JP5783230B2 - Method for producing silicon carbide single crystal - Google Patents

Description

  The present invention relates to a method for producing a SiC single crystal in which a raw material gas is supplied to a seed crystal composed of a silicon carbide (hereinafter referred to as SiC) single crystal to produce a SiC single crystal.

  Conventionally, for example, Patent Document 1 proposes a manufacturing apparatus for growing a SiC single crystal by a sublimation recrystallization method. Specifically, in Patent Document 1, a cylindrical heater is disposed so as to surround the outer periphery of the crucible, and further, a graphite heat insulating material is provided so as to surround the outer periphery of the heater and to surround the heater and the crucible from above and below. A method for growing a SiC single crystal in an arranged state has been proposed.

  When growing a SiC single crystal in this way, it is common to start the growth of the SiC single crystal with a graphite heat insulating material containing less than 100 ppm of Si arranged around the crucible. .

JP 2008-290885 A

  However, in the above-described conventional technique, when the growth of the SiC single crystal is started, the growth temperature of the SiC single crystal cannot be controlled and the growth is unstable, and the inventors have made it impossible to produce a high-quality SiC single crystal.・ Clarified by examination.

  In view of the above points, the present invention provides a method for producing a SiC single crystal capable of enabling stable growth of the SiC single crystal when a heat insulating material is disposed around the crucible to grow the SiC single crystal. For the purpose.

  Since the sublimation gas leaking from the crucible is absorbed by a new heat insulating material, the heating conditions of the crucible change every moment by changing the physical properties of the heat insulating material. It has been found that the growth temperature becomes unstable, and as a result, the silicon carbide single crystal cannot be grown stably.

  Therefore, in the invention described in claim 1, a step of preparing a heat-insulating material (11) that has absorbed silicon, and a heat-insulating material (11) that has absorbed silicon are disposed on the outer periphery of the crucible (2). And a growth step of growing the silicon carbide single crystal (6) on the seed crystal (4) by heating the crucible (2) in a state of surrounding the outer periphery of To do.

  According to this, since the heat insulating material (11) has already absorbed silicon, the silicon carbide single crystal (6) is grown when the silicon carbide single crystal (6) is grown using the heat insulating material (11) that has absorbed the silicon in the growth process. The deterioration rate of the heat insulating material (11) that has absorbed water becomes slow. For this reason, since the physical property of the heat insulating material (11) in the growth process is already stable, the temperature change due to the change in the physical property of the heat insulating material (11) that has absorbed silicon is reduced, and the temperature of the crucible (2) is desired. The growth temperature can be easily controlled. Therefore, stable growth of the silicon carbide single crystal (6) can be enabled in the growth process.

  Here, “absorbing silicon” is defined as a case where silicon is absorbed by 1% or more and less than 50% with respect to the proportion of carbon. If less than 1% of silicon is absorbed, deterioration of the heat insulating material still proceeds rapidly and the change in physical properties becomes large, so that stable growth cannot be achieved. On the other hand, when 50% or more of silicon is absorbed, most of the silicon becomes SiC and the heat insulating effect is lost, so that it does not serve as a heat insulating material. On the contrary, “does not absorb silicon” is defined as a case where silicon is contained in less than 1% with respect to the carbon ratio. Also, this carbon ratio means atomic percent, not weight percent. That is, the phrase “contains less than 1% silicon relative to the carbon ratio” is a ratio such that one silicon atom is included in more than 100 carbon atoms.

In addition, as a means for quantitatively analyzing the ratio of silicon contained in the heat-insulating material (11) that has absorbed silicon, an EPMA (Electron Probe MicroAnalyser) or SEM (Scanning Electron Microscope) is attached. Analyzer EDX (Energy
Dispersive X-ray Spectroscopy: energy dispersive X-ray analysis).

In addition, ICP-AES (Inductively Coupled Plasma Atomic Emission) is used as a means for quantitative analysis of the proportion of trace amounts of silicon contained in the graphite heat insulating material (20) that does not absorb silicon.
Spectrometry: inductively coupled plasma emission spectroscopy).

