JP6106394B2 - Resist solution supply device, resist coating device, resist solution temperature control method, resist solution storage device, and mask blank manufacturing method - Google Patents

Resist solution supply device, resist coating device, resist solution temperature control method, resist solution storage device, and mask blank manufacturing method Download PDF

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JP6106394B2
JP6106394B2 JP2012206826A JP2012206826A JP6106394B2 JP 6106394 B2 JP6106394 B2 JP 6106394B2 JP 2012206826 A JP2012206826 A JP 2012206826A JP 2012206826 A JP2012206826 A JP 2012206826A JP 6106394 B2 JP6106394 B2 JP 6106394B2
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充央 平出
充央 平出
三夫 三井
三夫 三井
本間 裕介
裕介 本間
浩 白鳥
浩 白鳥
光洋 白倉
光洋 白倉
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本発明は、フォトリソグラフィのパターンエッチングに用いるレジスト液をレジスト塗布装置に供給するレジスト液供給装置、レジスト液供給装置からレジスト液の供給を受けるレジスト塗布装置、レジスト液を保管するレジスト液保管装置、これらの装置におけるレジスト液の温度管理方法及びマスクブランクの製造方法に関する。   The present invention relates to a resist solution supply device that supplies a resist solution used for photolithography pattern etching to a resist coating device, a resist coating device that receives supply of a resist solution from the resist solution supply device, a resist solution storage device that stores the resist solution, The present invention relates to a temperature management method for a resist solution and a mask blank manufacturing method in these apparatuses.

LSIやフラットパネルディスプレイ(FPD:Flat Panel Display)などに代表される半導体デバイスの製造、磁気ディスクや光ディスクなどの微細構造物の形成・加工において、フォトリソグラフィの技術は不可欠である。マスクプロセスにおいは、1975年ごろには既に電子線や短波長レーザによる遮光膜のパターン描画が行われ、レジストとして有機溶媒現像系のものが用いられていた。現在では、マスクパターン寸法の微細化及び高感度露光の要請から主に化学増幅型レジスト(CAR:Chemically Amplified Resist)が広く採用されている。   Photolithographic techniques are indispensable in the manufacture of semiconductor devices typified by LSIs and flat panel displays (FPDs) and the formation and processing of fine structures such as magnetic disks and optical disks. In the mask process, a light shielding film pattern was already drawn by an electron beam or a short wavelength laser around 1975, and an organic solvent developing system was used as a resist. At present, a chemically amplified resist (CAR) is widely used mainly due to the demand for miniaturization of mask pattern dimensions and high-sensitivity exposure.

例えばフォトマスクプロセスにおけるマスクブランクへのレジストの塗布は、スピンコーティング法により行われる。スピンコーティング法では、スピンコータ上に対象基板を設置し、その基板表面にレジスト塗布装置のノズルからレジスト液を所定量だけ滴下した後にスピンコータを高速に回転させることで、レジスト液を拡散塗布させる。基板表面にレジストを均一かつ所望の厚さに塗布させるためには、その粘度条件に最も適合した温度(一般には室温)にレジスト液を調整する必要がある。   For example, application of a resist to a mask blank in a photomask process is performed by a spin coating method. In the spin coating method, a target substrate is set on a spin coater, a predetermined amount of resist solution is dropped from a nozzle of a resist coating device onto the substrate surface, and then the spin coater is rotated at a high speed, whereby the resist solution is applied by diffusion. In order to apply the resist uniformly and to a desired thickness on the substrate surface, it is necessary to adjust the resist solution to a temperature (generally room temperature) most suitable for the viscosity condition.

このような課題の解決を目的とした従来技術としては、レジスト液を滴下ノズルに供給する供給管の周囲にチューブを設け、このチューブに温調液を流すことによりレジスト液の温度を調整するレジスト液供給装置が知られている(例えば特許文献1参照)。また、ゲル化した不溶解物を含むレジスト液がノズルから滴下されないようにするために、ゲル化成分を積極的に凝集させる加熱手段と、凝集させた異物を除去するフィルタとを供給管に設けたレジスト液供給装置が提案されている(例えば特許文献2参照)。また、レジスト液のパーティクルの増加を防ぐために、レジスト液を保管容器内で循環させてフィルタで濾過する循環濾過装置を組み込んだフォトレジスト塗布液供給装置が開示されている(例えば特許文献3参照)。   As a conventional technique for solving such a problem, a resist is provided in which a tube is provided around a supply pipe for supplying a resist solution to a dropping nozzle, and the temperature of the resist solution is adjusted by flowing a temperature adjusting liquid through the tube. A liquid supply apparatus is known (see, for example, Patent Document 1). In order to prevent the resist solution containing gelled insoluble matter from dripping from the nozzle, the supply pipe is provided with a heating means for actively aggregating the gelled component and a filter for removing the agglomerated foreign matter. A resist solution supply apparatus has been proposed (see, for example, Patent Document 2). Also, a photoresist coating liquid supply apparatus is disclosed that incorporates a circulating filtration device that circulates the resist liquid in a storage container and filters it with a filter in order to prevent increase in the particles of the resist liquid (see, for example, Patent Document 3). .

特開2002−25887号公報JP 2002-25887 A 特開2011−44521号公報JP 2011-44521 A 国際公開第2006/057345号International Publication No. 2006/057345

フォトリソグラフィのエッチングに用いるレジスト液においては、通常、スピンコーティングによる塗布に適した温度(概ね室温)と長期間の保管に適した温度(冷温)との間に温度差がある。とりわけ、フォトマスクグランクのパターンエッチングなどに広く用いられる化学増幅型レジストは、室温の環境下に長時間置かれると感度が著しく変化する特性があり、温度管理の必要性が特に高い。実際、使用初期のレジスト液とある程度時間が経過したレジスト液とでは、それらの露光感度に差が生じることがある。これは、塗布工程が行われる室温環境下にレジスト液が置かれた累積時間の差によるものと考えられる。   In a resist solution used for photolithography etching, there is usually a temperature difference between a temperature suitable for application by spin coating (approximately room temperature) and a temperature suitable for long-term storage (cold temperature). In particular, a chemically amplified resist widely used for photomask ground pattern etching has a characteristic that sensitivity changes remarkably when placed in a room temperature environment for a long time, and the necessity of temperature management is particularly high. In fact, there may be a difference in the exposure sensitivity between the resist solution at the initial stage of use and the resist solution after a certain period of time. This is considered to be due to a difference in accumulated time in which the resist solution is placed in a room temperature environment where the coating process is performed.

レジスト液の感度変化ができるだけ生じないようにするために、塗布が行われない休止期間(例えばラインが稼動していない夜間や休日など)、保管に適した温度にレジスト液を冷却することが考えられる。しかし、温度の影響を受けやすい化学増幅型レジストにおいて、冷却時や保管時にレジスト液供給装置内で局所的な温度差があると感度にばらつきが生じる場合がある。このため、レジスト液の保管時にはレジスト液全体を均一に冷却させ、塗布作業時には塗布に適した室温に均一に戻す必要がある。従来の例えば上述したレジスト液供給装置では、ノズルの供給管付近に温調手段又は加熱手段が設けられているために、装置内のレジスト液の温度に局所的な差が生じるおそれがあった。   In order to prevent the sensitivity of the resist solution from changing as much as possible, it may be possible to cool the resist solution to a temperature suitable for storage during periods of non-coating (for example, nights or holidays when the line is not in operation). It is done. However, in a chemically amplified resist that is easily affected by temperature, if there is a local temperature difference in the resist solution supply apparatus during cooling or storage, sensitivity may vary. For this reason, it is necessary to uniformly cool the entire resist solution during storage of the resist solution and to return it to a room temperature suitable for coating during the coating operation. In the conventional resist solution supply apparatus described above, for example, temperature control means or heating means is provided in the vicinity of the supply pipe of the nozzle, so there is a possibility that a local difference occurs in the temperature of the resist solution in the apparatus.

本発明は、このような課題を解決するためになされたものであり、基板に塗布されるレジスト液の温度管理を均一に行う等して、レジスト液の感度変化又は品質劣化を可能な限り生じさせないようにする、レジスト液供給装置、レジスト液保管装置、レジスト塗布装置、又はレジスト液の温度管理方法を提供することを目的としている。また、本発明は、マスクブランクの製造方法を提供することも目的としている。   The present invention has been made to solve such a problem, and by performing uniform temperature control of the resist solution applied to the substrate, the sensitivity change or quality degradation of the resist solution is caused as much as possible. It is an object of the present invention to provide a resist solution supply device, a resist solution storage device, a resist coating device, or a temperature management method for a resist solution, which is not allowed to occur. Another object of the present invention is to provide a method for manufacturing a mask blank.

上述した課題を解決するため、本発明は、フォトリソグラフィに用いるレジスト液を貯留するためのレジストボトルと、充満される温調液で前記レジストボトルを浸漬させるための液槽と、前記液槽に設置され前記温調液を前記液槽に流入させる流入口、及び、前記温調液を前記液槽から流出させる流出口を有する温調液循環手段と、前記温調液循環手段により前記流入口から前記液槽へ流入させる前記温調液の温度を制御する温度制御手段と、前記レジストボトル内のレジスト液をレジスト塗布装置に供給するための供給手段と、を備えるレジスト液供給装置である。   In order to solve the problems described above, the present invention provides a resist bottle for storing a resist solution used for photolithography, a liquid tank for immersing the resist bottle in a temperature adjustment liquid to be filled, and the liquid tank. A temperature adjusting liquid circulation means having an inlet for introducing the temperature adjusting liquid into the liquid tank and an outlet for discharging the temperature adjusting liquid from the liquid tank; and the inlet by the temperature adjusting liquid circulating means. And a supply means for supplying the resist solution in the resist bottle to a resist coating apparatus.

このレジスト液供給装置によれば、レジストボトルを温調液に浸漬し温度管理を行う液槽が備えられている。液槽は、液槽は温調液の流入と流出を伴う循環式であり、温調水は液槽の外で温度制御されるため、液槽内の温調液は過熱過冷されにくい。液槽内の温調液は自然に攪拌され、液槽内で液体の温度分布が生じにくくなる。   According to this resist solution supply apparatus, a solution tank is provided that performs temperature management by immersing a resist bottle in a temperature adjusting solution. The liquid tank is a circulation type with inflow and outflow of the temperature adjustment liquid, and the temperature adjustment water is temperature-controlled outside the liquid tank, so that the temperature adjustment liquid in the liquid tank is not easily overheated and overcooled. The temperature adjustment liquid in the liquid tank is naturally stirred, and the temperature distribution of the liquid is less likely to occur in the liquid tank.

前記レジスト液供給装置は、前記温調液循環手段が前記温調液の流れを前記レジストボトルの外周に沿って周回させるように構成された周回手段を含むことが好ましい。温調液がレジストボトルを周回することで、レジストボトル内のレジスト液の液温調節を効率よく進行させる。   It is preferable that the resist solution supply device includes a circulation unit configured so that the temperature adjustment liquid circulation unit rotates the flow of the temperature adjustment solution along the outer periphery of the resist bottle. As the temperature adjusting solution circulates around the resist bottle, the liquid temperature adjustment of the resist solution in the resist bottle is efficiently advanced.

前記液槽の内壁が任意の水平断面において円をなしていると好ましい。液槽の水平断面が円形であれば、温調水が液槽内を周回しやすくなる。液槽の形状が平底又はU字底を有する円筒型であると特に好ましい。   It is preferable that the inner wall of the liquid tank forms a circle in an arbitrary horizontal cross section. If the horizontal cross section of the liquid tank is circular, the temperature-controlled water easily circulates in the liquid tank. The shape of the liquid tank is particularly preferably a cylindrical shape having a flat bottom or a U-shaped bottom.

前記流入口が前記液槽の内壁における一つの接線方向に向けて設けられ、かつ、前記流出口が前記一つの接線方向に対し前記温調液が周回する流線上において相対向する他の接線方向に向けて設けられると好ましい。   Other tangential directions opposite to each other on the streamline in which the temperature adjusting liquid circulates in the one tangential direction and the outlet is provided in one tangential direction on the inner wall of the liquid tank. It is preferable that it is provided toward.

この構成によれば、液槽の壁面に沿って温調水が流れるため、温調水を効率的に周回させる。   According to this structure, since temperature control water flows along the wall surface of a liquid tank, temperature control water is circulated efficiently.

前記レジスト液供給装置は、前記流入口が前記レジストボトルの上部側に設けられ、前記流出口が前記レジストボトルの下部側に設けられること、又は、前記流入口が前記レジストボトルの下部側に設けられ、前記流出口が前記レジストボトルの上部側に設けられることが好ましい。   In the resist solution supply apparatus, the inlet is provided on the upper side of the resist bottle and the outlet is provided on the lower side of the resist bottle, or the inlet is provided on the lower side of the resist bottle. The outlet is preferably provided on the upper side of the resist bottle.

流入口と流出口が近い位置にあると、流入口と流出口の付近で温調水の流れが完結してしまい、温調水が槽内全体に循環しなくなる。その結果、液槽内の温度の均一化が難くなる。また、流入口と流出口が上下の位置関係で設置されていると、温調液の流れが上から下又は下から上に流れるため、温調水が槽内によく循環し、液槽内で温度分布が生じにくくなる。   If the inlet and outlet are close to each other, the flow of temperature-controlled water is completed near the inlet and outlet, and the temperature-controlled water does not circulate throughout the tank. As a result, it becomes difficult to make the temperature in the liquid tank uniform. In addition, if the inlet and outlet are installed in a vertical relationship, the temperature adjustment liquid flows from top to bottom or from bottom to top. The temperature distribution is less likely to occur.

