JP6361570B2 - Multilayer ceramic capacitor orientation discrimination method, multilayer ceramic capacitor orientation discrimination device, and multilayer ceramic capacitor series manufacturing method - Google Patents

Description

The present invention, attitude determination method of a multilayer ceramic capacitor, attitude determination apparatus of a multilayer ceramic capacitor, and relates to the production how the multilayer ceramic capacitor communication.

  A laminated ceramic capacitor including a laminated internal electrode layer containing a magnetic material and a dielectric ceramic layer (hereinafter sometimes referred to as a capacitor) has an internal electrode layer mounted on a mounting surface when mounted on a substrate. There are a direction that is perpendicular to the direction and a direction that is parallel to the direction.

  It is difficult to distinguish the stacking direction of the internal electrodes from the appearance of the capacitor. In particular, after the capacitor is taped and packaged, the appearance of the capacitor is seen through the cover film, so it is difficult to confirm the difference in appearance, and it is extremely difficult to determine the stacking direction of the internal electrodes.

  As prior literatures that disclose a method for identifying the direction of a capacitor, there are Japanese Patent Laid-Open No. 7-115033 (Patent Document 1) and Japanese Patent Laid-Open No. 2014-130912 (Patent Document 2).

  In the capacitor direction identification method described in Patent Document 1, a constant magnetic field is applied to the capacitor, the magnetization state of the capacitor is measured, and the direction of the internal electrode layer is identified by the strength of magnetization.

  In the capacitor direction identification method described in Patent Document 2, a capacitor is passed between a magnetic generator and a measuring instrument, and a change in magnetic flux density at least when the capacitor passes is measured. The stacking direction of the internal electrode layers in the capacitor is identified based on the measurement result of the magnetic flux density.

  The determination of the stacking direction of the internal electrode layers may be rephrased as a determination of a main surface orthogonal to the stacking direction and a side surface extending along the stacking direction in the capacitor. The main surface includes a first main surface included in the first outer layer and a second main surface included in the second outer layer. In the conventional capacitor, the first main surface is distinguished from the second main surface. There was no need to do.

JP 7-115033 A JP 2014-130912 A

  In recent years, capacitors having different thicknesses of the first outer layer and the second outer layer may be manufactured. In this capacitor, it is preferable that the directions of the first main surface and the second main surface are determined before being mounted on the substrate.

  In the above prior art method, it is difficult to determine the direction in which the first main surface and the second main surface of the capacitor face.

The present invention has been made in view of the above problems, and can determine the orientation of the first ceramic surface and the second main surface of the multilayer ceramic capacitor. and to provide the attitude determination system, and the manufacturing how the multilayer ceramic capacitor communication.

  A method for determining the orientation of a multilayer ceramic capacitor according to the present invention includes a first outer layer including a first main surface, a second outer layer that is thicker than the first outer layer and includes a second main surface, and the first outer layer and the second outer layer. A multilayer ceramic capacitor including a plurality of dielectric layers and a plurality of internal electrode layers alternately stacked between the first and second main surfaces of the multilayer ceramic capacitor. This is a posture discrimination method. The method of determining the orientation of the multilayer ceramic capacitor includes a step of passing the multilayer ceramic capacitor in front of the magnetic generator and in front of the measuring instrument, and a step of measuring the magnetic flux density when the multilayer ceramic capacitor passes in front of the measuring instrument. The direction in which the first main surface and the second main surface face by determining the magnitude relationship between the determination target value based on the magnetic flux density measured in the step of measuring the magnetic flux density and at least one threshold value And an attitude discrimination step for discriminating between. In the posture determination step, when the determination target value is lower than the first threshold, it is determined that the second main surface faces the measuring instrument.

  In one form of this invention, in the said attitude | position discrimination | determination process, when a determination target value is lower than a 2nd threshold value higher than a 1st threshold value, and is higher than a 1st threshold value, a 1st main surface faces a measuring device. It is determined that

  In one embodiment of the present invention, the determination target value is a cumulative value of the magnetic flux density measured in the step of measuring the magnetic flux density.

  A multilayer ceramic capacitor orientation determination device according to the present invention includes a first outer layer including a first main surface, a second outer layer that is thicker than the first outer layer and includes a second main surface, and the first outer layer and the second outer layer. A multilayer ceramic capacitor including a plurality of dielectric layers and a plurality of internal electrode layers alternately stacked between the first and second main surfaces of the multilayer ceramic capacitor. It is a posture discrimination device. Multilayer ceramic capacitor orientation determination apparatus includes a magnetic generator, a measuring instrument for measuring magnetic flux density, a transport mechanism for transporting the multilayer ceramic capacitor and passing in front of the magnetic generator and the measuring instrument, and the multilayer ceramic capacitor. By determining the magnitude relationship between the determination target value based on the magnetic flux density measured by the measuring instrument when it passes in front of the measuring instrument and at least one threshold value, the first main surface and the second main surface A posture discriminating unit for discriminating the direction in which the head is facing. The posture determination unit determines that the second main surface faces the measuring instrument when the determination target value is lower than the first threshold value.

  In one aspect of the present invention, the posture determination unit has the first main surface facing the measuring instrument when the determination target value is lower than the second threshold value higher than the first threshold value and higher than the first threshold value. It is determined that there is.

  In one embodiment of the present invention, the determination target value is a cumulative value of magnetic flux density measured by a measuring instrument.

  A method of manufacturing a multilayer ceramic capacitor series according to the present invention includes a first outer layer including a first main surface, a second outer layer that is thicker than the first outer layer and includes a second main surface, and the first outer layer and the second outer layer. Is a method of manufacturing a multilayer ceramic capacitor series including a plurality of multilayer ceramic capacitors including a plurality of dielectric layers and a plurality of internal electrode layers alternately stacked with each other. The method of manufacturing a multilayer ceramic capacitor series includes a step of passing a plurality of multilayer ceramic capacitors in front of a magnetic generator and a measuring instrument, and a magnetic flux when each of the plurality of multilayer ceramic capacitors passes in front of a measuring instrument. By determining the magnitude relationship between the determination target value based on the magnetic flux density measured in the step of measuring the density and the magnetic flux density and the at least one threshold value, the first main surface and the second main surface And a posture discrimination step for discriminating the direction in which the main surface faces. In the posture determination step, when the determination target value is lower than the first threshold, it is determined that the second main surface faces the measuring instrument.

  In one aspect of the present invention, the method for manufacturing a multilayer ceramic capacitor series further includes a step of aligning the directions of the second main surfaces of the plurality of multilayer ceramic capacitors to each other.

