JP6254849B2 - 画像処理装置、画像処理方法 - Google Patents

画像処理装置、画像処理方法 Download PDF

Info

Publication number
JP6254849B2
JP6254849B2 JP2014007270A JP2014007270A JP6254849B2 JP 6254849 B2 JP6254849 B2 JP 6254849B2 JP 2014007270 A JP2014007270 A JP 2014007270A JP 2014007270 A JP2014007270 A JP 2014007270A JP 6254849 B2 JP6254849 B2 JP 6254849B2
Authority
JP
Japan
Prior art keywords
image
pixel
pattern
projection pattern
image processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2014007270A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015135293A5 (enExample
JP2015135293A (ja
Inventor
哲理 園田
哲理 園田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2014007270A priority Critical patent/JP6254849B2/ja
Priority to US14/593,249 priority patent/US9689668B2/en
Publication of JP2015135293A publication Critical patent/JP2015135293A/ja
Publication of JP2015135293A5 publication Critical patent/JP2015135293A5/ja
Application granted granted Critical
Publication of JP6254849B2 publication Critical patent/JP6254849B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Projection Apparatus (AREA)
  • Measurement Of Optical Distance (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP2014007270A 2014-01-17 2014-01-17 画像処理装置、画像処理方法 Expired - Fee Related JP6254849B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2014007270A JP6254849B2 (ja) 2014-01-17 2014-01-17 画像処理装置、画像処理方法
US14/593,249 US9689668B2 (en) 2014-01-17 2015-01-09 Image processing apparatus and image processing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014007270A JP6254849B2 (ja) 2014-01-17 2014-01-17 画像処理装置、画像処理方法

Publications (3)

Publication Number Publication Date
JP2015135293A JP2015135293A (ja) 2015-07-27
JP2015135293A5 JP2015135293A5 (enExample) 2017-02-16
JP6254849B2 true JP6254849B2 (ja) 2017-12-27

Family

ID=53544503

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014007270A Expired - Fee Related JP6254849B2 (ja) 2014-01-17 2014-01-17 画像処理装置、画像処理方法

Country Status (2)

Country Link
US (1) US9689668B2 (enExample)
JP (1) JP6254849B2 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6636252B2 (ja) * 2015-03-19 2020-01-29 株式会社メガチップス 投影システム、プロジェクター装置、撮像装置、および、プログラム
US10360693B2 (en) * 2017-03-01 2019-07-23 Cognex Corporation High speed structured light system
JP6879168B2 (ja) * 2017-11-01 2021-06-02 オムロン株式会社 ３次元測定装置、３次元測定方法及びプログラム
JP7028623B2 (ja) * 2017-12-07 2022-03-02 Ckd株式会社 三次元計測装置
WO2020235067A1 (ja) * 2019-05-22 2020-11-26 オムロン株式会社 ３次元計測システム及び３次元計測方法
CN113660407B (zh) * 2020-04-28 2023-11-17 合肥美亚光电技术股份有限公司 成像设备、成像设备的控制方法及存储介质
US20240384984A1 (en) * 2021-05-31 2024-11-21 Kowa Company, Ltd. Three-dimensional measurement device

