JP6029320B2 - 面取り部又は皿面の超音波検査用の形状補正トランスデューサー接続機構 - Google Patents
面取り部又は皿面の超音波検査用の形状補正トランスデューサー接続機構 Download PDFInfo
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- JP6029320B2 JP6029320B2 JP2012118400A JP2012118400A JP6029320B2 JP 6029320 B2 JP6029320 B2 JP 6029320B2 JP 2012118400 A JP2012118400 A JP 2012118400A JP 2012118400 A JP2012118400 A JP 2012118400A JP 6029320 B2 JP6029320 B2 JP 6029320B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/32—Arrangements for suppressing undesired influences, e.g. temperature or pressure variations, compensating for signal noise
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/221—Arrangements for directing or focusing the acoustical waves
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/223—Supports, positioning or alignment in fixed situation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2487—Directing probes, e.g. angle probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/28—Details, e.g. general constructional or apparatus details providing acoustic coupling, e.g. water
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- G—PHYSICS
- G10—MUSICAL INSTRUMENTS; ACOUSTICS
- G10K—SOUND-PRODUCING DEVICES; METHODS OR DEVICES FOR PROTECTING AGAINST, OR FOR DAMPING, NOISE OR OTHER ACOUSTIC WAVES IN GENERAL; ACOUSTICS NOT OTHERWISE PROVIDED FOR
- G10K11/00—Methods or devices for transmitting, conducting or directing sound in general; Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
- G10K11/02—Mechanical acoustic impedances; Impedance matching, e.g. by horns; Acoustic resonators
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/023—Solids
- G01N2291/0231—Composite or layered materials
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/051—Perpendicular incidence, perpendicular propagation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/26—Scanned objects
- G01N2291/263—Surfaces
- G01N2291/2638—Complex surfaces
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- Analytical Chemistry (AREA)
- Biochemistry (AREA)
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- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Acoustics & Sound (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Description
A.構造物の超音波検査用の形状補正トランスデューサー接続機構であって、
検査対象の構造物と係合する少なくとも一つの角度付きの面を有する形状補正構造物と、
検査対象の構造物の音速とおおむね一致する音速を有する形状補正構造物と、
形状補正構造物と接触した状態に配置された超音波トランスデューサーと、
超音波トランスデューサーと連動している表示ユニット
を含む形状補正トランスデューサー接続機構。
検査対象の構造物と係合する少なくとも一つの角度付き面を有する形状補正構造物を含み、前記形状補正構造物が複数の複合プライを有し、また
前記形状補正構造物が検査対象の構造物の音速とおおむね一致する音速を有する
形状補正トランスデューサー接続機構。
1a トランスデューサー接続機構
1b トランスデューサー接続機構
1c トランスデューサー接続機構
2 形状補正ウェッジ
3 積層複合プライ
4 ウェッジ底面
5 ウェッジ側面
6 ウェッジ最上面
7 ウェッジ側面
8 角度付き面
12 超音波トランスデューサー
13 トランスデューサーの配線
14 表示ユニット
15 入射超音波ビーム
16 反射超音波ビーム
20 構造物
21 積層複合プライ
26 面取り部
28 凹凸
32a 形状補正プラグ
33 積層複合プライ
34 プラグ底面
35 プラグ環状面
36 プラグ角度付き面
37 プラグ最上面
38 凹凸
40 構造物
41 積層複合プライ
45 皿開口部
46 皿面
Claims (6)
- 積層複合プライを含む複合構造物の超音波検査用の形状補正トランスデューサー接続機構であって、
検査対象の複合構造物の傾斜した面と係合するように構成されている少なくとも一つの角度付き面を有する形状補正構造物を含み、前記形状補正構造物が複数の複合プライを含み、前記形状補正構造物が検査対象の複合構造物の音速とおおむね一致する音速を有し、
前記形状補正構造物が、前記複合構造物の傾斜した面に前記複合構造物の前記積層複合プライに直角の方向で超音波ビームを伝播させるように構成されている、形状補正トランスデューサー接続機構。 - 前記形状補正構造物が非金属である、請求項1に記載の形状補正トランスデューサー接続機構。
- 前記形状補正構造物と前記検査対象の複合構造物がほぼ同じ材料でできている、請求項1に記載の形状補正トランスデューサー接続機構。
- 形状補正構造物が形状補正ウェッジを含む、請求項1に記載の形状補正トランスデューサー接続機構。
- 前記形状補正構造物が形状補正プラグを含む、請求項1に記載の形状補正トランスデューサー接続機構。
- 傾斜した面を有する検査対象の、積層複合プライを含む複合構造物を供給し、
