JP6618501B2 - Method for reducing the volume of PCB contaminants - Google Patents

Method for reducing the volume of PCB contaminants

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JP6618501B2
JP6618501B2 JP2017078075A JP2017078075A JP6618501B2 JP 6618501 B2 JP6618501 B2 JP 6618501B2 JP 2017078075 A JP2017078075 A JP 2017078075A JP 2017078075 A JP2017078075 A JP 2017078075A JP 6618501 B2 JP6618501 B2 JP 6618501B2
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pcb
ballast
concentration
transformer
capacitor
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JP2018176052A (en
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清水 由章
由章 清水
加藤 治
治 加藤
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Shinko Pantec Co Ltd
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Kobelco Eco Solutions Co Ltd
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02WCLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO WASTEWATER TREATMENT OR WASTE MANAGEMENT
    • Y02W30/00Technologies for solid waste management
    • Y02W30/50Reuse, recycling or recovery technologies
    • Y02W30/82Recycling of waste of electrical or electronic equipment [WEEE]

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Description

本発明は、PCB処理施設に設けられるプラズマ溶融炉で処理されるPCB汚染物の前処理に関する。   The present invention relates to pretreatment of PCB contaminants to be processed in a plasma melting furnace provided in a PCB processing facility.

従来、不燃性の絶縁体であるPCB(ポリ塩化ビフェニル)の処理方法として、PCB処理施設に設けられるプラズマ溶融炉にPCB汚染物を投入し、PCB汚染物を溶融分解する方法が知られている(例えば、特許文献1参照)。   Conventionally, as a method for treating PCB (polychlorinated biphenyl) which is a nonflammable insulator, a method is known in which PCB contaminants are introduced into a plasma melting furnace provided in a PCB treatment facility, and the PCB contaminants are melted and decomposed. (For example, refer to Patent Document 1).

特許文献1には、PCB処理施設に搬入された搬入保管容器に入っているPCB汚染物をプラズマ溶融炉に投入する投入用詰替容器に詰替えるPCB汚染物の前処理方法が開示されている。投入用詰替容器に詰替える際、PCB汚染物の種類等に応じて分類することで、投入用詰替容器単位のバッチ投入が可能となりプラズマ溶融炉の安定した運転を可能とすると記載されている。   Patent Document 1 discloses a PCB contaminant pretreatment method in which a PCB contaminant contained in a carry-in storage container carried into a PCB treatment facility is refilled into a refill container for input into a plasma melting furnace. . It is described that when refilling into a refill container for input, classification according to the type of PCB contaminants enables batch input in units of refill containers for input and stable operation of the plasma melting furnace. Yes.

特開2010−179239号公報JP 2010-179239 A

従来のPCB汚染物の前処理方法は、プラズマ溶融炉に投入されるPCB汚染物の総投入量が、投入用詰替容器に詰替えられる前のPCB汚染物の総量と同等である。つまり、プラズマ溶融炉において単位時間当たりに処理できるPCB汚染物の処理量は、投入用詰替容器に詰替える前と変わらず、処理効率の観点から改善の余地がある。   In the conventional PCB contaminant pretreatment method, the total amount of PCB contaminants charged into the plasma melting furnace is equal to the total amount of PCB contaminants before being refilled into the refill container for input. That is, the amount of PCB contaminants that can be processed per unit time in the plasma melting furnace is the same as before the refilling container for refilling, and there is room for improvement from the viewpoint of processing efficiency.

また、PCB処理施設に搬入される搬入保管容器には、本来PCB処理施設で処理する必要のないPCB濃度の低い部材も含まれているため、搬入保管容器の容積や数量が大きくなってしまい、PCB処理施設へのPCB汚染物の搬入効率が悪い。そこで、プラズマ処理施設へのPCB汚染物の搬入効率を高めると共にプラズマ処理の処理効率を高めることのできるPCB汚染物の減容化方法が望まれている。   In addition, since the carry-in storage container that is carried into the PCB processing facility includes a member having a low PCB concentration that does not need to be processed in the PCB processing facility, the volume and quantity of the carry-in storage container are increased. The efficiency of loading PCB contaminants into PCB processing facilities is poor. Therefore, there is a demand for a method for reducing the volume of PCB contaminants that can increase the efficiency of carrying PCB contaminants into the plasma processing facility and increase the processing efficiency of plasma processing.

PCB汚染物の減容化方法は、保管所で保管容器に保管されているPCBで汚染された安定器をPCB処理施設に搬入する前に減容化する方法であって、前記保管所および前記PCB処理施設とは異なる場所に設けられた密閉室の内部で前記安定器を切断し、PCBを含有したコンデンサが含まれるコンデンサ領域と変圧部が含まれる変圧部領域とに分離する切断工程と、前記PCB処理施設に搬入する前に、前記切断工程で分離された前記コンデンサ領域を、詰替容器に詰替える詰替工程と、を備えた点にある。   A method for reducing the volume of PCB contaminants is a method for reducing the volume of a ballast that has been contaminated with PCB stored in a storage container in a storage before bringing it into a PCB processing facility. Cutting the ballast inside a sealed chamber provided at a location different from the PCB processing facility, and separating the ballast into a capacitor area including a capacitor containing PCB and a transformer section area including a transformer section; And a refilling step of refilling the capacitor region separated in the cutting step into a refilling container before carrying it into the PCB processing facility.

安定器は、PCBが含まれるコンデンサと変圧部との間にアスファルト等の充填材が充填されており、コンデンサ領域と変圧部領域とを容易に分離することができる。そこで、本方法では、安定器を、PCB濃度が高いコンデンサ領域と、PCB濃度が低い変圧部領域とを切断工程で切断して分離している。そして、PCB濃度が高いコンデンサ領域を詰替容器に詰替えている。その結果、この詰替容器をプラズマ処理施設に搬入すれば、プラズマ処理する安定器の総容積が低減されるので、プラズマ処理の処理効率を高めることができる。   The ballast is filled with a filler such as asphalt between the capacitor including the PCB and the transformer, and the capacitor region and the transformer region can be easily separated. Therefore, in this method, the ballast is separated by cutting the capacitor region having a high PCB concentration and the transformer region having a low PCB concentration in a cutting process. And the capacitor area | region where PCB density | concentration is high is refilled by the refill container. As a result, if this refill container is carried into the plasma processing facility, the total volume of the ballast for plasma processing is reduced, so that the processing efficiency of the plasma processing can be increased.

しかも、プラズマ処理する安定器の総容積を小さくすれば、PCB処理施設に搬入される詰替容器の重量や数量も小さくすることが可能となり、搬入効率を高めることができる。このように、プラズマ処理施設へのPCB汚染物の搬入効率を高めると共にプラズマ処理の処理効率を高めることのできるPCB汚染物の減容化方法が提供できた。   Moreover, if the total volume of the ballast for plasma processing is reduced, the weight and quantity of the refill container carried into the PCB processing facility can be reduced, and the carrying-in efficiency can be increased. As described above, a PCB contaminant volume reduction method that can increase the efficiency of carrying PCB contaminants into the plasma processing facility and increase the plasma processing efficiency can be provided.

他の方法は、前記密閉室は、前記保管所の外部に配置された車両に備えられている点にある。   Another method is that the sealed chamber is provided in a vehicle disposed outside the storage.

