JP6452415B2 - Structural analysis system - Google Patents

Description

  The present invention relates to a structure analysis system capable of measuring a vibration frequency, a vibration intensity, a natural vibration frequency, a displacement, and the like of a structure such as a bridge with a laser Doppler vibrometer system and checking a deformation such as a crack.

  Conventionally, a laser Doppler vibrometer system has been used to measure the vibration characteristics and displacement of structures such as bridges, to grasp the vibration characteristics and displacement of the structure, and to evaluate the soundness of the structure. It has been broken.

For example, Patent Document 1 (Japanese Patent Application Laid-Open No. 2008-281422) discloses a non-contact method in which a paint bullet is landed and a retroreflective coating is attached to a non-contact measuring device for vibration characteristics of a structure using laser light. There is disclosed a non-contact measurement system for vibration characteristics of a structure, which is provided with an apparatus for forming a measurement target surface.
JP 2008-281422 A

  In order to measure an entire huge structure such as a bridge using the conventional laser Doppler vibrometer system as described above, it is necessary to measure a plurality of vibration measurement target points, which requires a lot of measurement time. was there.

  Further, there is a problem that even if the structure is measured by the laser Doppler vibrometer system, the structure cannot be visually and intuitively evaluated.

  In order to solve the above problems, the structure analysis system according to the present invention is a laser Doppler vibrometer that acquires measurement data related to vibration of a structure and image data of the structure with the same optical axis. A stage that rotates about a vertical axis, and a frame that rotates about the horizontal axis on the stage, and the laser Doppler vibrometer is mounted on the frame, and the laser An information processing unit that issues a data acquisition command to the Doppler vibrometer unit, inputs measurement data acquired by the laser Doppler vibrometer unit, and image data, and outputs a control command for the electric pan head. The information processing unit acquires the measurement data and the image data from the laser Doppler vibrometer while sequentially driving the electric head. And butterflies.

  The structure analysis system according to the present invention is characterized in that the information processing unit joins image data.

  The structure analysis system according to the present invention is characterized in that the information processing unit extracts deformation data from the connected image data.

  Moreover, the structure analysis system according to the present invention is characterized in that the information processing unit superimposes the connected image data and measurement data.

  The structure analysis system according to the present invention is characterized in that the information processing unit superimposes the connected image data and deformation data.

  The structure analysis system according to the present invention is characterized in that the information processing unit calculates the position of the laser Doppler vibrometer unit from a known point.

  The structure analysis system of the present invention is configured to acquire measurement data and image data from the laser Doppler vibrometer while sequentially driving the electric pan head on which the laser Doppler vibrometer is mounted. According to the structure analysis system of the present invention, it is possible to greatly reduce the time for measuring the entire huge structure, and it is possible to evaluate the structure visually and intuitively.

1 is a schematic perspective view of a structure analysis system 100 according to an embodiment of the present invention. It is a block diagram of structure analysis system 100 concerning an embodiment of the present invention. It is a front view of the electrically-driven pan head 50 of the structure analysis system 100 which concerns on embodiment of this invention. It is a figure which shows the reference | standard target 200 used for the setting of the structure analysis system 100 which concerns on embodiment of this invention. It is a figure explaining the arrangement | positioning relationship of the measurement head part 13 and the distance meter 30, and the dimension of the reference | standard target 200. FIG. It is a flowchart of the measurement preparation procedure of the structure analysis system 100 which concerns on embodiment of this invention. It is a figure which shows typically the mode of the measurement preparation procedure of the structure analysis system 100 which concerns on embodiment of this invention. It is a flowchart explaining the acquisition method of parameter set (r, (theta), (phi)). It is a flow figure of this measurement by structure analysis system 100 concerning an embodiment of the present invention. It is a figure which shows typically the mode of this measurement of the structure analysis system 100 which concerns on embodiment of this invention. It is a flowchart of the data processing by the structure analysis system 100 which concerns on embodiment of this invention. It is a figure which shows the example of a data output by the structure analysis system 100 which concerns on embodiment of this invention.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a schematic perspective view of a structure analysis system 100 according to an embodiment of the present invention, and FIG. 2 is a block diagram of the structure analysis system 100 according to an embodiment of the present invention. FIG. 3 is a front view of the electric pan head 50 of the structure analysis system 100 according to the embodiment of the present invention.

