JP6163066B2 - MCP unit, MCP detector and time-of-flight mass analyzer - Google Patents

Description

  The present invention provides an MCP unit having a function of multiplying charged particles such as electrons and ions, an MCP detector including the MCP unit, and the MCP detection as a main part of a detector used for time-of-flight mass spectrometry. The present invention relates to a time-of-flight analyzer including a measuring instrument.

  Time of flight mass spectrometry (TOF-MS) is known as a technique for detecting the molecular weight of a polymer. FIG. 1 is a diagram for explaining the structure of this TOF-MS analyzer (hereinafter referred to as a TOF-MS apparatus).

  As shown in FIG. 1, in the TOF-MS apparatus, the detector 100 is arranged at one end in the vacuum vessel 110, and the sample (ion source as a sample) 120 is arranged at the other end in the vacuum vessel 110. The A ring-shaped electrode 130 (ion accelerator) having an opening is disposed between the two. When the electrode 130 is grounded, and the sample 120 to which a predetermined voltage is applied is irradiated with a laser beam from an ion extraction system (including a laser light source), ions emitted from the sample 120 are converted into the sample 120 and the electrode 130. Is accelerated by the electric field formed between the two, and collides with the detector 100. The acceleration energy imparted to the ions between the sample 120 and the electrode 130 is determined by the ionic charge. Therefore, if the ion charges are the same, the speed when passing through the electrode 130 depends on the mass of the ions. In addition, since ions fly between the electrode 130 and the detector 100 at a constant speed, the flight time of ions between the electrode 130 and the detector 100 is inversely proportional to the velocity. That is, the analysis unit determines the mass of ions by obtaining the time of flight from the electrode 130 to the detector 100 (monitors the output voltage from the detector 100 with an oscilloscope). Visually, it is possible to determine the mass of ions from the time of occurrence of a peak appearing in the time spectrum of the output voltage displayed on the oscilloscope.

  As a detector applicable to such a TOF-MS apparatus, for example, an MCP detector disclosed in Patent Document 1 is known. FIG. 2 is an equivalent circuit diagram of an MCP detector having a triode structure disclosed in Patent Document 1 as an example of an MCP detector applicable to a TOF-MS apparatus. The MCP detector 100a shown in FIG. 2 is housed in a vacuum vessel whose interior is maintained at a predetermined degree of vacuum. The vacuum vessel is made of a conductive material (metal casing) and is set to the ground potential. In the MCP detector 100a, two micro channel plates (MCP) 20 and 21 (hereinafter referred to as MCP group 2) are formed by an IN electrode 1 and an OUT electrode 3 each having an opening at the center. It is sandwiched. An anode 4 is disposed behind the OUT electrode 3, and an acceleration electrode 5 having a metal mesh is disposed between the OUT electrode 3 and the anode 4. A vacuum vessel is connected to the shield side of a BNC terminal (Bayonet Neil-Concelman connector) 6 for signal readout, while the core wire of the BNC terminal 6 is connected to the anode 4 via a capacitor 62. The capacitor 62 has a function of setting the signal output level to the GND level by insulating the output. Further, capacitors 80 and 90 are also arranged between the shield side of the BNC terminal 6 and the OUT electrode 3 and between the shield side of the BNC terminal 6 and the acceleration electrode 5, respectively. The interval B between the acceleration electrode 5 and the anode 4 is set to be wider than the interval A between the MCP group 2 and the acceleration electrode 5.

  In the MCP detector 100 a having the above-described structure, the OUT electrode 3 is set to a negative potential higher than that of the IN electrode 1 with reference to the negative potential set to the IN electrode 1. The acceleration electrode 5 and the anode 4 are set to a negative potential higher than that of the OUT electrode 3. The acceleration electrode 5 and the anode 4 may be set to the same potential. Thus, the MCP detector 100a has a floating anode structure in which the anode potential is not grounded.

  The signal from the anode 4 taken out through the core wire of the BNC terminal 6 is amplified by an amplifier (Amp) and then taken into the analysis unit. Specifically, when charged particles enter the MCP group 2 in the MCP detector 100a, a large number of electrons (secondary electrons multiplied by each MCP) are emitted from the MCP group 2 accordingly. The secondary electrons thus emitted reach the anode 4 and are converted into an electric signal as a change in voltage or current (a signal is output from the core wire of the BNC terminal 6). At this time, the detection signal is output to the outside at the ground potential by the capacitor 62 provided between the anode 4 and the core wire, and between the shield side of the BNC terminal 6 and the OUT electrode 3, and the BNC terminal 6. The capacitors 80 and 90 provided between the shield side and the acceleration electrode 5 respectively suppress the waveform distortion and overshoot (ringing) of the output signal.

US Pat. No. 7,564,043

  In recent years, TOF-MS has further improved the characteristics of the detector by improving the characteristics in the region from the ion source to the detector due to the development of ionization techniques and ion optics, and improving the characteristics of the analysis system due to the development of electronics. Has come to be required. The triode-structured MCP detector disclosed in the above-mentioned Patent Document 1 is an electronic device that meets such a requirement, and realizes a desired time response characteristic without depending on the limitation due to the channel diameter of the MCP. The rise time and fall time of the detection peak at can be arbitrarily controlled. However, it has been discovered by the inventors' research that even a triode-structured MCP detector having such excellent detection characteristics may impair the stability of the detection characteristics depending on the use environment.

  That is, the evaluation of the time response characteristics of the triode-structured MCP detector is performed in an environment that is not easily affected by an external potential source such as a vacuum container that houses the MCP detector, as shown in FIG. Done. Thus, in an environment that is not easily affected by the external potential source (FIG. 3A), a signal waveform of the anode output (voltage signal) as shown in FIG. 3B is obtained. On the other hand, as shown in FIG. 4A, the MCP detector in which the anode 4 is set to a negative potential is actually used in an environment housed in a metal casing set to the ground potential. The In particular, when using the MCP detector, when the MCP detector is used in a state of being sufficiently separated from the inner wall of the housing, a stable time response characteristic can be obtained. It is difficult to secure a sufficient distance between the container and the inner wall of the housing. Therefore, in an environment (FIG. 4 (A)) in which a metal casing set to the ground potential as an external potential source is arranged in the vicinity of the MCP detector, the anode output as shown in FIG. A signal waveform is obtained.

  In addition, the equipotential lines shown in FIG. 3A and FIG. 4A are equipotential lines in a state where the acceleration electrode 5 and the anode 4 are set to the same potential. In FIG. 3B, which shows the measurement results in an environment that is not easily affected by the external potential source, a graph G310 shows the anode output obtained from the MCP detector having the triode structure, and a graph G320 shows the MCP group. 2 shows the anode output obtained from an MCP detector having a bipolar-structure in which no accelerating electrode is provided between 2 and the anode 4. In FIG. 4B, which shows the measurement results in an environment susceptible to the influence of the external potential source, graph G410 shows the anode output obtained from the MCP detector having a triode structure, and graph G420 shows a reference example. As shown, the anode output of the MCP detector having a triode structure in an environment hardly affected by the external potential source (corresponding to the graph G310 in FIG. 3B) is shown.

  As can be seen from the comparison between the graph G310 in FIG. 3B and the graph G410 in FIG. 4B, in the environment of FIG. 4A, the portion indicated by the arrow P in the graph G410, that is, a negative peak. Overshoot (ringing) has occurred after passing. The overshoot is a phenomenon in which the voltage signal from the anode 4 temporarily rises positively after passing a negative peak.

