JP5574530B2 - Mounting board inspection apparatus and mounting board inspection method - Google Patents

Mounting board inspection apparatus and mounting board inspection method Download PDF

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JP5574530B2
JP5574530B2 JP2010184744A JP2010184744A JP5574530B2 JP 5574530 B2 JP5574530 B2 JP 5574530B2 JP 2010184744 A JP2010184744 A JP 2010184744A JP 2010184744 A JP2010184744 A JP 2010184744A JP 5574530 B2 JP5574530 B2 JP 5574530B2
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inspection
inspection area
mounting board
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JP2012044028A (en
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俊孝 林
純男 門松
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Fuji Corp
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Fuji Machine Manufacturing Co Ltd
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本発明は、部品が実装された実装基板の検査対象領域に複数の検査エリアを設定し、前記複数の検査エリアを1つずつ順番にカメラで撮像して当該検査エリア内の部品実装状態を検査する実装基板検査装置及び実装基板検査方法に関する発明である。   In the present invention, a plurality of inspection areas are set in an inspection target area of a mounting board on which a component is mounted, and the plurality of inspection areas are sequentially imaged by a camera to inspect a component mounting state in the inspection area. It is invention regarding the mounting board inspection apparatus and mounting board inspection method which perform.

検査用のカメラの視野サイズと比較して実装基板の検査対象領域のサイズが大きい場合は、実装基板の検査対象領域を複数の検査エリア(1回の撮像で検査可能な撮像エリア)に分割して複数回の撮像を行う必要がある。   When the size of the inspection target area of the mounting board is larger than the visual field size of the inspection camera, the inspection target area of the mounting board is divided into a plurality of inspection areas (imaging areas that can be inspected by one imaging). It is necessary to perform multiple imaging.

そこで、特許文献1(特開平8−62275号公報)では、実装基板の検査対象領域をカメラの視野サイズの幅で格子状に分割して複数の検査エリア(撮像エリア)を区画するようにしている。更に、この特許文献1には、実装基板の検査時間を短縮するために、各部品毎に不良率を求めて、部品の不良率で検査の優先順位を付け、優先順位が低い部品が含まれる検査エリアの検査を省略する実施例が記載されている。   Therefore, in Patent Document 1 (Japanese Patent Application Laid-Open No. 8-62275), the inspection target area of the mounting substrate is divided into a lattice shape with the width of the visual field size of the camera so as to partition a plurality of inspection areas (imaging areas). Yes. Further, this Patent Document 1 includes a component with a low priority order by obtaining a defect rate for each component and assigning a priority of inspection based on the component defect rate in order to reduce the inspection time of the mounting board. An embodiment is described in which the inspection of the inspection area is omitted.

また、特許文献2(特開2006−78206号公報)では、実装基板のうちの部品が実装されていない領域(検査不要領域)の撮像をスキップして、各検査エリア(撮像エリア)内になるべく多くの部品を含み、最も少ない撮像回数となるように、各検査エリアの位置、エリア数(撮像回数)、撮像順序を算出するようにしている。   Further, in Patent Document 2 (Japanese Patent Application Laid-Open No. 2006-78206), imaging of an area (inspection unnecessary area) in which a component is not mounted on the mounting board is skipped and should be in each inspection area (imaging area). The position of each inspection area, the number of areas (number of times of imaging), and the imaging order are calculated so that the number of times of imaging is the smallest, including many parts.

特開平8−62275号公報(段落[0013]、[0014]、図5、図7参照)JP-A-8-62275 (see paragraphs [0013], [0014], FIG. 5 and FIG. 7) 特開2006−78206号公報(段落[0056]、図16参照)JP 2006-78206 A (see paragraph [0056], FIG. 16)

上記特許文献1では、部品の不良率で検査の優先順位を付け、優先順位が低い部品が含まれる検査エリア(撮像エリア)の検査を省略するようにしているが、一般に、1つの検査エリア内には、複数の部品が含まれるため、検査エリア内に含まれる1つの部品の検査の優先順位が低くても、他の部品の優先順位が高ければ、当該検査エリアの検査を行う必要がある。このため、検査を省略できる非検査エリアの数が非常に少なくなってしまい、実装基板の検査時間を短縮する効果は少ないと思われる。   In the above-mentioned Patent Document 1, inspection priority is given by the defect rate of parts, and inspection of an inspection area (imaging area) including parts with low priority is omitted, but in general, in one inspection area Includes a plurality of parts, so even if the priority of inspection of one part included in the inspection area is low, if the priority of other parts is high, it is necessary to inspect the inspection area. . For this reason, the number of non-inspection areas where the inspection can be omitted is very small, and it seems that the effect of shortening the inspection time of the mounting board is small.

