JP5854221B2 - AD converter circuit - Google Patents

AD converter circuit Download PDF

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JP5854221B2
JP5854221B2 JP2012018144A JP2012018144A JP5854221B2 JP 5854221 B2 JP5854221 B2 JP 5854221B2 JP 2012018144 A JP2012018144 A JP 2012018144A JP 2012018144 A JP2012018144 A JP 2012018144A JP 5854221 B2 JP5854221 B2 JP 5854221B2
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moving average
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JP2013157872A (en
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和秀 安田
和秀 安田
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Yokogawa Electric Corp
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本発明は、測定データをAD(Analog-Digital)変換するΔΣ変調器を備え、測定データに含まれる定周期ノイズをAD変換結果からフィルタリングするAD変換回路に関する。   The present invention relates to an AD conversion circuit that includes a ΔΣ modulator that performs AD (Analog-Digital) conversion of measurement data and filters fixed-cycle noise included in measurement data from AD conversion results.

電子計測器は、入力された大小様々な電気信号を増幅し、演算し、そして表示を行う。また、必要に応じて計測値を記録する。この電子計測器において、電気信号の処理はアナログ式とデジタル式とがあるが、現在ではデジタル処理を行い、表示のみならず電子記録ができるデジタル式が一般的である。ところで、ΔΣ型のAD変換回路は、より高精度にAD変換を行うために開発された変換方式を持つAD変換回路である。特徴として、逐次変換やフラッシュ変換型に比べラインノイズの影響が少なく、高い精度で測定でき、記録計等において多用されている。   The electronic measuring instrument amplifies, calculates and displays the input electric signals of various sizes. Moreover, a measured value is recorded as needed. In this electronic measuring instrument, there are an analog type and a digital type in the processing of electrical signals. At present, however, a digital type that performs digital processing and enables electronic recording as well as display is common. By the way, the ΔΣ AD conversion circuit is an AD conversion circuit having a conversion method developed for performing AD conversion with higher accuracy. As a feature, it is less affected by line noise than sequential conversion and flash conversion type, can be measured with high accuracy, and is often used in recorders.

ところで、アナログデバイセズ社のAD7794は、高精度計測アプリケーション向けの低消費電力、低ノイズ、全機能内蔵型のフロントエンドであり、6つの差動入力を備えた24ビットのΔΣ型のAD変換回路を内蔵しており、低ノイズのオンチップ計装アンプにより、微少な振幅信号をAD変換回路に直接インタフェースすることができる(例えば、非特許文献1参照)。   By the way, Analog Devices' AD7794 is a low-power, low-noise, full-function front end for high-precision measurement applications, and a 24-bit ΔΣ AD conversion circuit with six differential inputs. A small amplitude signal can be directly interfaced to the AD conversion circuit by a built-in low-noise on-chip instrumentation amplifier (see Non-Patent Document 1, for example).

「AD7794」<インターネットURL:www.analog.com/static/imported−files/jp/data_sheets/AD7794_JP.pdf>(2011年12月26日閲覧)。“AD7794” <Internet URL: www. analog. com / static / imported-files / jp / data_sheets / AD7794_JP. pdf> (accessed December 26, 2011).

ところで、図3に示すように、ΔΣ型のAD変換回路100は、ΔΣ変調器101と、n次移動平均フィルタ(n次sincフィルタ)102とにより構成される。ΔΣ変調器101は、測定入力を高いサンプリングレートで連続してサンプリングを行い、n次sincフィルタ102は、そのビットストリームを処理してデシメーションを行ない複数ビットの変換結果を生成する。また、n次sincフィルタは、商用電源周波数ノイズ等、測定入力に含まれる定周期ノイズをAD変換結果から除去する。ここで、nは、正の整数でフィルタの次数を表す。   As shown in FIG. 3, the ΔΣ AD conversion circuit 100 includes a ΔΣ modulator 101 and an n-th order moving average filter (n-th order sinc filter) 102. The ΔΣ modulator 101 continuously samples the measurement input at a high sampling rate, and the nth-order sinc filter 102 processes the bit stream and performs decimation to generate a multi-bit conversion result. In addition, the n-th order sinc filter removes periodic noise included in the measurement input, such as commercial power supply frequency noise, from the AD conversion result. Here, n is a positive integer and represents the order of the filter.

