JP5654577B2 - Halftone mask and manufacturing method thereof - Google Patents

Halftone mask and manufacturing method thereof Download PDF

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JP5654577B2
JP5654577B2 JP2012512963A JP2012512963A JP5654577B2 JP 5654577 B2 JP5654577 B2 JP 5654577B2 JP 2012512963 A JP2012512963 A JP 2012512963A JP 2012512963 A JP2012512963 A JP 2012512963A JP 5654577 B2 JP5654577 B2 JP 5654577B2
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transmissive
blocking layer
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JP2012528354A (en
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ムースン キム
ムースン キム
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LG Innotek Co Ltd
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/54Absorbers, e.g. of opaque materials
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/50Mask blanks not covered by G03F1/20 - G03F1/34; Preparation thereof
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/36Masks having proximity correction features; Preparation thereof, e.g. optical proximity correction [OPC] design processes
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/54Absorbers, e.g. of opaque materials
    • G03F1/58Absorbers, e.g. of opaque materials having two or more different absorber layers, e.g. stacked multilayer absorbers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/033Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers
    • H01L21/0332Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers characterised by their composition, e.g. multilayer masks, materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/033Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers
    • H01L21/0334Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers characterised by their size, orientation, disposition, behaviour, shape, in horizontal or vertical plane
    • H01L21/0337Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers characterised by their size, orientation, disposition, behaviour, shape, in horizontal or vertical plane characterised by the process involved to create the mask, e.g. lift-off masks, sidewalls, or to modify the mask, e.g. pre-treatment, post-treatment

Description

本発明は、一つの半透過物質を用いて多重半透過部を備えることができるハーフトーンマスク及びその製造方法に関するものである。   The present invention relates to a halftone mask that can be provided with multiple transflective portions using a single translucent material, and a method of manufacturing the same.

一般に、液晶表示装置は、電界を用いて、誘電異方性を有する液晶の光透過率を調節することによって画像を表示する。そのために、液晶表示装置は、画像を表示する液晶表示パネルと、液晶表示パネルを駆動する駆動回路と、液晶表示パネルに光を提供するバックライトアセンブリと、を含む。   Generally, a liquid crystal display device displays an image by adjusting the light transmittance of a liquid crystal having dielectric anisotropy using an electric field. For this purpose, the liquid crystal display device includes a liquid crystal display panel that displays an image, a drive circuit that drives the liquid crystal display panel, and a backlight assembly that provides light to the liquid crystal display panel.

液晶表示パネルは、液晶を挟んでシーリング材にて貼り合わせられたカラーフィルタ基板と薄膜トランジスタ基板とを備える。   The liquid crystal display panel includes a color filter substrate and a thin film transistor substrate bonded with a sealing material with a liquid crystal interposed therebetween.

カラーフィルタ基板は、絶縁基板上に積層されたブラックマトリクス、カラーフィルタ及び共通電極を備える。   The color filter substrate includes a black matrix, a color filter, and a common electrode stacked on an insulating substrate.

薄膜トランジスタ基板は、下部絶縁基板上に交差して形成されたゲートライン及びデータラインと、ゲートライン及びデータラインと画素電極との間に接続された薄膜トランジスタと、を備える。薄膜トランジスタは、ゲートラインからのスキャン信号に応答してデータラインからのデータ信号を画素電極に供給する。   The thin film transistor substrate includes a gate line and a data line formed to intersect with each other on the lower insulating substrate, and a thin film transistor connected between the gate line, the data line, and the pixel electrode. The thin film transistor supplies a data signal from the data line to the pixel electrode in response to a scan signal from the gate line.

このような薄膜トランジスタ基板は、多数のマスク工程を用いて形成しており、マスク工程を減らすために、ソース及びドレイン電極、半導体パターンを形成する工程を、ハーフトーンマスクを用いて1つのマスク工程で形成する。   Such a thin film transistor substrate is formed using a number of mask processes, and in order to reduce the mask process, the process of forming the source and drain electrodes and the semiconductor pattern is performed in a single mask process using a halftone mask. Form.

この場合、ハーフトーンマスクは、紫外線を遮断する遮断領域と、紫外線を部分透過させる半透過領域と、紫外線を透過させる透過領域と、を含む。このようなハーフトーンマスクの半透過領域は、互いに異なる透過率を有する多重半透過部で形成すればよい。多重半透過部を形成するために、互いに異なる透過率を有する多数の半透過物質を用いる。
例えば、3個以上の互いに異なる透過率を有する多重透過部を具現するには、互いに異なる透過率を有する3個の半透物質が必要とされる。すなわち、3個以上の多重半透過部を有するハーフトーンマスクを形成するためには、それに対応して半透過物質の数も増加させなければならないという問題点があった。
In this case, the halftone mask includes a blocking region that blocks ultraviolet rays, a semi-transmissive region that partially transmits ultraviolet rays, and a transmissive region that transmits ultraviolet rays. The semi-transmission region of such a halftone mask may be formed by multiple semi-transmission portions having different transmittances. In order to form a multiple semi-transmissive portion, a large number of semi-transmissive materials having different transmittances are used.
For example, in order to implement a multiple transmission part having three or more different transmittances, three semi-permeable materials having different transmittances are required. That is, in order to form a halftone mask having three or more multiple semi-transmissive portions, the number of semi-transmissive materials has to be increased correspondingly.

