JP5838081B2 - Optical characteristic unevenness measuring apparatus and optical characteristic unevenness measuring method - Google Patents

Description

  The present invention relates to an optical characteristic unevenness measuring apparatus and an optical characteristic unevenness measuring method for measuring unevenness of optical characteristic values (luminance unevenness, chromaticity unevenness, etc.). The present invention can be applied to, for example, measurement of unevenness in light characteristics of an illuminator LED (Light Emitting Diode) mounting substrate or the like.

  As a technique for measuring and evaluating light characteristic unevenness of an illumination device, a display device, or the like, for example, one described in Patent Document 1 below is known (see paragraph [0064] and the like of Patent Document 1).

  In the color unevenness measuring apparatus of Patent Document 1, first, a color pattern is displayed on the screen 21. Then, this color pattern is imaged by the imaging device 3.

  Subsequently, the inspection target measurement position 51 and chromaticity, and the chromaticity of the comparative measurement position 52 are detected.

  Thereafter, a chromaticity difference between the measurement positions 51 and 52 is calculated, and chromaticity unevenness is evaluated based on the chromaticity difference.

JP 2010-139324 A

  As described above, in the conventional evaluation method, a plurality of measurement positions of an object to be measured (in the example of Patent Document 1, a screen) are simultaneously imaged by one imaging device and used for evaluating chromaticity unevenness. ing.

  However, with such a method, the radiation angle of the light received by the imaging device differs for each measurement position.

  For example, when the imaging device is disposed on a normal line passing through the center point of the measurement object, the imaging device is configured to emit light from the center point (that is, light emitted in the normal direction) and an end portion of the measurement object. Are simultaneously received and compared with the radiated light (that is, the light emitted in a direction oblique to the normal).

  For this reason, in such an evaluation method, measurement conditions differ for each measurement position, and chromaticity unevenness may not be accurately evaluated. For example, in a light source having high light directivity such as an LED, the luminance and chromaticity are greatly different between light emitted in the normal direction and light emitted in an oblique direction. For this reason, for example, in the LED mounting substrate for a fluorescent lamp, the emitted light of the light emitting element arranged at the center point and the emitted light of the light emitting element arranged at the end are simultaneously measured and compared with the same imaging device. However, luminance unevenness and chromaticity unevenness cannot be accurately evaluated.

  On the other hand, if imaging is performed while relatively moving the imaging device from one end side to the other end side of the measurement object, the radiated light at all measurement positions for one line can be imaged from the same angle. Is possible. However, since this method needs to sequentially perform imaging while moving the imaging device or the measurement object, it introduces a new drawback that the measurement time becomes long.

  An object of the present invention is to provide an optical characteristic unevenness measuring apparatus and an optical characteristic unevenness measuring method capable of measuring optical characteristic unevenness with high accuracy in a short time.

An optical characteristic unevenness measuring apparatus according to the present invention images a plurality of measurement points provided on the surface of a plurality of measurement objects arranged, and detects a characteristic value of light incident from the measurement point. From the imaging unit and the measurement point, a reference measurement point is determined for each measurement object, the characteristic value of the other measurement point is determined, and the radiation angle of light incident on the imaging unit from the measurement point is A storage unit for storing correction data for executing a process of correcting to the value at the same time as the incident angle of the corresponding reference measurement point, and the other measurement using the correction data A correction operation unit for correcting the characteristic value of the point, and comparing the characteristic value of the other measurement point after correction with the characteristic value of the corresponding reference measurement point, It is characterized in that the optical characteristic unevenness is measured every time .

  In addition to the above-described configuration, the optical characteristic unevenness measuring device of the present invention measures the characteristic values of the light distribution measurement light source while changing the radiation angle, and uses the plurality of measurement results. Thus, it can be generated by calculating a ratio between the measurement result at the reference radiation angle and the measurement result at another radiation angle.

  In addition to the above configuration, the optical characteristic unevenness measuring apparatus of the present invention uses the measurement result and the radiation angle corresponding to any two of the measurement points, and corresponds to any of the other measurement points. Correction data can be calculated.

Light characteristics unevenness measuring apparatus of the present invention, the imaging unit may be configured to simultaneously imaging all of the measurement points of all the measurement object.