In the first aspect of the present invention, the step of preparing the heat-insulating material (11) in which silicon is absorbed includes the step of placing the silicon-containing material (21) in the container body (2a) as the crucible (2) and the lid. (2b) is prepared, a graphite heat insulating material (20) not absorbing silicon is disposed on the outer periphery of the crucible (2) so as to surround the outer periphery of the crucible (2), and the crucible (2) is heated. And a step of absorbing silicon contained in the sublimation gas leaked from the crucible (2) by heating the silicon-containing material (21) to the graphite heat insulating material (20) not absorbing silicon. Yes. In the growth step, after the step of absorbing silicon, the crucible (2) is provided with the silicon carbide raw material (5) in the container body (2a) and the pedestal (3) with the seed crystal (4). 2) is prepared, and the heat-insulating material (11) having absorbed silicon obtained in the step of absorbing silicon is disposed in the outer periphery of the crucible (2) so as to surround the outer periphery of the crucible (2). The silicon carbide single crystal (6) is grown on the seed crystal (4) by heating (2).

  Thus, the heat insulating material (11) which absorbed silicon can be manufactured from the heat insulating material (20) made of graphite which has not absorbed silicon by performing the process of absorbing silicon. And a silicon carbide single crystal (6) can be grown at a growth process using the heat insulating material (11) which absorbed silicon manufactured at the process of absorbing silicon.

  Specifically, in the invention according to claim 1, in the step of absorbing silicon, a crucible (20) in which the heat insulating material made of graphite not absorbing silicon is in contact with the outer wall of the crucible (2). The sublimation gas leaked from 2) is absorbed by a graphite heat insulating material (20) that does not absorb silicon.

  Further, as in the invention described in claim 2, in the growth process, by heating the crucible (2) in a state where the heat insulating material (11) having absorbed silicon is in contact with the outer wall of the crucible (2), A silicon carbide single crystal (6) can also be grown on the seed crystal (4).

  In the above manufacturing method, the silicon carbide raw material (5) is disposed in the container body (2a) of the crucible (2), and the sublimation recrystallization method of supplying the sublimation gas of the silicon carbide raw material (5) to the seed crystal (4). However, the present invention can also be applied to a gas supply method in which a silicon-containing gas and a source gas of a carbon-containing gas are supplied to the seed crystal (4).

  In addition, the code | symbol in the bracket | parenthesis of each means described in this column and the claim shows the correspondence with the specific means as described in embodiment mentioned later.

It is a section lineblock diagram of a SiC single crystal manufacturing device concerning a 1st embodiment of the present invention. It is the figure which showed the Si concentration profile of the AB cross section of the heat insulating material in FIG. It is the figure which showed the manufacturing process of the SiC single crystal. It is a section lineblock diagram of the SiC single crystal manufacturing device concerning a 2nd embodiment of the present invention.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings. In the following embodiments, the same or equivalent parts are denoted by the same reference numerals in the drawings.

(First embodiment)
Hereinafter, a first embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a cross-sectional configuration diagram of an SiC single crystal manufacturing apparatus 1 according to the present embodiment. As shown in this figure, the SiC single crystal manufacturing apparatus 1 is a hollow graphite body constituted by a bottomed cylindrical container body 2a and a circular lid body 2b for closing the container body 2a. A crucible 2 is provided.

  A pedestal 3 is provided on one surface of the lid 2b of the crucible 2 (the surface facing the container body 2a), and, for example, a circular SiC seed crystal 4 (silicon carbide single crystal substrate) is provided via the pedestal 3. Is arranged. Here, the pedestal 3 is separate from the lid 2b, and may be integrated with the lid 2b. Further, the pedestal 3 may be a part of one surface of the lid 2b protruding from the one surface, that is, a part of the lid 2b.

  On the other hand, an SiC powder raw material 5 serving as a sublimation gas supply source is disposed at the bottom of the container body 2 a of the crucible 2. The sublimation gas from the powder raw material 5 is recrystallized on the surface of the seed crystal 4 by using the space between the seed crystal 4 and the powder raw material 5 in the space in the crucible 2 as a growth space region. SiC single crystal 6 (silicon carbide single crystal) is grown.

  The SiC single crystal manufacturing apparatus 1 includes a disk-shaped table 7 for mounting the crucible 2 and a rod-shaped shaft 8 for rotating the table 7 around the central axis of the crucible 2. ing.

