JP5813143B2 - Surface shape measuring device and machine tool provided with the same - Google Patents

Description

  The present invention relates to a surface shape measuring device that measures a surface shape by a non-contact type displacement sensor using a light beam, and a machine tool including the surface shape measuring device.

  The demand for on-machine measurement technology in machine tools is increasing. Conventionally, on-machine measurement applications have been limited to positioning workpieces (also referred to as “workpieces”) and measuring geometric dimensions. In recent years, on-machine measurement is being used for correction for improving finishing accuracy by comparing on-machine measurement results with CAD data. In addition, research is underway to automatically correct the spatial error of the machine tool using on-machine measurement results.

  Generally, a touch probe is used for on-machine measurement. The touch probe can be attached to the machine tool body using an ATC (Automatic Tool Changer). Furthermore, the touch probe can also transfer data by wireless communication with a data processing computer, and the degree of fulfillment as a measurement tool is increasing.

  However, the touch probe has structural limitations. That is, since it is a contact type, the possibility of scratching the workpiece after finishing cannot be excluded. Furthermore, since the escape stroke at the time of contact is small, the shape to be measured must be known in advance. In the case of detecting the workpiece position before processing, it is necessary that the workpiece is positioned in advance with a precision within a small escape stroke range.

  On the other hand, the non-contact measurement does not damage the workpiece, and the distance between the displacement sensor and the workpiece can be relatively large, such as several tens of mm. For this reason, it is suitable for applications such as measurement for obtaining a processing offset before processing a casting, a forged product, etc., and scanning the shape of a workpiece after finishing at high speed.

  As a typical method of non-contact measurement, there is a laser triangulation method (for example, see JP-A-10-332335 (Patent Document 1)). Conventionally, in the measurement of the surface shape of a metal material, measurement using a laser displacement meter has been difficult due to the insufficient amount of diffusely reflected light on the metallic gloss surface. For this reason, it is necessary to perform pretreatment such as applying powder to the surface, and there has been a situation in which practical use of the laser displacement meter in on-machine measurement has not progressed. In recent years, it has become possible to measure a metallic glossy surface by improving the sensitivity of an image sensor as a light receiving element and developing a semiconductor laser element. This makes it possible to use a diffuse reflection type triangulation laser displacement meter for on-machine measurement.

JP-A-10-332335

Yasuhiko Arai and three others, "High-resolution electronic speckle interferometry using only two speckle patterns", Journal "Optics", Vol. 41, No. 2, p96-104, February 2012

  The accuracy of a triangulation laser displacement meter is usually displayed with repeatability, and submicron accuracy is usually guaranteed. However, since a laser beam is used and the spot has a size rather than an ideal point shape, a specific measurement error is observed. This measurement error is characterized in that it includes spike noise that is much larger than the actual surface roughness and cannot be removed by the time averaging process. The above measurement error is observed not only in the coherent laser beam but also in a triangulation displacement meter using a non-coherent light beam.

  The present invention has been made in consideration of the above-mentioned problems, and its main object is to reduce errors observed when measuring the surface shape by triangulation using a light beam. It is to provide a surface shape measuring device.

  In one aspect, the present invention is a surface shape measuring device, and includes a displacement meter, a moving mechanism, and a measurement control unit. The displacement meter includes a light emitting unit that emits a light beam toward the measurement target, an optical system that collects scattered light of the light beam from the measurement target, and a light receiving unit that detects a light collection position by the optical system. The displacement meter measures the displacement of the surface of the measurement object based on the light collection position at the light receiving unit. The moving mechanism scans the light beam by relatively moving the displacement meter and the measurement object. The measurement control unit controls the moving mechanism and the displacement meter. The measurement control unit causes the moving mechanism to scan the light beam so that the light receiving unit is positioned forward or backward in the scanning direction of the light beam with respect to the light emitting unit. The surface displacement is continuously measured as surface shape data.

  According to the configuration of the measurement control unit, it is possible to extract the spike-like error as an error pattern having a characteristic shape. Therefore, by removing the extracted error pattern, it is possible to efficiently reduce noise included in the surface shape data.

Preferably, the surface shape measuring apparatus further includes a feature section extracting unit that extracts a section having a size equal to or smaller than the spot size of the light beam and satisfying a predetermined condition from the measurement range of the surface shape surface shape data. . In this case, the predetermined condition is that the surface shape data in one part of the first half of the feature section changes in one direction beyond the predetermined range with respect to the average value of the entire measurement range of the surface shape data, and the second half of the feature section. In some cases, the surface shape data changes in a direction opposite to the first half in a direction opposite to a predetermined range with respect to the average value in the entire measurement range .

  Alternatively, it is desirable that the surface shape measuring apparatus further includes a feature section extracting unit that extracts a section having a size equal to the spot size of the light beam and satisfying a predetermined condition from the measurement range of the surface shape data. In this case, the predetermined condition is obtained by rotating the waveform of the surface shape data in the first half of the feature section and the waveform of the surface shape data in the second half of the feature section by 180 degrees around the data point at the center of the feature section. This includes a condition that the correlation coefficient with the waveform exceeds a predetermined reference value.

  With any of the above-described feature section extraction units, it is possible to extract a characteristic pattern shape error included in the measurement data of the laser displacement meter. Therefore, by removing the extracted error pattern, it is possible to efficiently reduce noise included in the surface shape data.

In a preferred embodiment, the surface shape measuring apparatus is configured to reduce the amount of change in the surface shape data with respect to the average value over the entire measurement range of the surface shape data in each of the extracted one or more feature sections. A data correction unit for correcting the shape data is further provided.

  Preferably, the data correction unit obtains a measurement value at an arbitrary first measurement point in each feature section by averaging with a measurement value at a second measurement point at a symmetrical position across the middle point of the section. The surface shape data is corrected by replacing each measurement value at the first and second measurement points with an average value.

Alternatively, the data correction unit preferably corrects the surface shape data by replacing the data in each feature section with the average value of the entire surface shape data measurement range .

  Any of the above-described data correction units can remove the characteristic error pattern.

  More preferably, in the above-described embodiment, the surface shape measuring apparatus performs low-pass filter processing on the surface shape data corrected by the data correction unit, leaving only fluctuations with a period longer than the spot size of the light beam. A filter processing unit is further provided. Thereby, noise included in the surface shape data can be further reduced.

  In another preferred embodiment, the surface shape measuring apparatus further includes a moving average processing unit that performs moving average on the surface shape data in a variable moving average section. Here, the size of the moving average section is larger than the spot size of the light beam. The size of the moving average section when performing the moving average including the feature section is larger than the size of the moving average section when performing the moving average without including the feature section.

  In still another preferred embodiment, the surface shape measuring apparatus further includes a moving average processing unit that performs weighted moving average on the surface shape data. Here, the size of the moving average section of the weighted moving average is larger than the spot size of the light beam. The weight for the measurement points inside the feature section is smaller than the weight for the measurement points outside the feature section.