図4に、フィルタ次数nが2の場合の従来のAD変換回路100の動作タイミング図が示されている。縦軸に測定入力が、横軸に時間軸が割り当てられている。△Σ変調器101が測定入力をサンプリングしてA/D変換を行う期間が測定期間(t1)である。図4に示すように、測定入力に含まれる定周期ノイズをAD変換結果から除去するためには、測定期間(t1)を、sincフィルタ102の次数n×除去したいノイズの周期に設定する必要がある。△Σ変換器101がA/D変換動作を繰り返す周期が測定周期(T)であり、この測定周期(T)は測定期間(t1)より短くすることはできない。   FIG. 4 shows an operation timing chart of the conventional AD conversion circuit 100 when the filter order n is 2. The measurement input is assigned to the vertical axis, and the time axis is assigned to the horizontal axis. The period during which the ΔΣ modulator 101 samples the measurement input and performs A / D conversion is the measurement period (t1). As shown in FIG. 4, in order to remove the fixed period noise included in the measurement input from the AD conversion result, it is necessary to set the measurement period (t1) to the order n of the sinc filter 102 × the period of the noise to be removed. is there. The period in which the ΔΣ converter 101 repeats the A / D conversion operation is the measurement period (T), and this measurement period (T) cannot be shorter than the measurement period (t1).

このように従来のAD変換回路100によれば、除去したいノイズの周期×フィルタ次数n分の測定期間(t1)が必要であり、このため、測定周期(T)を除去したいノイズの周期よりも短くすることができない。広い周波数範囲、大きな減衰量といった大きなノイズ除去効果を得るためにはフィルタ次数nを大きくする必要があり、したがって長い測定期間(t1)が必要になる。その結果、測定周期(T)も長くなるといった課題があった。   As described above, according to the conventional AD converter circuit 100, the measurement period (t1) corresponding to the period of the noise to be removed × the filter order n is required. Therefore, the measurement period (T) is longer than the period of the noise to be removed. It cannot be shortened. In order to obtain a large noise removal effect such as a wide frequency range and a large attenuation amount, it is necessary to increase the filter order n, and thus a long measurement period (t1) is required. As a result, there has been a problem that the measurement cycle (T) becomes longer.

本発明は上記した課題を解決するためになされたものであり、測定期間を短縮しながら大きなノイズ除去効果を得るAD変換回路を提供することを目的とする。   The present invention has been made to solve the above-described problems, and an object of the present invention is to provide an AD conversion circuit that obtains a large noise removal effect while shortening the measurement period.

上記した課題を解決するために本発明は、測定データをAD変換するΔΣ変調器を備え、前記測定データに含まれる定周期のノイズを前記AD変換の結果からフィルタリングするAD変換回路であって、前記ADへ変換を繰り返す測定周期内に割り当てられた測定期間の複数回分の前記測定データを保存する記憶部と、前記測定周期あたりの前記測定期間を前記ノイズの周期より短くなるように前記ΔΣ変調器と前記記憶部のタイミング制御を行う測定期間制御部と、前記測定期間制御部の制御に基づき、前記記憶部から前記測定周期あたりの複数回の測定期間の測定データを読み取り、整数周期分のノイズ波形の平均値を算出するように移動平均演算により前記測定データのn−1次移動平均を得、更に、前記n−1次移動平均の結果に対して前記複数回の測定期間の測定データの移動平均演算を行ってn(但し、nは正の整数)次移動平均を得るn次移動平均演算手段と、を有することを特徴とする。 In order to solve the above-described problem, the present invention is an AD conversion circuit that includes a ΔΣ modulator that AD converts measurement data, and filters noise of a fixed period included in the measurement data from the result of the AD conversion, a storage unit that stores a plurality of times before Symbol measurement data of the measurement period in the assigned measurement period to repeat the conversion to the AD, between front Kihaka periodically per the measurement period to be shorter than the period of the noise A measurement period control unit that performs timing control of the ΔΣ modulator and the storage unit, and based on the control of the measurement period control unit, reads measurement data of a plurality of measurement periods per measurement cycle from the storage unit, and an integer the moving average calculation to calculate an average value of the period of the noise waveform to obtain a n-1 order moving average of the measured data, to further the n-1 order moving average of results It said plurality of n by performing a moving average operation on the measurement data measurement period (where, n is a positive integer) and having a n-th moving average calculation means for obtaining the next moving average, a.