上記問題を解決するために、本発明は、一つの半透過物質を用いて多重半透過部を備えることができるハーフトーンマスク及びその製造方法を提供する。   In order to solve the above problems, the present invention provides a halftone mask that can include multiple transflective portions using a single translucent material, and a method of manufacturing the same.

上記技術的課題を達成するために、本発明に係るハーフトーンマスクは、基板と、前記基板上に形成され、照射される所定波長帯の光を透過させる透過領域と、一つの半透過物質を使用し、前記半透過物質の厚さまたは積層数によって、前記基板上に照射される所定波長帯の光を多数個の互いに異なる透過率で透過させる多重半透過部を有する半透過領域と、を含むことを特徴とする。   In order to achieve the above technical problem, a halftone mask according to the present invention includes a substrate, a transmission region that is formed on the substrate and transmits light of a predetermined wavelength band to be irradiated, and one semitransparent material. A semi-transmission region having a multiple semi-transmission portion that transmits a plurality of light of a predetermined wavelength band irradiated on the substrate with different transmittances according to the thickness or the number of stacked layers of the semi-transmission material. It is characterized by including.

ここで、前記ハーフトーンマスクは、少なくとも2つの前記半透過物質の間に形成された遮断層を有する遮断領域をさらに含むことを特徴とする。   Here, the halftone mask further includes a blocking region having a blocking layer formed between at least two of the semi-transmissive materials.

ここで、前記ハーフトーンマスクは、少なくとも2つの前記半透過物質の上部または下部に形成された遮断層を有する遮断領域をさらに含むことを特徴とする。   Here, the halftone mask may further include a blocking region having a blocking layer formed on or under the at least two semi-transparent materials.

ここで、前記半透過物質は、Cr、Si、Mo、Ta、Ti、Al、Zr、Sn、Zn、In、Mg、Hf、V、Nd、Ge、スピネル(MgO−Al23)、サイアロン(Si34)のいずれかの単一物質、これらうち少なくとも2つが混合された複合物質、または、前記単一物質または複合物質に、COx、Ox、Nx、Cx、Fx、Bx(ただし、下付き文字x、y、zは自然数で、各化学元素の個数を表す。)の少なくとも1つが添加された物質であることを特徴とする。
そして、前記半透過領域は、前記基板上に半透過物質が形成されて、光をX%透過させる第1半透過部と、前記半透過物質よりも厚く形成されて、光をY%透過させる第2半透過部と、前記半透過物質が2層で積層されて、光をZ%透過させる第3半透過部と、を含むことを特徴とする。
Here, the translucent materials are Cr, Si, Mo, Ta, Ti, Al, Zr, Sn, Zn, In, Mg, Hf, V, Nd, Ge, spinel (MgO—Al 2 O 3 ), sialon. Any single substance of (Si 3 N 4 ), a composite substance in which at least two of them are mixed, or the single substance or the composite substance is added with CO x , O x , N x , C x , F x , B x (wherein subscripts x, y, and z are natural numbers and represent the number of each chemical element) are added to the material.
The semi-transmission region is formed with a semi-transmission material on the substrate to transmit X% light, and is formed to be thicker than the semi-transmission material, and transmits Y% light. It includes a second semi-transmission part and a third semi-transmission part in which the semi-transmission material is laminated in two layers and transmits Z% of light.

上記技術的課題を解決するために、本発明に係るハーフトーンマスクの製造方法は、基板上に第1半透過物質、遮断層、フォトレジストを積層した後、前記遮断層の必要領域が露出されるように前記フォトレジストを露光及び現像し、前記露出された遮断層、第1半透過物質を順に除去する段階と、前記第1半透過物質及び遮断層の形成された基板上にフォトレジストを積層した後、前記遮断層の必要領域が露出されるように前記フォトレジストを露光及び現像して、前記露出された遮断層を除去する段階と、   In order to solve the above technical problem, in the method of manufacturing a halftone mask according to the present invention, after a first semi-transparent material, a blocking layer, and a photoresist are stacked on a substrate, a necessary region of the blocking layer is exposed. The photoresist is exposed and developed to remove the exposed blocking layer and the first semi-transmissive material in order, and the photoresist is formed on the substrate on which the first semi-transmissive material and the blocking layer are formed. After laminating, exposing and developing the photoresist so that a necessary region of the blocking layer is exposed, and removing the exposed blocking layer;

前記露出された遮断層を除去した後、第2半透過物質、フォトレジストを順に積層して、前記第1及び第2半透過物質の間に遮断層が形成された遮断領域を形成する段階と、前記第2半透過物質の必要領域が露出されるように前記フォトレジストを露光及び現像し、前記露出された第2半透過物質、遮断層を順に除去する段階と、前記基板上に第1半透過物質が形成された第1半透過部と、前記基板上に第2半透過物質が形成された第2半透過部と、前記第1及び第2半透過物質が積層された第3半透過部を含む半透過領域を形成する段階と、を含むことを特徴とする。   Removing the exposed blocking layer, and sequentially stacking a second semi-transmissive material and a photoresist to form a blocking region in which a blocking layer is formed between the first and second semi-transmissive materials; Exposing and developing the photoresist so that a necessary region of the second semi-transmissive material is exposed, and removing the exposed second semi-transmissive material and the blocking layer in order; A first semi-transmission portion in which a semi-transmission material is formed; a second semi-transmission portion in which a second semi-transmission material is formed on the substrate; and a third semi-layer in which the first and second semi-transmission materials are stacked. Forming a semi-transmissive region including a transmissive portion.