  In one aspect of the present invention, the method for manufacturing a multilayer ceramic capacitor series includes a plurality of concave portions of the tape in the same posture after the step of aligning the directions of the second main surfaces to each other. The method further includes a step of housing the container.

  In one aspect of the present invention, the method for manufacturing a multilayer ceramic capacitor series further includes a step of aligning the stacking directions of the plurality of internal electrode layers of each of the plurality of multilayer ceramic capacitors before the step of measuring the magnetic flux density. Prepare.

  In one aspect of the present invention, the method for manufacturing a multilayer ceramic capacitor series further includes a step of manufacturing a plurality of multilayer ceramic capacitors. In the step of manufacturing the plurality of multilayer ceramic capacitors, the dielectric layer constituting the first outer layer and the dielectric layer constituting the second outer layer are formed of substantially the same ceramic material system.

  In one aspect of the present invention, in the step of manufacturing the plurality of multilayer ceramic capacitors, a plurality of first ceramic sheets are stacked to form a first outer layer, and a plurality of second ceramic sheets are stacked to form a second outer layer. Form. The plurality of first ceramic sheets and the plurality of second ceramic sheets are cut out from a common mother ceramic sheet.

  The multilayer ceramic capacitor series according to the present invention includes a plurality of multilayer ceramic capacitors and a tape having a plurality of recesses for accommodating the plurality of multilayer ceramic capacitors one by one. Each of the plurality of multilayer ceramic capacitors includes a first outer layer including a first main surface, a second outer layer thicker than the first outer layer and including a second main surface, and between the first outer layer and the second outer layer. And a plurality of dielectric layers and a plurality of internal electrode layers stacked alternately. The directions of the second main surfaces of the plurality of multilayer ceramic capacitors accommodated in the plurality of recesses are aligned with each other.

  In one embodiment of the present invention, each of the plurality of multilayer ceramic capacitors is magnetized.

  In one aspect of the present invention, in each of the plurality of multilayer ceramic capacitors, the difference between the thickness of the second outer layer and the thickness of the first outer layer is 30 μm or more.

  In one embodiment of the present invention, in each of the plurality of multilayer ceramic capacitors, the dielectric layer constituting the first outer layer and the dielectric layer constituting the second outer layer are the same ceramic material system.

  In one embodiment of the present invention, the detected color distributions of the first main surface and the second main surface partially overlap in each of the plurality of multilayer ceramic capacitors.

  In one embodiment of the present invention, in each of the plurality of multilayer ceramic capacitors, the first ceramic sheet that is a material of the dielectric layer that constitutes the first outer layer and the first ceramic material that is the material of the dielectric layer that constitutes the second outer layer. The two ceramic sheets are cut out from a common mother ceramic sheet.

  According to the present invention, the direction in which the first main surface and the second main surface of the multilayer ceramic capacitor face can be determined.

It is a perspective view which shows the external appearance of the capacitor | condenser which concerns on Embodiment 1 of this invention. It is sectional drawing which looked at the capacitor | condenser of FIG. 1 from the II-II line arrow direction. It is a side view which shows the structure of the attitude | position discrimination | determination apparatus of the capacitor | condenser which concerns on Embodiment 1 of this invention. It is sectional drawing which shows the structure of the capacitor | condenser series which concerns on Embodiment 1 of this invention. It is sectional drawing which shows the magnetic force line in the state where the capacitor | condenser is not located between a magnetic generator and a measuring device. A magnetic field line is shown between the magnetic generator and the measuring instrument in a state in which the capacitor in the first posture is located with the first main surface facing the magnetic generator and the second main surface facing the measuring instrument. It is sectional drawing. A magnetic field line is shown between the magnetic generator and the measuring instrument in a state where the second main surface faces the magnetic generator and the capacitor in the second posture is positioned with the first main surface facing the measuring instrument. It is sectional drawing. Sectional drawing which shows the line of magnetic force in the state where the capacitor | condenser of the 3rd attitude | position which the 1st side surface faces a magnetic generator and the 2nd side surface faces a measuring device is located between a magnetic generator and a measuring device It is. Sectional drawing which shows the line of magnetic force in the state where the capacitor | condenser of the 4th attitude | position with the 2nd side surface facing a magnetic generator and the 1st side surface facing a measuring device is located between a magnetic generator and a measuring device It is. It is a graph which shows a time-dependent change of the magnetic flux density when each capacitor | condenser of a 1st attitude | position, a 2nd attitude | position, a 3rd attitude | position, and a 4th attitude | position passes the front of a measuring device. It is a graph which shows the cumulative value of the magnetic flux density when each capacitor | condenser of a 1st attitude | position, a 2nd attitude | position, a 3rd attitude | position, and a 4th attitude | position passes the front of a measuring device. It is a graph which shows the cumulative value of the magnetic flux density when each capacitor | condenser of samples 1-3 passes in front of a measuring device in Experimental example 1. FIG. The measurement result of the magnetic flux density by the measuring instrument when the difference between the thickness of the first outer layer and the thickness of the second outer layer is so small that the maximum posture of the magnetic flux density is the determination target value and the capacitor posture cannot be determined. It is a graph. The graph which shows the measurement result of the magnetic flux density by a measuring instrument when the difference between the thickness of the first outer layer and the thickness of the second outer layer is large enough to determine the posture of the capacitor with the maximum value of the magnetic flux density as the determination target value It is. It is a top view which shows the structure of the attitude | position discrimination | determination apparatus of the capacitor | condenser which concerns on Embodiment 2 of this invention. It is a top view which shows the structure of the linear conveyance mechanism of the attitude | position discrimination device of the capacitor | condenser which concerns on Embodiment 2 of this invention. It is a top view which shows the structure of the attitude | position discrimination | determination apparatus of the capacitor | condenser which concerns on Embodiment 3 of this invention. It is an enlarged plan view which shows the structure of the rotation conveyance mechanism of the attitude | position discrimination device of the capacitor | condenser which concerns on Embodiment 3 of this invention. It is a side view which shows the structure of the attitude | position discrimination | determination apparatus of the capacitor | condenser which concerns on Embodiment 4 of this invention.

  Hereinafter, a multilayer ceramic capacitor attitude determination method, a multilayer ceramic capacitor attitude determination apparatus, a multilayer ceramic capacitor series manufacturing method, and a multilayer ceramic capacitor series according to each embodiment of the present invention will be described with reference to the drawings. In the following description of the embodiments, the same or corresponding parts in the drawings are denoted by the same reference numerals, and the description thereof will not be repeated.

