SG11202010667VA - Detector having improved construction - Google Patents
Detector having improved constructionInfo
- Publication number
- SG11202010667VA SG11202010667VA SG11202010667VA SG11202010667VA SG11202010667VA SG 11202010667V A SG11202010667V A SG 11202010667VA SG 11202010667V A SG11202010667V A SG 11202010667VA SG 11202010667V A SG11202010667V A SG 11202010667VA SG 11202010667V A SG11202010667V A SG 11202010667VA
- Authority
- SG
- Singapore
- Prior art keywords
- detector
- improved construction
- construction
- improved
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
- H01J43/04—Electron multipliers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
- H01J43/04—Electron multipliers
- H01J43/06—Electrode arrangements
- H01J43/10—Dynodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
- H01J43/04—Electron multipliers
- H01J43/28—Vessels, e.g. wall of the tube; Windows; Screens; Suppressing undesired discharges or currents
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
- H01J43/02—Tubes in which one or a few electrodes are secondary-electron emitting electrodes
- H01J43/025—Circuits therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
- H01J43/04—Electron multipliers
- H01J43/06—Electrode arrangements
- H01J43/12—Anode arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/025—Detectors specially adapted to particle spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2201/00—Electrodes common to discharge tubes
- H01J2201/32—Secondary emission electrodes
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2018901542A AU2018901542A0 (en) | 2018-05-07 | Detector having improved construction | |
PCT/AU2019/050414 WO2019213697A1 (en) | 2018-05-07 | 2019-05-06 | Detector having improved construction |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11202010667VA true SG11202010667VA (en) | 2020-11-27 |
Family
ID=68466649
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202010667VA SG11202010667VA (en) | 2018-05-07 | 2019-05-06 | Detector having improved construction |
Country Status (9)
Country | Link |
---|---|
US (2) | US11978616B2 (en) |
EP (1) | EP3791423A4 (en) |
JP (2) | JP2021523523A (en) |
KR (1) | KR20210019431A (en) |
CN (1) | CN112585718B (en) |
AU (1) | AU2019264856A1 (en) |
CA (1) | CA3099178A1 (en) |
SG (1) | SG11202010667VA (en) |
WO (1) | WO2019213697A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3861567A4 (en) * | 2018-10-05 | 2022-07-06 | Adaptas Solutions Pty Ltd | Improvements to electron multiplier internal regions |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2662341B2 (en) * | 1992-05-20 | 1997-10-08 | 浜松ホトニクス株式会社 | Electron multiplier |
US5656807A (en) * | 1995-09-22 | 1997-08-12 | Packard; Lyle E. | 360 degrees surround photon detector/electron multiplier with cylindrical photocathode defining an internal detection chamber |
JP4108905B2 (en) * | 2000-06-19 | 2008-06-25 | 浜松ホトニクス株式会社 | Manufacturing method and structure of dynode |
US6727496B2 (en) * | 2001-08-14 | 2004-04-27 | Sionex Corporation | Pancake spectrometer |
AU2003900277A0 (en) * | 2003-01-20 | 2003-02-06 | Etp Electron Multipliers Pty Ltd | Particle detection by electron multiplication |
GB0327241D0 (en) * | 2003-11-21 | 2003-12-24 | Gv Instr | Ion detector |
JP4627431B2 (en) * | 2004-10-29 | 2011-02-09 | 浜松ホトニクス株式会社 | Photodetector and radiation detection apparatus |
US20060231769A1 (en) * | 2005-03-23 | 2006-10-19 | Richard Stresau | Particle detection by electron multiplication |
WO2009086642A1 (en) * | 2008-01-04 | 2009-07-16 | Covalx Ag | A detector device for high mass ion detection, a method for analyzing ions of high mass and a device for selection between ion detectors |
WO2010131420A1 (en) * | 2009-05-15 | 2010-11-18 | 日本電気株式会社 | Waterproof structure for electronic device |
WO2013033360A2 (en) * | 2011-09-02 | 2013-03-07 | Sun Chemical Corporation | Linear polyester resins and improved lithographic inks |
WO2014149846A2 (en) * | 2013-03-15 | 2014-09-25 | 1St Detect Corporation | A mass spectrometer system having an external detector |
JP6163066B2 (en) * | 2013-09-19 | 2017-07-12 | 浜松ホトニクス株式会社 | MCP unit, MCP detector and time-of-flight mass analyzer |
US9524855B2 (en) * | 2014-12-11 | 2016-12-20 | Thermo Finnigan Llc | Cascaded-signal-intensifier-based ion imaging detector for mass spectrometer |
US9508534B2 (en) * | 2014-11-07 | 2016-11-29 | Thermo Finnigan Llc | Systems and methods for calibrating gain in an electron multiplier |
GB2537148A (en) * | 2015-04-09 | 2016-10-12 | Kratos Analytical Ltd | Time of flight mass spectrometer |
US10262846B2 (en) * | 2015-07-29 | 2019-04-16 | ETP Ion Detect Pty Ltd | Apparatus and methods for focussing electrons |
JP6535250B2 (en) * | 2015-08-10 | 2019-06-26 | 浜松ホトニクス株式会社 | Charged particle detector and control method thereof |
-
2019
- 2019-05-06 CN CN201980036573.0A patent/CN112585718B/en active Active
- 2019-05-06 SG SG11202010667VA patent/SG11202010667VA/en unknown
- 2019-05-06 CA CA3099178A patent/CA3099178A1/en active Pending
- 2019-05-06 EP EP19800779.1A patent/EP3791423A4/en active Pending
- 2019-05-06 KR KR1020207035073A patent/KR20210019431A/en not_active Application Discontinuation
- 2019-05-06 US US17/053,192 patent/US11978616B2/en active Active
- 2019-05-06 WO PCT/AU2019/050414 patent/WO2019213697A1/en unknown
- 2019-05-06 AU AU2019264856A patent/AU2019264856A1/en not_active Abandoned
- 2019-05-06 JP JP2020562750A patent/JP2021523523A/en active Pending
-
2024
- 2024-01-11 JP JP2024002475A patent/JP2024024112A/en active Pending
- 2024-03-25 US US18/615,240 patent/US20240266157A1/en active Pending
Also Published As
Publication number | Publication date |
---|---|
US11978616B2 (en) | 2024-05-07 |
JP2024024112A (en) | 2024-02-21 |
CN112585718B (en) | 2024-05-28 |
US20240266157A1 (en) | 2024-08-08 |
CA3099178A1 (en) | 2019-11-14 |
CN112585718A (en) | 2021-03-30 |
EP3791423A4 (en) | 2022-01-12 |
KR20210019431A (en) | 2021-02-22 |
US20210142992A1 (en) | 2021-05-13 |
EP3791423A1 (en) | 2021-03-17 |
WO2019213697A1 (en) | 2019-11-14 |
AU2019264856A1 (en) | 2020-12-10 |
JP2021523523A (en) | 2021-09-02 |
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