ここで、前記第1半透過物質及び第2半透過物質は、同じ半透過物質で形成し、前記第1半透過物質及び第2半透過物質は、互いに異なる厚さを有するように形成することを特徴とする。   Here, the first semipermeable material and the second semipermeable material are formed of the same semipermeable material, and the first semipermeable material and the second semipermeable material are formed to have different thicknesses. It is characterized by.

そして、前記半透過物質は、Cr、Si、Mo、Ta、Ti、Alを主元素とし、これらのうち少なくとも2つが混合された複合物質、または、前記主元素にCOx、Ox、Nxの少なくとも1つが添加された物質であることを特徴とする。 The translucent material includes Cr, Si, Mo, Ta, Ti, and Al as main elements, and is a composite material in which at least two of them are mixed, or the main elements include CO x , O x , N x. It is characterized in that at least one of the above substances is added.

本発明に係るハーフトーンマスクは、一つの半透過物質を用いて3個以上の互いに異なる透過率を有する多重半透過部を有する半透過領域と、少なくとも2つの半透過物質の間に遮断層を形成してなる遮断領域と、を含む。   The halftone mask according to the present invention includes a semi-transmissive region having multiple semi-transmissive portions having three or more different transmittances using one semi-transmissive material, and a blocking layer between at least two semi-transmissive materials. And a blocking region formed.

このように、一つの半透過物質を用いて3個以上の互いに異なる透過率を有する多重半透過部を備えることができるため、多重透過率に従って半透過物質を増加させずに済む。すなわち、半透過物質の数を増加させることなく多重半透過部を有するハーフトーンマスクを具現することができる。   As described above, since one or more semi-transparent materials can be provided with three or more multiple semi-transmissive portions having different transmittances, it is not necessary to increase the semi-transmissive materials according to the multiple transmittance. That is, it is possible to implement a halftone mask having multiple semi-transmissive portions without increasing the number of semi-transmissive materials.

本発明の実施例に係るハーフトーンマスクを示す断面図である。It is sectional drawing which shows the halftone mask which concerns on the Example of this invention. 図1に示す本発明の実施例に係るハーフトーンマスクの製造方法を示す断面図である。It is sectional drawing which shows the manufacturing method of the halftone mask which concerns on the Example of this invention shown in FIG. 図1に示す本発明の実施例に係るハーフトーンマスクの製造方法を示す断面図である。It is sectional drawing which shows the manufacturing method of the halftone mask which concerns on the Example of this invention shown in FIG. 図1に示す本発明の実施例に係るハーフトーンマスクの製造方法を示す断面図である。It is sectional drawing which shows the manufacturing method of the halftone mask which concerns on the Example of this invention shown in FIG. 図1に示す本発明の実施例に係るハーフトーンマスクの製造方法を示す断面図である。It is sectional drawing which shows the manufacturing method of the halftone mask which concerns on the Example of this invention shown in FIG. 図1に示す本発明の実施例に係るハーフトーンマスクの製造方法を示す断面図である。It is sectional drawing which shows the manufacturing method of the halftone mask which concerns on the Example of this invention shown in FIG. 図1に示す本発明の実施例に係るハーフトーンマスクの製造方法を示す断面図である。It is sectional drawing which shows the manufacturing method of the halftone mask which concerns on the Example of this invention shown in FIG. 図1に示す本発明の実施例に係るハーフトーンマスクの製造方法を示す断面図である。It is sectional drawing which shows the manufacturing method of the halftone mask which concerns on the Example of this invention shown in FIG. 図1に示す本発明の実施例に係るハーフトーンマスクの製造方法を示す断面図である。It is sectional drawing which shows the manufacturing method of the halftone mask which concerns on the Example of this invention shown in FIG. 図1に示す本発明の実施例に係るハーフトーンマスクの製造方法を示す断面図である。It is sectional drawing which shows the manufacturing method of the halftone mask which concerns on the Example of this invention shown in FIG. 図1に示す本発明の実施例に係るハーフトーンマスクの製造方法を示す断面図である。It is sectional drawing which shows the manufacturing method of the halftone mask which concerns on the Example of this invention shown in FIG. 図1に示す本発明の実施例に係るハーフトーンマスクの製造方法を示す断面図である。It is sectional drawing which shows the manufacturing method of the halftone mask which concerns on the Example of this invention shown in FIG.

以下、本発明の好適な実施例を、図1乃至図12を参照して詳細に説明する。   Hereinafter, a preferred embodiment of the present invention will be described in detail with reference to FIGS.

図1は、本発明の一実施例に係るハーフトーンマスクを示す断面図である。   FIG. 1 is a cross-sectional view showing a halftone mask according to an embodiment of the present invention.

ハーフトーンマスク100は、図1に示すように、基板102上に、遮断領域S1、多重半透過部を有する半透過領域S2、S3、S4、及び透過領域S5を含む。   As shown in FIG. 1, the halftone mask 100 includes a blocking region S <b> 1, transflective regions S <b> 2, S <b> 3, S <b> 4 having multiple transflective portions, and a transmissive region S <b> 5 on a substrate 102.

