JP6253526B2 - Endoscope device - Google Patents

Description

  The present invention relates to an endoscope apparatus.

  As a measurement endoscope apparatus that acquires a three-dimensional shape of a subject, there is a device that performs three-dimensional measurement by a stereo method using subject images obtained by imaging a subject from a plurality of viewpoints (see, for example, Patent Document 1). ).

  In the stereo method, association (referred to as “matching processing”) between a plurality of subject images corresponding to different viewpoints is performed for each pixel of an image obtained by capturing the subject image. In the matching process, the corresponding points are searched for by using the characteristics (pattern or the like) of the subject as a clue. Therefore, in an area having few features on the surface of the subject, matching may not be performed correctly (referred to as “miscorresponding”), and the acquired three-dimensional shape may become inaccurate. In order to solve this problem, there is a method of reducing miscorrespondence of a region having few features by projecting a pattern and giving the subject a pattern from the outside.

  On the other hand, Patent Documents 2 and 3 describe a method of projecting a pattern onto a subject and performing three-dimensional measurement. In the measurement endoscope apparatus proposed in Patent Document 2, a pattern composed of parallel stripes is projected onto the surface of the subject, the position of the stripes is temporally changed, and the change in the luminance of each pixel of the subject image is generated. In addition, a phase shift method for performing three-dimensional measurement is used. In Patent Document 3, a method is used in which a subject image is acquired and a three-dimensional measurement is performed in a state where a dot-like pattern is projected onto the surface of the subject.

Japanese Patent No. 4759184 US Patent Application Publication No. 2009/0225321 US Pat. No. 7,486,805

  The pattern projected on the subject in Patent Document 2 and Patent Document 3 is a regular pattern. When a regular pattern is used in the stereo method, the photographed pattern tends to be regular in a portion having no feature on the surface of the subject. In this part, since miscorrespondence is likely to occur, the matching accuracy is likely to decrease.

  The present invention provides an endoscope apparatus with improved matching accuracy.

  The present invention captures a semiconductor light source that generates coherent light, a light source control unit that controls the semiconductor light source, and a subject inside the object from a plurality of viewpoints, and generates image data of a plurality of images of the subject. An imaging unit, a calculation unit that calculates a three-dimensional shape of the subject based on the image data generated during the measurement mode, and an image based on the image data generated during the observation mode are displayed during the observation mode. A display unit that is inserted into the object, and the imaging unit is disposed, and the light generated by the semiconductor light source is projected onto the subject from the tip of the insertion unit, or the semiconductor The insertion unit that projects the light generated by the light source onto the subject through the optical adapter attached to the tip, and the light generated by the semiconductor light source A speckle pattern generator for generating random diffraction field speckles, and a speckle pattern by the diffraction field speckles is projected onto the subject during the measurement mode, and is projected onto the subject during the observation mode. And a speckle pattern control unit that controls the diffraction field speckle so that the speckle pattern to be reduced is smaller than that in the measurement mode.

  In the endoscope apparatus according to the aspect of the invention, the speckle pattern control unit may perform the diffraction in space at a cycle that is the same as or shorter than the exposure time of imaging by the imaging unit during the observation mode. The diffraction field speckle is controlled so that the distribution of the field speckle changes.

  The endoscope apparatus according to the present invention further includes a light distribution adjusting optical system that is disposed at the distal end of the insertion portion and adjusts a range in which light generated by the semiconductor light source is projected onto the subject.

  The endoscope apparatus according to the present invention includes a wavelength conversion unit that converts light generated by the semiconductor light source into light corresponding to a plurality of color components, and light generated by the semiconductor light source from the image data. An extraction unit that extracts data of a color component having a wavelength closest to the wavelength of the color component included in the calculation unit, and the calculation unit is configured to obtain a three-dimensional shape of the subject based on the data extracted by the extraction unit Is calculated.

  In the endoscope apparatus of the present invention, the speckle pattern control unit may be configured to apply a first state in which a speckle pattern by the diffraction field speckle is projected onto the subject during the measurement mode, and the subject. The diffraction field speckle is controlled such that the projected speckle pattern is sequentially switched to a second state in which the speckle pattern is reduced from the first state, and the imaging unit is configured to control the first state and the first state. Imaging is performed in each of the two states.

  In the endoscope apparatus of the present invention, an objective lens that forms a plurality of images when the subject is viewed from a plurality of viewpoints, and a light distribution that adjusts a range in which the light generated by the semiconductor light source is projected onto the subject The optical adapter having an adjusting optical system can be attached to the distal end of the insertion portion, and the optical adapter attached to the distal end can be removed from the distal end.

  In the endoscope apparatus according to the present invention, the optical adapter includes an electrical element having electrical characteristics corresponding to a type of the optical adapter, and a first connection portion that is electrically connected to the distal end of the insertion portion. And a second connection part disposed at the distal end of the insertion part and electrically connected to the first connection part, and a signal detection for detecting a signal output from the electrical element And an identification unit for identifying the type of the optical adapter based on the signal detected by the signal detection unit.

  In the endoscope apparatus of the present invention, the speckle pattern control unit is the light source control unit, and the light source control unit controls the wavelength of light generated by the semiconductor light source to control the diffraction field specs. Control.

  In the endoscope apparatus of the present invention, the light source control unit has a period of change in wavelength of light generated by the semiconductor light source during the observation mode equal to an exposure time of imaging by the imaging unit, or Shorter than the exposure time, keep the wavelength of light generated by the semiconductor light source during the measurement mode constant, or change the period of change of the wavelength of light generated by the semiconductor light source during the measurement mode The diffraction field speckle is controlled by making it longer than the exposure time.

  In the endoscope apparatus of the present invention, the imaging unit adjusts an exposure time of imaging with an electronic shutter, and sets a period of change in wavelength of light generated by the semiconductor light source to a shutter speed of the electronic shutter. It further has a cycle determining unit that determines the response accordingly.

  In the endoscope apparatus according to the present invention, the light source control unit controls the diffraction field speckle by controlling a current for driving the semiconductor light source.

  In the endoscope apparatus of the present invention, the speckle pattern control unit controls the diffraction field speckle by controlling the temperature of the semiconductor light source.

  In the endoscope apparatus of the present invention, the speckle pattern generation unit is disposed in an optical path of light generated by the semiconductor light source, and is positioned in a direction perpendicular to a traveling direction of the light generated by the semiconductor light source. The optical path length varies according to the optical path length dispersion unit that gives a phase distribution according to the optical path length to the light generated by the semiconductor light source, and the speckle pattern control unit includes the optical path length dispersion The diffraction field speckle is controlled by vibrating the part and controlling the period of vibration.

  In the endoscope apparatus of the present invention, the speckle pattern generation unit includes a wavelength conversion unit that converts light generated by the semiconductor light source into light corresponding to a plurality of color components, and the speckle pattern generation unit The pattern control unit controls the diffraction field speckle by vibrating the wavelength conversion unit and controlling the period of vibration.

  According to the present invention, the speckle pattern due to random diffraction field speckles is projected onto the subject during the measurement mode, so that the matching accuracy is improved.