  When verifying the mechanism of overshoot occurrence, comparing the electric field distribution in the environment of FIG. 3A with the electric field distribution in the environment of FIG. 4A, the environment of FIG. Below, it can be seen that there is little disturbance in the electric field around the MCP detector, and the set potential in the MCP detector is stable. When the electric field between the MCP group 2 and the anode 4, particularly between the accelerating electrode 5 and the anode 4 is stable, the electrons emitted from the MCP group 2 collide with the anode 4 to cause reflected electrons (mainly, (Including secondary electrons elastically scattered at the anode 4 and secondary electrons newly generated by electron collision), the generated reflected electrons are absorbed by the anode 4 and the accelerating electrode 5 with constant velocity motion. It is considered that an anode output signal waveform like the graph G310 shown in FIG. 3B can be obtained. On the other hand, in the environment of FIG. 4A, since the anode 4 set to a negative potential and the inner wall of the casing set to the ground potential are close to each other, the electric field around the MCP detector is disturbed, and the equipotential lines are It can be seen that it has penetrated into the space between the acceleration electrode 5 and the anode 4. In this case, it is considered that the possibility that the reflected electrons emitted from the anode 4 reach the inner wall of the housing in a short time without being absorbed by the anode 4 increases the overshoot. That is, when the secondary electrons emitted from the MCP group 2 collide with the anode 4, the reflected electrons emitted from the anode 4 jump out to the inner wall of the housing, and the electrons in the anode 4 may be temporarily insufficient. This is considered one of the causes of overshoot.

  The present invention has been made to solve the above-described problems, and an MCP unit having a structure for obtaining a stable time response characteristic without being affected by an external environment, and an MCP including the MCP unit. It is an object of the present invention to provide a detector and a time-of-flight analyzer including the MCP detector.

  The MCP unit according to the present invention is an MCP unit that can arbitrarily control the rise time and the fall time of the detection peak in the time spectrum in order to realize a desired time response characteristic without depending on the limitation due to the channel diameter of the MCP. , MCP, a first electrode, a second electrode, an anode, and an acceleration electrode. In particular, the MCP unit according to the present invention is for confining reflected electrons (secondary electrons) emitted from the anode in response to the incidence of secondary electrons from the MCP in the space between the acceleration electrode and the anode. A restriction structure is further provided. The MCP emits secondary electrons that are multiplied inside in response to the incidence of charged particles that are arranged on a plane that intersects the central axis of the MCP unit and moves along the central axis. Further, the MCP has an incident surface on which charged particles are incident, and an emission surface that faces the incident surface and emits the secondary electrons. The first electrode is an electrode in contact with the incident surface of the MCP and is set to the first potential. The second electrode is an electrode in contact with the emission surface of the MCP, and is set to a second potential that is higher than the first potential. The anode is an electrode disposed at a position where secondary electrons emitted from the emission surface of the MCP reach. The anode is disposed so as to intersect the central axis, and is set to a third potential that is higher than the second potential. The acceleration electrode is an electrode disposed between the MCP and the anode, and is set to a fourth potential that is higher than the second potential. The accelerating electrode has a plurality of openings for passing secondary electrons from the exit surface of the MCP toward the anode.

  In the limiting structure, the space between the accelerating electrode and the anode is physically separated from the space around the MCP unit, and the reflected electrons emitted from the anode are arranged on the central axis of the MCP unit. A second mode for limiting movement along the orthogonal direction, a third mode for controlling the potential difference between the acceleration electrode and the anode, and a fourth mode for controlling the trajectory of secondary electrons from the microchannel plate toward the anode. This can be realized by the aspect and the fifth aspect in which the structure for suppressing the emission of the reflected electrons from the anode is changed. In addition, the said restriction | limiting structure is realizable also by the combination of 2 or more aspects among the 1st-5th aspects.

  The restriction structure according to the first aspect includes a ring member disposed between the acceleration electrode and the anode. The ring member has a through hole defined by a continuous surface surrounding the central axis of the MCP unit so that secondary electrons from the acceleration electrode toward the anode pass therethrough. The ring member has a first surface that contacts the acceleration electrode, and a second surface that faces the first surface and contacts the anode, and the through hole of the ring member communicates the first surface and the second surface. It has an extended shape.

  In addition, various structures can be employed for the anode in addition to a structure made of only a metal plate. For example, the anode may include an anode substrate (insulating substrate) made of an insulating material such as glass epoxy resin. In this case, a structure in which an insulating substrate and a metal film (foil) are provided on a partial region or the entire surface of the insulating substrate can be employed for the anode. For the anode, an insulating substrate and a structure in which a metal plate is fixed to a partial region or the entire surface of the insulating substrate may be employed. When the anode has a structure including an insulating substrate, the material of the ring member may be a metal or an insulating material. However, in a structure in which the entire anode is made of a metal plate, the ring member exhibits different functions depending on its constituent materials. For example, when the acceleration electrode and the anode are set to the same potential, the ring member is preferably made of a metal material. On the other hand, when the potential of the acceleration electrode and the potential of the anode are controlled independently, the ring member is preferably made of an insulating material.

  An example of the limiting structure according to the second aspect is to block a part of the effective region of the microchannel plate that contributes to multiplication of secondary electrons emitted in response to incident charged particles from the first electrode side. A mask member may be included. In this case, the mask member preferably has a through hole defined by a continuous surface surrounding the central axis of the MCP unit. Further, the mask member may be a part of the first electrode.

  Another example of the limiting structure according to the second aspect is the theoretical maximum diameter of the anode calculated in an ideal environment in which the electric field distribution around the MCP unit is not easily affected by the external potential source, and once released. An anode having an enlarged maximum diameter than the theoretical maximum diameter that enables absorption of reflected electrons may be included. In this case, the maximum diameter of the accelerating electrode is preferably substantially the same as the maximum diameter of the anode.

  In another example of the limiting structure according to the second aspect, the first interval along the central axis from the second electrode to the acceleration electrode is narrower than the second interval along the central axis from the acceleration electrode to the anode. In the set state, both the acceleration electrode and the anode arranged so that the second interval is not more than twice the first interval may be included.

  Still another example of the limiting structure according to the second aspect is that the potential gradient from the MCP unit to the casing is weakened by sufficiently separating the distance from the MCP unit to the casing set to the ground potential. A structure may be included.

  In the limiting structure according to the third aspect, the third potential is such that the potential gradient in the space between the acceleration electrode and the anode is smaller than the potential gradient in the space between the second electrode and the acceleration electrode. An anode set higher than the fourth potential may be included.

  An example of the restriction structure according to the fourth aspect is an electron lens structure for controlling the trajectory of secondary electrons from the microchannel plate to the anode, from the edge of the flat portion facing the incident surface of the microchannel plate to the anode. You may include the 1st electrode which has the side wall part extended toward.

  Another example of the limiting structure according to the fourth aspect may include a second electrode having a side wall portion extending from the edge of the flat portion facing the emission surface of the microchannel plate toward the anode.

  The limiting structure according to the fifth aspect may include an anode whose surface is coated with carbon or the like that suppresses the generation of secondary electrons.

  The MCP detector according to the present invention can be realized by an MCP unit (an MCP unit according to the present invention) having the above-described structure. That is, the MCP detector includes the MCP unit and a signal output unit arranged so as to sandwich the anode together with the microchannel plate. The signal output unit has a signal line electrically connected to the anode. The signal output unit may include a coaxial cable including a signal line and a shield unit surrounding the signal line. In this case, the MCP detector is further electrically connected to the shield unit. Preferably, a capacitor having one terminal and the other terminal electrically connected to the acceleration electrode is provided.

  Furthermore, a time-of-flight mass spectrometer according to the present invention includes a vacuum vessel (a metal casing set at a ground potential), an ion extraction system, an ion accelerator, and an MCP detector (this book) having the above-described structure. MCP detector according to the invention, and an analysis unit for determining at least mass as information on ions emitted from the sample. In the vacuum vessel, a sample to be analyzed as an ion source is installed inside. The ion extraction system releases ions from a sample installed in a vacuum vessel. The ion accelerator accelerates ions emitted from a sample, which are arranged in a vacuum vessel. The MCP detector is arranged so as to sandwich the ion accelerator together with the sample. An analysis part determines the mass of the ion which reached | attained this MCP detector by detecting the flight time from an ion accelerator to a MCP detector based on the detection signal from a MCP detector.