本方法では、密閉室を保管所の外部に配置された車両に備えている。つまり、車両を保管所に近接した場所に移動させれば、保管容器を密閉室まで速やかに搬出することが可能となるので、保管容器から取り出された安定器の減容化処理効率を高めることができる。また、密閉室を備えた車両であればあらゆる場所に移動できるので、全国に散在する保管所ごとに密閉室を別途設ける必要が無く、利便性が高い。   In this method, the sealed chamber is provided in a vehicle disposed outside the storage. In other words, if the vehicle is moved to a location close to the storage, the storage container can be quickly taken out to the sealed chamber, so that the volume reduction processing efficiency of the ballast taken out from the storage container is increased. Can do. In addition, since the vehicle can be moved to any place as long as the vehicle has a sealed room, it is not necessary to provide a sealed room separately for each storage place scattered throughout the country, which is highly convenient.

他の特徴構成は、前記詰替容器は、塩基度調整剤が投入されており、前記PCB処理施設のプラズマ溶融炉に投入可能な形状で構成されている点にある。   Another characteristic configuration is that the refill container is filled with a basicity adjusting agent and has a shape that can be charged into a plasma melting furnace of the PCB processing facility.

ところで、プラズマ処理で不燃性物質がスラグ化されるが、融点の高い酸化第二鉄がスラグの流動性を低下させることが知られている。このため、PCB汚染物に塩基度調整剤を添加してスラグの流動性を高める処理が行われる。このとき、プラズマ処理される安定器を減少させているので、塩基度調整剤の添加量も節約することができる。よって、プラズマ溶融すべき総量(安定器+塩基度調整剤)が削減されるので、プラズマ処理で無害化される安定器の処理効率をさらに高めることができる。しかも、詰替容器をプラズマ溶融炉に投入可能な形状で構成すれば、プラズマ処理施設で再度詰替える必要が無く、利便性が高まる。   By the way, although a nonflammable substance is made into slag by plasma treatment, it is known that ferric oxide having a high melting point reduces the fluidity of slag. For this reason, the process which improves the fluidity | liquidity of slag by adding a basicity adjusting agent to PCB contaminant is performed. At this time, since the number of ballasts to be plasma-treated is reduced, the amount of basicity adjusting agent added can be saved. Therefore, since the total amount (stabilizer + basicity adjusting agent) to be melted by plasma is reduced, it is possible to further increase the processing efficiency of the ballast that is rendered harmless by the plasma processing. Moreover, if the refill container is configured in a shape that can be charged into the plasma melting furnace, it is not necessary to refill the plasma processing facility again, and convenience is enhanced.

他の方法は、前記安定器または前記変圧部領域のPCB濃度を臭気で判定する判定工程をさらに備えている点にある。   Another method is that the method further includes a determination step of determining the PCB concentration of the ballast or the transformer section region by odor.

切断する前の安定器や比較的PCB濃度の低い変圧部領域でも、コンデンサに含まれるPCBが漏れ出しているおそれがある。そこで、本方法では、変圧部領域のPCB濃度を臭気で判定している。その結果、安定器や変圧部領域のPCB濃度を速やかに判定することが可能となり、PCB濃度の高い安定器の不必要な切断工程を省略したり、変圧部領域のうちPCB濃度の高い変圧部領域のみをプラズマ処理したりすることで、安定器の減容化処理効率を高めることができる。   There is a possibility that PCB contained in the capacitor leaks out even in the ballast before cutting or in the transformer region where the PCB concentration is relatively low. Therefore, in this method, the PCB concentration in the transformer region is determined by odor. As a result, it is possible to quickly determine the PCB concentration in the ballast or transformer region, omitting an unnecessary cutting step of the ballast having a high PCB concentration, or transforming the transformer portion having a high PCB concentration in the transformer region. By performing plasma treatment only on the region, the volume reduction efficiency of the ballast can be increased.

他の方法は、前記判定工程でPCB濃度が基準濃度を超過すると判定された前記安定器または前記変圧部領域を前記詰替容器に投入する点にある。   Another method is that the ballast or the transformer region, which has been determined that the PCB concentration exceeds the reference concentration in the determination step, is charged into the refill container.

本方法では、PCB濃度が基準濃度を超過したと判定された安定器または変圧部領域を詰替容器に投入しているので、高濃度のPCBを漏洩させること無く、適正にプラズマ処理することができる。   In this method, since the ballast or the transformer section where it is determined that the PCB concentration has exceeded the reference concentration is put into the refill container, the plasma treatment can be appropriately performed without leaking the high-concentration PCB. it can.

他の方法は、前記判定工程でPCB濃度が基準濃度以下であると判定された前記変圧部領域のPCB濃度を再分析する再分析工程をさらに備え、前記再分析工程においてPCB濃度が基準値を超過した前記変圧部領域を前記詰替容器に投入する点にある。   The other method further includes a reanalysis step of reanalyzing the PCB concentration of the transformer region, in which the PCB concentration is determined to be equal to or lower than the reference concentration in the determination step, and the PCB concentration has a reference value in the reanalysis step. It is in the point which throws in the said refilling container the said transformer part area | region which exceeded.

本方法では、PCB濃度が基準濃度以下であると判定された変圧部領域について、さらにPCB濃度を再分析し、PCB濃度が基準値を超過した変圧部領域を詰替容器に投入している。その結果、高濃度のPCBを確実に漏洩させること無く、適正にプラズマ処理することができる。しかも、臭気でPCB濃度が基準濃度以下であると判定された変圧部領域のみ再分析するので、減容化処理効率の低下を抑制することができる。   In this method, the PCB concentration is further reanalyzed for the transformer region determined to have a PCB concentration equal to or lower than the reference concentration, and the transformer region where the PCB concentration exceeds the reference value is put into the refill container. As a result, it is possible to appropriately perform plasma processing without reliably leaking high concentration PCB. In addition, since only the transformer section region in which the PCB concentration is determined to be equal to or lower than the reference concentration due to odor is reanalyzed, it is possible to suppress a reduction in volume reduction processing efficiency.

PCB汚染物の前処理方法を説明する概念図である。It is a conceptual diagram explaining the pre-processing method of PCB contaminant. 安定器を示す概略図である。It is the schematic which shows a ballast. 第一実施形態に係るPCB汚染物の減容化方法を示す図である。It is a figure which shows the volume reduction method of the PCB contaminant which concerns on 1st embodiment. 第一実施形態の別実施例1に係るPCB処理方法を示す図である。It is a figure which shows the PCB processing method which concerns on another Example 1 of 1st embodiment. 第一実施形態の別実施例2に係るPCB処理方法を示す図である。It is a figure which shows the PCB processing method which concerns on another Example 2 of 1st embodiment. 第一実施形態の別実施例3に係るPCB処理方法を示す図である。It is a figure which shows the PCB processing method which concerns on another Example 3 of 1st embodiment. 第二実施形態に係るPCB汚染物の減容化方法を示す図である。It is a figure which shows the volume reduction method of the PCB contaminant which concerns on 2nd embodiment.