本発明において、前記測定期間制御部は、前記測定期間内に割り当てられた前記複数の測定期間を足し合わせたときに、前記n次移動平均演算部で行う移動平均演算が整数周期分のノイズ波形の平均値を算出するように、前記測定期間と前記測定周期とを制御することを特徴とする。 In the present invention, when the measurement period control unit adds the plurality of measurement periods allocated within the measurement period, the moving average calculation performed by the n-th moving average calculation unit is a noise waveform for an integer period. The measurement period and the measurement cycle are controlled so as to calculate an average value of the two.

本発明において、前記測定期間制御部は、前記測定周期内に割り当てられた前記複数の測定期間を足し合わせたときに、測定した前記ノイズの位相が1周期の整数倍分だけ均一になるように、前記測定期間と前記測定周期とを制御することを特徴とする。本発明によれば、1測定周期あたりの測定期間を除去したいノイズの周期より短くすることが出来、測定期間を短くすることで測定周期を短縮することができる。   In the present invention, the measurement period control unit is configured to make the measured noise phase uniform by an integral multiple of one period when the plurality of measurement periods assigned within the measurement period are added together. The measurement period and the measurement cycle are controlled. According to the present invention, the measurement period per measurement period can be made shorter than the period of noise to be removed, and the measurement period can be shortened by shortening the measurement period.

本発明によれば、測定期間を短縮しながら大きなノイズ除去効果を得るAD変換回路を提供することができる。   According to the present invention, it is possible to provide an AD conversion circuit that obtains a large noise removal effect while shortening the measurement period.

本発明の実施の形態に係るAD変換回路の構成を示すブロック図である。It is a block diagram which shows the structure of the AD converter circuit which concerns on embodiment of this invention. 本発明の実施の形態に係るAD変換回路の動作を示すタイミング図である。It is a timing diagram which shows operation | movement of the AD converter circuit which concerns on embodiment of this invention. 従来のAD変換回路の構成を示すブロック図である。It is a block diagram which shows the structure of the conventional AD converter circuit. 従来のAD変換回路の動作を示すタイミング図である。It is a timing diagram which shows operation | movement of the conventional AD converter circuit.

以下、添付図面を参照して本発明を実施するための実施の形態(以下、単に本実施形態という)について詳細に説明する。   Hereinafter, an embodiment for carrying out the present invention (hereinafter simply referred to as the present embodiment) will be described in detail with reference to the accompanying drawings.

(実施形態の構成)
図1は、本実施形態に係るAD変換回路の構成を示すブロック図である。図1に示すように、本実施形態に係るAD変換回路1は、ΔΣ変調器10と、フィルタ回路20と、により構成される。ΔΣ変調器10は、測定入力を高いサンプリングレートで連続してサンプリングを行いAD変換の結果をフィルタ回路20に出力する。フィルタ回路20は、測定データに含まれる定周期のノイズをAD変換の結果からフィルタリングする。このため、フィルタ回路20は、記憶部21と、測定時間制御部22と、n次移動平均演算部(ここでは、1次移動平均演算部23と2次移動平均演算部24)と、を含み構成される。
(Configuration of the embodiment)
FIG. 1 is a block diagram showing a configuration of an AD conversion circuit according to the present embodiment. As shown in FIG. 1, the AD conversion circuit 1 according to the present embodiment includes a ΔΣ modulator 10 and a filter circuit 20. The ΔΣ modulator 10 continuously samples the measurement input at a high sampling rate, and outputs the AD conversion result to the filter circuit 20. The filter circuit 20 filters fixed-period noise included in the measurement data from the AD conversion result. Therefore, the filter circuit 20 includes a storage unit 21, a measurement time control unit 22, and an n-th order moving average calculation unit (here, a primary moving average calculation unit 23 and a secondary moving average calculation unit 24). Composed.