  Any of the above-described moving average processing units can suppress a characteristic pattern shape error included in the measurement data of the laser displacement meter.

  This invention is a machine tool provided with said surface shape measuring apparatus in another situation.

  Therefore, according to the present invention, errors observed when measuring the surface shape by triangulation using a light beam can be reduced.

It is a figure which shows typically the structure of a laser displacement meter. It is a perspective view which shows typically the structure of the linear image sensor of FIG. It is a figure which shows an example of the data detected by the linear image sensor of FIG. 1 is a block diagram schematically showing a configuration example of a surface shape measuring apparatus according to Embodiment 1. FIG. It is a figure which shows an example of the measurement result of the metal surface by a laser displacement meter. It is a figure for demonstrating the change of the imaging spot on a linear image sensor in case the reflectance of a measuring object is non-uniform | heterogenous. It is a top view which shows typically the surface of the measuring object of FIG. In the case of FIG. 6 and FIG. 7, it is a figure which shows an example of the luminance distribution detected by a linear image sensor. It is a figure for demonstrating the magnitude | size of the measurement error resulting from the nonuniformity of the reflectance of a measurement object. It is a figure which shows the result of having repeatedly measured the displacement of the height direction in the micro area on a gauge block using a laser displacement meter. It is a figure which shows the result of having measured the displacement of the height direction in the range of 0.4 mm on a gauge block using a laser displacement meter. It is a figure which shows the maximum value of the light reception amount of an image sensor in each measurement point of FIG. It is a figure which shows the relationship between the displacement of a height direction, and the largest received light quantity in area | region RC of FIG. 11 and FIG. It is a figure which shows the result of having measured the surface shape of the square area | region of 1 side 0.5mm with the laser beam of the spot size of diameter 50 micrometers. It is a figure which shows the result of having changed the laser spot size to 400 micrometers in diameter, and measuring the surface shape of the same area | region as FIG. It is a flowchart which shows the measurement procedure of the measurement of surface shape, and measured data. It is a figure for demonstrating the method to extract a characteristic area in step S105 of FIG. It is a figure for demonstrating the other method of extracting a feature area in step S105 of FIG. It is a figure for demonstrating the method to correct | amend surface shape data in step S110 of FIG. It is a figure which shows the result of having performed the data correction shown to step S110 of FIG. 16 with respect to the measurement data of FIG. It is a figure which shows the result of having performed the low pass filter process shown to step S115 of FIG. 16 with respect to the data of FIG. It is a figure which shows the result of having performed the low pass filter process shown to step S115, without performing the data correction shown to step S110 of FIG. 16 with respect to the measurement data of FIG. It is a block diagram which shows roughly the structure of the surface shape measuring apparatus by Embodiment 2. FIG. 6 is a flowchart illustrating an example of a procedure for measuring a surface shape and processing measured data in the surface shape measuring apparatus according to the second embodiment. 6 is a flowchart showing another example of the procedure for measuring the surface shape and processing the measured data in the surface shape measuring apparatus according to the second embodiment. FIG. 10 is a perspective view schematically showing a configuration of a machine tool according to a third embodiment. It is a block diagram which shows the functional structure of the part regarding the surface shape measuring apparatus among the machine tools of FIG.

  Hereinafter, each embodiment will be described in detail with reference to the drawings. In the following embodiments, a surface shape measuring device using a laser displacement meter will be described as an example. However, in the case of a non-contact displacement meter using a non-coherent light beam instead of a laser beam, The present invention can be applied. In the following description, the same or corresponding parts are denoted by the same reference symbols, and the description thereof may not be repeated.

<Embodiment 1>
[Outline of laser displacement meter]
FIG. 1 is a diagram schematically showing a configuration of a laser displacement meter. Referring to FIG. 1, laser displacement meter 100 includes a light emitting unit 110, a condensing lens 118 as an optical system, and a linear image sensor 120 as a light receiving unit. The light emitting unit 110 includes a laser diode 112 and a lens 114.

  The laser beam 116 emitted from the laser diode 112 is shaped into substantially parallel light by the lens 114 and is irradiated onto the measurement object 130. The spot size w (also referred to as spot diameter) of the laser beam 116 on the measurement object is, for example, 50 μm in diameter. The light diffusely reflected on the measurement object 130 is collected by the condenser lens 118 on the linear image sensor 120 arranged in the angle direction of the laser beam 116 and γ.

  In FIG. 1, the direction of the laser beam 116 is taken as the Z-axis direction. A surface including the central axis of the laser beam 116 and the optical axis of the condenser lens 118 is referred to as an optical path surface. A direction parallel to the optical path surface and perpendicular to the Z-axis direction is taken as an X-axis direction. A direction perpendicular to both the X-axis direction and the Z-axis direction is taken as a Y-axis direction. In the case of FIG. 1, the Y-axis direction is a direction perpendicular to the paper surface, and the XZ plane is parallel to the paper surface (optical path surface).

  Here, the beam size of laser light (spot size on the measurement object) will be described. There are various definitions of the beam size of laser light. For example, in the case of a laser beam having a symmetric beam profile as in the TEM00 mode, in a plane orthogonal to the optical axis, 1 / e 2 of the peak value (where e is the base of natural logarithm) ( The beam size is defined by the width of the intensity distribution (13.5%). When the beam profile is broken, for example, a circle including 86.5% of the total beam power is included on the basis of the peak power, and the diameter of this circle is defined as the beam size. In this specification, in order to include various definitions, the range of the beam size (measurement object) from the diameter of the circle including 50% of the total power to the diameter of the circle including 95% of the total power is substantially exceeded. Equal to the spot size above).

  FIG. 2 is a perspective view schematically showing the configuration of the linear image sensor of FIG. Referring to FIG. 2, the linear image sensor 120 includes 1024 pixels 122 arranged in a straight line. Each pixel 122 outputs a signal with a luminance level from 0 to a maximum of 255 according to the amount of received light.

  FIG. 3 is a diagram illustrating an example of data detected by the linear image sensor of FIG. The horizontal axis in FIG. 3 indicates the pixel position, and the vertical axis indicates the luminance level. Referring to FIGS. 2 and 3, the light diffusely reflected on the measurement object 130 is condensed by the condenser lens 118 onto the spot 124 on the linear image sensor 120, whereby a Gaussian as shown in FIG. Distributed data is obtained. The distance from the center of gravity of the data in FIG. 3 to the object is calculated by triangulation.

Referring again to FIG. 1, the linear image sensor 120 is disposed at an angle based on the Scheimpflug Condition. That is, the detection surface of the linear image sensor 120 and the main surface of the condenser lens 118 intersect with each other in a straight line, and the angle formed by these surfaces is β. A surface including the laser beam 116 is a subject surface. In this case, the moving magnification M of the imaging spot 124 on the linear image sensor 120 with respect to the change in the distance between the measurement object 130 and the laser displacement meter 100 is given by the following equation (1). However, the focal distance of the condenser lens 118 is f _0, and the distance from the irradiation position (laser spot 132) of the laser beam 116 on the measurement object 130 to the condenser lens 118 is l.