一般に、実装基板検査装置は、部品実装ラインの途中又は下流側に設置され、検査工程とその前後工程との間で実装基板1枚当たりの処理時間のバランスが取れていれば、ライン全体のタクトには影響がないが、実装基板1枚当たりの検査時間が前後工程の処理時間よりも長くなると、ライン全体のタクトが延びて生産能率が低下する。   Generally, a mounting board inspection device is installed in the middle or downstream of a component mounting line, and if the processing time per mounting board is balanced between the inspection process and the preceding and following processes, the tact of the entire line is achieved. However, if the inspection time per mounting board becomes longer than the processing time of the preceding and following processes, the tact of the entire line is extended and the production efficiency is lowered.

上記特許文献2では、部品が実装されていない領域の撮像をスキップするだけであるため、実装基板上の全ての部品を撮像して検査しなければならず、検査時間の短縮に限界がある。このため、検査時間が前後工程の処理時間よりも長くなる場合があり、その場合は、ライン全体のタクトが延びてしまう。   In Patent Document 2, since imaging of an area where no components are mounted is only skipped, all components on the mounting board must be imaged and inspected, and there is a limit to shortening the inspection time. For this reason, the inspection time may be longer than the processing time of the preceding and following processes, and in this case, the tact of the entire line is extended.

検査時間を短縮するには、実際に検査する検査エリアの数を減らすことが効果的であるが、上記特許文献1のように、検査エリアの位置が固定されていると、検査しない部品を優先順位等により指定しても、検査エリア内の複数の部品の中に1つでも検査が必要な部品が存在すれば、当該検査エリアを検査しなければならないため、検査を省略できる非検査エリアの数が非常に少なくなってしまい、検査時間を十分に短縮できない。   In order to shorten the inspection time, it is effective to reduce the number of inspection areas to be actually inspected. However, if the position of the inspection area is fixed as in Patent Document 1, the parts that are not inspected are given priority. Even if it is specified by order, etc., if at least one of the parts in the inspection area requires inspection, the inspection area must be inspected. The number becomes very small, and the inspection time cannot be shortened sufficiently.

従って、従来技術では、検査時間を短縮するには、作業者が非検査エリアを指定する必要があるが、この作業は、かなりの熟練度と経験が要求される。このため、熟練度や経験が不足する作業者が非検査エリアを指定すると、実際には検査が必要な部品を含む検査エリアを誤って非検査エリアに指定してしまう可能性があり、検査品質が低下してしまうという問題があった。   Therefore, in the prior art, in order to shorten the inspection time, it is necessary for an operator to designate a non-inspection area, but this work requires a considerable skill and experience. For this reason, if a worker with insufficient skill level or experience specifies a non-inspection area, the inspection area containing parts that actually need to be inspected may be erroneously specified as the non-inspection area. There was a problem that would decrease.

そこで、本発明が解決しようとする課題は、実装基板の検査対象領域に設定した複数の検査エリアを1つずつ順番にカメラで撮像して部品実装状態を検査するシステムにおいて、検査品質を確保しながら、目標タクトに応じて実装基板1枚当たりの検査時間を短縮できる実装基板検査装置及び実装基板検査方法を提供することである。   Therefore, the problem to be solved by the present invention is to ensure inspection quality in a system in which a plurality of inspection areas set in the inspection target area of the mounting board are imaged one by one in order and the component mounting state is inspected. However, it is to provide a mounting board inspection apparatus and a mounting board inspection method capable of shortening the inspection time per mounting board according to the target tact.

