JP5683187B2 - Hot displacement measuring device and hot displacement measuring method - Google Patents

Description

  The present invention relates to a hot displacement measuring apparatus and a hot displacement measuring method capable of measuring a hot displacement amount for obtaining a coefficient of thermal expansion and the like.

  Various methods such as a differential dilatometer method, a push rod dilatometer method, and a microscopic telescope method are known as methods for measuring the amount of hot displacement for obtaining the coefficient of thermal expansion.

  The differential-type and push-bar-type thermal expansion measurement methods have a problem that there is a limit to the heat resistance of the constituent devices, and measurement at high temperatures is not possible. Further, there is a problem that there is no highly accurate standard substance in the high temperature range, and high measurement accuracy cannot be obtained.

  In the microscopic telescope methods described in Patent Documents 1 to 4, imaging is difficult due to light emitted by the sample itself in a high temperature range, and even if measurement is possible, high measurement accuracy cannot be obtained. In addition, there is a problem that a small sample cannot be measured because the cameras are arranged side by side to image both ends of the sample.

  In the microscopic telescope method described in Patent Documents 5 and 6, a laser is used. In the high temperature range (1500 ° C. or higher), the sample emits light, so that heat radiation beyond the measurement wavelength range may occur, resulting in a problem that the S / N ratio deteriorates and high measurement accuracy cannot be obtained.

  Moreover, in the microscopic telescope method described in Patent Documents 1 to 5, since the sample is indirectly heated, a heat insulating material and a cooling facility are necessary. In Patent Document 6, the sample is heated by energization. However, heat radiation is generated from the sample, and the surrounding material is heated to a high temperature by the radiant heat. For this reason, a heat insulating material and cooling equipment are needed.

JP 60-39540 A Japanese Patent Application Laid-Open No. 61-7492 Japanese Patent Application Laid-Open No. 61-172041 Japanese Patent Laid-Open No. 06-167468 JP 2004-333154 A JP 2009-128066 A

  An object of the present invention is to provide a hot displacement measuring apparatus and a hot displacement measuring method capable of measuring a hot displacement amount easily and accurately in a high temperature range.

  The hot displacement measuring apparatus according to the present invention includes a measurement chamber in which a sample is installed, a heating unit for heating the sample, a temperature measurement unit for measuring the temperature in the sample measurement unit, and a sample measurement unit. And a pair of image pickup means for picking up images at both ends of the measurement part of the sample magnified by the projection lens.

  According to the present invention, each of the images at both ends of the measurement part of the sample magnified by the projection lens is picked up by different imaging means, and from the difference in displacement (displacement amount) at both ends between the predetermined temperatures, The amount of displacement can be determined. For this reason, since there is no part which contacts a sample directly, the amount of hot displacement can be easily measured even in a high temperature range.

  In addition, since the images at both ends of the measurement unit are enlarged and each of the images at both ends is captured by different imaging means, measurement can be performed even if the sample is small. That is, it is possible to measure not only the length direction of the sample but also a minute amount of displacement in the radial direction of the sample. In addition, since no laser or the like is used, the S / N ratio is not lowered due to light emission from the sample in a high temperature range, and measurement can be performed with high accuracy.

  Moreover, since it can measure with a projection lens and an imaging means, it can measure with a simple structure.

  In the present invention, it is preferable that the heating means is a DC power source for supplying a DC current to the sample. By directing a direct current from a direct current power source, the sample can be directly heated, and thus a facility such as a heater necessary for indirect heating is not necessary, and measurement can be performed with a simple structure. In addition, it is economical because it is not necessary to raise the temperature of the entire measurement chamber.

  Further, unlike the heating method using a heater or the like, the ambient temperature can be made relatively low. For this reason, a projection lens, an imaging means, etc. can be installed near a sample, and an apparatus structure can be made small.