1 is a perspective view showing an appearance of an endoscope apparatus according to an embodiment of the present invention. It is a block diagram which shows the detailed structure of the endoscope apparatus by embodiment of this invention. It is the perspective view and sectional drawing which show the structure of the front-end | tip of the insertion part of the endoscope apparatus and optical adapter by embodiment of this invention. It is sectional drawing which shows the structure of the front-end | tip of the insertion part and optical adapter of the endoscope apparatus by embodiment of this invention. It is a flowchart which shows the procedure of operation | movement of the endoscope apparatus by embodiment of this invention. It is a reference figure showing the picture photoed with the endoscope apparatus by the embodiment of the present invention. It is a block diagram which shows the detailed structure of the endoscope apparatus by the 1st modification of embodiment of this invention. It is sectional drawing which shows the structure of the front-end | tip of an insertion part and optical adapter of the endoscope apparatus by the 1st modification of embodiment of this invention. It is a flowchart which shows the procedure of operation | movement of the endoscope apparatus by the 2nd modification of embodiment of this invention. It is a block diagram which shows the structure of the endoscope apparatus by the 3rd modification of embodiment of this invention. It is a flowchart which shows the procedure of operation | movement of the endoscope apparatus by the 3rd modification of embodiment of this invention. FIG. 10 is a block diagram showing a configuration of an optical member for giving an optical path length difference to light in an endoscope apparatus according to a fifth modification of the embodiment of the present invention. It is a block diagram which shows the detailed structure of the endoscope apparatus by the 7th modification of embodiment of this invention.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings. In the present embodiment, a speckle pattern based on spatially random diffraction field speckles is projected onto a subject during measurement. Diffraction field speckles are generated when laser light interferes in space when the phase distribution in the light beam of laser light diffused from a window having a certain area and emitted into space is not uniform. On the surface of the subject irradiated with the laser light, the speckle pattern is observed as a random light and dark distribution.

  A diffraction field speckle when the phase distribution in the light beam is random has a spatially random structure. For this reason, when the position of the subject with respect to the laser light emission window changes, the observed speckle pattern changes randomly. If the phase distribution in the laser beam and the position of the subject with respect to the laser beam exit window are stable in time, the speckle pattern is observed as a fixed pattern. Since the fixed pattern does not change even if the viewpoint changes, this fixed pattern can be used as an auxiliary to three-dimensional measurement by the stereo method, that is, stereo measurement.

  FIG. 1 shows the overall configuration of an endoscope apparatus 1 according to the present embodiment. As shown in FIG. 1, the endoscope apparatus 1 includes an insertion unit 2, a control unit 3, an operation unit 4, and a display unit 5.

  The insertion unit 2 is inserted into the object to be observed. An optical adapter having an optical system for taking light from the subject into the distal end 20 can be attached to the distal end 20 (the distal end) of the insertion portion 2. For example, by attaching a stereo optical adapter to the tip 20, two subject images corresponding to a plurality of different viewpoints can be acquired. The control unit 3 has a configuration for controlling the endoscope apparatus 1. The operation unit 4 receives an operation performed by the user. The display unit 5 displays an image photographed by the endoscope apparatus 1, a processing menu, and the like.

  FIG. 2 shows a detailed configuration of the endoscope apparatus 1. As shown in FIG. 2, the optical adapter 6 is attached to the distal end 20 of the insertion portion 2. The optical adapter 6 of this embodiment is a stereo optical adapter that forms a plurality of images from a plurality of viewpoints. The optical adapter 6 includes an objective lens 60 and a light distribution adjusting optical system 61. An imaging unit 21 and a phosphor 22 are disposed at the distal end 20 of the insertion unit 2. The control unit 3 includes an imaging control unit 30, an image processing circuit 31, a laser diode 32, a light source control circuit 33, a temperature control element 34, a temperature control circuit 35, and a CPU 36. In the following, the laser diode is described as LD.

  The objective lens 60 captures light from the subject. The light captured by the objective lens 60 enters the imaging unit 21. The imaging unit 21 is disposed at the distal end 20 of the insertion unit 2 and images a subject inside the object into which the insertion unit 2 is inserted from a plurality of viewpoints, and generates image data of a plurality of images of the subject. The image data generated by the imaging unit 21 is transmitted to the imaging control unit 30 via the signal line 80 arranged in the insertion unit 2 and the control unit 3.

  The imaging control unit 30 outputs a control signal to the imaging unit 21 via the signal line 80 to control the imaging unit 21. Further, the imaging control unit 30 outputs the image data output from the imaging unit 21 to the video processing circuit 31. The video processing circuit 31 performs various types of image processing on the image data output from the imaging control unit 30. The video processing circuit 31 is an output unit that outputs image data to the display unit 5 that displays an image based on the image data generated during the observation mode during the observation mode.

  The LD 32 is a semiconductor light source (coherent light source) that generates coherent light. In the present embodiment, a diffracted light speckle generated by interference of light emitted from the semiconductor light source is used, and thus a semiconductor light source having high coherence is used. Therefore, it is desirable to use an LD as a semiconductor light source. In this embodiment, an example in which the LD 32 is used as a light source will be described. The LD 32 generates coherent monochromatic light. The light source control circuit 33 is a light source control unit that controls the LD 32.

  The light emitted from the LD 32 is transmitted to the phosphor 22 via the optical fiber 81 disposed in the insertion section 2 and the control unit 3. The optical fiber 81 of this embodiment is a single mode optical fiber. The phosphor 22 is a wavelength conversion unit that converts the light generated by the LD 32 into light corresponding to a plurality of color components. The phosphor 22 of the present embodiment converts the monochromatic light generated by the LD 32 into white light.

  The light emitted from the LD 32 is light having a uniform phase. This light is transmitted by the optical fiber 81 with its phases substantially aligned, and enters the phosphor 22. When this light passes through the phosphor 22, a spatially random phase distribution is given to the light, and diffraction field speckles are generated. That is, the phosphor 22 is a speckle pattern generation unit that generates spatially random diffraction field speckles for the light generated by the LD 32.

  The light emitted from the phosphor 22 enters the light distribution adjusting optical system 61. The light distribution adjusting optical system 61 adjusts the light distribution so that the light guided from the distal end 20 of the insertion unit 2 illuminates the entire field of view captured by the imaging unit 21, and irradiates the subject with the light. That is, the light distribution adjusting optical system 61 adjusts the range in which the light guided from the distal end 20 of the insertion portion 2 is projected. The light distribution adjusting optical system 61 is an illumination optical system such as a concave lens. Since the phosphor 22 diffuses and emits the light incident on the phosphor 22, the phosphor 22 may function as a light distribution adjusting optical system. Therefore, the light distribution adjusting optical system 61 is not essential. As described above, the insertion unit 2 of the present embodiment is inserted into the object, the imaging unit 21 is disposed, and the light generated by the LD 32 is transmitted to the subject via the optical adapter 6 attached to the tip 20. Project.

  The temperature control element 34 controls the temperature of the LD 32 by heating or cooling the LD 32. It is possible to control the conspicuousness of the speckle pattern by controlling the temperature of the LD 32 so that it changes with time. In order to efficiently and effectively change the conspicuousness of the speckle pattern by controlling the temperature of the semiconductor light source, it is desirable to make the heat dissipation of the semiconductor light source as high as possible.

  For example, the temperature control element 34 is a combination of a heater for raising the temperature and a heat sink or an air cooling fan for cooling. Alternatively, a Peltier element that can heat and cool the element by controlling the current may be used as the temperature control element 34.

