JP6327163B2 - Inspection apparatus and inspection method - Google Patents

Description

  The present invention relates to an inspection apparatus and an inspection method for inspecting an inspection object for scratches.

  2. Description of the Related Art Conventionally, inspection apparatuses that image the surface of an inspection object and inspect the surface state of the inspection object based on image data obtained thereby are known.

  For example, Patent Document 1 discloses an inspection apparatus for inspecting whether or not a predetermined area of a stamp printing sheet is a glue surface. In Patent Document 1, when a predetermined area of a stamp printing paper is inspected, the predetermined area of the stamp printing paper is illuminated and imaged to obtain image data of the predetermined area of the stamp printing paper (hereinafter referred to as predetermined image data). Is generated). Thereafter, the predetermined image data is binarized into a white level and a black level with a certain threshold value, and the area of the white level is calculated. If the calculated value indicating the area of the white level is equal to or greater than the reference value, it is determined that the predetermined area is the glue surface.

JP-A-5-46738

  Here, when image data of a predetermined region is generated by imaging a predetermined region including a scratched portion having a scratch and a scratch-free portion having no scratch in the surface region of the inspection object, a pixel of the scratched portion is generated. A difference occurs between the pixel value of the pixel and the pixel value of the pixel in the non-scratched part. Therefore, it is possible to inspect how much scratches are present in the predetermined area based on the image data of the predetermined area. That is, the technique of Patent Document 1 can also be used for inspection of scratches.

  However, when inspecting scratches using the technique of Patent Document 1, if uneven illuminance occurs during imaging of the inspection object, the pixel value of the pixel with the scratch becomes a value indicating no scratch, In some cases, the pixel value of the pixel in the non-scratched portion becomes a value indicating the presence of a scratch. As a result, there arises a disadvantage that the accuracy of the scratch inspection is lowered.

  The present invention has been made to solve the above-described problems, and an object of the present invention is to provide an inspection apparatus and an inspection method capable of improving the inspection accuracy of a scratch on an inspection object.

  In order to solve the above problems, an inspection apparatus according to a first aspect of the present invention is an inspection apparatus for inspecting an inspection object for scratches, an illumination device for illuminating the inspection object, and an inspection object An imaging device that generates inspection image data, which is monochrome image data of the inspection area, by imaging an inspection area determined by the user as an area to be inspected, and an area that is free of scratches on the inspection object by the user From the reference image data, which is monochrome image data in the defined reference area, generate inverted image data in which the luminance of each pixel of the reference image data is inverted, and invert the pixel value of each pixel of the inspection image data. A value obtained by adding the pixel values of the pixels at corresponding positions in the image data and multiplying by 1/2 is obtained as the inspection target value, and the inspection target value is determined in advance. The number of pixels brighter inspection image data than the threshold value, and an image analysis unit for obtaining a wound information indicating whether scratches how much the inspection region is present.

  An inspection method according to a second aspect of the present invention is an inspection method for inspecting a scratch on an object to be inspected, and is a monochrome image of a reference region defined by a user as an area free from scratch on the object to be inspected. A step of generating inverted image data obtained by inverting the luminance of each pixel of the reference image data from the reference image data which is image data, and imaging an inspection region defined by the user as an inspection region of the inspection object The step of generating inspection image data which is monochrome image data of the inspection region and the pixel value of the pixel at the corresponding position of the inverted image data are added to the pixel value of each pixel of the inspection image data. Obtaining a value obtained by multiplying by 1/2 as an inspection target value, and inspection image data in which the inspection target value becomes brighter than a predetermined threshold value The number of pixels, and a step of obtaining a flaw information indicating which degree of scratches is in the examination region.

  In the configuration of the present invention, the value obtained by adding the pixel value of the pixel at the corresponding position of the inverted image data and multiplying the pixel value of each pixel of the inspection image data by ½, Calculate as a value. Of all the inspection target values obtained in this way, all the inspection target values corresponding to the non-scratched part (the part having no scratches in the inspection area) are substantially the same even if illuminance unevenness occurs during imaging. It becomes a predetermined value. Accordingly, for example, a predetermined value is set as a threshold value, and the number of pixels of the inspection image data whose inspection target value is larger than the threshold value is obtained as scratch information (information indicating how much scratches are present in the inspection area). As a result, the inspection accuracy of the scratch can be improved.