(Embodiment 1)
First, the configuration of the capacitor according to Embodiment 1 of the present invention will be described. FIG. 1 is a perspective view showing an external appearance of a capacitor according to Embodiment 1 of the present invention. FIG. 2 is a cross-sectional view of the capacitor of FIG. 1 as viewed from the direction of arrows II-II.

  As shown in FIGS. 1 and 2, the capacitor 1 includes a ceramic body 10. The ceramic body 10 has a substantially rectangular parallelepiped shape. Specifically, the ceramic body 10 has a regular quadrangular prism shape. The ceramic body 10 has first and second main faces 10a and 10b, first and second side faces 10c and 10d, and first and second end faces 10e and 10f.

  Each of the first and second main surfaces 10a and 10b extends along the length direction L and the width direction W. The first main surface 10a and the second main surface 10b are parallel to each other. Each of the first and second side surfaces 10c and 10d extends along the length direction L and the height direction H. The first side surface 10c and the second side surface 10d are parallel to each other. Each of the first and second end faces 10e, 10f extends along the width direction W and the height direction H. The first end face 10e and the second end face 10f are parallel to each other.

The ceramic body 10 is made of a material whose main component is a dielectric ceramic. Specific examples of the dielectric ceramic include BaTiO ₃ , CaTiO ₃ , SrTiO ₃ , and CaZrO ₃ . For example, at least one subcomponent such as a Mn compound, a Mg compound, a Si compound, a Co compound, a Ni compound, and a rare earth compound may be appropriately added to the ceramic body 10.

  The “substantially rectangular parallelepiped” includes a rectangular parallelepiped whose corners or ridge lines are chamfered and a rectangular parallelepiped whose corners or ridge lines are rounded.

As shown in FIG. 2, the ceramic body 10 is formed of a dielectric layer, and includes a first outer layer 15a including the first main surface 10a, a dielectric layer thicker than the first outer layer 15a, and a second main surface. A second outer layer 15b including 10b, and a plurality of internal electrode layers 11 and 12 stacked alternately with dielectric layers between the first outer layer 15a and the second outer layer 15b. That is, the thickness T ₁ of the first outer layer 15a, and the thickness T ₂ of the second outer layer 15b, satisfy the relationship of T ₁ <T _2.

  In the present embodiment, in each of the plurality of capacitors 1, the dielectric layer constituting the first outer layer 15a and the dielectric layer constituting the second outer layer 15b are substantially the same ceramic material system. Substantially the same ceramic material system, the mixing ratio of the ceramic material that is the raw material is substantially the same, and the range of variation in the ceramic composition due to the mixing ratio and the variation in the processing process is substantially the same as the ceramic material system. included.

  Specifically, in each of the plurality of capacitors 1, a first ceramic sheet serving as a material for the dielectric layer constituting the first outer layer 15a and a second ceramic serving as a material for the dielectric layer constituting the second outer layer 15b. The sheet is cut out from a common mother ceramic sheet. That is, the first ceramic sheet and the second ceramic sheet are ceramic sheets produced by the same manufacturing method using the same ceramic raw materials and additives. By laminating the second ceramic sheet more than the first ceramic sheet, the second outer layer 15b can be made thicker than the first outer layer 15a, and the multilayer ceramic capacitor can be manufactured efficiently.

  Therefore, it is difficult to distinguish the first main surface 10a and the second main surface 10b of the capacitor 1 by color. Specifically, in each of the plurality of capacitors 1, the color distributions detected by the optical sensors (for example, cameras) of the first main surface 10a and the second main surface 10b are at least partially overlapped. That is, in each of the plurality of capacitors 1, the first main surface 10a and the second main surface 10b are processed by processing images obtained by capturing the first main surface 10a and the second main surface 10b with a camera. Is difficult to accurately determine. Even in such a case, it is possible to discriminate between the first main surface 10a and the second main surface 10b by using the capacitor posture determination method according to the present embodiment.

  In the capacitor posture determination method according to the present embodiment, since it is not necessary to use the color difference between the first main surface 10a and the second main surface 10b, the first outer layer is provided to provide the color difference. There is no need to separate the ceramic material system of the dielectric layer constituting the dielectric layer 15a and the ceramic material system of the dielectric layer constituting the second outer layer 15b, and the electrical characteristics of the capacitor are adversely affected by separating the ceramic material system. It can be prevented from occurring.

  In the ceramic body 10, the internal electrode layers 11 and the internal electrode layers 12 are alternately stacked along the height direction H. Each of the plurality of internal electrode layers 11 and 12 is provided in parallel with the length direction L and the width direction W. A dielectric layer 15 is disposed between the internal electrode layer 11 and the internal electrode layer 12 that are adjacent in the height direction H. That is, the internal electrode layer 11 and the internal electrode layer 12 which are adjacent in the height direction H are opposed to each other with the dielectric layer 15 interposed therebetween.

  The internal electrode layer 11 is drawn out to the first end face 10e. An external electrode 13 is provided so as to cover the first end face 10e. The external electrode 13 is electrically connected to the internal electrode layer 11. The internal electrode layer 12 is drawn out to the second end face 10f. An external electrode 14 is provided so as to cover the second end face 10f. The external electrode 14 is electrically connected to the internal electrode layer 12.

  The internal electrode layers 11 and 12 are made of a magnetic material such as Ni. The external electrodes 13 and 14 are made of an appropriate conductive material such as Ni, Cu, Ag, Pd, Au, or an Ag—Pd alloy, for example.

  Next, the configuration of the capacitor attitude determination device according to the first embodiment of the present invention will be described. FIG. 3 is a side view showing the configuration of the capacitor attitude determination device according to the first embodiment of the present invention. FIG. 4 is a cross-sectional view showing the configuration of the capacitor series according to Embodiment 1 of the present invention. In FIG. 4, the capacitor | condenser series 2 of the part which has passed between the magnetic generator 31 and the measuring device 32 which are mentioned later is shown.

  The capacitor orientation determination device 3 according to the first exemplary embodiment of the present invention determines the direction in which the first main surface 10a and the second main surface 10b of the capacitor 1 face. As shown in FIGS. 3 and 4, the posture determination device 3 includes a magnetic generator 31, a measuring device 32, a transport mechanism 35, and a posture determination unit 36. The magnetic generator 31 is composed of a permanent magnet or an electromagnet.