  The crucible 2 is disposed on one surface of the table 7, and one end of the shaft 8 is connected to the other surface of the table 7 so that the shaft 8 extends in a direction perpendicular to the other surface. The other end of the shaft 8 is supported by a rotation mechanism (not shown), and the shaft 8 is rotated around the central axis of the shaft 8 by the rotation mechanism. For example, the central axis of the crucible 2 is disposed on the central axis of the shaft 8. As a result, the table 7 and the crucible 2 rotate around the central axis of the shaft 8, that is, the central axis of the crucible 2.

  Furthermore, cylindrical heaters 9 and 10 are arranged so as to surround the outer periphery of the crucible 2. One heater 9 is disposed to face the side surface of the crucible 2 where the powder raw material 5 is disposed, and the other heater 10 is opposed to the side surface of the crucible 2 where the seed crystal 4 is disposed. Are arranged to be.

  Further, a graphite-made hollow cylindrical heat insulating material 11 mainly composed of carbon is disposed on the outer periphery of the crucible 2 so as to surround the outer periphery of the crucible 2. Specifically, the heat insulating material 11 is disposed so as to surround the outer periphery of the heaters 9 and 10 and to surround the heaters 9 and 10 and the crucible 2 from above and below. A space surrounding the heaters 9 and 10 and the crucible 2 in the internal space of the heat insulating material 11 is a gas flow chamber 12.

  Such a heat insulating material 11 is a porous body (fibrous carbon) having many gaps, a cylindrical outer peripheral portion 11 a surrounding the outer periphery of the crucible 2 and the heaters 9 and 10, and the crucible 2 and the heaters 9 and 10. A disc-shaped lid portion 11 b that covers the upper side of the crucible, and a disc-shaped bottom portion 11 c that covers the lower side of the crucible 2 and the heaters 9 and 10. Of the heaters 9 and 10, the heater 9 on the powder raw material 5 side is disposed on the bottom portion 11 c, and a rod-shaped member 9 a is disposed on the heater 9. And the heater 10 by the side of the base 3 is arrange | positioned on this rod-shaped member 9a. That is, the heater 10 is placed on the heater 9 by several bar-like members 9a.

  Further, a temperature measuring hole 11 d penetrating the lid portion 11 b is formed in the lid portion 11 b of the heat insulating material 11 at a center position of the lid body 2 b of the crucible 2, that is, a position corresponding to the back surface side of the seed crystal 4. Furthermore, the bottom part 11c of the heat insulating material 11 is provided with a through hole 11e through which the shaft 8 penetrates, and the shaft 8 penetrates the bottom part 11c.

  In addition, although it can adjust suitably about the thickness of each part 11a-11c which comprises the heat insulating material 11, and the distance (gap) with the crucible 2, the shape of the crucible 2, the internal structure of the crucible 2, and the heater 9 at the time of crystal growth It is preferable to select an optimum shape according to a temperature of 10 (temperature distribution in the heater) or the like.

  Here, when the SiC single crystal 6 is grown, the heat insulating material 11 in which Si (silicon) is absorbed is used. That is, the heat insulating material 11 originally contains Si. A normal heat insulating material is a porous graphite material, and Si is less than 100 ppm with respect to the proportion of C (carbon), but after starting production of SiC single crystal 6 by absorbing Si into this heat insulating material. The deterioration rate of the heat insulating material 11 is kept slow. Thereby, the physical property of the heat insulating material 11 is stabilized, and it becomes easy to control the growth temperature of the SiC single crystal 6. The physical properties are, for example, thermal conductivity and density.

  Inductive coils 13 and 14 that are driven at a high frequency are arranged on the outer periphery of the heat insulating material 11 shown in FIG. By flowing high-frequency current through the induction coils 13 and 14, the heaters 9 and 10 arranged on the outer periphery of the crucible 2 can be induction-heated. In addition, it is preferable that the induction coils 13 and 14 and the crucible 2, the heaters 9 and 10, and the heat insulating material 11 are completely insulated by disposing a quartz tube between the heat insulating material 11 and the induction coils 13 and 14.