上記課題を解決するために、請求項1に係る発明は、部品が実装された実装基板の検査対象領域に複数の検査エリアを設定し、前記複数の検査エリアを1つずつ順番にカメラで撮像して当該検査エリア内の部品実装状態を検査する実装基板検査装置において、前記実装基板に実装する各部品の検査の重要度を設定する検査重要度設定手段と、目標タクトを設定する目標タクト設定手段と、前記検査エリアの位置とエリア数と撮像順序を決める検査エリアシーケンスを作成する際に前記目標タクトに応じて検査の重要度の低い方の部品を検査対象から除外して前記検査エリアシーケンスをより少ないエリア数で前記実装基板上の全ての検査対象部品がいずれかの検査エリア内に収まるように作成する検査エリアシーケンス作成手段とを備え、前記検査エリアシーケンス作成手段は、前記実装基板のいずれか1つの角部周辺に最初の検査エリアを検査対象部品がより多く含まれるように配置し、以後、先に配置した検査エリアから移動した位置に次の検査エリアを検査対象部品がより多く含まれるように配置するという処理を繰り返すことで、前記実装基板上の全ての検査対象部品がいずれかの検査エリア内に収まるように検査エリアシーケンスを作成することを特徴とするものである。 In order to solve the above-described problem, the invention according to claim 1 sets a plurality of inspection areas in an inspection target area of a mounting board on which a component is mounted, and images the plurality of inspection areas one by one in order. In the mounting board inspection apparatus for inspecting the component mounting state in the inspection area, inspection importance setting means for setting the importance of inspection of each component mounted on the mounting board, and target tact setting for setting the target tact The inspection area sequence is created by excluding a part having a lower importance of inspection from the inspection object according to the target tact when creating the inspection area sequence for determining the position, the number of areas and the imaging order of the inspection area. and a test area sequence creating means for creating to fit in any of the inspection area all inspected components on the mounting substrate to a smaller number of areas, before The inspection area sequence creating means arranges the first inspection area around any one corner of the mounting substrate so as to include more parts to be inspected, and thereafter moves to a position moved from the previously arranged inspection area. By repeating the process of placing the next inspection area so that more parts to be inspected are included, an inspection area sequence is created so that all the parts to be inspected on the mounting board fit within one of the inspection areas. It is characterized by doing.

本発明のように、各部品の検査の重要度を設定し、目標タクトに応じて検査の重要度の低い方の部品を検査対象から除外して、検査エリアの位置とエリア数と撮像順序を決める検査エリアシーケンスを、より少ないエリア数で実装基板上の全ての検査対象部品がいずれかの検査エリア内に収まるように作成すれば、目標タクトに応じて検査するエリア数を減らして検査時間を短縮することが可能となり、目標タクトを実現できる。しかも、検査の重要度の低い方の部品のみを検査対象から除外して、検査の重要度の高い方の部品を全て検査できるため、検査品質も確保することができる。   As in the present invention, the importance of inspection of each part is set, the part with the lower importance of inspection is excluded from the inspection object according to the target tact, and the position, the number of areas and the imaging order of the inspection area are set. If the inspection area sequence to be determined is created so that all parts to be inspected on the mounting board fit in one of the inspection areas with a smaller number of areas, the inspection time can be reduced by reducing the number of areas to be inspected according to the target tact. It can be shortened and the target tact can be realized. In addition, since only the parts with the lower importance of the inspection are excluded from the inspection target and all the parts with the higher importance of the inspection can be inspected, the inspection quality can be ensured.

要するに、本発明では、部品単位で検査対象から除外するため、検査エリア単位で検査対象から除外する従来技術と比較して、同じ検査時間(同じエリア数)でも、検査対象部品の数を多くすることができて、検査対象から除外する部品数を少なくすることができ、検査時間の短縮と検査品質の確保とを両立させることができる。   In short, in the present invention, since the parts are excluded from the inspection target in units of parts, the number of parts to be inspected is increased even in the same inspection time (the same number of areas) as compared with the prior art in which the inspection areas are excluded from the inspection targets. Therefore, the number of parts to be excluded from the inspection target can be reduced, and both shortening the inspection time and ensuring the inspection quality can be achieved.

