JP6441786B2 - テスト支援装置、テスト支援方法、及びプログラム - Google Patents

テスト支援装置、テスト支援方法、及びプログラム Download PDF

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Publication number
JP6441786B2
JP6441786B2 JP2015237213A JP2015237213A JP6441786B2 JP 6441786 B2 JP6441786 B2 JP 6441786B2 JP 2015237213 A JP2015237213 A JP 2015237213A JP 2015237213 A JP2015237213 A JP 2015237213A JP 6441786 B2 JP6441786 B2 JP 6441786B2
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Japan
Prior art keywords
test
screen
information
test scenario
scenario
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JP2015237213A
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Japanese (ja)
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JP2017102807A (ja
JP2017102807A5 (enExample
Inventor
玄太 是木
玄太 是木
前岡　淳
淳 前岡
中村　秀樹
秀樹 中村
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Hitachi Ltd
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Hitachi Ltd
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Priority to JP2015237213A priority Critical patent/JP6441786B2/ja
Priority to CN201610141869.7A priority patent/CN106844191A/zh
Priority to US15/071,675 priority patent/US20170161181A1/en
Publication of JP2017102807A publication Critical patent/JP2017102807A/ja
Publication of JP2017102807A5 publication Critical patent/JP2017102807A5/ja
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Prevention of errors by analysis, debugging or testing of software
    • G06F11/3668—Testing of software
    • G06F11/3672—Test management
    • G06F11/3688—Test management for test execution, e.g. scheduling of test suites
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Prevention of errors by analysis, debugging or testing of software
    • G06F11/3668—Testing of software
    • G06F11/3672—Test management

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Debugging And Monitoring (AREA)
JP2015237213A 2015-12-04 2015-12-04 テスト支援装置、テスト支援方法、及びプログラム Active JP6441786B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2015237213A JP6441786B2 (ja) 2015-12-04 2015-12-04 テスト支援装置、テスト支援方法、及びプログラム
CN201610141869.7A CN106844191A (zh) 2015-12-04 2016-03-14 测试辅助装置以及测试辅助方法
US15/071,675 US20170161181A1 (en) 2015-12-04 2016-03-16 Testing support system, and testing support method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015237213A JP6441786B2 (ja) 2015-12-04 2015-12-04 テスト支援装置、テスト支援方法、及びプログラム

Publications (3)

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JP2017102807A JP2017102807A (ja) 2017-06-08
JP2017102807A5 JP2017102807A5 (enExample) 2018-03-29
JP6441786B2 true JP6441786B2 (ja) 2018-12-19

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JP2015237213A Active JP6441786B2 (ja) 2015-12-04 2015-12-04 テスト支援装置、テスト支援方法、及びプログラム

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US (1) US20170161181A1 (enExample)
JP (1) JP6441786B2 (enExample)
CN (1) CN106844191A (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10984438B2 (en) * 2017-07-28 2021-04-20 Ingram Micro Inc. Technologies for automatically validating the functionality of offers in a cloud service brokerage system
US11281763B2 (en) * 2018-11-13 2022-03-22 Microsoft Technology Licensing, Llc Integrated development environment information sharing for authentication provisioning
JP7211228B2 (ja) * 2019-04-09 2023-01-24 日本電信電話株式会社 解析装置、解析方法、及びプログラム
WO2021005686A1 (ja) * 2019-07-08 2021-01-14 日本電信電話株式会社 自動連携装置、自動連携方法、および自動連携プログラム
CN114116468B (zh) * 2021-11-17 2025-10-28 杭州网易云音乐科技有限公司 一种应用测试方法、装置、电子设备及存储介质
JP7093144B1 (ja) 2022-04-26 2022-06-29 Ｇｃ株式会社 テスト支援プログラム、テスト支援装置、ならびに、テスト支援方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8065204B2 (en) * 2005-09-29 2011-11-22 Sony Corporation System and method for software integration and factory deployment
JP4899971B2 (ja) * 2007-03-27 2012-03-21 富士通株式会社 テスト仕様書作成プログラム、テスト仕様書作成装置、およびテスト仕様書作成方法
US9104815B1 (en) * 2011-05-08 2015-08-11 Panaya Ltd. Ranking runs of test scenarios based on unessential executed test steps
JP5677924B2 (ja) * 2011-09-30 2015-02-25 株式会社日立ソリューションズ テスト自動化システム
US8954931B2 (en) * 2012-08-03 2015-02-10 Sap Se System test scope and plan optimization
CN103810091B (zh) * 2012-11-12 2018-11-23 百度在线网络技术（北京）有限公司 一种用于实现页面测试的方法和设备
CN103984624A (zh) * 2014-04-29 2014-08-13 北京京东尚科信息技术有限公司 一种网页自动化测试方法及系统
US9489289B2 (en) * 2014-12-09 2016-11-08 Sap Se Adaptive framework automatically prioritizing software test cases

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Publication number Publication date
JP2017102807A (ja) 2017-06-08
US20170161181A1 (en) 2017-06-08
CN106844191A (zh) 2017-06-13

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