In addition to the above-described configuration, the optical characteristic unevenness measuring apparatus of the present invention is configured such that the imaging unit is configured to emit light only to a predetermined number of measurement objects among the plurality of measurement objects arranged. , After imaging all the measurement points of the predetermined number of measurement objects at the same time, by repeating the process of terminating the light emission of the predetermined number of measurement objects, all the measurements of all the measurement objects It can be set as the structure which images a point .

In addition to the above-described configuration, the optical characteristic unevenness measuring apparatus of the present invention can be a plurality of LED mounting substrates in which the plurality of arrayed measurement objects are integrally manufactured in an aligned state. .

In the optical characteristic unevenness measuring method according to the present invention, a plurality of measurement points each provided on the surface of a plurality of measurement objects arranged are imaged by an imaging unit, and a characteristic value of light incident from the measurement point is measured. An imaging step for detecting a reference measurement point for each measurement object from among the measurement points, and the characteristic values of the other measurement points for the light incident on the imaging unit from the measurement points A correction calculation step for correcting the radiation angle to a value when the incident angle is the same as the incident angle of the corresponding reference measurement point, and the characteristic value of the other measurement point after correction is And an optical characteristic unevenness calculating step for comparing with the characteristic value .

  The optical characteristic unevenness measuring method of the present invention, in addition to the above-described configuration, uses the plurality of measurement results as the correction data by measuring the characteristic values of the light distribution measurement light source while changing the radiation angle. Thus, it can be generated by calculating a ratio between the measurement result at the reference radiation angle and the measurement result at another radiation angle.

  In addition to the above configuration, the optical characteristic unevenness measuring method of the present invention uses the measurement result corresponding to any two of the measurement points and the radiation angle, and corresponds to any of the other measurement points. Correction data can be calculated.

Light characteristics unevenness measuring method of the present invention, in addition to the above structure, the imaging step may be a step of simultaneously imaging all of the measurement points of all the measurement object.

In addition to the above-described configuration, the optical characteristic unevenness measuring method of the present invention performs the imaging step in a state where light emission is performed only on a predetermined number of the measurement objects among the plurality of measurement objects arranged in the array. , After imaging all the measurement points of the predetermined number of measurement objects at the same time, by repeating the process of terminating the light emission of the predetermined number of measurement objects, all the measurements of all the measurement objects It can be a step of imaging a point .

In addition to the above configuration, the optical characteristic unevenness measuring method of the present invention can be a plurality of LED mounting substrates in which the plurality of arrayed measurement objects are integrally manufactured in an aligned state. .

  According to the present invention, it is possible to correct the optical characteristic value of the measurement points arranged in a straight line on the surface of the measurement object to a value corresponding to the same radiation angle. Therefore, according to the present invention, it is possible to measure the optical characteristic unevenness with high accuracy despite imaging each measurement point without changing the position or direction of the imaging unit. Therefore, according to the present invention, optical characteristic unevenness can be measured with high accuracy in a short time.

  According to the present invention, by using the ratio of the optical characteristic measurement result at the reference radiation angle and the optical characteristic measurement result at another radiation angle as the correction data, the optical characteristic can be corrected by simple arithmetic processing. It can be carried out.

  According to the present invention, generation of correction data can be simplified by calculating correction data corresponding to other measurement points using the measurement results and radiation angles corresponding to the two measurement points. .

According to the present invention, by simultaneously imaging all measurement points of all of the measurement object, it is possible to shorten the time required for imaging.

According to the present invention, the power supply capacity of the optical village measuring device can be reduced by sequentially imaging a predetermined number of objects to be measured as compared with the case where all measurement points are imaged simultaneously.

According to the present invention, it is possible to perform characteristic evaluation before the cutting process of the LED mounting substrate by applying it to the measurement of unevenness of the optical characteristics of a plurality of LED substrates manufactured integrally.

It is a perspective view which shows notionally the principal part structure of the optical characteristic nonuniformity measuring apparatus which concerns on embodiment. It is a figure which shows notionally the principal part structure of the optical characteristic nonuniformity measuring apparatus which concerns on embodiment, (a) is a side view, (b) is a top view. It is a block diagram which shows notionally the principal part structure of the optical characteristic nonuniformity measuring apparatus which concerns on embodiment. It is a conceptual diagram which shows the structure of the light distribution measuring apparatus which concerns on embodiment. It is a table | surface which shows an example of the measurement result of the light distribution measuring apparatus which concerns on embodiment. It is a table | surface which shows an example of the optical characteristic measurement result in embodiment. It is a table | surface which shows an example of the result of having corrected the optical characteristic measurement result in embodiment. It is a table | surface which shows an example of the result of having evaluated the optical characteristic nonuniformity using the correction result in embodiment.