  The temperature control circuit 35 controls the temperature control element 34. The temperature control circuit 35 projects the speckle pattern by the diffraction field speckles onto the subject during the measurement mode, and reduces the speckle pattern projected onto the subject during the observation mode to be less than that during the measurement mode. A speckle pattern control unit that controls speckles. The temperature control circuit 35 controls the diffraction field speckle by controlling the temperature of the LD 32.

  During the measurement mode, the diffraction field speckle is controlled so that the speckle pattern projected on the surface of the subject is conspicuous in order to improve the matching accuracy in the stereo method. In addition, during the observation mode, the diffraction field speckle is controlled so that the speckle pattern projected on the surface of the subject becomes inconspicuous in order to make the surface of the subject easy to see.

  The CPU 36 controls each unit in the endoscope apparatus 1. The CPU 36 is an arithmetic unit that takes in the image data processed by the video processing circuit 31 during the measurement mode and calculates the three-dimensional shape of the subject based on the image data generated during the measurement mode. In addition, the CPU 36 monitors the state of the operation unit 4. Thereby, the CPU 36 detects an operation for changing the mode of the endoscope apparatus 1, an operation related to measurement in the measurement mode, and the like.

  FIG. 3 shows the configuration of the distal end 20 of the insertion portion 2 and the optical adapter 6. FIG. 3A shows the external appearance of the distal end 20 of the insertion portion 2 and the optical adapter 6. FIG. 3B shows a cross section of the distal end 20 of the insertion portion 2 and the optical adapter 6. FIG. 3B shows a cross section including the objective lens 60a and the objective lens 60b.

  An optical adapter 6 is attached to the distal end 20 of the insertion portion 2. The optical adapter 6 is screwed and fixed to the male screw 65 at the distal end 20 of the insertion portion 2 by the female screw 64 of the fixing ring 63. At the tip of the optical adapter 6, two objective lenses 60a, 60b and a light distribution adjusting optical system 61 are provided. The objective lens 60a and the objective lens 60b correspond to the objective lens 60 in FIG. The objective lens 60 a and the objective lens 60 b form two images of the subject on the imaging unit 21 provided in the distal end 20 of the insertion unit 2. The imaging unit 21 is connected to the signal line 80, and image data is output from the imaging unit 21 to the signal line 80. A cover glass 69 for protecting the imaging unit 21 is disposed on the end surface of the distal end 20 of the insertion unit 2.

  In the present embodiment, a window for projecting illumination light and a window for projecting a speckle pattern for measurement are shared in order to reduce restrictions on the outer diameter of the distal end 20 of the insertion portion 2. . The light distribution adjusting optical system 61 is disposed in the common window, and the light distribution adjusting optical system 61 projects the illumination light and the diffraction field speckle generated in the illumination light onto the subject.

  FIG. 4 shows a cross section of the distal end 20 of the insertion portion 2 and the optical adapter 6. FIG. 4 shows a cross section including the light distribution adjusting optical system 61. A phosphor 22 is disposed at the distal end 20 of the insertion portion 2, and an optical fiber 81 is connected to the phosphor 22. A light distribution adjusting optical system 61 is disposed in front of the phosphor 22.

  In the present embodiment, an objective lens 60a and an objective lens 60b that form a plurality of images when the subject is viewed from a plurality of viewpoints, and a light distribution adjustment optical system 61 that adjusts a range in which the light generated by the LD 32 is projected onto the subject. It is possible to attach the optical adapter 6 having the above to the distal end 20 of the insertion portion 2 and to remove the optical adapter 6 attached to the distal end 20 from the distal end 20. That is, in this embodiment, an interchangeable optical system is used.

  The optical system may not be exchangeable. In other words, the objective lens 60a and the objective lens 60b that form a plurality of images when the subject is viewed from a plurality of viewpoints, and the light distribution adjustment optical system 61 that adjusts the range in which the light generated by the LD 32 is projected onto the subject are inserted. 2 may be disposed at the tip 20. In this case, a first window for observation and a common second window for illumination and pattern projection are provided at the distal end 20 of the insertion portion 2, and the objective lens 60a and the objective lens 60b are provided in the first window. Is arranged, and the light distribution adjusting optical system 61 is arranged in the second window. The insertion unit 2 configured as described above is inserted into the object, the imaging unit 21 is disposed, and the light generated by the LD 32 is projected from the tip 20 onto the subject.

  The optical adapter 6 shown in FIG. 4 is a direct-viewing type optical adapter for performing observation in the direction in which the insertion portion 2 is inserted. A side-view type optical adapter for performing observation in a direction perpendicular to the direction in which the insertion portion 2 is inserted may be attached to the distal end 20 of the insertion portion 2.

  A rigid endoscope in which the insertion unit 2 is formed of a hard pipe, the imaging unit 21 is disposed on the base side of the insertion unit 2, and a relay lens is disposed in the insertion unit 2 may be used.

  Next, the operation of the endoscope apparatus 1 will be described with reference to FIG. FIG. 5 shows an operation procedure of the endoscope apparatus 1.

  When the endoscope apparatus 1 is activated, the CPU 36 reads stereo camera parameters indicating optical characteristics unique to the optical adapter 6 (step S101). The stereo camera parameters read in step S101 are internal parameters for correcting distortion generated in an image due to the focal length of the objective lens 60 and optical aberrations of the objective lens 60, or external parameters representing the positional relationship between a pair of objective lenses. Etc.

  After the stereo camera parameters are read, the CPU 36 sets the mode of the endoscope apparatus 1 to the observation mode (step S102). When the mode is set to the observation mode, the imaging unit 21 starts imaging. The imaging unit 21 continuously captures images and sequentially outputs the generated image data.

  After the mode is set, the CPU 36 determines the set mode (step S103). Immediately after the endoscope apparatus 1 is activated, the mode is set to the observation mode. When the set mode is the observation mode, the CPU 36 sets the wavelength modulation period in the observation mode for the temperature control circuit 35 (step S107). If the observation mode is continued and the wavelength modulation cycle has already been set, the process of step S107 is skipped.

  In the present embodiment, the endoscope apparatus 1 controls the conspicuousness of the speckle pattern projected on the surface of the subject by controlling the wavelength of light generated by the LD 32. In the observation mode, the wavelength modulation is performed so that the speckle pattern projected on the surface of the subject becomes inconspicuous in order to make the surface of the subject easy to see. The wavelength modulation cycle set in step S107 is the same as the exposure time of imaging by the imaging unit 21 or shorter than the exposure time. The wavelength of light generated by the LD 32 is controlled by controlling the temperature of the LD 32.

  The imaging unit 21 of the present embodiment adjusts the exposure time of imaging with an electronic shutter. The CPU 36 determines the period of change in the wavelength of the light generated by the LD 32 according to the shutter speed of the electronic shutter. In step S107, this cycle is set in the temperature control circuit 35.

  After the wavelength modulation period in the observation mode is set, the temperature control circuit 35 starts wavelength modulation control by the temperature control element 34 (step S108). When the wavelength modulation control is started, the temperature control circuit 35 changes the distribution of diffraction field speckles in the space at the same period as the exposure time of imaging by the imaging unit 21 or shorter than the exposure time during the observation mode. Thus, the temperature of the LD 32 is controlled. For example, when the temperature control element 34 is a Peltier element, the temperature control circuit 35 changes the current applied to the Peltier element into a rectangular wave shape. The period of the rectangular wave is the period set in step S107. Thereby, for example, the temperature of the LD 32 changes in a sine wave shape. If the observation mode is continued and wavelength modulation control has already been started, wavelength modulation control is continued in step S108.