以下に、本発明に係るPCB汚染物の減容化方法の実施形態について、図面に基づいて説明する。本実施形態では、PCB汚染物の減容化方法の一例として、プラズマ溶融炉1を用いて安定器2を溶融分解する例を説明する。ただし、以下の実施形態に限定されることなく、その要旨を逸脱しない範囲内で種々の変形が可能である。   Hereinafter, embodiments of a method for reducing the volume of PCB contaminants according to the present invention will be described with reference to the drawings. In this embodiment, an example of melting and decomposing the ballast 2 using the plasma melting furnace 1 will be described as an example of a method for reducing the volume of PCB contaminants. However, the present invention is not limited to the following embodiments, and various modifications can be made without departing from the scope of the invention.

[プラズマ溶融炉の基本構成]
PCB処理施設Zは、プラズマ溶融炉1を備えている。プラズマ溶融炉1は、PCB汚染物である電気機器(安定器2、トランス、コンデンサ等)、運転廃棄物(作業服、ゴム手袋、ウエス等)、感圧複写紙、汚泥、絶縁油などを、無害化する装置である。
[Basic configuration of plasma melting furnace]
The PCB processing facility Z includes a plasma melting furnace 1. The plasma melting furnace 1 contains PCB-contaminated electrical equipment (stabilizer 2, transformer, condenser, etc.), operating waste (work clothes, rubber gloves, waste cloth, etc.), pressure-sensitive copying paper, sludge, insulating oil, etc. It is a detoxifying device.

図1に示すように、プラズマ溶融炉1は、PCB汚染物を収容した詰替容器C(例えば、ドラム缶やぺール缶)を投入する投入口11と、PCB汚染物をプラズマ処理して溶融分解する処理部12と、を備えている。投入口11には、室11a内部に転動方向に横置きした詰替容器Cを処理部12に移送する押圧部11b(プッシャー)が形成され、PCB汚染物が溶融分解される時間(例えば30分)が経過した後に、次の詰替容器Cが処理部12に投入される。   As shown in FIG. 1, the plasma melting furnace 1 includes a charging port 11 for charging a refill container C (for example, a drum can or a pail can) containing PCB contaminants, and a plasma treatment of the PCB contaminants for melting and decomposition. And a processing unit 12 that performs processing. The input port 11 is formed with a pressing portion 11b (pusher) for transferring the refill container C horizontally placed in the rolling direction inside the chamber 11a to the processing portion 12, and a time (for example, 30) during which PCB contaminants are melted and decomposed. Minutes) elapses, the next refill container C is put into the processing unit 12.

処理部12はプラズマトーチ12aを有しており、このプラズマトーチ12aに連続的に空気などを送り、電気エネルギーを加えることで、中心温度が15,000度以上であるプラズマアークを発生させる。このとき、炉内温度は約1,400度に維持され、PCBが分解されると共に、金属等の不燃物が溶融してスラグSが生成される。詰替容器CやPCB汚染物が溶融分解された時点で、傾倒部12bによって処理部12を傾倒させ、スラグSがスラグ収容容器13に排出される。   The processing unit 12 has a plasma torch 12a, and a plasma arc having a center temperature of 15,000 degrees or more is generated by continuously supplying air or the like to the plasma torch 12a and applying electric energy. At this time, the in-furnace temperature is maintained at about 1,400 degrees, the PCB is decomposed, and incombustible materials such as metals are melted to generate slag S. When the refill container C and the PCB contaminant are melted and decomposed, the processing section 12 is tilted by the tilting section 12b, and the slag S is discharged to the slag storage container 13.

なお、PCB処理施設Zのプラズマ溶融炉1の下流側には、恒温チャンバ、バグフィルタ、触媒反応塔、および活性炭槽がこの順で設けられているが、図示を省略する。恒温チャンバは、プラズマ溶融炉1からの発生ガスを処理するに含まれるダイオキシン類を分解するものである。バグフィルタは、微量の有害有機物質や排気中に含まれるHCl等の酸性ガスを吸着または反応除去するものである。触媒反応塔は、酸化チタン等の触媒によって排気中のダイオキシン類を分解すると共に、アンモニアガスを加えることでNOxを分解するものである。活性炭槽は、排気中に有害有機物質が残存していた場合に該有害有機物質を吸着するものである。   Although a constant temperature chamber, a bag filter, a catalytic reaction tower, and an activated carbon tank are provided in this order on the downstream side of the plasma melting furnace 1 of the PCB processing facility Z, illustration is omitted. The constant temperature chamber is for decomposing dioxins contained in processing the gas generated from the plasma melting furnace 1. The bag filter adsorbs or removes trace amounts of harmful organic substances and acidic gases such as HCl contained in exhaust gas. The catalytic reaction tower decomposes dioxins in exhaust gas with a catalyst such as titanium oxide and decomposes NOx by adding ammonia gas. The activated carbon tank adsorbs the harmful organic substance when the harmful organic substance remains in the exhaust gas.

[第一実施形態]
以下、第一実施形態について説明する。図1〜図3に示すように、本実施形態に係るPCB汚染物の減容化方法は、保管所X(保管事業所)で保管容器Hに保管されているPCBで汚染された安定器2をPCB処理施設Zに搬入する前に減容化する前処理方法である。このPCB汚染物の減容化方法は、保管所XおよびPCB処理施設Zとは異なる場所に設けられた密閉室Yの内部で安定器2を切断し、PCBを含有したコンデンサ22が含まれるコンデンサ領域2Aと変圧部21が含まれる変圧部領域2B(コンデンサ領域2A以外の領域)とに分離する切断工程と、PCB処理施設Zに搬入する前に、切断工程で分離されたコンデンサ領域2Aを、詰替容器Cに詰替える詰替工程と、を備えている。また、切断前の安定器2または変圧部領域2BのPCB濃度を臭気で判定する判定工程を備えている。なお、本実施形態では保管容器Hと詰替容器Cとが異なる容器で構成されているが、保管容器Hが詰替容器Cと同様の形状である場合は、本実施形態における詰替容器Cとしての保管容器Hにコンデンサ領域2Aを詰替えても良い。
[First embodiment]
Hereinafter, the first embodiment will be described. As shown in FIGS. 1 to 3, the method for reducing the volume of PCB contaminants according to this embodiment is a ballast 2 contaminated with PCB stored in a storage container H at a storage facility X (storage facility). Is a pre-processing method for reducing the volume before carrying the product into the PCB processing facility Z. In this method of reducing the volume of PCB contaminants, the ballast 2 is cut inside a sealed chamber Y provided at a location different from the storage facility X and the PCB processing facility Z, and the capacitor includes the capacitor 22 containing PCB. The cutting process for separating the area 2A and the transformer section 2B (the area other than the capacitor area 2A) including the transformer section 21 and the capacitor area 2A separated in the cutting process before being carried into the PCB processing facility Z, A refilling step of refilling the refilling container C. Moreover, the determination process which determines the PCB density | concentration of the ballast 2 before the cutting | disconnection or the transformation | transformation part area | region 2B with an odor is provided. In the present embodiment, the storage container H and the refill container C are configured as different containers. However, when the storage container H has the same shape as the refill container C, the refill container C in the present embodiment. The capacitor region 2A may be refilled in the storage container H as

図1に示すように、保管所Xには、PCB汚染物が入った複数の保管容器Hが保管されている。この保管容器Hには、安定器2、トランス、コンデンサ等の電気機器が主として収容されている。本実施形態では、PCB処理施設Zに搬入する前に、保管容器Hに保管された安定器2を減容化することとしている。これは、プラズマ溶融炉1におけるプラズマ処理効率を高めるために、PCB処理施設Zで処理される安定器2を減容化することが求められているためである。   As shown in FIG. 1, a plurality of storage containers H containing PCB contaminants are stored in the storage place X. The storage container H mainly stores electrical equipment such as a ballast 2, a transformer, and a capacitor. In this embodiment, the volume of the ballast 2 stored in the storage container H is reduced before being carried into the PCB processing facility Z. This is because in order to increase the plasma processing efficiency in the plasma melting furnace 1, it is required to reduce the volume of the ballast 2 processed in the PCB processing facility Z.

