JP6087272B2 - Analysis board - Google Patents

Description

  The present invention relates to an analysis substrate for analyzing a liquid material.

  2. Description of the Related Art Conventionally, a technique for separating, mixing, and detecting a biological substance such as a specific protein from blood or biological fluid using an analysis substrate having a fine channel formed on the surface is known (for example, Patent Document 1). reference). Such an analysis board may be used for, for example, antigen-antibody reaction analysis for examining allergies, infectious diseases, adult diseases, etc., analysis of blood components for examining adult diseases, gene analysis, tumor marker analysis, etc. It is being considered.

  In recent years, an analysis substrate on which a plurality of analysis units are formed in order to perform many analyzes at once in a short time and in a simple manner is known (for example, see Patent Document 2).

JP 2007-10435 A JP 2009-47564 A

  When an analysis is performed using an analysis substrate on which a plurality of analysis units are formed, it is required to appropriately specify the position of the analysis unit on the analysis substrate when the analysis substrate is rotated. For example, in the technique disclosed in Patent Document 2, when rotating an analysis substrate, a stepping motor is used, and the number of pulses supplied to the stepping motor is used to change the flow path pattern (corresponding to an analysis unit) on the analysis substrate. The measurement channel is specified.

  There is a need to be able to detect the position of each analysis unit on an analysis substrate without a stepping motor.

  The present invention has been made in view of the above problems, and an object thereof is to provide a technique capable of appropriately recognizing the position of an analysis unit on an analysis substrate.

In order to achieve the above object, an analysis substrate according to an embodiment of the present invention is used for analyzing a sample, and is a disk-shaped liquid that can be fed radially outward from the center using centrifugal force when rotated. An analysis board having a plurality of analysis units each independently used for analyzing a sample, and having a predetermined direction in a detection range on one surface of the analysis board, in which reflected light is detected by a predetermined detection sensor Unlike other parts of the detection range, the reflection mode with respect to the light emitted from the sensor has at least one reference part for specifying the position of the analysis unit.
Analysis board.

  In the analysis substrate according to another embodiment of the present invention, the detection range further includes a region on the same circumference of the analysis substrate.

  An analysis board according to another embodiment of the present invention is further made of a transparent resin material.

  In the analysis substrate according to another embodiment of the present invention, each analysis unit further includes a detection unit serving as a site for detecting, reacting, adsorbing, desorbing, or decomposing a sample, and the reference unit is a detection unit. It is arranged on the outer edge side.

  In the analysis substrate according to another embodiment of the present invention, the reference portion is further provided in the vicinity of the outer edge of the analysis substrate.

  In an analysis substrate according to another embodiment of the present invention, the reference portion is further formed so that light irradiated from a predetermined direction is not reflected in the predetermined direction.

  In the analysis substrate according to another embodiment of the present invention, the reference portion is a concave portion.

  In the analysis substrate according to another embodiment of the present invention, the reference portion is a concave portion having an outer diameter of 0.5 to 2 mm.

  In the analysis substrate according to another embodiment of the present invention, the bottom surface of the concave portion of the reference portion is an inclined surface that is inclined so as to intersect with one surface of the analysis substrate.

  In the analysis substrate according to another embodiment of the present invention, the angle formed by the inclined surface of the reference portion and one surface of the analysis substrate is 20 to 80 degrees.

  In the analysis substrate according to another embodiment of the present invention, the reference portion is further formed on the back surface of the analysis substrate.

  The analysis board according to another embodiment of the present invention further includes a waste liquid tank for the analysis unit to collect the waste liquid, and the reference unit is off the straight line connecting the center of the analysis board and the waste liquid tank. Placed in position.

  According to the present invention, it is possible to appropriately detect the position of the analysis unit on the analysis substrate.

FIG. 1 is a plan view, a side view, and a back view of an analysis board according to the first embodiment of the present invention. FIG. 2 is an enlarged view of the analysis unit in FIG. FIG. 3 is an enlarged view of a region X in FIG. FIG. 4 is a cross-sectional view of the analysis substrate according to the first embodiment of the present invention taken along line BB. FIG. 5 is a configuration diagram of an analysis apparatus using the analysis substrate according to the first embodiment of the present invention. FIG. 6 is a sectional view taken along line BB of the analysis substrate according to the second embodiment of the present invention.

  Embodiments of the present invention will be described with reference to the drawings. The embodiments described below do not limit the invention according to the claims, and all the elements and combinations described in the embodiments are indispensable for the solving means of the invention. Not always.

<First Embodiment>
First, the analysis substrate according to the first embodiment of the present invention will be described.

  FIG. 1 is a plan view, a side view, and a back view of an analysis board according to the first embodiment of the present invention.