前記レジスト液供給装置は、前記温度制御手段で温度が制御された前記温調液を連続的に前記流入口から前記液槽に流入させることにより、前記レジストボトルに貯留されたレジスト液の温度を前記温調液の温度に変更及び/又は維持するものであることが好ましい。   The resist solution supply device continuously adjusts the temperature of the resist solution stored in the resist bottle by causing the temperature adjusting liquid whose temperature is controlled by the temperature control means to continuously flow into the liquid tank from the inlet. It is preferable to change and / or maintain the temperature of the temperature adjusting liquid.

温調水の温度が間欠制御の場合、温調水の過熱・過冷が生じることがある。それに伴いレジスト液が、昇温時に過熱したり、降温時に過冷したり、保温時には温度に揺らぎが生じたりする。この構成によれば、温調水の温度が連続的に管理されるため、レジスト液の昇温時の過熱、降温時の過冷、保温時の温度の揺らぎが抑制される。   When the temperature of the temperature control water is intermittent control, overheating and overcooling of the temperature control water may occur. As a result, the resist solution is overheated when the temperature is raised, overcooled when the temperature is lowered, or the temperature fluctuates when the temperature is kept. According to this configuration, since the temperature of the temperature-controlled water is continuously managed, overheating when the resist solution is heated, overcooling when the temperature is lowered, and temperature fluctuations when keeping the temperature are suppressed.

前記レジスト液供給装置は、前記温度制御手段により制御される前記温調液の温度範囲が、少なくとも、レジスト液の塗布に適合する第一の温度及びレジスト液の保管に適合する第二の温度を含むことが好ましい。   In the resist solution supply device, the temperature range of the temperature adjusting liquid controlled by the temperature control means is at least a first temperature suitable for application of the resist solution and a second temperature suitable for storage of the resist solution. It is preferable to include.

前記レジスト液供給装置は、前記レジストボトルの底部と前記液槽との間に前記温調液が流出入可能な間隙が設けられることが好ましい。この構成によれば、レジストボトルの底部と液槽の底部の間で温調液の流通が可能になるため、レジストボトル底部からもレジスト液の温度調節を行うことができる。   In the resist solution supply device, it is preferable that a gap through which the temperature adjusting solution can flow in and out is provided between a bottom portion of the resist bottle and the liquid tank. According to this configuration, since the temperature adjustment liquid can be distributed between the bottom of the resist bottle and the bottom of the liquid tank, the temperature of the resist liquid can also be adjusted from the bottom of the resist bottle.

前記レジスト液供給装置は、レジスト液を前記レジストボトル内で循環させるためのレジスト液循環手段を更に備えることが好ましい。レジスト液循環手段が備えられることにより、レジスト液の対流による温度分布が生じにくくなる。このため、レジストボトル内のレジストの品質を一定品質に保つことができる。   Preferably, the resist solution supply device further includes a resist solution circulating means for circulating the resist solution in the resist bottle. By providing the resist solution circulating means, temperature distribution due to convection of the resist solution is less likely to occur. For this reason, the quality of the resist in the resist bottle can be kept constant.

前記レジスト液供給装置は、前記供給手段の供給用のポンプが前記レジスト液循環手段の循環用のポンプを兼ねることが好ましい。この構成によれば、ポンプをレジスト液の温度が安定するまでは循環用に用い、レジスト液の温度が安定したところで供給用に切り替えることができる。供給用と循環用とで同一のポンプを使用することで、配管を簡素化することができる。   In the resist solution supply apparatus, it is preferable that a supply pump of the supply unit also serves as a circulation pump of the resist solution circulation unit. According to this configuration, the pump can be used for circulation until the temperature of the resist solution is stabilized, and can be switched to supply when the temperature of the resist solution is stabilized. By using the same pump for supply and circulation, piping can be simplified.

また、本発明は、前記レジスト液供給装置により供給されるレジスト液を基板表面に滴下させる滴下ノズルを備えるレジスト塗布装置である。   Moreover, this invention is a resist coating apparatus provided with the dripping nozzle which dripped the resist liquid supplied by the said resist liquid supply apparatus on the substrate surface.

また、本発明は、フォトリソグラフィに用いるレジスト液を貯留するレジストボトルと、充満される温調液で前記レジストボトルを浸漬させる液槽と、前記液槽に設置され前記温調液を前記液槽に流入させる流入口、及び、前記温調液を前記液槽から流出させる流出口を有する温調液循環手段と、前記温調液循環手段により前記流入口から前記液槽へ流入させる前記温調液の温度を制御する温度制御手段と、前記レジストボトル内のレジスト液をレジスト塗布装置に供給する供給手段と、を備えるレジスト液供給装置における、レジスト液の温度管理方法であって、前記供給手段によるレジスト液の供給に先立ち、前記温調液をレジスト液の塗布に適合する第一の温度に制御しながら前記液槽に流入させることで、前記レジストボトル内のレジスト液の温度を前記第一の温度に変更するステップと、前記供給手段によりレジスト液を供給する間に、前記第一の温度の温調液の流入を継続して、前記レジストボトル内のレジスト液の温度を前記第一の温度に維持するステップと、前記供給手段によるレジスト液の供給を終了した後に、前記温調液を前記第一の温度からレジスト液の保管に適合する第二の温度に制御しながら前記液槽に流入させることで、前記レジストボトル内のレジスト液の温度を前記第一の温度から前記第二の温度に変更するステップと、前記第二の温度の温調液の流入を継続して、前記レジストボトル内のレジスト液を前記第二の温度で保管するステップと、を含む、レジスト液の温度管理方法である。   The present invention also provides a resist bottle for storing a resist solution used for photolithography, a liquid tank for immersing the resist bottle in a temperature adjusting liquid to be filled, and the temperature adjusting liquid installed in the liquid tank. A temperature adjusting liquid circulating means having an inlet for flowing into the liquid tank, an outlet for discharging the temperature adjusting liquid from the liquid tank, and the temperature control for flowing into the liquid tank from the inlet by the temperature adjusting liquid circulating means. A resist solution temperature management method in a resist solution supply apparatus, comprising: temperature control means for controlling the temperature of the solution; and supply means for supplying the resist solution in the resist bottle to a resist coating apparatus, wherein the supply means Prior to the supply of the resist solution by the step, the temperature adjustment solution is allowed to flow into the solution tank while being controlled to a first temperature suitable for the application of the resist solution. A step of changing the temperature of the resist solution to the first temperature, and while the resist solution is supplied by the supply means, the flow of the temperature adjusting solution at the first temperature is continued, and the resist in the resist bottle is maintained. A step of maintaining the temperature of the solution at the first temperature, and after the supply of the resist solution by the supply means is finished, the temperature adjustment solution is changed from the first temperature to a second temperature suitable for storage of the resist solution. The temperature of the resist solution in the resist bottle is changed from the first temperature to the second temperature, and the temperature adjusting solution of the second temperature is Continuing the inflow, and storing the resist solution in the resist bottle at the second temperature.

また、本発明は、フォトリソグラフィに用いるレジスト液を貯留するためのレジストボトルと、充満される温調液で前記レジストボトルを浸漬させるための液槽と、前記液槽に設置され前記温調液を前記液槽に流入させる流入口、及び、前記温調液を前記液槽から流出させる流出口を有する温調液循環手段と、前記温調液循環手段により前記流入口から前記液槽へ流入させる前記温調液の温度を制御する温度制御手段と、を備えるレジスト液保管装置である。   The present invention also provides a resist bottle for storing a resist solution used for photolithography, a liquid tank for immersing the resist bottle in a temperature adjustment liquid to be filled, and the temperature adjustment liquid installed in the liquid tank. A temperature adjusting liquid circulating means having an inlet for flowing the liquid into the liquid tank, an outlet for discharging the temperature adjusting liquid from the liquid tank, and the temperature adjusting liquid circulating means flowing into the liquid tank from the inlet. And a temperature control means for controlling the temperature of the temperature adjusting liquid.

前記レジスト液保管装置は、前記温調液循環手段が、前記温調液の流れを前記レジストボトルの外周に沿って周回させるように構成された周回手段を含むことが好ましい。   It is preferable that the resist solution storage device includes a circulation unit configured such that the temperature adjustment solution circulation unit circulates the flow of the temperature adjustment solution along the outer periphery of the resist bottle.

前記レジスト液保管装置は、前記液槽の内壁が任意の水平断面において円をなし、前記レジストボトルが前記液槽内において縦に設置され、前記流入口が前記液槽の内周における一つの接線方向に向けて設けられ、かつ、前記流出口が前記一つの接線方向に対し前記温調液が周回する流線上において相対向する他の接線方向に向けて設けられることが好ましい。   In the resist solution storage device, the inner wall of the liquid tank forms a circle in an arbitrary horizontal cross section, the resist bottle is installed vertically in the liquid tank, and the inlet is one tangent in the inner periphery of the liquid tank It is preferable that the outlet is provided toward the other tangential direction opposite to each other on the streamline around which the temperature adjusting liquid circulates with respect to the one tangential direction.

前記レジスト液保管装置は、前記流入口が前記液槽内の上部側に設けられ、前記流出口が前記液槽内の下部側に設けられること、又は、前記流入口が前記液槽内の下部側に設けられ、前記流出口が前記液槽内の上部側に設けられることが好ましい。   In the resist solution storage device, the inlet is provided on the upper side in the liquid tank, and the outlet is provided on the lower side in the liquid tank, or the inlet is a lower part in the liquid tank. It is preferable that the outlet is provided on the upper side in the liquid tank.

前記レジスト液保管装置は、前記温度制御手段で温度が制御された前記温調液を連続的に前記流入口から前記液槽に流入させることにより、前記レジストボトルに貯留されたレジスト液の温度を前記温調液の温度に変更及び/又は維持するものであることが好ましい。   The resist solution storage device continuously adjusts the temperature of the resist solution stored in the resist bottle by flowing the temperature-controlled solution, the temperature of which is controlled by the temperature control unit, from the inlet to the liquid tank. It is preferable to change and / or maintain the temperature of the temperature adjusting liquid.

前記レジスト液保管装置は、前記温度制御手段により制御される前記温調液の温度範囲が、少なくとも、レジスト液の塗布に適合する第一の温度及びレジスト液の保管に適合する第二の温度を含むことが好ましい。   In the resist solution storage device, the temperature range of the temperature adjusting liquid controlled by the temperature control means is at least a first temperature suitable for application of the resist solution and a second temperature suitable for storage of the resist solution. It is preferable to include.

前記レジスト液保管装置は、前記レジストボトルの底部と前記液槽との間に前記温調液が流出入可能な間隙が設けられることが好ましい。   In the resist solution storage device, it is preferable that a gap through which the temperature adjusting solution can flow in and out is provided between a bottom portion of the resist bottle and the liquid tank.

前記レジスト液保管装置は、レジスト液を前記レジストボトル内で循環させるためのレジスト液循環手段を更に備えることが好ましい。   Preferably, the resist solution storage device further includes a resist solution circulating means for circulating the resist solution in the resist bottle.

また、本発明は、ガラス基板の一面に遮光膜を成膜する工程と、前記遮光膜を所定のマスクパターンにエッチングするためのレジスト液を前記遮光膜の表面に塗布して定着させる工程と、を含む、マスクブランクの製造方法であって、レジスト塗布装置を用いてレジスト液を前記遮光膜の表面に塗布する工程に先立ち、レジスト液が貯留されるレジストボトルを温調液が充満される液槽内に浸漬させ、前記温調液が前記レジストボトルの外周に沿って周回するように前記液槽内で循環させるステップと、前記液槽に流入させる前記温調液の温度をレジスト液の塗布に適合する温度に制御するステップと、前記温調液を連続的に前記液槽に流入させることにより、前記レジストボトルに貯留されたレジスト液の温度を前記塗布に適合する温度に変更及び/又は維持するステップと、前記塗布に適合する温度に変更及び/又は維持されたレジスト液を前記レジスト塗布装置に供給するステップと、を含む、マスクブランクの製造方法である。   Further, the present invention includes a step of forming a light shielding film on one surface of the glass substrate, a step of applying and fixing a resist solution for etching the light shielding film into a predetermined mask pattern on the surface of the light shielding film, A method for manufacturing a mask blank, comprising: a resist bottle that fills a resist bottle in which a resist solution is stored prior to a step of applying a resist solution to the surface of the light shielding film using a resist coating apparatus. The step of circulating in the liquid tank so that the temperature adjustment liquid circulates along the outer periphery of the resist bottle and the temperature of the temperature adjustment liquid flowing into the liquid tank are applied in a resist solution. The temperature of the resist solution stored in the resist bottle is adjusted to a temperature suitable for the application by continuously flowing the temperature adjusting liquid into the liquid tank. Comprising the steps of further and / or maintained, and a step of supplying the resist solution is changed and / or maintained at a temperature compatible with the coating on the resist coating apparatus, a method for producing a mask blank.