M = (f ₀ · sin γ) / (l · cos β) (1)
In the case of the present embodiment, in the above equation (1), f ₀ = 55 mm, l = 80 mm, γ = π / 6, β = 5π / 18, so the movement magnification M is calculated as follows. The

M = {55 × sin (π / 6)} / {80 × cos (5π / 18)} = 0.53 (1A)
[Configuration of surface shape measuring device]
FIG. 4 is a block diagram schematically showing a configuration example of the surface shape measuring apparatus according to the first embodiment. Referring to FIG. 4, surface shape measurement apparatus 140 includes table 144 on which measurement object 130 is placed, saddle 142, laser displacement meter 100, X-axis drive mechanism 146 </ b> X, and Y-axis drive mechanism 146 </ b> Y. , A Z-axis drive mechanism 146Z, and a computer 150.

  The table 144 is disposed on the saddle 142 and is movable in the X-axis direction. The saddle 142 is movable in the Y axis direction. The X-axis drive mechanism 146X moves the table 144 in the X-axis direction. The Y-axis drive mechanism 146Y moves the saddle 142 in the Y-axis direction. The Z-axis drive mechanism 146Z moves the laser displacement meter 100 in the Z-axis direction. The X-axis drive mechanism 146X, the Y-axis drive mechanism 146Y, and the Z-axis drive mechanism 146Z function as a moving mechanism 146 for relatively moving the laser displacement meter 100 and the measurement object 130. Therefore, the laser beam 116 scans the surface of the measurement object 130 by the moving mechanism 146.

  The configuration of the moving mechanism 146 is not limited to the example of FIG. For example, the measurement object 130 may be fixed and the laser displacement meter 100 may be movable in three directions of X, Y, and Z.

  The computer 150 includes a processor 152, a memory 154, a display device and an input / output device (not shown), and the like. The processor 152 functions as a measurement control unit 156 and a data processing unit 158 by executing a program stored in the memory 154.

  The measurement control unit 156 scans the laser beam 116 by controlling the laser displacement meter 100 and the moving mechanism 146. During the scanning of the laser beam 116, the measurement control unit 156 continuously measures the surface shape data 166 of the measurement object 130 using the laser displacement meter 100. The measured surface shape data 166 is stored in the memory 154. The surface shape data 166 is a data series in which the scanning position on the measurement object 130 (position where the laser beam is irradiated) and the displacement in the Z direction of the surface of the measurement object 130 at the scanning position are associated with each other. .

  The data processing unit 158 performs data processing of the measurement data in order to remove characteristic noise included in the measurement data (surface shape data 166) of the laser displacement meter 100. Details of the data processing will be described later with reference to FIGS.

  The surface shape measuring apparatus 140 according to the present embodiment is characterized by the relationship between the scanning direction of the laser beam 116 and the direction of the laser displacement meter 100. Specifically, as shown in FIG. 1, the light receiving unit (linear image sensor 120) is forward or backward in the scanning direction of the laser beam 116 (in the case of FIG. 1, + X direction or −X direction) with respect to the light emitting unit 110. The laser beam 116 is scanned so as to be positioned at the position. In other words, the scanning direction of the laser beam 116 is aligned with the optical path plane (in the case of FIG. 1, parallel to the XZ plane) including the central axis of the laser beam 116 and the optical axis of the condenser lens 118.

  By matching the scanning direction of the laser beam 116 and the direction of the laser displacement meter 100 as described above, a characteristic error pattern as shown in the regions RA, RB, RC of FIG. 11 appears in the measurement data. become. Therefore, if this characteristic error pattern is extracted and removed from the surface shape data 166, relatively large noise included in the surface shape data 166 can be efficiently reduced.

  Note that the laser beam 116 may be scanned so that the laser spot follows a curved locus on the surface of the measurement object 130. In this case, one of the measurement object 130 or the laser displacement meter 100 is rotated around the Z axis (C axis direction) so that the light receiving unit is positioned forward or backward in the scanning direction with respect to the light emitting unit 110. A drive mechanism is required.

[Cause of measurement error of laser displacement meter]
FIG. 5 is a diagram illustrating an example of a measurement result of a metal surface by a laser displacement meter. Specifically, FIG. 5 shows the result of measuring the displacement of the surface of a metal gauge block having a smooth surface at intervals of 0.1 mm using a laser displacement meter 100. The scanning direction of the laser beam is a direction parallel to the surface of the gauge block. As shown in FIG. 5, while the surface roughness of the gauge block was about 0.06 μm, noise as large as 36 μm was observed in the measurement data with a 3σ value (σ represents a standard deviation). As will be described in detail later, this noise is characterized in that it cannot be removed by a time averaging process (a process in which the same measurement is repeated and averaged).

  Causes of errors of the laser displacement meter include electrical noise, the influence of temperature changes, movement errors of the moving mechanism 146 (X-axis drive mechanism 146X, Y-axis drive mechanism 146Y, and Z-axis drive mechanism 146Z), the measurement object 130 An error based on the non-uniformity of the reflectance of the surface, laser speckle, etc. can be considered.

  Electrical noise can be improved by time averaging of measured values. The repetition accuracy of a commercially available laser displacement meter is often expressed by a number after the time averaging process is performed, and has submicron accuracy. Therefore, it is not the cause of the relatively large noise shown in FIG.

  The error due to the temperature change may be due to the outside air temperature, but the error caused by the thermal displacement of the measurement optical system is mainly due to the electric circuit inside the laser displacement meter serving as a heat source. In the laser displacement meter used this time, a measured value shift of 10 μm is observed after the power is turned on. However, the shift of the measurement value due to the temperature change is stabilized in about 30 to 60 minutes after the normal power supply is turned on, and therefore cannot cause the noise shown in FIG.

  The movement error of the moving mechanism 146 includes an error due to thermal displacement and a mechanical error. The error due to thermal displacement is observed as a slow fluctuation in time, similar to the effect of temperature inside the laser displacement meter. The mechanical error is caused by an error in the positional accuracy of the moving mechanism 146 when the laser beam is scanned for measuring the surface shape. However, since the mechanical error appears as a large swell compared to the spike-like noise, it is difficult to consider as the cause of the noise shown in FIG.

  In addition to the movement error of the moving mechanism 146, an error due to vibration of the servo shaft can be considered. However, since noise due to servo shaft vibration can be removed by time averaging processing in the same manner as electrical noise, it is not the cause of noise shown in FIG.

  From the above consideration, it is considered that one of the causes of noise shown in FIG. 5 is nonuniformity in the microscopic reflectance of the surface of the measurement object 130. The non-uniform reflectance is caused by non-uniform materials, scratches on the metal surface, irregularities, and the like. Since the measurement laser beam has a spot size, unevenness in brightness is caused by non-uniformity of microscopic reflectance within the laser spot size, which may cause a measurement error.

