JP6521720B2 - プロセス制御のためのリアルタイム厚さ測定と共にテラヘルツ放射を用いる密度の動的測定 - Google Patents
プロセス制御のためのリアルタイム厚さ測定と共にテラヘルツ放射を用いる密度の動的測定 Download PDFInfo
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Description
Claims (20)
- ローラー圧縮成形されたリボンの密度を決定する方法であって、
乾燥薬剤粉体をローラー圧縮成形機のプレスローラーの間で圧縮成形して、圧縮成形体リボンを生成するステップと、
前記圧縮成形体リボンが前記プレスローラーの間から送り出された後に、該圧縮成形体リボンの或る点における厚さを非侵襲的に決定するステップと、
前記圧縮成形体リボンを、テラヘルツ放出器とテラヘルツ検出器との間のギャップを通過させるステップと、
前記圧縮成形体リボンの前記点における屈折率を、前記テラヘルツ放出器及びテラヘルツ検出器からの測定値並びに前記点における前記厚さの測定値を用いて決定するステップと、
前記圧縮成形体リボンの前記点における密度を、前記屈折率の値を用いて計算するステップと、
を有する方法。 - 前記厚さを決定するステップが、該厚さをレーザマイクロメータを用いて測定するステップを有する請求項1に記載の方法。
- 前記厚さを決定するステップが、
前記圧縮成形体リボンを2つのレーザマイクロメータの間のギャップを通過させるステップと、
前記厚さを決定するために前記2つのレーザマイクロメータから同時の読取情報を得るステップと、
を更に有する請求項2に記載の方法。 - 前記屈折率を決定するステップが、
前記圧縮成形体リボンの前記点に関して前記テラヘルツ放出器により放出されると共に前記テラヘルツ検出器により検出された放射パルスの飛行時間を決定するステップと、
該飛行時間及び前記厚さを用いて前記点における前記屈折率を計算するステップと、
を有する請求項1に記載の方法。 - 前記屈折率を決定するステップが、
前記テラヘルツ放出器及び前記テラヘルツ検出器をx方向に平行移動させて、前記圧縮成形体リボンの複数の点に関する屈折率の値を取得するステップ、
を更に有する請求項1に記載の方法。 - 前記厚さを決定するステップが、
1対のレーザマイクロメータを前記圧縮成形体リボンを横切りx方向に平行移動させて、前記複数の点に対応する厚さの値を取得するステップ、
を更に有する請求項5に記載の方法。 - 前記複数の点に関する密度の値を、前記複数の点に対応する各厚さの値及び各屈折率の値を用いて計算するステップ、
を更に有する請求項6に記載の方法。 - ローラー圧縮成形されたリボンの密度を決定する装置であって、
乾燥薬剤粉体をプレスローラーの間で圧縮成形して、圧縮成形体リボンを生成するローラー圧縮成形機と、
前記圧縮成形体リボンが前記プレスローラーの間から送り出された後に、該圧縮成形体リボンの或る点における厚さを非侵襲的に決定する少なくとも1つのレーザマイクロメータと、
前記圧縮成形体リボンの前記点を介してテラヘルツ放射パルスを放出するテラヘルツ放出器と、
前記テラヘルツ放射パルスを検出するテラヘルツ検出器と、
メモリと、
プロセッサと、
を有し、前記プロセッサが、
前記圧縮成形体リボンの前記点における屈折率を、前記テラヘルツ放出器及び前記テラヘルツ検出器からの測定値並びに前記厚さの測定値を用いて決定し、
前記圧縮成形体リボンの前記点における密度を、前記屈折率の値を用いて計算する、
ように構成される装置。 - 前記少なくとも1つのレーザマイクロメータは2つのレーザマイクロメータを有し、各レーザマイクロメータは前記圧縮成形体リボンの各側に配置され、前記厚さの測定値が前記2つのレーザマイクロメータから同時に得られる請求項8に記載の装置。
- 前記2つのレーザマイクロメータのうちの第1のものは前記テラヘルツ放出器に隣接して配置され、前記2つのレーザマイクロメータのうちの第2のものは前記テラヘルツ検出器に隣接して配置される請求項9に記載の装置。