  Embodiments of the present invention will be described below with reference to the drawings.

  FIG. 1 is a perspective view conceptually showing a main part configuration of the optical characteristic unevenness measuring apparatus according to this embodiment. FIGS. 2A and 2B are diagrams conceptually showing the configuration of the main part of the optical characteristic unevenness measuring apparatus. FIG. 2A is a side view and FIG. FIG. 3 is a block diagram showing a configuration of a main part of the optical characteristic unevenness measuring apparatus.

  As shown in FIGS. 1 to 3, the optical characteristic unevenness measuring apparatus 100 of this embodiment includes an imaging unit 110 and a personal computer 120. In this embodiment, the optical characteristic unevenness measuring apparatus 100 is used to measure the optical characteristic value of the measuring object 200.

  The imaging unit 110 images a plurality of measurement points P (−2−2) to P (22) arranged on the surface of the measurement object 200 and detects a characteristic value of light incident from these measurement points. To do.

  In this embodiment, an XYZ camera is used as the imaging unit 110. An XYZ camera is a camera that generates image data as tristimulus values in the XYZ color system. The XYZ color system is a standard color system approved by the International Commission on Illumination (CIE) and is considered to be a color system closer to human vision than the RGB color system. However, another type of imaging device such as an RGB camera can be used as the imaging unit.

  The imaging unit 110 detects the optical characteristic value at each measurement point from the captured image and outputs it to the outside. In this embodiment, as light characteristic values, x (= X / (X + Y + Z)) and y (= Y / Y) among the component ratios of the X value, Y value, and Z value, which are tristimulus values of the XYZ color system. (X + Y + Z)) is measured.

  The personal computer 120 inputs the x value and the y value acquired from the imaging unit 110 and performs correction processing. For this purpose, the personal computer 120 includes a storage unit 121 and a correction calculation unit 122.

  The storage unit 121 stores correction data corresponding to each measurement point P (−2−2) to P (22). The correction data is determined according to the emission angle of light reaching the imaging unit 110 from each measurement point. Details of the correction data will be described later.

  The correction calculation unit 122 corrects the measured characteristic values (x value and y value) using the correction data. With this correction, in this embodiment, the optical characteristic values of all the measurement points P (−2−2) to P (22) are converted into characteristic values of light emitted at a reference radiation angle. Details of the correction calculation will be described later.

  As the measuring object 200, for example, an LED mounting board for an LED illuminator is employed. In this embodiment, a measurement object 200 is obtained by integrally manufacturing a plurality (here, five) of LED mounting boards 200-1 to 200-5. A large number of LED light sources 211 are provided on each of the LED mounting boards 200-1 to 200-5. In this embodiment, an arbitrary LED light source 211 is selected from these LED light sources 211 and set as measurement points P (−2−2) to P (22). The greater the number of measurement points, the more accurately the variation in optical characteristics can be measured. Each LED light source 211 may be composed of one LED element, or may be composed of two or more LED elements.

  As will be described later, in this embodiment, the light characteristic unevenness is individually evaluated for each of the LED mounting boards 200-1 to 200-5 of the measurement object 200. Then, the LED mounting boards 200-1 to 200-5 are cut after the evaluation and only those that are evaluated as non-defective products are adopted as products.

  FIG. 4 is a conceptual diagram showing the configuration of the light distribution measuring apparatus 400 used in this embodiment. As will be described later, the light distribution measuring apparatus 400 is used to generate correction data (an angle correction matrix in this embodiment).

  As shown in FIG. 4, the light distribution measurement device 400 includes a light source support unit 410 and a measurement unit 420.

  The light source support unit 410 includes a horizontal rotation stage 411 that rotates in the horizontal direction. An upright arm 412 is fixed to the rotation center of the horizontal rotation stage 411. Further, a vertical rotation stage 413 that rotates in the vertical direction is fixed to the upper end of the upright arm 412. An LED light source 401 for correction value measurement is supported at the rotation center of the vertical rotation stage 412. As the LED light source 401, the same type of LED element as that used for the measurement object 200 (that is, the LED mounting boards 200-1 to 200-5) is used.