基板102は、基板102上に照射される所定波長帯の光を完全に透過させる透明基板であればよく、例えば、石英で形成できるが、光を透過させうる透明性物質であればいずれも使用可能である。   The substrate 102 may be a transparent substrate that can completely transmit light of a predetermined wavelength band irradiated on the substrate 102. For example, the substrate 102 can be formed of quartz, but any transparent material that can transmit light can be used. Is possible.

半透過領域S2、S3、S4は、基板102上に照射される所定波長帯の光を、互いに異なる透過率で透過させるように多重半透過部を含む。このような半透過領域S2、S3、S4は、フォトレジスト工程において露光工程時に紫外線を部分透過させることによって現像工程後に互いに異なる厚さを有するフォトレジストパターンで形成すればよい。   The semi-transmissive regions S2, S3, and S4 include multiple semi-transmissive portions so as to transmit light of a predetermined wavelength band irradiated on the substrate 102 with different transmittances. Such semi-transmissive regions S2, S3, and S4 may be formed with photoresist patterns having different thicknesses after the development process by partially transmitting ultraviolet rays during the exposure process in the photoresist process.

具体的に、半透過領域S2、S3、S4は、一つの半透過物質を用いて3個以上の互いに異なる透過率を有する半透過部を含む。例えば、半透過領域S2、S3、S4は、第1半透過物質112で形成されて、照射される光をX%透過させる第1半透過部S3と、第2半透過物質114で形成されて、照射される光をY%透過させる第2半透過部S2と、第1及び第2半透過物質112、114が積層して形成されて、紫外線をZ%透過させる第3半透過部S4と、を含むことができる。   Specifically, the semi-transmissive regions S2, S3, and S4 include three or more semi-transmissive portions having different transmittances using one semi-transmissive material. For example, the semi-transmissive regions S2, S3, and S4 are formed of the first semi-transmissive material 112 and the first semi-transmissive portion S3 that transmits X% of the irradiated light and the second semi-transmissive material 114. A second semi-transmissive portion S2 that transmits Y% of the irradiated light, and a third semi-transmissive portion S4 that is formed by stacking the first and second semi-transmissive materials 112 and 114 and transmits Z% of ultraviolet rays; , Can be included.

この場合、第1及び第2半透過物質112、114のそれぞれは、同一の半透過物質で形成され、第1半透過部S3に形成された第1半透過物質112は、第2半透過部S2に形成された第2半透過物質114よりも薄い厚さとする。ここで、X%、Y%、Z%はそれぞれ、照射される光を10〜90%透過させる透過率を意味する。   In this case, each of the first and second semipermeable materials 112 and 114 is formed of the same semipermeable material, and the first semipermeable material 112 formed in the first semipermeable portion S3 is the second semipermeable portion. The thickness is smaller than that of the second semipermeable material 114 formed in S2. Here, X%, Y%, and Z% mean transmittances that transmit 10 to 90% of the irradiated light, respectively.

このように、一つの半透過物質を使用し、この半透過物質の厚さまたは積層数によって3個以上の互いに異なる透過率を有する多重半透過部を形成することができる。   As described above, a single semipermeable material is used, and three or more multiple semitransmissive portions having different transmittances can be formed according to the thickness or the number of laminated layers of the semipermeable materials.

第1及び第2半透過物質112、114は、Cr、Si、Mo、Ta、Ti、Alを主元素とし、これら主元素の少なくとも2つが結合した化合物、または、主元素にCOx、Ox、Nxの少なくとも1つが結合した化合物であると好ましい。下付き文字は、結合する主元素によって変わる自然数である。 The first and second semi-permeable materials 112 and 114 are mainly composed of Cr, Si, Mo, Ta, Ti, and Al, a compound in which at least two of these main elements are bonded, or the main elements are CO x , O x. , N x is preferably a bonded compound. The subscript is a natural number that varies depending on the main element to be bound.

第1及び第2半透過物質112、114の組成物には、照射される所定波長帯の光を一部のみ通過させうる種々のものを用いることができる。本発明では、Crxy、CrxCOy、Crxyz、Sixy、Sixyz、SixCOy、SixCOyz、MOxSiy、MOxy、MOxyz、MOxCOy、MOxyz、MOxSiyz、MOxSiyzN MOxSiyCOzN、MoxSiyCOz、Taxy、Taxyz、TaxCOy、Taxyz、Alxy、AlxCOy、Alxyz、AlxCOyz、Tixy、Tixyz、TixCOyのいずれか一つまたはこれらの組み合わせで第1及び第2半透過物質112、114を形成すればよい。 As the composition of the first and second translucent materials 112 and 114, various materials that can transmit only a part of the irradiated light of a predetermined wavelength band can be used. In the present invention, Cr x O y , Cr x CO y , Cr x O y N z , Si x O y , Si x O y N z , Si x CO y , Si x CO y N z , MO x Si y , MO x O y , MO x O y N z , MO x CO y , MO x O y N z , MO x Si y O z , MO x Si y O z N MO x Si y CO z N, Mo x Si y CO z, Ta x O y, Ta x O y N z, Ta x CO y, Ta x O y N z, Al x O y, Al x CO y, Al x O y N z, Al x CO y N z , Ti x O y , Ti x O y N z , Ti x CO y , or a combination thereof may be used to form the first and second translucent materials 112 and 114.