  As described above, according to the present invention, it is possible to improve the inspection accuracy of the scratch on the inspection object.

Schematic of an inspection apparatus according to an embodiment of the present invention. The figure which shows an example of the to-be-inspected object (corrugated cardboard) inspected with the inspection apparatus by one Embodiment of this invention. 1 is a block diagram of an imaging device (imaging unit) and an image analysis device that constitute an inspection device according to an embodiment of the present invention. The figure which shows an example of the attachment structure of the illuminating device and imaging device which comprise the test | inspection apparatus by one Embodiment of this invention. The flowchart for demonstrating the flow of the preparation process performed prior to an inspection process in the inspection apparatus by one Embodiment of this invention. The figure which shows an example of the image data which the inspection apparatus by one Embodiment of this invention produces | generates at the time of a preparation process The flowchart for demonstrating the flow of the inspection process performed in the inspection apparatus by one Embodiment of this invention. The figure which shows an example of the image data which the test | inspection apparatus by one Embodiment of this invention produces | generates at the time of an inspection process. The figure which shows an example of the alerting | reporting screen displayed when alerting | reporting a test result with the test | inspection apparatus by one Embodiment of this invention.

<Outline of inspection device>
As illustrated in FIG. 1, the inspection apparatus 100 according to the present embodiment includes an illumination device 1, an imaging device 2, and an image analysis device 3. This inspection apparatus 100 is used to inspect the presence or absence of scratches on the surface of the inspection object 300 using a corrugated cardboard as a packaging material as the inspection object 300.

  When the inspection object 300 is inspected, an inspection person (user) defines an inspection area IA (see FIG. 2) that is an area to be inspected in the inspection object 300. The inspection person illuminates the inspection area IA with the illumination device 1 and images the inspection area IA with the imaging device 2.

  When imaging the inspection area IA, the imaging apparatus 2 generates image data of the inspection area IA and outputs the image data to the image analysis apparatus 3. The image analysis device 3 analyzes the image data of the inspection area IA output from the imaging device 2 and inspects how much scratches are present in the inspection area IA. Note that the scratch inspection process performed by the inspection apparatus 100 will be described in detail later.

  The lighting device 1 includes an LED (not shown) as a light source. Although the color of the illumination light (light produced | generated by LED) emitted from the illuminating device 1 is not specifically limited, It is preferable that it is a color which has a relationship with the surface color of the to-be-inspected object 300, and a complementary color. Here, the surface color of the corrugated cardboard which is the object to be inspected 300 is light brown (sometimes referred to as craft color). In this case, the color complementary to the surface color of the inspection object 300 is blue. For this reason, the color of the illumination light of the illumination device 1 is blue. For example, a blue LED is used as the light source of the lighting device 1.

  The illumination device 1 irradiates the surface of the inspection object 300 with illumination light from an oblique direction with respect to the surface of the inspection object 300. In FIG. 1, a part of the illumination light from the illumination device 1 is indicated by an arrow L1. Moreover, the number of installation of the illuminating device 1 shall be two. The two illumination devices 1 are disposed so as to be substantially line symmetric with respect to the optical axis OA of the imaging device 1.

  Note that the illumination device 1 has specifications that can ensure an illuminance greater than the illuminance necessary for imaging in order to cope with deterioration over time (decrease in illuminance). In this case, when there is almost no deterioration in illuminance of the lighting device 1, the image pickup device 2 performs image pickup in a state where the stop is slightly stopped (not fully opened). And when the illumination intensity of the illuminating device 1 falls (however, when it is not less than required illumination intensity), the imaging by the imaging device 2 is performed in the state by which the aperture | diaphragm was opened from the beginning.

  The imaging device 2 includes a lens unit 21 and an imaging unit 22, and images the inspection object 300 to generate monochrome image data. The lens unit 21 includes an imaging lens, and guides the reflected light reflected by the inspection object 300 to the imaging unit 22. In FIG. 1, a part of the reflected light reflected by the inspection object 300 is indicated by an arrow L2. As shown in FIG. 3, the imaging unit 22 includes a monochrome CCD 23, an amplifier 24, an A / D converter 25, and an image memory 26.