請求項1から5のいずれか1項に記載の形状補正構造物を供給し、
前記形状補正構造物の角度付き面を前記検査対象の複合構造物の傾斜した面に当接させて配置し、
前記形状補正構造物を介して超音波ビームを前記検査対象の複合構造物の中へ送り、前記超音波ビームが前記複合構造物の前記積層複合プライに直角の方向に伝播し、
前記超音波ビームを受信し、
受信した超音波ビームに基づいて結果を読み取る、超音波検査の方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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US13/156,154 | 2011-06-08 | ||
US13/156,154 US8869621B2 (en) | 2009-01-31 | 2011-06-08 | Geometry compensating transducer attachments for ultrasonic inspection of chamfers or countersunk surfaces |
Publications (2)
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JP2012255776A JP2012255776A (ja) | 2012-12-27 |
JP6029320B2 true JP6029320B2 (ja) | 2016-11-24 |
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JP2012118400A Active JP6029320B2 (ja) | 2011-06-08 | 2012-05-24 | 面取り部又は皿面の超音波検査用の形状補正トランスデューサー接続機構 |
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EP (1) | EP2533040B1 (ja) |
JP (1) | JP6029320B2 (ja) |
CN (1) | CN102818854A (ja) |
CA (1) | CA2773921C (ja) |
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JP6261939B2 (ja) * | 2013-10-23 | 2018-01-17 | 三菱重工業株式会社 | 可搬式の超音波探傷装置及び超音波探傷方法 |
JP2016070852A (ja) * | 2014-10-01 | 2016-05-09 | 株式会社Ihi | 超音波探傷方法及び超音波探傷装置 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
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US3512400A (en) * | 1967-04-13 | 1970-05-19 | Panametrics | Ultrasonic testing method |
DE3147900A1 (de) * | 1981-12-03 | 1983-06-16 | Siemens AG, 1000 Berlin und 8000 München | "ultraschall-winkelpruefkopf" |
US4462256A (en) * | 1982-12-27 | 1984-07-31 | The United States Of America As Represented By The Secretary Of The Navy | Lightweight, broadband Rayleigh wave transducer |
JPS61265565A (ja) * | 1985-05-21 | 1986-11-25 | Mitsubishi Heavy Ind Ltd | 非破壊検査用標準欠陥の製作方法 |
JPS63195565A (ja) * | 1987-02-09 | 1988-08-12 | Aichi Steel Works Ltd | 超音波探傷垂直試験方法 |
JPH09133664A (ja) * | 1995-11-07 | 1997-05-20 | Toyota Motor Corp | 超音波探傷法 |
US6848312B2 (en) * | 2002-02-18 | 2005-02-01 | The Boeing Company | System, method and apparatus for the inspection of joints in a composite structure |
US20060009948A1 (en) * | 2003-10-04 | 2006-01-12 | Dannis Wulf | Method and apparatus for inspecting parts with high frequency linear array |
JP2006349486A (ja) * | 2005-06-15 | 2006-12-28 | Kobe Steel Ltd | 超音波探触子 |
JP4329773B2 (ja) * | 2006-03-06 | 2009-09-09 | 株式会社日立製作所 | フッ素樹脂製被検査物の超音波検査方法 |
JP2007263697A (ja) * | 2006-03-28 | 2007-10-11 | Tokyo Electric Power Co Inc:The | 超音波探触子装置 |
US8192075B2 (en) * | 2008-08-19 | 2012-06-05 | Ge Inspection Technologies, Lp | Method for performing ultrasonic testing |
US8286487B2 (en) * | 2009-01-31 | 2012-10-16 | The Boeing Company | Ultrasonic aperture scanning system and method |
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- 2012-04-11 CA CA2773921A patent/CA2773921C/en active Active
- 2012-05-07 EP EP12166975.8A patent/EP2533040B1/en active Active
- 2012-05-24 JP JP2012118400A patent/JP6029320B2/ja active Active
- 2012-06-08 CN CN2012101892365A patent/CN102818854A/zh active Pending
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CA2773921C (en) | 2016-06-07 |
CA2773921A1 (en) | 2012-12-08 |
CN102818854A (zh) | 2012-12-12 |
EP2533040A3 (en) | 2014-09-17 |
EP2533040B1 (en) | 2019-01-09 |
EP2533040A2 (en) | 2012-12-12 |
JP2012255776A (ja) | 2012-12-27 |
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