JP6120259B2 - イオン注入法 - Google Patents
イオン注入法 Download PDFInfo
- Publication number
- JP6120259B2 JP6120259B2 JP2012108170A JP2012108170A JP6120259B2 JP 6120259 B2 JP6120259 B2 JP 6120259B2 JP 2012108170 A JP2012108170 A JP 2012108170A JP 2012108170 A JP2012108170 A JP 2012108170A JP 6120259 B2 JP6120259 B2 JP 6120259B2
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- JP
- Japan
- Prior art keywords
- boron
- plasma
- ion implantation
- ions
- silicon substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000005468 ion implantation Methods 0.000 title claims description 41
- 238000000034 method Methods 0.000 title claims description 24
- 229910052796 boron Inorganic materials 0.000 claims description 81
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 80
- 150000002500 ions Chemical class 0.000 claims description 52
- 239000007789 gas Substances 0.000 claims description 31
- 238000000137 annealing Methods 0.000 claims description 14
- 229910052731 fluorine Inorganic materials 0.000 claims description 8
- 239000011737 fluorine Substances 0.000 claims description 8
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 claims description 7
- 239000001307 helium Substances 0.000 claims description 5
- 229910052734 helium Inorganic materials 0.000 claims description 5
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims description 5
- 229910052754 neon Inorganic materials 0.000 claims description 5
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 claims description 5
- 238000010438 heat treatment Methods 0.000 claims description 4
- 238000002347 injection Methods 0.000 claims description 3
- 239000007924 injection Substances 0.000 claims description 3
- 230000006698 induction Effects 0.000 claims 1
- 239000000758 substrate Substances 0.000 description 69
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 65
- 229910052710 silicon Inorganic materials 0.000 description 65
- 239000010703 silicon Substances 0.000 description 65
- 230000001133 acceleration Effects 0.000 description 9
- -1 B + Chemical compound 0.000 description 7
- UORVGPXVDQYIDP-UHFFFAOYSA-N borane Chemical compound B UORVGPXVDQYIDP-UHFFFAOYSA-N 0.000 description 6
- 238000002474 experimental method Methods 0.000 description 6
- 210000004027 cell Anatomy 0.000 description 5
- 230000000052 comparative effect Effects 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 239000007943 implant Substances 0.000 description 4
- 238000000926 separation method Methods 0.000 description 4
- 230000002159 abnormal effect Effects 0.000 description 3
- 229910000085 borane Inorganic materials 0.000 description 3
- WTEOIRVLGSZEPR-UHFFFAOYSA-N boron trifluoride Chemical compound FB(F)F WTEOIRVLGSZEPR-UHFFFAOYSA-N 0.000 description 3
- 229910021419 crystalline silicon Inorganic materials 0.000 description 3
- 230000008016 vaporization Effects 0.000 description 3
- 229910015900 BF3 Inorganic materials 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 150000001638 boron Chemical class 0.000 description 2
- 150000001793 charged compounds Chemical class 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 230000001771 impaired effect Effects 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000011282 treatment Methods 0.000 description 2
- 238000009834 vaporization Methods 0.000 description 2
- 229910014311 BxHy Inorganic materials 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000003085 diluting agent Substances 0.000 description 1