  The crucible 2, the heaters 9 and 10, the heat insulating material 11, and the induction coils 13 and 14 are accommodated in the external chamber 15. A room formed between the external chamber 15 and the heat insulating material 11 is a gas introduction chamber 16. In the external chamber 15, a gas introduction pipe 17 is provided so that an atmosphere gas such as an inert gas (Ar gas or the like) or a mixed gas such as nitrogen serving as a dopant to the SiC single crystal 6 can be introduced. At the same time, an exhaust pipe 18 is provided so that the mixed gas can be discharged.

  Further, a plurality of holes (not shown) are formed so as to allow the gas introduction chamber 16 and the gas flow chamber 12 to communicate with each other through the heat insulating material 11. Thereby, the inert gas introduced into the gas introduction chamber 16 flows through the gas flow chamber 12. A cylinder made of alumina, carbon, or the like may be passed inside each hole.

  In the present embodiment, a radiation thermometer 19 that measures the temperature of the pedestal 3 through the temperature measuring hole 11 d is disposed outside the external chamber 15. The above is the configuration of the SiC single crystal manufacturing apparatus 1 according to the present embodiment.

  Then, the manufacturing method of the SiC single crystal 6 by the SiC single crystal manufacturing apparatus 1 of the above structures is demonstrated. In this embodiment, first, a heat insulating material 11 in which Si is absorbed in advance is prepared.

  Next, a growth process is performed. In the growth process, a crucible 2 in which a powder raw material 5 is arranged on a container body 2a as a crucible 2 and a seed crystal 4 is arranged on a pedestal 3 provided on a lid 2b is prepared, and the crucible 2 is arranged on a table 7 To do. And the heat insulating material 11 which absorbed Si is arrange | positioned on the outer periphery of the said crucible 2 so that the outer periphery of the said crucible 2 may be enclosed.

  Then, using an exhaust mechanism (not shown), gas is discharged through the exhaust pipe 18 to evacuate the external chamber 15 including the inside of the crucible 2 and energize the induction coils 13 and 14. Thereby, the heaters 9 and 10 are induction-heated, and the crucible 2 is heated to a predetermined temperature by radiant heat.

  Thereafter, a mixed gas such as an inert gas (Ar gas or the like) or nitrogen serving as a dopant to the crystal is introduced through the gas introduction pipe 17. And the temperature of the growth surface of the seed crystal 4 and the temperature of the powder raw material 5 are raised to target temperature. For example, when the growth crystal is 4H—SiC, the temperature of the powder raw material 5 is 2100 to 2300 ° C., and the temperature of the growth crystal surface is lowered by about 10 to 100 ° C. Then, the crucible 2 is rotated by rotating the shaft 8. At this time, the energization amounts of the induction coils 13 and 14 are controlled while measuring the temperature of the crucible 2 through the radiation thermometer 19.

  Since the atmospheric gas is introduced through the gas introduction pipe 17, the atmospheric gas flows from the gas introduction chamber 16 through the heat insulating material 11 into the gas flow chamber 12 and is then discharged through the exhaust pipe 18. In addition, although sublimation gas leaks from the crucible 2 during crystal growth, since the physical properties of the heat insulating material 11 that has absorbed Si are already stable, the physical properties of the heat insulating material 11 are greatly increased by the sublimation gas during crystal growth. There is no change. In this way, SiC single crystal 6 is grown on seed crystal 4.

  As described above, the present embodiment is characterized in that the heat insulating material 11 in which Si is absorbed is prepared, and the SiC single crystal 6 is manufactured using the heat insulating material 11 in which Si is absorbed.

  Thus, since the heat insulating material 11 has already absorbed Si, the deterioration rate of the heat insulating material 11 after starting the production of the SiC single crystal 6 becomes slow, and the physical properties of the heat insulating material 11, that is, the heat insulating performance is stabilized. Therefore, the heat insulating performance of the heat insulating material 11 is hardly changed by the growing sublimation gas, and the physical properties of the heat insulating material 11 are stabilized. For this reason, since it becomes easy to control the crucible 2 to a desired growth temperature, it is possible to stabilize the growth of the SiC single crystal 6. That is, since the physical properties of the heat insulating material 11 are less likely to change, the heating conditions of the crucible 2 can be kept constant, so that the heating temperature is stable, and the SiC single crystal 6 can be stably grown.