記憶部21は、AD変換を繰り返す測定周期内に割り当てられた複数回分の測定期間の測定データを保存する。測定期間制御部22は、測定周期あたりの複数回分の測定期間をノイズの周期より短くなるようにΔΣ変調器10と記憶部21のタイミング制御を行う。1次移動平均演算部23は、測定期間制御部22の制御に基づき、記憶部21から測定周期あたりの複数回の測定期間の測定データを読み取り、移動平均演算により測定データの1次移動平均を得て2次移動平均演算部24に出力する。2次移動平均演算部24は、1次移動平均の結果に対して複数回の測定期間の測定データの移動平均演算を行なって2次移動平均を得、測定結果として不図示のコントローラ等、外部へ出力する。   The memory | storage part 21 preserve | saves the measurement data of the measurement period for several times allocated within the measurement period which repeats AD conversion. The measurement period control unit 22 performs timing control of the ΔΣ modulator 10 and the storage unit 21 so that a plurality of measurement periods per measurement period is shorter than the noise period. Based on the control of the measurement period control unit 22, the primary moving average calculation unit 23 reads the measurement data of a plurality of measurement periods per measurement cycle from the storage unit 21, and calculates the primary moving average of the measurement data by moving average calculation. Obtained and output to the secondary moving average calculator 24. The secondary moving average calculation unit 24 performs a moving average calculation of the measurement data of a plurality of measurement periods on the result of the primary moving average to obtain a secondary moving average, and a controller or the like (not shown) Output to.

なお、測定期間制御部22は、測定周期内に割り当てられた複数の測定期間を足し合わせたときに、測定したノイズの位相が1周期の整数倍分だけ均一になるように、測定期間と測定周期とを制御する。   The measurement period control unit 22 adds the measurement period and measurement so that the phase of the measured noise is uniform by an integral multiple of one period when a plurality of measurement periods assigned within the measurement period are added. Control the period.

(実施形態の動作)
図2は、本実施形態に係るAD変換回路1の動作を示す動作タイミング図である。以下、図2の動作タイミング図を参照しながら、図1に示すAD変換回路1の動作について詳細に説明する。
(Operation of the embodiment)
FIG. 2 is an operation timing chart showing the operation of the AD conversion circuit 1 according to the present embodiment. Hereinafter, the operation of the AD conversion circuit 1 shown in FIG. 1 will be described in detail with reference to the operation timing chart of FIG.

ここでは、測定周期等の制約により、測定期間に使用可能な時間が除去したいノイズ周期に満たない状況を想定している。測定期間制御部22は、想定周期の複数回(Np)にわたる測定期間(t1)を足し合わせたとき、測定したノイズの位相が1周期の整数倍均一になるように、測定期間(t1)と測定周期(T)とを選択する。図2の動作タイミング図に示す例では、Np=4の測定期間(t1)で、除去したいノイズ周期の1周期分となる。   Here, it is assumed that the usable time in the measurement period is less than the noise period to be removed due to restrictions such as the measurement period. The measurement period controller 22 adds the measurement period (t1) and the measurement period (t1) so that the phase of the measured noise is an integral multiple of one period when the measurement periods (t1) over a plurality of times (Np) of the assumed period are added Select the measurement period (T). In the example shown in the operation timing diagram of FIG. 2, the measurement period (t1) of Np = 4 is one period of the noise period to be removed.