図1および図3に示すように、保管容器Hを保管所Xから搬出し、密閉室Yに移動させる。本実施形態における密閉室Yは、保管所Xの外部に配置された車両に固定された密閉コンテナで構成されている。これによって、車両を保管所Xに近接した場所に移動させれば、保管容器Hを密閉室Yまで速やかに搬出することが可能となるので、保管容器Hから取り出された安定器2の減容化処理効率を高めることができる。また、密閉室Yを備えた車両であればあらゆる場所に移動できるので、全国に散在する保管所Xごとに密閉室Yを別途設ける必要が無く、利便性が高い。なお、密閉室Yを固定式に構成して、全国に散在する保管所Xごとに密閉室Yを設けても良い。   As shown in FIGS. 1 and 3, the storage container H is unloaded from the storage place X and moved to the sealed chamber Y. The sealed chamber Y in the present embodiment is composed of a sealed container fixed to a vehicle disposed outside the storage X. As a result, if the vehicle is moved to a place close to the storage place X, the storage container H can be quickly carried out to the sealed chamber Y. Therefore, the volume of the ballast 2 taken out from the storage container H is reduced. The processing efficiency can be increased. Moreover, since it can move to any place if it is a vehicle provided with the sealed room Y, it is not necessary to provide the sealed room Y for every storage place X scattered all over the country, and the convenience is high. In addition, the sealed chamber Y may be configured as a fixed type, and the sealed chamber Y may be provided for each storage facility X scattered throughout the country.

次いで、密閉室Yに移動した保管容器Hから安定器2を取り出して、安定器2をコンデンサ領域2Aと変圧部領域2Bとに区分した上で切断する。このとき、本実施形態では、安定器2の切断位置を特定するために重量差判定を行っても良い。   Next, the ballast 2 is taken out from the storage container H moved to the sealed chamber Y, and the ballast 2 is divided into a capacitor region 2A and a transformer part region 2B and then cut. At this time, in this embodiment, the weight difference determination may be performed in order to specify the cutting position of the ballast 2.

以下に、安定器2の切断工程について説明する。   Below, the cutting process of the ballast 2 will be described.

図2に示すように、安定器2は、磁性物である鉄心やコイルを含む変圧部21と、PCBを絶縁油として含むコンデンサ22とを有している。この安定器2は、変圧部21とコンデンサ22との間に、樹脂やアスファルトといった充填材23が充填されている充填型である。なお、安定器2は、変圧部21が含まれる変圧部領域2Bに、コンデンサ22が含まれるコンデンサ領域2Aが取付けられた外付型であっても良い。   As shown in FIG. 2, the ballast 2 includes a transformer unit 21 including an iron core and a coil that are magnetic materials, and a capacitor 22 including PCB as an insulating oil. The ballast 2 is a filling type in which a filling material 23 such as resin or asphalt is filled between the transformer 21 and the capacitor 22. The ballast 2 may be an external type in which a capacitor region 2A including a capacitor 22 is attached to a transformer region 2B including the transformer 21.

安定器2は、変圧部21とコンデンサ22とが長手方向に沿った両側領域に配置され、変圧部21とコンデンサ22との隙間には、充填材23が充填されている。また、鉄心が含まれる変圧部21はコンデンサ22に比べて大きな重量を有しており、コンデンサ22は、平面視における占有面積が変圧部21に比べて小さく、長手方向に対する中央線Tより一方側に偏って配置されている。   In the ballast 2, the transformer part 21 and the capacitor 22 are disposed in both side regions along the longitudinal direction, and a gap 23 between the transformer part 21 and the capacitor 22 is filled with a filler 23. Further, the transformer 21 including the iron core has a larger weight than the capacitor 22, and the capacitor 22 has a smaller occupied area in plan view than the transformer 21, and is one side from the center line T in the longitudinal direction. It is arranged to be biased.

そこで、安定器2を密閉室Yに受入れた後、安定器2の中央線Tを境界とした両側領域の重量差に基づいて、コンデンサ領域2Aを区分する重量差判定を行う。具体的には、安定器2の中央線Tに沿った支持部材31(例えば、棒状部材)を配置すれば、重力によって変圧部領域2Bが下降し、これに伴いコンデンサ領域2Aが上昇する。この上昇した領域(重量の小さい側)をコンデンサ領域2Aとして判定する。次いで、変圧部領域2Bとコンデンサ領域2Aとを所定の比率(例えば、1:1や3:2)に設定し、中央線Tまたは中央線Tとコンデンサ22との間の位置で安定器2を切断して、コンデンサ領域2Aと変圧部領域2Bとを仕分けする。これによって、コンデンサ22を誤って切断することが無いので、PCBの漏洩を確実に防止することができる。なお、重量差判定や切断工程は、手動で実施しても良いし、自動で実施しても良い。また、重量差判定は、中央線Tで切断した後に、コンデンサ領域2Aと変圧部領域2Bとの重量を測定し、重量の軽い方をコンデンサ領域2Aと特定しても良く、特に限定されない。   Therefore, after the ballast 2 is received in the sealed chamber Y, the weight difference determination for dividing the capacitor region 2A is performed based on the weight difference between the two side regions with the center line T of the ballast 2 as the boundary. Specifically, if a support member 31 (for example, a rod-like member) is disposed along the center line T of the ballast 2, the transformer region 2B is lowered by gravity, and the capacitor region 2A is raised accordingly. This increased region (the side with the smaller weight) is determined as the capacitor region 2A. Next, the transformer region 2B and the capacitor region 2A are set to a predetermined ratio (for example, 1: 1 or 3: 2), and the ballast 2 is placed at the center line T or a position between the center line T and the capacitor 22. The capacitor region 2A and the transformer part region 2B are sorted by cutting. As a result, the capacitor 22 is not accidentally cut, and thus PCB leakage can be reliably prevented. Note that the weight difference determination and the cutting step may be performed manually or automatically. The weight difference determination is not particularly limited, and the weight of the capacitor region 2A and the transformer region 2B may be measured after cutting along the center line T, and the lighter weight may be identified as the capacitor region 2A.