  The analysis substrate 1 is a substrate for analyzing a liquid sample (liquid material). The analysis substrate 1 includes a substrate 2 including a liquid tank for storing a liquid material, a flow path for the liquid material, and a detection unit for detecting and analyzing the liquid material. Further, the analysis substrate 1 has a cover member 3 attached to one surface of the substrate 2 (for example, the upper surface of the substrate 2) so as to cover at least a part of the opening of the substrate 2. The cover member 3 can be a film or a sheet, but is not limited thereto, and may be a molded body like the substrate. The analysis substrate 1 is, for example, a compact disk-type substrate that can be rotated and liquid material can be fed radially outward from the center using centrifugal force. The substrate 2 has a disk shape with a hole 4 in the center, and includes 16 analysis units 5 (regions surrounded by dotted lines in FIG. 1) in plan view. In the present embodiment, each analysis unit 5 has the same form, but some or all of them may have different forms. Further, the number of analysis units 5 is not limited to 16, and may be 17 or more or 15 or less.

  The material of the substrate 2 and the cover member 3 is not particularly limited, and may be made of a translucent material or a non-translucent material. Preferably, the translucent material such as resin or glass is used. In this embodiment, it is preferably made of an acrylic resin. The substrate 2 constituting the analysis substrate 1 has a function of reflecting at least a part of light emitted from a reference portion detection sensor 28 described later. For this reason, it is preferable that the substrate 2 not only transmits light but also has light reflectivity. The substrate 2 and the cover member 3 are made of a resin other than acrylic resin, such as polypropylene, polycarbonate resin, cycloolefin resin, polystyrene resin, polyester resin, urethane resin, vinyl chloride resin, silicone resin, fluorine resin, or silicone rubber or poly You may comprise from elastic rubbers, such as dimethylsiloxane. In particular, polycarbonate resin, polystyrene resin, acrylic resin, and cycloolefin resin are preferable. Here, “translucent” means that light can be transmitted regardless of whether it is colored or colorless and the transmittance of light is large. Although the manufacturing method of the board | substrate 2 is not specifically limited, For example, there exists the method of pouring and molding the material of an unhardened state in a metal mold | die.

  As shown in FIG. 1, each analysis unit 5 includes a detection unit 6 in the region. The detection unit 6 may be formed integrally with the substrate 2 or may be formed separately and detachably attached to the substrate 2.

  On the back side of the substrate 2, a reference portion 7 that is a concave portion for detecting the reference position of the analysis substrate 1 is formed. In the present embodiment, the reference unit 7 is formed in the vicinity of the outer edge of the analysis substrate 1 outside the detection unit 6. The reference portion 7 is formed on a circumferential detection range S that is a target for detection of reflected light by a reference portion detection sensor 28 of the analyzer 25 described later. The reference unit 7 reflects the light emitted from the reference unit detection sensor 28 from a predetermined direction so that the reference unit detection sensor 28 cannot detect the light. Note that the portions other than the reference portion 7 in the detection range S reflect the light emitted from the reference portion detection sensor 28 from a predetermined direction so that the reference portion detection sensor 28 can detect the light. In the present embodiment, the reference unit 7 is preferably formed on or near a straight line connecting the center of the substrate 2 and the detection unit 6 of the analysis unit 5 serving as a reference. Moreover, the reference | standard part 7 is formed in the position away from the straight line which connects the center of the board | substrate 2, and the waste liquid tank 20 mentioned later. The waste liquid tank 20 is a relatively wide recess, and the area on the straight line connecting the center of the substrate 2 and the waste liquid tank 20 is the lightest area in the substrate 2. Since the reference portion 7 that is further lightened is not provided in such a region on a straight line, it is possible to appropriately suppress a decrease in the overall balance when rotating about the center of the substrate 2 as an axis.

  FIG. 2 is an enlarged view of the analysis unit in FIG.

  The analysis unit 5 includes a detection unit 6, liquid tanks 10 and 11 for storing liquid substances, and a waste liquid tank 20 for collecting waste liquid. The liquid tanks 10 and 11 and the waste liquid tank 20 both have a concave shape that is recessed in the thickness direction from the front surface of the analysis substrate 1. The waste liquid tank 20 occupies the widest area in the analysis unit 5. The liquid tank 10, the liquid tank 11, and the waste liquid tank 20 are connected to the detection unit 6 through the flow path 13, the flow path 14, and the flow path 21, respectively. Further, the detection unit 6 is connected to the recess 16 via the flow path 17. These flow paths 13, 14, 17, 21 are preferably grooves having a width and a depth of about 10 μm to 100 μm. The recess 16 is a portion that becomes an air vent when the liquid material in the detection unit 6 is fed. The flow paths 13, 14, 17, 21 and the recess 16 are provided on the substrate 2 in a shape that is recessed from the front surface of the substrate 2 toward the inside in the thickness direction.