まず、ΔΣ変調器10は、外部(例えば、センサ)から測定入力を得、AD変換した結果をフィルタ回路20に出力する。フィルタ回路20は、測定期間制御部22による制御の下、記憶部21で、不連続な測定データを保存する。ここでは、測定周期×Np回分の測定データを保存する。測定周期制御部22は、上記した所望の測定期間(t1)、および測定周期(T)を実現するように、ΔΣ変調器10、および記憶部21のリードライトタイミングを制御する。   First, the ΔΣ modulator 10 obtains a measurement input from the outside (for example, a sensor), and outputs the result of AD conversion to the filter circuit 20. The filter circuit 20 stores discontinuous measurement data in the storage unit 21 under the control of the measurement period control unit 22. Here, the measurement data for the measurement cycle × Np times are stored. The measurement cycle control unit 22 controls the read / write timing of the ΔΣ modulator 10 and the storage unit 21 so as to realize the above-described desired measurement period (t1) and measurement cycle (T).

1次移動平均演算部23は、測定期間制御部22の制御に基づき、記憶部21から測定周期(T)あたりの複数回(Np回)の測定期間(t1)の測定データを読み取り、測定期間分(Np回)の移動平均演算を行ない、1次移動平均を得て2次移動平均演算部24へ出力する。2次移動平均演算部24は、1次移動平均演算部23から出力された1次移動平均の結果に対し、更に測定期間分(Np回)の移動平均演算を行い、結果を外部(コントローラ)へ出力する。   Based on the control of the measurement period control unit 22, the primary moving average calculation unit 23 reads measurement data of a plurality of (Np) measurement periods (t 1) per measurement period (T) from the storage unit 21, and measures the measurement period. The moving average calculation of minutes (Np times) is performed to obtain the primary moving average and output it to the secondary moving average calculation unit 24. The secondary moving average calculation unit 24 further performs a moving average calculation for the measurement period (Np times) on the result of the primary moving average output from the primary moving average calculation unit 23, and outputs the result to the outside (controller). Output to.

図2に示すフィルタ回路20は、2次移動平均の結果を測定結果として外部へ出力する構成として説明しているが、さらに移動平均を重ねてn次(但し、nは正の整数)の移動平均を得ることもできる。このような移動平均演算により、高次sincフィルタ並みのノイズ除去効果を得ることができる。   The filter circuit 20 shown in FIG. 2 is described as a configuration that outputs the result of the second-order moving average to the outside as a measurement result. However, the moving average is further overlapped to make an n-th order (where n is a positive integer) movement. You can also get an average. By such a moving average calculation, a noise removal effect similar to that of a high-order sinc filter can be obtained.

(実施形態の効果)
以上説明のように本発明によれば、測定期間制御部22が、AD変換を繰り返す測定周期内に割り当てられた複数回分の測定期間の測定データを記憶部21に保存し、測定周期あたりの複数回分の測定期間をノイズの周期より短くなるようにΔΣ変調器10と記憶部21のタイミング制御を行なう。そして、n次移動平均演算部(1次移動平均演算部23と2次移動平均演算部24)が、複数の測定周期にわたるAD変換の結果を組み合わせて周期ノイズを除去するための移動平均処理を行う。このため、1測定周期あたりの測定期間を除去したいノイズの周期より短くすることが出来、測定期間(t1)を短くすることで測定周期(T)を短縮することができる。したがって、広い周波数範囲、大きな減衰量といった大きなノイズ除去効果を得ながらも測定周期(T)の短縮が可能になる。
(Effect of embodiment)
As described above, according to the present invention, the measurement period control unit 22 stores, in the storage unit 21, measurement data for a plurality of measurement periods allocated within a measurement period in which AD conversion is repeated, and a plurality of measurement data per measurement period are stored. The timing control of the ΔΣ modulator 10 and the storage unit 21 is performed so that the measurement period for each batch is shorter than the period of noise. Then, the n-order moving average calculation unit (the primary moving average calculation unit 23 and the secondary moving average calculation unit 24) performs a moving average process for removing period noise by combining the results of AD conversion over a plurality of measurement periods. Do. For this reason, the measurement period per measurement period can be made shorter than the period of noise to be removed, and the measurement period (T) can be shortened by shortening the measurement period (t1). Therefore, the measurement period (T) can be shortened while obtaining a large noise removal effect such as a wide frequency range and a large attenuation.