本発明に係るレジスト液供給装置によれば、レジストボトル内のレジスト液の全体を均一に、制御された温調液の温度に変更し及び/又は維持する。これにより、レジスト液の温度に局所的な差を生じさせないようにしながら、レジスト液を所望の温度に調整し管理することができる。したがって、レジスト液の感度変化又は品質劣化を抑制することができる。   According to the resist solution supply apparatus of the present invention, the entire resist solution in the resist bottle is uniformly changed to and / or maintained at the temperature of the controlled temperature adjusting solution. Thereby, it is possible to adjust and manage the resist solution at a desired temperature while preventing a local difference from occurring in the temperature of the resist solution. Therefore, it is possible to suppress the sensitivity change or quality deterioration of the resist solution.

また、本発明に係るレジスト塗布装置によれば、安定した感度品質のレジスト液をレジスト液供給装置から受けることができる。このため、一定の品質のレジスト液が塗布された対象基板を提供することができる。   Further, according to the resist coating apparatus according to the present invention, a resist solution having a stable sensitivity quality can be received from the resist solution supply device. For this reason, the target board | substrate with which the resist solution of fixed quality was apply | coated can be provided.

また、本発明に係るレジスト液の温度管理方法によれば、レジストボトル内のレジスト液温度を、塗布に適合する第一の温度及び保管に適合する第二の温度に亘り均一に調整して管理することができる。これにより、レジスト液を長期に保管する場合でも経時による感度変化又は品質劣化を最小限にすることができる。   Further, according to the temperature control method for a resist solution according to the present invention, the resist solution temperature in the resist bottle is uniformly adjusted and managed over a first temperature suitable for application and a second temperature suitable for storage. can do. As a result, even when the resist solution is stored for a long period of time, it is possible to minimize the sensitivity change or quality deterioration with time.

また、本発明に係るレジスト液保管装置によれば、レジスト液の温度に局所的な差を生じさせずに均一に冷却してレジスト液を保管することができる。これにより、レジスト液を長期に保管する場合でも、経時による感度変化又は品質劣化を最小限に抑えることができる。   In addition, according to the resist solution storage device of the present invention, the resist solution can be stored by uniformly cooling without causing a local difference in the temperature of the resist solution. As a result, even when the resist solution is stored for a long period of time, a change in sensitivity or deterioration of quality over time can be minimized.

また、本発明に係るマスクブランクの製造方法によれば、安定した感度品質のレジストが塗布されたマスクブランクを提供することができる。また、塗布されるレジストの感度が一定であるため、塗布後のベークの条件をバッチ処理の度に調整しなくて済み、マスクブランクの製造工程の簡素化にも貢献する。   Moreover, according to the manufacturing method of the mask blank which concerns on this invention, the mask blank by which the resist of the stable sensitivity quality was apply | coated can be provided. In addition, since the sensitivity of the resist to be applied is constant, it is not necessary to adjust the baking conditions after application every time batch processing is performed, which contributes to simplification of the mask blank manufacturing process.

図1は、本発明の一つの実施形態によるレジスト液供給装置及びレジスト塗布装置の構成を示す概略図である。FIG. 1 is a schematic view showing the configuration of a resist solution supply apparatus and a resist coating apparatus according to an embodiment of the present invention. 図2は、図1の実施形態によるレジスト液供給装置の内部を表した側面図であり、温調液の流れを説明するための図である。FIG. 2 is a side view showing the inside of the resist solution supply apparatus according to the embodiment of FIG. 1, and is a view for explaining the flow of the temperature adjusting solution. 図3は、一つの実施形態によるレジスト液供給装置の上蓋を取り除いた状態で液槽を上方から見た平面図である。FIG. 3 is a plan view of the liquid tank as viewed from above with the upper lid of the resist liquid supply apparatus according to one embodiment removed. 図4は、他の実施形態によるレジスト液供給装置の上蓋を取り除いた状態で液槽を上方から見た平面図である。FIG. 4 is a plan view of the liquid tank as viewed from above with the upper lid of the resist solution supply apparatus according to another embodiment removed. 図5は、レジスト液供給装置又はレジスト液保管装置において管理される、レジスト液の温度プロファイルを例示する図である。FIG. 5 is a diagram illustrating a temperature profile of the resist solution managed in the resist solution supply device or the resist solution storage device. 図6は、他の実施形態によるレジスト液供給装置又はレジスト液保管装置の内部を表した側面図である。FIG. 6 is a side view showing the inside of a resist solution supply device or a resist solution storage device according to another embodiment. 図7は、更に他の実施形態によるレジスト液供給装置又はレジスト液保管装置の内部を表した側面図である。FIG. 7 is a side view showing the inside of a resist solution supply device or a resist solution storage device according to still another embodiment. 図8は、更に他の実施形態によるレジスト液供給装置又はレジスト液保管装置の内部を表した側面図である。FIG. 8 is a side view showing the inside of a resist solution supply device or a resist solution storage device according to still another embodiment. 図9は、マスクブランクの製造工程を例示するフロー図である。FIG. 9 is a flow diagram illustrating a mask blank manufacturing process.

本明細書に記載する実施形態の主要な特徴を最初に整理する。
(特徴1)温調液は水(純水)である。
(特徴2)レジストボトル11は任意の水平断面において円筒状をなす容器である。
このような形状であれば、温調水はレジストボトルを周回しやすくなる。
(特徴3)液槽の側壁には液槽内にあるレジストボトルの様子を確認できる窓部が形成されている。これにより、レジスト液の残量などを視認することができる。
(特徴4)外部環境の熱的影響を抑制するために、液槽には断熱材が備えられている。断熱材が備えられていることにより、液槽の壁面を介した熱移動が生じにくくなる。
(特徴5)液槽にレジストボトルのネック部分を嵌合可能な上蓋が備えられている。液槽外への温調水の飛散を防止することができる。また、上蓋が備えられることにより、
上蓋にレジストボトルが固定可能ならばより好ましい。レジストボトルが蓋部で固定されることにより、レジスト液と温調水の密度差、又は、レジスト液の消費によるボトル内空間の増加によりレジストボトルに浮力が加わっても、レジストボトルの安定性は維持される。
The main features of the embodiments described herein are first summarized.
(Feature 1) The temperature adjustment liquid is water (pure water).
(Feature 2) The resist bottle 11 is a container having a cylindrical shape in an arbitrary horizontal section.
If it is such a shape, it will become easy for temperature control water to circulate a resist bottle.
(Characteristic 3) The side wall of the liquid tank is formed with a window portion through which the state of the resist bottle in the liquid tank can be confirmed. As a result, the remaining amount of the resist solution can be visually confirmed.
(Feature 4) In order to suppress the thermal influence of the external environment, the liquid tank is provided with a heat insulating material. By providing the heat insulating material, heat transfer through the wall surface of the liquid tank is less likely to occur.
(Feature 5) An upper lid capable of fitting the neck portion of the resist bottle into the liquid tank is provided. Spattering of temperature-controlled water outside the liquid tank can be prevented. Also, by providing an upper lid,
It is more preferable if the resist bottle can be fixed to the upper lid. By fixing the resist bottle with the lid, even if buoyancy is applied to the resist bottle due to the difference in density between the resist solution and the temperature-controlled water or the increase in the bottle space due to consumption of the resist solution, the stability of the resist bottle is Maintained.

[レジスト液供給装置及びレジスト塗布装置の実施形態]
以下、図面に従って、本発明に係るレジスト液供給装置及びレジスト塗布装置の実施形態を説明する。図1は、本発明の一つの実施形態による、レジスト液供給装置1及びレジスト塗布装置2の構成を示す概略図である。なお、図1において、レジスト液供給装置1の本体がその一部を破断した部分断面図により示され、流体制御系の構成が流体回路図により示される。また、レジスト塗布装置2は、スピンコータ3上に設置される例えばフォトマスクブランク等の対象基板Sの表面にレジスト液を滴下させる滴下ノズル20を備える。
[Embodiments of resist solution supply apparatus and resist coating apparatus]
Embodiments of a resist solution supply apparatus and a resist coating apparatus according to the present invention will be described below with reference to the drawings. FIG. 1 is a schematic diagram showing the configuration of a resist solution supply device 1 and a resist coating device 2 according to one embodiment of the present invention. In FIG. 1, the main body of the resist solution supply apparatus 1 is shown by a partial cross-sectional view in which a part thereof is broken, and the configuration of the fluid control system is shown by a fluid circuit diagram. Further, the resist coating apparatus 2 includes a dropping nozzle 20 that drops a resist solution onto the surface of the target substrate S such as a photomask blank installed on the spin coater 3.

レジスト液供給装置1は、液状のレジスト液を一定量貯留可能なレジストボトル11と、レジストボトル11を内部に格納可能であり、充満される温調液14でレジストボトル11を浸漬させる液槽12とを備える。レジストボトル11は、任意の水平断面において円筒状をなす容器である。レジストボトル11の外表面は、突起などの凹凸がない平坦であることが好ましいが、上下にかけて一様に同一径の円筒状である必要はない。例えば、図1に示されるように、レジストボトル11の上部に円錐状の肩部11aを有してもよい。   The resist solution supply apparatus 1 includes a resist bottle 11 that can store a predetermined amount of a liquid resist solution, and a liquid tank 12 that can store the resist bottle 11 therein and immerse the resist bottle 11 in a temperature adjusting solution 14 that is filled. With. The resist bottle 11 is a cylindrical container in an arbitrary horizontal cross section. The outer surface of the resist bottle 11 is preferably flat with no irregularities such as protrusions, but does not have to be cylindrical with the same diameter uniformly from the top to the bottom. For example, as shown in FIG. 1, the resist bottle 11 may have a conical shoulder 11 a at the top.

レジストボトル11を平坦で円筒状の容器とすることで、後述する周回手段60によりレジストボトル11の周りを周回する温調液14の流れを促進し、かつ、その流れが速すぎて気泡が発生する状態にならないようにすることができる。これにより温調液14を介したレジストボトル11内のレジスト液の温度調整を効率的に行うことができる。   By making the resist bottle 11 a flat and cylindrical container, the circulation means 60 described later promotes the flow of the temperature adjusting liquid 14 that circulates around the resist bottle 11, and the flow is too fast to generate bubbles. It is possible to prevent the situation from occurring. Thereby, the temperature adjustment of the resist solution in the resist bottle 11 through the temperature adjusting solution 14 can be performed efficiently.

液槽12の内部空間を画している内壁は円筒状(任意の水平断面が円)となっており、その内部空間にレジストボトル11が格納される。液槽12の内壁の直径はレジストボトル11の直径よりも若干大きく、液槽12の内壁とレジストボトル11との間に温調液14が浸入するための所定幅の間隙が形成される。また、液槽12の壁内部には断熱材15が埋設されている。なお、液槽12の内壁面の全体に亘り断熱材15が貼付けられる構成でもよい。液槽12の内壁を円筒状とすることにより、設置されるレジストボトル11が仮に円筒状でない場合でも、温調液14の周回する流れを形成し又は促進することができる。なお、図示はしないが、液槽12の一部にレジストボトル11内のレジスト液の液量を目視計測するための窓部(例えば紫外線非透過型の透明窓)を設けてもよい。   The inner wall that defines the internal space of the liquid tank 12 has a cylindrical shape (an arbitrary horizontal cross section is a circle), and the resist bottle 11 is stored in the internal space. The diameter of the inner wall of the liquid tank 12 is slightly larger than the diameter of the resist bottle 11, and a gap with a predetermined width is formed between the inner wall of the liquid tank 12 and the resist bottle 11 for allowing the temperature adjusting liquid 14 to enter. A heat insulating material 15 is embedded in the wall of the liquid tank 12. In addition, the structure by which the heat insulating material 15 is affixed over the whole inner wall surface of the liquid tank 12 may be sufficient. By making the inner wall of the liquid tank 12 into a cylindrical shape, even when the resist bottle 11 to be installed is not cylindrical, the flow of the temperature adjusting liquid 14 can be formed or promoted. Although not shown, a window portion (for example, an ultraviolet non-transmissive transparent window) for visually measuring the amount of the resist solution in the resist bottle 11 may be provided in a part of the liquid tank 12.

液槽12は、温調液14が一定の高さまで充満できるように液密性を有して形成される。また、液槽12にはレジストボトル11のネック部分をはめ込み可能な上蓋18が備えられており、温調水14の飛散が防止されている。温調液14としては純水を使用することができるが、液量の安定化を目的として例えばエチレングリコールなどの蒸発抑制剤を純水に添加した水液でもよい。   The liquid tank 12 is formed with liquid tightness so that the temperature adjustment liquid 14 can be filled to a certain height. Further, the liquid tank 12 is provided with an upper lid 18 capable of fitting the neck portion of the resist bottle 11 so that the temperature control water 14 is prevented from being scattered. Although pure water can be used as the temperature control liquid 14, for example, an aqueous liquid in which an evaporation inhibitor such as ethylene glycol is added to pure water for the purpose of stabilizing the liquid amount may be used.