  FIG. 3 is an enlarged view of a region X in FIG.

  As shown in FIG. 3, a reference portion 7 is formed in the vicinity of the outer edge of one surface (back surface) of the analysis substrate 1. The reference portion 7 is formed as a circular opening. The outer diameter D of the opening of the reference portion 7 is, for example, 0.5 to 2 mm.

  FIG. 4 is a cross-sectional view of the analysis substrate according to the first embodiment of the present invention taken along line BB.

  As shown in FIG. 4, the bottom surface 7 </ b> A of the reference portion 7 is an inclined surface that forms an angle θ with the back surface of the analysis substrate 1. An angle θ formed by the bottom surface 7A and the back surface of the analysis substrate 1 is, for example, 20 to 80 degrees. This angle θ is an angle at which the reference portion detection sensor 28 cannot receive the reflected light of the light irradiated to the reference portion 7 by the reference portion detection sensor 28 or cannot receive the reflected light with a sufficient amount of light for detection. If it is good. According to the reference unit 7, for example, the light indicated by the arrow C irradiated vertically upward from below is reflected not in the downward direction but in the lower right direction indicated by the arrow C '. Thereby, the reference | standard part detection sensor 28 arrange | positioned below cannot receive reflected light. On the other hand, in the part other than the reference part 7 of the detection range S, the light indicated by the arrow C irradiated vertically upward from the lower side is reflected in the direction opposite to the arrow C, so that the reference part detection sensor 28 is sufficiently reflected. Light can be received. Therefore, the reference part detection sensor 28 can specify the position of the reference part 7 based on whether or not the reflected light is detected. Since the reference portion 7 is not a through hole or a notch, there is almost no possibility of causing a flow mark or a mold release failure when the substrate 2 having the reference portion 7 is formed using a mold.

  Next, an analysis apparatus that performs analysis using the analysis substrate 1 will be described.

  FIG. 5 is a configuration diagram of an analysis apparatus using the analysis substrate according to the first embodiment of the present invention.

  The analysis device 25 is a device that is used for analyzing a sample and can send liquid from the center of the analysis substrate 1 to the outside in the radial direction by using a centrifugal force when the analysis substrate 1 is rotated.

  The analysis device 25 includes a rotation shaft portion 27 to which the analysis substrate 1 can be connected and a motor 26 that rotates the rotation shaft portion 27. Therefore, the analysis substrate 1 can be rotated (rotated) by driving the motor 26 and rotating the rotary shaft portion 27. The driving of the motor 26 is controlled by a control device (not shown).

  The analysis device 25 includes a reference part detection sensor 28 for detecting the reference part 7 on the back side of the analysis board 1 and a light receiving part 29 for receiving light from the detection part 6 of the analysis board 1.

  The reference part detection sensor 28 is, for example, a reflective photoelectric sensor. The reference portion detection sensor 28 irradiates light in a predetermined direction (for example, vertically upward), receives reflected light from the direction, and notifies the control device of the light reception state. In the present embodiment, the position of the reference portion detection sensor 28 is such that the light emitted from the reference portion detection sensor 28 strikes a partial range of the detection range S on the back surface of the analysis substrate 1 from vertically below. It has been adjusted. In the present embodiment, when the light emitted from the reference part detection sensor 28 strikes the reference part 7 of the analysis substrate 1, the reference part detection sensor 28 cannot detect the reflected light of the irradiated light, while the reference part When the light emitted from the detection sensor 28 strikes a part other than the reference part 7 in the detection range S of the analysis substrate 1, the reference part detection sensor 28 can appropriately detect the reflected light of the emitted light.

  The state of the light detected by the reference unit detection sensor 28 is sent to the control device as an electrical signal. If the control device is a signal indicating that the reflected light of the irradiated light has been received, the portion irradiated with light by the reference portion detection sensor 28 at that time is a portion other than the reference portion 7 in the detection range S. If it is a signal that can be recognized and that the reflected light of the irradiated light is not received, the portion irradiated with light by the reference portion detection sensor 28 at that time is the reference portion 7. Can be recognized. In this way, the control device can recognize the position of the reference portion 7 formed on the analysis substrate 1, so that the analysis substrate 1 is based on the interval at which the reference portion 7 is detected when the analysis substrate 1 is rotated. The rotational speed of the analysis substrate 1 can be appropriately controlled by controlling the drive of the motor 26 based on the rotational speed thus grasped. Further, since the position of the reference unit 7 can be recognized, the position of each analysis unit 5 can be grasped with high accuracy based on the positional relationship between the position of the reference unit 7 and each analysis unit 5 of the analysis substrate 1. Therefore, for example, it is possible to automate the introduction of a liquid substance into a specific analysis unit 5 or to automate the work of fixing a substance to a specific detection unit 6. You can prevent mistakes.