  The transport mechanism 35 transports the capacitor 1 so as to pass in front of the magnetic generator 31 and in front of the measuring instrument 32. In the present embodiment, the transport mechanism 35 allows the capacitor 1 to pass in front of the magnetic generator 31 and in front of the measuring instrument 32 by passing the capacitor series 2 between the magnetic generator 31 and the measuring instrument 32. Let it pass.

  Specifically, the capacitor series 2 includes a plurality of capacitors 1 and a tape 20 having a plurality of recesses 21h that accommodate the plurality of capacitors 1 one by one. The tape 20 includes a carrier tape 21 and a cover tape 22. The carrier tape 21 is provided with a plurality of recesses 21h. By attaching the cover tape 22 to the carrier tape 21, each of the plurality of recesses 21h is closed.

  The transport mechanism 35 includes a first roll 33 and a second roll 34 for transporting the capacitor train 2. The capacitor series 2 is wound around the first roll 33 in advance, and the capacitor series 2 sent out from the first roll 33 and passed between the magnetic generator 31 and the measuring instrument 32 is the second roll 33. It is wound up on a roll 34.

  The measuring device 32 is arranged so as to be able to measure the density of magnetic flux generated in the magnetic generator 31. The measuring device 32 measures the density of magnetic flux generated from the magnetic generator 31. The measuring instrument 32 measures the magnetic flux density at least when the capacitor 1 passes in front of the measuring instrument 32.

  In the present embodiment, the measuring device 32 continuously measures the magnetic flux density at intervals of about 10 kHz to 100 kHz, and changes with time of the magnetic flux density when the capacitor 1 passes in front of the measuring device 32 are captured.

  The measuring instrument 32 has a magnetic flux density meter such as a Gauss meter or a Tesla meter and a magnetic probe. A magnetic sensor having a Hall element with a diameter of 0.76 mm, for example, is built in the tip of the magnetic probe. The measuring device 32 outputs the measurement result of the magnetic flux density to the posture determination unit 36.

  The posture determination unit 36 determines the magnitude relationship between the determination target value based on the magnetic flux density measured by the measuring instrument 32 and at least one threshold value, whereby the first main surface 10a and the second main surface 10b. Determine the direction the head is facing. The posture determination unit 36 sequentially determines the posture of the capacitor 1 with respect to the plurality of capacitors 1 arranged in a row at intervals in the capacitor series 2.

  Here, the principle of the capacitor posture determination method according to this embodiment will be described. FIG. 5 is a cross-sectional view showing lines of magnetic force when no capacitor is located between the magnetic generator and the measuring instrument. FIG. 6 shows a state in which a capacitor in a first posture in which the first main surface faces the magnetic generator and the second main surface faces the measuring device is located between the magnetic generator and the measuring device. It is sectional drawing which shows the magnetic force line in. FIG. 7 shows a state in which a capacitor in a second posture in which the second main surface faces the magnetic generator and the first main surface faces the measuring device is located between the magnetic generator and the measuring device. It is sectional drawing which shows the magnetic force line in. FIG. 8 shows the lines of magnetic force in a state where a capacitor in a third position in which the first side faces the magnetic generator and the second side faces the measuring instrument is located between the magnetic generator and the measuring instrument. FIG. FIG. 9 shows the lines of magnetic force in a state where a capacitor in a fourth position in which the second side faces the magnetic generator and the first side faces the measuring instrument is located between the magnetic generator and the measuring instrument. FIG.

  As shown in FIG. 5, in the state where the capacitor 1 is not located between the magnetic generator 31 and the measuring instrument 32, the interval between the magnetic lines Lm passing through the measuring instrument 32 is the largest, in other words, the unit area The number of magnetic field lines Lm per unit is reduced, and the magnetic flux density is reduced.

  As shown in FIGS. 6 to 9, when the capacitor 1 is located between the magnetic generator 31 and the measuring instrument 32, the magnetic field lines Lm that pass through the measuring instrument 32 than when the capacitor 1 is not located. , And the number of magnetic lines Lm per unit area increases.

  In the state of the second posture 1b in which the first main surface 10a faces the measuring device 32, the second main surface 10b passes through the measuring device 32 than in the state of the first posture 1a that faces the measuring device 32. The interval between the lines of magnetic force Lm to be reduced is reduced, and the number of magnetic lines of force Lm per unit area is increased.

  In the state of the third or fourth posture 1c, 1d in which the first or second side face 10c, 10d faces the measuring instrument 32, the second posture 1b in which the first main surface 10a faces the measuring instrument 32. The interval between the magnetic lines Lm passing through the measuring instrument 32 is narrower than that in the state, and the number of magnetic lines Lm per unit area is increased.

  FIG. 10 is a graph showing the change in magnetic flux density over time when the capacitors in the first posture, the second posture, the third posture, and the fourth posture pass in front of the measuring instrument. In FIG. 10, the vertical axis represents the magnetic flux density and the horizontal axis represents the elapsed time.

  As shown in FIG. 10, the maximum value of the magnetic flux density measured by the measuring device 32 is the lowest in the state of the first posture 1a, and then the lowest in the state of the second posture 1b. It is the highest in the state of 4 postures 1d.

  Therefore, the first threshold value is set between the maximum value of the magnetic flux density in the state of the first posture 1a and the maximum value of the magnetic flux density in the state of the second posture 1b, and the magnetic flux density measured by the measuring device 32 is set. By using the maximum value as the determination target value, it is possible to determine whether or not the capacitor 1 is in the first posture 1a. That is, when the maximum value of the magnetic flux density is lower than the first threshold value, it can be determined that the capacitor 1 is in the first posture 1a.

  Further, a second threshold value higher than the first threshold value is set between the maximum value of the magnetic flux density in the state of the second posture 1b and the maximum value of the magnetic flux density in the state of the third posture 1c and the fourth posture 1d. By determining the maximum value of the magnetic flux density measured by the measuring instrument 32 as the determination target value, it is possible to determine whether or not the capacitor 1 is in the second posture 1b. That is, when the maximum value of the magnetic flux density is lower than the second threshold and higher than the first threshold, it can be determined that the capacitor 1 is in the state of the second posture 1b.

  Furthermore, when the maximum value of the magnetic flux density is higher than the second threshold, it can be determined that the capacitor 1 is in the third posture 1c or the fourth posture 1d.

  FIG. 11 is a graph showing the cumulative value of the magnetic flux density when the capacitors in the first posture, the second posture, the third posture, and the fourth posture pass in front of the measuring instrument. In FIG. 11, the vertical axis indicates the accumulated value of the magnetic flux density, and the horizontal axis indicates the elapsed time.