温調液14は、予め給水ライン16を介して液槽12内に供給される。また、液槽12に充満された温調液14は、排水ライン17を介して排水可能でもある。液槽12には、架台13上の所定位置に設置されたレジストボトル11のレジスト液のレベルよりも高い水位に温調液14が充満され、これによってレジストボトル11が温調液14で浸漬される。なお、液槽12内に断熱材15が介在することによって、レジストボトル11及び温調液14共に、液槽12の外部の環境とは熱的に遮断される。   The temperature adjusting liquid 14 is supplied into the liquid tank 12 through the water supply line 16 in advance. Further, the temperature adjusting liquid 14 filled in the liquid tank 12 can be drained via the drain line 17. The liquid tank 12 is filled with the temperature adjustment liquid 14 at a level higher than the level of the resist liquid in the resist bottle 11 installed at a predetermined position on the gantry 13, whereby the resist bottle 11 is immersed in the temperature adjustment liquid 14. The Note that the heat insulating material 15 is interposed in the liquid tank 12, so that both the resist bottle 11 and the temperature adjusting liquid 14 are thermally blocked from the environment outside the liquid tank 12.

レジストボトル11は、図1に示されるように、液槽12内の底部に設けた架台13の上に縦に載置される。すなわち空となったレジストボトル11を容易に交換できるように、レジストボトル11が架台13に対して着脱可能に設置される。架台13の周囲には、レジストボトル11の底部を所定位置に安定的に支持するホルダガイド部13aが形成されてもよい。レジストボトル11の底部と液槽12との間には、架台13の脚部を介して温調液14が流出入可能な間隙が形成される。   As shown in FIG. 1, the resist bottle 11 is placed vertically on a gantry 13 provided at the bottom of the liquid tank 12. That is, the resist bottle 11 is detachably installed on the gantry 13 so that the resist bottle 11 that has become empty can be easily replaced. A holder guide portion 13 a that stably supports the bottom portion of the resist bottle 11 at a predetermined position may be formed around the gantry 13. A gap is formed between the bottom of the resist bottle 11 and the liquid tank 12 through which the temperature adjusting liquid 14 can flow in and out via the legs of the gantry 13.

レジストボトル11の底部と液槽12との間に間隙が形成されることで、レジストボトル11の底部にも温調液14が接触してレジスト液の温度調整が更に均一かつ効率的になる。   By forming a gap between the bottom of the resist bottle 11 and the liquid tank 12, the temperature adjustment liquid 14 comes into contact with the bottom of the resist bottle 11, and the temperature adjustment of the resist liquid becomes more uniform and efficient.

レジスト液供給装置1は、レジストボトル11内のレジスト液をレジスト塗布装置2に供給するためのレジスト液供給手段30を備える。レジスト液供給手段30は、少なくとも、レジスト液供給用のポンプ31と、レジストボトル11及びポンプ31の吸入側との間に接続され、ポンプ31が発生する負圧によりレジストボトル11内のレジスト液を吸い上げる排出管32と、ポンプ31の吐出側に接続されポンプ31から吐出されるレジスト液をレジスト塗布装置2(滴下ノズル20)に供給する供給管33とを有している。   The resist solution supply device 1 includes a resist solution supply means 30 for supplying the resist solution in the resist bottle 11 to the resist coating device 2. The resist solution supply means 30 is connected at least between the resist solution supply pump 31 and the resist bottle 11 and the suction side of the pump 31, and removes the resist solution in the resist bottle 11 by the negative pressure generated by the pump 31. It has a discharge pipe 32 to be sucked up, and a supply pipe 33 that is connected to the discharge side of the pump 31 and supplies the resist solution discharged from the pump 31 to the resist coating apparatus 2 (dropping nozzle 20).

ポンプ31は、レジスト液の吐出流量が一定であり、かつ、キャビテーション(気泡)の発生が極めて少ないロータリポンプであることが好ましい。また、レジスト液に含まれ得るパーティクル又はゲル化成分などを濾過して取り除くためのフィルタ34を、図1に示されるようにポンプ31の吐出側配管に設けてもよい。なお、図示はしないが、このようなフィルタをポンプ31の吸入側配管に設けてもよい。また、後述するレジスト液循環手段70によりレジスト液を循環させる管路の途中にこのようなフィルタを設けてもよい。   The pump 31 is preferably a rotary pump in which the resist solution discharge flow rate is constant and the occurrence of cavitation (bubbles) is extremely small. Further, a filter 34 for filtering and removing particles or gelled components that may be contained in the resist solution may be provided in the discharge side piping of the pump 31 as shown in FIG. Although not shown, such a filter may be provided in the suction side piping of the pump 31. Further, such a filter may be provided in the middle of a conduit through which the resist solution is circulated by the resist solution circulating means 70 described later.

また、液槽12には、温調液14を流入させる流入口41と、温調液14を流出させる流出口42とを有する温調液循環手段40を備える。図1に示される例では、温調液14の流入口41がレジストボトル11の上部側に設けられ、流出口42がレジストボトル11の下部側に設けられる。また、流入口41をレジストボトル11の下部側に設け、流出口42をレジストボトル11の上部側に設ける構成でもよい。更に、方向切換弁43を備えその弁の位置を制御することにより、流入口41及び流出口42の上下の位置を切り換えるようにしてもよい。例えば、レジストボトル11内のレジスト液の温度よりも低い冷温に制御された温調液14を液槽12に流入させる場合には(冷却/保管時)、レジストボトル11の上部側から下部側への流れが形成されるようにし、他方、冷却されたレジスト液の温度よりも高い例えば室温程度の温調液14を液槽12に流入させる場合には(昇温/塗布時)、レジストボトル11の下部側から上部側への流れが形成されるように流入口41及び流出口42の位置を切り換えてもよい。   Further, the liquid tank 12 is provided with a temperature adjustment liquid circulation means 40 having an inlet 41 through which the temperature adjustment liquid 14 flows in and an outlet 42 through which the temperature adjustment liquid 14 flows out. In the example shown in FIG. 1, the inlet 41 of the temperature adjustment liquid 14 is provided on the upper side of the resist bottle 11, and the outlet 42 is provided on the lower side of the resist bottle 11. Alternatively, the inlet 41 may be provided on the lower side of the resist bottle 11 and the outlet 42 may be provided on the upper side of the resist bottle 11. Furthermore, you may make it switch the vertical position of the inflow port 41 and the outflow port 42 by providing the direction switching valve 43 and controlling the position of the valve. For example, when the temperature adjusting liquid 14 controlled to a cold temperature lower than the temperature of the resist solution in the resist bottle 11 is allowed to flow into the liquid tank 12 (at the time of cooling / storage), the upper side of the resist bottle 11 is moved to the lower side. On the other hand, when the temperature adjustment liquid 14 having a temperature higher than the temperature of the cooled resist solution, for example, about room temperature is caused to flow into the liquid tank 12 (at the time of temperature increase / application), the resist bottle 11 The positions of the inlet 41 and the outlet 42 may be switched so that a flow from the lower side to the upper side is formed.

このように、流入口41及び流出口42を上下に離間した位置に設けることにより、温調液14とレジスト液との温度差による対流効果を利用した、温調液14の上下方向の効率的な流れを形成することができる。   As described above, by providing the inlet 41 and the outlet 42 at positions spaced apart from each other in the vertical direction, the temperature adjustment liquid 14 can be efficiently moved in the vertical direction using the convection effect due to the temperature difference between the temperature adjustment liquid 14 and the resist liquid. A smooth flow can be formed.

温調液循環手段40は、液槽12内における温調液14の上下方向の流れとともに、レジストボトル11の外周に沿って温調液14を周回させるように構成された周回手段60を含む。図2は、液槽12内で温調液14に浸漬された状態におけるレジストボトル11を示す側面図であり、周回手段60による温調液14の流れの向きを矢印として示す流線Fが付記されている。このような周回手段60は、温調液14を液槽12に流入させる流入口41がレジストボトル11の外周における一つの接線方向に向けて設けられ、かつ、温調液14を液槽12から流出させる流出口42が前記一つの接線方向に対し温調液14が周回する流線上において相対向する他の接線方向に向けて設けられた構成とすることができる。   The temperature adjustment liquid circulation means 40 includes a circulation means 60 configured to circulate the temperature adjustment liquid 14 along the outer periphery of the resist bottle 11 along with the vertical flow of the temperature adjustment liquid 14 in the liquid tank 12. FIG. 2 is a side view showing the resist bottle 11 immersed in the temperature adjusting liquid 14 in the liquid tank 12, and a streamline F indicating the flow direction of the temperature adjusting liquid 14 by the circulating means 60 as an arrow is appended. Has been. In such a circulating means 60, the inlet 41 for allowing the temperature adjustment liquid 14 to flow into the liquid tank 12 is provided in one tangential direction on the outer periphery of the resist bottle 11, and the temperature adjustment liquid 14 is removed from the liquid tank 12. The outlet 42 to be discharged may be provided in the other tangential direction opposite to each other on the streamline around which the temperature adjusting liquid 14 circulates in the one tangential direction.

図3は、上蓋18を取り除いた状態で液槽12を上方から見た平面図である。図3の実施形態の周回手段60では、流入口41と流出口42とがレジストボトル11を中心に互いに180度の角度をなし、レジストボトル11の外周に沿う流線上において流入口41及び流出口42の各開口部が互いに対向している。また、図4は、別の実施形態による液槽12を上方から見た平面図である。図4の実施形態の周回手段60では、流入口41と流出口42とが背中合わせに近接して配置されているが、レジストボトル11の外周に沿う流線上においては各開口部が対向している。これらの例で示されるように、流入口41及び流出口42は、レジストボトル11の外周に沿う接線方向に開口部が向けられ、かつ、レジストボトル11を周回する流線上において各開口部が互いに対向していればよく(より厳密には、流入口41及び流出口42の上下の位置が異なるため、図3及び図4の平面図で示されるように一つの仮想水平面に各開口部を投影した場合において対向していればよい)、レジストボトル11を中心とする流入口41及び流出口42との間の相対的な角度は任意でよい。   FIG. 3 is a plan view of the liquid tank 12 as viewed from above with the upper lid 18 removed. In the circulation means 60 of the embodiment of FIG. 3, the inlet 41 and the outlet 42 form an angle of 180 degrees with respect to the resist bottle 11, and the inlet 41 and the outlet on the streamline along the outer periphery of the resist bottle 11. Each opening part of 42 has mutually opposed. FIG. 4 is a plan view of the liquid tank 12 as viewed from above according to another embodiment. In the circulation means 60 of the embodiment of FIG. 4, the inlet 41 and the outlet 42 are arranged in close proximity to each other, but the openings face each other on the streamline along the outer periphery of the resist bottle 11. . As shown in these examples, the inflow port 41 and the outflow port 42 have openings directed in a tangential direction along the outer periphery of the resist bottle 11, and the openings are mutually on the streamline that circulates the resist bottle 11. (Strictly speaking, since the vertical positions of the inlet 41 and the outlet 42 are different, each opening is projected onto one virtual horizontal plane as shown in the plan views of FIGS. 3 and 4.) In this case, the relative angle between the inlet 41 and the outlet 42 around the resist bottle 11 may be arbitrary.

このように、温調液14の流入口41及び流出口42をレジストボトル11の外周に沿う流線上において互いに対向する位置にそれぞれ配置したことで、レジストボトル11の周りの温調液14の周回する流れを形成し又は促進することができる。   In this way, by arranging the inlet 41 and the outlet 42 of the temperature adjustment liquid 14 at positions facing each other on the streamline along the outer periphery of the resist bottle 11, the circulation of the temperature adjustment liquid 14 around the resist bottle 11 is performed. Can be created or promoted.

図1に戻り、温調液循環手段40は、上述した方向切換弁43と、可変流量ポンプ45とを更に備える。可変流量ポンプ45の吐出ポートは正圧配管46を介して方向切換弁43の第一の一次ポートに接続され、可変流量ポンプ45の吸入ポートは負圧配管47を介して方向切換弁43の第二の一次ポートに接続される。また、流入口41に連結する流入配管44が方向切換弁43の第一の二次ポートに接続され、流出口42に連結する流出配管49が方向切換弁43の第二の二次ポートに接続される。図1に示されるように、可変流量ポンプ45の吐出側にリリーフ弁91を設け、可変流量ポンプ45が過負荷状態のときに高圧の温調液14をドレインタンク92へ逃がすような保護回路を設けてもよい。   Returning to FIG. 1, the temperature adjustment liquid circulation means 40 further includes the direction switching valve 43 and the variable flow pump 45 described above. The discharge port of the variable flow pump 45 is connected to the first primary port of the direction switching valve 43 through the positive pressure pipe 46, and the suction port of the variable flow pump 45 is connected to the first port of the direction switching valve 43 through the negative pressure pipe 47. Connected to the second primary port. An inflow pipe 44 connected to the inflow port 41 is connected to the first secondary port of the direction switching valve 43, and an outflow pipe 49 connected to the outflow port 42 is connected to the second secondary port of the direction switching valve 43. Is done. As shown in FIG. 1, a relief valve 91 is provided on the discharge side of the variable flow pump 45, and a protection circuit for allowing the high-pressure temperature adjusting liquid 14 to escape to the drain tank 92 when the variable flow pump 45 is overloaded. It may be provided.