  In addition, regarding the correspondence between the description of the present embodiment and the description of the claims, the powder raw material 5 corresponds to the “silicon carbide raw material” in the claims, and the heaters 9 and 10 have the “ Corresponds to "heater".

(Second Embodiment)
In the present embodiment, parts different from the first embodiment will be mainly described. In the said 1st Embodiment, the heat insulating material 11 which absorbed Si was prepared previously, and the SiC single crystal 6 was manufactured, However, In this embodiment, the normal new insulation made from graphite which does not contain Si. It is characterized in that after the material 20 absorbs Si, the SiC single crystal 6 is manufactured using the heat insulating material 11 in which Si is absorbed. In other words, in the present embodiment, when the SiC single crystal 6 is grown, a normal new graphite heat insulating material is not used, but the heat insulating material 11 having absorbed Si is used. Hereinafter, a description will be given with reference to FIGS. 2 and 3.

  FIG. 2 is a view showing a Si concentration profile of an A-B section of the heat insulating material 11 in FIG. In this figure, A is the position of the inner wall of the heat insulating material 11 that has absorbed Si, and B is the position of the outer wall of the heat insulating material 11.

  First, the normal graphite heat insulating material 20 (see FIG. 3) contains almost no Si at less than 100 ppm with respect to the proportion of C (carbon). On the other hand, as shown in FIG. 2, in the heat insulating material 11 that has absorbed Si, the Si concentration increases from the position A toward the inside of the heat insulating material 11. And there exists a location where Si density | concentration becomes the highest, and it has Si density distribution that Si density | concentration decreases toward B position (outer wall side) of the heat insulating material 11. FIG.

  As described above, the heat insulating material 20 made of graphite is a porous material and absorbs Si contained in the sublimation gas leaked from the crucible 2. For this reason, the Si concentration contained in the graphite heat insulating material 20 changes to a distribution as shown in FIG. In other words, the physical properties (heat insulation performance) of the new graphite heat insulating material 20 change with time by absorbing Si. In other words, the deterioration rate of the heat insulating material after the start of the production of the SiC single crystal 6 is the fastest, and the deterioration rate also decreases as the Si concentration contained in the heat insulating material increases. For this reason, the heat insulation performance of the new graphite heat insulating material 20 is not stable.

  Therefore, in the present embodiment, before the SiC single crystal 6 is grown, Si is absorbed in advance by the graphite heat insulating material 20 so as to make the deterioration rate of the heat insulating material 11 that has absorbed Si slow. Thereby, the physical property of the heat insulating material 11 is stabilized, and it becomes easy to control the growth temperature of the SiC single crystal 6.

  Specifically, in the present embodiment, first, a normal new graphite heat insulating material 20 is subjected to a process of absorbing Si, and a growth process of growing the SiC single crystal 6 using the heat insulating material 11 having absorbed Si. To produce the SiC single crystal 6. For the SiC single crystal manufacturing apparatus 1, a common apparatus is used for the process of absorbing Si and the growth process except for the heat insulating material 20 and the heat insulating material 11 made of graphite.

  First, a process of absorbing Si is performed. FIG. 3 shows a cross-sectional view of the SiC single crystal manufacturing apparatus 1 when performing a process of absorbing Si. In FIG. 3, the induction coils 13 and 14 and the external chamber 15 are omitted.

  As shown in FIG. 3, the Si-containing material 21 is arranged in the container body 2 a as the crucible 2 and the lid body 2 b is prepared. The crucible 2 is arranged on the table 7, and a normal new graphite heat insulating material 20 is arranged on the outer periphery of the crucible 2 so as to surround the outer periphery of the crucible 2.

  As described above, the heat insulating material 11 that has absorbed Si is configured to include the outer peripheral portion 11a, the lid portion 11b, and the bottom portion 11c, and the lid portion 11b of the heat insulating material 11 has a temperature measuring hole 11d. And a through hole 11e is provided in the bottom 11c. Therefore, the graphite heat insulating material 20 that does not absorb Si corresponds to the outer peripheral portion 20a corresponding to the outer peripheral portion 11a of the heat insulating material 11 that has absorbed Si, and the lid portion 11b of the heat insulating material 11 that has absorbed Si. And a bottom portion 20c corresponding to the bottom portion 11c of the heat insulating material 11 that has absorbed Si. Further, a temperature measuring hole 20d corresponding to the lid portion 11b of the heat insulating material 11 having absorbed Si is formed in the lid portion 20b of the graphite heat insulating material 20 that has not absorbed Si, and Si is not absorbed. A through hole 20e corresponding to the through hole 11e of the heat insulating material 11 having absorbed Si is provided in the bottom portion 20c of the heat insulating material 20 made of graphite.