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3668019B2 (ja) * 1998-10-27 2005-07-06 株式会社ソニー・コンピュータエンタテインメント 記録媒体、画像処理装置および画像処理方法
JP4110501B2 (ja) 1999-11-22 2008-07-02 ソニー株式会社 ランダムパターン生成装置とその方法、距離画像生成装置とその方法、およびプログラム提供媒体
JP4480488B2 (ja) * 2003-08-28 2010-06-16 富士通株式会社 計測装置、コンピュータ数値制御装置及びプログラム
CA2528791A1 (en) * 2005-12-01 2007-06-01 Peirong Jia Full-field three-dimensional measurement method
JP5299054B2 (ja) * 2009-04-21 2013-09-25 ソニー株式会社 電子機器、表示制御方法およびプログラム
TWI432699B (zh) * 2009-07-03 2014-04-01 Koh Young Tech Inc 用於檢查測量物件之方法
JP5576726B2 (ja) 2010-06-29 2014-08-20 キヤノン株式会社 三次元計測装置、三次元計測方法、及びプログラム
GB2497031A (en) 2010-09-08 2013-05-29 Canon Kk Method and apparatus for 3D-measurement by detecting a predetermined pattern
JP5595211B2 (ja) * 2010-10-12 2014-09-24 キヤノン株式会社 三次元形状測定装置、三次元形状測定方法及びコンピュータプログラム
JP5132832B1 (ja) * 2011-07-11 2013-01-30 キヤノン株式会社 計測装置および情報処理装置
AU2011224051B2 (en) * 2011-09-14 2014-05-01 Canon Kabushiki Kaisha Determining a depth map from images of a scene
US9142025B2 (en) * 2011-10-05 2015-09-22 Electronics And Telecommunications Research Institute Method and apparatus for obtaining depth information using optical pattern
JP2013124884A (ja) 2011-12-13 2013-06-24 Canon Inc 情報処理装置、情報処理装置の制御方法、およびプログラム
JP6112769B2 (ja) 2012-03-05 2017-04-12 キヤノン株式会社 情報処理装置、情報処理方法
US9389067B2 (en) * 2012-09-05 2016-07-12 Canon Kabushiki Kaisha Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium

Also Published As

Publication number Publication date
US9689668B2 (en) 2017-06-27
US20150204661A1 (en) 2015-07-23
JP2015135293A (ja) 2015-07-27

Similar Documents

Publication Publication Date Title
JP6254849B2 (ja) 画像処理装置、画像処理方法
JP6480902B2 (ja) 投影パターン作成装置および３次元計測装置
EP2568253B1 (en) Structured-light measuring method and system
JP2021507440A (ja) 対象物の３次元画像を生成するための方法およびシステム
US20130272600A1 (en) Range image pixel matching method
JP2017181298A (ja) ３次元形状測定装置および３次元形状測定方法
US20190313082A1 (en) Apparatus and method for measuring position of stereo camera
JP2012141758A (ja) 三次元データ処理装置、方法及びプログラム
CN107534731B (zh) 图像处理装置和图像处理方法
CN118747742A (zh) 基于人工智能的电缆缺陷检测方法及系统
US9563937B2 (en) High-resolution image generation apparatus, high-resolution image generation method, and high-resolution image generation program
Svoboda et al. Matching in catadioptric images with appropriate windows, and outliers removal
CN111489384A (zh) 基于互视角的遮挡评估方法及装置、设备、系统和介质
KR20110089299A (ko) 스테레오 매칭 처리 시스템, 스테레오 매칭 처리 방법, 및 기록 매체
US9721348B2 (en) Apparatus and method for raw-cost calculation using adaptive window mask
JP2019091122A (ja) デプスマップフィルタ処理装置、デプスマップフィルタ処理方法及びプログラム
CN104641395B (zh) 图像处理设备及图像处理方法
US20250278859A1 (en) Image point cloud data processing device, image point cloud data processing method, and storage medium storing image point cloud data processing program
JP2018139366A (ja) 補正量演算装置、補正装置及び補正量演算方法
CN107534730A (zh) 图像处理装置及图像处理方法
KR102358854B1 (ko) 얼굴 이미지 색상 합성 장치 및 방법
US9936189B2 (en) Method for predicting stereoscopic depth and apparatus thereof
JP7135517B2 (ja) 三次元形状モデル生成装置、三次元モデル生成方法及びプログラム
JPWO2009107365A1 (ja) 複眼測距装置の検査方法及び検査装置並びにそれに用いるチャート
JP2021018219A (ja) ３次元形状計測システム、３次元形状計測方法、及び３次元形状計測プログラム

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20170106

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20170106

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20171010

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20171102

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20171201

R151 Written notification of patent or utility model registration

Ref document number: 6254849

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R151

LAPS Cancellation because of no payment of annual fees