正圧配管46の途中には熱交換器51を含む温度制御手段50が設けられる。負圧配管47には温度センサ48が設けられる。液槽12から流出された温調液14の温度が温度センサ48により測定され、その結果が温度制御手段50に入力される。温度制御手段50は、液槽12からの温調液14の温度が目標温度となるように熱交換器51による熱交換率を制御する。このようなフィードバック温度制御により、液槽12へ流入する温調液14の温度が制御される。   A temperature control means 50 including a heat exchanger 51 is provided in the middle of the positive pressure pipe 46. A temperature sensor 48 is provided in the negative pressure pipe 47. The temperature of the temperature adjustment liquid 14 flowing out from the liquid tank 12 is measured by the temperature sensor 48, and the result is input to the temperature control means 50. The temperature control means 50 controls the heat exchange rate by the heat exchanger 51 so that the temperature of the temperature adjusting liquid 14 from the liquid tank 12 becomes the target temperature. By such feedback temperature control, the temperature of the temperature adjusting liquid 14 flowing into the liquid tank 12 is controlled.

なお、正圧配管46に温度センサを設け、液槽12へ流入する温調液14の温度が目標温度となるように熱交換器51を制御するような、いわゆるフィードフォワード制御により温調液14の温度を制御してもよい。また、正圧配管46及び負圧配管47を流れる温調液14の温度差に応じて可変流量ポンプ45の流量を制御してもよい。例えば行きと戻りの温度差が大きいときには可変流量ポンプ45の吐出流量を最大にし、温度差が小さいときには吐出流量を制限することで、温調液14の温度制御の効率を向上させることができる。   In addition, a temperature sensor is provided in the positive pressure pipe 46, and the temperature adjustment liquid 14 is controlled by so-called feedforward control in which the heat exchanger 51 is controlled so that the temperature of the temperature adjustment liquid 14 flowing into the liquid tank 12 becomes a target temperature. The temperature may be controlled. Further, the flow rate of the variable flow pump 45 may be controlled according to the temperature difference of the temperature adjusting liquid 14 flowing through the positive pressure pipe 46 and the negative pressure pipe 47. For example, when the temperature difference between the return and return is large, the discharge flow rate of the variable flow pump 45 is maximized, and when the temperature difference is small, the discharge flow rate is limited, thereby improving the temperature control efficiency of the temperature adjusting liquid 14.

温度制御手段50は、レジスト液の塗布に適した第一の温度(例えば23℃の室温)からレジスト液の保管に適した第二の温度(例えば10℃の冷温)にレジストボトル11内のレジスト液の温度を下降させる場合(冷却/保管時)には、前記第二の温度に目標温度を設定して温調液14の温度を制御する。このとき、温調液14がレジストボトル11の上部側から下部側への流れるように方向切換弁43の弁位置を切り換えてもよい。   The temperature control means 50 adjusts the resist in the resist bottle 11 from a first temperature suitable for application of the resist solution (for example, room temperature of 23 ° C.) to a second temperature suitable for storage of the resist solution (for example, cold temperature of 10 ° C.). When the temperature of the liquid is lowered (during cooling / storage), the target temperature is set to the second temperature to control the temperature of the temperature adjustment liquid 14. At this time, the valve position of the direction switching valve 43 may be switched so that the temperature adjustment liquid 14 flows from the upper side to the lower side of the resist bottle 11.

温度制御手段50で前記第二の温度に制御された温調液14は、連続的に流入口41から液槽12内に流入する。あらかじめ温度制御された温調液14が流入するため、レジストボトル内の温調液14の温度が下がり過ぎたりする現象が生じない。これにより、レジストボトル11に貯留されたレジスト液の温度を保管に適した例えば10℃に全体的に均一に変更し、そしてその温度を維持してレジスト液を保管することができる。   The temperature adjusting liquid 14 controlled to the second temperature by the temperature control means 50 continuously flows into the liquid tank 12 from the inlet 41. Since the temperature-controlled liquid 14 whose temperature is controlled in advance flows in, a phenomenon that the temperature of the temperature-controlled liquid 14 in the resist bottle is excessively lowered does not occur. Accordingly, the temperature of the resist solution stored in the resist bottle 11 can be uniformly changed to, for example, 10 ° C. suitable for storage as a whole, and the resist solution can be stored while maintaining the temperature.

また、温度制御手段50は、前記第二の温度から前記第一の温度(塗布時温度)にレジスト液の温度を上昇させる場合(昇温)には、前記第一の温度に目標温度を設定して温調液14の温度を制御する。このとき、温調液14がレジストボトル11の下部側から上部側への流れるように方向切換弁43の弁位置を切り換えてもよい。   Further, when the temperature of the resist solution is increased from the second temperature to the first temperature (application temperature) (temperature increase), the temperature control unit 50 sets the target temperature to the first temperature. Thus, the temperature of the temperature adjustment liquid 14 is controlled. At this time, the valve position of the direction switching valve 43 may be switched so that the temperature adjustment liquid 14 flows from the lower side to the upper side of the resist bottle 11.

温度制御手段50で前記第一の温度に制御された温調液14は、連続的に流入口41から液槽12内に流入する。あらかじめ温度制御された温調液14が流入するため、レジストボトル内の温調液14の温度が過熱する現象が生じない。これにより、レジストボトル11に貯留されたレジスト液の温度を塗布に適した例えば23℃に全体的に均一に変更し、そして塗布作業の間その温度を維持することができる。   The temperature adjusting liquid 14 controlled to the first temperature by the temperature control means 50 continuously flows into the liquid tank 12 from the inlet 41. Since the temperature control liquid 14 whose temperature is controlled in advance flows in, the temperature of the temperature control liquid 14 in the resist bottle does not overheat. As a result, the temperature of the resist solution stored in the resist bottle 11 can be uniformly changed to, for example, 23 ° C. suitable for application as a whole, and the temperature can be maintained during the application operation.

レジスト液供給装置1は、レジスト液をレジストボトル11内で循環させるためのレジスト液循環手段70を更に備えてもよい。図1において、レジスト液循環手段70は、ポンプ31と、ポンプ31の吸入ポートに接続しレジストボトル11に吸込口側が挿入された排出管32と、ポンプ31の吐出ポートに接続した供給管33から三方弁35を介して分岐し、レジストボトル11に注入口側が挿入された戻り管36とを備えて構成される。レジスト液を循環させるポンプ31は、上述した滴下ノズル20への供給用のポンプが兼用される。   The resist solution supply apparatus 1 may further include a resist solution circulating means 70 for circulating the resist solution in the resist bottle 11. In FIG. 1, the resist solution circulation means 70 includes a pump 31, a discharge pipe 32 connected to the suction port of the pump 31 and having the suction port inserted into the resist bottle 11, and a supply pipe 33 connected to the discharge port of the pump 31. A return pipe 36 branched from the three-way valve 35 and having the inlet side inserted into the resist bottle 11 is provided. The pump 31 for circulating the resist solution is also used as the pump for supplying the dropping nozzle 20 described above.

すなわち、レジスト液循環手段70は、三方弁35の連通が戻り管36側へ切り換えられることで機能する。レジスト塗布装置2にレジスト液を供給するときには、三方弁35の連通が供給管33側へ切り換えられる。三方弁35を電磁弁で構成し、このようなレジスト液の供給/循環の動作モードの切り換えをプログラミングにより自動制御してもよい。また、手動操作型の三方弁35を用いて、そのような切り換えを随時手動で行うようにしてもよい。   That is, the resist solution circulating means 70 functions by switching the communication of the three-way valve 35 to the return pipe 36 side. When supplying the resist solution to the resist coating apparatus 2, the communication of the three-way valve 35 is switched to the supply pipe 33 side. The three-way valve 35 may be constituted by an electromagnetic valve, and the switching of the resist solution supply / circulation operation mode may be automatically controlled by programming. Further, such switching may be manually performed as needed using a manually operated three-way valve 35.

かかるレジスト液循環手段70によるレジスト液の循環を、上述した温度制御手段50によりレジスト液の温度を変更するときや保管時に連続して行うことが好ましい。これにより、レジスト液に局所的な温度差を殆ど生じさせないようにすることができ、更に均一な温度管理を可能にする。   It is preferable that the resist solution is circulated by the resist solution circulation means 70 continuously when the temperature of the resist solution is changed or stored by the temperature control means 50 described above. Thereby, a local temperature difference can be hardly generated in the resist solution, and more uniform temperature management is possible.

また、レジスト液を排出する排出管32及びレジスト液を注入する戻り管36、又は、排出管32若しくは戻り管36の何れか一方の配管にフィルタを設けてもよい。また、塗布が行われない休止期間に冷温(第二の温度)を維持しながらレジスト液を循環させることが好ましい。冷温により粘度が高い状態のレジスト液をフィルタで濾過することで、レジスト液に含まれるゲル化成分の捕捉効率を向上させることができる。   Further, a filter may be provided in either the discharge pipe 32 for discharging the resist solution and the return pipe 36 for injecting the resist solution, or either the discharge pipe 32 or the return pipe 36. In addition, it is preferable to circulate the resist solution while maintaining the cold temperature (second temperature) during a rest period in which application is not performed. By filtering the resist solution having a high viscosity with a filter by a cold temperature, it is possible to improve the trapping efficiency of the gelled component contained in the resist solution.

(レジスト液の保管及び温度管理の動作)
上述した構成のレジスト液供給装置1によるレジスト液の保管及び温度の管理は、例えば次のようにして行われる。
(Resist solution storage and temperature control operations)
The resist solution is stored and the temperature is controlled by the resist solution supply apparatus 1 having the above-described configuration, for example, as follows.

まず、レジスト液供給装置1における液槽12内の架台13には、レジスト液を貯留したレジストボトル11が縦に設置される。そして、液槽12の上部開口部が上蓋18で塞がれ、例えばエチレングリコールなどの蒸発抑制剤を純水に添加した温調液14が給水ライン16を介して液槽12内に供給される。液槽12には、レジストボトル11内のレジスト液のレベルよりも高い水位に温調液14が充満され、これによってレジストボトル11が温調液14で浸漬される。   First, a resist bottle 11 storing a resist solution is installed vertically on a gantry 13 in a liquid tank 12 in the resist solution supply apparatus 1. Then, the upper opening of the liquid tank 12 is closed by the upper lid 18, and for example, a temperature adjustment liquid 14 in which an evaporation inhibitor such as ethylene glycol is added to pure water is supplied into the liquid tank 12 through the water supply line 16. . The liquid tank 12 is filled with the temperature adjustment liquid 14 at a water level higher than the level of the resist liquid in the resist bottle 11, whereby the resist bottle 11 is immersed in the temperature adjustment liquid 14.

レジスト液供給装置1の温調液循環手段40は、可変流量ポンプ45を駆動させて、流入口41を介して温調液14を所定の流量で液槽12に流入させ、流出口42を介して同一流量の温調液14を流出させることで、液槽12の水位を一定に維持しながら温調液14を循環させる。これにより、液槽12内では、温調液14がレジストボトル11の周りを周回しながら上部側から下部側へ、又は、下部側から上部側へ向けて連続的に流れることとなる。   The temperature adjustment liquid circulation means 40 of the resist liquid supply apparatus 1 drives the variable flow rate pump 45 to allow the temperature adjustment liquid 14 to flow into the liquid tank 12 at a predetermined flow rate via the inlet 41 and via the outlet 42. By flowing out the temperature control liquid 14 at the same flow rate, the temperature control liquid 14 is circulated while maintaining the water level in the liquid tank 12 constant. Thereby, in the liquid tank 12, the temperature adjusting liquid 14 flows continuously from the upper side to the lower side or from the lower side to the upper side while circling around the resist bottle 11.

同時に温度制御手段50は、液槽12から戻される温調液14の温度が目標温度となるように熱交換器51の交換熱量を制御して、液槽12へ流入させる温調液14の温度を目標温度に制御する。   At the same time, the temperature control means 50 controls the exchange heat amount of the heat exchanger 51 so that the temperature of the temperature adjustment liquid 14 returned from the liquid tank 12 becomes the target temperature, and the temperature of the temperature adjustment liquid 14 that flows into the liquid tank 12. To the target temperature.

ここで、図5は、レジスト液供給装置1又はレジスト液保管装置において管理される、レジスト液の温度プロファイルを例示する図である。図5の実施形態の温度プロファイルは、レジスト液の温度調整管理に関して少なくとも4つの特徴的な過程I〜IVを有している。   Here, FIG. 5 is a diagram illustrating a temperature profile of the resist solution managed in the resist solution supply apparatus 1 or the resist solution storage apparatus. The temperature profile of the embodiment of FIG. 5 has at least four characteristic processes I to IV regarding the temperature adjustment management of the resist solution.

(第一の過程I)
第一の過程Iは、レジスト液の塗布に先立ち、レジスト液の塗布に適した第一の温度(例えば23℃の室温)にレジスト液の温度を昇温させるまでの過程である。図5に示される第一の過程Iでは、温度制御手段50が前記第一の温度に温調液14の温度を制御し、その第一の温度の温調液14を液槽12に連続的に供給して循環させることで、レジストボトル11内のレジスト液をレジスト液の保管に適した第二の温度(例えば10℃の冷温)から前記第一の温度に昇温させる。
(First process I)
The first process I is a process until the temperature of the resist solution is raised to a first temperature suitable for the application of the resist solution (for example, room temperature of 23 ° C.) prior to the application of the resist solution. In the first process I shown in FIG. 5, the temperature control means 50 controls the temperature of the temperature adjustment liquid 14 to the first temperature, and the temperature adjustment liquid 14 at the first temperature is continuously supplied to the liquid tank 12. The resist solution in the resist bottle 11 is heated from the second temperature suitable for storage of the resist solution (for example, a cold temperature of 10 ° C.) to the first temperature.