  Each embodiment according to the present invention can be more fully understood from the following detailed description and the accompanying drawings. These examples are given for illustration only and should not be construed as limiting the invention.

  Further scope of applicability of the present invention will become apparent from the detailed description given below. However, the detailed description and specific examples, while indicating the preferred embodiment of the invention, are presented for purposes of illustration only and various modifications and improvements within the scope of the invention may It will be apparent to those skilled in the art from the detailed description.

  According to the present invention, reflected electrons (secondary electrons) emitted from the anode in response to the incidence of secondary electrons from the MCP are transmitted to the triode-structured MCP unit that realizes excellent time response characteristics with the acceleration electrode. By providing a limiting structure for confining in the space between the anode and the anode, a stable time response characteristic can be obtained without being affected by an external environment such as an external potential source.

It is a figure which shows schematic structure of a TOF-MS apparatus. It is an equivalent circuit diagram which shows an example of the MCP detector applied to a TOF-MS apparatus. (A) is a figure which shows the electric field distribution of the MCP detector vicinity in the environment where it is hard to receive the influence of an external potential source, (B) is a figure which shows the time response characteristic of this MCP detector. (A) is a figure which shows the electric field distribution of the MCP detector vicinity in the environment where it is easy to be influenced by an external potential source, (B) is a figure which shows the time response characteristic of this MCP detector. It is an assembly process figure for demonstrating the structure (basic structure of the MCP unit etc. which concern on this invention) of the MCP detector to which the MCP unit which has a triode structure was applied. It is a figure which shows the cross-sectional structure along the L1-L1 line | wire of the MCP detector shown by FIG. It is a graph which shows the time response characteristic of the MCP detector to which the MCP unit which has a triode structure was applied. (A) is sectional drawing which shows the structure of the MCP unit prepared in order to measure the response characteristic of FIG. 7, (B) is a table | surface which shows a measurement result. (A)-(C) are the figures for demonstrating the structure of an acceleration electrode. (A) is a graph showing the relationship between the aperture ratio (%) of the acceleration electrode applied to the MCP unit shown in FIG. 8 (A) and the rise time (ps), and (B) shows the measurement conditions. It is a table | surface which shows. It is an equivalent circuit diagram for demonstrating the characteristic structure of the MCP detector to which the MCP unit based on this invention was applied. It is an assembly process figure for demonstrating the structure of the MCP detector to which the MCP unit which concerns on 1st Embodiment was applied. It is a figure which shows the cross-sectional structure along the L2-L2 line | wire of the MCP detector shown by FIG. It is an assembly process figure for demonstrating the 1st structure of the MCP detector to which the MCP unit which concerns on 2nd Embodiment was applied. It is a figure which shows the cross-sectional structure along the L3-L3 line | wire of the MCP detector shown by FIG. It is an assembly process figure for demonstrating the 2nd structure of the MCP detector to which the MCP unit which concerns on 2nd Embodiment was applied. It is a figure which shows the cross-sectional structure along the L4-L4 line | wire of the MCP detector shown by FIG. It is an assembly process figure for demonstrating the 3rd structure of the MCP detector to which the MCP unit which concerns on 2nd Embodiment was applied. It is a figure which shows the cross-sectional structure along the L5-L5 line | wire of the MCP detector shown by FIG. It is an equivalent circuit diagram for demonstrating the structure of the MCP detector to which the MCP unit which concerns on 3rd Embodiment was applied. (A) is a figure which shows the voltage application state between OUT electrode-anode in the MCP detector to which the MCP unit which concerns on 3rd Embodiment was applied, (B) is a figure which shows the cross-section of an MCP unit It is. It is an assembly process figure for demonstrating the 1st structure of the MCP detector to which the MCP unit which concerns on 4th Embodiment was applied. It is a figure which shows the cross-sectional structure along the L6-L6 line | wire of the MCP detector shown by FIG. It is an assembly process figure for demonstrating the 2nd structure of the MCP detector to which the MCP unit which concerns on 4th Embodiment was applied. FIG. 25 is a diagram showing a cross-sectional structure of the MCP detector shown in FIG. 24 along the line L7-L7.

  Hereinafter, embodiments of an MCP unit, an MCP detector, and a time-of-flight mass spectrometer according to the present invention will be described in detail with reference to the accompanying drawings. In the description of the drawings, the same elements are denoted by the same reference numerals, and redundant description is omitted.

  As shown in FIG. 1, the time-of-flight mass analyzer according to the present invention includes a vacuum vessel 110 whose inside is decompressed to a predetermined vacuum degree, an ion extraction system including a laser light source, and a ring that is an ion accelerator. The electrode 130 having a shape, the detector 100, and an analysis unit are provided. The MCP detector according to the present invention can be suitably applied to the detector 100 and employs a triode structure. In the following description, embodiments of an MCP unit having a triode structure and an MCP detector including the MCP unit will be described in detail as detectors applicable to the time-of-flight mass spectrometer according to the present invention.

  First, an MCP unit and an MCP detector having a triode structure as a basic structure of an MCP unit or the like according to the present invention will be described with reference to FIGS. 5 to 7 and FIGS. 8 (A) to 10 (B). FIG. 5 is an assembly process diagram for explaining the basic structure of the MCP detector to which the MCP unit having the triode structure is applied, and is consistent with the basic structure of the MCP unit having the triode structure disclosed in Patent Document 1. ing. FIG. 6 is a diagram showing a cross-sectional structure of the MCP detector shown in FIG. 5 along the line L1-L1. The equivalent circuit diagram of the MCP detector shown in FIGS. 5 and 6 is identical to the equivalent circuit diagram shown in FIG.

  The MCP detector shown in FIG. 5 includes a vacuum vessel (a metal housing set to a ground potential) whose inside is maintained at a predetermined degree of vacuum, and a tube axis AX of the vacuum vessel (a central axis of the MCP unit). In this case, the IN electrode 1 (first electrode), the MCP group 2, the OUT electrode 3 (second electrode), the acceleration electrode 5, and the anode 4 are arranged in this order. The MCP group 2 is composed of two disc-shaped MCPs 20 and 21. Further, the IN electrode 1 (first electrode) is disposed on the incident surface (front surface where the charged particles reach) of the MCP group 2, while the OUT electrode 3 (second electrode) is disposed on the emission surface (rear surface) side. Has been placed. As described above, the MCP assembly is configured by the MCP group 2 and the IN electrode 1 and the OUT electrode 3 sandwiching the MCP group 2. Further, in the MCP detector shown in FIG. 5 and FIG. 6, as the voltage application structure to each electrode, an IN electrode (first electrode) 1, an OUT electrode (second electrode) 3, an acceleration electrode 5 (acceleration electrode substrate) 50) and the anode 4 (including the anode substrate 40) are each provided with a four-terminal voltage application structure in which voltage application leads are provided.

  The IN electrode 1 is a metal (for example, stainless steel) electrode having a donut shape having an opening 10 in the center, and four countersunk screws 910 are provided on the panel surface every 90 degrees about the tube axis AX. A hole to be inserted is provided. An IN lead made of a conductive material (for example, stainless steel) having a bar shape extending from the rear is electrically connected to the rear surface of the IN electrode 1. The connection position of the IN electrode 1 and the IN lead is positioned between two adjacent holes. The IN lead is held in a state of being inserted in an insulator for IN lead made of an insulating material, and the IN lead is insulated from other structural elements (components) by this structure. As an insulator for IN lead, for example, PEEK (PolyEtherEtherKetone) resin excellent in workability, heat resistance, impact resistance, and insulation is suitable.