  In the present invention, the wall portion constituting the outer peripheral portion of the measurement chamber is formed of a material that transmits heat rays due to radiation from the sample, and the heat rays from the sample are directly irradiated on the wall portion of the measurement chamber to the outside. It is preferably configured to radiate. By forming the wall portion of the measurement chamber from a material that transmits heat rays, the temperature rise of the measurement chamber wall portion can be suppressed. For this reason, a heat insulating material and cooling equipment become unnecessary. By forming the wall of the measurement chamber from a material that transmits heat rays, for example, even if the temperature of the sample is increased to about 3000 ° C., the temperature around the sample in the measurement chamber can be suppressed to an increase to about 200 ° C. it can.

  Moreover, since the temperature rise in the measurement chamber can be suppressed, it is possible to suppress the discharge of the ionized inert gas and the occurrence of discharge when an inert gas such as argon is used as the atmosphere gas in the measurement chamber. it can. For this reason, measurement with higher accuracy is possible without affecting imaging in a high temperature range.

  In the present invention, it is preferable that the material of the wall portion of the measurement chamber has a light transmittance of 80% or more at a wavelength of 0.4 to 2.0 μm. That is, the light transmittance at each wavelength in the above range is preferably 80% or more. Heat rays due to radiation from the sample are generated in a wide wavelength range, and the intensity increases as the temperature increases. However, the strength is not strong in the low temperature region, and it is considered that the contribution to the temperature rise for the object irradiated with heat rays is not so great. Further, the intensity of the heat rays due to radiation becomes shorter as the temperature becomes higher, and becomes a peak at a wavelength of 2.0 μm or less particularly at 1500 ° C. or higher, and the influence of heating due to radiation cannot be ignored. Therefore, particularly when the temperature of the sample is 1500 ° C. or higher, the wall portion transmits more light in the wavelength region of 2.0 μm or less, thereby suppressing the temperature rise of the wall portion, and consequently, inside the measurement chamber. Temperature rise can also be suppressed.

  In the present invention, the wall portion of the measurement chamber is not particularly limited, but preferred examples include quartz glass and alumina. Since these materials easily transmit the heat ray, the temperature does not increase, and the temperature in the wall of the measurement chamber and the temperature in the measurement chamber can be suppressed. In particular, quartz glass is preferably used. In particular, quartz glass is preferable because it is transparent and has high heat resistance, so that a heated sample can be directly observed. For this reason, it is not necessary to install a window etc. in the wall part of a measurement chamber, and it can measure a high temperature easily with a thermal radiation type thermometer. In addition, other physical characteristics that can be measured by observing the sample can be easily measured. In addition, quartz glass has a small coefficient of friction, and the holding member can easily move freely when the holding member is placed directly in the measurement chamber.

  In the present invention, the image of the measurement part of the sample is enlarged by the projection lens, and both ends in the radial direction are picked up by the image pickup means. Therefore, the wall part of the measurement chamber needs to be transparent. Since quartz glass is transparent and has high heat resistance, it is particularly preferable as a material for forming the wall of the measurement chamber in the present invention. Further, by using one projection lens, it is possible to easily measure the amount of hot displacement by enlarging even a minute sample (for example, the radial direction of the sample).

  In the present invention, the distance between the outer peripheral wall portion of the measurement chamber and the sample is preferably 50 mm or more. Since the heat rays due to the radiation from the sample are further attenuated according to the reach distance, the longer the distance from the sample, the harder the irradiated object is heated. In the present invention, the wall portion of the outer peripheral portion of the measurement chamber is made of a material that is difficult to be heated by radiation heat rays, and the wall portion can be further prevented from being heated by separating the wall portion by 50 mm or more. Note that the wall portion of the outer peripheral portion of the measurement chamber is preferably cylindrical in terms of ease of taking a distance from the sample, and the diameter is preferably 100 mm or more. Further, in order to replace the measurement chamber with an inert gas, the volume is preferably not too large, and the diameter is preferably 200 mm or less.

  In this invention, you may further provide the illuminating device which irradiates light to the both ends of a sample. By providing such an illumination device, an image can be taken with sufficient contrast from a low temperature range to a high temperature range. Therefore, the position of the end portion in the sample can be detected more accurately. When imaging is possible due to self-emission of the sample in a high temperature range, the measurement can be performed by switching off the illumination device.