  As shown in FIG. 11, the cumulative value of the magnetic flux density measured by the measuring instrument 32 is the lowest in the state of the first posture 1a, then the lowest in the state of the second posture 1b, and the state of the third posture 1c and the second state. It is the highest in the state of 4 postures 1d. The difference in the cumulative value of the magnetic flux density is larger than the difference in the maximum value of the magnetic flux density.

  A first threshold value is set between the cumulative value of magnetic flux density in the state of the first posture 1a and the cumulative value of magnetic flux density in the state of the second posture 1b, and the cumulative value of magnetic flux density measured by the measuring device 32. By using as a determination target value, it is possible to determine whether or not the capacitor 1 is in the first posture 1a. That is, when the accumulated value of the magnetic flux density is lower than the first threshold value, it can be determined that the capacitor 1 is in the first posture 1a.

  Further, a second threshold value higher than the first threshold value is set between the cumulative value of the magnetic flux density in the state of the second posture 1b and the cumulative value of the magnetic flux density in the state of the third posture 1c and the fourth posture 1d, By using the cumulative value of the magnetic flux density measured by the measuring instrument 32 as a determination target value, it is possible to determine whether or not the capacitor 1 is in the second posture 1b. That is, when the cumulative value of the magnetic flux density is lower than the second threshold and higher than the first threshold, it can be determined that the capacitor 1 is in the second posture 1b.

  Furthermore, when the accumulated value of the magnetic flux density is higher than the second threshold value, it can be determined that the capacitor 1 is in the third posture 1c or the fourth posture 1d.

  Since the difference in the accumulated value of the magnetic flux density is larger than the difference in the maximum value of the magnetic flux density, the accuracy of determining the posture of the capacitor 1 can be increased by using the accumulated value of the magnetic flux density as the determination target value.

  For example, even if the maximum value of the magnetic flux density varies due to variations in the position of the capacitor 1 when measuring the magnetic flux density by the measuring instrument 32, the cumulative value of the magnetic flux density is used as the determination target value. The posture of the capacitor 1 can be determined stably.

  In particular, when the number of stacked internal electrode layers 11 and 12 is small, the posture of the capacitor 1 is determined using the accumulated value of the magnetic flux density as the determination target value rather than the maximum value of the magnetic flux density as the determination target value. Is preferred. Specifically, when the number of laminated internal electrode layers 11 and 12 is 100 or less, it is preferable to determine the posture of the capacitor 1 using the accumulated value of the magnetic flux density as a determination target value.

  As described above, the capacitor posture determination device 3 according to the present embodiment can determine the direction in which the first main surface 10a and the second main surface 10b of the capacitor 1 face. As a result, it is possible to mark and identify capacitors 1 that are not in a uniform orientation, or exclude capacitors 1 that are not in a uniform posture.

  Here, an experimental example in which the influence of the difference between the thickness of the first outer layer 15a and the thickness of the second outer layer 15b on the magnetic flux density measured by the measuring device 32 will be described.

(Experiment 1)
First, samples 1 to 3 of three types of capacitors were produced. As common conditions for samples 1 to 3, the length of the capacitor in the length direction L is 1.15 mm, the width direction W is 0.65 mm, the thickness of the first outer layer is 40 μm, and the number of stacked internal electrode layers Was 430 sheets. The thickness of the second outer layer was 140 μm for sample 1, 240 μm for sample 2, and 340 μm for sample 3.

  FIG. 12 is a graph showing the cumulative value of the magnetic flux density when each of the capacitors of Samples 1 to 3 passes in front of the measuring instrument in Experimental Example 1. In FIG. 12, the vertical axis represents the cumulative value of the magnetic flux density, and the horizontal axis represents the elapsed time.

  In FIG. 12, the cumulative value of the magnetic flux density when the sample 1 is in the third posture 1c state and the state of the fourth posture 1d is a solid line A, and the cumulative value of the magnetic flux density when the sample 1 is in the second posture 1b is the solid line B. 1 is a solid line C showing the cumulative value of the magnetic flux density in the state of the first posture 1a, sample 2 is a solid line D showing the cumulative value of the magnetic flux density in the state of the first posture 1a, and sample 3 is the magnetic flux density in the state of the first posture 1a. The accumulated value is indicated by a solid line E.

  As shown in FIG. 12, as the difference between the thickness of the first outer layer 15a and the thickness of the second outer layer 15b increases, the cumulative value of the magnetic flux density in the state of the first posture 1a and the magnetic flux in the state of the second posture 1b. The difference from the cumulative density increased. Therefore, it was confirmed that the accuracy of determining the posture of the capacitor 1 was improved as the difference between the thickness of the first outer layer 15a and the thickness of the second outer layer 15b was increased.

  Next, an experimental example in which the influence of the difference between the thickness of the first outer layer 15a and the thickness of the second outer layer 15b on the maximum value of the magnetic flux density measured by the measuring device 32 will be described.

(Experimental example 2)
FIG. 13 shows the magnetic flux density measured by the measuring instrument when the difference between the thickness of the first outer layer and the thickness of the second outer layer is so small that the capacitor posture cannot be determined using the maximum value of the magnetic flux density as the determination target value. It is a graph which shows a measurement result. FIG. 14 shows the measurement of the magnetic flux density by the measuring instrument when the difference between the thickness of the first outer layer and the thickness of the second outer layer is large enough to determine the posture of the capacitor with the maximum value of the magnetic flux density as the determination target value. It is a graph which shows a result. 13 and 14, the vertical axis represents the measurement frequency, and the horizontal axis represents the maximum value of the magnetic flux density.

  As shown in FIG. 13, when the difference between the thickness of the first outer layer 15a and the thickness of the second outer layer 15b is small, the maximum value group of magnetic flux density in the state of the first posture 1a measured by the measuring instrument, There is no clear boundary between the maximum value group of magnetic flux densities in the state of the two postures 1b, and the state of the first posture 1a and the state of the second posture 1b cannot be determined.

  As shown in FIG. 14, when the difference between the thickness of the first outer layer 15a and the thickness of the second outer layer 15b is sufficiently large, the maximum value group of magnetic flux density in the state of the first posture 1a, measured by the measuring instrument, The maximum value group of the magnetic flux density in the state of the second posture 1b is clearly separated with an interval D, and the state of the first posture 1a and the state of the second posture 1b can be discriminated.

  In Experimental Example 2, samples 4 to 8 of five types of capacitors were produced by changing the difference between the thickness of the first outer layer 15a and the thickness of the second outer layer 15b. As common conditions for samples 4 to 8, the outer dimension L of the capacitor is 1.15 mm, the width W is 0.65 mm, the thickness of the first outer layer is 40 μm, and the number of stacked internal electrode layers Was 430 sheets.