  FIG. 6 is a diagram for explaining a change in the imaging spot on the linear image sensor when the reflectance of the measurement object is nonuniform. FIG. 7 is a plan view schematically showing the surface of the measurement object of FIG. FIG. 8 is a diagram illustrating an example of the luminance distribution detected by the linear image sensor in the cases of FIGS. 6 and 7.

  6 to 8, in order to accurately obtain the displacement in the height direction by the triangulation method, the luminance distribution in the imaging spot 124 on the linear image sensor 120 shows a Gaussian distribution, and imaging is performed. It is important that the center of the spot 124 can be detected. When the microscopic reflectance of the surface of the measurement object 130 is not uniform and luminance unevenness occurs, a measurement error may occur because the luminance distribution deviates from the Gaussian distribution due to the luminance unevenness.

  As shown in FIGS. 6 and 7, it is assumed that the surface 130A of the measurement object 130 has a region that is smaller than the spot size of the laser spot 132 and has a higher reflectance than the surroundings. The relative position of the high reflectivity region with respect to the laser beam 116 is P1, P2, as the laser beam 116 is scanned in the + X direction (scanning direction) (that is, as the measurement object moves in the −X direction). It shall change in the order of P3.

  When the high reflectance region is positioned at P1 with respect to the laser beam 116, the data center of gravity 136 is shifted from the center 134 of the imaging spot of the image sensor 120, as shown in FIG. For this reason, the measurement object 130 is measured so as to be at a position (lower position) farther from the light emitting unit 110 than the actual measurement object 130.

  When the high reflectance region is positioned at P2 with respect to the laser beam 116, the center 134 of the imaging spot of the image sensor 120 and the data center of gravity 136 coincide as shown in FIG. 8B. For this reason, the measurement object 130 is measured so that it exists in the same position as an actual.

  When the high reflectivity region is positioned at P3 with respect to the laser beam 116, as shown in FIG. 8C, the center of gravity 136 of the data with respect to the center 134 of the imaging spot of the image sensor 120 is shown in FIG. A shift in the opposite direction to the case of A). For this reason, the measurement object 130 is measured so that it exists in the position (high position) of the light emission part 110 closer than actual.

  FIG. 9 is a diagram for explaining the magnitude of the measurement error due to the non-uniformity of the reflectance of the measurement object. In FIGS. 9A and 9B, the size of the laser spot 132 is shown large for easy illustration. FIG. 9A shows a case where the surface of the measurement object is measured so as to be located at a distance ε− from the actual position, as in FIG. 8A. FIG. 9B shows a case where measurement is performed such that the surface of the measurement object is located closer to ε + than the actual surface, as in FIG. 8C.

The magnitude of the measurement error due to the non-uniformity of the reflectance is determined by the spot size w of the laser spot 132 and the light receiving angle γ. Specifically, the maximum value of measurement error (error when erroneously recognizing around the periphery of the laser spot 132) ε _max is given by the following equation (2).

ε _max = w / (2 · tan (γ)) (2)
In the laser displacement meter used for the measurement in FIG. 5, the spot size w = 50 μm and the light receiving angle γ = π / 6. In this case, the maximum value ε _max of the measurement error is given by the following equation (2A), which is a value comparable to the measurement error of FIG.

ε _max = 25 / tan (π / 6) = 43 [μm] (2A)
When a laser diode is used as a triangulation light source, speckles caused by interference of reflected light are considered to cause noise shown in FIG. 5 in addition to nonuniform reflectance.

  Since speckle is an interference phenomenon of laser light, measurement noise caused by speckle is closely related to surface roughness. Specifically, when the wavelength of the laser beam is λ and the optical path length is shifted by λ / 2, the light is darkened on the image sensor 120 due to interference, and the light on the image sensor 120 is brightened by the shift of λ. When converted to the unevenness of the surface of the measurement object, the luminance variation occurs on the image sensor 120 at an integral multiple of λ / 4.

  In the gauge block which is the measurement target in the case of FIG. 5, the unevenness on the surface is several tens of nm or less, which is about 1/10 of the wavelength λ of the laser beam. In that case, the speckle does not have a clear light and dark state, and unevenness of low contrast occurs.

  Various studies on laser speckle have been conducted so far. It is known that the average speckle diameter on the image plane is given by the following formula (3) (for example, Yasuhiko Arai et al., “Optical” Vol. 41, No. 2, p96-104, February 2012 ( (See Non-Patent Document 1)).

σ = 1.22 × (1 + M) · λ · f / d (3)
In the above equation (3), σ is the average speckle diameter on the imaging plane, M is the magnification of the imaging optical system, λ is the wavelength of the laser light, f is the focal length of the lens, and d is the aperture diameter of the lens. In the laser displacement meter used in the measurement of FIG. 5, M = 0.53, λ = 655 nm, d = 10 mm, and f = 33 mm, so σ = 4.0 μm.

  Since the width of each pixel of the linear image sensor 120 is 12 μm, it is considered that the influence of the speckle having the average size calculated above is averaged at each pixel of the linear image sensor 120. However, speckles with a diameter larger than the average value that appears due to non-uniformity in a specific location are not averaged within each pixel of the linear image sensor 120. Therefore, speckle noise can cause the noise shown in FIG. 5 by the same mechanism as in the case where the reflectance described with reference to FIGS. Normally, speckle noise is treated as a statistic because it cannot be predicted. However, in the microscopic range, speckle noise appears deterministically with good reproducibility, and cannot be removed by averaging with a time filter.

[About spike noise]
Hereinafter, the result of observing the spike-like noise shown in FIG. 5 in more detail will be described.

  FIG. 10 is a diagram showing a result of repeatedly measuring the displacement in the height direction in a minute section on the gauge block using a laser displacement meter. In FIG. 10, with respect to the same gauge block as FIG. 5, when the measurement range of 0.1 mm is measured 20 times at the sampling interval of 1 μm, the measurement data at each measurement point (average value and range of ± 3σ, where σ is Standard deviation). Since the spot size of the laser beam is 50 μm, the measurement interval (1 μm) is sufficiently smaller than the spot size.

  As shown in FIG. 10, what appeared to be spike-like random noise in FIG. 5 had very good measurement reproducibility, and the measurement result was as if there were minute irregularities on the surface. The surface roughness of the gauge block is several tens of nanometers, and irregularities close to 100 times the actual roughness are detected. The data variation at each measurement point is 2.3 μm in terms of 3σ. The error at each measurement point is noise caused by electrical noise, air fluctuation, servo motor vibration, and the like, and can be canceled by time averaging processing.

  FIG. 11 is a diagram showing the results of measuring the displacement in the height direction in the range of 0.4 mm on the gauge block using a laser displacement meter. In the case of FIG. 11, measurement data (surface shape data) is shown for the same gauge block as in FIG. 5 when the measurement range of 0.4 mm is measured only once at a sampling interval of 1 μm.