  The monochrome CCD 23 has pixels (pixels) arranged in a grid pattern, and receives light (reflected light reflected from the surface of the inspection object 300) through the lens unit 21. When the monochrome CCD 23 receives the reflected light reflected from the surface of the inspection object 300, the monochrome CCD 23 performs photoelectric conversion for each pixel, accumulates charges, and outputs an analog signal corresponding to the accumulated charges. That is, the analog signal output from the monochrome CCD 23 varies according to the amount of received light.

  The amplifier 24 amplifies the analog signal output from the monochrome CCD 23. The A / D converter 25 converts the analog signal amplified by the amplifier 24 into digital image data. The analog signal input to the A / D converter 25 is converted into digital image data having 8-bit density gradation (256 gradations). For example, the pixel value of the black pixel is the minimum value (the minimum value of the pixel value is “0”), and the pixel value of the pure white pixel is the maximum value (the maximum value of the pixel value is “255”). The image memory 26 temporarily holds digital image data from the A / D converter 25 and transfers the image data to the image analysis device 3.

  The image analysis device 3 corresponds to an “image analysis unit” and includes a control unit 31, a storage unit 32, a display unit 33, and an operation unit 34. The control unit 31 performs image analysis of the image data from the imaging device 2 (details will be described later). The storage unit 32 stores image analysis software 35. The control unit 31 operates based on the image analysis software 35 (performs image analysis). The storage unit 32 is also provided with an area for storing image data.

  The display unit 33 is a display such as an LCD, for example, and displays various types of information. The operation unit 34 is, for example, a hardware keyboard and accepts various inputs.

<Position adjustment of illumination device and imaging device>
As shown in FIG. 4, the illuminating device 1 is attached to the one surface side of the illuminating device attaching plate 111 for holding the illuminating device 1 in a desired position. The lighting device mounting plate 111 is formed with a fastening hole 111a (corresponding to a “lighting device fastening hole”) into which a predetermined fastening member 4 is inserted. For example, the fastening member 4 is a member in which a male screw is formed (such as a bolt with a knob), and the lighting device 1 (its housing) is formed with a female screw that can be screwed with the fastening member 4. The lighting device 1 is fastened and fixed to the lighting device mounting plate 111 by the fastening member 4 inserted into the fastening hole 111a from the other surface side opposite to the one surface side of the lighting device mounting plate 111.

  The illumination device mounting plate 111 is rotatably supported by the support plate 112. Specifically, when the lighting device mounting plate 111 rotates to one side (one direction) in the A direction with the rotation shaft 113 as a fulcrum, the lighting device 1 approaches the object to be inspected 300, and the support plate 112 When the mounting plate 111 rotates about the rotation shaft 113 to the other side in the A direction (another direction opposite to one direction), the lighting device mounting plate 111 is moved away from the object to be inspected 300. It is supported so that it can rotate. Thereby, the position of the illuminating device 1 with respect to the to-be-inspected object 300 can be adjusted by rotating the illuminating device attaching plate 111.

  Furthermore, the fastening hole 111a of the lighting device mounting plate 111 is formed in a long hole shape that extends from the rotating shaft 113 side of the lighting device mounting plate 111 toward the opposite side. Thereby, the attachment position of the illuminating device 1 to the illuminating device attaching plate 111 can also be adjusted. That is, the position of the illumination device 1 with respect to the inspection object 300 can be adjusted.

  Moreover, the imaging device 2 is attached to one surface side of the imaging device mounting plate 211 for holding the imaging device 2 at a desired position. The imaging device mounting plate 211 is formed with a fastening hole 211a (corresponding to “imaging device fastening hole”) into which the fastening member 4 is inserted. 4 does not show the fastening member 4 inserted into the fastening hole 211a of the imaging device mounting plate 211, but actually, the fastening member 4 is inserted into the fastening hole 211a of the imaging device mounting plate 211. ing. For example, the imaging device 2 (its housing) is formed with a female screw that can be screwed into the fastening member 4. The imaging device 2 is fastened and fixed to the imaging device mounting plate 211 by the fastening member 4 inserted into the fastening hole 211a from the other surface side opposite to the one surface side of the imaging device mounting plate 211.