  The difference between the thickness of the first outer layer 15a and the thickness of the second outer layer 15b was 5 μm for sample 4, 20 μm for sample 5, 30 μm for sample 6, 60 μm for sample 7, and 100 μm for sample 8.

  The difference between the maximum value group of the magnetic flux density in the state of the first posture 1a and the maximum value group of the magnetic flux density in the state of the second posture 1b, measured by the measuring instrument 32, is 0.29 mT for the sample 4 and sample 5 0.37 mT, Sample 6 was 0.43 mT, Sample 7 was 0.60 mT, and Sample 8 was 0.82 mT.

  In order to discriminate between the maximum value group of magnetic flux density in the state of the first posture 1a and the maximum value group of magnetic flux density in the state of the second posture 1b, an equivalent margin is added to the repetition accuracy (± 0.1 mT). Thus, a difference of 0.4 mT is necessary. Then, from the result of Experimental Example 2, it was confirmed that the difference between the thickness of the first outer layer 15a and the thickness of the second outer layer 15b was 30 μm or more.

  When the difference between the thickness of the first outer layer 15a and the thickness of the second outer layer 15b is 180 μm or more, the balance of thermal contraction between the first outer layer 15a and the second outer layer 15b during the firing of the ceramic in the capacitor manufacturing process. It has been found that there is a possibility that structural defects (cracks) may occur.

  Therefore, in order to make it possible to determine the posture of the capacitor 1 while suppressing the occurrence of structural defects (cracks), the difference between the thickness of the first outer layer 15a and the thickness of the second outer layer 15b is 30 μm or more and less than 180 μm. Preferably there is.

  As a result of various evaluations, in a capacitor in which the dielectric layer contains barium titanate, it is possible to determine the posture when the difference between the thickness of the first outer layer 15a and the thickness of the second outer layer 15b is 30 μm or more. Is a case where at least the following conditions are satisfied. A capacitor having a dimension in the length direction L of the outer shape of 1.0 mm or more and a dimension in the width direction W of 0.5 mm or more has a capacitance of 0.1 μF or more. Alternatively, a capacitor having a dimension in the length direction L of the outer shape of 0.6 mm or more and less than 1.0 mm and a dimension in the width direction W of 0.3 mm or more and less than 0.5 mm has a capacitance of 1 μF or more. ing.

(Embodiment 2)
The configuration of the capacitor attitude determination device according to the second embodiment of the present invention will be described below. The capacitor posture determination device according to the present embodiment is different from the capacitor posture determination device 3 according to the first embodiment mainly in that the posture of the capacitor 1 before being packaged on a tape is determined. The same configurations as those of the capacitor attitude determination device 3 are denoted by the same reference numerals, and the description thereof will not be repeated.

  FIG. 15 is a plan view showing the configuration of the capacitor attitude determination device according to the second embodiment of the present invention. FIG. 16 is a plan view showing the configuration of the linear transport mechanism of the capacitor attitude determination device according to the second embodiment of the present invention.

  As shown in FIGS. 15 and 16, the capacitor posture determination apparatus according to the second embodiment of the present invention includes a linear transport mechanism 51, a rotary transport mechanism 52, a magnetic generator 31, a measuring instrument 32, and a posture determination unit. 40.

  A ball feeder 50 is connected to the linear transport mechanism 51. A plurality of capacitors 1 are accommodated in the ball feeder 50. As the ball feeder 50 vibrates, the capacitors 1 are sequentially supplied to the linear transport mechanism 51.

  The linear transport mechanism 51 is connected to the rotary transport mechanism 52. The linear transport mechanism 51 transports the capacitor 1 to the rotary transport mechanism 52 by vibration. The conveyance path of the linear conveyance mechanism 51 is provided with a wide portion 51a where the width of the conveyance path is wide and two openings 51b and 51c facing each other.

  One magnetic generator 70 is arranged on each side of the wide portion 51a so as to sandwich the wide portion 51a. The two magnetic generators 70 have a function of aligning the stacking direction of the capacitors 1 by applying a magnetic force between them. When the capacitors 1 having different stacking directions pass through the wide portion 51a, the magnetic force generated by the magnetic generator 70 rotates with the length direction L as the rotation axis direction as indicated by an arrow in FIG. As a result, the stacking direction of the capacitors 1 that have passed through the wide portion 51a is aligned.

  Note that the method of aligning the stacking direction of the capacitors 1 is not limited to the method using the magnetic force, and for example, the stacking direction of the capacitors 1 using the difference between the dimension in the width direction W and the dimension in the height direction H of the capacitor 1. May be aligned.

  Between the wide portion 51a and the two openings 51b and 51c in the conveyance path of the linear conveyance mechanism 51, the magnetic generator 31 and the measuring instrument 32 are arranged so as to sandwich the conveyance path between each other. The linear transport mechanism 51 transports the capacitor 1 so as to pass in front of the magnetic generator 31. The measuring device 32 outputs the measurement result of the magnetic flux density to the posture determination unit 40.

  The posture determination unit 40 is arranged outside the opening 51b and is configured to be able to blow air toward the opening 51c. When the capacitor 1 having a different posture passes in front, the posture determination unit 40 blows air to the capacitor 1 and discharges it from the opening 51c to the outside of the conveyance path. Thereby, the capacitor | condenser 1 conveyed by the rotation conveyance mechanism 52 is arrange | equalized with the same attitude | position. Specifically, in each of the plurality of capacitors 1, the second main surface 10b is aligned in a vertically downward posture.

  Note that the capacitor 1 discharged from the opening 51c may be reintroduced into the ball feeder 50, or rotated 180 degrees with the length direction L set as the rotation axis direction and aligned in the same posture, and then the linear transport mechanism. You may return to the conveyance path of 51. Further, the method of discharging the capacitor 1 is not limited to the method of blowing air to the capacitor 1, and may be a method using gravity or magnetic force, or a method using a pickup mechanism.

  The rotary transport mechanism 52 transports the capacitor 1 so that the capacitor 1 is accommodated in the recess 21 h of the carrier tape 21. The rotary transport mechanism 52 includes a disk-shaped transport table 54 that rotates about a central axis C.

  Specifically, the transfer table 54, which is a circular rotor, rotates clockwise about the central axis C. The transfer table 54 includes a plurality of storage portions 54a. The plurality of accommodating portions 54 a are provided in a row at intervals from each other along the outer periphery of the transport table 54.