  Here, the measurement of FIG. 11 is characterized in that the laser beam 116 is scanned such that the light receiving unit (linear image sensor 120) is positioned in front of the light emitting unit 110 of FIG. . That is, the scanning direction of the laser beam is aligned with the optical path plane (XZ plane in FIG. 1) including the center axis of the laser beam and the optical axis of the condenser lens 118.

  As shown in FIG. 11, relatively large errors such as those seen in the regions RA, RB, and RC are generated along with fine noise with good reproducibility. The errors seen in these areas RA, RB, RC have a characteristic shape. Specifically, as the measurement point (scanning position of the laser beam) moves from left to right, the height displacement measured by the laser displacement meter is initially lower than the average level of the data, and then It shows a change that becomes higher than the average level and finally returns to the original average level.

  The changes in the measurement data seen in the areas RA, RB, RC in FIG. 11 are the same as those described with reference to FIGS. That is, as the region of high reflectivity moves from right to left within the laser spot (note that the laser beam scan direction is opposite), the displacement in the height direction measured by the laser displacement meter is In the first half, it is lower than the actual level, and in the second half, it is higher than the actual level.

  It should be noted that the direction of the error change described above is a case where the light receiving unit (linear image sensor 120) is positioned in front of the scanning direction with respect to the light emitting unit 110 in FIG. When the light receiving unit (linear image sensor 120) is located behind the light emitting unit 110 in the scanning direction, the direction of error change is reversed.

  FIG. 12 is a diagram showing the maximum value of the amount of light received by the image sensor at each measurement point in FIG. The vertical axis in FIG. 12 indicates the luminance level in the pixel with the maximum amount of received light. In FIG. 11, in the regions RA, RB, and RC where a relatively large measurement error with a characteristic shape is observed, it can be seen that the amount of received light fluctuates drastically.

  FIG. 13 is a diagram showing the relationship between the displacement in the height direction and the maximum amount of received light in the region RC of FIGS. 11 and 12.

  Referring to FIG. 13, as the measurement point (laser beam scanning position) moves, the maximum received light amount detected by image sensor 120 gradually increases, and the barycentric position of the luminance distribution on image sensor 120 increases. Shift. As a result, the detected value (displacement in the height direction) of the laser displacement meter largely fluctuates on the minus side (section indicated by arrow A1).

  When the amount of light received by the image sensor 120 reaches the maximum level, the barycentric position of the luminance distribution on the image sensor 120 moves as the measurement point (laser beam scanning position) moves. As a result, the detection value (displacement in the height direction) of the laser displacement meter changes from minus to plus (interval of arrow A2).

  Eventually, the amount of light received by the image sensor 120 decreases, and accordingly, the detected value (displacement in the height direction) of the laser displacement meter returns to the correct value (average value) (section indicated by arrow A3).

  As described above, the above characteristic phenomenon can be explained by uneven reflection in a minute region (region smaller than the laser spot size) on the surface of the measurement object. Alternatively, this characteristic phenomenon can be described as a case where the speckle diameter is so large that it cannot be ignored with respect to the spot size of the laser beam.

  The average speckle diameter is calculated to be 4.0 μm as described using the equation (3), which is smaller than 12 μm, which is the pixel width of the linear image sensor 120, and is about 1/12 of 50 μm of the spot size. It is a size. Therefore, since it is averaged within the pixel, the variation in the measured value due to the influence of the average speckle diameter is small and can be removed by the averaging process using the spatial filter.

  However, errors caused by speckles of large diameter that appear locally are very large and cannot be easily removed by the averaging process in a narrow area, and as a result, the measured values of the laser displacement meter are greatly affected. However, the range in which the speckle having such a large diameter affects the measurement data is limited to the range of the laser spot size as can be seen from FIG.

  FIG. 14 is a diagram showing a result of measuring the surface shape of a square region having a side of 0.5 mm with a laser beam having a spot size of 50 μm in diameter. FIG. 15 is a diagram showing the result of measuring the surface shape of the same region as in FIG. 14 by changing the laser spot size to a diameter of 400 μm. 14 and 15, Φ represents a diameter.

  As shown in FIGS. 14 and 15, when the spot size of the laser beam was changed from 50 μm in diameter to 400 μm in diameter, the maximum value of the surface irregularities measured by the laser displacement meter increased from 67 μm to 80 μm.

  As the laser spot size increases, the error due to the speckle of the average size is averaged, so the effect is reduced. However, the range affected by large speckles that appear locally increases as the laser spot size increases, as shown by equation (2) above. Therefore, it is considered that the measurement error of the laser displacement meter increases as the spot size increases.

[Noise removal method]
As described above, the measurement error of the laser displacement meter is considered to be due to the influence of the nonuniformity of the local reflectance of the measurement object and the speckle having a large diameter that occasionally appears. The error due to these factors has the following characteristics.

  (A) Depending on the size of the laser spot size, the range in which the non-uniform reflectance and speckles having a large diameter affect is determined.

  (B) By aligning the laser displacement meter so that the light receiving portion (image sensor) is positioned forward or backward in the scanning direction with respect to the laser beam, as seen in the regions RA, RB, and RC in FIG. A characteristic error pattern appears. Specifically, in the first half of a section where this characteristic error pattern appears (referred to as a feature section), the error changes to either plus or minus, and in the second half, the error changes in the opposite direction. Further, the absolute value of the error is substantially equal at a point equidistant from the median value of the feature section (that is, the error pattern is substantially point-symmetric with respect to the median value).

  A section (characteristic section) in which such a characteristic error pattern is seen is equal to or smaller than the laser spot size. Therefore, according to the sampling theorem, in order to capture this error pattern (up and down movement of the measurement value), the sampling interval of the laser displacement meter needs to be ½ or less of the laser spot size. In order to accurately grasp the shape of the vertical movement of the measurement value, the sampling interval of the laser displacement meter is desirably 1/10 or less of the spot size. More preferably, the sampling interval of the laser displacement meter is set to 1/20 or less of the spot size.

  Since the above characteristic error pattern is dominant to the measurement error of the laser displacement meter, if this error pattern can be extracted and removed by software processing, the measurement error of the laser displacement meter can be reduced efficiently. can do. Hereinafter, the noise removal procedure will be described more specifically.

  FIG. 16 is a flowchart showing the procedure for measuring the surface shape and processing the measured data. Hereinafter, operations of the measurement control unit 156 and the data processing unit 158 in FIG. 4 will be described with reference mainly to FIGS. 4 and 16.