  The laser Doppler vibrometer system 10 is a laser Doppler vibrometer system with a built-in camera (not shown), and the measurement data related to the vibration of the structure and the image data of the structure are the same through the measurement opening 15. It can be acquired with the optical axis.

  The laser Doppler vibrometer system 10 includes a measurement head unit 13 and an analysis unit 17 that analyzes measurement data and image data obtained by the measurement head unit 13 and transmits them to a personal computer 90 or the like. The measurement data relating to the vibration of the structure output from the analysis unit 17 includes at least the vibration frequency, vibration strength, natural vibration frequency, and displacement of the structure.

  As the laser Doppler vibrometer system 10 as described above, for example, RSV-150 manufactured by Polytec can be used.

  The laser Doppler vibrometer system 10 is communicably connected to a personal computer 90, and in accordance with a data acquisition command from the personal computer 90, measurement data such as vibration frequency, vibration intensity, natural vibration frequency, and displacement of the structure. And the image data of the structure are acquired and transmitted to the personal computer 90.

  In the structure analysis system 100 according to the embodiment of the present invention, a general-purpose personal computer 90 is used as an information processing apparatus. However, any structure having a data processing function can be used in the structure analysis system 100 according to the present invention. Other information processing apparatuses may be used. Further, instead of the general-purpose personal computer 90, a dedicated information processing circuit or the like can be used.

  The measurement head unit 13 of the laser Doppler vibrometer system 10 is mounted on the electric head 50. The electric head 50 includes a stage unit 60 that rotates about a vertical axis 63 by a drive mechanism including a motor and a gear (not shown). A rotation angle of the stage unit 60 in the horizontal plane is defined as a horizontal rotation angle θ.

  In addition, two standing portions 65 are provided on the stage portion 60, and a frame portion 70 that rotates about the horizontal shaft 73 is provided between the two standing portions 65. A rotation angle in the vertical plane of the frame unit 70 is defined as a vertical rotation angle φ.

  The electric camera platform 50 is communicably connected to the personal computer 90, and can adjust the horizontal rotation angle θ and the vertical rotation angle φ based on a drive command from the personal computer 90. Yes. Thereby, the measurement opening part 15 of the measurement head part 13 mounted in the frame part 70 can be turned to arbitrary directions.

  The stage unit 60 and the frame unit 70 are provided with a rotary encoder (not shown) so that information relating to the horizontal rotation angle θ and the vertical rotation angle φ can be fed back to the personal computer 90. .

  A distance meter 30 is also attached to the frame portion 70. The distance meter 30 measures the distance by laser light (not shown) emitted from the measurement opening 35 hitting the measurement object and receiving the reflected light again on the measurement opening 35 side.

  Here, in the measurement opening 35, the direction of the emitted laser light and the direction of the optical axis of the configuration for measurement in the measurement head unit 13 are parallel to each other. Therefore, the distance meter 30 measures the distance between the points in the structure measured by the laser Doppler vibrometer system 10. (However, as will be described later, strictly speaking, the distance meter 30 measures the distance between the distance meter 30 and a distance d from the measurement point in the structure measured by the laser Doppler vibrometer system 10. The distance data r measured by the distance meter 30 is transmitted to the personal computer 90 and used for data processing.

An accelerometer 40 is attached to the frame portion 70, and the vibration state of the electric head 50 itself can be monitored by the accelerometer 40. The acceleration data acquired by the accelerometer 40 is transmitted to the personal computer 90. On the personal computer 90 side, the timing of data acquisition by the laser Doppler vibrometer system 10 is set or the data acquired by the laser Doppler vibrometer system 10 is corrected according to the data obtained by the accelerometer 40. It becomes possible to do.

  Next, setting when acquiring data related to the structure S by the structure analysis system 100 configured as described above will be described. FIG. 4 is a diagram showing a reference target 200 used for setting of the structure analysis system 100 according to the embodiment of the present invention, and FIG. 4 (A) is the reference target 200 of the first aspect, and FIG. Is the reference target 200 of the second aspect. Both are different in the pattern of the image recognition target 250 and are otherwise identical.

