JP5822669B2 - Copper foil for producing graphene and method for producing graphene using the same - Google Patents

Copper foil for producing graphene and method for producing graphene using the same Download PDF

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JP5822669B2
JP5822669B2 JP2011250982A JP2011250982A JP5822669B2 JP 5822669 B2 JP5822669 B2 JP 5822669B2 JP 2011250982 A JP2011250982 A JP 2011250982A JP 2011250982 A JP2011250982 A JP 2011250982A JP 5822669 B2 JP5822669 B2 JP 5822669B2
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JP2012183583A (en
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喜寛 千葉
喜寛 千葉
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JX Nippon Mining and Metals Corp
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Priority to ES12747854.3T priority patent/ES2639917T3/en
Priority to US15/432,383 priority patent/USRE47195E1/en
Priority to EP12747854.3A priority patent/EP2664580B1/en
Priority to CN201280008963.5A priority patent/CN103370275B/en
Priority to KR1020137021614A priority patent/KR101514909B1/en
Priority to US13/985,931 priority patent/US9260310B2/en
Priority to PCT/JP2012/053945 priority patent/WO2012111840A1/en
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Description

本発明は、グラフェンを製造するための銅箔基材、及びそれを用いたグラフェンの製造方法に関する。   The present invention relates to a copper foil base material for producing graphene, and a method for producing graphene using the same.

グラファイトは平らに並んだ炭素6員環の層がいくつも積み重なった層状構造をもつが、その単原子層〜数原子層程度のものはグラフェン又はグラフェンシートと呼ばれる。グラフェンシートは独自の電気的、光学的及び機械的特性を有し、特にキャリア移動速度が高速である。そのため、グラフェンシートは、例えば、燃料電池用セパレータ、透明電極、表示素子の導電性薄膜、無水銀蛍光灯、コンポジット材、ドラッグデリバリーシステム(DDS)のキャリアーなど、産業界での幅広い応用が期待されている。   Graphite has a layered structure in which a number of flat carbon 6-membered ring layers are stacked, and those having a single atomic layer to several atomic layers are called graphene or graphene sheets. Graphene sheets have unique electrical, optical and mechanical properties, and in particular have a high carrier moving speed. Therefore, graphene sheets are expected to have a wide range of applications in the industry, such as fuel cell separators, transparent electrodes, conductive thin films for display elements, mercury-free fluorescent lamps, composite materials, and drug delivery system (DDS) carriers. ing.

グラフェンシートを製造する方法として、グラファイトを粘着テープで剥がす方法が知られているが、得られるグラフェンシートの層数が一定でなく、大面積のグラフェンシートが得難く、大量生産にも適さないという問題がある。
そこで、シート状の単結晶グラファイト化金属触媒上に炭素系物質を接触させた後、熱処理することによりグラフェンシートを成長させる技術(化学気相成長(CVD)法)が開発されている(特許文献1)。この単結晶グラファイト化金属触媒としては、Ni、Cu、Wなどの金属基板が記載されている。
同様に,NiやCuの金属箔やSi基板上に形成した銅層上に化学気相成長法でグラフェンを製膜する技術が報告されている.なお,グラフェンの製膜は1000℃程度で行われる(非特許文献1)。
As a method of producing a graphene sheet, a method of peeling graphite with an adhesive tape is known, but the number of layers of the obtained graphene sheet is not constant, it is difficult to obtain a large area graphene sheet, and it is not suitable for mass production There's a problem.
Thus, a technique (chemical vapor deposition (CVD) method) has been developed in which a graphene sheet is grown by bringing a carbon-based material into contact with a sheet-like single crystal graphitized metal catalyst and then performing heat treatment (Patent Literature). 1). As this single crystal graphitized metal catalyst, a metal substrate of Ni, Cu, W or the like is described.
Similarly, a technique for forming graphene by chemical vapor deposition on a copper layer formed on a Ni or Cu metal foil or Si substrate has been reported. The graphene film is formed at about 1000 ° C. (Non-patent Document 1).

特開2009−143799号公報JP 2009-143799 A

SCIENCE Vol.324 (2009) P1312-1314SCIENCE Vol.324 (2009) P1312-1314

しかしながら、特許文献1のように単結晶の金属基板を製造することは容易でなく極めて高コストであり、又、大面積の基板が得られ難く、ひいては大面積のグラフェンシートが得難いという問題がある。一方,非特許文献1には、Cuを基板として使用することが記載されているが,Cu箔上では短時間にグラフェンが面方向に成長せず,Si基板上に形成したCu層を焼鈍で粗大粒として基板としている。この場合、グラフェンの大きさはSi基板サイズに制約され,製造コストも高い。
すなわち、本発明は、大面積のグラフェンを低コストで生産可能なグラフェン製造用銅箔及びそれを用いたグラフェンの製造方法の提供を目的とする。
However, as in Patent Document 1, it is not easy to manufacture a single crystal metal substrate, which is extremely expensive, and it is difficult to obtain a large-area substrate, and thus it is difficult to obtain a large-area graphene sheet. . On the other hand, Non-Patent Document 1 describes that Cu is used as a substrate, but graphene does not grow in the surface direction in a short time on the Cu foil, and the Cu layer formed on the Si substrate is annealed. The substrate is formed as coarse particles. In this case, the size of graphene is limited by the Si substrate size, and the manufacturing cost is high.
That is, an object of the present invention is to provide a copper foil for producing graphene capable of producing large-area graphene at low cost and a method for producing graphene using the same.

本発明のグラフェン製造用銅箔は、圧延平行方向及び圧延直角方向の60度光沢度が共に500%以上であり、水素を20体積%以上含有し残部アルゴンの雰囲気中で1000℃で1時間加熱後の平均結晶粒径が200μm以上である。   The copper foil for producing graphene of the present invention has a 60 ° gloss in the parallel and perpendicular directions of rolling of 500% or more, contains 20% by volume or more of hydrogen, and is heated at 1000 ° C. for 1 hour in the atmosphere of the remaining argon. The later average crystal grain size is 200 μm or more.

前記平均結晶粒径が400μm以上であることが好ましく、900μm以上であることが更に好ましく、表面の算術平均粗さRaが0.05μm以下であることが好ましい。   The average crystal grain size is preferably 400 μm or more, more preferably 900 μm or more, and the arithmetic average roughness Ra of the surface is preferably 0.05 μm or less.

又、本発明のグラフェン製造用銅箔は、水素を20体積%以上含有し残部アルゴンの雰囲気中で1000℃で1時間加熱後の平均結晶粒径が200μm以上であり、表面の算術平均粗さRaが0.05μm以下である。表面の算術平均粗さRaが0.03μm以下であることが好ましい。

Further, the copper foil for producing graphene of the present invention contains 20% by volume or more of hydrogen, and the average crystal grain size after heating for 1 hour at 1000 ° C. in the atmosphere of the remaining argon is 200 μm or more, and the arithmetic average roughness of the surface Ra is 0.05 μm or less. The arithmetic average roughness Ra of the surface is preferably 0.03 μm or less.