一方、図1に示すように、半透過領域は、互いに異なる透過率を有する半透過部として第1乃至第3半透過部を含むように形成してもよく、一つの半透過物質を用いて半透過部として第1乃至第nの半透過部を形成してもよい。   On the other hand, as shown in FIG. 1, the semi-transmissive region may be formed to include the first to third semi-transmissive portions as the semi-transmissive portions having different transmittances. You may form the 1st thru | or nth semi-transmissive part as a semi-transmissive part.

遮断領域S1は、露光工程時に紫外線を遮断することによって、現像工程後にフォトレジストパターンが残ることになる。そのために、遮断領域S1は、基板102上に第1半透過物質112、遮断層110、第2半透過物質114を順に積層して形成し、紫外線を遮断する。すなわち、遮断領域S1は、遮断層110が第1及び第2半透過物質112、114の間に形成される。   In the blocking area S1, the photoresist pattern remains after the development process by blocking the ultraviolet rays during the exposure process. For this purpose, the blocking region S1 is formed by sequentially stacking the first semi-transmissive material 112, the blocking layer 110, and the second semi-transmissive material 114 on the substrate 102 to block ultraviolet rays. That is, in the blocking region S1, the blocking layer 110 is formed between the first and second semipermeable materials 112 and 114.

このように、透過領域S5、遮断領域S1、半透過領域S2、S3、S4が含まれたハーフトーンマスクを形成する工程を、図2乃至図10を参照して説明する。   A process of forming a halftone mask including the transmissive region S5, the blocking region S1, and the semi-transmissive regions S2, S3, and S4 will be described with reference to FIGS.

図2乃至図10は、図1に示す本発明の実施例に係るハーフトーンマスクの製造方法を示す断面図である。   2 to 10 are cross-sectional views showing a method of manufacturing the halftone mask according to the embodiment of the present invention shown in FIG.

図2を参照すると、基板102上にスパッタ法、化学気相蒸着法などを用いて第1半透過物質112、遮断層110、フォトレジスト120が順に積層される。   Referring to FIG. 2, a first semi-transmissive material 112, a blocking layer 110, and a photoresist 120 are sequentially stacked on a substrate 102 using a sputtering method, a chemical vapor deposition method, or the like.

具体的に、第1半透過物質112は、Cr、Si、Mo、Ta、Ti、Alを主元素とし、これら主元素の少なくとも2つが結合した化合物、または、主元素にCOx、Ox、Nxの少なくとも1つが結合した化合物であると好ましい。下付き文字は、結合する主元素によって変わる自然数である。 Specifically, the first semi-transmissive material 112 includes Cr, Si, Mo, Ta, Ti, and Al as main elements, a compound in which at least two of these main elements are bonded, or CO x , O x , A compound having at least one N x bonded thereto is preferred. The subscript is a natural number that varies depending on the main element to be bound.

第1半透過物質112の組成物には、照射される所定波長帯の光を一部のみ通過させうる種々のものを用いることができる。本発明では、Crxy、CrxCOy、Crxyz、Sixy、Sixyz、SixCOy、SixCOyz、MOxSiy、MOxy、MOxyz、MOxCOy、MOxyz、MOxSiyz、MOxSiyzN MOxSiyCOzN、MoxSiyCOz、Taxy、Taxyz、TaxCOy、Taxyz、Alxy、AlxCOy、Alxyz、AlxCOyz、Tixy、Tixyz、TixCOyのいずれか一つまたはこれらの組み合わせで第1半透過物質112を形成すればよい。ここで、下付き文字x、y及びzは自然数で、各化学元素の個数を表す。 As the composition of the first translucent material 112, various materials that can transmit only a part of the irradiated light of a predetermined wavelength band can be used. In the present invention, Cr x O y , Cr x CO y , Cr x O y N z , Si x O y , Si x O y N z , Si x CO y , Si x CO y N z , MO x Si y , MO x O y , MO x O y N z , MO x CO y , MO x O y N z , MO x Si y O z , MO x Si y O z N MO x Si y CO z N, Mo x Si y CO z, Ta x O y, Ta x O y N z, Ta x CO y, Ta x O y N z, Al x O y, Al x CO y, Al x O y N z, Al x CO y N z , Ti x O y , Ti x O y N z , Ti x CO y , or a combination thereof may be used to form the first semipermeable material 112. Here, the subscripts x, y, and z are natural numbers and represent the number of chemical elements.

そして、遮断層110は、紫外線を遮断できる材質で形成すればよく、例えば、Cr及びCrxyで構成された膜で形成することができる。 The blocking layer 110 may be formed of a material that can block ultraviolet rays. For example, the blocking layer 110 may be formed of a film made of Cr and Cr x O y .

図3を参照すると、遮断層110上に形成されたフォトレジスト120がレーザービーム照射により描画された後、該描画されたフォトレジスト120が現像されて、透過領域S5及び第2半透過部S2の形成される位置では遮断層110が露出される。   Referring to FIG. 3, after the photoresist 120 formed on the blocking layer 110 is drawn by laser beam irradiation, the drawn photoresist 120 is developed, and the transmissive region S5 and the second semi-transmissive portion S2 are developed. The blocking layer 110 is exposed at the position where it is formed.

図4を参照すると、遮断層110上に残れさたフォトレジスト120をマスクとし、露出された遮断層110はエッチング工程で除去され、第1半透過物質112が露出される。   Referring to FIG. 4, using the photoresist 120 left on the blocking layer 110 as a mask, the exposed blocking layer 110 is removed by an etching process to expose the first semi-transmissive material 112.

