JP5709020B2 - ケイ素錯体、製造方法及び蛍光材料 - Google Patents
ケイ素錯体、製造方法及び蛍光材料 Download PDFInfo
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- JP5709020B2 JP5709020B2 JP2012070286A JP2012070286A JP5709020B2 JP 5709020 B2 JP5709020 B2 JP 5709020B2 JP 2012070286 A JP2012070286 A JP 2012070286A JP 2012070286 A JP2012070286 A JP 2012070286A JP 5709020 B2 JP5709020 B2 JP 5709020B2
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Description
下記式(5)で表されるシッフ塩基(HL1):
1−(8−キノリルアミノメチレン)ナフタレン−2(1H)−オンの合成
(式中、R3〜R10は水素原子を表し、R1とR2とで縮合ベンゼン環を形成)
このシッフ塩基のDMSO中の吸収極大波長はλmax457nm、481nmであった。
元素分析値:実験値(計算値:C20H14N2O)%:C,80.36(80.52);H,4.81(4.73);N,9.40(9.39)。
シッフ塩基(HL3)(R3=R4=H、R5=CH3、R6〜R10=H、R1とR2とで縮合ベンゼン環を形成)457nm(25600),481nm(27000)。
シッフ塩基(HL4)(R1=R3=H、R2=CH3、R4=−CHO、R5〜R10=H)350nm(26400),504nm(7700)。
シッフ塩基(HL7)(R1=R3=H、R2=R4=Cl、R5〜R10=H)531nm(5290)。
シッフ塩基(HL10)(R1=H、R2=OCH3、R3〜R10=H)355nm(8100)。
黄色粉末350mgをMeOH(80ml)に完全に溶かし、暗所でAgPF6(615mg、3倍モル)のMeOH(16ml)溶液を加えた。黄色溶液を加熱(10分、35℃)したのち、室温・暗所数日放置し、析出した褐色板状結晶を濾取し、メタノールで精製し目的物20mgを得た。分子構造の決定はX線構造解析、元素分析により行い、式3に記載の構造であることが確認された。
[ケイ素錯体(式2)のワンポット合成]
六フッ化リン酸アンモニウム(NH4PF6)(490mg、3.0mmol)をメタノール10mlに溶解し、四塩化ケイ素(1ml、1.0Mジクロロメタン溶液;1.0mmol)を加える。この中にシッフ塩基HL1(320mg、1.0mmol)のメタノール溶液(100ml、オレンジ色)を加え、50℃で3時間加熱撹拌し、生成したオレンジ色粉末を取り出し、メタノールで十分洗浄し、乾燥した。目的物280mg(収率73%)を得た。
ケイ素錯体(式2)の単結晶を用いてX線構造解析により立体構造を明らかにした。
図1は式(2)ケイ素錯体のORTEP図を示す。ケイ素錯体は3座配位のシッフ塩基とメリディオナル(子午線)に配位した3つのフッ化物イオンを持つ六配位八面体型錯体であることが判明した。
結晶データ:
結晶システム モノクリニック、スペースグループ P21/c(#14)
格子パラメータ
a=10.743(2)A, b=10.265(2)A, c=15.031(3)A, β=105.675(3)°
V=1595.9(5)A3, Z value=4, Dcalc=1.592g/cm3, μ(MoKα)=1.939cm−1
Rl(I>2.00σ(I)=0.0353, R(All reflections)=0.0492, wR2(All reflections)=0.0936
図2はケイ素錯体(式2)の吸収スペクトル、図3は蛍光ペクトルを示す。また表1は式2の錯体及び類似錯体の吸収特性及び蛍光特性を表す。表中、[LSiCl3]は式2のフッ素イオンを塩素イオンに代えた構造、[LSnCl3]はSiをSnに代えた構造である。
Claims (9)
- 式(1)においてR1は水素原子、R2が水素原子、メチル基、メトキシ基、アリル基、ヒドロキシ基、ニトロ基,ホルミル基、クロル基又フッ素基を表し、R3は水素原子、R4が水素原子又はクロル基を表し、R5が水素原子又はメチル基を表し、R1とR2とで縮合ベンゼン環を形成してもよい請求項1に記載のケイ素錯体。
- 8−アミノキノリン誘導体とサリチルアルデヒド誘導体(1−ヒドロキシ−2−ナフチルアルデヒド誘導体及び2−ヒドロキシ−1−ナフチルアルデヒド誘導体を含む)とから得られる下記式(5)で表されるシッフ塩基とハロゲンが塩素、臭素又は沃素原子から選ばれるハロゲン化ケイ素との反応により得られる下記式(3)で表されるシッフ塩基配位ハロゲン化ケイ素錯体をフッ素原子置換剤と加熱反応させることを特徴とする下記式(4)で表されるシッフ塩基配位三フッ化ケイ素錯体の製造方法。
- シッフ塩基配位ハロゲン化ケイ素錯体が下記式(3)で表され、シッフ塩基配位三フッ化ケイ素錯体が下記式(4)で表されるケイ素錯体であることを特徴とする請求項4及び5に記載の下記式(4)で表されるシッフ塩基配位三フッ化ケイ素錯体の製造方法。
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