図1および図3に戻って、安定器2のコンデンサ領域2Aを、プラズマ溶融炉1に投入可能な形状(大きさ)で構成された詰替容器Cに詰替え、PCB処理施設Zに搬入する。このとき、詰替容器Cに珪砂(SiO)、生石灰(CaO)、炭酸カルシウム(CaCO)などの塩基度調整剤を加えるのが好ましい。これによって、プラズマ溶融炉1で生成されるスラグSの流動性を高めることができる。また、切断工程によってプラズマ処理される安定器2の重量を減少させているので、塩基度調整剤の添加量も節約することができる。よって、プラズマ溶融すべき総量(安定器2+塩基度調整剤)が削減されるので、プラズマ処理で無害化される安定器2の処理量をさらに高めることができる。なお、密閉室Yで詰替容器Cに塩基度調整剤を添加せずに、PCB処理施設Zで詰替容器Cに塩基度調整剤を添加しても良く、特に限定されない。 Returning to FIGS. 1 and 3, the capacitor region 2 </ b> A of the ballast 2 is refilled with a refill container C having a shape (size) that can be charged into the plasma melting furnace 1, and is loaded into the PCB processing facility Z. . At this time, it is preferable to add basicity adjusting agents such as silica sand (SiO 2 ), quicklime (CaO), calcium carbonate (CaCO 3 ) to the refill container C. Thereby, the fluidity | liquidity of the slag S produced | generated with the plasma melting furnace 1 can be improved. Moreover, since the weight of the ballast 2 plasma-processed by the cutting process is reduced, the amount of basicity adjusting agent added can be saved. Accordingly, since the total amount to be melted by plasma (stabilizer 2 + basicity adjusting agent) is reduced, it is possible to further increase the treatment amount of the stabilizer 2 that is rendered harmless by the plasma treatment. In addition, the basicity adjusting agent may be added to the refilling container C in the PCB processing facility Z without adding the basicity adjusting agent to the refilling container C in the sealed chamber Y, and is not particularly limited.

次いで、PCB処理施設Zにおいて、コンデンサ領域2Aが塩基度調整剤と共に詰込まれた詰替容器Cを、プラズマ溶融炉1でプラズマ処理する。このとき、詰替容器Cをプラズマ溶融炉1に投入可能な形状で構成しているので、PCB処理施設Zで再度詰替える必要が無く、利便性が高い。プラズマ処理で発生したスラグSは、PCB濃度が基準値以下か否かの卒業判定が実行され、無害であると判定されたものは埋立処分や資源として再利用するといった適正処分が行われる。逆に、卒業判定でPCB濃度が基準値をクリアしていない場合は、再度プラズマ処理が行われる。なお、詰替容器CをPCB処理施設Zへ搬入する車両は、密閉室Yを有する車両であっても良いし、詰替容器Cを別の運搬車両に移動させてからPCB処理施設Zへ搬入しても良い。   Next, in the PCB processing facility Z, the refill container C in which the capacitor region 2 </ b> A is packed together with the basicity adjusting agent is subjected to plasma processing in the plasma melting furnace 1. At this time, since the refill container C is configured in a shape that can be charged into the plasma melting furnace 1, it is not necessary to refill the PCB processing facility Z again, which is highly convenient. The slag S generated by the plasma processing is subjected to graduation judgment whether the PCB concentration is below the reference value, and those judged to be harmless are subjected to appropriate disposal such as landfill disposal or reuse as resources. Conversely, if the PCB concentration does not clear the reference value in the graduation determination, the plasma processing is performed again. The vehicle that carries the refill container C into the PCB processing facility Z may be a vehicle having the sealed chamber Y, or the refill container C is moved to another transport vehicle and then carried into the PCB processing facility Z. You may do it.

一方、切断工程で切断された変圧部領域2BはPCB濃度が小さく、本来であればPCB処理施設Zで処理する必要はないが、コンデンサ22から漏れ出したPCBが含まれている場合があるので、判定工程において臭気判定処理が実行される。上述したように、PCBは絶縁油であり、甘い特有の臭気がある。そこで、本実施形態では、油の臭気成分に感応して臭気強度を数値で表す油臭センサを用いて、臭気判定処理を実行する。この油臭センサは、上山智嗣他1名、「水晶振動子式高感度油臭センサによる河川油汚染モニタリング」、学会誌EICA、第8巻、第3号、2003、p16−20に記載のように、目的とする物質に特異的に吸着する感応膜を有している。ここで、臭気判定における変圧部領域2BのPCB濃度は、無害化処理認定施設で焼却処理可能な基準値(5,000mg/kg以下)を臭気強度に換算した基準濃度と比較して判定する。   On the other hand, the transformer region 2B cut in the cutting process has a low PCB concentration, and it is not necessary to process it at the PCB processing facility Z if it is originally, but it may contain PCB leaked out from the capacitor 22. In the determination step, odor determination processing is executed. As mentioned above, PCB is an insulating oil and has a sweet and characteristic odor. Therefore, in this embodiment, the odor determination process is performed using an oil odor sensor that expresses the odor intensity with a numerical value in response to the odor component of the oil. This oil odor sensor is described in Tomoaki Kamiyama et al., “River Oil Contamination Monitoring by Quartz Crystal Sensor Sensitive Oil Odor Sensor”, Journal of EICA, Vol. 8, No. 3, 2003, p16-20. In addition, it has a sensitive membrane that specifically adsorbs to the target substance. Here, the PCB concentration in the transformer part region 2B in the odor determination is determined by comparing a reference value (5,000 mg / kg or less) that can be incinerated at a detoxification treatment certified facility with a reference concentration converted to odor intensity.

臭気判定により、変圧部領域2BのPCB濃度が基準濃度を超過していれば、変圧部領域2Bをコンデンサ領域2Aと共に詰替容器Cに詰替える。その後の工程は、上述したコンデンサ領域2Aの工程と同じであるので、詳細な説明を省略する。一方、変圧部領域2BのPCB濃度が基準濃度以下であれば、変圧部領域2Bを焼却処理する。これによって、PCBが漏れ出ている変圧部領域2Bを判定することが可能となるので、高濃度のPCBを含む変圧部領域2Bを誤って焼却処理してしまうおそれが無く、適正にプラズマ処理することができる。また、安定器2のうちPCB処理施設Zで処理すべき領域が臭気判定により速やかに判定されるので、安定器2の減容化処理効率を高めることができる。   If the PCB concentration in the transformer region 2B exceeds the reference concentration by the odor determination, the transformer region 2B is refilled into the refill container C together with the capacitor region 2A. Subsequent steps are the same as those of the capacitor region 2A described above, and thus detailed description thereof is omitted. On the other hand, if the PCB concentration in the transformer region 2B is equal to or lower than the reference concentration, the transformer region 2B is incinerated. As a result, it is possible to determine the transformer part region 2B where the PCB has leaked out, so that there is no risk of accidentally incinerating the transformer part region 2B containing the high-concentration PCB. be able to. Moreover, since the area | region which should be processed in the PCB processing plant | facility Z among the ballasts 2 is determined rapidly by odor determination, the volume reduction process efficiency of the ballast 2 can be improved.

[第一実施形態の変形例1]
図4に示すように、臭気判定によってPCB濃度が基準値(5,000mg/kg)以下であると判定された変圧部領域2BのPCB濃度を再分析する再分析工程をさらに備えていても良い。具体的には、上述の臭気判定処理において、PCB濃度が基準濃度以下であると判定された変圧部領域2Bを、密閉室Yとは異なる分析場所に搬出する。次いで、再分析工程において、変圧部領域2Bの分析値が基準濃度以下か否かを判定する。ここで、再分析工程は、「低濃度PCB含有廃棄物に関する測定方法(第2版)」(環境省大臣官房廃棄物・リサイクル対策部産業廃棄物課、平成26年9月)に記載された含有量試験、表面拭き取り試験、および表面抽出試験の何れか1つ、又は併用によって実行される。
[Variation 1 of the first embodiment]
As shown in FIG. 4, a reanalyzing step for reanalyzing the PCB concentration in the transformer region 2 </ b> B determined by the odor determination that the PCB concentration is not more than a reference value (5,000 mg / kg) may be further provided. Specifically, in the above-described odor determination process, the transformer part region 2B, in which the PCB concentration is determined to be equal to or lower than the reference concentration, is carried out to an analysis place different from the sealed chamber Y. Next, in the reanalysis step, it is determined whether or not the analysis value of the transformer part region 2B is equal to or lower than the reference concentration. Here, the reanalysis process was described in “Measurement Method for Waste Containing Low Concentration PCB (2nd Edition)” (Ministry of the Environment Minister's Secretariat Waste and Recycling Countermeasures Department, Industrial Waste Division, September 2014) It is performed by any one of a content test, a surface wiping test, and a surface extraction test, or in combination.