図5を参照すると、遮断層110上に残されたフォトレジスト120をマスクとし、露出された第1半透過物質112はエッチング工程で除去される。その後、遮断層110上に残存しているフォトレジスト120がストリップ工程で除去される。これにより、遮断領域S1、第1及び第3半透過部S3、S4が形成される位置には第1半透過物質112及び遮断層110が積層形成され、透過領域S5及び第2半透過部S2の形成される位置では基板102が露出される。   Referring to FIG. 5, the exposed first semi-transmissive material 112 is removed by an etching process using the photoresist 120 left on the blocking layer 110 as a mask. Thereafter, the photoresist 120 remaining on the blocking layer 110 is removed by a strip process. As a result, the first semi-transmissive material 112 and the blocking layer 110 are stacked and formed at the position where the blocking region S1, the first and third semi-transmissive portions S3 and S4 are formed, and the transmissive region S5 and the second semi-transmissive portion S2. The substrate 102 is exposed at the position where the film is formed.

図6を参照すると、第1半透過物質112及び遮断層110が形成された基板102上にフォトレジスト120が積層された後、フォトレジスト120がレーザービーム照射により描画される。その後、該描画されたフォトレジスト120が現像されて、第3半透過部S4の形成される位置では遮断層110が露出される。   Referring to FIG. 6, after the photoresist 120 is stacked on the substrate 102 on which the first semi-transmissive material 112 and the blocking layer 110 are formed, the photoresist 120 is drawn by laser beam irradiation. Thereafter, the drawn photoresist 120 is developed, and the blocking layer 110 is exposed at the position where the third semi-transmissive portion S4 is formed.

図7を参照すると、第1半透過物質112及び遮断層110が形成された基板102上に残されたフォトレジスト120をマスクとし、露出された遮断層110がエッチング工程で除去される。その後、この基板102上に残存しているフォトレジスト120がストリップ工程で除去される。   Referring to FIG. 7, the exposed blocking layer 110 is removed by an etching process using the photoresist 120 left on the substrate 102 on which the first semi-transmissive material 112 and the blocking layer 110 are formed as a mask. Thereafter, the photoresist 120 remaining on the substrate 102 is removed by a strip process.

図8を参照すると、基板102上に、スパッタ法、化学気相蒸着法などを用いて第2半透過物質114及びフォトレジスト120が順に積層される。   Referring to FIG. 8, a second semi-transmissive material 114 and a photoresist 120 are sequentially stacked on a substrate 102 by using a sputtering method, a chemical vapor deposition method, or the like.

ここで、第2半透過物質114は、第1半透過物質112と同じ物質で形成されるが、第1半透過物質112よりも厚く形成されることから、第1半透過物質114と異なる透過率を有するようになる。   Here, the second semi-permeable material 114 is formed of the same material as the first semi-permeable material 112, but is thicker than the first semi-permeable material 112, and therefore has a different transmission from the first semi-permeable material 114. Will have a rate.

具体的に、第2半透過物質114は、Cr、Si、Mo、Ta、Ti、Alを主元素とし、これら主元素の少なくとも2つが結合した化合物、または、主元素にCOx、Ox、Nxの少なくとも1つが結合した化合物であると好ましい。下付き文字は、結合する主元素によって変わる自然数である。 Specifically, the second translucent material 114 is a compound in which Cr, Si, Mo, Ta, Ti, and Al are main elements, and at least two of these main elements are bonded, or the main elements are CO x , O x , A compound having at least one N x bonded thereto is preferred. The subscript is a natural number that varies depending on the main element to be bound.

第2半透過物質114の組成物には、照射される所定波長帯の光を一部のみ通過させうる種々のものを用いることができる。本発明では、Crxy、CrxCOy、Crxyz、Sixy、Sixyz、SixCOy、SixCOyz、MOxSiy、MOxy、MOxyz、MOxCOy、MOxyz、MOxSiyz、MOxSiyzN MOxSiyCOzN、MoxSiyCOz、Taxy、Taxyz、TaxCOy、Taxyz、Alxy、AlxCOy、Alxyz、AlxCOyz、Tixy、Tixyz、TixCOyのいずれか一つまたはこれらの組み合わせで第2半透過物質114を形成すればよい。ここで、下付き文字x、y及びzは自然数で、各化学元素の個数を表す。 As the composition of the second translucent material 114, various materials that can transmit only a part of the irradiated light of a predetermined wavelength band can be used. In the present invention, Cr x O y , Cr x CO y , Cr x O y N z , Si x O y , Si x O y N z , Si x CO y , Si x CO y N z , MO x Si y , MO x O y , MO x O y N z , MO x CO y , MO x O y N z , MO x Si y O z , MO x Si y O z N MO x Si y CO z N, Mo x Si y CO z, Ta x O y, Ta x O y N z, Ta x CO y, Ta x O y N z, Al x O y, Al x CO y, Al x O y N z, Al x CO y N z , Ti x O y , Ti x O y N z , Ti x CO y , or a combination thereof may be used to form the second semipermeable material 114. Here, the subscripts x, y, and z are natural numbers and represent the number of chemical elements.