本発明のグラフェン製造用銅箔において、JIS-H3100又はJIS-H3250に規格するタフピッチ銅、JIS-H3100若しくはJIS−H3510に規格する無酸素銅、又は前記タフピッチ銅若しくは前記無酸素銅に対してSn及びAgの群から選ばれる1種以上の元素を0.050質量%以下含有することが好ましい。   In the copper foil for graphene production of the present invention, Sn is tough pitch copper specified in JIS-H3100 or JIS-H3250, oxygen-free copper specified in JIS-H3100 or JIS-H3510, or the tough pitch copper or the oxygen-free copper. And it is preferable to contain 0.050 mass% or less of 1 or more types of elements chosen from the group of Ag.

本発明のグラフェンの製造方法は、前記グラフェン製造用銅箔を用い、所定の室内に、加熱した前記グラフェン製造用銅箔を配置すると共に炭素含有ガスを供給し、前記グラフェン製造用銅箔の表面にグラフェンを形成するグラフェン形成工程と、前記グラフェンの表面に転写シートを積層し、前記グラフェンを前記転写シート上に転写しながら、前記グラフェン製造用銅箔をエッチング除去するグラフェン転写工程と、を有する。   The method for producing graphene of the present invention uses the copper foil for producing graphene, arranges the heated copper foil for producing graphene in a predetermined chamber and supplies a carbon-containing gas, and the surface of the copper foil for producing graphene A graphene forming step of forming graphene on the surface, and a graphene transfer step of laminating a transfer sheet on the surface of the graphene and transferring the graphene onto the transfer sheet while removing the graphene-producing copper foil by etching .

本発明によれば、大面積のグラフェンを低コストで生産可能とする銅箔が得られる。   ADVANTAGE OF THE INVENTION According to this invention, the copper foil which can produce a large area graphene at low cost is obtained.

本発明の実施形態に係るグラフェンの製造方法を示す工程図である。It is process drawing which shows the manufacturing method of the graphene which concerns on embodiment of this invention.

以下、本発明の実施形態に係るグラフェン製造用銅箔について説明する。なお、本発明において%とは、特に断らない限り、質量%を示すものとする。   Hereinafter, the copper foil for graphene manufacture which concerns on embodiment of this invention is demonstrated. In the present invention, “%” means “% by mass” unless otherwise specified.

<組成>
グラフェン製造用銅箔としては、JIS-H3250若しくはJIS-H3100に規格するタフピッチ銅(TPC)、又はJIS-H3510若しくはJIS−H3100に規格する無酸素銅(OFC)を用いることができる。
又、これらタフピッチ銅又は無酸素銅に対し、Sn及びAgの群から選ばれる1種以上の元素を0.050質量%以下含有する組成を用いることもできる。上記元素を含有すると、銅箔の強度が向上し適度な伸びを有すると共に、結晶粒径を大きくすることができる。上記元素の含有割合が0.050質量%を超えると強度は更に向上するものの、伸びが低下して加工性が悪化すると共に結晶粒径の成長が抑制される場合がある。より好ましくは上記元素の含有割合が0.040質量%以下である。
なお、上記元素の含有割合の下限は特に制限されないが、例えば0.005質量%を下限とすることができる。上記元素の含有割合が0.005質量%未満であると、含有割合が小さいためその含有割合を制御することが困難になる場合がある。
<Composition>
As the copper foil for producing graphene, tough pitch copper (TPC) standardized to JIS-H3250 or JIS-H3100, or oxygen-free copper (OFC) standardized to JIS-H3510 or JIS-H3100 can be used.
Moreover, the composition which contains 0.050 mass% or less of 1 or more types of elements chosen from the group of Sn and Ag with respect to these tough pitch copper or oxygen-free copper can also be used. When the above elements are contained, the strength of the copper foil is improved, the film has an appropriate elongation, and the crystal grain size can be increased. If the content of the element exceeds 0.050% by mass, the strength is further improved, but the elongation is lowered and the workability is deteriorated and the growth of the crystal grain size may be suppressed. More preferably, the content of the element is 0.040% by mass or less.
In addition, the lower limit of the content ratio of the element is not particularly limited, but 0.005% by mass can be set as the lower limit, for example. When the content ratio of the element is less than 0.005% by mass, it may be difficult to control the content ratio because the content ratio is small.

<厚み>
グラフェン製造用銅箔の厚みは特に制限されないが、一般的には5〜150μmである。さらに、ハンドリング性を確保しつつ、後述するエッチング除去を容易に行うため、銅箔の厚みを12〜50μmとすると好ましい。グラフェン製造用銅箔の厚みが12μm未満であると、破断し易くなってハンドリング性に劣り、厚みが50μmを超えるとエッチング除去がし難くなる場合がある。
<Thickness>
The thickness of the graphene-producing copper foil is not particularly limited, but is generally 5 to 150 μm. Furthermore, it is preferable to set the thickness of the copper foil to 12 to 50 μm in order to easily perform the etching removal described later while ensuring the handleability. When the thickness of the copper foil for producing graphene is less than 12 μm, it is easy to break and the handling property is inferior, and when the thickness exceeds 50 μm, it may be difficult to remove by etching.

<60度光沢度>
グラフェン製造用銅箔の圧延平行方向及び圧延直角方向の60度光沢度(JIS Z 8741)が共に500%以上である。
後述するように、本発明のグラフェン製造用銅箔を用いてグラフェンを製造した後、銅箔から転写シートへグラフェンを転写する必要があるが、銅箔の表面が粗いと転写がし難く、グラフェンが破損することがわかった。そこで、銅箔の表面凹凸を表す指標として、60度光沢度を規定する。
圧延平行方向及び圧延直角方向の60度光沢度のいずれかが500%未満であると、転写の際にグラフェンが破損する。圧延平行方向及び圧延直角方向の60度光沢度の上限は特に制限されないが、実用上、800%程度が上限である。
又、このように転写シートへグラフェンを転写し易くするため、JIS B0601に規格するグラフェン製造用銅箔表面の算術平均粗さRaが0.05μm以下であることが好ましく、Raが0.03μm以下であることがより好ましい。Raの下限は特に限定する必要は無いが、製造することができる銅箔表面のRaの下限値は0.01μm程度であると考えられる。
<60 degree gloss>
Both the 60-degree glossiness (JIS Z 8741) in the rolling parallel direction and the perpendicular direction of rolling of the copper foil for producing graphene is 500% or more.
As will be described later, after producing graphene using the copper foil for producing graphene of the present invention, it is necessary to transfer the graphene from the copper foil to the transfer sheet. However, if the surface of the copper foil is rough, transfer is difficult. Was found to be damaged. Therefore, 60 degree glossiness is defined as an index representing the surface roughness of the copper foil.
If any of the 60 ° gloss in the direction parallel to rolling and the direction perpendicular to rolling is less than 500%, the graphene is damaged during transfer. The upper limit of the 60-degree glossiness in the rolling parallel direction and the direction perpendicular to the rolling direction is not particularly limited, but about 800% is practically the upper limit.
In order to facilitate the transfer of graphene to the transfer sheet as described above, the arithmetic average roughness Ra of the copper foil surface for producing graphene specified in JIS B0601 is preferably 0.05 μm or less, and Ra is 0.03 μm or less. It is more preferable that The lower limit of Ra need not be particularly limited, but the lower limit of Ra on the copper foil surface that can be produced is considered to be about 0.01 μm.