  After the wavelength modulation control in the observation mode is started, the video processing circuit 31 performs image processing on the image data output from the imaging unit 21 and outputs the processed image data to the display unit 5. The display unit 5 displays an image of the subject based on the image data (step S109).

  As the wavelength of the light generated by the LD 32 changes, the phase distribution in the light beam emitted from the tip changes, and the interference position in space changes. When the interference position changes at high speed within the exposure time, the speckle pattern distribution changes at high speed. For this reason, the luminance distribution of the speckle pattern in the image is averaged, and the speckled speckle pattern becomes inconspicuous. During the observation mode, light in which the speckle pattern is reduced than the speckle pattern projected on the surface of the subject during the measurement mode described later is projected onto the subject. In this state, the user observes the subject and inspects whether there is a damaged portion.

  The speckle pattern projected on the surface of the subject during the observation mode only needs to be less noticeable than the speckle pattern projected on the surface of the subject during the measurement mode. The speckle pattern projected on the surface of the subject during the observation mode may not be visible. The state where the speckle pattern cannot be visually recognized is the state where the speckle pattern is most reduced.

  After the subject image is displayed, the CPU 36 determines whether or not an operation for changing the mode is performed on the operation unit 4 (step S110). When the operation for changing the mode is not performed, the determination in step S103 is performed. When the operation for changing the mode is performed, the CPU 36 sets the mode of the endoscope apparatus 1 to a mode different from the set mode (step S111). When the set mode is the observation mode, the mode is set to the measurement mode in step S111. If the set mode is the measurement mode, the mode is set to the observation mode in step S111. After the mode is changed, the determination in step S103 is performed.

  For example, when a damaged part is found and an operation for changing the mode to the measurement mode is performed, it is determined in step S110 that an operation for changing the mode is performed, and in step S111, the mode is changed to the measurement mode. Thereafter, in step S103, it is determined that the set mode is the measurement mode. In the measurement mode, the CPU 36 causes the temperature control circuit 35 to start wavelength control in the measurement mode (step S104).

  In the measurement mode, wavelength control is performed so that the wavelength of the light generated by the LD 32 is constant over time. The temperature control circuit 35 controls the temperature of the LD 32 so that the distribution of diffraction field speckles in the space becomes constant during the measurement mode. That is, the temperature control circuit 35 controls the temperature control element 34 so that the temperature of the LD 32 becomes constant. If the measurement mode is continued and wavelength control has already been started, wavelength control is continued in step S104.

  In the measurement mode, the wavelength of light generated by the LD 32 is constant. As a result, while the positional relationship between the subject and the distal end 20 of the insertion portion 2 is constant, a spotted speckle pattern in a stationary state is projected onto the surface of the subject. Wavelength control is performed so that the speckle pattern does not fluctuate.

  After the wavelength control in the measurement mode is started, the video processing circuit 31 performs image processing on the image data output from the imaging unit 21 and outputs the processed image data to the display unit 5. The display unit 5 displays an image of the subject based on the image data (step S105).

  After the image of the subject is displayed, the CPU 36 receives an operation related to measurement and performs measurement calculation processing (step S106). For example, the measurement-related operation is an operation for designating a measurement point indicating a measurement position with respect to an image displayed on the display unit 5. The measurement point is designated for a moving image (live image) or a still image. The measurement calculation process is a process for calculating the three-dimensional shape of the subject based on the image data generated during the measurement mode. The CPU 36 calculates corresponding points of other subject images corresponding to the measurement points designated for any of the plurality of subject images by matching processing. Further, the CPU 36 calculates the spatial coordinates, ie, three-dimensional coordinates, of the points on the subject corresponding to the measurement points based on the image coordinates of the measurement points and the corresponding points, ie, the two-dimensional coordinates.

  A plurality of subject images have random spotted patterns. This pattern is a speckle pattern. Even if there is no feature in the subject, the projected speckle pattern becomes a feature, so that it is possible to prevent erroneous calculation of corresponding points in the matching process. As a result, subject restrictions are reduced, and three-dimensional measurement of a subject with few features, which is difficult with an endoscope apparatus equipped with a conventional stereo measurement function, is possible.

  After the measurement calculation process is completed, the determination in step S110 is performed. When an operation for changing the mode is performed during the measurement mode, the mode is changed to the observation mode in step S111. After that, wavelength modulation control is performed by the processing in step S107 and step S108, and the subject is easily observed.

  FIG. 6 shows an example of a captured image. FIG. 6A shows an image M1 photographed during the observation mode. FIG. 6B shows an image M2 taken during the measurement mode.

  The image M1 photographed during the observation mode has a left image L1 and a right image R1 that are two subject images corresponding to the left and right viewpoints. Similarly, the image M2 photographed during the measurement mode has a left image L2 and a right image R2. The speckle pattern is not conspicuous in the left image L1 and the right image R1 in the image M1 photographed during the observation mode. On the other hand, a speckle pattern is photographed in the left image L2 and the right image R2 in the image M2 photographed during the measurement mode.

  The mode switching from the observation mode to the measurement mode may be automatically performed. For example, when the endoscope apparatus 1 further includes a shake detection unit (for example, the CPU 36) that detects an image blur based on the image data generated by the imaging unit 21, and the image blur amount is a predetermined amount or more. Alternatively, the mode may be switched from the observation mode to the measurement mode when the mode of the endoscope apparatus 1 becomes the observation mode and the amount of blurring of the image is less than a predetermined amount.

  The endoscope apparatus 1 may perform control to increase the shutter speed of the imaging unit 21 when the distance from the distal end 20 of the insertion unit 2 to the subject is long and the amount of light captured by the imaging unit 21 is small. In addition, the endoscope apparatus 1 may perform control to reduce the shutter speed of the imaging unit 21 when the distance from the distal end 20 of the insertion unit 2 to the subject is short and the amount of light captured by the imaging unit 21 is large. Using the result of this control, when the shutter speed of the imaging unit 21 is equal to or higher than a predetermined value, the mode of the endoscope apparatus 1 is in the observation mode, and when the shutter speed is lower than the predetermined value, the mode is changed from the observation mode. You may switch to measurement mode.

  The endoscope apparatus 1 may perform control to increase the gain of the imaging unit 21 when the distance from the distal end 20 of the insertion unit 2 to the subject is long and the amount of light captured by the imaging unit 21 is small. In addition, the endoscope apparatus 1 may perform control to reduce the gain of the imaging unit 21 when the distance from the distal end 20 of the insertion unit 2 to the subject is short and the amount of light captured by the imaging unit 21 is large. Using the result of this control, when the gain of the imaging unit 21 is greater than or equal to a predetermined value, the mode of the endoscope apparatus 1 becomes the observation mode, and when the gain is less than the predetermined value, the mode changes from the observation mode to the measurement mode. It may be switched to.

  The endoscope apparatus 1 may perform control to increase the illumination light amount (light amount of the LD 32) when the distance from the distal end 20 of the insertion unit 2 to the subject is long and the light amount taken into the imaging unit 21 is small. Further, the endoscope apparatus 1 may perform control to reduce the illumination light amount when the distance from the distal end 20 of the insertion unit 2 to the subject is short and the light amount taken into the imaging unit 21 is large. Using the result of this control, the mode of the endoscope apparatus 1 is in the observation mode when the illumination light quantity is greater than or equal to a predetermined value, and the mode is switched from the observation mode to the measurement mode when the illumination light quantity is less than the predetermined value. May be.