  The light receiving unit 29 is disposed above the analysis substrate 1 so that the detection unit 6 that passes when the analysis substrate 1 rotates can be observed. The light receiving unit 29 is, for example, a CCD camera, a photomultiplier tube (PMT), a photodiode (PD), an organic photodiode (OPD), or the like. In particular, a CCD camera is preferable. A signal based on light reception by the light receiving unit 29 is transmitted to the control device, and recording and analysis are performed in the control device. The control device is based on the position of the reference portion 7 specified by the signal from the reference portion detection sensor 28 and the rotational speed of the analysis substrate 1, the positional relationship between the position of the reference portion 7 and each analysis unit 5 of the analysis substrate 1, and the like. It is possible to identify with high accuracy which part of the signal based on the light received by the light receiving unit 29 corresponds to which analysis unit 5.

<Second Embodiment>
Next, an analysis substrate according to a second embodiment of the present invention will be described. In the present embodiment, the same components as those in the first embodiment are denoted by the same reference numerals, and description thereof will be omitted as appropriate.

  FIG. 6 is a sectional view taken along line BB of the analysis substrate according to the second embodiment of the present invention.

  The bottom surface 7B of the reference portion 7 is a surface that diffuses light. The reference unit 7 diffusely reflects the light indicated by the arrow C irradiated vertically upward from below, for example, as indicated by the arrow E. Thereby, when the reference part detection sensor 28 irradiates the reference part 7 with light from below, it cannot receive a sufficient amount of reflected light. On the other hand, at portions other than the reference portion 7 in the detection range S, the light irradiated vertically upward from the bottom is reflected in the opposite direction, so that the reference portion detection sensor 28 can receive sufficient reflected light. it can. For this reason, the control device that receives the signal from the reference part detection sensor 28 can appropriately specify the position of the reference part 7.

<Other embodiments>
Although the present invention has been described based on the embodiments, the present invention is not limited to the above-described embodiments, and can be applied to various other modes.

  For example, in the first and second embodiments, the analysis substrate 1 is provided with one reference part 7, but two or more reference parts 7 may be provided. For example, a reference unit may be provided at a position corresponding to each analysis unit 5. Further, the position where the reference portion 7 is provided is not limited to the back surface of the substrate, but may be the front surface, and is not limited to the outer edge portion of the substrate, but may be the inner peripheral portion. Further, the reference portion 7 is not limited to a concave shape, and may be a convex shape.

  In the first and second embodiments, the reference unit 7 does not reflect sufficient light in the irradiated direction (the direction in which the reference unit detection sensor 28 can receive light), and the reference of the detection range S The part other than the part 7 reflects the irradiated light in that direction, but reflects the light in the direction in which only the reference part 7 is irradiated (the direction in which the reference part detection sensor 28 can receive light), A portion other than the reference portion 7 of the detection range S may be configured not to reflect the irradiated light in that direction. That is, the reflection mode regarding whether or not the light irradiated from a predetermined direction is reflected in the direction in which the reference part detection sensor 28 can receive is different between the reference part 7 and the part other than the reference part 7 in the detection range S. It only has to be different.

  The present invention can be used as an analysis substrate for analyzing a liquid substance.

DESCRIPTION OF SYMBOLS 1 Analysis board 2 Board | substrate 3 Cover member 5 Analysis unit 6 Detection part 7 Reference | standard part 7A Bottom face (inclined surface)
20 Waste liquid tank 28 Reference part detection sensor (detection sensor)

Claims (3)

A disc-shaped analysis substrate that is used for sample analysis and can be fed radially outward from the center using centrifugal force when rotating,
Multiple analysis units that are used independently for sample analysis,
In the detection range where the reflected light is detected by a predetermined detection sensor on one surface of the analysis substrate, the reflection mode for light irradiated from a predetermined direction is different from other parts of the detection range. the reference portion for specifying the position of the analysis unit has at least one closed,
The detection range is a range including a region on the same circumference of the analysis substrate,
The analysis unit has a waste liquid tank for collecting waste liquid,
The waste liquid tank is a portion having the widest area in the analysis substrate,
The reference portion is a concave portion formed on an outer edge portion of the back surface of the analysis substrate, the bottom surface of the concave shape is an inclined surface facing the central axis side of the analysis substrate, and the center of the analysis substrate and the An analysis board placed at a position off the straight line connecting the waste liquid tank . The analysis substrate according to claim 1, which is made of a transparent resin material. Each of the analysis units has a detection unit that becomes a site for detecting, reacting, adsorbing, desorbing, or decomposing the sample,
The analysis substrate according to claim 1, wherein the reference unit is disposed on an outer edge side of the detection unit.

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