  On the other hand, the measurement unit 420 includes an XY stage 421 that can move in the horizontal direction. An upright arm 422 is fixed to the XY stage 421. Further, a light receiver 423 is supported on the upper end of the upright arm 422. The light receiver 423 receives the emitted light from the LED light source 401. The light received by the light receiver 423 is input to the spectroscope 425 through the optical fiber 424. The spectroscope 425 includes an optical sensor (not shown) for each frequency, and photoelectrically converts input light. An electric signal generated by the photoelectric conversion is sent to the personal computer 427 through the signal line 426. The personal computer 427 detects the tristimulus values X, Y, and Z of the XYZ color system based on the input signal, and further calculates the x value and the y value from these values X, Y, and Z.

  According to the light distribution measuring apparatus 400, the rotation stages 411 and 412 are rotated to change the inclination of the LED light source 401, whereby a desired radiation angle of the LED light source 401 (measurement provided on the measurement target 200) is measured. It is possible to measure the optical characteristics of the points P (−2−2) to P (22) with respect to the horizontal radiation angle φ and the radiation angle corresponding to the vertical radiation angle θ.

  Next, a procedure for evaluating optical characteristic unevenness using the apparatus according to this embodiment will be described.

  As will be described later, in this embodiment, the light characteristics (here, x value and y value) are individually measured and corrected for each of the LED mounting boards 200-1 to 200-5.

  For example, for the LED mounting substrate 200-1, the measurement points P (-2-2), P (-1-2), P (0-2), P (1-2), and P (2-2) are measured. Each of the light characteristics is measured. Of these, the measurement results at measurement points P (−2−2), P (−1−2), P (1−2), and P (2−2) are used as measurement points P (0 -2). That is, the measurement results at the measurement points P (−2−2), P (−1−2), P (1−2), and P (2−2) are the radiation angles corresponding to P (0 −2). The light characteristic value is corrected. As a result, variation in the optical characteristics of the LED mounting substrate 200-1 can be accurately evaluated.

  The same applies to the other LED mounting substrates 200-2 to 200-5, and the measurement points P (0-1), P (0 0), P (0 1), P (0) where the vertical angle θ is 0 °. By correcting the measurement results at other measurement points corresponding to 2), the optical characteristic variation can be accurately evaluated.

  Thus, in this embodiment, each measurement point P (0-2), P (0-1), P (0 0), P (0 1), where the vertical radiation angle θ is 0 °, The radiation angle corresponding to P (02) is defined as “reference radiation angle”.

  Hereinafter, an example of a specific measurement and correction method will be described.

  First, a method for generating an angle correction matrix (correction data of the present invention) will be described.

  When generating the angle correction matrix, first, using the light distribution measuring device 400, the optical characteristic values (x value and y value) are measured while changing the angle of the correction value measuring LED light source 401.

  In this embodiment, the horizontal radiation angles are φ = −20 °, −10 °, 0 °, 10 °, 20 ° and the vertical radiation angles θ = −20 °, −10 °, 0 °, 10 °. , 20 °, tristimulus values X, Y, and Z were measured for each combination, and x and y values were calculated from the measurement results.

  Next, an angle correction matrix is created using this measurement result.

  In this embodiment, for each of the x value and the y value, a matrix value indicating a ratio between a value at a reference radiation angle and a value at another radiation angle is obtained and used as correction data.

  As can be understood from the above description, in this embodiment, (φ, θ) = (0 °, −20 °), (0 °, −10 °), (0 °, 0 °), (0 °, 10 °) and (0 °, 20 °) are used as reference radiation angles.

  Here, the case where an angle correction matrix of the LED mounting substrate 200-3 (see FIG. 1) is created (that is, the reference radiation angle is (φ, θ) = (0 °, 0 °)) is taken as an example. explain.

  An angle correction matrix for correcting the measurement points P (1 0) and P (2 0) is calculated using the following arithmetic expression.

In the following formula, A is a matrix element indicating the x value and y value when (φ, θ) = (0 °, 10 °), and B is (φ, θ) = (0 °, 20 °). C is a matrix element indicating the x and y values when (φ, θ) = (0 °, 0 °). In these matrix elements, xa, xb, and xc are (φ, θ) = (0 °, 10 °), (0 °, 20 °), (0 °, 0) obtained by the light distribution measuring apparatus 400. X) at the time of (°). Further, ya, yb, yc are obtained by the light distribution measuring device 400 when (φ, θ) = (0 °, 10 °), (0 °, 20 °), (0 °, 0 °). Y value.