  An image used for three-dimensional measurement will be described. In the present embodiment, the light emitted from the LD 32 strikes the phosphor 22 and the monochromatic light is converted into white light. This white light becomes illumination light. The speckle pattern can be made more conspicuous by using an image of only the color component corresponding to the wavelength close to the wavelength of the light that excites the phosphor 22 instead of the color image for the three-dimensional measurement. For example, when the LD 32 is an LD that generates blue light, an image of a blue component can be extracted from a color image and used for three-dimensional measurement. When three-dimensional measurement is performed on a part with a gentle shape or a part without a pattern, the matching accuracy is further improved by extracting the data of the color component close to the color component of the light generated by the LD 32 and performing the three-dimensional measurement. To do.

  The phosphor 22 is a wavelength conversion unit that converts the light generated by the LD 32 into light corresponding to a plurality of color components. The video processing circuit 31 is an extraction unit that extracts, from the image data generated by the imaging unit 21, data of a color component having a wavelength closest to the wavelength of the color component included in the light generated by the LD 32. For example, the image data generated by the imaging unit 21 includes data of red, green, and blue components. Since the speckle pattern is included in the blue component data, the video processing circuit 31 extracts the blue component data from the image data. The CPU 36 calculates the three-dimensional shape of the subject based on the data extracted by the video processing circuit 31.

  On the other hand, a color image may be used for measurement. Since the speckle pattern is patchy, there is a portion where the pattern is not projected (a portion between the bright portion of the pattern and the dark portion of the pattern). When three-dimensional measurement is performed using image data including red, green, and blue component data, information on a portion where no pattern is projected is included in the red and green component data. When measuring a sharp edge portion or a portion with a pattern, matching accuracy is further improved by using image data including data of red and green components. Further, since the blue component data is included in the image data, as described above, the matching accuracy in the three-dimensional measurement of the portion having a gentle shape or the portion having no pattern is further improved.

  The configuration and method shown in this embodiment is not limited to an endoscope apparatus, and is an apparatus that images a subject from a plurality of viewpoints and calculates a three-dimensional shape of the subject using a stereo method. The present invention can also be applied to other three-dimensional measuring devices with high restrictions.

  The imaging unit 21 of the endoscope apparatus 1 according to the present embodiment captures two subject images simultaneously. On the other hand, the imaging unit 21 may alternately capture two subject images. For example, a movable shielding material that shields one of the first optical path and the second optical path corresponding to two subject images is provided. The imaging unit 21 captures a subject image in each of a state where only the first optical path is shielded by the shielding material and a state where only the second optical path is shielded by the shielding material.

  According to the present embodiment, a semiconductor light source (LD32) that generates coherent light, a light source control unit (light source control circuit 33) that controls the semiconductor light source, and subjects inside the object are imaged from a plurality of viewpoints, An imaging unit 21 that generates image data of the plurality of images, a calculation unit (CPU 36) that calculates a three-dimensional shape of the subject based on the image data generated during the measurement mode, and an image generated during the observation mode A display unit 5 that displays an image based on data during the observation mode, and an insertion unit 2 that is inserted into the object, the imaging unit 21 being arranged, and the light generated by the semiconductor light source is transmitted to the tip of the insertion unit 2 20 is projected onto the subject, or the light generated by the semiconductor light source is projected onto the subject via the optical adapter 6 attached to the tip 20, and the light is generated by the semiconductor light source. A speckle pattern generator (phosphor 22) that generates spatially random diffraction field speckles against the reflected light, and a speckle pattern by diffraction field speckles is projected onto the subject during the measurement mode and observed. An endoscope apparatus 1 having a speckle pattern control unit (temperature control circuit 35) that controls a diffraction field speckle so that a speckle pattern projected onto a subject is reduced during the mode than in the measurement mode. Composed.

  In the present embodiment, since the speckle pattern due to random diffraction field speckles is projected onto the subject during the measurement mode, the matching accuracy is improved.

  Next, a modification of this embodiment will be described.

(First modification)
FIG. 7 shows a configuration of an endoscope apparatus 1a according to this modification. Hereinafter, a difference in configuration between the endoscope apparatus 1 illustrated in FIG. 2 and the endoscope apparatus 1a illustrated in FIG. 7 will be described. As shown in FIG. 7, the endoscope apparatus 1a includes an insertion portion 2a, a control unit 3a, an operation portion 4, and a display portion 5. LD32 is arrange | positioned at the front-end | tip 20a of the insertion part 2a. The control unit 3 a includes an imaging control unit 30, a video processing circuit 31, a light source control circuit 33, and a CPU 36.

  The LD 32 is connected to the light source control circuit 33 by a power line 82 disposed in the insertion portion 2a and the control unit 3a. As described in another modification, the speckle pattern can be controlled by a method other than the method of controlling the temperature of the LD 32. For this reason, in FIG. 7, the configuration relating to the control of the speckle pattern is omitted. The LD 32 and the phosphor 22 may be provided in the optical adapter 6.

  FIG. 8 shows a cross section of the distal end 20 a of the insertion portion 2 a and the optical adapter 6. FIG. 8 shows a cross section including the light distribution adjusting optical system 61. The phosphor 22 and the LD 32 are disposed at the distal end 20a of the insertion portion 2a, and the power line 82 is connected to the LD 32. The phosphor 22 and the LD 32 are in contact with each other, and light emitted from the LD 32 is directly incident on the phosphor 22. A light distribution adjusting optical system 61 is disposed in front of the phosphor 22.

(Second modification)
This modification will be described using the endoscope apparatus 1 shown in FIG. The endoscope apparatus 1 of the present modification operates according to the procedure shown in FIG. The operation of the endoscope apparatus 1 will be described with reference to FIG. In this modification, the user can specify the period of wavelength modulation in the observation mode. Hereinafter, differences from the procedure illustrated in FIG. 5 will be described, and description of the same points as the procedure illustrated in FIG. 5 will be omitted.

  When it is determined in step S <b> 103 that the mode of the endoscope apparatus 1 is the observation mode, the CPU 36 outputs screen data for performing an operation relating to the setting change to the video processing circuit 31. The video processing circuit 31 outputs data obtained by superimposing image data on data output from the CPU 36 to the display unit 5. Based on this data, the display unit 5 displays a screen for performing an operation related to the setting change (step S201). An image of the subject is displayed on this screen.

  The user can operate the operation unit 4 to specify the wavelength modulation period. The CPU 36 sequentially changes the period set in the temperature control circuit 35 according to the operation of the operation unit 4 by the user. As the video processing circuit 31 updates the image data, the image of the subject displayed on the screen is sequentially updated. In the displayed image, the state of the speckle pattern projected on the surface of the subject changes according to the operation of the operation unit 4 by the user. The user determines the period in which the speckle pattern is in a state suitable for observation while checking the subject image.

  When an operation for determining the wavelength modulation period is performed, the CPU 36 sets the period determined as described above to the temperature control circuit 35 (step S202). After the period is set, wavelength modulation control is started in step S108.

  In this modification, the user's operation becomes more complicated than when the wavelength modulation period is automatically set. However, the state of the image displayed during the observation mode can be flexibly controlled according to the subject.