なお、上記した本実施形態に係るAD変換回路1において、n次移動平均演算部(1次移動平均演算部23と2次移動平均演算部24)は専用ハードウェアで実現するものとして説明したが、マイコン等を使用してソフトウェアにより実現してもよい。   In the above-described AD conversion circuit 1 according to the present embodiment, the n-order moving average calculation unit (the primary moving average calculation unit 23 and the secondary moving average calculation unit 24) has been described as being realized by dedicated hardware. Alternatively, it may be realized by software using a microcomputer or the like.

以上、本発明の好ましい実施形態について詳述したが、本発明の技術的範囲は上記実施形態に記載の範囲には限定されないことは言うまでもない。上記実施形態に、多様な変更または改良を加えることが可能であることが当業者に明らかである。またその様な変更または改良を加えた形態も本発明の技術的範囲に含まれ得ることが、特許請求の範囲の記載から明らかである。   As mentioned above, although preferred embodiment of this invention was explained in full detail, it cannot be overemphasized that the technical scope of this invention is not limited to the range as described in the said embodiment. It will be apparent to those skilled in the art that various modifications or improvements can be added to the above-described embodiments. Further, it is apparent from the scope of the claims that the embodiments added with such changes or improvements can be included in the technical scope of the present invention.

1・・AD変換回路、10・・ΔΣ変調器、20・・フィルタ回路、21・・記憶部、22・・測定期間制御部、23・・1次移動平均演算部、24・・2次移動平均演算部   1 ·· AD conversion circuit, 10 ·· ΔΣ modulator, 20 ·· Filter circuit, 21 ·· Storage unit, 22 ·· Measurement period control unit, 23 ·· Primary moving average operation unit, 24 ·· Secondary move Average calculator

Claims (2)

測定データをAD変換するΔΣ変調器を備え、前記測定データに含まれる定周期のノイズを前記AD変換の結果からフィルタリングするAD変換回路であって、
前記AD変換を繰り返す測定周期内に割り当てられた測定期間の複数回分の前記測定データを保存する記憶部と、
前記測定周期あたりの前記測定期間を前記ノイズの周期より短くなるように前記ΔΣ変調器と前記記憶部のタイミング制御を行う測定期間制御部と、
前記測定期間制御部の制御に基づき、前記記憶部から前記測定周期あたりの複数回の測定期間の測定データを読み取り、整数周期分のノイズ波形の平均値を算出するように移動平均演算により前記測定データのn−1次移動平均を得、更に、前記n−1次移動平均の結果に対して前記複数回の測定期間の測定データの移動平均演算を行ってn(但し、nは正の整数)次移動平均を得るn次移動平均演算手段と、
を有することを特徴とするAD変換回路。
An AD conversion circuit including a ΔΣ modulator for AD conversion of measurement data, and filtering noise of a fixed period included in the measurement data from the result of the AD conversion;
A storage unit that stores a plurality of times before Symbol measurement data of the measurement period allocated to the measurement cycle repeating AD conversion,
A measurement period control unit that performs the timing control of the ΔΣ modulator and the storage unit so that between the leading Kihaka periodically per the measurement period becomes shorter than the period of said noise,
Based on the control of the measurement period control unit, the measurement data is read from the storage unit for a plurality of measurement periods per measurement period, and the measurement is performed by moving average calculation so as to calculate the average value of the noise waveform for an integer period. N-1 order moving average of the data is obtained, and the moving average calculation of the measurement data of the plurality of measurement periods is performed on the result of the n-1 order moving average, and n (where n is a positive integer) ) N-th order moving average calculating means for obtaining a next moving average;
An AD conversion circuit comprising:
前記測定期間制御部は、
前記測定期間内に割り当てられた前記複数の測定期間を足し合わせたときに、前記n次移動平均演算部で行う移動平均演算が整数周期分のノイズ波形の平均値を算出するように、前記測定期間と前記測定周期とを制御することを特徴とする請求項1記載のAD変換回路。
The measurement period control unit
The measurement is performed such that when the plurality of measurement periods allocated within the measurement period are added, the moving average calculation performed by the n-th moving average calculation unit calculates an average value of the noise waveform for an integer period. The AD conversion circuit according to claim 1, wherein a period and the measurement cycle are controlled.
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