  Similarly to the IN electrode 1, the OUT electrode 3 is a metal electrode having a donut shape having an opening 30 in the center, but a part of the OUT electrode 3 is cut out so as not to come into contact with the IN lead insulator that accommodates the IN lead. Have a structured. A similar hole is provided on the surface of the OUT electrode 3 at a position corresponding to the hole of the IN electrode 1. The rear surface of the OUT electrode 3 is electrically connected to an OUT lead made of a conductive material (for example, stainless steel) having a bar shape extending from the rear. The OUT lead is disposed at a position where the IN lead is rotated 90 degrees counterclockwise about the tube axis AX when viewed from the front. Similarly to the IN lead, the OUT lead is also held in an insulating material, for example, an insulator for OUT lead made of PEEK resin (insulated from other structural elements).

  Note that an MCP insulator 901 made of an insulating material having a donut shape is disposed between the IN electrode 1 and the OUT electrode 3 at positions corresponding to the respective holes of the IN electrode 1 and the OUT electrode 3. These MCP insulators 901 are made of, for example, PEEK resin, and are slightly thinner than the MCP group 2. In the MCP assembly in which the MCP group 2 is sandwiched between the IN electrode 1 and the OUT electrode 3 as described above, the centers of the disk-shaped MCPs 20 and 21 coincide with the centers of the respective openings 10 and 30 of the IN electrode 1 and the OUT electrode 3. It is obtained by assembling with high accuracy.

  An accelerating electrode substrate 50 is disposed behind the OUT electrode 3 at a predetermined interval. The acceleration electrode substrate 50 is a metal electrode having a circular opening in the center, and a metal mesh is provided so as to cover the opening. The acceleration electrode 5 is configured by the acceleration electrode substrate 50 and the metal mesh. The acceleration electrode substrate 50 has a notch structure so as not to come into contact with an IN lead insulator that accommodates an IN lead and an OUT lead insulator that accommodates an OUT lead. As described above, since the acceleration electrode substrate 50 is disposed at a predetermined interval with respect to the OUT electrode 3, the acceleration electrode substrate 50 is provided with holes at positions corresponding to the holes of the OUT electrode 3. A thin plate 801 made of a conductive material and an insulator 902 made of an insulating material, both having a donut shape, are disposed between the OUT electrode 3 and the OUT electrode 3. The thin plate 801 is a metal part for sandwiching one end of the capacitor 80 with the OUT electrode 3. As the thin plate 801, a material having excellent ductility is suitable. For example, a member obtained by applying gold or copper plating to a phosphor bronze plate is preferable. Further, as the insulator 902, for example, PEEK resin can be applied. The opening provided in the acceleration electrode substrate 50 defines an effective area of the acceleration electrode 5 (mesh area for passing secondary electrons emitted from the MCP group 2). It is wider than the region (region that emits secondary electrons).

  Further, an anode substrate 40 is disposed behind the acceleration electrode substrate 50 at a predetermined interval. The anode substrate 40 has a disk shape formed of glass epoxy resin (insulating material), and a predetermined pattern of a metal thin film such as copper is formed on the front and back surfaces thereof. The metal thin film pattern on the front surface and the metal thin film pattern on the back surface are electrically connected. The anode substrate 40 has a notch structure so as not to come into contact with an IN lead insulator that accommodates an IN lead and an OUT lead insulator that accommodates an OUT lead. As described above, since the anode substrate 40 is disposed at a predetermined interval with respect to the acceleration electrode substrate 50, the anode substrate 40 is provided with holes at positions corresponding to the holes of the acceleration electrode substrate 50, and Between the accelerating electrode substrate 50, a thin plate 803 made of a conductive material and an insulator 904 made of an insulating material both having a donut shape are disposed. The thin plate 803 is a metal part for sandwiching one end of the capacitor 90 with the acceleration electrode substrate 50. As the thin plate 803, a material excellent in ductility is suitable. For example, a member obtained by applying gold or copper plating to a phosphor bronze plate is preferable. Further, as the insulator 904, for example, PEEK resin can be applied.

  Of the metal thin film patterns formed on the front surface and the back surface of the anode substrate 40, the metal thin film pattern on the front surface is a circle having the same shape as the opening 30 of the OUT electrode 3, and the metal thin film pattern on the opening 30 and the front surface. Are arranged coaxially. On the other hand, the metal thin film pattern on the back surface is a substantially linear pattern extending in the radial direction from the center of the anode substrate 40, and a conductive material (for example, made of stainless steel) having a rod shape extending from the rear at the outer end. ) Anode lead is electrically connected. The anode lead is disposed at a position obtained by rotating the OUT lead 90 degrees counterclockwise about the tube axis AX when viewed from the front. That is, the IN lead is disposed at a symmetrical position with respect to the tube axis AX. Similarly to the IN lead and OUT lead, the anode lead is insulated from other structural elements by being held in an insulating material, for example, an insulator for anode lead made of PEEK resin.

  A copper anode terminal 41 is screwed to the center of the metal thin film pattern on the back surface. The anode 4 is configured by the anode terminal 41 and the anode substrate 40. The anode 4 is not limited to the above-described structure, and may be constituted by, for example, an anode substrate 40 made of an insulating material and a metal plate fixed to a partial region or the entire surface of the anode substrate 40. Moreover, the whole anode 4 may be comprised with the metal plate.

  A rear cover 500 is disposed behind the anode 4. The rear cover 500 includes a substrate 501 having a donut shape, a cylindrical portion 502, and a substrate 503 having the same donut shape. The cylindrical portion 502 is sandwiched between the substrates 501 and 503 and fixed by screws 920 and 930. The rear cover 500 thus connects the inner periphery of the substrate 501 and the outer periphery of the substrate 503 via the cylindrical portion 502. By doing so, it becomes a deep dish-shaped member. The substrates 501 and 503 and the cylindrical portion 502 are all made of metal (for example, stainless steel). Further, the substrate 501 is provided with a screw hole, and the rear cover 500 is disposed on the back surface of the anode 4 with the insulator 903 and the thin plate 802 interposed therebetween. At this time, the electrodes 1, 3, 4 and the MCP group 2 are fixed to the rear cover 500 by fastening screws 910 that are electrically insulating (for example, PEEK resin is applicable) into the screw holes. The thin plate 802 is a metal part for sandwiching the other ends of the capacitors 80 and 90 together with the substrate 501. The thin plate 802 may be the same material as the thin plates 801 and 803. For the insulator 903, for example, PEEK resin is applicable. Further, the substrate 501 has a hole into which each lead insulator is inserted.

  A BNC terminal 6 that is a signal output unit is fixed to the center of the substrate 503 by a screw 940. The outer side 600 of the BNC terminal 6 is electrically connected to the substrate 501 of the rear cover 500. On the other hand, the core wire 601 inside the BNC terminal 6 is connected to the anode terminal 41 via a capacitor 62. The capacitor 62 has a function of setting the signal output level to the GND level by insulating the output.

  Note that, between the OUT electrode 3 and the substrate 501, four capacitors 80, each terminal of which is electrically connected to each of the OUT electrode 3 and the substrate 501 by the thin plate 801 and the thin plate 802, are connected to the tube axis. Arranged at equal intervals around AX. Since the substrate 501, the cylindrical portion 502, and the substrate 503 are each made of metal, one end of the capacitor 80 is electrically connected to the outside 600 of the BNC terminal 6. Similarly, between the acceleration electrode substrate 50 and the substrate 501, there are four capacitors 90 in which each terminal is electrically connected to each of the acceleration electrode substrate 50 and the substrate 501 by the thin plate 803 and the thin plate 802 described above. These are arranged at equal intervals around the tube axis AX. Therefore, these capacitors 90 are also attached between the metal substrate 501 and the acceleration electrode substrate 50, and one end of the capacitor 90 is electrically connected to the outside 600 of the BNC terminal 6.