この場合、各部品の検査の重要度や目標タクトは、部品実装ラインの各工程で用いられる各種データや生産ジョブに基づいて自動的に設定しても良い。
或は、予め専門のエンジニアが各部品の検査の重要度を設定したデータを検査対象部品ライブラリに格納しておけば、検査エリアシーケンスの作成時に作業者が各部品の検査の重要度を設定する必要がなく、作業者の設定ミスによる検査品質の低下を確実に防止できる。
In this case, the importance level and target tact of the inspection of each component may be automatically set based on various data and production jobs used in each process of the component mounting line.
Or, if the data that sets the importance of inspection of each part by a specialist engineer is stored in the inspection target part library in advance, the operator sets the importance of inspection of each part when creating the inspection area sequence. There is no need, and it is possible to reliably prevent a drop in inspection quality due to an operator's setting mistake.

但し、本発明は、検査エリアシーケンスの作成時に作業者が各部品の検査の重要度を設定するようにしても良く、この場合でも、検査エリア単位で検査対象から除外する従来の作業と比較すれば、部品単位で検査の重要度を設定する作業は簡単であるため、熟練度や経験が少ない作業者でも十分に作業可能であり、作業者の設定ミスを大幅に低減することができる。
更に、本発明では、検査エリアシーケンスを作成する際に、実装基板のいずれか1つの角部周辺に最初の検査エリアを検査対象部品がより多く含まれるように配置し、以後、先に配置した検査エリアから移動した位置に次の検査エリアを検査対象部品がより多く含まれるように配置するという処理を繰り返すことで、実装基板上の全ての検査対象部品がいずれかの検査エリア内に収まるように検査エリアシーケンスを作成するようにしているため、最初の検査エリアを実装基板のいずれか1つの角部周辺に配置すれば、検査エリアの撮像順序を時計回り方向又は反時計回り方向のみとするように検査エリアシーケンスを作成することができ、カメラの移動距離を短くできる。
However, according to the present invention, when creating an inspection area sequence, an operator may set the importance of inspection of each part, and even in this case, it is compared with the conventional work that is excluded from inspection targets in units of inspection areas. For example, since it is easy to set the inspection importance level for each part, even a worker with little skill or experience can work sufficiently, and the setting mistake of the worker can be greatly reduced.
Furthermore, in the present invention, when creating the inspection area sequence, the first inspection area is arranged so as to include more parts to be inspected around any one corner of the mounting substrate, and then arranged first. By repeating the process of arranging the next inspection area so that more parts to be inspected are included at the position moved from the inspection area, all the parts to be inspected on the mounting board can be accommodated in one of the inspection areas. Since the inspection area sequence is created at the same time, if the first inspection area is arranged around any one corner of the mounting board, the imaging order of the inspection areas is only clockwise or counterclockwise. Thus, the inspection area sequence can be created, and the moving distance of the camera can be shortened.

また、請求項2のように、各部品の検査の重要度は、少なくとも実装基板上の部品間の間隔、部品サイズ及び部品のリードピッチを考慮して設定すれば良い。ここで、部品間の間隔、部品サイズ、部品のリードピッチは、部品実装機で用いる部品実装用データを用いれば良く、例えば、部品間の間隔が狭くなるほど、重要度を高くし、部品サイズが小さくなるほど、重要度を高くすれば良い。また、部品のリードピッチが狭いものほど、重要度を高くすれば良い。これにより、部品間の間隔、部品サイズ及び部品のリードピッチに基づいて各部品の検査の重要度を簡単且つ正確に設定できると共に、各部品の検査の重要度の設定を自動化することも可能である。   Further, the importance of inspection of each component may be set in consideration of at least the interval between components on the mounting board, the component size, and the lead pitch of the components. Here, the interval between components, the component size, and the component lead pitch may be obtained by using component mounting data used in a component mounter. For example, the smaller the interval between components, the higher the importance and the component size. The smaller the value, the higher the importance. The narrower the component lead pitch, the higher the importance. This makes it possible to easily and accurately set the importance of inspection of each part based on the interval between parts, the size of the part, and the lead pitch of the part, and it is also possible to automate the setting of the importance of inspection of each part. is there.