変圧部領域2Bの分析値が基準値以下であれば、焼却処理する。一方、変圧部領域2Bの分析値が基準値を超過していれば、詰替容器Cに詰替える。この詰替容器Cは、上述したコンデンサ領域2Aが詰替えられた詰替容器Cと同じ容器であっても良いし、異なる詰替容器Cに変圧部領域2Bを塩基度調整剤と共に、又は変圧部領域2Bのみを詰替えても良い。次いで、PCB濃度の高い変圧部領域2Bが塩基度調整剤と共に詰込まれた詰替容器CをPCB処理施設Zへ搬入し、プラズマ溶融炉1でプラズマ処理する。本変形例では、再分析工程を備えることで、高濃度のPCBを漏洩させるおそれを確実に無くし、適正にプラズマ処理することができる。しかも、臭気で基準濃度以下であると判定された変圧部領域2Bのみ再分析するので、減容化処理効率の低下を抑制することができる。その他の作用効果は第一実施形態と同様であるので、詳細な説明を省略する。   If the analysis value of the transformer part region 2B is equal to or less than the reference value, incineration is performed. On the other hand, if the analysis value of the transformer part region 2B exceeds the reference value, the refill container C is refilled. The refill container C may be the same container as the refill container C in which the capacitor region 2A described above is refilled, or the transformer unit region 2B may be combined with a basicity adjusting agent or transformed into a different refill container C. Only the partial area 2B may be refilled. Next, the refill container C in which the transformer part region 2 </ b> B having a high PCB concentration is packed together with the basicity adjusting agent is carried into the PCB processing facility Z and subjected to plasma processing in the plasma melting furnace 1. In this modification, by providing the reanalysis step, there is no risk of leaking high-concentration PCBs, and plasma processing can be performed appropriately. Moreover, since only the transformer section region 2B determined to be below the reference concentration due to odor is reanalyzed, it is possible to suppress a decrease in volume reduction processing efficiency. Since other operations and effects are the same as those of the first embodiment, detailed description thereof is omitted.

[第一実施形態の変形例2]
図5に示すように、臭気判定によってPCB濃度が基準濃度以下であると判定された変圧部領域2Bを破砕する破砕工程と、破砕後の変圧部領域2Bを磁選する磁選工程とをさらに備えていても良い。具体的には、PCB濃度が基準濃度以下であると判定された変圧部領域を搬送し、破砕機(不図示)を用いて破砕する。次いで、磁力によって磁性物を分離する磁選機(不図示)で、磁性物(鉄等)と非磁性物(樹脂、アルミ、アスファルト等)とを選別する。選別された磁性物は、炭化水素系の溶剤等で洗浄処理される。磁性物はPCB濃度が比較的低いので、洗浄処理によって無害化することができる。次いで、PCB濃度が基準値以下か否かの卒業判定が実行され、無害であると判定されたものは資源として再利用するといった適正処分が行われる。逆に、卒業判定でPCB濃度が基準値をクリアしていない場合は、再度洗浄処理が行われる。このとき、洗浄工程で用いた溶剤は、系内で蒸留することで再利用される。なお、洗浄方法は、超音波洗浄、浸漬洗浄、撹拌洗浄、真空加熱分離などを単独または適宜組み合わせて実行する。
[Modification 2 of the first embodiment]
As shown in FIG. 5, the method further includes a crushing step of crushing the transformer part region 2B determined by the odor determination to have a PCB concentration equal to or lower than a reference concentration, and a magnetic separation step of magnetically selecting the transformer part region 2B after crushing. May be. Specifically, the transformer part region in which the PCB concentration is determined to be equal to or lower than the reference concentration is transported and crushed using a crusher (not shown). Subsequently, a magnetic separator (not shown) that separates the magnetic material by magnetic force separates the magnetic material (iron, etc.) and the non-magnetic material (resin, aluminum, asphalt, etc.). The selected magnetic material is washed with a hydrocarbon solvent or the like. Since the magnetic substance has a relatively low PCB concentration, it can be rendered harmless by a cleaning process. Next, a graduation judgment is made as to whether or not the PCB concentration is below a reference value, and appropriate disposal is performed such that what is judged harmless is reused as a resource. On the contrary, if the PCB concentration does not clear the reference value in the graduation determination, the cleaning process is performed again. At this time, the solvent used in the washing step is reused by distillation in the system. As the cleaning method, ultrasonic cleaning, immersion cleaning, stirring cleaning, vacuum heating separation, or the like is performed alone or in combination as appropriate.

一方、選別された非磁性物は、PCB濃度が比較的高いので、珪砂(SiO)、生石灰(CaO)、炭酸カルシウム(CaCO)などの塩基度調整剤と共に、又は非磁性物のみを詰替容器Cに詰替え、この詰替容器Cをプラズマ溶融炉1でプラズマ処理を実行する。本変形例2によれば、切断工程によって分離された変圧部領域2Bに含まれる磁性物の容量分だけプラズマ処理されるPCB汚染物が減量される。安定器2は磁性物の容量比が半分以上であるので、1回のプラズマ処理で無害化される安定器2の処理効率が約2倍となる。また、プラズマ処理される鉄分を磁選工程で減少させているので、塩基度調整剤の添加量を節約することができる。その他の作用効果は第一実施形態と同様であるので、詳細な説明を省略する。なお、破砕工程の前に、変形例1の再分析工程を実行しても良く、特に限定されない。 On the other hand, since the selected non-magnetic material has a relatively high PCB concentration, it is packed together with a basicity adjusting agent such as silica sand (SiO 2 ), quicklime (CaO), calcium carbonate (CaCO 3 ), or only non-magnetic material. The refill container C is refilled, and the refill container C is subjected to plasma processing in the plasma melting furnace 1. According to the second modification, the amount of PCB contaminants that are plasma-treated is reduced by the amount of the magnetic material contained in the transformer region 2B separated by the cutting process. Since the ballast 2 has a magnetic material capacity ratio of more than half, the treatment efficiency of the ballast 2 that is rendered harmless by one plasma treatment is approximately doubled. Moreover, since the amount of iron to be plasma-treated is reduced by the magnetic separation process, the amount of basicity adjusting agent added can be saved. Since other operations and effects are the same as those of the first embodiment, detailed description thereof is omitted. In addition, you may perform the reanalysis process of the modification 1 before a crushing process, and it does not specifically limit.

