JP5798389B2 - Light irradiation test method and light irradiation test apparatus - Google Patents

Description

  The present invention relates to a light irradiation test method (light deterioration acceleration test method) for evaluating the phenomenon that various industrial materials and industrial products undergo light deterioration, and a light irradiation test apparatus therefor. In particular, when a photoelectric conversion element is used as a sample, the present invention relates to a light irradiation test method and a light irradiation test apparatus therefor that can be suitably used for a light deterioration acceleration test of the photoelectric conversion element.

  Various industrial materials and industrial products that can be exposed to the outdoors often suffer from light deterioration and heat deterioration due to sunlight. For example, it is known that the characteristics of a photoelectric conversion element typified by a solar cell change due to heat or light irradiation. In particular, the characteristics of amorphous solar cells (amorphous silicon (a-Si) solar cells, amorphous silicon germanium (a-SiGe) solar cells, amorphous germanium (a-Ge) solar cells, etc.) have output characteristics due to light irradiation. It is known that the output characteristics are restored when the heat is deteriorated and the heat is applied (Stebler-Lonsky effect). Therefore, in order to evaluate the deterioration of characteristics of the photoelectric conversion element due to light irradiation, a deterioration acceleration test is performed by irradiating light with high intensity under the condition of a constant temperature of the photoelectric conversion element. At that time, in order to separate the effect of light irradiation and the effect of heat, it is extremely important to keep the temperature of the photoelectric conversion element constant.

  In addition, there is a light irradiation test method (light / dark cycle test) in which light is turned on / off repeatedly while controlling the temperature of a sample (photoelectric conversion element) in order to simulate deterioration / recovery due to day / night fluctuations. For example, in Non-Patent Document 1, taking into account the daily solar radiation and temperature changes, exposure to the external environment equivalent to a day and night in an a-Si solar cell is 8 minutes (4 minutes light irradiation state and 4 spectral non-irradiation state). It is disclosed that it can be accelerated. As a result, it is disclosed that one day equivalent can be simulated for 8 minutes and one year equivalent for 36.5 hours, and daytime / nighttime fluctuations and seasonal fluctuations, which have been difficult in the past, can be appropriately evaluated. In the light irradiation test method described in Non-Patent Document 1, the temperature of the sample is controlled using an electronic cooling element (so-called Peltier element).

  Patent Document 1 discloses a solar simulator including a lamp bank, a temperature control unit including a cooling device and an air conditioner.

  Further, Patent Document 2 discloses a simulated solar experiment apparatus that includes a ventilation device that can send wind, a cooling device, and a measuring device mounting portion.

JP 2006-2105015 A Japanese Utility Model Publication No. 60-145472

The Journal of Reliability Engineering Association of Japan Vol.18 No.4 (1996) Akari, Nakano, Nose, Takahisa, Matsuda “Testing Method for Accelerated Aging Degradation Cycle of a-Si Solar Cells”

  The inventor has studied in detail a light irradiation test method (light / dark cycle test) that simulates day-and-night fluctuations by repeatedly turning on and off the light. When the light is switched from the off-state to the on-state and from the on-state to the off-state of the light It was found that the temperature of the sample changed greatly when switching to, and it was difficult to keep the sample temperature constant during the test. Moreover, when the inventor tried the light-dark cycle test by the structure which arrange | positions an electronic cooling element (what is called a Peltier element) in a thermostat, and installs a sample on a Peltier element similarly to the method of a nonpatent literature 1, It was found that the temperature profile differs greatly depending on the adhesion between the sample and the Peltier element, and it is difficult to control the temperature with good reproducibility. In view of such circumstances, the present invention has been made in order to suppress a rapid temperature change of a sample accompanying light on / off switching.