  The fastening hole 211 a of the imaging device mounting plate 211 is formed in a long hole shape extending along the axial direction (B direction) of the optical axis OA of the imaging device 1. Thereby, the attachment position of the imaging device 2 to the imaging device attachment plate 211 can be adjusted. That is, the position of the imaging device 2 with respect to the inspection object 300 can be adjusted.

  By the way, the illuminating device 1 and the imaging device 2 are installed on the same apparatus installation stand (not shown), and thereby, the illuminating device 1 and the imaging device 2 can be carried together. In addition, you may attach a caster to an apparatus installation stand. In this way, the illumination device 1 and the imaging device 2 can be easily carried. For example, when the size of the inspection object 300 is large or when the weight of the inspection object 300 (the weight of the device packed by the inspection object 300) is heavy, it takes time to move the inspection object 300. The illumination device 1 and the imaging device 2 must be brought toward the object 300 to be inspected. In this case, if the illumination device 1 and the imaging device 2 are installed on a device installation table with casters, the convenience of the person in charge of inspection is improved.

<Inspection of scratches>
When the surface of the cardboard is scratched, the scratched portion becomes whitish than the other portions. Therefore, when the illumination light of the illumination device 1 is incident on a scratched portion (hereinafter referred to as a scratched portion), the light reflected toward the imaging device 2 increases, but there is no scratched portion (hereinafter, no scratch). When the illumination light of the illumination device 1 is incident on a portion), the light reflected toward the imaging device 2 is reduced. That is, the pixel value of the pixel with a scratch is larger than the pixel value of the pixel with no scratch.

  Further, the fact that the surface of the corrugated cardboard is scratched means that fine irregularities are generated. Therefore, when the illumination light of the lighting device 1 enters the scratched portion, the light is easily diffused by the unevenness. On the other hand, when the illumination light of the illuminating device 1 enters the non-scratched part, the light that is regularly reflected increases (the diffusion of light decreases).

  Here, as shown in FIG. 1, the illumination device 1 irradiates the illumination light obliquely with respect to the surface of the inspection object 300. For this reason, when the illumination light of the illumination device 1 is incident on the scratched portion, the light travels toward the imaging device 2 due to the diffusion of light, but when the illumination light of the illumination device 1 is incident on the scratchless portion, The amount of light that travels toward the image pickup device 2 decreases as the amount of specularly reflected light increases. That is, the pixel value of the pixel with a scratch is larger than the pixel value of the pixel with no scratch. In addition, the illumination light of the illuminating device 1 is blue light with a short wavelength and easy to diffuse. Therefore, the diffusion of light when the illumination light of the illumination device 1 enters the damaged portion is further promoted.

  Thereby, by imaging the surface of the cardboard and analyzing the image data obtained thereby, it is possible to know how much scratches are generated on the surface of the cardboard. This will be specifically described below.

  First, the flow of the preparation process performed prior to the inspection process of the inspection area IA of the inspection object 300 will be described with reference to the flowchart shown in FIG.

  At the start of the flowchart of FIG. 5, it is assumed that the inspection area IA (see FIG. 2) is determined by the inspector from the surface area of the inspection object 300. In addition, it is assumed that a reference area RA (see FIG. 2) serving as a reference in the inspection of the scratch in the inspection area IA is defined by the inspection person among the surface areas of the same inspection object 300. Note that the reference area RA is an area different from the inspection area IA, and is an area in the inspection object 300 that is free from scratches (an area in which the amount of scratches is within an allowable range). This is a defined area.

  The flowchart in FIG. 5 starts when the person inspecting the image captures the reference region RA of the inspection object 300 using the imaging device 2.

  In step S <b> 1, when monochrome image data of the reference area RA is generated by the imaging device 2, the image analysis device 3 acquires the image data from the imaging device 2 as reference image data. Here, the reference area RA is an area defined by an inspector as an area free from scratches. Therefore, the pixel values of the respective pixels of the reference image data are substantially the same value (a value indicating no scratches). An example of the reference image data is shown in FIG. 6 (upper figure).