  Here, “Si-containing material 21” means Si itself such as Si powder, or a material containing Si such as Si compound. For example, the powder raw material 5 may be used as the Si-containing material 21.

  Thereafter, by using an exhaust mechanism (not shown) to discharge gas through the exhaust pipe 18, the inside of the external chamber 15 including the inside of the crucible 2 is set to several hundred Pa to several thousand Pa, and the induction coils 13, 14. The heaters 9 and 10 are induction-heated by energizing them, and the crucible 2 is heated to, for example, 2000 ° C. or more by heating the crucible 2 with its radiant heat. At this time, by changing the frequency or power of energization to the induction coils 13 and 14, the heaters 9 and 10 can be heated to generate a temperature difference. Moreover, the temperature of the crucible 2 is controlled to a desired temperature by controlling the energization amount of the induction coils 13 and 14 while measuring the temperature of the upper surface of the crucible 2 with the radiation thermometer 19 through the temperature measuring hole 11d.

  Thereafter, a mixed gas such as an inert gas (Ar gas or the like) or nitrogen serving as a dopant to the crystal is introduced through the gas introduction pipe 17.

  When the heating is performed for several tens of hours to several hundreds of hours while rotating the crucible 2 by rotating the shaft 8, the sublimation gas in the crucible 2 leaks to the outside of the crucible 2 and passes through the gas flow chamber 12. It is absorbed by the heat insulating material 20 made of graphite. As a result, as shown in FIG. 2, the Si concentration in the graphite heat insulating material 20 is increased, and a part of the graphite heat insulating material 20 is converted to SiC by Si contained in the sublimation gas. Thus, the physical property of the heat insulating material 11 can be stabilized by making the heat insulating material 20 made of graphite absorb Si.

  In the step of absorbing Si, it is preferable to heat-treat the graphite heat insulating material 20 under the same conditions as the growth conditions of the SiC single crystal 6. Thereby, the heat insulating material 20 made of graphite can be deteriorated similarly to the deterioration of the heat insulating material 20 made of graphite during the growth of the SiC single crystal 6. Therefore, when the SiC single crystal 6 is grown, the heat insulating material 11 that absorbs Si and has stable physical properties is used. Therefore, it is easy to control the crucible 2 to the growth temperature of the SiC single crystal 6. Can do.

  Subsequently, a growth process is performed. In this case, the heat insulating material 11 having absorbed Si obtained in the step of absorbing Si is disposed on the outer periphery of the crucible 2 so as to surround the outer periphery of the crucible 2. Then, a SiC single crystal 6 is grown on the seed crystal 4 as in the first embodiment.

  As described above, in the present embodiment, before the SiC single crystal 6 is grown, the new graphite heat insulating material 20 is deteriorated in advance, and the SiC single crystal 6 is manufactured using the heat insulating material 11 in which Si is absorbed. It is characterized by.

  Thus, since the new graphite heat insulating material 20 is heat-treated and Si is absorbed in advance, the deterioration rate of the heat insulating material 11 can be slowed down and the heat insulating performance of the heat insulating material 11 can be stabilized. . Therefore, the heating conditions of the crucible 2 can be kept constant, and consequently the SiC single crystal 6 can be stably grown.

  As for the correspondence between the description of the present embodiment and the description of the claims, the Si-containing material 21 corresponds to the “silicon-containing material” in the claims. In the present embodiment, since the common manufacturing apparatus 1 is used for the process of absorbing Si and the growth process, the heaters 9 and 10 are also used in common for the process of absorbing Si and the growth process. . Of course, when different manufacturing apparatuses are used in the process of absorbing Si and the growth process, the heaters provided in each manufacturing apparatus are used in each process.