  In the present invention, it is preferable that a diaphragm or a filter is further provided between the sample and the projection lens. The diaphragm and / or filter can adjust the amount of light and remove light having an unnecessary wavelength, so that the position of the end of the sample can be detected more accurately.

  Further, by providing it between the sample and the projection lens, it is possible to make one aperture or filter. When provided between the projection lens and the imaging means, it is necessary to provide a diaphragm and / or a filter for each of the pair of imaging means. Moreover, it becomes necessary to adjust each diaphragm and / or filter individually, which is complicated.

  The method for measuring a hot displacement according to the present invention includes a step of installing a sample in a measurement chamber, and an enlarged projection of the measurement unit of the sample installed in the measurement chamber, and capturing each of both ends in the radial direction in the image of the measurement unit However, the method includes a step of heating the sample and raising the temperature, and a step of obtaining a hot displacement amount of the sample from a temperature difference in the temperature rise and a displacement amount of both ends due to the temperature rise. Yes.

  According to the hot displacement measuring method of the present invention, the amount of hot displacement can be measured easily and accurately in a high temperature range.

  According to the present invention, the amount of hot displacement can be measured easily and accurately in a high temperature range.

The schematic diagram which shows the hot displacement measuring apparatus of one Embodiment according to this invention. The perspective view which shows the measurement chamber of the hot displacement measuring apparatus of one Embodiment according to this invention. The perspective view which shows the measurement part of the hot displacement measuring apparatus shown in FIG. The top view which shows the measurement part of the hot displacement measuring apparatus shown in FIG. Sectional drawing in alignment with the AA shown in FIG. The top view which shows the holding member used for the hot displacement measuring apparatus shown in FIG. Sectional drawing in alignment with the AA shown in FIG. The top view which shows the press plate used for the hot displacement measuring apparatus shown in FIG. Sectional drawing in alignment with the AA shown in FIG. The top view which shows the sample measured with the hot displacement measuring apparatus shown in FIG. The side view of the sample shown in FIG. The side view which shows the reflector used for the hot displacement measuring apparatus shown in FIG. The top view which shows the reflector shown in FIG. The side view which shows the metal plate used for preparation of the reflector shown in FIG.12 and FIG.13. The figure which shows typically the hot displacement measuring apparatus of one Embodiment according to this invention.

  Hereinafter, the present invention will be described with reference to specific embodiments, but the present invention is not limited to the following embodiments.

  FIG. 1 is a schematic diagram showing a hot displacement measuring apparatus according to an embodiment of the present invention.

  The sample 10 is installed in a measurement chamber described later. In FIG. 1, the measurement chamber is not shown. An optical filter (or diaphragm) 21 and a projection lens 22 are provided outside the measurement chamber. The projection lens 22 is for enlarging and projecting both end portions 10 a and 10 b in the measurement unit of the sample 10. An optical filter (or diaphragm) 21 is provided between the sample 10 and the projection lens 22. The optical filter 21 adjusts the amount of light, removes light with an unnecessary wavelength, etc., and passes through the optical filter 21. Light enters the projection lens 22. The image of the measurement part of the sample 10 is incident on one projection lens 22 and then projected onto one-dimensional CCDs 23 and 24 as a pair of imaging means. The one-dimensional CCD 24 images one end portion 10a of the sample 10. Further, the other end portion 10 b of the sample 10 is imaged on the one-dimensional CCD 23. In the present invention, the projection lens 22 images one end portion 10a in the radial direction in the image of the enlarged measurement portion of the sample 10 with the one-dimensional CCD 24 and the other end portion 10b with the one-dimensional CCD 23. Therefore, by appropriately adjusting the positions of the one-dimensional CCD 23 and the one-dimensional CCD 24, it is possible to correspond to the measurement of the sample 10 having various sizes.