  Further, in the MCP detector having the triode structure as described above, the acceleration electrode 5 has the shortest distance B to the anode 4 longer than the shortest distance A to the emission surface of the MCP group 2 as shown in FIG. It is arranged between the MCP group 2 and the anode 4 so as to be. That is, by arranging the acceleration electrode 5 between the MCP group 2 and the anode 4 so as to satisfy the condition of A <B, the detection peak FWHM can be significantly shortened, and the time response characteristic can be improved. it can. This is because the peak FWHM appearing on the detected time spectrum can be reduced by adjusting the arrangement conditions of the MCP group 2, the acceleration electrode 5, and the anode 4. That is, the adjustment of the distance A between the MCP group 2 and the acceleration electrode 5 contributes to the control of the rise time of the detection peak, and the adjustment of the distance B between the acceleration electrode 5 and the anode 4 contributes to the control of the fall time of the detection peak. To do.

  The acceleration electrode 5 may be set to a higher potential than the OUT electrode 3, but the acceleration electrode 5 is set to the same potential as the anode 4, so that the MCP can be compared with the conventional bipolar MCP detector. The acceleration region of the secondary electrons emitted from the group 2 can be arbitrarily limited (spreading time can be reduced, so that the rise time of the detection peak can be shortened compared to the conventional case).

  FIG. 7 is a graph showing time response characteristics of an MCP detector to which an MCP unit having a triode structure is applied. FIG. 8A is a cross-sectional view showing the structure of a triode-structured MCP unit prepared in order to measure the response characteristics of FIG. 7 (structure in an ideal environment that is hardly affected by an external potential source). Yes, FIG. 8B is a table showing the measurement results.

  As shown in FIG. 8A, the prepared measurement system includes an MCP group 2 in which an IN electrode 1 is provided on the incident surface side and an OUT electrode 3 is provided on the output surface side, an anode 4, It is assumed that the MCP unit includes an acceleration electrode 5 disposed between the MCP group 2 and the anode 4 and is installed in an ideal environment that is not easily affected by an external potential source. In such a measurement system MCP unit, the anode 4 and the acceleration electrode 5 are set to the ground level, the OUT electrode 3 is set to -500V, and the IN electrode 1 is set to -2000V. The effective area of the acceleration electrode 5 is composed of a metal mesh having an aperture ratio of 81% (line width 40 μm, wiring pitch 0.4 mm).

  In this measurement, the output voltage obtained from the anode 4 while changing the shortest distance A between the MCP group 2 and the acceleration electrode 5 and the shortest distance B between the acceleration electrode 5 and the anode 4 shown in FIG. This was done by monitoring the time change. That is, as shown in FIG. 8B, the case 1 in which the distance A is 1.1 mm and the distance B is 1.1 mm, the case 2 in which the distance A is 1.1 mm and the distance B is 2.6 mm, and the distance A Was measured for Case 3 with a distance of 2.6 mm and a distance B of 1.1 mm. A graph G810 shown in FIG. 7 shows a time spectrum of case 1 (A = B), and a graph G820 shows a time spectrum of case 2 (A <B). As can be seen from FIG. 7, in the case 2, the full width at half maximum (FWHM) of the detection peak is greatly reduced as the fall time of the detection peak is significantly shortened. On the other hand, although not shown in FIG. 7, in the case 3, the FWHM of the detection peak is almost the same as the case 1 as a result, but the rise time is increased in contrast to the reduction of the fall time of the detection peak. It has been. Thus, in case 3, since the fall time and the rise time change in conjunction with each other, it is difficult to shape the waveform of the detected peak.

  Next, FIG. 9A to FIG. 9C are views for explaining the structure of the acceleration electrode 5. As shown in FIG. 9A, the acceleration electrode 5 includes an acceleration electrode substrate 50 provided with a circular opening 5a at the center, and a metal mesh 51 attached so as to cover the opening 5a. As shown in FIG. 9B, the metal mesh 51 is obtained by arranging metal wires having a predetermined line width in a grid pattern. The limit of the line width is considered to be about 40 μm from the viewpoint of manufacturing restrictions and mechanical strength. FIG. 9C is a table showing the relationship between the wiring pitch and the aperture ratio of the metal mesh 51 configured with a line width of 40 μm.

  The open efficiency (open efficiency of the metal mesh) in the effective region of the accelerating electrode 5 having the above-described structure is preferably 60% or more and 95% or less. This is because when the aperture ratio is less than 60%, the number of passing electrons (transmittance of the accelerating electrode) decreases, and the amount of signal obtained from the anode decreases. On the other hand, when the aperture ratio exceeds 95%, the waveform shaping of the detection peak in the obtained time spectrum is substantially impossible. FIG. 10 (A) is a graph showing the relationship between the aperture ratio (%) of the acceleration electrode applied to the MCP unit shown in FIG. 8 (A) and the rise time (ps). B) is a table showing measurement conditions.

  Next, the restriction structure applied to the triode structure MCP unit having the above-described structure will be described. That is, the MCP unit or the like according to the present invention includes the triode structure as described above as a basic structure, and various structures as a limiting structure for reducing the influence of an external potential source existing in the vicinity of the MCP unit. Applicable.

  FIG. 11 is an equivalent circuit diagram for explaining the characteristic structure of the MCP detector to which the MCP unit according to the present invention is applied, and its main part overlaps with the equivalent circuit diagram of FIG. The MCP detector shown in FIG. 11 is also applicable to a TOF-MS device or the like. The MCP detector shown in FIG. 11 is housed in a vacuum container whose interior is maintained at a predetermined degree of vacuum. The vacuum vessel is made of a conductive material and is set to the ground potential. In this MCP detector, two MCPs 20 and 21 (MCP group 2) are sandwiched between an IN electrode 1 and an OUT electrode 3 each having an opening at the center thereof. An anode 4 is disposed behind the OUT electrode 3, and an acceleration electrode 5 having a metal mesh is disposed between the OUT electrode 3 and the anode. Further, a vacuum vessel is connected to the shield side of the BNC terminal 6 for signal readout, while the core wire of the BNC terminal 6 is connected to the anode 4 via a capacitor 62. The capacitor 62 has a function of setting the signal output level to the GND level by insulating the output. Further, capacitors 80 and 90 are also arranged between the shield side of the BNC terminal 6 and the OUT electrode 3 and between the shield side of the BNC terminal 6 and the acceleration electrode 5, respectively. The interval B between the acceleration electrode 5 and the anode 4 is set to be wider than the interval A between the MCP group 2 and the acceleration electrode 5.

  In the MCP detector having the above-described structure, the OUT electrode 3 is set to a higher negative potential than the IN electrode 1 with the negative potential set to the IN electrode 1 as a reference. The acceleration electrode 5 and the anode 4 are set to a negative potential higher than that of the OUT electrode 3. The acceleration electrode 5 and the anode 4 may be set to the same potential. Thus, the MCP detector has a floating anode structure in which the anode potential is not grounded.

  The signal from the anode 4 taken out through the core wire of the BNC terminal 6 is amplified by an amplifier (Amp) and then taken into the analysis unit. Specifically, when charged particles enter the MCP group 2 in the MCP detector 100a, a large number of electrons are emitted from the MCP group 2 accordingly. The secondary electrons thus emitted reach the anode 4 and are converted into an electric signal as a change in voltage or current. At this time, the detection signal is output to the outside at the ground potential by the capacitor 62 provided between the anode 4 and the core wire, and between the shield side of the BNC terminal 6 and the OUT electrode 3, and the BNC terminal 6. Occurrence of waveform distortion and overshoot (ringing) of the output signal is suppressed (in an ideal environment) by the capacitors 80 and 90 provided respectively between the shield side and the acceleration electrode 5.

  In particular, the MCP unit according to the present invention causes secondary electrons (reflected electrons) emitted from the anode 4 in response to the incidence of secondary electrons from the MCP group 2 to enter the space between the acceleration electrode and the anode. A restriction structure for confinement is further provided.

