JP5709372B2 - 校正手段、校正方法、及びプログラム - Google Patents

校正手段、校正方法、及びプログラム Download PDF

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Publication number
JP5709372B2
JP5709372B2 JP2009273888A JP2009273888A JP5709372B2 JP 5709372 B2 JP5709372 B2 JP 5709372B2 JP 2009273888 A JP2009273888 A JP 2009273888A JP 2009273888 A JP2009273888 A JP 2009273888A JP 5709372 B2 JP5709372 B2 JP 5709372B2
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search
calibration
extreme value
search range
measurement data
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JP2009273888A
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Japanese (ja)
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JP2011117777A5 (enExample
JP2011117777A (ja
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寿人 関根
寿人 関根
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Canon Inc
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Canon Inc
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Priority to JP2009273888A priority Critical patent/JP5709372B2/ja
Priority to US12/956,910 priority patent/US8564771B2/en
Publication of JP2011117777A publication Critical patent/JP2011117777A/ja
Publication of JP2011117777A5 publication Critical patent/JP2011117777A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G01J3/20—Rowland circle spectrometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
JP2009273888A 2009-12-01 2009-12-01 校正手段、校正方法、及びプログラム Expired - Fee Related JP5709372B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2009273888A JP5709372B2 (ja) 2009-12-01 2009-12-01 校正手段、校正方法、及びプログラム
US12/956,910 US8564771B2 (en) 2009-12-01 2010-11-30 Calibration apparatus and calibration method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009273888A JP5709372B2 (ja) 2009-12-01 2009-12-01 校正手段、校正方法、及びプログラム

Publications (3)

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JP2011117777A JP2011117777A (ja) 2011-06-16
JP2011117777A5 JP2011117777A5 (enExample) 2012-12-20
JP5709372B2 true JP5709372B2 (ja) 2015-04-30

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JP2009273888A Expired - Fee Related JP5709372B2 (ja) 2009-12-01 2009-12-01 校正手段、校正方法、及びプログラム

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US (1) US8564771B2 (enExample)
JP (1) JP5709372B2 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103115878B (zh) * 2012-12-29 2016-08-03 聚光科技(杭州)股份有限公司 纠正光谱漂移的方法及应用
US9846081B2 (en) 2013-03-12 2017-12-19 Osaka University Light wavelength measurement method and light wavelength measurement apparatus
JP6180954B2 (ja) * 2014-02-05 2017-08-16 浜松ホトニクス株式会社 分光器、及び分光器の製造方法
JP2017053903A (ja) * 2015-09-07 2017-03-16 キヤノン株式会社 画像形成装置
CN105424185B (zh) * 2015-11-04 2017-08-11 清华大学 一种计算机辅助的全波段光谱仪波长标定方法
CN108106726A (zh) * 2017-12-14 2018-06-01 中国科学院长春光学精密机械与物理研究所 一种光谱仪背景噪声抑制系统
JP7382629B2 (ja) * 2019-10-25 2023-11-17 大塚電子株式会社 光学測定装置および波長校正方法
CN110913665B (zh) * 2019-12-09 2021-02-26 中国科学院合肥物质科学研究院 一种星载探测器的精密温控系统
JP2022147223A (ja) 2021-03-23 2022-10-06 大塚電子株式会社 光学測定システム、光学測定方法および測定プログラム
CN120497180B (zh) * 2025-07-16 2025-09-26 上海车仪田科技有限公司 一种终点检测系统在线校准方法及其装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03144321A (ja) * 1989-10-30 1991-06-19 Mitsui Petrochem Ind Ltd レーザ発振波長測定方法
JP2689707B2 (ja) 1990-08-28 1997-12-10 松下電器産業株式会社 波長校正機能付分光測定装置
JPH10332485A (ja) * 1997-05-27 1998-12-18 Shimadzu Corp 発光分光分析装置のデータ処理方法
JP3925301B2 (ja) * 2001-07-12 2007-06-06 コニカミノルタセンシング株式会社 分光特性測定装置および同装置の分光感度の波長シフト補正方法
US6974973B2 (en) * 2002-11-08 2005-12-13 Micron Technology, Inc. Apparatus for determining temperature of an active pixel imager and correcting temperature induced variations in an imager
US20050267689A1 (en) * 2003-07-07 2005-12-01 Maxim Tsypin Method to automatically identify peak and monoisotopic peaks in mass spectral data for biomolecular applications
JP4660694B2 (ja) * 2005-06-28 2011-03-30 コニカミノルタセンシング株式会社 分光装置の波長校正方法及び分光装置
US20090002703A1 (en) * 2006-08-16 2009-01-01 Craig Edward Parman Methods and systems for quantifying isobaric labels and peptides
EP1998155A1 (de) * 2007-05-30 2008-12-03 Roche Diagnostics GmbH Verfahren zur Wellenlängenkalibration eines Spektrometers

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Publication number Publication date
US8564771B2 (en) 2013-10-22
US20110128542A1 (en) 2011-06-02
JP2011117777A (ja) 2011-06-16

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