Here, it should be noted carefully that the problems and means of solution between the prior patent document and the present invention are completely different. Patent Document 1 discloses a solar simulator including a lamp bank, a cooling device, and a temperature control unit including an air conditioner. The light irradiation test apparatus of Patent Document 1 is an apparatus that can "approximate the change with time of sunlight" radiated during the day, considering only the continuous light intensity change of the irradiation light. Device. In fact, according to FIG. 5 of Patent Document 1, since the irradiance continuously changes from 0 W / m ² to 1120 w / m ² over 4 hours, the temperature control of the sample is easy. Therefore, from Patent Document 1, the problem of “suppressing a rapid temperature change associated with light on / off switching” cannot be assumed. Further, “the combination of the temperature control mechanism and a separate cooling air blowing mechanism”, which is a main part of the present invention, has no description or suggestion in the invention of Patent Document 1.

  Further, Patent Document 2 discloses a simulated solar experiment apparatus including a ventilation device that can send wind, a cooling device, and a measuring device mounting portion. However, the idea of feeding back data measured by a measuring device to a cooling mechanism is disclosed. Not at all. Solves the problem of the present invention which has the essence of "combination of a temperature control mechanism and a cooling air blowing mechanism different from the temperature control mechanism in order to suppress a rapid temperature change due to light on / off switching". The means are also different. In addition, while the present invention attempts to control the temperature precisely in a closed system for temperature control, in Patent Document 2, “the periphery of the specimen mounting portion is configured to be open to the outside” The idea of temperature control is contradictory.

In view of such circumstances, the inventor studied a method for precisely controlling the temperature of a sample in a light irradiation test method for simulating day-and-night fluctuations by repeatedly turning on and off light, and reached the present invention. The first invention group is a light irradiation test methods, the second invention group is a light irradiation test equipment.

The light irradiation test method of the present invention alternately performs a step of performing light irradiation on a photoelectric conversion element as a sample and a step of not performing light irradiation . The holding tank is provided with a temperature control mechanism for controlling the atmospheric temperature in the holding tank to a constant temperature, and a cooling air blowing mechanism different from the temperature control mechanism. The cooling air blowing mechanism includes a vortex tube, and the vortex tube is arranged so as to blow cool air from the back side of the light irradiation surface of the sample to the sample. A cold air dispersion plate is provided between the vortex tube and the sample for dispersing the cold air from the vortex tube and applying it to the sample. In the light irradiation test method of the present invention, air is blown from the back side of the light irradiation surface of the sample by controlling the cooling air blowing mechanism according to the presence or absence of light irradiation and / or the measurement temperature of the sample. Adjust the temperature.

In one form of the light irradiation test method of the present invention, Ru time and Der least 2 minutes to 15 minutes or less any time of the light irradiation is not performed the step of step of performing light irradiation.

In one embodiment of the light irradiation test method of the present invention, and performing light irradiation to the sample, it intends row at least 100 times or more and a step of not performing light irradiation.
The light irradiation test apparatus of the present invention is an apparatus for performing the light irradiation test, and includes a holding tank including a sample stage for holding a photoelectric conversion element as a sample in the tank, and a light source device. The irradiation light emitted from the light source device is configured to be applied to the sample held in the holding tank through the light irradiation window provided in the holding tank.

According to the method of the present invention , the temperature of the sample can be appropriately controlled in the case of simulating day and night fluctuations by repeatedly turning on and off light irradiation. Further, by using the apparatus of the present invention, it is possible to appropriately control the temperature of the sample when simulating day and night fluctuations by repeatedly turning on and off light irradiation. By using the light irradiation test method and the light irradiation test apparatus according to the present invention, it is possible to assess the phenomenon of photoelectric conversion element is deteriorated light when off the original light of constant temperature.

It is a block diagram of the light irradiation test apparatus which concerns on Example 1 of this invention. It is an example of the temperature change of the sample (photoelectric conversion element) at the time of performing a light irradiation test using the light irradiation test apparatus which concerns on Example 1 of this invention.