  First, the measurement control unit 156 performs laser processing so that the light receiving unit (linear image sensor 120) is positioned in front of or behind the scanning direction (+ X direction or −X direction) of the laser beam 116 with respect to the light emitting unit 110 in FIG. The laser beam 116 is scanned by the moving mechanism 146 by aligning the direction of the displacement meter 100. Further, the measurement control unit 156 continuously measures the displacement of the surface of the measurement object 130 by the laser displacement meter 100 during the scanning of the laser beam 116 (step S100). The measurement data is stored as surface shape data 166 in the memory 154. The sampling interval of the surface shape data 166 needs to be ½ or less of the spot size of the laser beam, preferably 1/10 or less, more preferably 1/20 or less of the spot size.

  The data processing unit 158 performs data processing on the surface shape data 166 after measurement by the measurement control unit 156. As shown in FIG. 4, the data processing unit 158 includes a feature section extraction unit 160, a data correction unit 162, and a filter processing unit 164.

  First, the feature section extraction unit 160 extracts a feature section in which the characteristic error pattern is observed from the measurement range of the surface shape data (step S105). Hereinafter, the feature segment extraction method will be described with reference to FIGS. 17 and 18.

  FIG. 17 is a diagram for explaining a method of extracting feature sections in step S105 of FIG. Referring to FIG. 17, the feature section extraction unit 160 in FIG. 4 sequentially cuts out the measurement data MD of the section I1 equal to the laser beam spot size w from the measurement range of the surface shape data. The feature section extraction unit 160 then converts the waveform of the measurement data MD in the first half I2 of the section I1 and the waveform of the measurement data MD in the second half I3 of the section I1 to 180 degrees centering on the data point MP at the center of the section I1. A correlation coefficient with a waveform obtained by rotating is obtained. The feature section extraction unit 160 specifies the section I1 that has been cut out as the feature section when the obtained correlation coefficient exceeds a predetermined reference value.

  FIG. 18 is a diagram for explaining another method for extracting a feature section in step S105 of FIG. Referring to FIG. 18, the feature section extraction unit 160 in FIG. 4 performs plus and minus over the range TH in which the measurement data MD exceeds a predetermined range TH with respect to the average value AV within the section I4 that is equal to or less than the spot size w of the laser beam. The part which is changing in both directions is extracted. The feature section extraction unit 160 changes the measurement data MD in one direction (plus or minus direction) beyond a predetermined range TH with respect to the average value AV of the measurement data MD in a part of the first half I5 of the section I4. When the measurement data MD changes in a part of the second half I6 of the section I4 in a direction opposite to the first half I5 and exceeds the predetermined range TH with respect to the average value AV, the section I4 is specified as the feature section. .

  Referring to FIGS. 4 and 16 again, the data correction unit 162 has the surface shape data 166 so that the amount of change with respect to the average value of the surface shape data 166 is small in each of the extracted one or more feature sections. Is corrected (step S110). For example, a method of correcting the surface shape data 166 using the symmetry of the error pattern in each feature section can be considered.

  FIG. 19 is a diagram for explaining a method of correcting the surface shape data 166 in step S110 of FIG. Referring to FIG. 19, a solid line graph represents data MD (surface shape data 166) measured in feature section I7. The one-dot chain line graph shows the return data RD obtained by turning back the measurement data MD in the latter half to the first half side and the first half data MD in the second half side at the boundary line BR between the first half I8 and the second half I9 of the feature section I7. Represents. Since the measurement data MD and the aliasing data RD are substantially symmetrical with respect to the boundary line BR, the correction data AD (characteristic noise is removed by averaging the measurement data MD and the aliasing data RD for each measurement point. A broken line in FIG. 19 can be obtained.

  Specifically, the data correction unit 162 averages the measurement value at an arbitrary first measurement point in each feature section with the measurement value at the second measurement point at a symmetrical position across the midpoint of the section. Then, the surface shape data is corrected by replacing the measured values at the first and second measurement points with the obtained average value.

  As another method, the data correction unit 162 may correct the surface shape data 166 by replacing the data in each feature section with the average value of the surface shape data 166.

  Referring to FIGS. 4 and 16 again, the filter processing unit 164 performs spatial low-pass filter processing on the surface shape data corrected by the data correction unit 162 (step S115). In this case, since the range in which the characteristic error pattern appears is equal to or smaller than the laser spot size, the cutoff wavelength of the spatial low-pass filter for noise removal may be matched with the laser spot size at the time of measurement. As a result, only fluctuations with a period longer than the spot size of the laser beam remain. As the spatial low-pass filter process, for example, a moving average process in which the size of the moving average section is set equal to the spot size can be used.

  Hereinafter, the result of applying the data processing of steps S105, S110, and S115 of FIG. 16 to the measurement data of FIG. 11 will be described.

  FIG. 20 is a diagram showing a result of performing the data correction shown in step S110 of FIG. 16 on the measurement data of FIG. By performing the data correction shown in step S110, the data fluctuation range (noise component) was reduced from 3σ = 0.026 mm to 3σ = 0.102 mm.

  FIG. 21 is a diagram showing a result of performing the low pass filter process shown in step S115 of FIG. 16 on the data of FIG. Specifically, the moving average process is performed with the size of the moving average section set to 50 μm, which is equal to the spot size. By performing the moving average process, the fluctuation range of the data was reduced from 3σ = 0.102 mm to 3σ = 0.004 mm.

  FIG. 22 is a diagram illustrating a result of performing the low-pass filter process shown in step S115 without performing the data correction shown in step S110 of FIG. 16 on the measurement data of FIG. Specifically, the moving average process is performed with the size of the moving average section set to 50 μm, which is equal to the spot size. In this case, the data fluctuation range is reduced only from 3σ = 0.026 mm to 3σ = 0.09 mm.

  In the case of FIG. 22, if the size of the moving average section is made larger than the spot size of the laser beam, the measurement noise can be further reduced, but the noise caused by the characteristic error pattern can be completely removed. I can't. Furthermore, if the size of the moving average section is made too large, there is a disadvantage that it is impossible to detect irregularities at a level that can be detected originally.

[Summary of Embodiment 1]
As described above, when measuring the surface shape of the measurement object with the laser displacement meter while scanning the laser beam, a large spike-like error appears. The characteristics of the error are as follows.

  (A) The repeatability of the error of the laser displacement meter is very good. For this reason, noise cannot be removed by averaging a plurality of measurements (time averaging process).

  (B) A characteristic error pattern having a point-symmetric shape appears by aligning the laser displacement meter so that the light receiving unit (image sensor) is positioned forward or backward in the scanning direction with respect to the laser beam. .

  (C) The range in which the characteristic error pattern appears is determined according to the laser spot size.

  The above error can be explained by speckle noise having a diameter that is not negligible with respect to the spot size of the laser light, or nonuniform local reflectance on the surface of the measurement object. The measurement error of the laser displacement meter can be efficiently reduced by extracting and removing the characteristic error pattern of the error. Furthermore, since the amount of light received by the image sensor changes drastically in areas where the error is increasing, the fluctuation rate of the amount of light received by the image sensor can be used as an indicator of measurement reliability. It can also be used for discrimination from the above original unevenness.