<平均結晶粒径>
グラフェン製造用銅箔を、水素を20体積%以上含有し残部アルゴンの雰囲気中で1000℃で1時間加熱後の平均結晶粒径が200μm以上である。
グラフェン製造用銅箔の平均結晶粒径が200μmより小さいと、グラフェン製造用銅箔の表面にグラフェンを成長させる際の障害となり、面方向にグラフェンが成長し難くなる。これは、結晶粒界がグラフェンの成長の障害となるためと考えられる。特に、グラフェン製造用銅箔の平均結晶粒径が900μm以上であると好ましい。
なお、水素を20体積%以上含有し残部アルゴンの雰囲気中での1000℃で1時間の加熱は、グラフェンを製造する際、グラフェン製造用銅箔を炭素含有ガスの分解温度以上に加熱する条件を模したものである。
又、平均結晶粒径は、JIS H0501の切断法により、グラフェン製造用銅箔を測定する。
<Average crystal grain size>
The copper foil for producing graphene contains 20% by volume or more of hydrogen, and the average crystal grain size after heating for 1 hour at 1000 ° C. in the atmosphere of the remaining argon is 200 μm or more.
If the average crystal grain size of the copper foil for producing graphene is smaller than 200 μm, it becomes an obstacle when growing graphene on the surface of the copper foil for producing graphene, and it becomes difficult for graphene to grow in the plane direction. This is presumably because the crystal grain boundaries hinder the growth of graphene. In particular, the average crystal grain size of the copper foil for producing graphene is preferably 900 μm or more.
In addition, heating for 1 hour at 1000 ° C. in an atmosphere of 20% by volume or more of hydrogen and the remainder of argon is a condition for heating the copper foil for producing graphene to the decomposition temperature of the carbon-containing gas or higher when producing graphene. It is imitated.
In addition, the average crystal grain size is measured for a graphene-producing copper foil by the cutting method of JIS H0501.

以上のように規定したグラフェン製造用銅箔を用いることで、大面積のグラフェンを低コストで、かつ高い歩留りで生産することができる。   By using the graphene-producing copper foil defined as described above, large-area graphene can be produced at a low cost and with a high yield.

<グラフェン製造用銅箔の製造>
本発明の実施形態に係るグラフェン製造用銅箔は、例えば以下のようにして製造することができる。まず、所定の組成の銅インゴットを製造し、熱間圧延を行った後、焼鈍と冷間圧延を繰り返し、圧延板を得る。この圧延板を焼鈍して再結晶させ,所定の厚みまで圧下率を80〜99.9%(好ましくは85〜99.9%、更に好ましくは90〜99.9%)として最終冷間圧延して銅箔を得る。
<Manufacture of copper foil for graphene production>
The copper foil for producing graphene according to the embodiment of the present invention can be produced, for example, as follows. First, after manufacturing the copper ingot of a predetermined composition and performing hot rolling, annealing and cold rolling are repeated and a rolled sheet is obtained. The rolled sheet is annealed and recrystallized, and finally cold-rolled to a predetermined thickness of 80 to 99.9% (preferably 85 to 99.9%, more preferably 90 to 99.9%). To obtain copper foil.

ここで、グラフェン製造用銅箔の60度光沢度を500%以上に制御することが重要である。その方法として、最終冷間圧延の最終パスと最終冷間圧延の最終パスの1つ前のパスの両方の油膜当量をいずれも18000以下とする。
圧延銅箔は、一般に油潤滑のもと高速で加工されるが、潤滑油膜が薄くなるほどせん断帯変形が支配的になりやすい。これは金属一般に共通する現象である。なお、せん断帯の存在は、焼鈍した場合の結晶粒の成長にとって好ましいとはいえない。そして、せん断帯の多少あるいは短深は銅箔表面の光沢度で表すことができる。具体的には、圧延時の現象として、ロールと材料の間に導入される油膜が厚いと圧延加工表面にオイルピット(凹凸)を生じるが、油膜が薄ければ材料表面で圧延ロールと接触する面積が増えて自由変形が制限され、オイルピットが発達せず、圧延ロールの平滑な表面プロフィルが転写され、平滑な表面が形成される。このようなことから、油膜を薄くする指標として、油膜当量を18000以下とする。油膜当量が18000を超えると、銅箔表面の60度光沢度が500%未満となる。
Here, it is important to control the 60 degree gloss of the copper foil for producing graphene to 500% or more. As the method, both oil film equivalents of the final pass of the final cold rolling and the pass before the final pass of the final cold rolling are set to 18000 or less.
The rolled copper foil is generally processed at high speed under oil lubrication, but the shear band deformation tends to become dominant as the lubricating oil film becomes thinner. This is a phenomenon common to metals in general. Note that the presence of a shear band is not preferable for the growth of crystal grains when annealed. And the some or short depth of a shear band can be represented by the glossiness of the copper foil surface. Specifically, as a phenomenon during rolling, if the oil film introduced between the roll and the material is thick, oil pits (unevenness) are formed on the rolled surface, but if the oil film is thin, it contacts the rolling roll on the material surface. The area increases and free deformation is limited, oil pits do not develop, the smooth surface profile of the rolling roll is transferred, and a smooth surface is formed. Therefore, the oil film equivalent is set to 18000 or less as an index for thinning the oil film. If the oil film equivalent exceeds 18000, the 60 degree glossiness of the copper foil surface will be less than 500%.

油膜当量は下記式で表される。
(油膜当量)={(圧延油粘度、40℃の動粘度;cSt)×(圧延速度;m/分)}/{(材料の降伏応力;kg/mm2)×(ロール噛込角;rad)}
油膜当量を18000以下とするためには、圧延油粘度(40℃の動粘度)を低く、圧延速度も低く、ロール噛込角(圧下量に対応する)は大きいことが好ましい。例えば、ロール直径250mm以下で表面粗さRarollが0.1μm以下(好ましくは0.01〜0.04μm、更に好ましくは0.01〜0.02μm)に調整された圧延ロールにより、粘度が3〜8cSt(好ましくは3〜5cSt、更に好ましくは3〜4cSt)の圧延油を使用し、圧延速度100〜500m/分(好ましくは200〜450m/分、更に好ましくは250〜400m/分)、パス毎の圧下率10〜60%が挙げられる。又、ロール噛込角は、例えば0.001〜0.04rad、好ましくは0.002〜0.03rad、更に好ましくは0.003〜0.03radである。
The oil film equivalent is represented by the following formula.
(Oil film equivalent) = {(rolling oil viscosity, kinematic viscosity at 40 ° C .; cSt) × (rolling speed; m / min)} / {(yield stress of material; kg / mm 2 ) × (roll biting angle; rad )}
In order to make the oil film equivalent 18000 or less, it is preferable that the rolling oil viscosity (kinematic viscosity at 40 ° C.) is low, the rolling speed is low, and the roll biting angle (corresponding to the reduction amount) is large. For example, the viscosity is 3 by a rolling roll having a roll diameter of 250 mm or less and a surface roughness Ra roll adjusted to 0.1 μm or less (preferably 0.01 to 0.04 μm, more preferably 0.01 to 0.02 μm). -8 cSt (preferably 3-5 cSt, more preferably 3-4 cSt), rolling speed 100-500 m / min (preferably 200-450 m / min, more preferably 250-400 m / min), pass A rolling reduction of 10 to 60% can be mentioned. The roll biting angle is, for example, 0.001 to 0.04 rad, preferably 0.002 to 0.03 rad, and more preferably 0.003 to 0.03 rad.