(Overall configuration of the device)
The light irradiation test apparatus according to the present invention is essential in that the temperature of the sample can be controlled to be constant even when the light irradiation is repeatedly turned on and off. The apparatus mainly includes a holding tank and a light source device. The holding tank is formed with a light irradiation window that takes in the irradiation light emitted from the light source device, and the light irradiated from the light source device enters the holding tank through the light irradiation window. The holding tank holds the sample (photoelectric conversion element) that is the subject of the light irradiation test and is irradiated with light.

  The holding tank has a temperature control mechanism capable of controlling the inside of the tank to a constant temperature. A commercially available thermostatic bath can be used as the holding bath having the temperature control mechanism. The holding tank may be provided with a humidity control mechanism. In that case, as one embodiment, it is preferable that the humidity can be maintained at 0% to 5%, more preferably 0% to 1%. This is because condensation occurs on the sample when the sample is cooled by the cooling air blowing mechanism. As another embodiment, when the light and humidity resistance test is performed, it is preferable that the humidity can be maintained at 70% or more and 100% or less, more preferably 80% or more and 100% or less.

  The holding tank is provided with a cooling air blowing mechanism different from the temperature control mechanism of the holding tank. It is preferable that a temperature measuring mechanism for measuring the temperature of the sample is provided on the sample stage provided in the holding tank. The temperature measuring mechanism is not particularly limited as long as it can measure the temperature of the sample in the holding tank, but a thermocouple, a radiation thermometer, or the like is used.

(light source)
The light source for light irradiation is not particularly limited as long as it is a light emitting element capable of light irradiation. For example, halogen lamps, xenon lamps, metal halide lamps, tungsten lamps, mercury lamps, sodium lamps and the like can be mentioned. Moreover, you may use LED and various lasers.

  Further, a combination of a plurality of these light emitting elements may be used. From the viewpoint of performing an accelerated test of deterioration of the photoelectric conversion element by pseudo-sunlight, a light source having a spectrum matching degree of JIS C8942 equivalent to class C, more preferably class B or more, most preferably class A is preferable. For that purpose, a xenon lamp or a combination of a xenon lamp and a halogen lamp is particularly preferable. In order to make it more approximate to sunlight, it is also a preferred embodiment to use an air mass filter and / or a bright line cut filter.

Light irradiation Ikyo degree 100 mW / cm ² or more, more preferably from 200 mW / cm ² or more, 350 mW / cm ² or more. This is because 100 mW / cm ² is the irradiance of sunlight that is normally irradiated on the ground, and light degradation of less than 100 mW / cm ² does not accelerate light degradation. Further, according to known literatures so far, with regard to amorphous solar cells, at least 200 times acceleration of light deterioration is expected at 200 mW / cm ² or more, and at least about 10 times light deterioration is expected at 350 mW / cm ² or more. This is because acceleration can be expected.

Light irradiation Ikyo degree in terms of acceleration of photodegradation good The stronger, but the optimum light irradiation Ikyo degree for another technical difficulties there is an upper limit. That is, light irradiation Ikyo degree is preferably 1000 mW / cm ² or less, more preferably 500 mW / cm ² or less. This is because light irradiation Ikyo degree 1000 mW / cm ² is greater than, the deterioration of the light source lamp is intense, is because not be performed continuously for 500 hours or more optical deterioration acceleration test. Further, light irradiation Ikyo degree 500 mW / cm ² is greater than, greater temperature increase of the sample due to light irradiation is because even with the configuration according to the present invention are also difficult case to temperature control.

It is preferable that continuous light irradiation can be performed for 500 hours or longer, more preferably 1000 hours or longer. For the amorphous solar cell, to do photodegradation acceleration equivalent 10 years with light irradiation of 350 mW / cm ² requires continuous irradiation of 500 hours or more, considerable light 20 years with light irradiation of 350 mW / cm ² This is because continuous irradiation for 1000 hours or more is necessary to accelerate deterioration.