<Embodiment 2>
FIG. 23 is a block diagram schematically showing the configuration of the surface shape measuring apparatus according to the second embodiment. Data processing unit 158A in FIG. 23 differs from data processing unit 158 in FIG. 4 in that it includes moving average processing unit 163 instead of data correction unit 162 and filter processing unit 164. Since the surface shape measuring apparatus 140A in FIG. 23 is the same as the surface shape measuring apparatus 140 in FIG. 4 except for the data processing unit 158, the same or corresponding parts are denoted by the same reference numerals and the description is repeated. Absent.

  FIG. 24 is a flowchart showing an example of the surface shape measurement and measurement data processing procedure in the surface shape measurement apparatus according to the second embodiment. In the data processing procedure of FIG. 24, step S120 is executed instead of steps S110 and S115 of FIG. Steps S100 and S105 are the same as those in FIG. 16, and therefore description thereof will not be repeated.

  In the example of FIG. 24, the moving average processing unit 163 of FIG. 23 performs a moving average on the surface shape data 166 in a variable moving average section (step S120). The size of the moving average section is larger than the spot size of the light beam. When the moving average processing unit 163 performs a moving average including a section (referred to as a feature section) in which a characteristic error pattern as seen in the regions RA, RB, and RC in FIG. The size of the moving average section is set to be larger than that when moving average is performed without including. For example, the size of the moving average section when performing the moving average including the characteristic section is set to 5 times or more the spot size.

  FIG. 25 is a flowchart showing another example of the procedure for measuring the surface shape and processing the measurement data in the surface shape measuring apparatus according to the second embodiment. In the data processing procedure of FIG. 24, step S125 is executed instead of steps S110 and S115 of FIG. Steps S100 and S105 are the same as those in FIG. 16, and therefore description thereof will not be repeated.

  In the example of FIG. 25, the moving average processing unit 163 of FIG. 23 performs a weighted moving average on the surface shape data 166 (step S125). The size of the moving average section of the weighted moving average is set to be larger than the spot size of the light beam, for example, 5 times or more the spot size. The moving average processing unit 163 sets the weight for the measurement point in the feature section where the characteristic error pattern as seen in the regions RA, RB, and RC in FIG. 11 is observed, more than the weight for the measurement point outside the feature section. Set smaller.

  As described above, the error included in the laser displacement meter can be efficiently removed by suppressing the fluctuation of the data in the feature section more than the fluctuation of the data outside the feature section.

<Embodiment 3>
The third embodiment discloses a machine tool provided with the surface shape measuring device of the first or second embodiment. Although the case where the machine tool is a vertical machining center is described below, the machine tool may be of other types such as a horizontal machining center or a lathe.

  FIG. 26 is a perspective view schematically showing the configuration of the machine tool according to the third embodiment. Referring to FIG. 26, machine tool 200 includes a processing device 10, an NC (Numerical Control) device 24, an ATC (Automatic Tool Changer) 28, and a computer 150.

  The processing apparatus 10 includes a bed 12, a column 14 installed on the bed 12, a spindle head 20 having a spindle 22, and a saddle 16 having a table 18.

  The spindle head 20 is supported on the front surface of the column 14 and is movable in the vertical direction (Z-axis direction). A tool (not shown) or a measurement head 42 is detachably attached to the tip of the main shaft 22. The main shaft 22 is supported by the main shaft head 20 so that its central axis (CL in FIG. 2) is parallel to the Z axis and is rotatable about the central axis. The measurement head 42 incorporates a laser displacement meter 100 shown in FIGS. 4 and 23, a control circuit and a driving battery for the laser displacement meter, and a communication device for performing wireless communication.

  The saddle 16 is disposed on the bed 12 and is movable in the front-rear horizontal direction (Y-axis direction). A table 18 is disposed on the saddle 16. The table 18 is movable in the left and right horizontal direction (X-axis direction). The workpiece 2 is placed on the table 18. The saddle 16 corresponds to the saddle 142 in FIGS. 4 and 23, and the table 18 corresponds to the table 144 in FIGS. The workpiece 2 corresponds to the measurement object 130 in FIGS. 4 and 23.

  The processing apparatus 10 is a machining center that performs three-axis control for linearly moving the measurement head 42 and the workpiece 2 relatively in three orthogonal directions of the X, Y, and Z axes. Unlike the configuration of FIG. 1, the processing apparatus 10 may be configured to move the spindle head 20 that supports the measurement head 42 in the X-axis and Y-axis directions with respect to the workpiece 2.

  The NC device 24 controls the operation of the entire processing device 10 including the above-described three-axis control. An ATC (automatic tool changer) 28 automatically changes the tool and the measuring head 42 with respect to the spindle 22. The ATC 28 is controlled by the NC device 24.

  FIG. 27 is a block diagram showing a functional configuration of a part related to the surface shape measuring apparatus in the machine tool of FIG. FIG. 27 shows a Z-axis feed mechanism 34, a Y-axis feed mechanism 32, and an X-axis feed mechanism 30 provided in the machining apparatus 10.

  26 and 27, the Z-axis feed mechanism 34 drives the spindle head 20 supported by the column 14 to move in the Z-axis direction. The Y-axis feed mechanism 32 drives the saddle 16 disposed on the bed 12 to move in the Y-axis direction. The X-axis feed mechanism 30 drives the table 18 that is placed on the saddle 16 and supports the workpiece 2 to move in the X-axis direction. The NC device 24 controls the Z-axis feed mechanism 34, the Y-axis feed mechanism 32, and the X-axis feed mechanism 30, respectively. The X-axis feed mechanism 30, the Y-axis feed mechanism 32, and the Z-axis feed mechanism 34 correspond to the X-axis drive mechanism 146X, the Y-axis drive mechanism 146Y, and the Z-axis drive mechanism 146Z in FIGS. 4 and 23, respectively.

  The computer 150 includes a processor 152, a memory 154, a communication device 168 that performs wireless communication with the measurement head 42, and the like. The processor 152 functions as the measurement control unit 156 and the data processing units 158 and 158A described with reference to FIGS. 4 and 23 by executing the program stored in the memory 154.

  The measurement control unit 156 continuously changes the relative positional relationship between the measurement head 42 and the workpiece 2 by cooperating with the NC device 24, whereby the laser beam 116 scans along the surface of the workpiece 2. To do. During the scanning of the laser beam 116, the measurement control unit 156 uses displacement data in the height direction (Z-axis direction) at a plurality of measurement points in the scanning direction of the laser beam 116 as surface shape data of the workpiece 2 from the measuring head 42. get. The specific procedure is as follows.

  First, based on the control from the measurement control unit 156, the NC device 24 is configured so that one of the X-axis feed mechanism 30 and the Y-axis feed mechanism 32, or the X-axis feed mechanism 30, the Y-axis feed mechanism 32, and the Z-axis feed mechanism. By driving at least two axes of the feed mechanism 34, the relative positional relationship between the measuring head 42 and the workpiece 2 is continuously changed. Here, the direction of the laser displacement meter is adjusted so that the light receiving portion of the laser displacement meter is positioned in front of or behind the scanning direction of the laser beam 116 with respect to the light emitting portion of the laser displacement meter.