(Third embodiment)
In the present embodiment, parts different from the first embodiment will be mainly described. FIG. 4 is a cross-sectional configuration diagram of the SiC single crystal manufacturing apparatus according to the present embodiment. In FIG. 4, the external chamber 15 is omitted.

  As shown in FIG. 4, the heat insulating material 11 is in contact with the outer wall of the crucible 2. In the present embodiment, except for the temperature measuring hole 11d of the lid portion 11b and the through hole 11e of the bottom portion 11c, the heat insulating material 11 so that there is no gap between the outer peripheral portion 11a, the lid portion 11b, and the bottom portion 11c and the crucible 2. Is in contact with the outer wall of the crucible 2. Thus, since there is no gap between the heat insulating material 11 and the crucible 2, there is no gas flow chamber 12 in this embodiment.

  Therefore, in the present embodiment, in the step of absorbing Si, the entire new graphite heat insulating material 20 not absorbing Si is in contact with the outer wall of the crucible 2 as shown in FIG. The sublimation gas leaked from the graphite is absorbed by the graphite heat insulating material 20. Further, in the growth process, the SiC single crystal is formed on the seed crystal 4 by heating the crucible 2 in a state where the entire heat insulating material 11 having absorbed Si is in contact with the outer wall of the crucible 2 as shown in FIG. 6 will be grown.

  As described above, when the crucible 2 is covered with the heat insulating materials 11, 20, a heating device such as an induction heating coil or a heater is disposed around the heat insulating materials 11, 20, and the crucible 2 is used by using this heating device. Heat.

  As described above, the process of absorbing Si and the growth process can be performed in a state where the heat insulating materials 11 and 20 are in contact with the outer wall of the crucible 2.

(Other embodiments)
In each said embodiment, although the heat insulating material 11 was divided into 3 in the outer peripheral part 11a, the cover part 11b, and the bottom part 11c, this is an example of the structure of the heat insulating material 11, and the heat insulating material 11 is divided into 2 parts or 4 parts. Or the like. The same applies to the heat insulating material 20 made of graphite.

  In the first embodiment, the temperature control of the corresponding heaters 9 and 10 is performed by the two induction coils 13 and 14, respectively. However, both of the two heaters 9 and 10 are controlled by one induction coil. Also good. Of course, the number of heaters and the number of induction coils are not limited to this, and can be appropriately determined according to the configuration of the SiC single crystal manufacturing apparatus 1.

  In the first embodiment, the heaters 9 and 10 are induction-heated by the induction coils 13 and 14, but the heating method of the crucible 2 is a self-heating method of the heater by induction heating or a self-heating method of the heater by resistance heating. May be.

  In the second embodiment, the growth process is performed after the process of absorbing Si. However, the positional relationship between the graphite heat insulating material 20 and the crucible 2 in the process of absorbing Si and the heat insulating material 11 in the growth process. And the crucible 2 may not necessarily have the same positional relationship, and may be a similar positional relationship.

  In the third embodiment, the heat insulating materials 11 and 20 are brought into contact with the crucible 2 in both the step of absorbing Si and the growth step, but the heat insulating materials 11 and 20 are not brought into contact with the outer wall of the crucible 2 in both steps. Moreover, you may make it make the heat insulating materials 11 and 20 contact the crucible 2 in any one process. Further, a part of the heat insulating materials 11 and 20 may be brought into contact with the crucible 2 without bringing the entire heat insulating materials 11 and 20 into contact with the crucible 2.

  In each of the above embodiments, the powder raw material 5 is arranged in advance at the bottom of the container main body 2a, and the sublimation recrystallization method in which the powder raw material 5 is sublimated to grow the SiC single crystal 6 is employed. The base 3 is disposed in the hollow portion of the reaction vessel by introducing the raw material gas into the part, and the SiC single crystal 6 is added to the seed crystal 4 disposed on the base 3 with a Si-containing gas, specifically, for example, silane gas, C You may employ | adopt the gas supply method which supplies and grows containing gas, specifically, for example, propane gas. The crucible 2 corresponds to the reaction vessel.