  The reference target 200 has a vertical shaft member 205. The reference target 200 is a target for determining the position (self-position) where the measurement head unit 13 is installed in the electric head 50 of the structure analysis system 100 with the vertical shaft member 205 attached to a base (not shown) or the like. Used as A support member 210 having a substantially U shape is attached to the vertical shaft member 205, and a horizontal shaft member 215 is passed to the support member 210 at two ends of the support member 210. Is provided. A reflective surface 230 is attached to the horizontal shaft member 215. The reflecting surface 230 is assumed to reflect laser light (not shown) emitted from the distance meter 30.

  In addition, an extending portion 240 is provided below the reflecting surface 230, and the image recognition target 250 is attached to the extending portion 240. This image recognition target 250 is assumed to be photographed by the camera function of the laser Doppler vibrometer system 10 and transmitted to the personal computer 90. The image recognition target 250 is color-coded in white and black so that the image recognition target 250 can be easily recognized by the image recognition technology in the personal computer 90.

  Here, the distance between the center of the reflecting surface 230 in the reference target 200 and the center of the image recognition target 250 is d. This distance d corresponds to the distance between the center of the measurement opening 15 of the measurement head unit 13 and the center of the measurement opening 35 of the distance meter 30. FIG. 5 is a diagram for explaining the arrangement relationship between the measurement head unit 13 and the distance meter 30 and the dimensions of the reference target 200.

  As described above, since the distance d between the center of the reflecting surface 230 and the center of the image recognition target 250 is determined, the distance d is more accurately mounted on the electric head 50 based on the reference target 200. The self-position of the measurement head unit 13 can be obtained.

  Further, in the structure analysis system 100 according to the present invention, it is possible to easily and appropriately install the electric head 50 of the structure analysis system 100 using the reference target 200 as described above, which is an expensive system. It is not necessary to always install a set near the structure to be analyzed, and costs can be saved.

  Next, measurement preparation after the electric pan head 50 of the structure analysis system 100 is installed will be described. FIG. 6 is a flowchart of a measurement preparation procedure of the structure analysis system 100 according to the embodiment of the present invention. This flowchart is not executed only by the personal computer 90.

Moreover, FIG. 7 is a figure which shows typically the mode of the measurement preparation procedure of the structure analysis system 100 which concerns on embodiment of this invention. In the present embodiment, the following description will be given on the assumption that the structure analysis system 100 analyzes the structure S such as a bridge. Further, it is assumed that the three position coordinates (x _o1 , y _o1 , z _o1 ), (x _o2 , y _o2 , z _o2 ), and (x _o3 , y _o3 , z _o3 ) are known.

In step S101 in the measurement preparation flow diagram of FIG. 6, the reference target is set so that the center of the image recognition target 250 of the reference target 200 is at a known position coordinate (for example, (x _o1 , _{yo 1} , z _o1 )). Set 200. When the reference target 200 is set, known position coordinates are specified separately by a total station or the like.

  Subsequently, in step S102, the image recognition target 250 is captured by the measurement head unit 13, the distance data r measured by the distance meter 30 at that time, the horizontal rotation angle θ and the vertical rotation angle φ of the electric head 50. Parameter set (r, θ, φ).

  The method at this time will be described with reference to the flowchart of FIG. FIG. 8 is a flowchart for explaining a method for acquiring the parameter set (r, θ, φ).

  In step S201, the drive command for the horizontal rotation angle θ and the vertical rotation angle φ is adjusted to be appropriate θ and φ for the electric camera platform 50. Appropriate θ and φ are θ and φ such that the image recognition target 250 is within the field of view of the camera function of the laser Doppler vibrometer system 10.

  In subsequent step S202, image data is acquired by the measurement head unit 13 of the laser Doppler vibrometer system 10.