  The capacitor 1 is transferred from the linear conveyance mechanism 51 to the accommodating portion 54a at the position P1 of the conveyance table 54, which is a connection point between the linear conveyance mechanism 51 and the rotation conveyance mechanism 52. The capacitor 1 transferred to the accommodating portion 54a is transported along the circumferential direction around the central axis C as the transport table 54 rotates.

  The capacitor 1 is transported from the position P1 to a position P3 of the transport table 54 that is a connection point between the rotary transport mechanism 52 and the transport path of the carrier tape 21. At the position P3, the capacitor 1 is inserted from the rotary transport mechanism 52 into the recess 21h of the carrier tape 21.

  In the capacitor 1 accommodated in the recess 21h of the carrier tape 21, the bottom of the recess 21h and the second main surface 10b face each other. Thus, the plurality of capacitors 1 are accommodated in the plurality of recesses 21h of the carrier tape 21 in the same posture one by one. As a result, the directions of the second principal surfaces 10b of the plurality of capacitors 1 accommodated in the plurality of recesses 21h are aligned with each other. Moreover, in the capacitor | condenser attitude | position discriminating device which concerns on this embodiment, each of the several capacitor | condenser 1 from which the attitude | position was discriminate | determined is magnetized. In this case, since the magnetic fluxes generated from each of the plurality of capacitors 1 are directed in the same direction, it can be expected that the posture of the capacitor 1 accommodated in the recess 21h is unlikely to change.

  In order to determine whether or not the capacitor 1 is magnetized, first, the density of the magnetic flux generated from the capacitor 1 is measured, and after demagnetizing the capacitor 1 with a demagnetizer, the magnetic flux density is measured again. The magnetic flux density measured at the first time is compared with the magnetic flux density measured at the second time. If there is a significant difference between the two measurement results of the magnetic flux density, it is determined that the capacitor 1 has been magnetized.

  Also in the capacitor posture determination device according to the present embodiment, the direction in which the first main surface 10a and the second main surface 10b of the capacitor 1 face can be determined.

  In addition, in the capacitor | condenser attitude | position discriminating device which concerns on this embodiment, although the magnetic generator 70 for aligning the lamination direction of the capacitor | condenser 1 was provided, the magnetic generator 70 does not necessarily need to be provided. However, it is possible to efficiently align the postures of the plurality of capacitors 1 when the capacitor posture determination device includes the magnetic generator 70.

(Embodiment 3)
The configuration of the capacitor attitude determination device according to the third embodiment of the present invention will be described below. The capacitor posture determination device according to the present embodiment is different from the capacitor posture determination device according to the second embodiment mainly in that the rotation generator mechanism 52 is provided with the magnetic generator 31 and the measuring device 32. The same components as those of the capacitor posture determination device according to the second embodiment are denoted by the same reference numerals, and the description thereof will not be repeated.

  FIG. 17 is a plan view showing a configuration of a capacitor attitude determination device according to Embodiment 3 of the present invention. FIG. 18 is an enlarged plan view showing the configuration of the rotation transport mechanism of the capacitor posture determination device according to the third embodiment of the present invention.

  As shown in FIGS. 17 and 18, the capacitor attitude determination device according to the third embodiment of the present invention includes a linear conveyance mechanism 51, a rotation conveyance mechanism 52, a magnetic generator 31, a measuring instrument 32, and an attitude determination unit. 40. In the present embodiment, the linear transport mechanism 51 has only a function of transporting the capacitor 1 to the rotary transport mechanism 52.

  At the position P2 located between the position P1 and the position P3 in the conveyance path of the rotary conveyance mechanism 52, an attitude determination mechanism 55 is provided. The posture determination mechanism 55 includes a magnetic generator 31 and a measuring instrument 32. The magnetism generator 31 and the measuring instrument 32 are arranged so that the transport path of the rotary transport mechanism 52 is sandwiched between them. The magnetic generator 31 is located above the conveyance table 54, and the measuring instrument 32 is located below the conveyance table 54.

  The rotary transport mechanism 52 transports the capacitor 1 so as to pass in front of the magnetic generator 31. The conveyance table 54 performs a so-called intermittent operation that repeats the rotation and stop at a constant interval. The measuring device 32 outputs the measurement result of the magnetic flux density to the posture determination unit 40.

  The posture determination unit 40 is located on the downstream side of the posture determination mechanism 55 in the transfer path of the rotary transfer mechanism 52 and is adjacent to the accommodating portion 54a when the transfer table 54 is stopped on the inner peripheral side of the transfer table 54. ing. A discharge section 52c is provided on the outer peripheral side of the transport table 54 with respect to the storage section 54a adjacent to the posture determination section 40. The discharge section 52c faces the opening of the storage section 54a. The posture determination unit 40 is configured to be able to blow air toward the discharge unit 52c. When the capacitor 1 having a different posture passes in front, the posture determination unit 40 blows air onto the capacitor 1 and discharges it from the discharge unit 52c to the outside of the conveyance path. Thereby, the capacitors 1 transported to the position P3 of the transport table 54 are aligned in the same posture. Specifically, in each of the plurality of capacitors 1, the second main surface 10b is aligned in a vertically downward posture.

  Also in the capacitor posture determination device according to the present embodiment, the direction in which the first main surface 10a and the second main surface 10b of the capacitor 1 face can be determined.

(Embodiment 4)
The configuration of the capacitor attitude determination device according to the fourth embodiment of the present invention will be described below. The capacitor posture determination device according to the present embodiment is different from the capacitor posture determination device according to the first embodiment mainly in that the magnetic generator 31 and the measuring device 32 are provided in the movement path of the mounter. The same components as those of the capacitor attitude determination device according to the first embodiment are denoted by the same reference numerals, and the description thereof will not be repeated.

  FIG. 19 is a side view showing a configuration of a capacitor attitude determination device according to Embodiment 4 of the present invention. As shown in FIG. 19, the capacitor posture determination apparatus according to the fourth embodiment of the present invention includes a mounter 60 that is a transport mechanism, a magnetic generator 31, a measuring instrument 32, and a posture determination unit (not shown).

  The mounter 60 includes a suction nozzle, and takes out the capacitors 1 accommodated in the recesses of the carrier tape 21 one by one with the suction nozzle and transports them onto the mounting substrate 61. The mounter 60 conveys the capacitor 1 so as to pass in front of the magnetic generator 31. The capacitor 1 passes between the magnetic generator 31 and the measuring instrument 32.