  Thereafter, in step S2, the image analysis device 3 generates inverted image data that is image data obtained by inverting the luminance of each pixel of the reference image data. At this time, the image analysis apparatus 3 subtracts the actual pixel value from the maximum pixel value (the maximum value is “255”) for each pixel of the reference image data, and uses each value obtained thereby for the inverted image data. The pixel value of each pixel is used. An example of the reverse image data is shown in FIG. In step S <b> 3, the image analysis device 3 stores the inverted image data in the storage unit 32. The reverse image data obtained here is used during an inspection process to be described later.

  A predetermined corrugated cardboard of the same type as the corrugated cardboard as the object to be inspected 300 (for example, a new corrugated cardboard without scratches) is separately prepared, and one area of the predetermined corrugated cardboard is defined as a reference area RA, and the reference area RA of the predetermined corrugated cardboard is defined. The image data obtained by imaging can also be used as reference image data. However, some corrugated cardboard as the object to be inspected 300 is manufactured by mixing waste paper or the like. That is, individual differences occur even with the same type of cardboard (for example, cardboard with the same specifications and production line). Therefore, it is preferable to use one area of the cardboard to be inspected (an area other than the inspection area IA) as the reference area RA and use image data obtained by imaging the reference area RA as the reference image data.

  Next, the flow of inspection processing performed when inspecting the inspection area IA of the inspection object 300 will be described with reference to the flowchart shown in FIG.

  The start of the flowchart of FIG. 7 starts when the person inspecting the image captures the inspection area IA of the inspection object 300 using the imaging device 2.

  In step S11, when monochrome image data of the inspection area IA is generated by the imaging device 2, the image analysis device 3 acquires the image data from the imaging device 2 as inspection image data. An example of inspection image data is shown in FIG. 8 (upper figure). In FIG. 8, the portion corresponding to the scratched portion of the inspection image data is indicated by an ellipse.

In step S12, the image analysis device 3 obtains an inspection target value. Specifically, the image analysis device 3 performs an operation of adding the pixel value of the pixel at the corresponding position of the inverted image data to each pixel value of each pixel of the inspection image data and multiplying by 1/2. Each value obtained by the calculation is obtained as an inspection target value. That is, assuming that the pixel value of a certain pixel of the inspection image data is V1, and the pixel value of the pixel of the inverted image data corresponding to the pixel of the inspection image data is V2, the inspection target value V3 is expressed by the following equation (1). Desired.
V3 = (V1 + V2) × 0.5 (1)
An example of the inspection image data after the calculation is shown in FIG.

  In step S <b> 13, the image analysis device 3 obtains the number of pixels (hereinafter referred to as “predetermined pixels”) in the damaged portion as scratch information (information indicating how much scratches are present in the inspection area IA). Here, the reference image data that is the basis for generating the inverted image data is image data obtained by imaging the reference area RA, which is an area free from scratches. For this reason, even if illuminance unevenness occurs at the time of imaging, all the inspection target values corresponding to the scratch-free portion obtained based on the above formula (1) are substantially the same predetermined value. Therefore, the image analysis apparatus 3 sets a predetermined value as a threshold value. Then, the image analysis apparatus 3 determines that among all the pixels of the inspection image data, a pixel whose inspection target value is brighter (larger) than the threshold, that is, a pixel whose inspection target value is “128” or more is a predetermined pixel. to decide. The threshold value can be changed.

  Subsequently, in step S <b> 14, the image analysis device 3 notifies the person inspecting the wound information. For example, the image analysis device 3 obtains the ratio of the predetermined number of pixels to the total number of pixels of the inspection image data. Then, the image analysis apparatus 3 displays a notification screen DS as shown in FIG. 9 on the display unit 33 so as to notify the inspection staff of what percentage of the inspection area IA has a scratch. To do. Thereby, the presence or absence of an abrasion can be evaluated quantitatively.