  In order to keep the light irradiation light intensity constant, it is preferable to provide a feedback circuit that monitors the irradiation light intensity and adjusts the current flowing through the light emitting element in accordance with the detected light intensity. This is because it is useful for keeping the irradiation light intensity on the sample constant.

  Irradiating the sample with the irradiation light via the integrator lens or the fish-eye lens (fly eye lens) is useful for eliminating unevenness of the irradiation light intensity on the sample.

  Examples of on / off of light irradiation include control by turning on / off power supply to the light source and control by opening / closing a light guide path by providing a shutter, but control by the shutter is preferable. This is because the control by turning on / off the power supply to the light source accelerates the deterioration of the light source element and the spectrum and intensity of the irradiation light are not stable.

(Light irradiation process)
The light irradiation test method according to the present invention includes at least a step of performing light irradiation on a sample (in particular, a photoelectric conversion element) (bright step) and a step of not performing light irradiation (dark step). It is preferable to perform the light process and the dark process at least 100 times or more, preferably 500 times, and most preferably 4000 times or more. This is because, in order to perform the light irradiation accelerated test for about 3 months, about 1 year, or about 10 years, it is necessary to repeat the light process and the dark process more than the number of times described above.

When both the time of the bright process and the time of the dark process are 30 minutes or less, the configuration of the present invention significantly contributes to solving the problem. This is because, Akira process time and dark sizes have if more time is 30 minutes steps, from the light non-irradiation state to a light irradiation state switching (hereinafter dark-light referred to as switching) and from the light irradiation state to the light non-irradiating state Although there is a time when the sample temperature deviates from the desired sample temperature due to switching (hereinafter referred to as light-dark switching), the time when the temperature has settled and reached the equilibrium temperature is sufficiently longer than the time when the sample temperature deviates. This is because the influence of the temperature change accompanying the switching and the dark / light switching is slight.

  When both the time of the light process and the time of the dark process are 2 minutes or more, the configuration of the present invention significantly contributes to solving the problem. This is because if the time of the light process and the time of the dark process are less than 2 minutes, the process proceeds to the dark process before the temperature rise of the sample starts in the light process, and the process proceeds to the light process before the temperature drop of the sample starts in the dark process. This is because temperature control is facilitated.

(Temperature control mechanism and light irradiation test method)
As described above, the holding tank is provided with a cooling air blowing mechanism different from the temperature control mechanism of the holding tank. Then, by linking the on / off control mechanism of the light irradiation, the temperature control mechanism of the holding tank, and the cooling air blowing mechanism, cold air is blown against the sample in accordance with the light irradiation to adjust the temperature of the sample. In addition, it is preferable to link a temperature measuring mechanism for measuring the temperature of the sample as necessary.

  The cooling air blowing mechanism is preferably located on the back side of the light irradiation surface of the sample, and the cooling air is preferably blown from the back surface of the surface where the sample is irradiated with light. This is because the cooling fan mechanism is optimal for cooling the sample uniformly without interfering with the irradiation light.

  A vortex tube is preferable as the cooling air blowing mechanism. This is because it is possible to generate cold air having sufficient cooling capacity and to instantaneously switch between the blowing state and the no-air state.

As a preferred sample temperature control mode, the temperature of the sample is adjusted by having a function of adjusting the temperature control mechanism and the cooling air blowing mechanism in accordance with the presence or absence of light irradiation of the light source and / or the measured temperature of the sample. Some specific patterns of temperature adjustment modes are shown below, but the present invention is not limited to these patterns, and other temperature adjustment modes are also selected depending on how precisely the temperature needs to be controlled. The
As a first specific sample temperature adjustment mode, the cooling air blowing mechanism is operated in the bright process, and the cooling air blowing mechanism is stopped in the dark process. The temperature setting of the temperature control mechanism is constant throughout the light process and the dark process.