- 238000010790 dilution Methods 0.000 description 1
- 239000012895 dilution Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000001819 mass spectrum Methods 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 238000009832 plasma treatment Methods 0.000 description 1
- 210000004180 plasmocyte Anatomy 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000003892 spreading Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
Images
Classifications
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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- Photovoltaic Devices (AREA)
Description
Claims (5)
- プラズマ発生室にデカボランを導入してプラズマを発生させ、このプラズマ中で電離したボロン含有イオンを加速し、プラズマ発生室に連通する真空処理室内に存する処理対象物にボロン含有イオンを注入するイオン注入工程と、
前記処理対象物を所定温度で加熱するアニール工程とを含み、
前記イオン注入工程にて、プラズマ中のボロン含有イオンのうち1個のボロンを含有するイオン又は2個のボロンを含有するイオンの量が最も多くなるように、前記プラズマ発生室に印加する電力を設定することを特徴とするイオン注入法。 - 前記プラズマ発生室に設けた高周波導入用コイルに500W〜1kWの高周波電力を印加してICP放電により前記プラズマを発生させることを特徴とする請求項1記載のイオン注入法。
- 前記プラズマ中のボロン含有イオンのうちボロンを1個含むイオンの量が最も多くなるように、前記高周波導入用コイルに600W〜1000Wの高周波電力を印加することを特徴とする請求項2記載のイオン注入法。
- 前記イオン注入工程にて、前記デカボランと共にヘリウムガス又はネオンガスを導入することを特徴とする請求項1〜3のいずれか1項記載のイオン注入法。
- イオン注入工程後、プラズマ発生室にフッ素含有ガスを導入してプラズマを発生させ、プラズマ発生室の内壁面に付着、堆積したボロン含有膜を除去する工程を更に含むことを特徴とする請求項1〜4のいずれか1項記載のイオン注入法。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012108170A JP6120259B2 (ja) | 2012-05-10 | 2012-05-10 | イオン注入法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012108170A JP6120259B2 (ja) | 2012-05-10 | 2012-05-10 | イオン注入法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2013235992A JP2013235992A (ja) | 2013-11-21 |
JP6120259B2 true JP6120259B2 (ja) | 2017-04-26 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012108170A Active JP6120259B2 (ja) | 2012-05-10 | 2012-05-10 | イオン注入法 |
Country Status (1)
Country | Link |
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JP (1) | JP6120259B2 (ja) |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3118785A1 (de) * | 1981-05-12 | 1982-12-02 | Siemens AG, 1000 Berlin und 8000 München | Verfahren und vorrichtung zum dotieren von halbleitermaterial |
JPH01225117A (ja) * | 1988-03-04 | 1989-09-08 | Nippon Telegr & Teleph Corp <Ntt> | 半導体装置の製造方法及びその製造装置 |
JPH0845867A (ja) * | 1994-05-27 | 1996-02-16 | Sanyo Electric Co Ltd | 半導体装置の製造方法および表示装置 |
JPH09259779A (ja) * | 1996-03-15 | 1997-10-03 | Nissin Electric Co Ltd | イオン源およびそれを用いたイオン注入装置 |
JP3749924B2 (ja) * | 1996-12-03 | 2006-03-01 | 富士通株式会社 | イオン注入方法および半導体装置の製造方法 |
JPH11329336A (ja) * | 1998-05-11 | 1999-11-30 | Nissin Electric Co Ltd | イオン注入装置 |
US6479828B2 (en) * | 2000-12-15 | 2002-11-12 | Axcelis Tech Inc | Method and system for icosaborane implantation |
JP4013674B2 (ja) * | 2002-07-11 | 2007-11-28 | 松下電器産業株式会社 | プラズマドーピング方法及び装置 |
US7939388B2 (en) * | 2006-10-25 | 2011-05-10 | Panasonic Corporation | Plasma doping method and plasma doping apparatus |
US8142607B2 (en) * | 2008-08-28 | 2012-03-27 | Varian Semiconductor Equipment Associates, Inc. | High density helicon plasma source for wide ribbon ion beam generation |
JP2012503886A (ja) * | 2008-09-25 | 2012-02-09 | アプライド マテリアルズ インコーポレイテッド | オクタデカボラン自己アモルファス化注入種を使用する無欠陥接合形成 |
JP5545706B2 (ja) * | 2009-06-18 | 2014-07-09 | 日本電信電話株式会社 | ホウ素ドーピング方法および半導体装置の製造方法 |
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2012
- 2012-05-10 JP JP2012108170A patent/JP6120259B2/ja active Active
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JP2013235992A (ja) | 2013-11-21 |
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