  The position of the other end 10b of the sample 10 can be detected by the inflection point 25a in the electric signal 25 from the one-dimensional CCD 23. Similarly, the position of the one end portion 10a of the sample 10 can be detected by the inflection point 26a of the electric signal 26 from the one-dimensional CCD 24. Thereby, the displacement amount with respect to the sample of the predetermined | prescribed temperature of the one end part 10a and the other end part 10b can be measured, and the distance from the one end part 10a of the sample 10 to the other end part 10b can be measured.

  When the sample 10 is heated and thermally expanded, the sample 10 also expands in the radial direction, so that the distance between the one end 10a and the other end 10b changes. Thereby, the amount of hot displacement of the sample at a predetermined temperature difference can be obtained, and the coefficient of thermal expansion can be calculated.

  Hereinafter, the present invention will be described with reference to specific embodiments, but the present invention is not limited to the following embodiments.

  FIG. 2 is a perspective view showing a measurement chamber of the hot displacement measuring apparatus according to one embodiment of the present invention. As shown in FIG. 2, the measurement chamber 1 is configured by arranging O-rings between both ends of a wall portion 1 a made of a quartz glass tube and caps 2 and 3 and fixing them with clips. . In the present embodiment, the cap 2 and the cap 3 are made of bakelite, but are not particularly limited as long as they have heat resistance, and may be metal or resin. A pipe serving as an inlet 18 for introducing an inert gas into the measurement chamber 1 is inserted into the cap 2. An inert gas is introduced into the measurement chamber 1 through the introduction port 18. In this embodiment, argon (Ar) is used as the inert gas. As the inert gas, other inert gases such as neon (Ne) and krypton (Kr) may be used. Further, nitrogen gas can be used instead of the inert gas.

  An exhaust port 19 is formed in the cap 3 provided on the opposite side. The exhaust port 19 is formed to exhaust the gas in the measurement chamber 1. Note that the exhaust port 19 is not shown in FIG. An exhaust pump (not shown) as exhaust means for exhausting the gas in the measurement chamber 1 is connected to the exhaust port 19.

  After the gas in the measurement chamber 1 is exhausted from the exhaust port 19, the atmosphere in the measurement chamber 1 can be changed to an argon gas atmosphere by introducing argon gas from the introduction port 18.

  The sample 10 whose electrical resistivity is measured by the hot displacement measuring apparatus of this embodiment is installed in the measurement chamber 1 by being held by the holding members 4 and 5 in the measurement chamber 1.

  As shown in FIG. 2, an electric wire 8 is connected to the holding member 4, and the electric wire 8 passes between the cap 2 and the wall portion 1 a and is led to the outside. Similarly, an electric wire 9 is connected to the holding member 5, and the electric wire 9 is led to the outside through between the cap 3 and the wall portion 1 a. The electric wires 8 and 9 are connected to a DC power source (not shown). By holding the sample 10 between the holding member 4 connected to the electric wire 8 and the holding member 5 connected to the electric wire 9, the sample 10 is supplied with a direct current from a DC power source, and the sample 10 is heated. Is done.

  The quartz glass tube constituting the wall portion 1a is supported on a table 33 by support members 31 and 32. In the present embodiment, a quartz glass tube having a diameter of 120 mm is used, and the transmittance of light having a wavelength of 0.4 to 2.0 μm of quartz glass is 80% or more.

  FIG. 3 is an enlarged perspective view showing a measuring section of the hot displacement measuring apparatus shown in FIG.

  As shown in FIG. 3, the holding member 4 is configured by combining a pedestal portion 4a and a presser plate 4e. Similarly, the holding member 5 is also configured by combining a pedestal portion 5a and a pressing plate 5e. The pedestals 4a and 5a are made of graphite in the present embodiment. The holding plates 4e and 5e are made of copper in this embodiment.

  4 is a plan view showing a measuring section of the hot displacement measuring apparatus shown in FIG. 2, and FIG. 5 is a cross-sectional view taken along the line AA shown in FIG.

  6 is a plan view showing the pedestal portion 5a, and FIG. 7 is a cross-sectional view taken along the line AA of FIG. FIG. 8 is a plan view showing the presser plate 5e, and FIG. 9 is a cross-sectional view taken along line AA shown in FIG.