圧延ロールの表面粗さRarollが0.1μmを超えるとロール表面の凹凸が転写され、材料表面の平滑性が損なわれる。上記条件で圧延することで、オイルピットのない表面平坦部の面積を広くできる。圧延油の粘度が8cStを超えると油膜当量が大きくなり表面光沢が得られず、一方、3cSt未満であると圧延抵抗が大きくなり圧下率を上げることができない。圧延速度500m/分を超えると導入油量が増えるため光沢度が低下し、一方、100m/分未満であると充分な圧下量がとれず、また生産性の観点から不都合である。
圧下率が99.9%を超えると加工硬化がすすむため変形能力がなくなり最終パスの圧下率が確保できなくなり、一方、80%未満であると圧延集合組織が発達せず、表面平滑性が得られない。ロール噛込角が0.04radを超えるとロール周速度と材料速度との差が大きくなり、材料表面の平滑性が損なわれる。一方、0.002rad未満であると圧延ロールと被圧延材料間に入り、潤滑の役割をする油の量が多く、光沢が低下する。
パス毎の圧下率は、例えば20〜40%、好ましくは20〜35%、更に好ましくは25〜35%である。圧下率が35%を超えるとせん断帯が発達してオイルピットが発生し、光沢度が低下する。一方、20%未満であるとパス数が増えるために生産性が悪化する。
When the surface roughness Ra roll of the rolling roll exceeds 0.1 μm, irregularities on the roll surface are transferred, and the smoothness of the material surface is impaired. By rolling under the above conditions, the area of the flat surface portion without oil pits can be increased. If the viscosity of the rolling oil exceeds 8 cSt, the oil film equivalent becomes large and surface gloss cannot be obtained. On the other hand, if it is less than 3 cSt, the rolling resistance increases and the rolling reduction cannot be increased. When the rolling speed exceeds 500 m / min, the amount of introduced oil increases and the glossiness decreases. On the other hand, when the rolling speed is less than 100 m / min, a sufficient amount of reduction cannot be obtained, which is disadvantageous from the viewpoint of productivity.
If the rolling reduction exceeds 99.9%, work hardening proceeds and the deformability is lost, and the rolling reduction in the final pass cannot be secured. On the other hand, if the rolling reduction is less than 80%, the rolling texture does not develop and surface smoothness is obtained. I can't. If the roll bite angle exceeds 0.04 rad, the difference between the roll peripheral speed and the material speed increases, and the smoothness of the material surface is impaired. On the other hand, if it is less than 0.002 rad, the amount of oil that enters between the rolling roll and the material to be rolled and plays the role of lubrication is large, and the gloss is lowered.
The rolling reduction for each pass is, for example, 20 to 40%, preferably 20 to 35%, and more preferably 25 to 35%. When the rolling reduction exceeds 35%, a shear band develops, an oil pit is generated, and the glossiness is lowered. On the other hand, if it is less than 20%, the number of passes increases, so the productivity deteriorates.

又、グラフェン製造用銅箔の60度光沢度を500%以上に制御する別の方法として、最終冷間圧延中の材料温度を高くする方法がある.材料温度を高くすると転位の回復が起こり,せん断帯変形が起きにくくなる。材料温度としては油の潤滑性が損なわれたり,銅箔が再結晶する温度では意味がなく,120℃以下,好ましくは100℃以下であればよい。また、材料温度が50℃以下ではせん断帯変形抑制の効果はほとんどない。   Another method for controlling the 60 degree gloss of the copper foil for producing graphene to 500% or more is to increase the material temperature during the final cold rolling. When the material temperature is raised, dislocation recovery occurs and shear band deformation is less likely to occur. The material temperature is meaningless at the temperature at which oil lubricity is impaired or the copper foil is recrystallized, and may be 120 ° C. or less, preferably 100 ° C. or less. Further, when the material temperature is 50 ° C. or less, there is almost no effect of suppressing shear band deformation.

上記のような方法により、グラフェン製造用銅箔の60度光沢度を500%以上に制御することができる。又、銅箔の60度光沢度が500%以上になると、焼鈍後の結晶粒径が200μm以上になることが判明している。これは、上記した油膜当量や最終冷間圧延中の材料温度を制御し、せん断帯変形を起きにくくすることで、焼鈍後の結晶成長が促進されるためと考えられる。
なお、グラフェン製造用銅箔の60度光沢度を500%以上に制御する方法は上記に限られるものではない。
By the above method, the 60 degree glossiness of the copper foil for producing graphene can be controlled to 500% or more. It has also been found that when the 60-degree glossiness of the copper foil is 500% or more, the crystal grain size after annealing is 200 μm or more. This is presumably because crystal growth after annealing is promoted by controlling the oil film equivalent and the material temperature during the final cold rolling to make shear band deformation difficult to occur.
In addition, the method of controlling the 60 degree glossiness of the copper foil for producing graphene to 500% or more is not limited to the above.

<グラフェンの製造方法>
次に、図1を参照し、本発明の実施形態に係るグラフェンの製造方法について説明する。
まず、室(真空チャンバ等)100内に、上記した本発明のグラフェン製造用銅箔10を配置し、グラフェン製造用銅箔10をヒータ104で加熱すると共に、室100内を減圧又は真空引きする。そして、ガス導入口102から室100内に炭素含有ガスGを供給する(図2(a))。炭素含有ガスGとしては、二酸化炭素、一酸化炭素、メタン、エタン、プロパン、エチレン、アセチレン、アルコール等が挙げられるがこれらに限定されず、これらのうち1種又は2種以上の混合ガスとしてもよい。又、グラフェン製造用銅箔10の加熱温度は炭素含有ガスGの分解温度以上とすればよく、例えば1000℃以上とすることができる。又、室100内で炭素含有ガスGを分解温度以上に加熱し、分解ガスをグラフェン製造用銅箔10に接触させてもよい。
これにより、分解ガス(炭素ガス)がグラフェン製造用銅箔10の表面にグラフェン20を形成する(図2(b))。
<Graphene production method>
Next, with reference to FIG. 1, a method for producing graphene according to an embodiment of the present invention will be described.
First, the graphene producing copper foil 10 of the present invention described above is placed in a chamber (vacuum chamber or the like) 100, the graphene producing copper foil 10 is heated by the heater 104, and the inside of the chamber 100 is decompressed or evacuated. . Then, the carbon-containing gas G is supplied from the gas inlet 102 into the chamber 100 (FIG. 2A). Examples of the carbon-containing gas G include, but are not limited to, carbon dioxide, carbon monoxide, methane, ethane, propane, ethylene, acetylene, alcohol, and the like. Good. Further, the heating temperature of the graphene-producing copper foil 10 may be equal to or higher than the decomposition temperature of the carbon-containing gas G, for example, 1000 ° C. or higher. Further, the carbon-containing gas G may be heated to a decomposition temperature or higher in the chamber 100, and the decomposition gas may be brought into contact with the copper foil 10 for producing graphene.
Thereby, decomposition gas (carbon gas) forms the graphene 20 on the surface of the copper foil 10 for graphene manufacture (FIG.2 (b)).