  As a specific restricting structure, as shown in FIG. 11, an aspect I (first embodiment) in which the space between the acceleration electrode and the anode is physically isolated from the peripheral space of the MCP unit, Aspect II (second embodiment) for limiting the movement of reflected electrons emitted from the anode along a direction perpendicular to the central axis of the MCP unit, and an aspect III (second) for controlling the potential difference between the acceleration electrode and the anode 3), an aspect IV for controlling the trajectory of secondary electrons from the microchannel plate to the anode (fourth embodiment), and an aspect V for changing the structure for suppressing the emission of reflected electrons from the anode itself (first embodiment). 5 embodiment). In addition, the said restriction | limiting structure is realizable also by the combination of two or more aspects among aspect IV.

(First embodiment)
FIG. 12 is an assembly process diagram for explaining the structure of the MCP detector to which the MCP unit according to the first embodiment is applied. FIG. 13 is a diagram showing a cross-sectional structure of the MCP detector shown in FIG. 12 along the line L2-L2.

  The restriction structure in the first embodiment is realized by a structure (mode I) that isolates the space between the acceleration electrode 5 and the anode 4 from the peripheral space, as shown in FIG. Specifically, in the limiting structure in the first embodiment, a ring member 904A having a through hole 904Aa is applied instead of the insulator 904 as a spacer in the basic structure of the MCP detector shown in FIG. The

  That is, the MCP detector to which the MCP unit according to the first embodiment is applied includes an IN electrode 1 (first electrode), an MCP group 2 in order along the tube axis AX (corresponding to the central axis of the MCP unit), It has a structure in which an OUT electrode 3 (second electrode), an acceleration electrode 5 and an anode 4 are arranged. Note that an MCP insulator 901 made of an insulating material is disposed between the IN electrode 1 and the OUT electrode 3. The acceleration electrode 5 is disposed behind the OUT electrode 3 via an insulator 902. Further, an anode 4 is disposed behind the acceleration electrode 5, and a ring member 904 </ b> A having a through-hole 904 </ b> Aa through which secondary electrons from the MCP group 2 can pass between the acceleration electrode 5 and the anode 4. Is arranged. A rear cover 500 is disposed behind the anode 4 with the insulator 903 and the thin plate 802 interposed therebetween. The rear cover 500 includes a substrate 501, a cylindrical portion 502, and a substrate 503. A BNC terminal 6 serving as a signal output unit is fixed at the center of the substrate 503, and a core wire 601 inside the BNC terminal 6 is connected to the anode terminal 41 via a capacitor 62.

  In the first embodiment, the ring member 904 </ b> A has a through hole 904 </ b> Aa defined by a continuous surface surrounding the tube axis AX so that secondary electrons from the acceleration electrode 5 toward the anode 4 can pass therethrough. The ring member 904A has a first surface that contacts the accelerating electrode 5 and a second surface that faces the first surface and contacts the anode 4, and the through hole 904Aa of the ring member 904A has a first surface. And has a shape extended to communicate with the second surface. Further, the ring member 904A may be made of either a metal member or an insulating material. With this structure, the space between the acceleration electrode 5 and the anode 4 is maintained in an isolated state from the surrounding space. As a result, the possibility of reflection electrons jumping out from the space between the acceleration electrode 5 and the anode 4 toward the outside of the MCP detector is effectively reduced (see graph G420 in FIG. 4B). . However, in the structure in which the entire anode 4 is made of a metal plate, the ring member 904A exhibits different functions depending on its constituent materials. That is, when the acceleration electrode 5 and the anode 4 are set to the same potential, the ring member 904A is preferably made of a metal material. On the other hand, when the potential of the acceleration electrode 5 and the potential of the anode 4 are controlled independently, the ring member 904A is preferably made of an insulating material.

(Second Embodiment)
As shown in FIG. 11, the limiting structure in the second embodiment is a structure that limits the movement of the reflected electrons emitted from the anode 4 along the direction perpendicular to the tube axis AX of the MCP detector (mode). II). The structure of the MCP detector to which the MCP unit according to the second embodiment is applied substantially matches the basic structure shown in FIG. 5 except for the structure corresponding to the restriction structure in the second embodiment. To do.

  That is, the MCP detector to which the MCP unit according to the second embodiment is applied has an IN electrode 1 (first electrode), an MCP group 2, OUT in order along the tube axis AX (coincident with the central axis of the MCP unit). The electrode 3 (second electrode), the acceleration electrode 5 and the anode 4 are arranged. Note that an MCP insulator 901 made of an insulating material is disposed between the IN electrode 1 and the OUT electrode 3. The acceleration electrode 5 is disposed behind the OUT electrode 3 via an insulator 902. Further, an anode 4 is disposed behind the acceleration electrode 5, and an insulator 904 as a spacer is disposed between the acceleration electrode 5 and the anode 4. A rear cover 500 is disposed behind the anode 4 with the insulator 903 and the thin plate 802 interposed therebetween. The rear cover 500 includes a substrate 501, a cylindrical portion 502, and a substrate 503. A BNC terminal 6 serving as a signal output unit is fixed at the center of the substrate 503, and a core wire 601 inside the BNC terminal 6 is connected to the anode terminal 41 via a capacitor 62.

  Although the restriction structure according to the second embodiment can be realized by various structures, FIG. 14 illustrates an assembly process for explaining the first structure of the MCP detector to which the MCP unit according to the second embodiment is applied. FIG. FIG. 15 is a view showing a cross-sectional structure of the MCP detector shown in FIG. 14 along the line L3-L3.

  Specifically, instead of the IN electrode 1 in the basic structure of the MCP detector shown in FIG. 5, the IN electrode 100A is applied to the first structure that realizes the limiting structure in the second embodiment. . In the first structure, the IN electrode 100A is provided with a mask member 100Ab so that the diameter of the opening 100Aa is smaller than the diameter of the opening 10 of the IN electrode 1 shown in FIG. 5 (basic structure). . As shown in FIG. 14, the mask member 100Ab has a through hole defined by a continuous surface surrounding the tube axis AX, and constitutes a part of the IN electrode 100A. According to this structure, the arrival region of the secondary electrons emitted from the MCP group 2 is more limited on the anode 4 in the vicinity of the tube axis AX. Therefore, it is possible to relatively increase the distance between the generation position of the reflected electrons emitted from the anode 4 and the end of the anode 4, and the MCP detection from the space between the acceleration electrode 5 and the anode 4. The possibility of reflected electrons jumping out of the device is effectively reduced.

  Next, the second structure for realizing the limiting structure in the second embodiment includes an acceleration electrode 500A and an anode in place of the acceleration electrode 5 and the anode 4 in the basic structure of the MCP detector shown in FIG. 400 is applied. FIG. 16 is an assembly process diagram for explaining a second structure of the MCP detector to which the MCP unit according to the second embodiment is applied. FIG. 17 is a diagram showing a cross-sectional structure of the MCP detector shown in FIG. 16 along the line L4-L4. Except for the acceleration electrode 500A and the anode 400, the structure of the MCP detector (FIGS. 16 and 17) having the second structure as the limiting structure is substantially the same as the basic structure of the MCP detector shown in FIG. I'm doing it.

  That is, in this second structure, the acceleration electrode 500A is configured by an acceleration electrode substrate 500Aa having a central opening and a metal mesh that closes the opening. Particularly, the acceleration electrode substrate 500Aa has a circular shape, and its maximum diameter is larger than that of the acceleration electrode substrate 50 shown in FIG. Similarly, also in the anode 400, the shape of the anode substrate 400a is circular, and the maximum diameter is larger than that of the anode substrate 40 shown in FIG. Specifically, the anode 400 (anode substrate 400a) is the anode theory calculated in an ideal environment (for example, the environment of FIG. 8A) in which the electric field distribution around the MCP unit is not easily affected by the external potential source. It has a maximum diameter that is larger than the theoretical maximum diameter that allows the backscattered electrons once absorbed. Similarly, the acceleration electrode 500A has the same maximum diameter as the anode 400. This second structure also makes it possible to substantially extend the travel distance of reflected electrons emitted from the anode 400 (in the direction orthogonal to the tube axis AX). As a result, the possibility of reflection electrons jumping out from the space between the acceleration electrode 5 and the anode 4 toward the outside of the MCP detector is effectively reduced.

