JP6236016B2 - 多重反射質量分析計 - Google Patents

多重反射質量分析計 Download PDF

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JP6236016B2
JP6236016B2 JP2014553680A JP2014553680A JP6236016B2 JP 6236016 B2 JP6236016 B2 JP 6236016B2 JP 2014553680 A JP2014553680 A JP 2014553680A JP 2014553680 A JP2014553680 A JP 2014553680A JP 6236016 B2 JP6236016 B2 JP 6236016B2
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mirror
mass spectrometer
mirrors
ion
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JP2015506567A (ja
Inventor
ディミトリ グリンフェルト
ディミトリ グリンフェルト
マカロフ　アレクサンダー
アレクサンダー マカロフ
Original Assignee
サーモ フィッシャー サイエンティフィック （ブレーメン） ゲーエムベーハー
サーモ フィッシャー サイエンティフィック （ブレーメン） ゲーエムベーハー
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/005—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/406—Time-of-flight spectrometers with multiple reflections
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/4245—Electrostatic ion traps

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2014553680A 2012-01-27 2013-01-22 多重反射質量分析計 Active JP6236016B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB201201405A GB201201405D0 (en) 2012-01-27 2012-01-27 Multi-reflection mass spectrometer
GB1201405.6 2012-01-27
PCT/EP2013/051103 WO2013110588A2 (en) 2012-01-27 2013-01-22 Multi-reflection mass spectrometer

Publications (2)

Publication Number Publication Date
JP2015506567A JP2015506567A (ja) 2015-03-02
JP6236016B2 true JP6236016B2 (ja) 2017-11-22

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Family Applications (1)

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JP2014553680A Active JP6236016B2 (ja) 2012-01-27 2013-01-22 多重反射質量分析計

Country Status (8)

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US (2) US9136102B2 (enExample)
JP (1) JP6236016B2 (enExample)
CN (1) CN104067371B (enExample)
CA (1) CA2865058C (enExample)
DE (1) DE112013000722B4 (enExample)
GB (2) GB201201405D0 (enExample)
IN (1) IN2014DN06160A (enExample)
WO (1) WO2013110588A2 (enExample)

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AU2019281714B2 (en) 2018-06-04 2024-05-02 The Trustees Of Indiana University Charge detection mass spectrometry with real time analysis and signal optimization
GB201810573D0 (en) 2018-06-28 2018-08-15 Verenchikov Anatoly Multi-pass mass spectrometer with improved duty cycle
EP3884510A1 (en) 2018-11-20 2021-09-29 The Trustees of Indiana University Orbitrap for single particle mass spectrometry
JP7195669B2 (ja) * 2018-12-03 2022-12-26 ザ・トラスティーズ・オブ・インディアナ・ユニバーシティー 静電線形イオン・トラップによって複数のイオンを同時に分析する装置および方法
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GB201901411D0 (en) 2019-02-01 2019-03-20 Micromass Ltd Electrode assembly for mass spectrometer
GB201903779D0 (en) 2019-03-20 2019-05-01 Micromass Ltd Multiplexed time of flight mass spectrometer
US11942317B2 (en) 2019-04-23 2024-03-26 The Trustees Of Indiana University Identification of sample subspecies based on particle mass and charge over a range of sample temperatures
JP7671510B2 (ja) 2019-09-25 2025-05-02 ザ・トラスティーズ・オブ・インディアナ・ユニバーシティー パルス・モード電荷検出質量分析のための装置および方法
AU2020361596B2 (en) 2019-10-10 2025-12-04 The Trustees Of Indiana University System and method for identifying, selecting and purifying particles
JP7690209B2 (ja) 2019-12-18 2025-06-10 ザ・トラスティーズ・オブ・インディアナ・ユニバーシティー 電荷測定装置を有する質量分析計
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KR20220134679A (ko) 2020-02-03 2022-10-05 더 트러스티즈 오브 인디애나 유니버시티 전하 검출 질량 분석법을 위한 신호들의 시간-도메인 분석
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Also Published As

Publication number Publication date
GB201412003D0 (en) 2014-08-20
US9673033B2 (en) 2017-06-06
US9136102B2 (en) 2015-09-15
US20160005580A1 (en) 2016-01-07
GB2512773A (en) 2014-10-08
CN104067371B (zh) 2017-04-12
CA2865058C (en) 2017-10-10
WO2013110588A2 (en) 2013-08-01
GB2512773B (en) 2020-07-29
US20150028198A1 (en) 2015-01-29
IN2014DN06160A (enExample) 2015-08-21
WO2013110588A3 (en) 2014-01-30
DE112013000722T5 (de) 2014-11-06
DE112013000722B4 (de) 2022-10-13
GB201201405D0 (en) 2012-03-14
JP2015506567A (ja) 2015-03-02
CA2865058A1 (en) 2013-08-01
CN104067371A (zh) 2014-09-24

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