そして、グラフェン製造用銅箔10を常温に冷却し、グラフェン20の表面に転写シート30を積層し、グラフェン20を転写シート30上に転写する。次に、この積層体をシンクロール120を介してエッチング槽110に連続的に浸漬し、グラフェン製造用銅箔10をエッチング除去する(図2(c))。このようにして、所定の転写シート30上に積層されたグラフェン20を製造することができる。
さらに、グラフェン製造用銅箔10が除去された積層体を引き上げ、グラフェン20の表面に基板40を積層し、グラフェン20を基板40上に転写しながら、転写シート30を剥がすと、基板40上に積層されたグラフェン20を製造することができる。
And the copper foil 10 for graphene manufacture is cooled to normal temperature, the transfer sheet 30 is laminated | stacked on the surface of the graphene 20, and the graphene 20 is transcribe | transferred on the transfer sheet 30. FIG. Next, this laminated body is continuously immersed in the etching tank 110 through the sink roll 120, and the copper foil 10 for graphene production is removed by etching (FIG. 2C). Thus, the graphene 20 laminated on the predetermined transfer sheet 30 can be manufactured.
Furthermore, when the laminated body from which the copper foil 10 for producing graphene is removed is pulled up, the substrate 40 is laminated on the surface of the graphene 20, and the transfer sheet 30 is peeled off while transferring the graphene 20 onto the substrate 40, The stacked graphene 20 can be manufactured.

転写シート30としては、各種樹脂シート(ポリエチレン、ポリウレタン等のポリマーシート)を用いることができる。グラフェン製造用銅箔10をエッチング除去するエッチング液としては、例えば硫酸溶液、過硫酸ナトリウム溶液、過酸化水素、及び過硫酸ナトリウム溶液又は過酸化水素に硫酸を加えた溶液を用いることができる。又、基板40としては、例えばSi、 SiC、Ni又はNi合金を用いることができる。   As the transfer sheet 30, various resin sheets (polymer sheets such as polyethylene and polyurethane) can be used. As an etching solution for etching and removing the copper foil 10 for producing graphene, for example, a sulfuric acid solution, a sodium persulfate solution, hydrogen peroxide, a sodium persulfate solution, or a solution obtained by adding sulfuric acid to hydrogen peroxide can be used. As the substrate 40, for example, Si, SiC, Ni, or Ni alloy can be used.

<試料の作製>
表1に示す組成の銅インゴットを製造し、800〜900℃で熱間圧延を行った後、300〜700℃の連続焼鈍ラインで焼鈍と冷間圧延を1回繰り返して1〜2mm厚の圧延板を得た。この圧延板を600〜800℃の連続焼鈍ラインで焼鈍して再結晶させ,7〜50μmの厚みまで圧下率を95〜99.7%として最終冷間圧延し、実施例1〜15、比較例1〜9の銅箔を得た。
<Preparation of sample>
After producing a copper ingot having the composition shown in Table 1 and performing hot rolling at 800 to 900 ° C., annealing and cold rolling are repeated once in a continuous annealing line at 300 to 700 ° C. to roll a thickness of 1 to 2 mm. I got a plate. This rolled sheet was annealed and recrystallized in a continuous annealing line at 600 to 800 ° C., and finally cold-rolled to a thickness of 7 to 50 μm with a reduction ratio of 95 to 99.7%. Examples 1 to 15 and Comparative Examples 1 to 9 copper foils were obtained.

ここで、最終冷間圧延の最終パスと最終冷間圧延の最終パスの1つ前のパスの両方の油膜当量をいずれも表1に示す値に調整した。
油膜当量は下記式で表される。
(油膜当量)={(圧延油粘度、40℃の動粘度;cSt)×(圧延速度;m/分)}/{(材料の降伏応力;kg/mm2)×(ロール噛込角;rad)}
Here, the oil film equivalents of both the final pass of the final cold rolling and the pass before the final pass of the final cold rolling were adjusted to the values shown in Table 1.
The oil film equivalent is represented by the following formula.
(Oil film equivalent) = {(rolling oil viscosity, kinematic viscosity at 40 ° C .; cSt) × (rolling speed; m / min)} / {(yield stress of material; kg / mm 2 ) × (roll biting angle; rad )}

<60度光沢度の測定>
実施例1〜15、比較例1〜9の銅箔について、最終冷間圧延後、及びその後に水素を20体積%以上含有し残部アルゴンの雰囲気中で1000℃で1時間加熱後の表面の60度光沢度を測定した。
60度光沢度は、JIS−Z8741に準拠した光沢度計(日本電色工業製、商品名「PG-1M」)を使用して測定した。
<Measurement of 60 degree glossiness>
For the copper foils of Examples 1 to 15 and Comparative Examples 1 to 9, 60% of the surface after final cold rolling and after heating at 1000 ° C. for 1 hour in an atmosphere of 20% by volume or more of hydrogen and the balance argon. Glossiness was measured.
The 60 degree glossiness was measured using a gloss meter (trade name “PG-1M” manufactured by Nippon Denshoku Industries Co., Ltd.) in accordance with JIS-Z8741.