  In step S203, it is determined whether or not the center of the image recognition target 250 matches the center of the image data. If the determination result at this time is YES, the measurement opening 15 of the measurement head unit 13 is aiming at the image recognition target 250 in an appropriate posture, and thus the process proceeds to step S204 and the distance data of the distance meter 30 is obtained. r is acquired and stored, and in step S205, θ and φ at that time are stored, and the process proceeds to step S206 to end the process.

  If the decision result in the step S203 is NO, the process returns to the step S201, and the attitude of the electric camera platform 50 is adjusted again so that appropriate θ and φ are obtained. At this time, appropriate θ and φ may be determined based on image analysis of the image data.

  Returning to the flowchart of FIG. 6, in step S <b> 103, it is determined whether the process of obtaining the parameter set (r, θ, φ) for three known points has been executed. If this determination is NO, the process returns to step S101, the reference target 200 is set to other known points, and the parameter set (r, θ, φ) is acquired for other known points in step S102. Run.

On the other hand, if the determination in step S103 is YES,
Known point _{(x o1, y o1, z} o1) parameters corresponding to _{(r o1, θ o1, φ} o1)
Known point _{(x o2, y o2, z} o2) parameters corresponding to _{(r o2, θ o2, φ} o2)
Known point _{(x o3, y o3, z} o3) parameters corresponding to _{(r o3, θ o3, φ} o3)
Therefore, the process proceeds to step S104, and the self-position (x _o ,
y _o , z _o ) is obtained by calculation.

  In step S105, the process ends.

Next, after performing the measurement preparation as described above, the main measurement by the structure analysis system 100 is executed. FIG. 9 is a flowchart of the main measurement by the structure analysis system 100 according to the embodiment of the present invention. Moreover, FIG. 10 is a figure which shows typically the mode of the main measurement of the structure analysis system 100 which concerns on embodiment of this invention. In the following flowchart, the suffix n is used for the current process, and n + 1 is used for the next process.

  First, when performing the main measurement, the electric head 50 is appropriately adjusted so that the image data obtained by the measurement head unit 13 has the first angle of view. In the structure analysis system 100 according to the present invention, the measurement head unit 13 is sequentially driven by the electric camera platform 50, data acquisition at “first field angle” → data acquisition at “second field angle” → “ Data acquisition related to the structure S is performed by repeating the process of data acquisition at “third angle of view” → data acquisition at “fourth angle of view” →.

  Thus, in the structure analysis system 100 according to the present invention, it is possible to significantly reduce the time for measuring the entire huge structure S using the electric pan head 50.

  When the main measurement process is started in step S300, it is determined in step S301 whether or not the data acquired from the accelerometer 40 is equal to or less than a predetermined value. In the structure analysis system 100 according to the present invention, after the electric pan head 50 is driven as described above, data acquisition is performed. It is conceivable that vibration of a drive mechanism (not shown) remains in the electric camera platform 50 after the electric camera platform 50 is driven. Therefore, measurement data is acquired when the determination in step S301 is YES.

  When determination by step S301 becomes YES, it progresses to step S302 and the acceleration data of the said accelerometer 40 are memorize | stored. This is because such acceleration data may be used for correcting measurement data of the laser Doppler vibrometer system 10.

In step S303, a command to acquire data is issued to the laser Doppler vibrometer system 10, and in step S304, measurement data (vibration frequency, vibration intensity, natural vibration frequency, displacement) acquired from the laser Doppler vibrometer system 10, an image Data, (r _n , θ _n , φ _n ) at the center of the image is stored.

In step S305, the self position is referred to, (r _n , θ _n , φ _n ) is converted into (x _n , y _n , z _n ) and stored.

  In step S306, it is determined whether or not all angles of view of the target structure S have been photographed. If YES, the process proceeds to step S310, and if NO, the process proceeds to step S307.

In step S307, from the current (x _n , y _n , z _n ), the angle of view to be measured / photographed next (
x _{n + 1} , y _{n + 1} , z _{n + 1} ) are determined. In determining such an angle of view, this angle of view,
The next angle of view may be slightly overlapped. In addition, suitable image processing software can be used to determine such an angle of view.

In step S308, (θ _{n + 1} , φ _{n + 1} ) corresponding to the field angle to be photographed next determined in step S307 is calculated, and in step S309, the calculated (θ _{n + 1} ) is calculated. ,
Based on (φ _{n + 1} ), the electric head 50 is driven and controlled, and the process returns to step S301 again.