  Next, the third structure for realizing the restriction structure in the second embodiment includes an insulator 904 arranged between the acceleration electrode 5 and the anode 4 in the basic structure of the MCP detector shown in FIG. Instead, the insulator 904B is applied. FIG. 18 is an assembly process diagram for explaining a third structure of the MCP detector to which the MCP unit according to the second embodiment is applied. FIG. 19 is a diagram showing a cross-sectional structure of the MCP detector shown in FIG. 18 taken along line L5-L5. Except for the insulator 904B, the structure of the MCP detector (FIGS. 18 and 19) having the third structure as the limiting structure substantially matches the basic structure of the MCP detector shown in FIG.

  In other words, in this third structure, the insulator 904B contributes to the setting of the interval B along the tube axis AX from the acceleration electrode 5 to the anode 4. Specifically, the interval A along the tube axis AX from the OUT electrode 3 to the acceleration electrode 5 is set to be narrower than the interval B along the tube axis AX from the acceleration electrode 5 to the anode 4. The interval B between the acceleration electrode 5 and the anode 4 is defined so that B is not more than twice the interval A. According to the third structure, the solid angle of movement of the reflected electrons emitted from the anode 4 can be narrowed by narrowing the distance between the acceleration electrode 5 and the anode 4 than the normal distance. As a result, the possibility of reflection electrons jumping out from the space between the acceleration electrode 5 and the anode 4 toward the outside of the MCP detector is effectively reduced.

  Further, the fourth structure for realizing the limiting structure in the second embodiment is the same as the basic structure shown in FIG. 5 except that the structure of the MCP detector itself is set to the ground potential from the MCP detector. According to the fourth structure in which the distance to the casing is sufficiently separated, the potential gradient from the MCP unit to the casing can be weakened. As a result, the possibility of reflection electrons jumping out from the space between the acceleration electrode 5 and the anode 4 toward the outside of the MCP detector is effectively reduced.

(Third embodiment)
The restriction structure in the third embodiment is realized by a structure (mode III) for controlling the potential difference between the acceleration electrode 5 and the anode 4 as shown in FIG. The basic structure of the MCP detector to which the MCP unit according to the third embodiment is applied is the same as the basic structure shown in FIGS. 2 and 11 except for the structure corresponding to the restriction structure in the third embodiment. Substantially match. FIG. 20 is an equivalent circuit diagram for explaining the structure of the MCP detector to which the MCP unit according to the third embodiment is applied. FIG. 21A is a diagram illustrating a voltage application state between the OUT electrode 3 and the anode 4 in the MCP detector to which the MCP unit according to the third embodiment is applied, and FIG. 21B is a diagram illustrating the MCP unit. FIG.

  That is, the MCP detector (FIG. 20) to which the MCP unit according to the third embodiment is applied is housed in a vacuum container whose interior is maintained at a predetermined degree of vacuum, as in FIGS. Yes. The vacuum vessel is made of a conductive material and is set to the ground potential. In this MCP detector, two MCPs 20 and 21 (MCP group 2) are sandwiched between an IN electrode 1 and an OUT electrode 3 each having an opening at the center thereof. An anode 4 is disposed behind the OUT electrode 3, and an acceleration electrode 5 having a metal mesh is disposed between the OUT electrode 3 and the anode. Further, a vacuum vessel is connected to the shield side of the BNC terminal 6 for signal readout, while the core wire of the BNC terminal 6 is connected to the anode 4 via a capacitor 62.

  The limiting structure in the third embodiment is realized by a structure for setting a potential higher than that of the acceleration electrode 5 to the anode 4, as shown in FIG. In this case, as shown in FIG. 21A, the potential gradient in the space between the acceleration electrode 5 and the anode 4 is smaller than the potential gradient in the space between the OUT electrode 3 and the acceleration electrode 5. Thus, a predetermined potential is set at the anode 4. According to the limiting structure in the third embodiment, the trajectory of the reflected electrons emitted from the anode 4 is bent toward the anode 4 by the potential gradient set in the space between the acceleration electrode 5 and the anode 4. As a result, the possibility that reflected electrons jump out from the space between the acceleration electrode 5 and the anode 4 toward the outside of the MCP detector is effectively reduced (see FIG. 21B).

(Fourth embodiment)
The restriction structure in the fourth embodiment is realized by a structure (mode IV) for controlling the trajectory of secondary electrons from the microchannel plate toward the anode, as shown in FIG. The structure of the MCP detector to which the MCP unit according to the fourth embodiment is applied substantially matches the basic structure shown in FIG. 5 except for the structure corresponding to the restriction structure in the fourth embodiment. To do.

  That is, the MCP detector to which the MCP unit according to the fourth embodiment is applied has an IN electrode 1 (first electrode), an MCP group 2, OUT in order along the tube axis AX (matching the central axis of the MCP unit). The electrode 3 (second electrode), the acceleration electrode 5 and the anode 4 are arranged. Note that an MCP insulator 901 made of an insulating material is disposed between the IN electrode 1 and the OUT electrode 3. The acceleration electrode 5 is disposed behind the OUT electrode 3 via an insulator 902. Further, an anode 4 is disposed behind the acceleration electrode 5, and an insulator 904 as a spacer is disposed between the acceleration electrode 5 and the anode 4. A rear cover 500 is disposed behind the anode 4 with the insulator 903 and the thin plate 802 interposed therebetween. The rear cover 500 includes a substrate 501, a cylindrical portion 502, and a substrate 503. A BNC terminal 6 serving as a signal output unit is fixed at the center of the substrate 503, and a core wire 601 inside the BNC terminal 6 is connected to the anode terminal 41 via a capacitor 62.

  Although the restriction structure according to the fourth embodiment can be realized by various structures, FIG. 22 illustrates an assembly process for explaining the first structure of the MCP detector to which the MCP unit according to the fourth embodiment is applied. FIG. FIG. 23 is a view showing a cross-sectional structure of the MCP detector shown in FIG. 22 along the line L6-L6.

  Specifically, instead of the IN electrode 1 in the basic structure of the MCP detector shown in FIG. 5, the IN electrode 100B is applied to the first structure that realizes the limiting structure in the fourth embodiment. . In this second structure, the IN electrode 100B has a shape that realizes an electron lens structure for controlling the trajectory of secondary electrons from the MCP group 2 toward the anode 4. That is, the IN electrode 100B includes a flat part having an opening 100Ba (a part facing the incident surface of the MCP group 2) and a side wall part extending from the edge of the flat part toward the anode 4. According to this first structure, even when the reflected electrons emitted from the anode 4 move along the direction orthogonal to the tube axis AX, the trajectory of the reflected electrons is bent toward the anode 4 side. As a result, the possibility of reflection electrons jumping out from the space between the acceleration electrode 5 and the anode 4 toward the outside of the MCP detector is effectively reduced.

  Next, instead of the OUT electrode 3 in the basic structure of the MCP detector shown in FIG. 5, the OUT electrode 300 is applied to the second structure that realizes the limiting structure in the fourth embodiment. FIG. 24 is an assembly process diagram for explaining a second structure of the MCP detector to which the MCP unit according to the fourth embodiment is applied. FIG. 25 is a diagram showing a cross-sectional structure of the MCP detector shown in FIG. 24 taken along line L7-L7.