図示しないが、PCB汚染物の減容化方法は、磁選工程で磁選された磁性物に付着している樹脂やアスファルトといった不純物を除去する除去工程をさらに備えても良い。この除去工程において、洗浄、篩、風力選別、比重選別、光学選別などが考えられる。また、磁性物に珪砂を接触させて不純物を除去することが考えられる。具体的には、磁性物と珪砂とを所定の容器に収容して、この容器に振動を与えたり、磁性物に珪砂を吹付けたりして、磁性物に付着している不純物を剥離させる。このとき、洗浄、篩、風力選別、比重選別、光学選別などを併用しても良い。また、除去工程で使用した珪砂を塩基度調整剤として再利用しても良い。なお、除去工程は、珪砂を用いずに他の粒子で磁性物をサンドブラストしても良いし、化学処理で不純物を除去しても良く、特に限定されない。   Although not shown, the method for reducing the volume of PCB contaminants may further include a removal step of removing impurities such as resin and asphalt attached to the magnetic material magnetically selected in the magnetic separation step. In this removal process, washing, sieving, wind sorting, specific gravity sorting, optical sorting, etc. can be considered. It is also conceivable to remove impurities by bringing silica sand into contact with the magnetic material. Specifically, the magnetic substance and the silica sand are accommodated in a predetermined container, and the container is vibrated or the silica substance is sprayed on the magnetic substance to peel off the impurities adhering to the magnetic substance. At this time, washing, sieving, wind sorting, specific gravity sorting, optical sorting, etc. may be used in combination. Moreover, you may reuse the silica sand used at the removal process as a basicity adjusting agent. The removing step is not particularly limited, and the magnetic substance may be sandblasted with other particles without using silica sand, or impurities may be removed by chemical treatment.

[第一実施形態の変形例3]
図6に示すように、安定器2を切断する前に、安定器2のPCB濃度を臭気で判定する事前判定工程をさらに備えていても良い。この事前判定工程は、保管容器Hから取り出された安定器2について臭気判定を実行し、PCBの漏洩可能性が高い安定器2とPCBの漏洩可能性が低い安定器2とに分類する工程である。具体的には、上述した油臭センサを用いて、安定器2のPCB濃度を事前判定基準濃度(基準濃度の一例)と比較して判定する。この事前判定基準濃度は、上述したような焼却処理可能な基準値(5,000mg/kg以下)を臭気強度に換算した基準濃度であっても良いし、基準濃度に安全率(例えば1.2)を乗算した値としても良い。
[Modification 3 of the first embodiment]
As shown in FIG. 6, before cutting the ballast 2, a pre-determination step of determining the PCB concentration of the ballast 2 by odor may be further provided. This pre-determination step is a step of performing odor determination on the ballast 2 taken out from the storage container H, and classifying the ballast 2 into a ballast 2 having a high possibility of PCB leakage and a ballast 2 having a low possibility of PCB leakage. is there. Specifically, the above-described oil odor sensor is used to determine the PCB concentration of the ballast 2 by comparing it with a prior determination reference concentration (an example of a reference concentration). This pre-judgment reference concentration may be a reference concentration obtained by converting a reference value (5,000 mg / kg or less) that can be incinerated as described above into an odor intensity, or a safety factor (eg, 1.2). It is good also as a value which multiplied.

事前判定工程により、安定器2のPCB濃度が事前判定基準濃度を超過していれば、変圧部領域2Bまで汚染が拡がっている可能性が高いため、安定器2を詰替容器Cに詰替えてPCB処理施設Zに搬入する。これによって、不必要な切断工程を省略することができると共に、PCBの汚染拡大を招く切断工程を回避することができる。一方、安定器2のPCB濃度が事前判定基準濃度以下であれば、上述した切断工程に移行する。以降の工程や作用効果は第一実施形態と同様であるので、詳細な説明を省略する。   If the PCB concentration of the ballast 2 exceeds the pre-judgment reference concentration by the pre-judgment step, there is a high possibility that the contamination has spread to the transformer region 2B, so the ballast 2 is refilled with the refill container C. To the PCB processing facility Z. As a result, an unnecessary cutting process can be omitted, and a cutting process that causes an increase in PCB contamination can be avoided. On the other hand, if the PCB concentration of the ballast 2 is less than or equal to the prior determination reference concentration, the process proceeds to the cutting step described above. Since the subsequent steps and operational effects are the same as those of the first embodiment, detailed description thereof is omitted.

[第二実施形態]
図7に示すように、本実施形態におけるPCB汚染物の減容化方法は、保管所X(保管事業所)およびPCB処理施設Zとは異なる場所に設けられた密閉室Yの内部で安定器2を切断し、PCBを含有したコンデンサ22が含まれるコンデンサ領域2Aと変圧部21が含まれる変圧部領域2B(コンデンサ領域2A以外の領域)とに分離する切断工程と、PCB処理施設Zに搬入する前に、切断工程で分離されたコンデンサ領域2Aを、詰替容器Cに詰替える詰替工程と、を備えている。また、変圧部領域2Bを洗浄する洗浄工程と、変圧部領域2BのPCB濃度を分析する分析工程とを備えている。なお、切断工程と詰替工程とは、上述した第一実施形態と同様であるので詳細な説明は省略する。
[Second Embodiment]
As shown in FIG. 7, the method for reducing the volume of PCB contaminants in the present embodiment is a ballast inside a sealed chamber Y provided at a location different from the storage facility X (storage facility) and the PCB processing facility Z. 2 is cut and separated into a capacitor area 2A including a capacitor 22 containing PCB and a transformer section area 2B (an area other than the capacitor area 2A) including a transformer section 21, and is loaded into a PCB processing facility Z A refilling step of refilling the refill container C with the capacitor region 2A separated in the cutting step. Further, a cleaning process for cleaning the transformer part region 2B and an analysis process for analyzing the PCB concentration in the transformer part region 2B are provided. Since the cutting process and the refilling process are the same as those in the first embodiment described above, detailed description thereof is omitted.

洗浄工程では、変圧部領域2Bを炭化水素系の溶剤等で洗浄処理する。洗浄方法は、超音波洗浄、浸漬洗浄、撹拌洗浄、真空加熱分離などを単独または適宜組み合わせて実行する。なお、洗浄工程で用いた溶剤は、系内で蒸留することで再利用しても良い。次いで、洗浄された変圧部領域2Bを密閉室Yとは異なる分析場所に搬出する。そして、分析工程において、変圧部領域2Bの分析値が基準値(5,000mg/kg)以下か否かを判定する。この分析工程は、上述した第一実施形態の変形例1の再分析工程と同様の方法であるので、詳細な説明を省略する。本実施形態では臭気による判定工程を省略しているので迅速性に欠けるが、安定器2を安価に減容化できる点で有益である。   In the cleaning process, the transformer section region 2B is cleaned with a hydrocarbon solvent or the like. As the cleaning method, ultrasonic cleaning, immersion cleaning, stirring cleaning, vacuum heating separation, or the like is performed alone or in combination as appropriate. Note that the solvent used in the cleaning step may be reused by distillation in the system. Next, the cleaned transformer region 2B is carried out to an analysis place different from the sealed chamber Y. Then, in the analysis step, it is determined whether or not the analysis value of the transformer part region 2B is equal to or less than a reference value (5,000 mg / kg). Since this analysis process is the same method as the reanalysis process of the modification 1 of 1st embodiment mentioned above, detailed description is abbreviate | omitted. In this embodiment, since the determination process by odor is omitted, it is not quick, but it is advantageous in that the volume of the ballast 2 can be reduced at a low cost.