  As a second specific sample temperature adjustment mode, the cooling blower mechanism is operated at the time of light irradiation, and the temperature control mechanism is operated at a setting for lowering the temperature in the tank. On the other hand, when the light is not irradiated, the cooling air blowing mechanism is stopped, and the temperature control mechanism is operated with a setting for further increasing the temperature in the tank. This embodiment can control the temperature more precisely than the first embodiment.

  As a third specific sample temperature adjustment mode, in addition to the first and second embodiments described above, each temperature control condition of the temperature control mechanism and the cooling air blowing mechanism at the time of dark / light switching and at the time of light / dark switching Is continuously changed. This embodiment can control the temperature more precisely than the first and second embodiments.

  As another preferred sample temperature adjustment mode, the temperature of the sample is adjusted by having a function of adjusting the temperature control mechanism and the cooling air blowing mechanism in accordance with the sample temperature measured by the temperature measurement mechanism.

  As a more specific sample temperature adjustment mode, at the time of light irradiation, based on the difference between the sample temperature and the desired temperature, the amount of cooling air in the cooling fan mechanism and / or the set temperature of the temperature control mechanism are set. The automatic adjustment is performed so that the difference becomes smaller. On the other hand, when the light is not irradiated, the cooling air blowing mechanism is stopped, and when the light is irradiated, the temperature control mechanism is automatically adjusted based on the difference between the sample temperature and the desired temperature so that the difference becomes smaller.

(Device diagram)
An embodiment of the present invention will be described below with reference to FIG. FIG. 1 is a plan view of an essential part of the embodiment. The apparatus according to this embodiment is mainly composed of a light source device 1 and a holding tank 15. Inside the light source device 1, a 1.6 kW xenon lamp (UXL-1600SX, manufactured by Ushio Inc.) was disposed as the light source 1. A condenser mirror 3 is disposed around the light source 1. The light irradiated radially from the light source is guided to the first mirror 4 provided on the upper part of the light source 1 by the condenser mirror 3. A blower is provided around the light source 1 to cool the light source 1 and peripheral members and exhaust them to the outside (not shown).

  The light reflected by the first mirror 4 is transmitted to the integrator lens 5 and the A.E. M.M. The light is guided to the second mirror body 8 through the 1.5 filter 7. The integrator lens 5 makes the irradiance more uniform. A. M.M. The 1.5 filter 7 is a spectral filter for approximating the spectrum of irradiation light to the spectrum of sunlight. A. M.M. The degree of coincidence between the irradiation light spectrum and the sunlight spectrum (air mass 1.5) by the 1.5 filter 7 was equivalent to class C in JIS C8942.

  Integrator lens 5 and A.I. M.M. A shutter 6 is provided between the 1.5 filter 7 and the on / off of light irradiation can be controlled by controlling the opening and closing timely.

  Although not shown in the drawing, a beam splitter is provided between the first mirror 4 and the integrator lens, and a part of the irradiated light is taken out and the light intensity is monitored by a photodiode. Further, a feedback circuit is provided for adjusting the current flowing through the light source so that the monitored light intensity is constant. Thereby, even when a light source whose irradiation light intensity is attenuated due to deterioration with time is used, light irradiation can always be performed with a constant illuminance.

  The light guided to the second mirror 8 enters the thermostat 15 from the light source device 1 through the collimator lens 9. A light irradiation window 14 for guiding light from the light source device 1 is provided in the upper part of the thermostatic chamber 15. The periphery from the collimator lens 9 to the light irradiation window 14 is covered with a metal black light-shielding member to prevent light leakage and heat leakage from the thermostat.

  The holding tank 15 used was an Espec Corp. constant temperature and humidity chamber (Platinum K series) provided with a light irradiation window 14. A temperature sensor is provided inside the thermostatic bath so that the temperature in the bath can be controlled to be constant.