  When the SiC single crystal 6 is thus grown by the gas supply method, the heat insulating material 11 that has absorbed Si may be prepared as in the first embodiment, and the outer periphery of the reaction vessel may be provided on the outer periphery of the reaction vessel. A new graphite heat insulating material 20 that does not absorb Si is disposed so as to surround the substrate, and the raw material gas is supplied to the hollow portion of the reaction vessel and the reaction vessel is heated to contain the Si-containing gas and the C containing raw material gas. By supplying the gas, the raw material gas leaked from the reaction vessel may be absorbed by the graphite heat insulating material 20 that does not absorb Si. Then, in the growth step, the reaction vessel is heated in a state where the heat insulating material 11 in which Si has been absorbed in advance is arranged on the outer periphery of the reaction vessel so as to surround the outer periphery of the reaction vessel, and the Si-containing gas and the C-containing gas are supplied. As a result, the SiC single crystal 6 is grown on the seed crystal 4. As for the correspondence between the description of the present embodiment and the description of the claims, the Si-containing gas corresponds to the “silicon-containing gas” in the claims, and the C-containing gas is the “carbon” in the claims. Corresponds to “containing gas”.

  Further, when the heat insulating materials 11 and 20 are in contact with the reaction vessel as in the fourth embodiment, the heat insulating materials 11 and 20 are also provided with holes through which gas passes. Further, an apparatus having a configuration suitable for the gas supply method is used as the SiC single crystal manufacturing apparatus 1. For example, the heaters 9 and 10 are used for heating the hollow portion of the reaction vessel and heating the seed crystal 4.

2 crucible 2a container body 2b lid 3 pedestal 4 seed crystal 5 powder raw material 6 SiC single crystal 9, 10 heater 11 heat insulating material that has absorbed Si 20 heat insulating material made of graphite that does not absorb Si 21 Si-containing material

Claims (2)

A hollow cylindrical crucible (2) having a bottomed cylindrical container body (2a) and a lid (2b) for closing the container body (2a); A seed crystal (4) made of a silicon carbide single crystal substrate is disposed on a pedestal (3) provided in 2b), a silicon carbide raw material (5) is disposed in the container body (2a), and the silicon carbide raw material (5 ) In the growth space region constituted by the space between the seed crystal (4) and the silicon carbide raw material (5), the silicon carbide single crystal is formed on the seed crystal (4). A method for producing a silicon carbide single crystal for growing (6),
Preparing a heat insulating material (11) having absorbed silicon;
The said crucible (2) is heated in the state which has arrange | positioned the heat insulating material (11) which absorbed the said silicon to the outer periphery of the said crucible (2) so that the outer periphery of the said crucible (2) might be surrounded, 4) a growth step of growing the silicon carbide single crystal (6) thereon,
The step of preparing the heat-insulating material (11) that has absorbed silicon includes arranging the silicon-containing material (21) in the container body (2a) as the crucible (2) and preparing the lid (2b), By placing a graphite heat insulating material (20) not absorbing silicon so as to surround the outer periphery of the crucible (2) on the outer periphery of the crucible (2), and heating the crucible (2), the silicon A step of absorbing silicon contained in the sublimation gas leaked from the crucible (2) by heating the silicon-containing material (21) to the heat insulating material (20) made of graphite that has not absorbed the carbon,
In the step of absorbing silicon, without placing the seed crystal (4), the heat insulating material made of graphite (20) not absorbing silicon is in contact with the outer wall of the crucible (2). The sublimation gas leaked from the crucible (2) is absorbed in the heat insulating material (20) made of graphite not absorbing silicon.
In the growth step, after the step of absorbing silicon, the silicon carbide raw material (5) is disposed in the container body (2a) as the crucible (2) and the seed crystal (4) is disposed on the pedestal (3). A crucible (2) is prepared, and the silicon-absorbed heat insulating material (11) obtained in the step of absorbing silicon is surrounded on the outer periphery of the crucible (2). The silicon carbide single crystal (6) is grown on the seed crystal (4) by heating the crucible (2) in a state where the silicon carbide single crystal is disposed.   In the growth step, the crucible (2) is heated in a state where the heat-insulating material (11) having absorbed the silicon is in contact with the outer wall of the crucible (2), whereby the seed crystal (4) is The method for producing a silicon carbide single crystal according to claim 1, wherein the silicon carbide single crystal (6) is grown.

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