図9を参照すると、透過領域S5及び第1半透過領域S3の形成される位置に形成されたフォトレジスト120が描画されたのち現像されて、第2半透過物質114が露出される。具体的に、透過領域S5及び第1半透過部S3の形成される位置に形成されたフォトレジスト120がレーザービーム照射により描画され、該描画されたフォトレジスト領域を現像して除去する。これにより、遮断領域S1、第2半透過部S2、第3半透過部S4が形成される位置に形成された第2半透過物質114上にはフォトレジスト120が残り、透過領域S5及び第1半透過部S3の形成される位置では第2半透過物質114が露出される。   Referring to FIG. 9, the photoresist 120 formed at the position where the transmissive region S5 and the first semi-transmissive region S3 are formed is drawn and then developed to expose the second semi-transmissive material 114. Specifically, the photoresist 120 formed at the position where the transmissive region S5 and the first semi-transmissive portion S3 are formed is drawn by laser beam irradiation, and the drawn photoresist region is developed and removed. As a result, the photoresist 120 remains on the second semi-transmissive material 114 formed at the position where the blocking region S1, the second semi-transmissive portion S2, and the third semi-transmissive portion S4 are formed. The second semi-transmissive material 114 is exposed at the position where the semi-transmissive portion S3 is formed.

図10を参照すると、第2半透過物質114上に残されたフォトレジスト120をマスクとし、露出された第2半透過物質114が除去される。これにより、基板102が露出された透過領域S5が形成され、第1半透過部S3の形成される位置では遮断層110が露出される。   Referring to FIG. 10, the exposed second semi-transmissive material 114 is removed using the photoresist 120 left on the second semi-transmissive material 114 as a mask. Thereby, a transmissive region S5 where the substrate 102 is exposed is formed, and the blocking layer 110 is exposed at a position where the first semi-transmissive portion S3 is formed.

図11を参照すると、基板102上に露出された遮断層110が除去されることによって、第1半透過物質112で形成された第1半透過部S3が形成される。   Referring to FIG. 11, the blocking layer 110 exposed on the substrate 102 is removed, thereby forming a first semi-transmissive portion S3 formed of the first semi-permeable material 112.

図12を参照すると、基板102上に残存しているフォトレジスト120がストリップ工程で除去される。これにより、基板102上に遮断層110、第1半透過物質112、第2半透過物質114が積層された遮断領域S1が形成され、基板102上に第1半透過物質112が積層された第1半透過部S3が形成され、基板102上に第2半透過物質114が積層された第2半透過部S4が形成され、基板102上に第1半透過物質112及び第2半透過物質114が積層された第3半透過部S2が形成され、基板102が露出された透過領域S5が形成される。   Referring to FIG. 12, the photoresist 120 remaining on the substrate 102 is removed by a strip process. As a result, a blocking region S1 in which the blocking layer 110, the first semi-transmissive material 112, and the second semi-transmissive material 114 are stacked on the substrate 102 is formed, and the first semi-transmissive material 112 is stacked on the substrate 102. The first semi-transmissive portion S3 is formed, the second semi-transmissive portion S4 is formed by laminating the second semi-transmissive material 114 on the substrate 102, and the first semi-transmissive material 112 and the second semi-transmissive material 114 are formed on the substrate 102. Is formed, and a transmission region S5 where the substrate 102 is exposed is formed.

以上の詳細な説明では本発明の好適な実施例を参照して本発明を説明してきたが、当該技術の分野における熟練した当業者または当該技術の分野における通常の知識を有する者にとっては、添付した特許請求の範囲に記載された本発明の思想及び技術領域を逸脱しない範囲内で、本発明を様々に修正及び変更できるということは明らかであろう。   While the foregoing detailed description has described the invention with reference to the preferred embodiment of the invention, it should be understood that those skilled in the art or those having ordinary knowledge in the art will be It will be apparent that various modifications and changes may be made in the present invention without departing from the spirit and scope of the invention as set forth in the appended claims.

102 基板
110 遮断層
112 第1半透過物質
114 第2半透過物質
120 フォトレジスト
102 Substrate 110 Blocking layer 112 First translucent material 114 Second translucent material 120 Photoresist

Claims (6)