<表面粗さ(Ra,Rz,Sm)の測定>
実施例1〜15、比較例1〜9の銅箔について、最終冷間圧延後、及びその後に水素を20体積%以上含有し残部アルゴンの雰囲気中で1000℃で1時間加熱後の表面粗さを測定した。
接触粗さ計(小坂研究所製、商品名「SE−3400」)を使用し、JIS−B0601に準拠した算術平均粗さ(Ra;μm)を測定し、オイルピット深さRzはJIS B0601−1994に準拠して十点平均粗さを測定した。測定基準長さ0.8mm、評価長さ4mm、カットオフ値0.8mm、送り速さ0.1mm/秒の条件で圧延方向と平行に測定位置を変えて10回行ない、各方向で10回の測定での値を求めた。また凹凸の平均間隔(Sm;mm)は、測定基準長さ0.8mm、評価長さ4mm、カットオフ値0.8mm、送り速さ0.1mm/秒の条件で圧延方向と平行に測定位置を変えて10回行ない、10回の測定での値を求めた。なお、Smは表面性状を輪郭曲線方式で表すJIS B0601−2001(ISO4287−1997準拠)において、凹凸の「凹凸の平均間隔」と規定されており、基準長さ内での各凹凸の輪郭長さの平均をいう。
<Measurement of surface roughness (Ra, Rz, Sm)>
About the copper foils of Examples 1 to 15 and Comparative Examples 1 to 9, the surface roughness after final cold rolling and after heating for 1 hour at 1000 ° C. in an atmosphere of argon containing the remaining 20% by volume of hydrogen. Was measured.
Using a contact roughness meter (trade name “SE-3400”, manufactured by Kosaka Laboratories), the arithmetic average roughness (Ra; μm) based on JIS-B0601 was measured, and the oil pit depth Rz was JIS B0601-. Ten-point average roughness was measured according to 1994. The measurement position is changed 10 times in parallel with the rolling direction under the conditions of a measurement standard length of 0.8 mm, an evaluation length of 4 mm, a cut-off value of 0.8 mm, and a feed rate of 0.1 mm / second, and 10 times in each direction. The value in the measurement was obtained. In addition, the average interval of unevenness (Sm; mm) is a measurement position parallel to the rolling direction under the conditions of a measurement reference length of 0.8 mm, an evaluation length of 4 mm, a cut-off value of 0.8 mm, and a feed rate of 0.1 mm / second. The measurement was repeated 10 times, and the values for 10 measurements were obtained. Note that Sm is defined as “average interval of unevenness” in JIS B0601-2001 (conforms to ISO 4287-1997) in which the surface property is expressed by a contour curve method, and the contour length of each unevenness within the reference length. The average of

<平均結晶粒径の測定>
実施例1〜15、比較例1〜9の銅箔について、JIS H0501の切断法により、表面の平均結晶粒径を測定した。
<Measurement of average crystal grain size>
About the copper foil of Examples 1-15 and Comparative Examples 1-9, the average crystal grain diameter of the surface was measured with the cutting method of JISH0501.

<グラフェンの製造>
各実施例の銅箔(縦横100X100mm)を真空チャンバーに設置し、1000℃に加熱した。真空(圧力:0.2Torr)下でこの真空チャンバーにメタンガスを供給し(供給ガス流量:10〜100cc/min)、銅箔を1000℃まで30分で昇温した後、1時間保持し、銅箔表面にグラフェンを成長させた。
各実施例について、上記条件でグラフェンの製造を10回行い、銅箔表面のグラフェンの有無を原子間力顕微鏡(AFM)で観察して評価した。AFMにより、表面全体にうろこ状の凹凸が観察されたものをグラフェンが製造されたものとみなし、10回の製造のうちグラフェンが製造された回数により以下の基準で歩留を評価した。評価が◎、○又は△であれば実用上問題はない。
◎:10回の製造のうち、5回以上グラフェンが製造された
○:10回の製造のうち、4回グラフェンが製造された
△:10回の製造のうち、3回グラフェンが製造された
×:10回の製造のうち、グラフェンが製造された回数が2回以下
<Manufacture of graphene>
The copper foil of each example (length and width 100 × 100 mm) was placed in a vacuum chamber and heated to 1000 ° C. Methane gas is supplied to this vacuum chamber under vacuum (pressure: 0.2 Torr) (supply gas flow rate: 10 to 100 cc / min), and the copper foil is heated to 1000 ° C. in 30 minutes and then held for 1 hour. Graphene was grown on the surface.
About each Example, manufacture of graphene was performed 10 times on the said conditions, and the presence or absence of the graphene on the surface of copper foil was observed and evaluated by atomic force microscope (AFM). The case where scaly irregularities were observed on the entire surface by AFM was regarded as the production of graphene, and the yield was evaluated according to the following criteria based on the number of times graphene was produced out of 10 productions. If the evaluation is ◎, ○ or △, there is no practical problem.
◎: Graphene was produced 5 times or more out of 10 productions ○: Graphene was produced 4 times out of 10 productions △: Graphene was produced 3 times out of 10 productions × : Of 10 times of production, the number of times graphene was produced is 2 times or less

得られた結果を表1に示す。なお、表1において、G60RD、G60TDはそれぞれ圧延平行方向及び圧延直角方向の60度光沢度を示す。又、GSは平均結晶粒径を示す。
又、表中の実施例1〜7、実施例14、実施例15、比較例1〜3、比較例7、9の「TPC」は、JIS-H3100に規格するタフピッチ銅を表す。実施例9〜12、比較例4〜6、比較例8の「OFC」はJIS-H3100に規格する無酸素銅を表す。実施例13のTPCはJIS−H3250に規格するタフピッチ銅を表す。実施例8のOFCはJIS−H3510に規格する無酸素銅を表す。
従って、比較例8の「OFC+Sn1200ppm」は、JIS-H3100に規格する無酸素銅にSnを1200wtppm添加したことを表す。
The obtained results are shown in Table 1. In Table 1, G60 RD and G60 TD indicate 60-degree glossiness in the rolling parallel direction and the rolling perpendicular direction, respectively. GS represents an average crystal grain size.
“TPC” in Examples 1 to 7, Example 14, Example 15, Comparative Examples 1 to 3, and Comparative Examples 7 and 9 in the table represents tough pitch copper standardized to JIS-H3100. “OFC” in Examples 9 to 12, Comparative Examples 4 to 6, and Comparative Example 8 represents oxygen-free copper specified in JIS-H3100. TPC of Example 13 represents tough pitch copper standardized to JIS-H3250. OFC in Example 8 represents oxygen-free copper specified in JIS-H3510.
Therefore, “OFC + Sn 1200 ppm” in Comparative Example 8 represents that 1200 wtppm of Sn was added to oxygen-free copper specified in JIS-H3100.

Figure 0005822669
Figure 0005822669

表1から明らかなように、銅箔の表面の60度光沢度が500%以上であり、水素を20体積%以上含有し残部アルゴンの雰囲気中で1000℃で1時間加熱後の平均結晶粒径が200μm以上である実施例1〜15の場合、グラフェンの製造歩留が優れていた。
特に、水素を20体積%以上含有し残部アルゴンの雰囲気中で1000℃で1時間加熱後の平均結晶粒径が900μm以上である実施例1〜6、8、9、11〜13、15の場合、グラフェンの製造歩留が最も優れていた。又、水素を20体積%以上含有し残部アルゴンの雰囲気中で1000℃で1時間加熱後の平均結晶粒径が400〜900μmである実施例7,10の場合、平均結晶粒径が400μm未満の実施例14に比べ、グラフェンの製造歩留が優れていた。
As is apparent from Table 1, the 60 ° glossiness of the copper foil surface is 500% or more, the average crystal grain size after heating for 1 hour at 1000 ° C. in an atmosphere containing 20% by volume or more of hydrogen and the balance argon. In the case of Examples 1 to 15 having a thickness of 200 μm or more, the graphene production yield was excellent.
In particular, in the case of Examples 1 to 6, 8, 9, 11, 13 and 15 in which 20% by volume or more of hydrogen is contained and the average crystal grain size after heating for 1 hour at 1000 ° C. in the atmosphere of argon is 900 μm or more The graphene production yield was the best. In the case of Examples 7 and 10 in which the average crystal grain size after heating for 1 hour at 1000 ° C. in an atmosphere of argon containing 20% by volume or more of hydrogen is 400 to 900 μm, the average crystal grain size is less than 400 μm. Compared to Example 14, the graphene production yield was excellent.

