JP5789368B2 - 電子デバイスの導電性フィーチャの製造方法 - Google Patents
電子デバイスの導電性フィーチャの製造方法 Download PDFInfo
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- JP5789368B2 JP5789368B2 JP2010249432A JP2010249432A JP5789368B2 JP 5789368 B2 JP5789368 B2 JP 5789368B2 JP 2010249432 A JP2010249432 A JP 2010249432A JP 2010249432 A JP2010249432 A JP 2010249432A JP 5789368 B2 JP5789368 B2 JP 5789368B2
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- 229910052814 silicon oxide Inorganic materials 0.000 description 1
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- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 229940116411 terpineol Drugs 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 239000011135 tin Substances 0.000 description 1
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- 239000010936 titanium Substances 0.000 description 1
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- 239000011701 zinc Substances 0.000 description 1
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66742—Thin film unipolar transistors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/45—Ohmic electrodes
- H01L29/456—Ohmic electrodes on silicon
- H01L29/458—Ohmic electrodes on silicon for thin film silicon, e.g. source or drain electrode
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/124—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/1292—Multistep manufacturing methods using liquid deposition, e.g. printing
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- Ceramic Engineering (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Electrodes Of Semiconductors (AREA)
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- Laminated Bodies (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Manufacturing Of Electric Cables (AREA)
Description
例示的な有機安定剤には、チオールおよびその誘導体、アミンおよびその誘導体、カルボン酸およびカルボキシレート誘導体、ポリエチレングリコールおよび他の有機界面活性剤がある。また、有機安定剤としては、チオール、例えば、ブタンチオール、ペンタンチオール、ヘキサンチオール、ヘプタンチオール、オクタンチオール、デカンチオール、およびドデカンチオール、アミン、例えば、エチルアミン、プロピルアミン、ブチルアミン、ペンチルアミン、ヘキシルアミン、ヘプチルアミン、オクチルアミン、ノニルアミン、デシルアミン、ドデシルアミンおよびヘキシルデシルアミン、ジチオール、例えば、1,2−エタンジチオール、1,3−プロパンジチオールおよび1,4−ブタンジチオール、ジアミン、例えば、エチレンジアミン、1,3−ジアミノプロパン、1,4−ジアミノブタン、チオールおよびジチオールの混合物、およびアミンおよびジアミンの混合物からなる群から選択できる。銀含有ナノ粒子を安定化させることができるピリジン誘導体、例えば、ドデシルピリジン、および/又は有機ホスフィンを含有する有機安定剤を選択することもできる。
新しく調製したドデシルアミン安定化銀ナノ粒子を用いた。15重量%の銀ナノ粒子のトルエンへの分散液を調製し、ガラススライド上にスピンコーティングした。成膜組成物を約115℃で10分間焼成して、94nmの厚さを有する薄膜を得た。導電率は、四探針法を用いて測定したところ、3.04×104S/cmであった。明らかに、新しく調製したドデシルアミン安定化銀ナノ粒子は、約115℃での処理温度での焼成後、高い導電率を示した。
同じバッチの銀ナノ粒子を、所定の期間(3ヶ月以上)貯蔵後に使用した。銀ナノ粒子のトルエンへの分散液(15重量%)を調製し、ガラススライド上にスピンコーティングした。成膜組成物を約120℃で20分未満焼成して、93nmの厚さを有する薄膜を得た。四探針法を用いて測定したところ、焼成された薄膜は導電性ではなかった。即ち、ドデシルアミン安定化銀ナノ粒子の導電率は、長期間貯蔵後に著しく減退した。