基板と、
前記基板上に形成され、照射される所定波長帯の光を透過させる透過領域と、
一つの半透過物質を使用し、前記半透過物質の厚さまたは積層数によって、前記基板上に照射される所定波長帯の光を多数個の互いに異なる透過率で透過させる多重半透過部を有する半透過領域と、を含み、
前記半透過領域は、
前記基板上に半透過物質が形成されて、光をX%透過させる第1半透過部と、
前記半透過物質よりも厚く形成されて、光をY%透過させる第2半透過部と、
前記半透過物質が2層で積層されて、光をZ%透過させる第3半透過部と、を含み、
前記第3半透過部は、前記半透過物質の2層が直接接触することを特徴とするハーフトーンマスク。
A substrate,
A transmission region formed on the substrate and transmitting light of a predetermined wavelength band to be irradiated;
One semi-transparent material is used, and a plurality of semi-transparent portions that transmit light of a predetermined wavelength band irradiated on the substrate with a plurality of different transmittances depending on the thickness or the number of stacked layers of the semi-transparent materials. A translucent region, and
The translucent region is
A semi-transparent material is formed on the substrate, and a first semi-transmissive portion that transmits X% of light;
A second semi-transmissive portion that is formed thicker than the semi-transmissive material and transmits Y% of light;
Wherein are laminated in a semi-transparent material two layers, seen including a third semi-transmission part where light is Z% transmittance, a,
The half-tone mask, wherein the third semi-transmissive portion is in direct contact with two layers of the semi-transmissive material .
前記一つの半透過物質を積層し、積層した半透過物質の間に形成された遮断層を有する遮断領域をさらに含むことを特徴とする、請求項1に記載のハーフトーンマスク。   The halftone mask according to claim 1, further comprising a blocking region having the blocking layer formed between the stacked semi-transmitting materials. 前記半透過物質の上部または下部に形成された遮断層を有する遮断領域をさらに含むことを特徴とする、請求項1に記載のハーフトーンマスク。   The halftone mask of claim 1, further comprising a blocking region having a blocking layer formed on an upper portion or a lower portion of the translucent material. 前記半透過物質は、Cr、Si、Mo、Ta、Ti、Al、Zr、Sn、Zn、In、Mg、Hf、V、Nd、Ge、MgO−Al23、Si34のいずれかの単一物質、これらのうち少なくとも2つが混合された複合物質、または、前記単一物質または複合物質に、COx、Ox、Nx、Cx、Fx、Bxの少なくとも1つが添加された物質であることを特徴とし、下付き文字xは自然数で、各化学元素の個数を表す、請求項1に記載のハーフトーンマスク。 The translucent material is any one of Cr, Si, Mo, Ta, Ti, Al, Zr, Sn, Zn, In, Mg, Hf, V, Nd, Ge, MgO—Al 2 O 3 , and Si 3 N 4 . A single substance, a composite substance in which at least two of them are mixed, or at least one of CO x , O x , N x , C x , F x , and B x is added to the single substance or the composite substance The halftone mask according to claim 1, wherein the subscript x is a natural number and represents the number of each chemical element. 基板上に第1半透過物質、遮断層、フォトレジストを積層した後、前記遮断層の必要領域が露出されるように前記フォトレジストを露光及び現像し、前記露出された遮断層、第1半透過物質を順に除去する段階と、
前記第1半透過物質及び遮断層の形成された基板上にフォトレジストを積層した後、前記遮断層の必要領域が露出されるように前記フォトレジストを露光及び現像して、前記露出された遮断層を除去する段階と、
前記露出された遮断層を除去した後、第2半透過物質、フォトレジストを順に積層して、前記第1及び第2半透過物質の間に遮断層が形成された遮断領域を形成する段階と、
前記第2半透過物質の必要領域が露出されるように前記フォトレジストを露光及び現像し、前記露出された第2半透過物質、遮断層を順に除去する段階と、
前記基板上に第1半透過物質が形成された第1半透過部と、前記基板上に第2半透過物質が形成された第2半透過部と、前記第1及び第2半透過物質が積層された第3半透過部を含む半透過領域を形成する段階と、を含み、
前記第1半透過物質及び第2半透過物質は、同じ半透過物質で形成し、前記第1半透過物質及び第2半透過物質は、互いに異なる厚さを有するように形成し、前記第3透過部で前記第1半透過物質と第2半透過物質が直接接触することを特徴とするハーフトーンマスクの製造方法。
After laminating a first semi-transparent material, a blocking layer, and a photoresist on the substrate, the photoresist is exposed and developed so that a necessary region of the blocking layer is exposed, and the exposed blocking layer, the first half layer is exposed. Removing permeate in sequence;
After laminating a photoresist on the substrate on which the first translucent material and the blocking layer are formed, the photoresist is exposed and developed so that a necessary area of the blocking layer is exposed, and the exposed blocking is performed. Removing the layer;
Removing the exposed blocking layer, and sequentially stacking a second semi-transmissive material and a photoresist to form a blocking region in which a blocking layer is formed between the first and second semi-transmissive materials; ,
Exposing and developing the photoresist so that a necessary region of the second semi-transmissive material is exposed, and sequentially removing the exposed second semi-transmissive material and a blocking layer;
A first semi-transmissive portion having a first semi-transmissive material formed on the substrate; a second semi-transmissive portion having a second semi-transmissive material formed on the substrate; and the first and second semi-transmissive materials. Forming a semi-transmissive region including the laminated third semi-transmissive portion,
The first semipermeable material and the second semipermeable material are formed of the same semipermeable material, and the first semipermeable material and the second semipermeable material are formed to have different thicknesses, and the third semipermeable material . A method of manufacturing a halftone mask , wherein the first semi-transmissive material and the second semi-transmissive material are in direct contact with each other in a transmissive portion .
前記半透過物質は、Cr、Si、Mo、Ta、Ti、Al、Zr、Sn、Zn、In、Mg、Hf、V、Nd、Ge、MgO−Al23、Si34のいずれかの単一物質、これらのうち少なくとも2つが混合された複合物質、または、前記単一物質または複合物質に、COx、Ox、Nx、Cx、Fx、Bxの少なくとも1つが添加された物質であることを特徴とし、下付き文字xは自然数で、各化学元素の個数を表す、請求項5に記載のハーフトーンマスクの製造方法。 The translucent material is any one of Cr, Si, Mo, Ta, Ti, Al, Zr, Sn, Zn, In, Mg, Hf, V, Nd, Ge, MgO—Al 2 O 3 , and Si 3 N 4 . A single substance, a composite substance in which at least two of them are mixed, or at least one of CO x , O x , N x , C x , F x , and B x is added to the single substance or the composite substance 6. The method of manufacturing a halftone mask according to claim 5, wherein the subscript x is a natural number and represents the number of each chemical element.
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