[その他の実施形態]
(1)上述した実施形態における各工程は、適宜組み合わせたり、省略したりしても良い。例えば、臭気による判定工程(事前判定工程を含む)や再分析工程を省略しても良いし、第二実施形態における分析工程の後に破砕工程や磁選工程を備えていても良い。
(2)上述した実施形態では、保管容器Hを保管所Xから搬出して密閉室Yに移動させたが、保管所Xで保管容器Hから安定器2を取り出して、所定の安全対策を施した上で安定器2自体を密閉室Yに移動させても良い。
(3)臭気による判定工程や事前判定工程では、油臭センサを用いて変圧部領域2Bの臭気判定をしたが、他の装置を用いて臭気判定しても良いし、所定の安全対策を施した上で目視または嗅覚にて臭気判定を行っても良く、臭気判定の方法は特に限定されない。
(4)切断工程に代えて安定器2を工具等で解体することによりコンデンサ22とその他の領域に選別しても良い。
[Other Embodiments]
(1) Each process in the above-described embodiment may be appropriately combined or omitted. For example, a determination step (including a preliminary determination step) and a reanalysis step by odor may be omitted, or a crushing step and a magnetic separation step may be provided after the analysis step in the second embodiment.
(2) In the embodiment described above, the storage container H is carried out from the storage place X and moved to the sealed chamber Y. However, the ballast 2 is taken out from the storage container H at the storage place X, and predetermined safety measures are taken. In addition, the ballast 2 itself may be moved to the sealed chamber Y.
(3) In the determination process by odor and the preliminary determination process, the odor of the transformer section 2B is determined using the oil odor sensor. However, the odor may be determined using another device, and a predetermined safety measure is taken. In addition, the odor determination may be performed visually or by smell, and the method of odor determination is not particularly limited.
(4) Instead of the cutting step, the ballast 2 may be separated into the capacitor 22 and other regions by disassembling with a tool or the like.

本発明に係るPCB汚染物の減容化方法は、安定器をプラズマ処理する際の前処理方法として利用可能である。   The method for reducing the volume of PCB contaminants according to the present invention can be used as a pretreatment method for plasma treatment of a ballast.

2 安定器
2A コンデンサ領域
2B 変圧部領域
21 変圧部
22 コンデンサ
C 詰替容器
H 保管容器
X 保管所
Y 密閉室
Z PCB処理施設
2 Ballast 2A Capacitor area 2B Transformer area 21 Transformer 22 Capacitor C Refill container H Storage container X Storage room Y Sealed room Z PCB processing facility

Claims (6)

プラズマ処理するために、PCBで汚染された安定器の総容積を減少させる減容化方法であって、
前記安定器のPCB濃度を臭気で判定する判定工程と、
密閉室の内部で前記安定器を切断し、PCBを含有したコンデンサが含まれるコンデンサ領域と変圧部が含まれる変圧部領域とに分離する切断工程と、
前記切断工程で分離された前記コンデンサ領域を、前記プラズマ処理される詰替容器に詰替えることにより、前記詰替容器に詰替えられる前記安定器の総容積を減少させる詰替工程と、を備え、
前記判定工程でPCB濃度が基準濃度以下であると判定された前記安定器を、前記切断工程において切断して前記コンデンサ領域と前記変圧部領域とに分離するPCB汚染物の減容化方法。
To plasma treatment, a volume reduction how to reduce the total volume of ballast contaminated with PCB,
A determination step of determining the PCB concentration of the ballast by odor;
Cutting the ballast inside the sealed chamber, and separating the capacitor into a capacitor region including a capacitor containing PCB and a transformer unit region including a transformer unit;
A refilling step of reducing the total volume of the ballast refilled in the refilling container by refilling the capacitor region separated in the cutting step with the refilling container to be plasma-treated. ,
A method for reducing the volume of PCB contaminants, wherein the ballast, in which the PCB concentration is determined to be lower than the reference concentration in the determination step, is cut in the cutting step and separated into the capacitor region and the transformer region.
プラズマ処理するために、PCBで汚染された安定器の総容積を減少させる減容化方法であって、
密閉室の内部で前記安定器を切断し、PCBを含有したコンデンサが含まれるコンデンサ領域と変圧部が含まれる変圧部領域とに分離する切断工程と、
前記切断工程で分離された前記変圧部領域のPCB濃度を臭気で判定する判定工程と、
前記切断工程で分離された前記コンデンサ領域を、前記プラズマ処理される詰替容器に詰替えることにより、前記詰替容器に詰替えられる前記安定器の総容積を減少させる詰替工程と、を備え、
前記判定工程でPCB濃度が基準濃度を超過すると判定された前記変圧部領域、前記詰替工程において前記詰替容器に前記コンデンサ領域と共に詰替えられるPCB汚染物の減容化方法。
To plasma treatment, a volume reduction how to reduce the total volume of ballast contaminated with PCB,
Cutting the ballast inside the sealed chamber, and separating the capacitor into a capacitor region including a capacitor containing PCB and a transformer unit region including a transformer unit;
A determination step of determining by odor the PCB concentration of the transformer section separated in the cutting step;
A refilling step of reducing the total volume of the ballast refilled in the refilling container by refilling the capacitor region separated in the cutting step with the refilling container to be plasma-treated. ,
Wherein said transformer region determined to PCB concentration exceeds the reference concentration determination step, volume reduction method of the refill Refill is that PCB contaminants together with the capacitor region in the refill container in the process.
前記密閉室は、前記安定器を保管している保管所の外部に配置された車両に備えられている請求項1又は2に記載のPCB汚染物の減容化方法。   The method for reducing the volume of PCB contaminants according to claim 1 or 2, wherein the sealed chamber is provided in a vehicle disposed outside a storage where the ballast is stored. 前記詰替容器は、塩基度調整剤が投入されており、PCB処理施設のプラズマ溶融炉に投入可能な形状で構成されている請求項1〜3の何れか一項に記載のPCB汚染物の減容化方法。   The PCB refill container according to any one of claims 1 to 3, wherein the refill container is filled with a basicity adjusting agent and is configured to be put into a plasma melting furnace of a PCB processing facility. Volume reduction method. 前記判定工程でPCB濃度が前記基準濃度を超過すると判定された前記安定器、前記詰替工程において前記詰替容器に前記コンデンサ領域と共に詰替えられる請求項1に記載のPCB汚染物の減容化方法。 Volume reduction of the determining step the ballast PCB concentration is determined to exceed the reference density in, PCB contamination of claim 1, which is instead packed together with the capacitor region in the refill container in the refill process Method. 前記判定工程でPCB濃度が前記基準濃度以下であると判定された前記変圧部領域のPCB濃度を再分析する再分析工程をさらに備え、
前記再分析工程においてPCB濃度が基準値を超過した前記変圧部領域、前記詰替工程において前記詰替容器に前記コンデンサ領域と共に詰替えられる請求項2に記載のPCB汚染物の減容化方法。
A reanalyzing step of reanalyzing the PCB concentration of the transformer part area determined in the determining step that the PCB concentration is equal to or lower than the reference concentration;
Wherein said transformer region of PCB concentration exceeds the reference value in the re-analysis process, volume reduction method of PCB contaminants, wherein said in claim 2, are re-packed with the capacitor region in the refill container in the refill process .
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