  A PLC (Programmable Logic Controller) 26 built in the NC device 24 outputs a trigger signal to the communication device 168 in a predetermined cycle in synchronization with the driving of the feeding mechanism. When the communication device 168 receives the trigger signal, it transmits a measurement command f to the measurement head 42, and the measurement head 42 distances D from the measurement head 42 to the workpiece 2 according to the measurement command f (that is, displacement of the surface of the workpiece 2). Measure. Data F of the measured distance D is transmitted from the measurement head 42 to the measurement control unit 156 via the communication device 168.

  The PLC 26 further acquires positional information of the X-axis feed mechanism 30, the Y-axis feed mechanism 32, and the Z-axis feed mechanism 34 in accordance with the timing of distance measurement by the measurement head 42, so that the measurement head 42 Detect position data. The PLC 26 transmits the detected position data of the measurement head 42 to the measurement control unit 156.

  Based on the position data of the measurement head 42 acquired from the PLC 26 and the data F of the distance D acquired from the measurement head 42, the measurement control unit 156 is in the height direction at each measurement point along the scanning direction of the laser beam 116. The displacement data in the (Z-axis direction) is stored in the memory 154 as the surface shape data 166.

  The processor 152 further functions as data processing units 158 and 158A that perform data processing for removing noise included in the surface shape data 166. The operations of data processing units 158 and 158A are as described in the first and second embodiments. The errors included in the surface shape data 166 can be efficiently reduced by the data processing units 158 and 158A.

  The embodiment disclosed this time must be considered as illustrative in all points and not restrictive. The scope of the present invention is defined by the terms of the claims, rather than the description above, and is intended to include any modifications within the scope and meaning equivalent to the terms of the claims.

  2 Workpiece, 10 Processing device, 16,142 Saddle, 18,144 Table, 24 NC device, 30 X-axis feed mechanism, 32 Y-axis feed mechanism, 34 Z-axis feed mechanism, 42 Measuring head, 100 Laser displacement meter, 110 Light emitting unit, 112 laser diode, 114 lens, 116 laser beam, 118 condenser lens (optical system), 120 linear image sensor (light receiving unit), 130 measurement object, 132 laser spot, 140, 140A surface shape measuring device, 146 Movement mechanism, 146X X-axis drive mechanism, 146Y Y-axis drive mechanism, 146Z Z-axis drive mechanism, 150 computer, 152 processor, 154 memory, 156 measurement control unit, 158, 158A data processing unit, 160 feature section extraction unit, 162 data Correction unit, 163 Moving average processing , 164 filter unit, 166 surface shape data, 168 communication device, 200 a machine tool.

Claims (9)

A surface shape measuring device,
A light emitting unit that emits a light beam toward the measurement object, an optical system that collects the scattered light of the light beam from the measurement object, and a light receiving unit that detects a light collection position by the optical system, A displacement meter for measuring the displacement of the surface of the measurement object based on the light collection position at the light receiving unit;
A moving mechanism for scanning the light beam by relatively moving the displacement meter and the measurement object;
A measurement control unit for controlling the moving mechanism and the displacement meter,
The measurement control unit
The moving mechanism scans the light beam so that the light receiving unit is positioned in front of or behind the scanning direction of the light beam with respect to the light emitting unit,
During the scanning of the light beam, the displacement meter is configured to continuously measure the displacement of the surface of the measurement object as surface shape data,
The surface shape measuring device further includes a feature section extracting unit that extracts a feature section that satisfies a predetermined condition that is a section having a size equal to or smaller than the spot size of the light beam from the measurement range of the surface shape data,
The predetermined condition is that the surface shape data in one part of the first half of the feature section changes in one direction beyond a predetermined range with respect to an average value of the entire surface measurement data of the surface shape data. late part by including a condition that the surface shape data in the first half in the opposite direction is changed beyond the range predetermined with respect to the mean value of the entire said measurement range, the front surface shape measuring apparatus of the section. A surface shape measuring device,
A light emitting unit that emits a light beam toward the measurement object, an optical system that collects the scattered light of the light beam from the measurement object, and a light receiving unit that detects a light collection position by the optical system, A displacement meter for measuring the displacement of the surface of the measurement object based on the light collection position at the light receiving unit;
A moving mechanism for scanning the light beam by relatively moving the displacement meter and the measurement object;
A measurement control unit for controlling the moving mechanism and the displacement meter,
The measurement control unit
The moving mechanism scans the light beam so that the light receiving unit is positioned in front of or behind the scanning direction of the light beam with respect to the light emitting unit,
During the scanning of the light beam, the displacement meter is configured to continuously measure the displacement of the surface of the measurement object as surface shape data,
The surface shape measuring device further includes a feature section extracting unit that extracts a feature section that is a section having a size equal to the spot size of the light beam and satisfies a predetermined condition from the measurement range of the surface shape data,
The predetermined condition is that the waveform of the surface shape data in the first half of the feature section and the waveform of the surface shape data in the second half of the feature section are rotated 180 degrees around a data point at the center of the feature section. the correlation coefficient between the waveform obtained by includes a condition that exceeds a reference value predetermined, the front surface shape measuring apparatus. A data correction unit that corrects the surface shape data so that a change amount of the surface shape data with respect to an average value of the surface shape data in the entire measurement range is small in each of the one or more extracted feature sections. further comprising a surface shape measuring apparatus according to claim 1 or 2. The data correction unit averages the measurement value at an arbitrary first measurement point in each feature section with the measurement value at a second measurement point at a symmetrical position across the midpoint of the section. The surface shape measurement apparatus according to claim 3 , wherein the surface shape data is corrected by replacing each measurement value at the first and second measurement points with a value. The surface shape measurement device according to claim 3 , wherein the data correction unit corrects the surface shape data by replacing data in each feature section with an average value of the surface shape data over the entire measurement range . Relative to the surface shape data corrected by the data correcting section further comprises a filtering unit which performs low-pass filtering process to leave only the variation of a period longer than the spot size of the light beam, one of the claims 3-5 The surface shape measuring apparatus according to claim 1. A moving average processing unit that performs a moving average in a variable moving average section on the surface shape data,
The size of the moving average section is larger than the spot size of the light beam,
The size of the moving average period when performing a moving average comprising said characteristic section, the larger than the size of the moving average period when performing a moving average without the characteristic section of claim 1 or 2 Surface shape measuring device. A moving average processing unit that performs a weighted moving average on the surface shape data,
The moving average section of the weighted moving average is larger than the spot size of the light beam,
The weights for the measurement points in the feature section, the smaller than the weight for the measuring point outside the feature section, the surface shape measuring apparatus according to claim 1 or 2. A machine tool comprising the surface shape measuring device according to any one of claims 1 to 8 .