一方、最終冷間圧延の最終パスと最終冷間圧延の最終パスの1つ前のパスの両方の油膜当量が18000を超え、銅箔自身の表面の60度光沢度が500%未満となった比較例1〜9の場合、グラフェンの製造歩留が劣った。又、比較例1〜9の場合、水素を20体積%以上含有し残部アルゴンの雰囲気中で1000℃で1時間加熱後の平均結晶粒径が200μm未満となったが、これは、最終冷間圧延の油膜当量が多すぎ、せん断帯が生じて結晶粒の成長が抑制されたためと考えられる。   On the other hand, the oil film equivalent of both the final cold rolling final pass and the pass immediately before the final cold rolling pass exceeded 18000, and the 60-degree glossiness of the surface of the copper foil itself was less than 500%. In Comparative Examples 1 to 9, the production yield of graphene was inferior. Further, in the case of Comparative Examples 1 to 9, the average crystal grain size after heating for 1 hour at 1000 ° C. in an atmosphere of argon containing 20% by volume or more of the balance was less than 200 μm. This is considered to be because the rolling oil film equivalent was too much, and a shear band was generated to suppress the growth of crystal grains.

10 グラフェン製造用銅箔
20 グラフェン
30 転写シート
10 Copper foil for graphene production 20 Graphene 30 Transfer sheet

Claims (8)

圧延平行方向及び圧延直角方向の60度光沢度が共に500%以上であり、水素を20体積%以上含有し残部アルゴンの雰囲気中で1000℃で1時間加熱後の平均結晶粒径が200μm以上であるグラフェン製造用銅箔。   The 60 degree gloss in the direction parallel to the rolling direction and the direction perpendicular to the rolling direction is 500% or more, the average crystal grain size after heating for 1 hour at 1000 ° C. in an atmosphere of argon containing 20% by volume of hydrogen and the balance is 200 μm or more. A copper foil for producing graphene. 前記平均結晶粒径が400μm以上である請求項1に記載のグラフェン製造用銅箔。   The graphene-producing copper foil according to claim 1, wherein the average crystal grain size is 400 μm or more. 前記平均結晶粒径が900μm以上である請求項1に記載のグラフェン製造用銅箔。   The graphene-producing copper foil according to claim 1, wherein the average crystal grain size is 900 μm or more. 表面の算術平均粗さRaが0.05μm以下である請求項1又は2に記載のグラフェン製造用銅箔。   The copper foil for producing graphene according to claim 1, wherein the arithmetic average roughness Ra of the surface is 0.05 μm or less. 水素を20体積%以上含有し残部アルゴンの雰囲気中で1000℃で1時間加熱後の平均結晶粒径が200μm以上であり、表面の算術平均粗さRaが0.05μm以下であるグラフェン製造用銅箔。 Graphene-producing copper containing 20% by volume or more of hydrogen, having an average crystal grain size of 200 μm or more after heating for 1 hour at 1000 ° C. in an atmosphere of argon, and an arithmetic average roughness Ra of 0.05 μm or less Foil. 表面の算術平均粗さRaが0.03μm以下である請求項5に記載のグラフェン製造用銅箔。   The copper foil for producing graphene according to claim 5, wherein the arithmetic average roughness Ra of the surface is 0.03 μm or less. JIS-H3100若しくはJIS-H3250に規格するタフピッチ銅、JIS-H3100若しくはJIS−H3510に規格する無酸素銅、又は前記タフピッチ銅若しくは前記無酸素銅に対してSn及びAgの群から選ばれる1種以上の元素を0.050質量%以下含有する請求項1〜6のいずれかに記載のグラフェン製造用銅箔。   One or more selected from the group of Sn and Ag with respect to JIS-H3100 or JIS-H3250, oxygen-free copper specified by JIS-H3100 or JIS-H3510, or the tough-pitch copper or oxygen-free copper The copper foil for graphene manufacture in any one of Claims 1-6 containing 0.050 mass% or less of said element. 請求項1〜7のいずれかに記載のグラフェン製造用銅箔を用いたグラフェンの製造方法であって、
所定の室内に、加熱した前記グラフェン製造用銅箔を配置すると共に炭素含有ガスを供給し、前記グラフェン製造用銅箔の表面にグラフェンを形成するグラフェン形成工程と、
前記グラフェンの表面に転写シートを積層し、前記グラフェンを前記転写シート上に転写しながら、前記グラフェン製造用銅箔をエッチング除去するグラフェン転写工程と、を有するグラフェンの製造方法。
A method for producing graphene using the copper foil for producing graphene according to claim 1,
A graphene forming step of arranging the heated copper foil for producing graphene in a predetermined chamber and supplying a carbon-containing gas and forming graphene on the surface of the copper foil for producing graphene,
A graphene transfer process comprising: laminating a transfer sheet on the surface of the graphene; and transferring the graphene onto the transfer sheet while etching and removing the copper foil for producing graphene.
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Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5822669B2 (en) 2011-02-18 2015-11-24 Jx日鉱日石金属株式会社 Copper foil for producing graphene and method for producing graphene using the same
JP5850720B2 (en) 2011-06-02 2016-02-03 Jx日鉱日石金属株式会社 Copper foil for producing graphene and method for producing graphene
JP5959510B2 (en) 2011-06-02 2016-08-02 Jx金属株式会社 Copper foil for producing graphene and method for producing graphene
JP5847834B2 (en) * 2011-11-04 2016-01-27 Jx日鉱日石金属株式会社 Copper foil for producing graphene, method for producing the same, and method for producing graphene
JP5721609B2 (en) * 2011-11-15 2015-05-20 Jx日鉱日石金属株式会社 Copper foil for producing graphene and method for producing graphene
JP2014037577A (en) * 2012-08-16 2014-02-27 Jx Nippon Mining & Metals Corp Rolled copper foil for producing graphene, and method for producing graphene
JP5865211B2 (en) * 2012-08-16 2016-02-17 Jx日鉱日石金属株式会社 Copper foil for producing graphene and method for producing graphene using the same
JP5756834B2 (en) * 2013-10-02 2015-07-29 尾池工業株式会社 Transfer film, method for producing the same, and method for producing transparent conductive laminate
JP6277490B2 (en) * 2014-02-10 2018-02-14 パナソニックIpマネジメント株式会社 Manufacturing equipment for coatings
JP6078024B2 (en) 2014-06-13 2017-02-08 Jx金属株式会社 Rolled copper foil for producing a two-dimensional hexagonal lattice compound and a method for producing a two-dimensional hexagonal lattice compound
CN104198389B (en) * 2014-09-22 2017-02-01 上海理工大学 Preparation method of copper-based suspended sample stage used for ultrahigh resolution fluorescence imaging
WO2016147475A1 (en) * 2015-03-17 2016-09-22 リンテック株式会社 Sheet manufacturing device and manufacturing method
JP6808353B2 (en) 2015-05-29 2021-01-06 コイト電工株式会社 Push button box
CN107267792A (en) * 2017-06-29 2017-10-20 广东省材料与加工研究所 A kind of preparation method of graphene enhancing copper or copper alloy bar