(第二の過程II)
第二の過程IIは、レジスト液をレジスト塗布装置2へ供給する稼動期間において、レジスト液の塗布に適した前記第一の温度(室温)にレジスト液の温度を維持する過程である。図5に示される第二の過程IIでは、温度制御手段50が前記第一の温度に温調液14の温度を制御しながら液槽12に温調液14を連続的に継続して循環させることで、レジストボトル11内のレジスト液の温度を前記第一の温度に維持する。この第二の過程IIの期間は、レジスト液供給装置1及びレジスト塗布装置2の稼動期間に概ね一致し、その間、塗布のバッチ処理が複数回、断続的に行われることが想定される。
(Second process II)
The second process II is a process of maintaining the temperature of the resist solution at the first temperature (room temperature) suitable for the application of the resist solution during the operation period in which the resist solution is supplied to the resist coating apparatus 2. In the second process II shown in FIG. 5, the temperature control means 50 continuously circulates the temperature adjusting liquid 14 in the liquid tank 12 while controlling the temperature of the temperature adjusting liquid 14 to the first temperature. As a result, the temperature of the resist solution in the resist bottle 11 is maintained at the first temperature. The period of the second process II substantially coincides with the operation period of the resist solution supply apparatus 1 and the resist coating apparatus 2, and it is assumed that the batch process of coating is intermittently performed a plurality of times during that period.

(第三の過程III)
第三の過程IIIは、最後の塗布のバッチ処理が終了した後に、レジスト液の保管に適した前記第二の温度(冷温)にレジスト液の温度を冷却する過程である。この第三の過程IIIでは、温度制御手段50が前記第二の温度に温調液14の温度を制御し、その第二の温度の温調液14を液槽12に連続的に供給して循環させることで、レジストボトル11内のレジスト液を前記第一の温度から前記第二の温度に冷却させる。
(Third process III)
The third step III is a step of cooling the temperature of the resist solution to the second temperature (cold temperature) suitable for storing the resist solution after the final coating batch processing is completed. In the third process III, the temperature control means 50 controls the temperature of the temperature adjustment liquid 14 to the second temperature, and continuously supplies the temperature adjustment liquid 14 of the second temperature to the liquid tank 12. By circulating, the resist solution in the resist bottle 11 is cooled from the first temperature to the second temperature.

(第四の過程IV)
第四の過程IVは、塗布が行われない休止期間において、レジスト液の保管に適した前記第二の温度(冷温)にレジスト液の温度を維持する過程である。この第四の過程IVでは、温度制御手段50が前記第二の温度に温調液14の温度を制御しながら液槽12に温調液14を連続的に継続して循環させることで、レジストボトル11内のレジスト液の温度を前記第二の温度に維持する。これにより、レジスト液の感度劣化を抑制した長期の保管を許容する。
(Fourth Process IV)
The fourth process IV is a process of maintaining the temperature of the resist solution at the second temperature (cold temperature) suitable for storing the resist solution during a rest period in which coating is not performed. In the fourth process IV, the temperature control means 50 continuously circulates the temperature adjusting liquid 14 in the liquid tank 12 while controlling the temperature of the temperature adjusting liquid 14 to the second temperature, thereby generating a resist. The temperature of the resist solution in the bottle 11 is maintained at the second temperature. This allows long-term storage in which resist solution sensitivity deterioration is suppressed.

なお、レジスト液の供給を行わない前記第一の過程I、第三の過程III及び第四の過程IVの少なくとも一部の期間においては、レジスト液循環手段70を機能させて、レジストボトル11内でレジスト液を循環させてもよい。   During at least a part of the first process I, the third process III, and the fourth process IV in which the resist solution is not supplied, the resist solution circulating means 70 is operated so that the inside of the resist bottle 11 The resist solution may be circulated.

本実施形態のレジスト液供給装置1によれば、レジストボトル11内のレジスト液に局所的な温度差を生じさせないようにしながら、迅速かつ効率的にレジスト液を第一の温度(例えば23℃の室温)から第二の温度(例えば10℃の冷温)に冷却することができる。また冷却と同様に、レジストボトル11内のレジスト液を第二の温度(冷温)から第一の温度(室温)に均一かつ迅速に回復することもできる。   According to the resist solution supply apparatus 1 of the present embodiment, the resist solution is quickly and efficiently supplied to the first temperature (for example, 23 ° C.) without causing a local temperature difference in the resist solution in the resist bottle 11. Room temperature) to a second temperature (eg, a cold temperature of 10 ° C.). Further, similarly to the cooling, the resist solution in the resist bottle 11 can be uniformly and quickly recovered from the second temperature (cool temperature) to the first temperature (room temperature).

また、塗布が行われない休止期間にはレジスト液を第二の温度(冷温)に維持して保管することができる。これにより、例えば、室温での感度変化が大きい化学増幅型レジストを用いる場合でも、レジスト液が室温環境下に置かれる累積時間を減らすことができ、レジスト液の感度劣化を最小限に抑えることができる。   In addition, the resist solution can be kept at the second temperature (cold temperature) and stored during a rest period in which application is not performed. As a result, for example, even when a chemically amplified resist having a large change in sensitivity at room temperature is used, the accumulated time that the resist solution is placed in the room temperature environment can be reduced, and the sensitivity deterioration of the resist solution can be minimized. it can.

また、塗布が行われない期間にレジスト液を循環させることで、レジスト液の局所的な温度差が殆ど生じない保管を可能にするとともに、フィルタによる異物の補足を積極的に行うことができる。   Further, by circulating the resist solution during a period in which application is not performed, it is possible to store the resist solution with little local temperature difference, and it is possible to positively supplement foreign matter with a filter.

[レジスト液保管装置の実施形態]
上述した構成のレジスト液供給装置1は、レジスト液を保管するレジスト液保管装置としても機能する。この場合において、レジスト液保管装置は、レジスト液を一定量貯留するレジストボトル11と、充満される温調液14でレジストボトル11を浸漬させる液槽12と、温調液14を液槽12内に流入させる流入口41及び温調液14を液槽12から流出させる流出口42を有する温調液循環手段40と、流入口41から液槽12へ流入させる温調液14の温度を制御する温度制御手段50とを備える。図1に示したレジスト液供給装置1と同様に、液槽12の内壁が任意の水平断面において円をなすことが好ましく、略円筒状のレジストボトル11が液槽12内において縦に設置されることで、液槽12の内壁とレジストボトル11との間に温調液14が浸入するための所定幅の間隙が形成される。
[Embodiment of resist solution storage apparatus]
The resist solution supply device 1 having the above-described configuration also functions as a resist solution storage device that stores the resist solution. In this case, the resist solution storage device includes a resist bottle 11 that stores a certain amount of resist solution, a liquid tank 12 that immerses the resist bottle 11 with the temperature adjusting liquid 14 that is filled, and the temperature adjusting liquid 14 in the liquid tank 12. The temperature adjusting liquid circulating means 40 having an inlet 41 for flowing into the tank and an outlet 42 for discharging the temperature adjusting liquid 14 from the liquid tank 12, and the temperature of the temperature adjusting liquid 14 flowing into the liquid tank 12 from the inlet 41 are controlled. Temperature control means 50. As in the resist solution supply apparatus 1 shown in FIG. 1, it is preferable that the inner wall of the liquid tank 12 has a circular shape in an arbitrary horizontal cross section, and the substantially cylindrical resist bottle 11 is installed vertically in the liquid tank 12. As a result, a gap having a predetermined width is formed between the inner wall of the liquid tank 12 and the resist bottle 11 for allowing the temperature adjusting liquid 14 to enter.

また、レジスト液保管装置の温調液循環手段40が、温調液14の流れをレジストボトル11の外周に沿って周回させるように構成された周回手段60を含む。周回手段60は、例えば流入口41が液槽12の内周における一つの接線方向に向けて設けられ、かつ、流出口42が前記一つの接線方向に対し温調液14が周回する流線上において相対向する他の接線方向に向けて設けられることにより構成される。   Further, the temperature adjustment liquid circulation means 40 of the resist solution storage device includes a circulation means 60 configured to circulate the flow of the temperature adjustment liquid 14 along the outer periphery of the resist bottle 11. For example, the circulation means 60 is provided on the streamline in which the inlet 41 is provided in one tangential direction in the inner circumference of the liquid tank 12 and the outlet 42 is circulated in the one tangential direction. It is configured by being provided toward other tangential directions facing each other.

この温調液循環手段40において、例えば流入口41が液槽12内の上部側に設けられ、流出口42が液槽12内の下部側に設けられる。また、流入口41を液槽12内の下部側に設け、流出口42を液槽12内の上部側に設けてもよい。図1に示されるような方向切換弁43の位置を制御することにより、流入口41及び流出口42の上下の位置を切り換え可能な構成であってもよい。   In this temperature control liquid circulation means 40, for example, an inlet 41 is provided on the upper side in the liquid tank 12, and an outlet 42 is provided on the lower side in the liquid tank 12. Further, the inlet 41 may be provided on the lower side in the liquid tank 12, and the outlet 42 may be provided on the upper side in the liquid tank 12. A configuration in which the upper and lower positions of the inlet 41 and the outlet 42 can be switched by controlling the position of the direction switching valve 43 as shown in FIG.

このレジスト液保管装置によれば、温度制御手段50で温度が制御された温調液14を連続的に流入口41から液槽12に流入させることにより、レジストボトル11に貯留されたレジスト液の温度を、制御された温調液14の温度に変更及び/又は維持することができる。温度制御手段50により制御される温調液14の温度範囲が、少なくとも、レジスト液の塗布に適合する第一の温度(例えば23℃の室温)及びレジスト液の保管に適合する第二の温度(例えば10℃の冷温)を含むことが好ましい。   According to this resist solution storage device, the temperature adjusting liquid 14 whose temperature is controlled by the temperature control means 50 is continuously introduced from the inlet 41 into the liquid tank 12, so that the resist solution stored in the resist bottle 11 can be stored. The temperature can be changed and / or maintained at a controlled temperature of the temperature adjustment liquid 14. The temperature range of the temperature adjustment liquid 14 controlled by the temperature control means 50 is at least a first temperature (for example, a room temperature of 23 ° C.) suitable for application of the resist liquid and a second temperature (for example, room temperature of 23 ° C.). For example, it is preferable to include a cold temperature of 10 ° C.

また、レジスト液保管装置は、レジスト液をレジストボトル11内で循環させるためのレジスト液循環手段70を更に備えてもよい。   The resist solution storage device may further include a resist solution circulating means 70 for circulating the resist solution in the resist bottle 11.

[レジスト液供給装置又はレジスト液保管装置の他の実施形態]
図6は、他の実施形態によるレジスト液供給装置又はレジスト液保管装置であり、液槽12の部分を破断して装置内部の構成を表した側面図である。図6に示される実施形態では、レジストボトル11の首部11bにフランジ11cが設けられる。液槽12の上蓋18には開口部18aが形成され、開口部18aの縁部とフランジ11cの外周部分を嵌合等により着脱可能に固定することで、レジストボトル11が液槽12内に吊り下げられた形態で支持される。これにより、温調液14とレジスト液との密度差やレジスト液消費によるボトル内空間の増加によりレジストボトル11に浮力が一定程度発生する場合でも、液槽12内にレジストボトル11を安定して支持することができる。また、図1に示した架台13を設けなくても、レジストボトル11の底部と液槽12との間には、温調液14が流出入可能な間隙が形成される。
[Other Embodiments of Resist Solution Supply Device or Resist Solution Storage Device]
FIG. 6 is a resist solution supply device or a resist solution storage device according to another embodiment, and is a side view showing a configuration inside the device by breaking a portion of the solution tank 12. In the embodiment shown in FIG. 6, a flange 11 c is provided on the neck 11 b of the resist bottle 11. An opening 18a is formed in the upper lid 18 of the liquid tank 12, and the resist bottle 11 is suspended in the liquid tank 12 by detachably fixing the edge of the opening 18a and the outer peripheral portion of the flange 11c by fitting or the like. Supported in lowered form. Thereby, even when buoyancy occurs to a certain degree in the resist bottle 11 due to the density difference between the temperature adjusting liquid 14 and the resist liquid and the increase in the space in the bottle due to consumption of the resist liquid, the resist bottle 11 is stably provided in the liquid tank 12. Can be supported. Further, even if the gantry 13 shown in FIG. 1 is not provided, a gap through which the temperature adjusting liquid 14 can flow in and out is formed between the bottom of the resist bottle 11 and the liquid tank 12.

図7は、更に他の実施形態によるレジスト液供給装置又はレジスト液保管装置であり、同じく液槽12の部分を破断して装置内部の構成を表した側面図である。図7に示される実施形態では、液槽12の中空円筒状の内壁に三角リブ12aが螺旋状に形成される。温調液14が周回する方向に沿って螺旋状に形成される三角リブ12aにより、液槽12本体の強度が増すだけでなく、温調液14の周回方向の流れが促進されることでレジスト液との間の熱交換の効率を向上させることができる。なお、三角リブ12aは、螺旋状に連続的に繋がっている必要はなく断続的であってもよい。   FIG. 7 is a resist solution supply device or a resist solution storage device according to still another embodiment, and is a side view showing the internal configuration of the device by also breaking the portion of the solution tank 12. In the embodiment shown in FIG. 7, triangular ribs 12 a are spirally formed on the hollow cylindrical inner wall of the liquid tank 12. The triangular ribs 12a formed in a spiral shape along the direction in which the temperature adjusting liquid 14 circulates not only increases the strength of the liquid tank 12 body but also promotes the flow of the temperature adjusting liquid 14 in the rotating direction. The efficiency of heat exchange with the liquid can be improved. In addition, the triangular rib 12a does not need to be continuously connected spirally, and may be intermittent.