In the main measurement of the structure analysis system 100 according to the present invention as described above, measurement data (vibration frequency, vibration intensity, natural vibration frequency, displacement), image data, and measurement points at the center of the image are obtained for each angle of view. Next, the position coordinate table (x, y, z) and the corresponding parameter set (r, θ, φ) will be obtained. Next, the data processing of the data acquired by the main measurement as described above will be described. To do. FIG. 11 is a flowchart of data processing by the structure analysis system 100 according to the embodiment of the present invention.

  In FIG. 11, when the data processing is performed in step S400, in the subsequent step S401, image processing for joining the captured image data of all angles of view is executed.

  In the next step S402, deformation data such as cracks is extracted from the images connected in step S401 based on an image recognition technique.

  In step S403, measurement data (here, vibration frequency is taken as an example, but any of vibration frequency, vibration intensity, natural vibration frequency, and displacement may be used) is superimposed on image data for all angles of view. For example, when displaying by color-coded according to the magnitude of the vibration frequency, since one measurement data is acquired for one angle of view, one color is superimposed on one angle of view. Will be.

  In the next step S404, the extracted deformation data is superimposed on the image data for all the angles of view. By superimposing such deformation data on the image data, the relationship between the measurement data and the deformation data can be grasped visually and intuitively.

  In the subsequent step S405, as described above, the image data on which the measurement data and the deformation data are superimposed is displayed on the display means of the personal computer 90, or from a printer (not shown) connected to the personal computer 90. An output process such as printing is executed, and the process ends in step S406.

  FIG. 12 is an example of data output output in step S405. In this example, image data displayed in different colors is output according to the magnitude of the vibration frequency. However, the method of superimposing the measurement data such as vibration frequency on the image data is not limited to the color coding of this example, and it is displayed by contour lines, displayed by shading, displayed by graph, polygon, Can also be displayed.

  As described above, the structure analysis system 100 of the present invention acquires measurement data and image data from the laser Doppler vibrometer system 10 while sequentially driving the electric camera platform 50 on which the laser Doppler vibrometer system 10 is mounted. According to the structure analysis system 100 of the present invention, the time for measuring the entire huge structure can be greatly reduced, and the structure is visually and intuitively evaluated. It becomes possible to do.

DESCRIPTION OF SYMBOLS 10 ... Laser Doppler vibrometer system 13 ... Measurement head part 15 ... Measurement opening part 17 ... Analysis part 30 ... Distance meter 35 ... Measurement opening part 40 ... Accelerometer 50 ..Electric pan head 60... Stage part 63... Vertical axis 65 .. standing part 70 .. frame part 73 .. horizontal axis 90. 200 ... reference target 205 ... vertical shaft member 210 ... support member 215 ... horizontal shaft member 230 ... reflecting surface 240 ... extended portion 250 ... image recognition target S ... ·Structure

Claims (6)

Laser Doppler vibrometer unit that acquires measurement data related to the vibration of the structure and image data of the structure with the same optical axis,
A stage that rotates about a vertical axis, and a frame that rotates about a horizontal axis on the stage, and an electric pan head on which the laser Doppler vibrometer is mounted on the frame;
Information processing that issues a data acquisition command to the laser Doppler vibrometer unit, inputs measurement data and image data acquired by the laser Doppler vibrometer unit, and outputs a control command for the electric pan head And consists of
The information processing unit acquires measurement data and image data from the laser Doppler vibrometer while sequentially driving the electric pan head. The structure analysis system according to claim 1, wherein the information processing unit joins image data. The structure analysis system according to claim 2, wherein the information processing unit extracts deformation data from the connected image data. The structure analysis system according to claim 2 or 3, wherein the information processing unit superimposes the connected image data and measurement data. 5. The structure analysis system according to claim 3, wherein the information processing unit superimposes the connected image data and deformation data. 6. Structure Analysis system according to any one of claims 1 to 5 wherein the information processing unit, characterized in that for calculating the position of the laser Doppler vibrometer portion from a known point.

Images