  The pedestal portion 4a has the same structure as the pedestal portion 5a, and the presser plate 4e also has the same structure as the presser plate 5e.

  As shown in FIGS. 3 and 4, one end portion of the sample 10 is disposed in a groove 5i (see FIGS. 6 and 7) formed in the pedestal portion 5a, and a holding plate 5e is disposed thereon. Then, the bolt of the fixture 5b composed of a bolt and a nut is passed through the hole 5f of the pedestal portion 5a and the hole 5j of the holding plate 5e, and tightened with the nut, so that it is sandwiched and fixed between the pedestal portion 5a and the holding plate 5e. Yes.

  Similarly, the other end portion of the sample 10 is also fixed between the pedestal portion 4a and the presser plate 4e by fixing the pedestal portion 4a and the presser plate 4e with the fixture 4b.

  FIG. 5 shows a state in which the sample 10 is sandwiched and fixed between the pedestal 5a and the holding plate 5e.

  As shown in FIG. 5, the bottom surface of the pedestal portion 5 a has a semicircular shape along the inner surface of the wall portion 1 a, and the pedestal portion 5 a is arranged by being inserted into the cylindrical wall portion 1 a, It is not fixed to the part 1a. Similarly, the pedestal part 4a is inserted into the wall part 1a and is not fixed to the wall part 1a. Accordingly, the holding members 4 and 5 are held in the measurement chamber 1 so as to be movable in the length direction of the sample 10 in the measurement chamber 1.

  As shown in FIGS. 3 and 4, a reflector 6 is provided between the measurement member of the sample 10, that is, the portion of the sample 10 positioned between the holding member 4 and the holding member 5 and the holding member 4. Yes. Similarly, a reflector 7 is provided between the measurement unit of the sample 10 and the holding member 5. The distance between the reflector 6 and the reflector 7 is not particularly limited, and may be changed according to the length of the sample 10. That is, the reflectors 6 and 7 are fixed to the holding members 4 and 5, and the distance is changed together with the holding members 4 and 5 depending on the length of the sample 10.

  FIG. 12 is a side view showing the reflector 6, and FIG. 13 is a plan view showing the reflector 6. The reflector 6 is manufactured by processing a metal plate made of stainless steel SUS304 having the shape shown in FIG. As shown in FIG. 14, a cutout portion 6a through which the sample 10 is passed is formed, and cutouts 6d and 6e are formed on both sides thereof. The hatched portions outside the cuts 6d and 6e are extracted by punching. The flaps 6b and 6c shown in FIGS. 12 and 13 are formed by bending the notches 6d and 6e at the base portions thereof. The flap portions 6b and 6c are formed with notches for allowing the attachment screws 4c to pass therethrough. The reflector 7 has the same shape as the reflector 6.

  As shown in FIG. 4, the attachment screw 4c is passed through the flap portion of the reflector 6, and the reflector 6 is attached to the pedestal portion 4a. Similarly, the reflector 7 is attached to the pedestal 5a by passing the attachment screw 5c through the flap of the reflector 7. As shown in FIGS. 5, 6, and 7, the attachment screw 5 c is attached by being screwed into a hole 5 g formed in the pedestal portion 5 a.

  Since the reflectors 6 and 7 are made of stainless steel as described above, the heat rays radiated from the sample 10 can be reflected. The reflector 6 is provided between the measurement unit of the sample 10 and the holding member 4, and the reflector 7 is provided between the measurement unit of the sample 10 and the holding member 5. Therefore, at the time of measurement, the heat rays radiated from the sample 10 can be reflected so as not to be applied to the holding member 4 and the holding member 5. For this reason, it can suppress that the holding member 4 and the holding member 5 absorb a heat ray, and a temperature rise. For this reason, it can suppress that the temperature in the measurement chamber 1 rises. Further, the holding member 4 and the holding member 5 can be prevented from being deteriorated by the heat rays from the sample 10. The reflectors 6 and 7 preferably reflect at least infrared rays.

