JP6117473B2 - 望遠鏡用の単純化された検査台及び自動検査可能な望遠鏡 - Google Patents

望遠鏡用の単純化された検査台及び自動検査可能な望遠鏡 Download PDF

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JP6117473B2
JP6117473B2 JP2012035408A JP2012035408A JP6117473B2 JP 6117473 B2 JP6117473 B2 JP 6117473B2 JP 2012035408 A JP2012035408 A JP 2012035408A JP 2012035408 A JP2012035408 A JP 2012035408A JP 6117473 B2 JP6117473 B2 JP 6117473B2
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optical
telescope
diameter
objective lens
detection case
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Japanese (ja)
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JP2012177920A (ja
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ペラン、ギョーム
リオタール、アルノー
ベナール、ハーブ
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テールズ
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/005—Testing of reflective surfaces, e.g. mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00—Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02—Catoptric systems, e.g. image erecting and reversing system
    • G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
    • G02B17/0605—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors
    • G02B17/061—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors on-axis systems with at least one of the mirrors having a central aperture
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B23/00—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices
    • G02B23/02—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices involving prisms or mirrors

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Astronomy & Astrophysics (AREA)
  • Telescopes (AREA)
JP2012035408A 2011-02-24 2012-02-21 望遠鏡用の単純化された検査台及び自動検査可能な望遠鏡 Active JP6117473B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1100549 2011-02-24
FR1100549A FR2972051B1 (fr) 2011-02-24 2011-02-24 Banc de controle simplifie de telescopes et telescopes auto-controlables

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JP2012177920A JP2012177920A (ja) 2012-09-13
JP6117473B2 true JP6117473B2 (ja) 2017-04-19

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JP2012035408A Active JP6117473B2 (ja) 2011-02-24 2012-02-21 望遠鏡用の単純化された検査台及び自動検査可能な望遠鏡

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US (1) US8670113B2 (enExample)
EP (1) EP2492659B1 (enExample)
JP (1) JP6117473B2 (enExample)
CA (1) CA2768414C (enExample)
FR (1) FR2972051B1 (enExample)
IN (1) IN2012DE00519A (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3011089B1 (fr) * 2013-09-20 2016-12-02 Thales Sa Telescope comportant des moyens internes de reglage au plan focal
FR3074306B1 (fr) * 2017-11-28 2020-06-12 Thales Instrument d'observation comportant un autocollimateur a miroir monte sur viseur d'etoiles

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5410408A (en) * 1993-12-22 1995-04-25 Hughes Aircraft Company Optical arrangement for performing null testing of aspheric surfaces including reflective/diffractive optics
FR2722571B1 (fr) * 1994-07-12 1996-10-04 Aerospatiale Procede de caracterisation d'un instrument optique par auto-collimation et instrument permettant sa mise en oeuvre
JP4140684B2 (ja) * 2000-11-28 2008-08-27 三菱電機株式会社 光学系ズレ推定装置、光学系ズレ調整装置、光学系ズレ推定方法、及び光学系ズレ調整方法
US6924899B2 (en) * 2002-05-31 2005-08-02 Optical Physics Company System for measuring wavefront tilt in optical systems and method of calibrating wavefront sensors
CA2424023C (en) * 2003-03-28 2008-10-14 Institut National D'optique Method and system for characterizing aspheric surfaces of optical elements
JP2007085788A (ja) * 2005-09-20 2007-04-05 Nikon Corp ハルトマンセンサ
CN100449260C (zh) * 2007-01-17 2009-01-07 哈尔滨工业大学 利用干涉仪精确测量望远系统物镜和目镜间距偏差的方法
FR2920536B1 (fr) * 2007-08-29 2010-03-12 Thales Sa Dispositif de mesure de la fonction de transfert de modulation d'instruments optiques de grande dimension
CN101251436A (zh) * 2008-03-28 2008-08-27 中国科学院上海技术物理研究所 卡塞格林二反射镜光学系统加工在线检验方法
FR2938933B1 (fr) 2008-11-25 2011-02-11 Thales Sa Systeme optique spatial comportant des moyens de controle actif de l'optique
JP5402011B2 (ja) * 2009-01-20 2014-01-29 株式会社ニコン 光学性能評価装置
US8511842B1 (en) * 2010-03-15 2013-08-20 Exelis, Inc. Eddy current based mirror wavefront control

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Publication number Publication date
FR2972051B1 (fr) 2013-08-16
US8670113B2 (en) 2014-03-11
EP2492659B1 (fr) 2019-12-25
US20130057851A1 (en) 2013-03-07
JP2012177920A (ja) 2012-09-13
IN2012DE00519A (enExample) 2015-06-05
EP2492659A1 (fr) 2012-08-29
FR2972051A1 (fr) 2012-08-31
CN102680209A (zh) 2012-09-19
CA2768414C (en) 2019-04-02
CA2768414A1 (en) 2012-08-24

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