- 前記テラヘルツ放出器及び前記テラヘルツ検出器からの前記測定値が、前記圧縮成形体リボンの前記点に関して前記テラヘルツ放出器により放出されると共に前記テラヘルツ検出器により検出された放射パルスの飛行時間を有する請求項8に記載の装置。
- 前記テラヘルツ放出器及び前記テラヘルツ検出器が、前記圧縮成形体リボンの複数の点に関する屈折率の値を取得するためにx方向に平行移動される請求項8に記載の装置。
- 前記少なくとも1つのレーザマイクロメータが、前記圧縮成形体リボンの前記複数の点に対応する厚さの値を取得するためにx方向に平行移動される請求項12に記載の装置。
- 前記プロセッサが、更に、前記複数の点に関する密度の値を前記複数の点に対応する各厚さの値及び各屈折率の値を用いて計算するよう構成される請求項13に記載の装置。
- 乾燥薬剤粉体をプレスローラーの間で圧縮成形して、圧縮成形体リボンを生成するローラー圧縮成形機と、
前記圧縮成形体リボンが前記プレスローラーの間から送り出された後に、該圧縮成形体リボンの複数の点における厚さを非侵襲的に決定する複数対のレーザマイクロメータであって、前記複数対のレーザマイクロメータは第1軸方向に互いに隣接して配置されて第2軸方向のリボンの流れに沿う専用のトラックを走査するようにし、各対のレーザマイクロメータが前記圧縮成形体リボンの前記複数の点のうちの単一の点における厚さを決定する複数対のレーザマイクロメータと、
複数のテラヘルツ放出器であって、各テラヘルツ放出器が前記圧縮成形体リボンの前記複数の点のうちの各点を介してテラヘルツ放射パルスを放出する複数のテラヘルツ放出器と、
複数のテラヘルツ検出器であって、各テラヘルツ検出器が前記圧縮成形体リボンの前記複数の点のうちの各点を通過した前記テラヘルツ放射パルスを検出する複数のテラヘルツ検出器と、
メモリと、
プロセッサと、
を有し、前記プロセッサが、
前記圧縮成形体リボンの前記複数の点の各々における屈折率を、前記テラヘルツ放出器及び前記テラヘルツ検出器からの各測定値並びに前記厚さの各測定値を用いて決定し、
前記圧縮成形体リボンの前記複数の点の各々における密度を、前記屈折率の各値を用いて計算する、
ように構成される試験器システム。 - 各対のレーザマイクロメータは2つのレーザマイクロメータを有し、各レーザマイクロメータは前記圧縮成形体リボンの各側に配置され、前記厚さの測定値が前記2つのレーザマイクロメータから同時に得られる請求項15に記載の試験器システム。
- 前記複数のテラヘルツ放出器の各々及び前記複数のテラヘルツ検出器の各々からの前記測定値が、前記圧縮成形体リボンの各点に関して各テラヘルツ放出器により放出されると共に各テラヘルツ検出器により検出された放射パルスの飛行時間を有する請求項15に記載の試験器システム。
- 前記複数対のレーザマイクロメータが、前記複数のテラヘルツ放出器及び前記複数のテラヘルツ検出器の対に隣接して配置される請求項15に記載の試験器システム。
- 前記テラヘルツ放射パルスが、直径が実質的に1〜6mmの範囲内のテラヘルツビームを用いて伝送される請求項15に記載の試験器システム。
- 前記プロセッサが、更に、前記複数の点における測定値に対応する複数の密度値を記録するように構成され、当該試験器システムが前記複数の密度値を表示するディスプレイを更に有する請求項15に記載の試験器システム。
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US14/273,252 US9417181B2 (en) | 2014-05-08 | 2014-05-08 | Dynamic measurement of density using terahertz radiation with real-time thickness measurement for process control |
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