  Also in the capacitor posture determination device according to the present embodiment, the direction in which the first main surface 10a and the second main surface 10b of the capacitor 1 face can be determined. As a result, it is possible to exclude the capacitors 1 whose postures are not uniform.

  It should be thought that embodiment disclosed this time is an illustration and restrictive at no points. The scope of the present invention is defined by the terms of the claims, rather than the description above, and is intended to include any modifications within the scope and meaning equivalent to the terms of the claims.

  DESCRIPTION OF SYMBOLS 1 Capacitor, 1a 1st attitude | position, 1b 2nd attitude | position, 1c 3rd attitude | position, 1d 4th attitude | position, 2 capacitor | condenser series, 3 attitude | position discriminating device, 10 ceramic body, 10a 1st main surface, 10a 2nd main surface 10c first side surface, 10c second side surface, 10e first end surface, 10e second end surface, 10e, 10f second end surface, 11, 12 internal electrode layer, 13, 14 external electrode, 15 dielectric layer , 15a First outer layer, 15b Second outer layer, 20 tape, 21 carrier tape, 21h recess, 22 cover tape, 31, 70 magnetic generator, 32 measuring instrument, 33 first roll, 34 second roll, 35 Mechanism, 36, 40 Posture determination unit, 50 ball feeder, 51 linear conveyance mechanism, 51a wide portion, 51b, 51c opening, 52 rotary conveyance mechanism, 52c discharge unit, 4 conveying table, 54a accommodating portion 55 attitude determination mechanism, 60 mounter, 61 mounting board, Lm field lines.

Claims (12)

A first outer layer including a first major surface;
A second outer layer that is thicker than the first outer layer and includes a second major surface;
The first main surface and the second main surface in a multilayer ceramic capacitor including a plurality of dielectric layers and a plurality of internal electrode layers alternately stacked between the first outer layer and the second outer layer. A method of determining the orientation of a multilayer ceramic capacitor,
Passing the multilayer ceramic capacitor in front of a magnetic generator and in front of a measuring instrument;
Measuring the magnetic flux density when the multilayer ceramic capacitor passes in front of the measuring instrument;
By determining the magnitude relationship between the determination target value based on the magnetic flux density measured in the step of measuring the magnetic flux density and at least one threshold value, the first main surface and the second main surface A posture determination step for determining a direction to face,
In the posture determination step, when the determination target value is lower than a first threshold, it is determined that the second main surface faces the measuring instrument.   In the posture determination step, when the determination target value is lower than a second threshold value higher than the first threshold value and higher than the first threshold value, the first main surface faces the measuring instrument. The method of determining a posture of a multilayer ceramic capacitor according to claim 1, wherein the determination is performed.   The multilayer ceramic capacitor orientation determination method according to claim 1, wherein the determination target value is a cumulative value of the magnetic flux density measured in the step of measuring the magnetic flux density. A first outer layer including a first major surface;
A second outer layer that is thicker than the first outer layer and includes a second major surface;
The first main surface and the second main surface in a multilayer ceramic capacitor including a plurality of dielectric layers and a plurality of internal electrode layers alternately stacked between the first outer layer and the second outer layer. A multilayer ceramic capacitor attitude discrimination device that discriminates the direction in which
A magnetic generator;
A measuring instrument for measuring the magnetic flux density;
A transport mechanism for transporting the multilayer ceramic capacitor to pass in front of the magnetic generator and in front of the measuring instrument;
By determining the magnitude relationship between the determination target value based on the magnetic flux density measured by the measuring instrument and the at least one threshold when the multilayer ceramic capacitor passes in front of the measuring instrument, A posture discriminating unit that discriminates the direction in which the surface and the second main surface face,
The posture determination unit for a multilayer ceramic capacitor, wherein the posture determination unit determines that the second main surface faces the measuring device when the determination target value is lower than a first threshold value.   When the determination target value is lower than the second threshold value higher than the first threshold value and higher than the first threshold value, the posture determination unit is configured such that the first main surface faces the measuring instrument. The multilayer ceramic capacitor orientation determination apparatus according to claim 4, wherein the determination is performed.   The multilayer ceramic capacitor attitude determination device according to claim 4, wherein the determination target value is a cumulative value of the magnetic flux density measured by the measuring instrument. A first outer layer including a first major surface;
A second outer layer that is thicker than the first outer layer and includes a second major surface;
A method for producing a multilayer ceramic capacitor series comprising a plurality of multilayer ceramic capacitors including a plurality of dielectric layers and a plurality of internal electrode layers alternately stacked between the first outer layer and the second outer layer. ,
Passing the plurality of multilayer ceramic capacitors in front of a magnetic generator and in front of a measuring instrument;
Measuring a magnetic flux density when each of the plurality of multilayer ceramic capacitors passes in front of the measuring instrument;
By determining the magnitude relationship between the determination target value based on the magnetic flux density measured in the step of measuring the magnetic flux density and at least one threshold value, the first main surface and the second main surface A posture determination step for determining a direction to face,
A manufacturing method of a multilayer ceramic capacitor series, wherein, in the posture determination step, when the determination target value is lower than a first threshold value, it is determined that the second main surface faces the measuring instrument.   The method for manufacturing a multilayer ceramic capacitor series according to claim 7, further comprising the step of aligning the directions of the second main surfaces of each of the plurality of multilayer ceramic capacitors with each other.   The multilayer ceramic according to claim 8, further comprising a step of accommodating the plurality of multilayer ceramic capacitors one by one in the plurality of concave portions of the tape in the same posture after the step of aligning the directions of the second main surfaces to each other. Manufacturing method for capacitor series.   10. The method according to claim 7, further comprising the step of aligning the stacking directions of the plurality of internal electrode layers of each of the plurality of multilayer ceramic capacitors with each other before the step of measuring the magnetic flux density. Manufacturing method for multilayer ceramic capacitor series.   A step of manufacturing the plurality of multilayer ceramic capacitors, wherein in the step of manufacturing the plurality of multilayer ceramic capacitors, a dielectric layer constituting the first outer layer and a dielectric layer constituting the second outer layer The method for producing a multilayer ceramic capacitor series according to claim 7, wherein the multilayer ceramic capacitor series is formed of substantially the same ceramic material system. In the step of manufacturing the plurality of multilayer ceramic capacitors, a plurality of first ceramic sheets are stacked to form the first outer layer, a plurality of second ceramic sheets are stacked to form the second outer layer,
The method for producing a multilayer ceramic capacitor series according to claim 11, wherein the plurality of first ceramic sheets and the plurality of second ceramic sheets are cut out from a common mother ceramic sheet.

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