By substituting these matrix elements into the following equation and further substituting the x and y values shown in the table of FIG. 5, the following 2 × 2 angle correction matrix ΔC can be obtained. . With this matrix, the measurement result of the x value and y value corresponding to (φ, θ) = (0 °, 10 °) and the x value corresponding to (φ, θ) = (0 °, 20 °), y The measurement result of the value can be corrected simultaneously.

  Similarly, x value corresponding to (φ, θ) = (0 °, −10 °), measurement result of y value and x value corresponding to (φ, θ) = (0 °, −20 °), An angle correction matrix for simultaneously correcting the measurement result of the y value is created.

  In addition, an angle correction matrix in a case other than φ = 0 ° can be generated in the same manner.

  It is also possible to create an angle correction matrix for the horizontal radiation angle φ that is not measured by the light distribution measuring device 400 as follows.

  For example, assuming that the angle correction matrix when φ = 0 is ΔC0 and the angle correction matrix when φ = 10 ° is ΔC10, these angle correction matrices ΔC0 and ΔC10 can be expressed by the following equations.

Then, the angle correction matrix ΔC5 when φ = 5 ° can be obtained by the following calculation.

  Similarly to this, it is also possible to calculate an angle correction matrix of the vertical radiation angle θ that has not been measured.

  In this way, by obtaining a part of the angle correction matrix by calculation, the processing for obtaining the angle correction matrix can be simplified. However, in order to improve the reliability of the optical characteristic unevenness, it is desirable that the angle correction matrix obtained from the measurement result is large.

  The angle correction matrix obtained as described above is stored in the storage unit 121 (see FIG. 3) of the personal computer 120.

  In this embodiment, since the angle correction matrix is created using the matrix, correction calculation processing (described later) can be simplified.

  Here, an angle correction matrix in a matrix format has been created. For example, for each of the x value and the y value, by simply calculating the ratio between the value of the reference radiation angle and the value of the other radiation angle, It is also possible to obtain an angle correction matrix.

  Next, the procedure for measuring the optical characteristic unevenness of the measuring object 200 using the optical characteristic unevenness measuring apparatus 100 (see FIGS. 1 to 3) according to this embodiment will be described.

  As described above, in this embodiment, the LED illuminator LED mounting boards 200-1 to 200-5 are used as the measurement object 200, and the x and y values of the XYZ color system are measured as optical characteristics. .

  First, the imaging unit 110 is arranged so as to be positioned in the normal direction of the measurement object 200 serving as a reference.

  At this time, the position and direction of the imaging unit 110 are adjusted so that the LED light emitted from the measurement point P (00) is perpendicularly incident on the normal direction.

  Furthermore, the distance of the imaging unit 110 is such that the incident angle of light emitted from the measurement points P (−2−2) to P (22) is equal to the emission angle (horizontal emission angle φ) of the angle correction matrix described above. And the vertical radiation angle θ).

  Subsequently, among the measurement object 200, the LED mounted on the leftmost LED mounting board 200-1 is turned on. And the emitted light of this LED mounting substrate 200-1 is imaged by the imaging part 110. FIG. Thereafter, the LED of the LED mounting substrate 200-1 is turned off.

  The imaging unit 110 detects the x and y values of the XYZ color system from the incident light on each pixel. FIG. 6 is a table showing an example of the detection result. In FIG. 6, LED mounting substrates 1 to 5 correspond to the LED mounting substrates 200-1 to 200-5 in FIG. 1 (the same applies to FIGS. 7 and 8).

  Then, the imaging unit 110 sends the x value and the y value corresponding to each pixel to the correction calculation unit 122 of the personal computer 120.

  Based on information such as the x value and y value corresponding to each pixel, the correction calculation unit 122 measures the measurement points P (−2−2), P (−1−2), and P (−2) of the LED mounting substrate 200-1. 0-2), P (1-2), P (2-2) are specified. And among the specified measurement points, the x value and y value of the measurement points P (−2−2), P (−1−2), P (1−2) and P (2−2) are Correction is performed as follows.

  In this correction calculation, the correction calculation unit 122 first reads a corresponding angle correction matrix from the storage unit 121. Here, angle correction matrices ΔCa and ΔCb corresponding to φ = −20 ° are read out.