図8は、更に他の実施形態によるレジスト液供給装置又はレジスト液保管装置であり、同じく液槽12の部分を破断して装置内部の構成を表した側面図である。図8の実施形態では、温調液14の流入口41及び流出口42を液槽12の側壁部に穿設した貫通口により形成される。これにより、流入口41及び流出口42に接続する配管を液槽12の外部に設けることができ、レジストボトル11の周囲を循環する温調液14の流路抵抗を減らすことができる。なお、図示はしないが、流入口41及び流出口42の何れか一方を液槽12の底部に設けてもよい。   FIG. 8 is a resist solution supply device or a resist solution storage device according to still another embodiment, and is a side view showing the internal structure of the device by similarly breaking the portion of the solution tank 12. In the embodiment of FIG. 8, the inlet 41 and the outlet 42 of the temperature adjusting liquid 14 are formed by through holes formed in the side wall portion of the liquid tank 12. Thereby, piping connected to the inflow port 41 and the outflow port 42 can be provided outside the liquid tank 12, and the flow path resistance of the temperature adjusting liquid 14 circulating around the resist bottle 11 can be reduced. Although not shown, either the inlet 41 or the outlet 42 may be provided at the bottom of the liquid tank 12.

[マスクブランクの製造における実施形態]
LSIやフラットパネルディスプレイ(FPD:Flat Panel Display)などに代表される半導体デバイスの製造、並びに、磁気ディスク、光ディスク及びマイクロマシンなどの微細構造物の形成や加工等においてはフォトリソグラフィ技術が採用されている。そのようなフォトリソグラフィのパターンエッチングに用いられるフォトマスクは、遮光膜が成膜されたフォトマスクブランク(本明細書では単に「マスクブランク」という)に所定のマスクパターンを短波長のレーザ等により描画することにより製造される。
[Embodiment in Manufacturing Mask Blank]
Photolithography technology is employed in the manufacture of semiconductor devices such as LSIs and flat panel displays (FPDs), and the formation and processing of fine structures such as magnetic disks, optical disks and micromachines. . A photomask used for such photolithography pattern etching is to draw a predetermined mask pattern on a photomask blank (herein simply referred to as “mask blank”) on which a light-shielding film is formed by a short wavelength laser or the like. It is manufactured by doing.

マスクブランクは、透明なガラス基板の一面に例えばCr(クロム)の金属薄膜からなる遮光膜が成膜された構造を有し、遮光膜側には所定厚の例えば化学増幅型レジスト(CAR:Chemically Amplified Resist)が一様に塗布された状態で提供される。マスクブランクに予め塗布されるレジストの感度は、マスクパターンを描画する際の露光条件と密接に関連するため、レジストの感度にばらつきがあると最終製品であるマスクパターンの寸法精度に影響を与えてしまう。レジストがポジ型の場合、経時劣化によりレジストの感度が上がると露光パターンの幅が規定値よりも広がってしまい、所定のパターン寸法精度を確保できなくなるおそれがある。また、異なるバッチ処理で製造されたマスクブランクにおいてレジストの感度に差が生じることは望ましくない。   The mask blank has a structure in which a light shielding film made of, for example, a Cr (chromium) metal thin film is formed on one surface of a transparent glass substrate, and a predetermined thickness of, for example, a chemically amplified resist (CAR: Chemically) is formed on the light shielding film side. Amplified Resist) is provided in a uniformly applied state. The sensitivity of the resist applied in advance to the mask blank is closely related to the exposure conditions for drawing the mask pattern. Therefore, variations in resist sensitivity affect the dimensional accuracy of the final mask pattern. End up. When the resist is a positive type, if the sensitivity of the resist increases due to deterioration over time, the width of the exposure pattern becomes wider than a specified value, and there is a possibility that a predetermined pattern dimensional accuracy cannot be ensured. Further, it is not desirable that a difference in resist sensitivity occurs in mask blanks manufactured by different batch processes.

本実施形態によれば、マスクブランクは、例えば図9に示される工程フローに従って製造される。   According to the present embodiment, the mask blank is manufactured, for example, according to the process flow shown in FIG.

まず、ガラス基板の面を研磨し、表面粗さが1nm以下の高い平坦度を得る(ステップS1)。そのガラス基板の研磨面にCr等の金属薄膜からなる遮光膜を成膜する(ステップS2)。この遮光膜の成膜法としては、真空蒸着法又はスパッタリング法などを用いることができる。   First, the surface of the glass substrate is polished to obtain high flatness with a surface roughness of 1 nm or less (step S1). A light shielding film made of a metal thin film such as Cr is formed on the polished surface of the glass substrate (step S2). As a method for forming the light shielding film, a vacuum deposition method, a sputtering method, or the like can be used.

レジスト塗布装置2によるレジスト塗布の工程に先立ち、レジスト液供給装置1のセットアップを行う。レジスト液供給装置1は、例えば図1に示されるように、レジスト液を一定量貯留するレジストボトル11と、レジストボトル11内のレジスト液を滴下ノズル20に供給する供給手段30と、充満される温調液14でレジストボトル11を浸漬させる液槽12と、温調液14を液槽12内に流入させる流入口41及び温調液14を液槽12から流出させる流出口42を有する温調液循環手段40と、流入口41から液槽12へ流入させる温調液14の温度を制御する温度制御手段50とを備える。   Prior to the resist coating process by the resist coating apparatus 2, the resist solution supply apparatus 1 is set up. For example, as shown in FIG. 1, the resist solution supply apparatus 1 is filled with a resist bottle 11 that stores a predetermined amount of resist solution, and a supply unit 30 that supplies the resist solution in the resist bottle 11 to the dropping nozzle 20. The temperature control includes a liquid tank 12 in which the resist bottle 11 is immersed with the temperature adjustment liquid 14, an inlet 41 for allowing the temperature adjustment liquid 14 to flow into the liquid tank 12, and an outlet 42 for allowing the temperature adjustment liquid 14 to flow out of the liquid tank 12. A liquid circulation means 40 and a temperature control means 50 for controlling the temperature of the temperature adjusting liquid 14 flowing into the liquid tank 12 from the inlet 41 are provided.

レジスト液供給装置1の準備において、化学増幅型レジストが貯留されるレジストボトル11を温調液14が充満される液槽12内に浸漬させる。そして、温調液循環手段40を作動させ温調液14がレジストボトル11の外周に沿って周回するように液槽12内で循環させる(ステップS3)。   In preparation of the resist solution supply apparatus 1, the resist bottle 11 in which the chemically amplified resist is stored is immersed in the liquid tank 12 filled with the temperature adjustment solution 14. Then, the temperature adjusting liquid circulating means 40 is operated to circulate in the liquid tank 12 so that the temperature adjusting liquid 14 circulates along the outer periphery of the resist bottle 11 (step S3).

これと同時に温度制御手段50を作動させ、液槽12内で循環させる温調液14の温度をレジスト液の塗布に適合する温度(例えば23℃の室温)に制御する(ステップS4)。そして、レジストボトル11内のレジスト液の温度が前記温度(室温)で維持されるように温調液14の流入を継続する。   At the same time, the temperature control means 50 is operated to control the temperature of the temperature adjusting liquid 14 circulated in the liquid tank 12 to a temperature (for example, a room temperature of 23 ° C.) suitable for application of the resist liquid (step S4). Then, the flow of the temperature adjusting solution 14 is continued so that the temperature of the resist solution in the resist bottle 11 is maintained at the temperature (room temperature).

レジストボトル11内のレジスト液の温度が温調液14の循環により室温に戻された後、供給手段30によりレジスト液供給装置1からレジスト供給装置2へレジスト液を供給する(ステップS5)。そして、スピンコータ3に載置したガラス基板に対して、滴下ノズル20からレジスト液を所定量だけ滴下する。スピンコータ3を高速に回転させることで、レジスト液をガラス基板の表面上で拡散させて均一に塗布する(ステップS6)。   After the temperature of the resist solution in the resist bottle 11 is returned to room temperature by circulation of the temperature adjusting solution 14, the resist solution is supplied from the resist solution supply device 1 to the resist supply device 2 by the supply means 30 (step S5). Then, a predetermined amount of resist solution is dropped from the dropping nozzle 20 onto the glass substrate placed on the spin coater 3. By rotating the spin coater 3 at a high speed, the resist solution is diffused on the surface of the glass substrate and uniformly applied (step S6).

そして、レジスト液が塗布されたガラス基板をホットプレート装置に移し、基板の表面温度を約100℃に維持してベークする(ステップS7)。これによりレジストに含まれる有機溶媒が蒸発して、レジストがガラス基板に定着する。   Then, the glass substrate coated with the resist solution is transferred to a hot plate apparatus and baked while maintaining the surface temperature of the substrate at about 100 ° C. (step S7). As a result, the organic solvent contained in the resist evaporates and the resist is fixed to the glass substrate.

レジスト液供給装置1によりレジスト液を冷温保管することで、レジストの感度劣化(ポジの化学増幅型レジストの場合は感度上昇)を極力抑えることができる。したがって、本実施形態の製造方法によれば、安定した感度のレジストが塗布されたマスクブランクを提供することができる。また、レジストの感度が安定するため、レジスト塗布のバッチ処理の度にベーク処理の条件出しをしなくて済み、マスクブランクの製造工程の簡素化にも貢献する。   By storing the resist solution at a low temperature using the resist solution supply device 1, it is possible to suppress the deterioration of resist sensitivity (in the case of a positive chemically amplified resist) as much as possible. Therefore, according to the manufacturing method of the present embodiment, it is possible to provide a mask blank to which a resist having a stable sensitivity is applied. Further, since the sensitivity of the resist is stable, it is not necessary to set the conditions for the baking process every time the resist coating is batched, which contributes to the simplification of the mask blank manufacturing process.

以上説明した実施形態は発明を説明するための例示に過ぎず、これらの態様が発明の範囲を限定するものとして解釈されるものではない。   The embodiments described above are merely examples for explaining the invention, and these aspects are not to be construed as limiting the scope of the invention.

1 レジスト液供給装置
2 レジスト塗布装置
3 スピンコータ
11 レジストボトル
12 液槽
13 架台
14 温調液
15 断熱材
16 給水ライン
17 排水ライン
18 上蓋
20 滴下ノズル
30 レジスト液供給手段
31 ポンプ
32 排出管
33 供給管
34 フィルタ
35 三方弁
36 戻り管
40 温調液循環手段
41 流入口
42 流出口
43 方向切換弁
45 可変流量ポンプ
48 温度センサ
50 温度制御手段
60 周回手段
70 レジスト液循環手段
DESCRIPTION OF SYMBOLS 1 Resist liquid supply apparatus 2 Resist coating apparatus 3 Spin coater 11 Resist bottle 12 Liquid tank 13 Base 14 Temperature control liquid 15 Heat insulating material 16 Water supply line 17 Drain line 18 Top cover 20 Dripping nozzle 30 Resist liquid supply means 31 Pump 32 Discharge pipe 33 Supply pipe 34 Filter 35 Three-way valve 36 Return pipe 40 Temperature control liquid circulation means 41 Inlet 42 Outlet 43 Directional switching valve 45 Variable flow pump 48 Temperature sensor 50 Temperature control means 60 Circulation means 70 Resist liquid circulation means

Claims (22)