  A fixing tool 5d made of a bolt and a nut is attached to the hole 5h shown in FIG. 6, and the electric wire 9 is attached to the holding member 5 by the fixing tool 5d. Similarly, the fixture 4d is attached to a hole formed in the pedestal portion 4a, and the electric wire 8 is connected to the holding member 4 by the fixture 4d.

  FIG. 15 is a diagram schematically illustrating the hot displacement measuring apparatus according to the present embodiment.

  As shown in FIG. 15, the sample 10 is disposed in the measurement chamber 1 in which the wall 1a is made of quartz glass. The other end of each of the electric wire 8 and the electric wire 9 having one end connected to the DC power source 14 is connected to the sample 10. By applying a direct current to the sample 10, the sample 10 can be heated and the temperature of the sample 10 can be raised. An ammeter 15 is provided between the DC power supply 14 and the sample 10. As the DC power source 14, it is preferable to use a constant voltage constant current power source.

  The temperature of the measurement part of the sample 10 is measured by the thermocouple 13 in the low temperature range. The thermocouple 13 is attached to the sample 10 with an adhesive. Therefore, in the present embodiment, the thermocouple 13 is disposable. Data measured by the thermocouple 13 is sent to a temperature measurement circuit / data logger 17. Further, the temperature of the measurement part of the sample 10 in the high temperature range is measured by a radiation type thermometer 16 provided outside the measurement chamber 1. The temperature data measured by the radiation type thermometer 16 is sent to a temperature measurement circuit / data logger 17. Based on the temperature data measured in this way, a signal is sent from the temperature measurement circuit / data logger 17 to the DC power source 14 to control the current or voltage to be applied to the sample 10 and to control the temperature increase rate of the sample 10. Can do. The displacement data measured by the optical displacement measuring device 20 is also sent to the temperature measurement circuit / data logger 17 to derive the displacement amount of the sample at each temperature with respect to the sample at a predetermined temperature.

  An optical displacement measuring device 20 is provided outside the measurement chamber. The optical displacement measuring device 20 is the device described with reference to FIG.

  As described above, in the present embodiment, the wall 1a of the measurement chamber 1 is made of quartz glass. Quartz glass is a material that transmits heat rays and transmits heat rays generated from the sample 10. For this reason, the temperature rise in the measurement chamber 1 can be suppressed, and the amount of hot displacement in the high temperature region can be accurately measured with a simple structure without requiring a heat insulating material or a cooling facility.

  When the temperature of the measurement part of the sample 10 was raised to about 3000 ° C. with the radiation thermometer 16, the temperature at the wall 1 a above the sample 10 was measured and found to be 396 ° C. Moreover, it was 149 degreeC in the place about 100 mm away from the center of the measurement part of the sample 10, ie, above the reflectors 6 and 7. FIG. Moreover, when the temperature in the end part of the measurement chamber 1, that is, in the vicinity of the caps 2 and 3, is measured, it is about 100 ° C., and it is understood that the temperature in the measurement chamber 1 is extremely low.

  Therefore, in this embodiment, the temperature rise around the measurement part of the measurement chamber 1 can be suppressed. Therefore, the heat insulating material and the cooling equipment, which are conventionally required, are no longer necessary.

  Moreover, since the temperature rise of 1 of a measurement chamber can be suppressed, when inert gas, such as argon, is used as atmospheric gas in the measurement chamber 1, it suppresses that an inert gas ionizes and discharge arises. be able to. For this reason, more accurate measurement is possible without adversely affecting imaging in a high temperature range.

  As described above, in the present embodiment, the both ends 10a and 10b in the image of the measurement unit of the sample 10 magnified by the projection lens 22 are imaged by the pair of imaging units 23 and 24, and the both ends 10a and 10b The amount of hot displacement can be determined from the amount of displacement with respect to the sample having a predetermined temperature of 10b. For this reason, since there is no part which contacts the sample 10 directly, the amount of hot displacement can be easily measured even in a high temperature range.