And the correction calculation of measurement point P (0-2), P (0 -1), P (0 1), P (02) is performed by performing the following calculation. In the following equation, x1, x2, x3, x4 are the x values of measurement points P (0-2), P (0-1), P (01), P (02), y1, y2, y3 , Y4 are y values of measurement points P (0-2), P (0-1), P (01), and P (02).

  In this way, the correction calculation for the measurement points P (0-2) to P (02) of the uppermost LED mounting substrate 200-1 is completed.

  These correction calculation results indicate that the LED light source 211 corresponding to each of the measurement points P (−2−2) to P (22) of the LED mounting substrate 200-1 is the reference radiation angle (that is, (φ, θ) = It corresponds to the x value and y value when measured from (in the direction of 0 °, −20 °). Therefore, by comparing these correction calculation results between the measurement points, the optical characteristic unevenness of the x value and the y value can be accurately evaluated. In addition, since the measurement points P (−2−2) to P (22) are simultaneously imaged, it is possible to evaluate the unevenness of the light characteristics in a short time.

  Next, for the second and subsequent LED mounting substrates 200-2 to 200-5, the LED light sources 211 are sequentially turned on, and the same imaging and correction calculation processing as in the case of the LED mounting substrate 200-1 are performed. FIG. 7 is an example of values obtained by correcting the x value and the y value (see FIG. 7) in this way.

  Thereafter, with respect to the corrected optical characteristic values of the respective LED mounting substrates 200-1 to 200-5, values corresponding to the reference radiation angle (x value and y value when θ = 0 °) and other values, Each difference is calculated. Thereby, the optical characteristic nonuniformity for every LED mounting substrate 200-1 to 200-5 can be evaluated. FIG. 8 is a table showing the results of this calculation.

  In this embodiment, since an angle correction matrix is created for each horizontal radiation angle φ, the position and angle of the imaging unit 110 can be changed even when imaging is performed on the second and subsequent LED mounting substrates 200-2 to 200-5. There is no need to adjust. Therefore, according to this embodiment, the unevenness evaluation of the x value and the y value can be accurately performed in a short time.

  In addition, the LED light sources 211 of all the LED mounting boards 200-1 to 200-5 are not turned on at the same time, but are sequentially turned on one by one to take images, thereby suppressing the power supply capacity of the optical characteristic unevenness measuring device to be small. Can do.

  However, the LED light sources 211 of all the LED mounting boards 200-1 to 200-5 may be turned on simultaneously. Further, the LED mounting substrates may be sequentially turned on by a predetermined number (two or more). In these cases, the measurement time can be further shortened.

  Further, the LED mounting substrates 200-1 to 200-5 are imaged a plurality of times, and the result of correcting the total of the x value and y value obtained by the imaging by the correction calculation unit 122 is used to obtain the optical characteristics. You may evaluate unevenness. Thereby, evaluation with higher reliability can be performed.

  According to the present invention, since the light characteristic value is the x value and the y value of the XYZ color system, it is possible to measure the light characteristic unevenness in accordance with human vision.

  In this embodiment, the case where the present invention is applied to the evaluation of the unevenness of the optical characteristics of the LED mounting board for an LED illuminator has been described. However, the present invention is not limited to this, and any apparatus that emits, reflects, or transmits light can be used. It can also be applied to the evaluation of unevenness of optical characteristics of such a device.

  In this embodiment, the horizontal radiation angle φ and the vertical radiation angle θ are set to 0 °, ± 10 °, and ± 20 °, but these angles are arbitrary. However, the accuracy of the optical characteristic unevenness can be improved as the angle interval is made finer.

  In this embodiment, the LED mounting substrates 200-1 to 200-5 are arranged in the horizontal direction, a measurement point serving as a reference is provided for each column in the vertical direction, and light characteristic unevenness is measured and evaluated for each column in the vertical direction. However, the unevenness of optical characteristics may be measured and evaluated for each column in the horizontal direction. It is also possible to measure and evaluate optical characteristic unevenness of a plurality of columns or the entire measurement object 200 by providing a reference measurement point for each of the plurality of lines or by providing only one measurement object 200 as a whole. It is.

  In this embodiment, the x and y values of the XYZ color system are evaluated. However, the present invention can also be applied to the evaluation of other light characteristics such as the three primary colors and the luminance of the RGB color system.