(Third Modification)
FIG. 10 shows a configuration of an endoscope apparatus 1b according to this modification. In FIG. 10, only the configuration for detecting the type of the optical adapter 6b is shown, and the same configuration as the configuration shown in FIG. 2 is omitted. As shown in FIG. 10, the endoscope apparatus 1b includes an insertion portion 2b and a control unit 3b. A replaceable optical adapter 6b is attached to the distal end 20b of the insertion portion 2b. The endoscope apparatus 1b according to this modification performs processing according to the type of the optical adapter 6b attached to the distal end 20b of the insertion portion 2b.

  The optical adapter 6b includes an electrical element 66, a connection portion 67a that is a first connection portion, and a connection portion 67b. The distal end 20b of the insertion portion 2b has a connection portion 68a and a connection portion 68b which are second connection portions. The control unit 3 b has a CPU 36 and a signal detection circuit 37.

  The electrical element 66 has electrical characteristics corresponding to the type of the optical adapter 6b. For example, the electrical element 66 is a resistance element and has a resistance value corresponding to the type of the optical adapter 6b. The first terminal of the electrical element 66 is electrically connected to the connection portion 67a, and the second terminal of the electrical element 66 is electrically connected to the connection portion 67b. The connection portion 67a and the connection portion 67b are electrically connected to the distal end 20b of the insertion portion 2b by mounting the optical adapter 6b on the distal end 20b of the insertion portion 2b.

  A connecting portion 68a and a connecting portion 68b corresponding to the connecting portion 67a and the connecting portion 67b are disposed at the distal end 20b of the insertion portion 2b. The connecting portion 68a is electrically connected to the connecting portion 67a, and the connecting portion 68b is electrically connected to the connecting portion 67b. Further, the connection portion 68 a and the connection portion 68 b are electrically connected to the signal detection circuit 37.

  The signal detection circuit 37 is a signal detection unit that detects a signal output from the electrical element 66. For example, the signal detection circuit 37 includes a voltage source that applies a predetermined voltage to the electrical element 66 and a current detection circuit that detects a current value output from the electrical element 66. The CPU 36 is an identification unit that identifies the type of the optical adapter 6 b based on the signal detected by the signal detection circuit 37. For example, since the resistance value of the electrical element 66 differs depending on the type of the optical adapter 6b, the current flowing through the electrical element 66 when a predetermined voltage is applied to the electrical element 66 depends on the type of the optical adapter 6b. Different. The CPU 36 identifies the type of the optical adapter 6b based on the current value detected by the signal detection circuit 37.

  The endoscope apparatus 1b of the present modification operates according to the procedure shown in FIG. The operation of the endoscope apparatus 1b will be described with reference to FIG. Hereinafter, differences from the procedure illustrated in FIG. 5 will be described, and description of the same points as the procedure illustrated in FIG. 5 will be omitted.

  If the set mode is the measurement mode in step S103, the CPU 36 causes the signal detection circuit 37 to detect the signal and identifies the type of the optical adapter 6b based on the signal detected by the signal detection circuit 37. (Step S301). After the type of the optical adapter 6b is identified, the CPU 36 determines whether or not the type of the optical adapter 6b is a stereo optical adapter corresponding to the speckle pattern projection (step S302).

  When the type of the optical adapter 6b is not a stereo optical adapter that supports speckle pattern projection, for example, when the type of the optical adapter 6b is a normal stereo optical adapter, the process of step S105 is performed. In this case, since the wavelength modulation control in the observation mode continues during the measurement mode, the speckle pattern projected on the surface of the subject is reduced.

  When the type of the optical adapter 6b is a stereo optical adapter that supports speckle pattern projection, the process of step S104 is performed. In this case, since the control is performed so that the wavelength of the light generated by the LD 32 is constant, the speckle pattern projected on the surface of the subject is not reduced.

  As described above, the CPU 36 determines whether or not to reduce the speckle pattern during the measurement mode according to the type of the optical adapter 6b. That is, when the type of the optical adapter 6b is a stereo optical adapter that does not support speckle pattern projection, the CPU 36 performs control to reduce the speckle pattern projected on the surface of the subject. When the type of the optical adapter 6b is a stereo optical adapter that supports speckle pattern projection, the CPU 36 performs control to project the speckle pattern onto the surface of the subject.

  In this modification, depending on whether the function is given priority or the cost is given priority between the stereo optical adapter that supports speckle pattern projection and the stereo optical adapter that does not support speckle pattern projection. An optical adapter can be selected.

(Fourth modification)
This modification will be described using the endoscope apparatus 1 shown in FIG. It is possible to control to modulate the wavelength of light generated by the LD 32 using a wavelength tunable laser.

  In this modification, the light source control circuit 33 controls the diffraction field speckle by controlling the wavelength of the light generated by the LD 32. For example, by changing the current that drives the LD 32, the wavelength of the light generated by the LD 32 changes. Therefore, the light source control circuit 33 controls the diffraction field speckle by controlling the current that drives the LD 32.

  The light source control circuit 33 controls the diffraction field speckle by setting the period of change in the wavelength of the light generated by the LD 32 during the observation mode to be the same as or shorter than the exposure time of imaging by the imaging unit 21. To do. That is, the light source control circuit 33 controls the diffraction field speckles by setting the period of change of the current for driving the LD 32 during the observation mode to be the same as or shorter than the exposure time of imaging by the imaging unit 21. .

  During the observation mode, the wavelength of light changes at a high speed in accordance with the change in current. As a result, the interference position in the space changes, and the distribution of the speckle pattern projected on the surface of the subject fluctuates. By this wavelength modulation, the luminance distribution of the speckle pattern in the image is averaged, and the speckle pattern is reduced.

  Further, the light source control circuit 33 keeps the wavelength of the light generated by the LD 32 during the measurement mode constant, or makes the change period of the wavelength of the light generated by the LD 32 during the measurement mode longer than the exposure time. To control the diffraction field speckle. In other words, the light source control circuit 33 keeps the current for driving the LD 32 constant during the measurement mode, or sets the diffraction field speckle by changing the period of change of the current for driving the LD 32 during the measurement mode longer than the exposure time. Control.

  During the measurement mode, the wavelength of the light is constant, or the wavelength of the light changes at a lower speed than in the observation mode in accordance with a change in current. As a result, the interference position in the space is constant or does not change much. For this reason, imaging is performed in a state where the speckle pattern in the image is more conspicuous than in the observation mode.

  The imaging unit 21 adjusts the exposure time of imaging with an electronic shutter. The endoscope apparatus 1 may include a period determining unit that determines the period of change in the wavelength of the light generated by the LD 32 according to the shutter speed of the electronic shutter. The light source control circuit 33 may be a period determining unit. For example, the light source control circuit 33 may determine the period of change in the current that drives the LD 32 according to the shutter speed of the electronic shutter.

  For example, the following control is performed. The light source control circuit 33 controls the diffraction field speckle by setting the period of change in the wavelength of the light generated by the LD 32 during the observation mode to be the same as or shorter than the shutter speed of the electronic shutter. To do. That is, the light source control circuit 33 controls the diffraction field speckle by setting the period of change of the current for driving the LD 32 during the observation mode to be the same as or shorter than the shutter speed of the electronic shutter. .