比較例2の貯蔵後分散液を使用した。成膜組成物を約110℃で10分間加熱すると共に同時に、水酸化アンモニウムの塩基性蒸気を施した。この蒸気はホットプレート表面上に水酸化アンモニウム溶液を数滴ドリップすることによって作成した。これらの条件で加熱処理した後、得られた薄膜の導電率は、四探針法を用いて測定したところ、3.82×104S/cmであった。
比較例2の貯蔵後分散液を使用した。成膜組成物をアセトンで希釈した水酸化アンモニウム溶液に1〜2分間浸漬し、次いで約95℃で10分間加熱処理した。得られた膜(84nmの厚さ)は高導電性となり、その導電率は3.06×104S/cmに達した。
比較例2の貯蔵後分散液を使用した。成膜組成物を約95℃で10分間焼成したところ、焼成された薄膜(86nmの厚さ)は導電性ではなかった。この薄膜を次に、アセトンで希釈した水酸化アンモニウム溶液に約1〜2分間浸漬し、次いで約95℃で10分間乾燥した。薄膜は非常に導電性となり、その導電率は4.27×104S/cmに達した。
比較例2の貯蔵後分散液を使用した。成膜組成物を約85℃で15分間焼成したところ、焼成された薄膜(88nmの厚さ)は導電性ではなかった。この薄膜を次に、アセトンで希釈した水酸化アンモニウム溶液に約1〜2分間浸漬し、次いで約10分間加熱せずに空気乾燥した。得られた薄膜は高導電性となり、その導電率は4.87×103S/cmに達した。さらに乾燥させるために、室温で、空気中で一晩放置した後、導電率は1.11×104S/cmに増加した。
Claims (5)
- 電子デバイスの導電性フィーチャの製造方法であって、
有機系安定剤が表面上に存在する銀ナノ粒子を含有する組成物を、基材上に成膜して成膜組成物を形成し、
前記成膜組成物を100℃以下の温度で加熱し、
前記成膜組成物をアルカリ組成物に接触させて導電性フィーチャを形成する、
ことを含む電子デバイスの導電性フィーチャの製造方法。 - 請求項1に記載の製造方法において、
前記アルカリ組成物は、水酸化ナトリウム、水酸化カリウム、水酸化カルシウム、水酸化マグネシウム、水酸化アンモニウム、アンモニア、炭酸ナトリウム、酢酸ナトリウム、有機アミン、イミダゾール、ピリジン、又はその混合物を含むことを特徴とする導電性フィーチャの製造方法。 - 請求項2に記載の製造方法において、
前記アルカリ組成物は、少なくとも水酸化アンモニウムを含むことを特徴とする導電性フィーチャの製造方法。 - 請求項3に記載の製造方法において、
前記アルカリ組成物は、水と、炭化水素溶媒、アルコール、エーテル、テトラヒドロフラン、クロロベンゼン、ジクロロベンゼン、トリクロロベンゼン、ニトロベンゼン、シアノベンゼン、アセトニトリル、アセトン、及びこれらの混合物から選択される有機溶媒とを含有する水酸化アンモニウム水性溶液であることを特徴とする導電性フィーチャの製造方法。 - 請求項1〜4のいずれか1項に記載の製造方法において、
前記成膜組成物の加熱及び前記アルカリ組成物に対する接触は、同時に行われることを特徴とする導電性フィーチャの製造方法。
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US4353741A (en) * | 1979-03-12 | 1982-10-12 | Olin Corporation | Silver coated particles and a process for preparing them |
US4508756A (en) * | 1980-10-08 | 1985-04-02 | Murata Manufacturing Co., Ltd. | Method for inhibiting oxidation of a copper film on ceramic body |
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US20050129843A1 (en) | 2003-12-11 | 2005-06-16 | Xerox Corporation | Nanoparticle deposition process |
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US7306969B2 (en) | 2005-07-22 | 2007-12-11 | Xerox Corporation | Methods to minimize contact resistance |
US7919015B2 (en) * | 2006-10-05 | 2011-04-05 | Xerox Corporation | Silver-containing nanoparticles with replacement stabilizer |
US7737497B2 (en) | 2007-11-29 | 2010-06-15 | Xerox Corporation | Silver nanoparticle compositions |
US20090142482A1 (en) * | 2007-11-30 | 2009-06-04 | Xerox Corporation | Methods of Printing Conductive Silver Features |
US8048488B2 (en) * | 2008-01-14 | 2011-11-01 | Xerox Corporation | Methods for removing a stabilizer from a metal nanoparticle using a destabilizer |
US8382878B2 (en) * | 2008-08-07 | 2013-02-26 | Xerox Corporation | Silver nanoparticle process |
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