DESCRIPTION OF SYMBOLS 100 Optical characteristic nonuniformity measuring apparatus 110 Imaging part 120,427 Personal computer 121 Memory | storage part 122 Correction | amendment calculating part 200 Measuring object 200-1 to 200-5 LED mounting board 211 LED light source 400 Light distribution measuring apparatus 401 LED light source for correction value measurement 410 Light source support unit 411 Horizontal rotation stage 412, 422 Upright arm 413 Vertical rotation stage 420 Measurement unit 421 XY stage 423 Light receiver 424 Optical fiber 425 Spectrometer 426 Signal line

Claims (12)

An imaging unit that images a plurality of measurement points provided on the surface of each of the plurality of measurement objects arranged, and detects a characteristic value of light incident from the measurement points;
A reference measurement point is determined for each measurement object from among the measurement points, and the characteristic value of the other measurement point corresponds to the radiation angle of light incident on the imaging unit from the measurement point. A storage unit for storing correction data for executing a process of correcting to a value at the same time as the incident angle of the reference measurement point ;
A correction operation unit that corrects the characteristic value of the other measurement point using the correction data; and
By measuring the characteristic value of the other measurement point after correction with the characteristic value of the corresponding reference measurement point, optical characteristic unevenness for each measurement object is measured.
An optical characteristic unevenness measuring apparatus characterized by that . The correction data is
Measure the characteristic values of the light distribution measurement light source while changing the radiation angle,
Using these multiple measurement results, respectively calculate the ratio of the measurement result at the reference radiation angle and the measurement result at another radiation angle,
The optical characteristic unevenness measuring apparatus according to claim 1, wherein the optical characteristic unevenness measuring apparatus is generated.   The correction data corresponding to any one of the other measurement points is calculated using the measurement result and the radiation angle corresponding to any two of the measurement points. Optical characteristic unevenness measuring device. The imaging unit, the optical characteristic unevenness measuring apparatus according to any one of claims 1 to 3, characterized in that simultaneously imaging all of the measurement points of all the measurement object. In the state where only a predetermined number of the measurement objects are emitted from the array of the plurality of measurement objects, the imaging unit simultaneously sets all the measurement points of the predetermined number of measurement objects. 4. The method according to claim 1, wherein after the imaging, all the measurement points of all the measurement objects are imaged by repeating the process of terminating the light emission of the predetermined number of measurement objects. The optical characteristic unevenness measuring apparatus according to claim 1 . 6. The uneven light characteristic according to claim 1, wherein the plurality of arrayed measurement objects are a plurality of LED mounting substrates that are integrally manufactured in an aligned state. measuring device. An imaging step of imaging a plurality of measurement points provided on the surfaces of the plurality of measurement objects arranged by the imaging unit and detecting a characteristic value of light incident from the measurement points;
A reference measurement point is determined for each measurement object from among the measurement points, and the characteristic value of the other measurement point corresponds to the radiation angle of light incident on the imaging unit from the measurement point. A correction calculation step for correcting to a value when it is the same as the incident angle of the reference measurement point ;
A light characteristic unevenness calculating step of comparing the characteristic value of the other measurement point after correction with the characteristic value of the corresponding reference measurement point;
A method for measuring unevenness of optical characteristics. The correction data is
Measure the characteristic values of the light distribution measurement light source while changing the radiation angle,
Using these multiple measurement results, respectively calculate the ratio of the measurement result at the reference radiation angle and the measurement result at another radiation angle,
The optical characteristic unevenness measuring method according to claim 7, wherein   The correction data corresponding to any one of the other measurement points is calculated using the measurement result and the radiation angle corresponding to any two of the measurement points. Method for measuring unevenness of optical characteristics. Light characteristics unevenness measuring method according to any one of claims 7 to 9, characterized in that said imaging step is a step of simultaneously imaging all of the measurement points of all the measurement object. In the state in which the imaging step causes only a predetermined number of the measurement objects to emit light among the plurality of measurement objects arranged in the array, all the measurement points of the predetermined number of measurement objects are simultaneously measured. after imaging, by repeating the process to terminate the light emission of said predetermined authentic book number of the measurement object, to claim 7, characterized in that a step of imaging all of the measurement points of all of the measurement object 10. The method for measuring unevenness in optical characteristics according to any one of 9 above. The uneven light characteristic according to claim 7, wherein the plurality of measurement objects arranged are a plurality of LED mounting boards manufactured integrally in an aligned state. Measuring method.

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