  As described above, the inspection apparatus 100 according to the present embodiment images the illumination device 1 that illuminates the inspection object 300 and the inspection area IA that is determined by the user as the inspection area of the inspection object 300. The imaging device 2 that generates inspection image data that is monochrome image data of the inspection area IA, and a reference image that is monochrome image data of the reference area RA that is determined by the user as an area free of scratches in the inspection object 300 Inverted image data obtained by inverting the luminance of each pixel of the reference image data is generated from the data, and the pixel value of the pixel at the corresponding position of the inverted image data is set for each pixel value of each pixel of the inspection image data. A value obtained by adding and multiplying by 1/2 is obtained as an inspection target value, and the inspection target value becomes brighter (larger) than a predetermined threshold value. Includes an image analysis apparatus 3 for determining a flaw information indicating which degree of scratches there the number of pixels of 査 image data in the inspection area IA (image analyzing unit), a.

  In the configuration of the present embodiment, the pixel value of each pixel of the inspection image data is added to the pixel value of the pixel at the corresponding position of the inverted image data and multiplied by ½. Calculate as target value. Of all the inspection target values obtained in this way, all the inspection target values corresponding to the non-scratched part (the part having no scratch in the inspection area IA) are all omitted even if illuminance unevenness occurs during imaging. The same predetermined value is obtained. Accordingly, if a predetermined value is set in advance as a threshold and the number of pixels of the inspection image data whose inspection target value is larger than the threshold is obtained as scratch information (information indicating how much scratches are present in the inspection area IA). It is possible to improve the inspection accuracy of scratches.

  In the present embodiment, as described above, the color of the illumination light of the illumination device 1 is a color that is in a complementary color relationship with the surface color of the inspection object 300. With this configuration, the difference in contrast becomes clear. That is, the difference between the pixel value of the pixel with the flawed portion and the pixel value of the pixel with the flawless portion becomes clear. Thereby, the inspection accuracy of the scratches can be further improved.

  In the present embodiment, as described above, the illuminating device 1 irradiates illumination light obliquely onto the surface of the inspection object 300. Here, since the fine unevenness | corrugation has arisen in the part with a flaw of corrugated cardboard, the illumination light of the illuminating device 1 which injected into the part with a flaw is easy to be spread | diffused (it is hard to carry out regular reflection). Therefore, it is preferable that the illumination device 1 irradiates the illumination light obliquely with respect to the surface of the inspection object 300. Furthermore, it is more preferable to use blue light having a short wavelength and easily diffusing as illumination light of the illumination device 1.

  In the present embodiment, as described above, the lighting device mounting plate 111 to which the lighting device 1 is mounted and the lighting device 1 is inspected when the lighting device mounting plate 111 rotates to one side (one direction) in the A direction. The lighting device mounting plate 111 is rotated so that the lighting device 1 moves away from the object to be inspected when the lighting device mounting plate 111 is rotated to the other side in the A direction (another direction opposite to one direction). And a support plate 112 that is movably supported. Further, the lighting device mounting plate 111 has a lighting device fastening hole 111a into which a fastening member 4 for fastening and fixing the lighting device 1 to the lighting device mounting plate 111 is inserted. The lighting device mounting plate 111 is formed in a long hole shape extending from the rotating shaft 113 side toward the opposite side of the rotating shaft 113 side. If comprised in this way, the position of the illuminating device 1 with respect to the to-be-inspected object 300 can be adjusted easily.

  In the present embodiment, as described above, the imaging device mounting plate 211 to which the imaging device 2 is mounted is provided. The imaging device mounting plate 211 has an imaging device fastening hole 211a into which a fastening member 4 for fastening and fixing the imaging device 2 to the imaging device mounting plate 211 is inserted, and the imaging device fastening hole 211a is the imaging device. It is formed in a long hole shape extending along the axial direction (B direction) of the two optical axes OA. If comprised in this way, the position of the imaging device 2 with respect to the to-be-inspected object 300 can be adjusted easily.

  It should be thought that embodiment disclosed this time is an illustration and restrictive at no points. The scope of the present invention is shown not by the description of the above-described embodiment but by the scope of claims for patent, and further includes meanings equivalent to the scope of claims for patent and all modifications within the scope.