  The light source control circuit 33 keeps the wavelength of the light generated by the LD 32 during the measurement mode constant, or sets the period of change in the wavelength of the light generated by the LD 32 during the measurement mode to be higher than the shutter speed of the electronic shutter. The diffraction speckle is controlled by increasing the length. That is, the light source control circuit 33 keeps the current for driving the LD 32 constant during the measurement mode, or makes the period of change in the wavelength of the light generated by the LD 32 during the measurement mode longer than the shutter speed of the electronic shutter. To control the diffraction field speckle.

  As in this modification, by modulating the wavelength of the LD 32 by current control, the speckle pattern can be changed relatively easily without modulating the temperature of the LD 32. For this reason, the control circuit can be simplified and the endoscope apparatus can be made inexpensive. In this modification, the temperature control element 34 and the temperature control circuit 35 are unnecessary.

  You may use LD disclosed by Unexamined-Japanese-Patent No. 2007-35940. For example, in an LD having a plurality of electrodes, the speckle pattern may be controlled by controlling the period of a current pulse applied to each electrode.

(Fifth modification)
Giving a random phase distribution to the light emitted from the optical fiber by giving an optical path length difference to the light before the light emitted from the LD, which is a coherent light source for projecting the speckle pattern, enters the optical fiber. it can.

  FIG. 12 shows a configuration of an optical member 200 for giving an optical path length difference to light. The optical member 200 is disposed in the control unit 3 of FIG. The optical member 200 includes a lens 201, a lens 202, an optical path length dispersion unit 203, and a lens 204. The light emitted from the LD 32 is collimated by the lens 201 and the lens 202. When passing through the lens 202, the phase distribution in the light beam is almost uniform.

  The optical path length dispersion unit 203 is a member in which a plurality of rod lenses having different lengths arranged in a direction perpendicular to the light traveling direction are bundled. The light that has passed through the lens 202 enters one of the plurality of rod lenses. Since each rod lens has a different length, a different optical path length is given to the light for each rod lens. That is, a difference in optical path length occurs depending on the position in the light beam that has passed through the optical path length dispersion unit 203. Due to this difference in optical path length, a phase distribution occurs in the light beam. In FIG. 12, the plurality of rod lenses are arranged in the order of the length, but the length of each rod lens may be different, and the arrangement order of the plurality of rod lenses is not necessarily regular.

  The incident end of the optical fiber 81 is disposed at the focal point 205 of the lens 204. The light incident on the optical fiber 81 is transmitted to the distal end 20 of the insertion portion 2 by the optical fiber 81. The light emitted from the distal end 20 of the insertion portion 2 has a random phase distribution and produces diffraction field speckles.

  By moving the optical path length dispersion unit 203 in a direction perpendicular to the light traveling direction, the phase distribution of the light emitted from the distal end 20 of the insertion unit 2 changes, and the speckle pattern changes. Therefore, the speckle pattern vibrates by vibrating the optical path length dispersion unit 203 using a piezoelectric element or the like. The optical path length dispersion unit 203 may be rotated about the optical axis of the lens 202 and the lens 204.

  In this modification, the optical path length is different depending on the position in the direction perpendicular to the traveling direction of the light generated by the LD 32 and is disposed in the optical path of the light generated by the LD 32. An optical path length dispersion unit 203 that provides a phase distribution according to the optical path length serves as a speckle pattern generation unit. In FIG. 12, a vibration generator 38 and a vibration control circuit 39 are provided. The vibration generator 38 and the vibration control circuit 39 are disposed in the control unit 3.

  The vibration generation unit 38 generates vibration and applies vibration to the optical path length dispersion unit 203. The vibration control circuit 39 controls the vibration generator 38. The vibration control circuit 39 is a speckle pattern control unit that controls the diffraction field speckle by vibrating the optical path length dispersion unit 203 and controlling the period of vibration.

  During the observation mode, the vibration control circuit 39 vibrates the optical path length dispersion unit 203 at the same period as the exposure time of imaging by the imaging unit 21 or shorter than the exposure time. Thereby, since the brightness of the speckle pattern is averaged within the exposure time, the speckle pattern can be reduced. Further, during the measurement mode, the vibration control circuit 39 stops the vibration or vibrates the optical path length dispersion unit 203 at a cycle longer than the exposure time. This makes the speckle pattern stand out because the phase of the speckle pattern is constant or does not change much within the exposure time.

(Sixth Modification)
This modification will be described using the endoscope apparatus 1 shown in FIG. In this modification, the endoscope apparatus 1 can switch at high speed between a state in which a speckle pattern is always projected and a state in which the speckle pattern is reduced during the measurement mode. In addition, the endoscope apparatus 1 sequentially captures both an image in a state where the speckle pattern is projected and an image in a state where the speckle pattern is reduced.

  In the present modification, the speckle pattern control unit (the temperature control circuit 35 or the like) has a first state in which the speckle pattern by the diffraction field speckle is projected onto the subject and the spec projected on the subject during the measurement mode. The diffraction field speckles are controlled so that the second state in which the pattern is reduced from the first state is sequentially switched. The imaging unit 21 performs imaging in each of the first state and the second state.

  For example, in the first state, the speckle pattern control unit keeps the wavelength of the light generated by the LD 32 constant, or sets the period of change in the wavelength of the light generated by the LD 32 to the exposure time for imaging by the imaging unit 21. Longer than. In the second state, the speckle pattern control unit makes the change period of the wavelength of the light generated by the LD 32 the same as the exposure time or shorter than the exposure time.

  The video processing circuit 31 outputs the image data generated in the second state to the display unit 5. As a result, the image for the user to observe the subject during the measurement mode is an image taken with the speckle pattern reduced. Therefore, the subject can be observed without disturbing the subject's own pattern or the like by the speckle pattern.

  On the other hand, the CPU 36 takes in the image data generated in the first state from the video processing circuit 31, and calculates the three-dimensional shape of the subject based on the image data. Since the three-dimensional measurement is performed based on the image photographed with the speckle pattern being projected, the matching accuracy is improved.

  After confirming the image captured in the second state, the user designates the position of the part to be measured via the operation unit 4. The CPU 36 calculates three-dimensional coordinates corresponding to the image coordinates at the position specified by the user, using the image data generated in the first state.

  The speckle pattern control unit may switch between the first state and the second state for each frame. Thereby, it is possible to suppress as much as possible the photographing time difference between the image in which the speckle pattern is projected and the image in which the speckle pattern is reduced. Further, the speckle pattern control unit performs control according to the second state until the user inputs an instruction via the operation unit 4, and the speckle pattern control is performed when the user inputs an instruction via the operation unit 4. The unit may perform control according to the first state.

  In this modification, an image in which the speckle pattern is reduced is displayed during the measurement mode, so that the user can observe the portion to be measured in a state where it is easier to observe. Further, since the three-dimensional measurement is performed using the image on which the speckle pattern is projected, the three-dimensional shape of the subject can be restored more accurately.

(Seventh Modification)
FIG. 13 shows a configuration of an endoscope apparatus 1c according to this modification. Hereinafter, the difference in configuration between the endoscope apparatus 1 illustrated in FIG. 2 and the endoscope apparatus 1c illustrated in FIG. 13 will be described. As shown in FIG. 13, the endoscope apparatus 1 c includes an insertion unit 2 c, a control unit 3 c, an operation unit 4, and a display unit 5. The control unit 3 c includes an imaging control unit 30, a video processing circuit 31, an LD 32, a light source control circuit 33, a temperature control element 34, a temperature control circuit 35, a CPU 36, and a vibration control circuit 39.