更に、請求項のように、検査エリアシーケンスを作成する際に、実装基板の4つの角部について、それぞれの角部周辺に配置した最初の検査エリアから時計回り方向に検査エリアを順番に配置する時計回り方向の検査エリアシーケンス作成処理と反時計回り方向に検査エリアを順番に配置する反時計回り方向の検査エリアシーケンス作成処理を行って、合計8通りの検査エリアシーケンスを作成し、これらの検査エリアシーケンスの中からエリア数とカメラ移動距離がより少ない検査エリアシーケンスを1つだけ採用するようにしても良い。このようにすれば、エリア数とカメラ移動距離が最小となる検査エリアシーケンスを採用することができる。 Further, as described in claim 3 , when the inspection area sequence is created, the inspection areas are sequentially arranged in the clockwise direction from the first inspection area arranged around each of the four corners of the mounting board. The inspection area sequence creation processing in the clockwise direction and the inspection area sequence creation processing in the counterclockwise direction in which the inspection areas are sequentially arranged in the counterclockwise direction are performed to create a total of eight inspection area sequences. Only one inspection area sequence having a smaller number of areas and a smaller camera moving distance may be adopted from the inspection area sequences. In this way, it is possible to adopt an inspection area sequence that minimizes the number of areas and the camera movement distance.

尚、請求項に係る発明は、請求項1に係る実装基板検査装置の発明と実質的に同一の技術思想をカテゴリーの異なる実装基板検査方法の発明として記載したものである。
The invention according to claim 4 describes the technical idea substantially the same as the invention of the mounting board inspection apparatus according to claim 1 as an invention of a mounting board inspection method of a different category.

図1は本発明の一実施例における実装基板検査装置の構成を概略的に示すブロック図である。FIG. 1 is a block diagram schematically showing the configuration of a mounting board inspection apparatus according to an embodiment of the present invention. 図2は実装基板上の全ての部品A〜Jを検査対象とする場合の検査エリアK1〜K3の配置例を示す図である。FIG. 2 is a diagram illustrating an arrangement example of the inspection areas K1 to K3 when all the components A to J on the mounting substrate are to be inspected. 図3は検査の重要度が最低の部品Jを除く部品A〜Iを検査対象とする場合の検査エリアK1,K2の配置例を示す図である。FIG. 3 is a diagram showing an arrangement example of the inspection areas K1 and K2 when the parts A to I except the part J having the lowest importance of inspection are to be inspected. 図4は検査エリアシーケンスの作成方法を説明する図である。FIG. 4 is a diagram for explaining a method of creating an inspection area sequence. 図5は反時計回り方向の検査エリアシーケンスを作成する具体例を説明する図である。FIG. 5 is a diagram illustrating a specific example of creating an inspection area sequence in the counterclockwise direction. 図6は検査エリアシーケンス作成プログラムの処理の流れを示すフローチャートである。FIG. 6 is a flowchart showing the flow of processing of the inspection area sequence creation program.

以下、本発明を実施するための形態を具体化した一実施例を説明する。
図1に示すように、実装基板検査装置は、実装基板の検査エリアを撮像するカメラ11と、このカメラ11をXY方向に移動させるXY移動装置12と、部品が実装された実装基板を搬送する基板搬送装置13と、これらの動作を制御する制御装置14等を備えた構成となっている。
Hereinafter, an embodiment embodying a mode for carrying out the present invention will be described.
As shown in FIG. 1, the mounting board inspection apparatus conveys a camera 11 that images the inspection area of the mounting board, an XY moving device 12 that moves the camera 11 in the XY directions, and a mounting board on which components are mounted. A substrate transport device 13 and a control device 14 for controlling these operations are provided.

この実装基板検査装置の制御装置14は、パーソナルコンピュータ等のコンピュータを主体として構成され、キーボード、マウス等の入力装置15と、液晶ディスプレイ、CRT等の表示装置16と、後述する図6の検査エリアシーケンス作成プログラム、作成した検査エリアシーケンス、予め専門のエンジニアが各部品の検査の重要度を設定したデータを格納した検査対象部品ライブラリ等を記憶する記憶装置17等が接続されている。   The control device 14 of this mounting board inspection apparatus is mainly composed of a computer such as a personal computer, and includes an input device 15 such as a keyboard and a mouse, a display device 16 such as a liquid crystal display and a CRT, and an inspection area shown in FIG. A storage device 17 for storing a sequence creation program, a created inspection area sequence, an inspection target component library storing data in which the degree of importance of inspection of each component is set in advance by a specialized engineer, and the like are connected.