フォトリソグラフィに用いるレジスト液を貯留するためのレジストボトルと、
充満される温調液で前記レジストボトルを浸漬させるための液槽と、
前記液槽に設置され前記温調液を前記液槽に流入させる流入口、及び、前記温調液を前記液槽から流出させる流出口を有する温調液循環手段と、
前記温調液循環手段により前記流入口から前記液槽へ流入させる前記温調液の温度を制御する温度制御手段と、
前記レジストボトル内のレジスト液をレジスト塗布装置に供給するための供給手段と、を備え
前記温度制御手段により制御される前記温調液の温度範囲が、少なくとも、レジスト液の塗布に適合する第一の温度及びレジスト液の保管に適合する第二の温度を含むレジスト液供給装置。
A resist bottle for storing a resist solution used for photolithography;
A liquid tank for immersing the resist bottle in a temperature adjusting liquid to be filled;
A temperature adjusting liquid circulation means having an inlet installed in the liquid tank and allowing the temperature adjusting liquid to flow into the liquid tank; and an outlet allowing the temperature adjusting liquid to flow out of the liquid tank;
Temperature control means for controlling the temperature of the temperature adjustment liquid flowing into the liquid tank from the inlet by the temperature adjustment liquid circulation means;
A supply means for supplying the resist solution in the resist bottle to a resist coating apparatus ,
The resist solution supply apparatus, wherein a temperature range of the temperature adjusting liquid controlled by the temperature control means includes at least a first temperature suitable for application of the resist solution and a second temperature suitable for storage of the resist solution.
前記温調液循環手段が前記温調液の流れを前記レジストボトルの外周に沿って周回させるように構成された周回手段を含む、請求項1に記載のレジスト液供給装置。   2. The resist solution supply apparatus according to claim 1, wherein the temperature adjustment liquid circulation means includes a circulation means configured to circulate the flow of the temperature adjustment liquid along an outer periphery of the resist bottle. 前記液槽の内壁が任意の水平断面において円をなしていることを特徴とする、請求項1又は2に記載のレジスト液供給装置。   3. The resist solution supply apparatus according to claim 1, wherein an inner wall of the liquid tank forms a circle in an arbitrary horizontal section. 4. 前記流入口が前記レジストボトルの外周における一つの接線方向に向けて設けられ、かつ、前記流出口が前記一つの接線方向に対し前記温調液が周回する流線上において相対向する他の接線方向に向けて設けられる、請求項1〜3の何れかに記載のレジスト液供給装置。   Other tangential directions opposite to each other on the streamline in which the temperature adjusting liquid circulates in the one tangential direction, and the outlet is provided in one tangential direction on the outer periphery of the resist bottle. The resist solution supply apparatus according to claim 1, which is provided toward 前記流入口が前記レジストボトルの上部側に設けられ、前記流出口が前記レジストボトルの下部側に設けられる、請求項1〜4の何れかに記載のレジスト液供給装置。   The resist solution supply apparatus according to claim 1, wherein the inflow port is provided on an upper side of the resist bottle, and the outflow port is provided on a lower side of the resist bottle. 前記流入口が前記レジストボトルの下部側に設けられ、前記流出口が前記レジストボトルの上部側に設けられる、請求項1〜5の何れかに記載のレジスト液供給装置。   The resist solution supply apparatus according to claim 1, wherein the inlet is provided on a lower side of the resist bottle, and the outlet is provided on an upper side of the resist bottle. 前記温度制御手段で温度が制御された前記温調液を連続的に前記流入口から前記液槽に流入させることにより、前記レジストボトルに貯留されたレジスト液の温度を前記温調液の温度に変更及び/又は維持する、請求項1〜6の何れかに記載のレジスト液供給装置。   The temperature of the resist solution stored in the resist bottle is set to the temperature of the temperature adjustment liquid by continuously flowing the temperature adjustment liquid whose temperature is controlled by the temperature control means from the inlet into the liquid tank. The resist solution supply device according to claim 1, wherein the resist solution supply device is changed and / or maintained. 前記レジストボトルの底部と前記液槽との間に前記温調液が流出入可能な間隙が設けられる、請求項1〜の何れかに記載のレジスト液供給装置。 Wherein the temperature control fluid outflow entrant gaps between the resist bottle bottom portion and the liquid tank is provided, the resist solution supply device according to any one of claims 1-7. レジスト液を前記レジストボトル内で循環させるためのレジスト液循環手段を更に備える、請求項1〜の何れかに記載のレジスト液供給装置。 Further comprising a resist solution A resist solution circulating means for circulating within the resist bottle, the resist solution supply device according to any one of claims 1-8. 前記供給手段の供給用のポンプが前記レジスト液循環手段の循環用のポンプを兼ねる、請求項に記載のレジスト液供給装置。 The resist solution supply apparatus according to claim 9 , wherein a supply pump of the supply unit also serves as a circulation pump of the resist solution circulation unit. 請求項1〜の何れかに記載のレジスト液供給装置により供給されるレジスト液を基板表面に滴下させる滴下ノズルを備えるレジスト塗布装置。 Resist coating apparatus comprising a dropping nozzle for dropping a resist liquid supplied to the substrate surface by a resist solution supply device according to any one of claims 1-9. フォトリソグラフィに用いるレジスト液を貯留するためのレジストボトルと、
充満される温調液で前記レジストボトルを浸漬させるための液槽と、
前記液槽に設置され前記温調液を前記液槽に流入させる流入口、及び、前記温調液を前記液槽から流出させる流出口を有する温調液循環手段と、
前記温調液循環手段により前記流入口から前記液槽へ流入させる前記温調液の温度を制御する温度制御手段と、を備え
前記温度制御手段により制御される前記温調液の温度範囲が、少なくとも、レジスト液の塗布に適合する第一の温度及びレジスト液の保管に適合する第二の温度を含むレジスト液保管装置。
A resist bottle for storing a resist solution used for photolithography;
A liquid tank for immersing the resist bottle in a temperature adjusting liquid to be filled;
A temperature adjusting liquid circulation means having an inlet installed in the liquid tank and allowing the temperature adjusting liquid to flow into the liquid tank; and an outlet allowing the temperature adjusting liquid to flow out of the liquid tank;
Temperature control means for controlling the temperature of the temperature adjusting liquid that is caused to flow from the inlet to the liquid tank by the temperature adjusting liquid circulating means ,
A resist solution storage device in which the temperature range of the temperature adjusting liquid controlled by the temperature control means includes at least a first temperature suitable for application of the resist solution and a second temperature suitable for storage of the resist solution.
前記温調液循環手段が、前記温調液の流れを前記レジストボトルの外周に沿って周回させるように構成された周回手段を含む、請求項12に記載のレジスト液保管装置。 The resist solution storage device according to claim 12 , wherein the temperature adjustment liquid circulation means includes a circulation means configured to circulate the flow of the temperature adjustment liquid along an outer periphery of the resist bottle. 前記液槽の内壁が任意の水平断面において円をなし、前記レジストボトルが前記液槽内において縦に設置されることを特徴とする請求項12又は13に記載のレジスト液保管装置。 The resist solution storage device according to claim 12 or 13 , wherein an inner wall of the liquid tank forms a circle in an arbitrary horizontal cross section, and the resist bottle is installed vertically in the liquid tank. 前記流入口が前記液槽の内周における一つの接線方向に向けて設けられ、かつ、前記流出口が前記一つの接線方向に対し前記温調液が周回する流線上において相対向する他の接線方向に向けて設けられる、請求項1214の何れかに記載のレジスト液保管装置。 Other tangents facing each other on the streamline in which the temperature adjusting liquid circulates in the one tangential direction, and the outlet is provided in one tangential direction on the inner circumference of the liquid tank The resist solution storage device according to any one of claims 12 to 14 , provided in a direction. 前記流入口が前記液槽内の上部側に設けられ、前記流出口が前記液槽内の下部側に設けられる、請求項1215の何れかに記載のレジスト液保管装置。 The inlet is provided at the upper portion of the liquid tank, wherein the outflow opening is arranged on the lower side of the liquid tank, the resist solution storage apparatus according to any one of claims 12-15. 前記流入口が前記液槽内の下部側に設けられ、前記流出口が前記液槽内の上部側に設けられる、請求項1216の何れかに記載のレジスト液保管装置。 The inlet is provided in the lower side of the liquid tank, wherein the outflow opening is arranged on the upper side of the liquid tank, the resist solution storage apparatus according to any one of claims 12 to 16. 前記温度制御手段で温度が制御された前記温調液を連続的に前記流入口から前記液槽に流入させることにより、前記レジストボトルに貯留されたレジスト液の温度を前記温調液の温度に変更及び/又は維持する、請求項1217の何れかに記載のレジスト液保管装置。 The temperature of the resist solution stored in the resist bottle is set to the temperature of the temperature adjustment liquid by continuously flowing the temperature adjustment liquid whose temperature is controlled by the temperature control means from the inlet into the liquid tank. The resist solution storage device according to any one of claims 12 to 17 , which is changed and / or maintained. 前記レジストボトルの底部と前記液槽との間に前記温調液が流出入可能な間隙が設けられる、請求項1218の何れかに記載のレジスト液保管装置。 The resist solution storage device according to any one of claims 12 to 18 , wherein a gap through which the temperature adjusting liquid can flow in and out is provided between a bottom portion of the resist bottle and the liquid tank. レジスト液を前記レジストボトル内で循環させるためのレジスト液循環手段を更に備える、請求項1219の何れかに記載のレジスト液保管装置。 Further comprising a resist solution A resist solution circulating means for circulating within the resist bottle, the resist solution storage apparatus according to any one of claims 12-19. フォトリソグラフィに用いるレジスト液を貯留するレジストボトルと、
充満される温調液で前記レジストボトルを浸漬させる液槽と、
前記液槽に設置され前記温調液を前記液槽に流入させる流入口、及び、前記温調液を前記液槽から流出させる流出口を有する温調液循環手段と、
前記温調液循環手段により前記流入口から前記液槽へ流入させる前記温調液の温度を制御する温度制御手段と、
前記レジストボトル内のレジスト液をレジスト塗布装置に供給する供給手段と、を備えるレジスト液供給装置における、レジスト液の温度管理方法であって、
前記供給手段によるレジスト液の供給に先立ち、前記温調液をレジスト液の塗布に適合する第一の温度に制御しながら前記液槽に流入させることで、前記レジストボトル内のレジスト液の温度を前記第一の温度に変更するステップと、
前記供給手段によりレジスト液を供給する間に、前記第一の温度の温調液の流入を継続して、前記レジストボトル内のレジスト液の温度を前記第一の温度に維持するステップと、
前記供給手段によるレジスト液の供給を終了した後に、前記温調液を前記第一の温度からレジスト液の保管に適合する第二の温度に制御しながら前記液槽に流入させることで、前記レジストボトル内のレジスト液の温度を前記第一の温度から前記第二の温度に変更するステップと、
前記第二の温度の温調液の流入を継続して、前記レジストボトル内のレジスト液を前記第二の温度で保管するステップと、を含む、レジスト液の温度管理方法。
A resist bottle for storing a resist solution used for photolithography;
A bath for immersing the resist bottle in a temperature adjusting solution to be filled;
A temperature adjusting liquid circulation means having an inlet installed in the liquid tank and allowing the temperature adjusting liquid to flow into the liquid tank; and an outlet allowing the temperature adjusting liquid to flow out of the liquid tank;
Temperature control means for controlling the temperature of the temperature adjustment liquid flowing into the liquid tank from the inlet by the temperature adjustment liquid circulation means;
A resist solution temperature control method in a resist solution supply device comprising: a supply means for supplying a resist solution in the resist bottle to a resist coating device;
Prior to the supply of the resist solution by the supply means, the temperature of the temperature of the resist solution in the resist bottle is adjusted by allowing the temperature adjusting solution to flow into the solution tank while controlling the temperature at a first temperature suitable for application of the resist solution. Changing to the first temperature;
Maintaining the temperature of the resist solution in the resist bottle at the first temperature by continuing the inflow of the temperature adjusting solution at the first temperature while supplying the resist solution by the supplying means;
After the supply of the resist solution by the supply means is finished, the temperature adjusting solution is allowed to flow into the solution tank while controlling the temperature from the first temperature to a second temperature suitable for storage of the resist solution. Changing the temperature of the resist solution in the bottle from the first temperature to the second temperature;
Continuing the inflow of the temperature adjustment liquid at the second temperature and storing the resist liquid in the resist bottle at the second temperature.
ガラス基板の一面に成された遮光膜を所定のマスクパターンにエッチングするためのレジスト液を前記遮光膜の表面に塗布して定着させる工程を含む、マスクブランクの製造方法であって、
レジスト塗布装置を用いてレジスト液を前記遮光膜の表面に塗布する工程に先立ち、
レジスト液が貯留されるレジストボトルを温調液が充満される液槽内に浸漬させ、前記温調液が前記レジストボトルの外周に沿って周回するように前記液槽内で循環させるステップと、
前記液槽に流入させる前記温調液の温度をレジスト液の塗布に適合する第一の温度に制御するステップと、
前記温調液を連続的に前記液槽に流入させることにより、前記レジストボトルに貯留されたレジスト液の温度を前記第一の温度に変更及び/又は維持するステップと、
前記第一の温度に変更及び/又は維持されたレジスト液を前記レジスト塗布装置に供給するステップと、
レジスト液の供給を終了した後に、前記温調液を前記第一の温度からレジスト液の保管に適合する第二の温度に制御しながら前記液槽に流入させることで、前記レジストボトル内のレジスト液の温度を前記第一の温度から前記第二の温度に変更するステップと、
前記第二の温度の温調液の流入を継続して、前記レジストボトル内のレジスト液を前記第二の温度で保管するステップと、を含む、マスクブランクの製造方法。
The resist solution for etching on one surface of a glass substrate a film has been shielding light film with the mask pattern including more Engineering for fixing applied to the surface of the light shielding film, a method for producing a mask blank,
Prior to the step of applying a resist solution to the surface of the light shielding film using a resist coating apparatus,
Immersing the resist bottle in which the resist solution is stored in a liquid tank filled with the temperature adjustment liquid, and circulating the temperature adjustment liquid in the liquid tank so as to circulate along the outer periphery of the resist bottle;
Controlling the temperature of the temperature adjusting liquid flowing into the liquid tank to a first temperature suitable for application of a resist solution;
Changing and / or maintaining the temperature of the resist solution stored in the resist bottle to the first temperature by continuously flowing the temperature adjusting liquid into the liquid tank;
Supplying a resist solution changed and / or maintained at the first temperature to the resist coating apparatus;
After the supply of the resist solution is finished, the temperature adjustment solution is allowed to flow from the first temperature to the second bath while being controlled to a second temperature suitable for storage of the resist solution. Changing the temperature of the liquid from the first temperature to the second temperature;
Storing the resist solution in the resist bottle at the second temperature by continuing the inflow of the temperature adjusting solution at the second temperature .
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