DESCRIPTION OF SYMBOLS 1 Illuminating device 2 Imaging device 3 Image analysis apparatus (image analysis part)
100 Inspection Device 111 Lighting Device Mounting Plate 111a Fastening Hole (Lighting Device Fastening Hole)
112 support plate 211 imaging device mounting plate 211a fastening hole (fastening hole for imaging device)
300 Inspected object IA Inspection area RA reference area

Claims (8)

An inspection device for inspecting an inspection object for scratches,
An illumination device that illuminates the inspection object with illumination light of a color complementary to the surface color of the inspection object;
An imaging device that generates inspection image data that is monochrome image data of the inspection area by imaging an inspection area defined by a user as an area to be inspected in the inspection object;
From the reference image data which is monochrome image data of a reference area defined by the user as an area free from scratches in the inspection object, inverted image data in which the luminance of each pixel of the reference image data is inverted is generated. The value obtained by adding the pixel value of the pixel at the corresponding position of the inverted image data and multiplying the pixel value of each pixel of the inspection image data by 1/2 is obtained as the inspection target value. An image analysis unit that determines the number of pixels of the inspection image data in which the inspection target value is brighter than a predetermined threshold value as scratch information indicating how much scratches are present in the inspection region. Inspection apparatus characterized by that. The inspection apparatus according to claim 1, wherein the illumination apparatus irradiates illumination light obliquely to the surface of the inspection object. The lighting device, the inspection device according to claim 1 or 2, characterized in that emits blue light as the illumination light. A lighting device mounting plate to which the lighting device is mounted;
When the lighting device mounting plate rotates in one direction, the lighting device approaches the object to be inspected, and when the lighting device mounting plate rotates in another direction opposite to the one direction, the lighting device is in the test object. away from the inspection apparatus according to any one of claims 1 to 3, characterized in that it comprises a support plate for supporting the illumination device mounting plate pivotally.   An inspection device for inspecting an inspection object for scratches,
  An illumination device for illuminating the object to be inspected;
  A lighting device mounting plate to which the lighting device is mounted;
  When the lighting device mounting plate rotates in one direction, the lighting device approaches the object to be inspected, and when the lighting device mounting plate rotates in another direction opposite to the one direction, the lighting device is in the test object. A support plate for rotatably supporting the lighting device mounting plate,
  An imaging device that generates inspection image data that is monochrome image data of the inspection area by imaging an inspection area defined by a user as an area to be inspected in the inspection object;
  From the reference image data which is monochrome image data of a reference area defined by the user as an area free from scratches in the inspection object, inverted image data in which the luminance of each pixel of the reference image data is inverted is generated. The value obtained by adding the pixel value of the pixel at the corresponding position of the inverted image data and multiplying the pixel value of each pixel of the inspection image data by 1/2 is obtained as the inspection target value. An image analysis unit that determines the number of pixels of the inspection image data in which the inspection target value is brighter than a predetermined threshold value as scratch information indicating how much scratches are present in the inspection region. Inspection apparatus characterized by that. The lighting device mounting plate has a lighting device fastening hole into which a fastening member for fastening and fixing the lighting device to the lighting device mounting plate is inserted.
The inspection device according to claim 5, wherein the lighting device fastening hole is formed in a long hole shape. An imaging device mounting plate to which the imaging device is mounted;
The imaging device mounting plate has an imaging device fastening hole into which a fastening member for fastening and fixing the imaging device to the imaging device mounting plate is inserted.
The inspection device according to claim 1, wherein the fastening hole for the imaging device is formed in a long hole shape. An inspection method for inspecting an inspection object for scratches,
Generate inverted image data in which the luminance of each pixel of the reference image data is inverted from reference image data which is monochrome image data of a reference area defined by a user as an area free from scratches in the inspection object. Steps,
By inspecting the inspection area defined by the user as an area to be inspected among the inspection objects by illuminating the inspection object with illumination light having a color complementary to the surface color of the inspection object , Generating inspection image data which is monochrome image data of the inspection region;
A step of obtaining a value obtained by adding the pixel value of a pixel at a corresponding position of the inverted image data and multiplying the pixel value of each pixel of the inspection image data by 1/2 as an inspection target value When,
Obtaining the number of pixels of the inspection image data in which the inspection target value becomes brighter than a predetermined threshold as scratch information indicating how much scratches are present in the inspection region. Inspection method.