  In addition, since no laser or the like is used, measurement can be performed with high accuracy without causing a decrease in the S / N ratio due to light emission from the sample in a high temperature range.

  Moreover, since it can measure with the projection lens 22 and the imaging means 23 and 24, it can measure with a simple structure.

DESCRIPTION OF SYMBOLS 1 ... Measurement chamber 1a ... Wall part 2 ... Cap 3 ... Cap 4 ... Holding member 4a ... Base part 4b ... Fixing tool 4c ... Mounting screw 4d ... Fixing tool 4e ... Plate 5 ... Holding member 5a ... Base part 5b ... Fixing part 5c ... Mounting screw 5d ... Fixing tool 5e ... Plate 5f ... Hole 5g ... Hole 5h ... Hole 5i ... Groove 5j ... Hole 6 ... Reflector 6a ... Cut out part 6b, 6c ... Flap part 6d, 6e ... Cut 7 ... Reflector 8 ... Electric wire DESCRIPTION OF SYMBOLS 9 ... Electric wire 10 ... Sample 10a ... One end part 10b ... The other end part 13 ... Thermocouple 14 ... DC power supply 15 ... Ammeter 16 ... Radiation type thermometer 17 ... Temperature measurement circuit and data logger 18 ... Inlet 19 ... Exhaust outlet 20 ... Optical displacement measuring device 21 ... Optical filter 22 ... Projection lens 23 ... One-dimensional CCD
24 ... one-dimensional CCD
25 ... Electric signal 25a ... Inflection point 26 ... Electric signal 26a ... Inflection point 31, 32 ... Support member 33 ... Stand

Claims (8)

A measurement room where the sample is installed;
A holding member for holding the sample in the measurement chamber;
Heating means for heating the sample;
Temperature measuring means for measuring the temperature in the measurement part of the sample;
A projection lens for enlarging and projecting the measurement part of the sample;
A pair of imaging means for capturing each of the images at both ends of the measurement unit of the sample magnified by the projection lens;
A reflector is provided between the measurement unit of the sample and the holding member so that heat rays from the sample irradiated to the holding member are reflected,
Wall portion constituting the outer peripheral portion of the measuring chamber is formed from a material that transmits heat rays from the sample, the heat ray is irradiated directly on the wall of the measuring chamber outside from the sample Radiated ,
The hot displacement measuring apparatus , wherein the heat ray reflected by the reflector is also radiated to the outside from the wall portion .   The hot displacement measuring apparatus according to claim 1, wherein the heating unit is a DC power source for supplying a DC current to the sample.   3. The hot displacement measuring apparatus according to claim 1, wherein the wall of the measuring chamber has a light transmittance of 80% or more at a wavelength of 0.4 to 2.0 μm.   The hot displacement measuring apparatus according to any one of claims 1 to 3, wherein the wall portion of the measurement chamber is made of quartz glass.   The hot displacement measuring device according to any one of claims 1 to 4, wherein a distance between a wall portion of the measuring chamber and the sample is 50 mm or more.   The hot displacement measuring apparatus according to claim 1, further comprising an illuminating device that irradiates light to the both ends of the sample.   The hot displacement measuring apparatus according to any one of claims 1 to 6, further comprising a diaphragm and / or a filter between the sample and the projection lens. Installing the sample in the measurement chamber and holding it with a holding member ;
A process of enlarging and projecting the measurement part of the sample installed in the measurement chamber, heating the sample and raising the temperature while imaging each of the images at both ends of the measurement part with a pair of imaging means When,
A step of obtaining a hot displacement amount of the sample from a temperature difference in the temperature rise and a displacement amount of the both end portions due to the temperature rise,
Wall portion constituting the outer peripheral portion of the measuring chamber is formed from a material which transmits the heat ray from the sample is further between the holding member and the measuring unit of the sample, irradiating the holding member A reflector is provided so that heat rays from the sample are reflected, and the heat rays from the sample are directly irradiated to the wall portion of the measurement chamber and emitted to the outside, and reflected by the reflector. The hot displacement measuring method, wherein the hot wire is also radiated to the outside from the wall portion .

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