Family Cites Families (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE94811T1 (en) 1990-01-22 1993-10-15 Atd Corp PILLOW-LIKE STRUCTURE WITH HEAT CONDUCTION ZONES AND THERMAL INSULATION ZONES AND DEFORMABLE LAMINATE.
JP3481797B2 (en) 1996-10-03 2003-12-22 片山特殊工業株式会社 Method for manufacturing battery electrode substrate and battery electrode substrate
JP3859384B2 (en) 1999-03-08 2006-12-20 日鉱金属株式会社 Rolled copper foil for flexible printed circuit board having excellent flexibility and manufacturing method thereof
JP4056175B2 (en) 1999-05-13 2008-03-05 株式会社神戸製鋼所 Copper alloy plate for lead frames, terminals, connectors, switches or relays with excellent press punchability
JP3521074B2 (en) 2000-01-06 2004-04-19 三井金属鉱業株式会社 Method for testing physical properties of electrolytic copper foil
JP3552043B2 (en) 2000-08-07 2004-08-11 古河電気工業株式会社 Method for producing oxygen-free copper wire by belt & wheel continuous casting and rolling method and method for producing copper alloy wire
TWI298988B (en) * 2002-07-19 2008-07-11 Ube Industries Copper-clad laminate
JP2004074214A (en) 2002-08-16 2004-03-11 Nikko Metal Manufacturing Co Ltd Metallic rolled foil improved in peeling strength with laminated material
CN1286716C (en) 2003-03-19 2006-11-29 清华大学 Method for growing carbon nano tube
CN100510131C (en) 2004-08-17 2009-07-08 株式会社神户制钢所 Copper alloy plate for electric and electronic parts having bending workability
CN101851769B (en) * 2005-03-31 2012-07-04 三井金属矿业株式会社 Electrolytic copper foil and method for producing same, surface-treated electrolytic copper foil, copper-clad laminate, and printed wiring board
JP4401998B2 (en) * 2005-03-31 2010-01-20 日鉱金属株式会社 High-gloss rolled copper foil for copper-clad laminate and method for producing the same
JP4522972B2 (en) 2005-04-28 2010-08-11 日鉱金属株式会社 High gloss rolled copper foil for copper-clad laminates
TW200738913A (en) * 2006-03-10 2007-10-16 Mitsui Mining & Smelting Co Surface treated elctrolytic copper foil and process for producing the same
KR101344493B1 (en) 2007-12-17 2013-12-24 삼성전자주식회사 Single crystalline graphene sheet and process for preparing the same
JP4960215B2 (en) 2007-12-28 2012-06-27 パナソニック株式会社 Metal foil negative electrode current collector processing roller and metal foil negative electrode current collector processing method
US7479590B1 (en) 2008-01-03 2009-01-20 International Business Machines Corporation Dry adhesives, methods of manufacture thereof and articles comprising the same
JP2009215146A (en) 2008-03-13 2009-09-24 Panasonic Corp Metal-containing nanoparticle, carbon nanotube structure grown by using the same, electronic device using the carbon nanotube structure, and method for manufacturing the device
WO2010038641A1 (en) 2008-09-30 2010-04-08 日鉱金属株式会社 High-purity copper and process for electrolytically producing high-purity copper
JP4972115B2 (en) * 2009-03-27 2012-07-11 Jx日鉱日石金属株式会社 Rolled copper foil
US20120039344A1 (en) 2009-04-13 2012-02-16 Loh Ping Kian Graphene-based saturable absorber devices and methods
JP5569769B2 (en) * 2009-08-31 2014-08-13 独立行政法人物質・材料研究機構 Graphene film manufacturing method
KR101736462B1 (en) 2009-09-21 2017-05-16 한화테크윈 주식회사 Method for manufacturing graphene
JP5219973B2 (en) 2009-09-24 2013-06-26 Jx日鉱日石金属株式会社 Rolled copper foil excellent in shear workability, and negative electrode current collector, negative electrode plate and secondary battery using the same
JP5094834B2 (en) 2009-12-28 2012-12-12 Jx日鉱日石金属株式会社 Copper foil manufacturing method, copper foil and copper clad laminate
EP2523903A4 (en) 2010-01-12 2013-05-01 Nat Nanomaterials Inc Method and system for producing graphene and graphenol
EP2354272B1 (en) 2010-02-08 2016-08-24 Graphene Square Inc. Roll-to-roll apparatus for coating simultaneously internal and external surfaces of a pipe and graphene coating method using the same
JP5563500B2 (en) 2010-05-28 2014-07-30 日本電信電話株式会社 Synthesis method of graphene and carbon molecular thin film
US20120132516A1 (en) 2010-11-29 2012-05-31 Zimmerman Paul A Synthesis of Graphene Films Cycloalkanes
JP5822669B2 (en) 2011-02-18 2015-11-24 Jx日鉱日石金属株式会社 Copper foil for producing graphene and method for producing graphene using the same
JP5411192B2 (en) 2011-03-25 2014-02-12 Jx日鉱日石金属株式会社 Rolled copper foil and method for producing the same
JP5959510B2 (en) 2011-06-02 2016-08-02 Jx金属株式会社 Copper foil for producing graphene and method for producing graphene
JP5850720B2 (en) 2011-06-02 2016-02-03 Jx日鉱日石金属株式会社 Copper foil for producing graphene and method for producing graphene
JP5758254B2 (en) * 2011-09-27 2015-08-05 Jx日鉱日石金属株式会社 Rolled copper foil
JP5847834B2 (en) 2011-11-04 2016-01-27 Jx日鉱日石金属株式会社 Copper foil for producing graphene, method for producing the same, and method for producing graphene
JP5721609B2 (en) 2011-11-15 2015-05-20 Jx日鉱日石金属株式会社 Copper foil for producing graphene and method for producing graphene
JP5909082B2 (en) 2011-11-21 2016-04-26 Jx金属株式会社 Copper foil for producing graphene and method for producing graphene
JP5475897B1 (en) * 2012-05-11 2014-04-16 Jx日鉱日石金属株式会社 Surface-treated copper foil and laminate using the same, copper foil, printed wiring board, electronic device, and method for manufacturing printed wiring board
JP5298225B1 (en) * 2012-06-29 2013-09-25 Jx日鉱日石金属株式会社 Rolled copper foil, method for producing the same, and laminate
JP2014037577A (en) 2012-08-16 2014-02-27 Jx Nippon Mining & Metals Corp Rolled copper foil for producing graphene, and method for producing graphene
JP6078024B2 (en) 2014-06-13 2017-02-08 Jx金属株式会社 Rolled copper foil for producing a two-dimensional hexagonal lattice compound and a method for producing a two-dimensional hexagonal lattice compound

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