JP5711123B2 - 周波数コム光源を有するフーリエ変換分光計 - Google Patents
周波数コム光源を有するフーリエ変換分光計 Download PDFInfo
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- JP5711123B2 JP5711123B2 JP2011519248A JP2011519248A JP5711123B2 JP 5711123 B2 JP5711123 B2 JP 5711123B2 JP 2011519248 A JP2011519248 A JP 2011519248A JP 2011519248 A JP2011519248 A JP 2011519248A JP 5711123 B2 JP5711123 B2 JP 5711123B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/45—Interferometric spectrometry
- G01J3/453—Interferometric spectrometry by correlation of the amplitudes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
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Description
本出願は、2008年7月25日付けで出願された米国仮特許出願第61/083620号の利益を主張するものであり、この内容は、本引用により、そのすべてが本開示に包含される。
添付図面を参照し、本発明の好適な実施例について詳細に説明することとするが、添付図面においては、類似の参照符号によって類似の要素を示している。以下において周波数コム光源を有するフーリエ変換分光計又は1C−FTSと呼ばれる本明細書に提示されている分光計は、フーリエ変換分光法及び関係するすべての計測法(ハイパースペクトル撮像、顕微鏡検査法、振動円2色法、減衰全反射、Zeeman変調、速度変調、選択的検出法、時間分解分光法など)を主な目的としているが、本明細書に記述されているアプリケーション以外に、周波数コム光源を有する2ビーム干渉計を使用することも可能であることに留意されたい。例えば、本明細書に記述されている周波数コム光源を有する2ビーム干渉計は、OCT(Optical Coherence Tomography)、干渉測長、LIDAR(Light Detection And Ranging)、反射計測法において使用するべく適合可能である。本明細書に具体的に記述されていない波面又は振幅再結合に基づいたその他の干渉計測アプリケーションも、後述する周波数コム光源及び同期検出法を有する周波数又は位相誘発効果を生成する2ビーム又は多ビーム干渉計から利益を享受可能である。
Claims (5)
- サンプルを解析するためのフーリエ変換分光計であって、
定義された周波数繰返しレートを具備する周波数コム生成器を有し、前記周波数コム生成器は、一方は赤色−シフト用であると共に他方は青色用である2つのカウンタ伝播ビームに分割される、コヒーレント光源と、
固定アームと可動アームとを有し、2つの部分の間に干渉を生成し、前記2つのカウンタ伝播ビームを分析するべく、前記コヒーレント光源を前記2つの部分に分離するべく適合され、前記2つの部分のそれぞれは前記可動アームと前記固定アームのうちの一方に続く、振幅又は波面分割に基づいた、2入力2出力フーリエ変換干渉計と、
前記2入力2出力フーリエ変換干渉計の2出力で測定された結果としての二つのインターフェログラムの間の差を得るべく適合された差動検出手段と、
を有し、
前記サンプルは前記コヒーレント光源と前記フーリエ変換干渉計間の光路上に配置される、フーリエ変換分光計。 - 前記差動検出手段は、前記周波数繰返しレート又は前記周波数繰返しレートの倍数だけ離隔した前記周波数コムの周波数のペアのうなりを検出するべく適合されている請求項1記載のフーリエ変換分光計。
- 前記2入力2出力フーリエ変換干渉計は、マイケルソン干渉計である請求項1記載のフーリエ変換分光計。
- 前記フーリエ変換分光計による分析の対象である前記サンプルを受け入れるべく適合された少なくとも1つのマルチパスセルを更に有する請求項1又は2記載のフーリエ変換分光計。
- 前記フーリエ変換分光計による分析の対象である前記サンプルを受け入れるべく適合された少なくとも1つの少なくとも千のフィネスを持つ空洞を更に有する請求項1又は2記載のフーリエ変換分光計。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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US8362008P | 2008-07-25 | 2008-07-25 | |
US61/083,620 | 2008-07-25 | ||
PCT/IB2009/006282 WO2010010437A1 (en) | 2008-07-25 | 2009-07-20 | Fourier transform spectrometer with a frequency comb light source |
Publications (2)
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JP2011529179A JP2011529179A (ja) | 2011-12-01 |
JP5711123B2 true JP5711123B2 (ja) | 2015-04-30 |
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JP2011519249A Expired - Fee Related JP5647116B2 (ja) | 2008-07-25 | 2009-07-20 | 周波数コムを有する同期方式の干渉計 |
JP2011519248A Expired - Fee Related JP5711123B2 (ja) | 2008-07-25 | 2009-07-20 | 周波数コム光源を有するフーリエ変換分光計 |
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JP2011519249A Expired - Fee Related JP5647116B2 (ja) | 2008-07-25 | 2009-07-20 | 周波数コムを有する同期方式の干渉計 |
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US (2) | US8917396B2 (ja) |
EP (2) | EP2310817A2 (ja) |
JP (2) | JP5647116B2 (ja) |
KR (2) | KR20110036945A (ja) |
CN (2) | CN102159926B (ja) |
CA (2) | CA2731301A1 (ja) |
WO (3) | WO2010010444A1 (ja) |
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US8917396B2 (en) | 2014-12-23 |
CA2731301A1 (en) | 2010-01-28 |
US20110267625A1 (en) | 2011-11-03 |
WO2010010437A8 (en) | 2010-06-03 |
WO2010010444A1 (en) | 2010-01-28 |
EP2310817A2 (en) | 2011-04-20 |
CN102159926A (zh) | 2011-08-17 |
WO2010010438A2 (en) | 2010-01-28 |
CA2731303A1 (en) | 2010-01-28 |
EP2310816A1 (en) | 2011-04-20 |
JP2011529179A (ja) | 2011-12-01 |
CN102246016B (zh) | 2015-09-23 |
US20110261363A1 (en) | 2011-10-27 |
WO2010010438A3 (en) | 2010-05-06 |
KR20110036945A (ko) | 2011-04-12 |
CN102246016A (zh) | 2011-11-16 |
CN102159926B (zh) | 2013-08-28 |
JP5647116B2 (ja) | 2014-12-24 |
JP2011529180A (ja) | 2011-12-01 |
WO2010010438A8 (en) | 2010-06-24 |
KR20110036944A (ko) | 2011-04-12 |
WO2010010437A1 (en) | 2010-01-28 |
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