  The phosphor 22 is a wavelength conversion unit that converts the light generated by the LD 32 into light corresponding to a plurality of color components, and spatially random diffraction field speckles with respect to the light generated by the LD 32. This is a speckle pattern generation unit that generates Accordingly, the speckle pattern vibrates by vibrating the phosphor 22 using a piezoelectric element or the like.

  The vibration generating part 23 is disposed at the distal end 20c of the insertion part 2c. The vibration generating unit 23 is connected to the vibration control circuit 39 by a signal line 83 arranged in the insertion unit 2c and the control unit 3c.

  The vibration generating unit 23 generates vibration and applies vibration to the phosphor 22. The vibration control circuit 39 controls the vibration generator 23. The vibration control circuit 39 is a speckle pattern control unit that controls the diffraction field speckle by vibrating the phosphor 22 and controlling the period of vibration.

  During the observation mode, the vibration control circuit 39 vibrates the phosphor 22 at a cycle that is the same as or shorter than the exposure time of imaging by the imaging unit 21. Thereby, since the brightness of the speckle pattern is averaged within the exposure time, the speckle pattern can be reduced. Further, during the measurement mode, the vibration control circuit 39 stops the vibration or vibrates the phosphor 22 at a cycle longer than the exposure time. This makes the speckle pattern stand out because the phase of the speckle pattern is constant or does not change much within the exposure time.

  As described above, the embodiments of the present invention have been described in detail with reference to the drawings. However, the specific configuration is not limited to the above-described embodiments, and includes design changes and the like without departing from the gist of the present invention. .

1, 1a, 1b, 1c Endoscopic device 2, 2a, 2b, 2c Insertion unit 3, 3a, 3b, 3c Control unit 4 Operation unit 5 Display unit 6, 6a, 6b Optical adapter 20, 20a, 20b, 20c 21 Imaging Unit 22 Phosphor 23, 38 Vibration Generation Unit 30 Imaging Control Unit 31 Video Processing Circuit 32 LD
33 Light source control circuit 34 Temperature control element 35 Temperature control circuit 36 CPU
37 signal detection circuit 39 vibration control circuit 60, 60a, 60b objective lens 61 light distribution adjusting optical system 66 electrical element 67a, 67b, 68a, 68b connection part 200 optical member 201, 202, 204 lens 203 optical path length dispersion part

Claims (14)

A semiconductor light source that generates coherent light;
A light source control unit for controlling the semiconductor light source;
An imaging unit that images a subject inside an object from a plurality of viewpoints and generates image data of a plurality of images of the subject;
A calculation unit that calculates a three-dimensional shape of the subject based on the image data generated during the measurement mode;
A display unit for displaying an image based on the image data generated during the observation mode during the observation mode;
An insertion unit that is inserted into the object, wherein the imaging unit is disposed, and the light generated by the semiconductor light source is projected onto the subject from the tip of the insertion unit, or generated by the semiconductor light source The insertion unit that projects light onto the subject via an optical adapter attached to the tip; and
A speckle pattern generator that generates spatially random diffraction field speckles for the light generated by the semiconductor light source;
The speckle pattern by the diffraction field speckle is projected onto the subject during the measurement mode, and the speckle pattern projected onto the subject is reduced during the observation mode as compared to during the measurement mode. A speckle pattern control unit for controlling diffraction field speckles;
An endoscope apparatus having   The speckle pattern control unit is configured so that, during the observation mode, the diffraction field speckle distribution in the space changes in a cycle that is the same as or shorter than the exposure time of imaging by the imaging unit. The endoscope apparatus according to claim 1, which controls diffraction field speckles.   The endoscope apparatus according to claim 1, further comprising a light distribution adjustment optical system that is disposed at the distal end of the insertion portion and adjusts a range in which light generated by the semiconductor light source is projected onto the subject. A wavelength converter that converts light generated by the semiconductor light source into light corresponding to a plurality of color components;
An extraction unit that extracts, from the image data, color component data having a wavelength closest to the wavelength of the color component included in the light generated by the semiconductor light source;
Further comprising
The endoscope apparatus according to claim 1, wherein the calculation unit calculates a three-dimensional shape of the subject based on the data extracted by the extraction unit. The speckle pattern control unit includes a first state in which a speckle pattern by the diffraction field speckle is projected onto the subject during the measurement mode, and the speckle pattern projected onto the subject is the first state. Controlling the diffracted field speckles so as to sequentially switch to the second state reduced from the state of
The endoscope apparatus according to claim 1, wherein the imaging unit performs imaging in each of the first state and the second state.   The optical adapter comprising: an objective lens that forms a plurality of images when the subject is viewed from a plurality of viewpoints; and a light distribution adjustment optical system that adjusts a range in which light generated by the semiconductor light source is projected onto the subject. The endoscope apparatus according to claim 1, wherein the endoscope apparatus can be attached to the distal end of the insertion portion, and the optical adapter attached to the distal end can be detached from the distal end. The optical adapter further includes an electrical element having electrical characteristics corresponding to the type of the optical adapter, and a first connection portion that is electrically connected to the distal end of the insertion portion,
A second connection portion disposed at the tip of the insertion portion and electrically connected to the first connection portion;
A signal detector for detecting a signal output from the electrical element;
An identification unit for identifying the type of the optical adapter based on the signal detected by the signal detection unit;
The endoscope apparatus according to claim 1, further comprising: The speckle pattern control unit is the light source control unit,
The endoscope apparatus according to claim 1, wherein the light source control unit controls the diffraction field speckle by controlling a wavelength of light generated by the semiconductor light source.   The light source control unit sets a period of change in wavelength of light generated by the semiconductor light source during the observation mode to be equal to or shorter than an exposure time of imaging by the imaging unit, and the measurement mode The wavelength of the light generated by the semiconductor light source during the measurement mode is kept constant, or the period of change of the wavelength of the light generated by the semiconductor light source during the measurement mode is made longer than the exposure time. The endoscope apparatus according to claim 8, which controls speckles. The imaging unit adjusts the exposure time of imaging with an electronic shutter,
The endoscope apparatus according to claim 9, further comprising a period determining unit that determines a period of change in wavelength of light generated by the semiconductor light source according to a shutter speed of the electronic shutter.   The endoscope apparatus according to claim 8, wherein the light source control unit controls the diffraction field speckle by controlling a current for driving the semiconductor light source.   The endoscope apparatus according to claim 1, wherein the speckle pattern control unit controls the diffraction field speckle by controlling a temperature of the semiconductor light source. The speckle pattern generation unit is disposed in an optical path of light generated by the semiconductor light source, and an optical path length varies depending on a position in a direction perpendicular to a traveling direction of the light generated by the semiconductor light source. An optical path length dispersion unit that gives a phase distribution corresponding to the optical path length to the light generated by
The endoscope apparatus according to claim 1, wherein the speckle pattern control unit controls the diffraction field speckle by vibrating the optical path length dispersion unit and controlling a period of vibration. The speckle pattern generation unit includes a wavelength conversion unit that converts light generated by the semiconductor light source into light corresponding to a plurality of color components,
The endoscope apparatus according to claim 1, wherein the speckle pattern control unit controls the diffraction field speckle by vibrating the wavelength conversion unit and controlling a period of vibration.

Images