  A sample stage 11 for installing a sample (photoelectric conversion element) to be used in the accelerated light degradation test is disposed in the thermostatic chamber. The sample stage 11 is made of a SUS wire mesh. Furthermore, thermocouples were attached to the four corners and the center of the sample stage so that the sample temperature could be measured by directly contacting the sample placed on the sample stage 11. When the sample stage 11 is irradiated with light from the light irradiation window 14, it is irradiated over a range of a perfect circle having a diameter of about 20 cm. A cold air dispersion plate 12 and three vortex tubes 13 are arranged on the lower surface of the sample stage 11. The cold wind dispersion plate 12 is a 15 cm square metal plate, and holes with diameters of 1 mm are formed on the surface at intervals of 1 cm. The cold air blown from the vortex tube 13 cools the photoelectric conversion element installed on the sample stage 11 through the holes formed in the cold air dispersion plate 12. When the cold air dispersion plate 12 does not exist, strong cold air from the vortex tube locally hits the photoelectric conversion element, and thus the temperature unevenness of the photoelectric conversion element is likely to occur. However, when the cold air dispersion plate 12 exists, It is possible to uniformly cool the 15-cm square area of the sample on 11. The distance from the cold wind dispersion plate 12 to the sample (photoelectric conversion element) 10 was 1.5 cm.

(Photo degradation test pattern 1)
Light irradiation morphism intensity at the sample stage 11 was set to 350 mW / cm ² (milliwatts per square centimeter). An attempt was made to control the temperature of the sample (photoelectric conversion element) to 20 ° C. with 5 cycles of light irradiation and 5 minutes of light non-irradiation as one cycle. A 10 cm square photoelectric conversion element was used as a sample and fixed to the sample stage 11. Thermocouples were attached to the four corners and the center of the back surface of the photoelectric conversion element so that the temperature profile could be measured every 5 seconds. The vortex tube was operated only during light irradiation, and the circulating air temperature in the thermostatic bath was controlled to be 17 ° C. when irradiated with light and 20 ° C. when not irradiated with light. FIG. 2 shows temperature profiles of five thermocouples attached to the center and four corners of the photoelectric conversion element. It can be seen that a rapid change in temperature was suppressed even when the light was turned on and off, and that the temperature could be maintained between 18 ° C. and 22 ° C. on the entire surface of the sample.

Further, when 100 cycles were performed using an amorphous silicon solar cell as a photoelectric conversion element and the output characteristics of the solar cell before and after the test were compared, it was assumed when light irradiation at 20 ° C. and 350 mW / cm ² was performed for 500 minutes. Degradation of output characteristics was observed. From this, it can be seen that by controlling the temperature and irradiance, a light degradation acceleration test can be performed in consideration of the effect of day and night.

(Photo degradation test pattern 2)
Light irradiation morphism intensity at the sample stage 11 was set to 350 mW / cm ² (milliwatts per square centimeter). An attempt was made to control the temperature of the sample (photoelectric conversion element) to 20 ° C. with 5 cycles of light irradiation and 5 minutes of light non-irradiation as one cycle. A 10 cm square photoelectric conversion element was used as a sample and fixed to the sample stage 11. Thermocouples were attached to the four corners and the center of the back surface of the photoelectric conversion element so that the temperature profile could be measured every 5 seconds. The circulating air temperature in the thermostatic bath was controlled to be 17 ° C. when irradiated with light and 20 ° C. when not irradiated with light. The program was set so that the vortex tube operates when the temperature of the photoelectric conversion element exceeds a certain reference temperature, and stops when the light irradiation state changes to the light non-irradiation state. When a light irradiation test similar to the light degradation accelerated test pattern 1 was performed, temperature control at the time of light on / off was possible to the same extent as the light degradation accelerated test pattern 1.