  In the second structure of the fourth embodiment, the OUT electrode 300 has a shape that realizes an electron lens structure for controlling the trajectory of secondary electrons from the MCP group 2 toward the anode 4. That is, the OUT electrode 300 includes a flat portion having an opening 300a (a portion facing the emission surface of the MCP group 2) and a side wall portion extending from the edge of the flat portion toward the anode 4. According to this second structure, even when the reflected electrons emitted from the anode 4 move along a direction orthogonal to the tube axis AX, the trajectory of the reflected electrons is bent toward the anode 4 side. As a result, the possibility of reflection electrons jumping out from the space between the acceleration electrode 5 and the anode 4 toward the outside of the MCP detector is effectively reduced.

(Fifth embodiment)
The structure of the MCP detector to which the MCP unit according to the fifth embodiment is applied is the same as the basic structure of the triode-structured MCP detector shown in FIGS. However, the fifth embodiment includes a structure that suppresses the emission of reflected electrons from the anode 4 itself. Specifically, the anode 4 has a structure in which the surface thereof is coated with carbon or the like that suppresses the generation of secondary electrons (reflected electrons). Thus, the effect of reducing the influence of the external potential source can be sufficiently expected by changing the structure of the anode 4 itself.

  From the above description of the present invention, it is apparent that the present invention can be modified in various ways. Such modifications cannot be construed as departing from the spirit and scope of the invention, and modifications obvious to one skilled in the art are intended to be included within the scope of the following claims.

  DESCRIPTION OF SYMBOLS 1,100A, 100B ... IN electrode (first electrode), 2 ... MCP group, 3,300 ... OUT electrode (second electrode), 20, 21 ... MCP, 4,400 ... anode, 5,500A ... acceleration electrode, 904, 904B: Insulator, 904A: Ring member.

Claims (12)

In an MCP unit having a charged particle multiplication function,
Arranged on a plane intersecting the central axis of the MCP unit, a microchannel plate which emits secondary electrons multiplication internally in response to incidence of the charged particles moving along said central axis A microchannel plate having an incident surface on which the charged particles are incident and an exit surface facing the incident surface and emitting the secondary electrons;
A first electrode in contact with an incident surface of the microchannel plate, the first electrode set at a first potential;
A second electrode in contact with the emission surface of the microchannel plate, the second electrode being set to a second potential higher than the first potential;
An anode disposed in a state intersecting with the central axis at a position where secondary electrons emitted from the emission surface of the microchannel plate reach, and is set to a third potential higher than the second potential. An anode,
An accelerating electrode disposed between the microchannel plate and the anode, set to a fourth potential higher than the second potential, and secondary from the emission surface of the microchannel plate toward the anode An accelerating electrode having a plurality of apertures for passing electrons; and
A ring member disposed between the accelerating electrode and the anode, wherein reflected electrons emitted from the anode in response to incident secondary electrons from the microchannel plate are converted into the accelerating electrode and the anode. as to confine the space between the, and a ring member having a through hole secondary electrons flowing from the accelerating electrode to the anode is defined by a continuous surface surrounding the central shaft to pass,
The ring member has a first surface that contacts the acceleration electrode, and a second surface that faces the first surface and contacts the anode,
The MCP unit according to claim 1, wherein the through hole of the ring member has a shape extending so as to connect the first surface and the second surface . The MCP unit according to claim 1, wherein the ring member is made of an insulating material. The MCP unit according to claim 1, wherein the ring member is made of a metal material. In an MCP unit having a charged particle multiplication function,
A microchannel plate disposed on a plane intersecting with the central axis of the MCP unit and emitting secondary electrons multiplied inside in response to incidence of the charged particles moving along the central axis. A microchannel plate having an incident surface on which the charged particles are incident and an exit surface facing the incident surface and emitting the secondary electrons;
A first electrode in contact with an incident surface of the microchannel plate, the first electrode set at a first potential;
A second electrode in contact with the emission surface of the microchannel plate, the second electrode being set to a second potential higher than the first potential;
An anode disposed in a state intersecting with the central axis at a position where secondary electrons emitted from the emission surface of the microchannel plate reach, and is set to a third potential higher than the second potential. An anode,
An accelerating electrode disposed between the microchannel plate and the anode, set to a fourth potential higher than the second potential, and secondary from the emission surface of the microchannel plate toward the anode An accelerating electrode having a plurality of apertures for passing electrons; and
A ring member disposed between the accelerating electrode and the anode, wherein reflected electrons emitted from the anode in response to incident secondary electrons from the microchannel plate are converted into the accelerating electrode and the anode. A ring member having a through hole defined by a continuous surface surrounding the central axis so that secondary electrons from the accelerating electrode toward the anode pass so as to be confined in a space between
It said ring member, M CP unit you characterized in that it consists of an insulating material. The ring member has a first surface that contacts the acceleration electrode, and a second surface that faces the first surface and contacts the anode,
The MCP unit according to claim 4, wherein the through hole of the ring member has a shape extending so as to connect the first surface and the second surface. The MCP unit according to any one of claims 1 to 5 , and
An MCP detector comprising: a signal output unit arranged to sandwich the anode together with the microchannel plate, the signal output unit having a signal line electrically connected to the anode. The signal output unit includes a coaxial cable including the signal line and a shield unit surrounding the signal line, and
Claim the MCP detector is further characterized in that it comprises a capacitor having electrically connected to one terminal and the shield portion, and the other terminal electrically connected to the acceleration electrode 6 The MCP detector according to 1. In an MCP detector comprising an MCP unit having a charged particle multiplication function, and a signal output unit,
The MCP unit is
A microchannel plate disposed on a plane intersecting with the central axis of the MCP unit and emitting secondary electrons multiplied inside in response to incidence of the charged particles moving along the central axis. A microchannel plate having an incident surface on which the charged particles are incident and an exit surface facing the incident surface and emitting the secondary electrons;
A first electrode in contact with an incident surface of the microchannel plate, the first electrode set at a first potential;
A second electrode in contact with the emission surface of the microchannel plate, the second electrode being set to a second potential higher than the first potential;
An anode disposed in a state intersecting with the central axis at a position where secondary electrons emitted from the emission surface of the microchannel plate reach, and is set to a third potential higher than the second potential. An anode,
An accelerating electrode disposed between the microchannel plate and the anode, set to a fourth potential higher than the second potential, and secondary from the emission surface of the microchannel plate toward the anode An accelerating electrode having a plurality of apertures for passing electrons; and
A ring member disposed between the accelerating electrode and the anode, wherein reflected electrons emitted from the anode in response to incident secondary electrons from the microchannel plate are converted into the accelerating electrode and the anode. A ring member having a through hole defined by a continuous surface surrounding the central axis so that secondary electrons from the accelerating electrode to the anode pass so as to be confined in a space between
The signal output unit includes a coaxial cable that is disposed so as to sandwich the anode together with the microchannel plate, and that includes a signal line electrically connected to the anode and a shield unit surrounding the signal line. ,
The MCP detector further includes a capacitor having one terminal electrically connected to the shield part and the other terminal electrically connected to the acceleration electrode. . The ring member of the MCP unit has a first surface that contacts the acceleration electrode, and a second surface that faces the first surface and contacts the anode, and the through-hole of the ring member includes: The MCP detector according to claim 8, wherein the MCP detector has a shape extending so as to connect the first surface and the second surface . The MCP detector according to claim 8 or 9, wherein the ring member of the MCP unit is made of an insulating material. The MCP detector according to claim 8 or 9, wherein the ring member of the MCP unit is made of a metal material. A vacuum container in which a sample to be analyzed as an ion source is installed;
An ion extraction system for releasing ions from a sample installed in the vacuum vessel;
An ion accelerator arranged in the vacuum vessel for accelerating ions emitted from the sample;
The MCP detector according to any one of claims 6 to 11 , arranged so as to sandwich the ion accelerator together with the sample, and
An analysis unit for determining at least a mass as information on ions emitted from the sample, and detects a flight time from the ion accelerator to the MCP detector based on a detection signal from the MCP detector. it allows analysis unit and time-of-flight mass spectrometer equipped with determining the mass of ions reaching the MCP detector.

Images