(Comparative Example 1)
In the light degradation acceleration test pattern 1, the light degradation acceleration was performed in the same manner as described in Example 1 except that instead of the sample stage 11, the cold air dispersion plate 12, and the vortex tube 13, a sample stage made of a Peltier element was used. A test was conducted. However, since the adhesion between the sample and the Peltier element is uneven, the temperature of the entire surface of the sample cannot be uniformly controlled. In addition, since the cooling capacity is insufficient, an increase in the temperature of the sample cannot be suppressed when switching from the non-light irradiation state to the light irradiation state.

Moreover, when 100 cycles were performed using an amorphous silicon solar cell as an electric conversion element and the output characteristics of the solar cell before and after the test were compared, it was assumed when light irradiation at 20 ° C. and 350 mW / cm ² was performed for 500 minutes. The degradation was significantly less than the degradation of the output characteristics. This indicates that the output of the amorphous silicon solar cell has been recovered due to the temperature rise due to light irradiation. Therefore, it can be seen that an accelerated photodegradation test in which the temperature is appropriately controlled has not been completed.

1. 1. Light source device Light source Condenser mirror 4. First mirror 5. Integrator lens 6. Shutter 7. A. M.M. 1.5 filter
8). Second mirror 9. Collimator lens 10. Sample (photoelectric conversion element)
11. Sample stage 12. Cold air dispersion plate 13. Vortex tube 14. Light irradiation window 15. Holding tank

Claims (6)

A light irradiation test method for alternately performing a step of performing light irradiation and a step of not performing light irradiation on a sample held in a holding tank ,
The sample is a photoelectric conversion element,
Wherein the holding tank includes a temperature control mechanism for controlling the ambient temperature in the holding tank at a constant temperature, and another cooling blower mechanism is provided with said temperature control mechanism,
The cooling air blowing mechanism includes a vortex tube,
The vortex tube is arranged so as to blow cold air from the back side of the light irradiation surface of the sample to the sample,
Between the vortex tube and the sample, there is provided a cold air dispersion plate for dispersing the cold air from the vortex tube and hitting the sample,
Depending on the temperature measured by the presence or absence and / or the sample light irradiation, by controlling the cold却用blower mechanism, by blowing cold air from a back surface of the light irradiated surface of the sample, adjusting the temperature of the sample It characterized the Turkey, light irradiation test method. 2. The light irradiation test according to claim 1, wherein, in addition to controlling the cooling air blowing mechanism, the temperature control mechanism is also controlled according to the presence or absence of light irradiation and / or the measured temperature of the sample. Method. Light irradiation test method according to claim 1 or 2, wherein the time of step is not performed time and light irradiation step of performing light irradiation, both at 15 minutes or less for at least 2 minutes. And performing light irradiation, the light irradiation test method according to any one of claims 1 to 3, and a step of not performing light irradiation and performs at least 100 times or more. The light irradiation intensity for the sample in the step of performing light irradiation is 100 mW / cm. ² It is the above, The light irradiation test method of any one of Claims 1-4. A holding tank provided with a sample stage for holding a photoelectric conversion element as a sample in the tank, have a light source device, the light irradiation windows irradiation light is found arranged in the holding tank to be emitted from the light source device A light irradiation test apparatus configured to irradiate a sample held in a holding tank via
With the sample held in the tank, a mechanism for exchange may be performed each other and a step of not performing the process and light irradiation for performing light irradiation,
Wherein the holding tank includes a temperature control mechanism for controlling the ambient temperature in the holding tank at a constant temperature, another cooling blower mechanism is provided with said temperature control mechanism,
The cooling air blowing mechanism includes a vortex tube,
The vortex tube is arranged so as to blow cold air from the back side of the light irradiation surface of the sample to the sample,
Between the vortex tube and the sample stage, there is provided a cold air dispersion plate for dispersing the cold air from the vortex tube and suppressing the cold air from locally hitting the sample,
Depending on the temperature measured by the presence or absence and / or the sample light irradiation, I by the controlling the cooling blower mechanism performs air blowing from the back surface of the light irradiated surface of the sample, adjusting the temperature of the sample A light irradiation test apparatus comprising a mechanism.

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