制御装置14は、実装基板の検査対象領域に複数の検査エリアを設定し、これら複数の検査エリアを1つずつ順番にカメラ11で撮像して、その撮像画像を処理して当該検査エリア内の部品実装状態を検査する。   The control device 14 sets a plurality of inspection areas in the inspection target area of the mounting board, picks up the plurality of inspection areas one by one in order, processes the picked-up images, and processes the picked-up images in the inspection area. Inspect the component mounting status.

ところで、実装基板検査装置は、部品実装ラインの途中又は下流側に設置され、検査工程とその前後工程との間で実装基板1枚当たりの処理時間のバランスが取れていれば、ライン全体のタクトには影響がないが、実装基板1枚当たりの検査時間が前後工程の処理時間よりも長くなると、ライン全体のタクトが延びて生産能率が低下してしまう。   By the way, if the mounting board inspection device is installed in the middle or downstream of the component mounting line and the processing time per mounting board is balanced between the inspection process and the preceding and following processes, the tact of the entire line is achieved. However, if the inspection time per mounting board becomes longer than the processing time of the preceding and following processes, the tact of the entire line is extended and the production efficiency is lowered.

この対策として、検査するエリア数を削減して検査時間を短縮する必要があるが、検査するエリア数を削減する作業は、かなりの熟練度と経験が要求されるため、熟練度や経験が不足する作業者が行うと、間違いが発生しやすく、検査品質が低下してしまう。   As a countermeasure, it is necessary to reduce the inspection time by reducing the number of areas to be inspected, but the work to reduce the number of areas to be inspected requires considerable skill and experience. If a worker who does this, mistakes are likely to occur, and the inspection quality will deteriorate.

そこで、本実施例では、制御装置14によって図6の検査エリアシーケンス作成プログラムを実行することで、実装基板に実装する各部品の検査の重要度と目標タクトを設定し、設定した目標タクトに応じて検査の重要度の低い方の部品を検査対象から除外して、検査エリアの位置とエリア数と撮像順序を決める検査エリアシーケンスを、より少ないエリア数で実装基板上の全ての検査対象部品がいずれかの検査エリア内に収まるように作成する。   Therefore, in this embodiment, the control device 14 executes the inspection area sequence creation program shown in FIG. 6 to set the importance and target tact of inspection of each component mounted on the mounting board, and according to the set target tact. The inspection area sequence that determines the position of the inspection area, the number of areas, and the imaging order is excluded from the inspection target parts with the least important parts. Create to fit in one of the inspection areas.

この場合、検査エリアの位置は固定されておらず、実装基板上の部品の位置に応じて検査エリアの位置を移動させる。例えば、図2には、実装基板上の全ての部品A〜Jを検査対象とする場合の検査エリアK1〜K3の配置例を示しており、この例では、各検査エリアK1〜K3内の部品数を可能な限り平均化するように、実装基板上に3つの検査エリアK1〜K3が配置される。   In this case, the position of the inspection area is not fixed, and the position of the inspection area is moved according to the position of the component on the mounting board. For example, FIG. 2 shows an arrangement example of inspection areas K1 to K3 when all the components A to J on the mounting board are to be inspected. In this example, the components in the inspection areas K1 to K3 are shown. Three inspection areas K1 to K3 are arranged on the mounting substrate so as to average the number as much as possible.

一方、図3には、検査の重要度が最低の部品Jを除く部品A〜Iを検査対象とする場合の検査エリアK1,K2の配置例を示しており、この例では、2つの検査エリアK1,K2が配置される。図3の例では、検査の重要度が最低の部品Jを1つだけ検査対象から除外するだけで、検査エリアを1つ削減する効果が得られる。   On the other hand, FIG. 3 shows an arrangement example of the inspection areas K1 and K2 when the parts A to I except the part J having the lowest importance of inspection are to be inspected. In this example, two inspection areas are shown. K1 and K2 are arranged. In the example of FIG. 3, the effect of reducing one inspection area can be obtained by removing only one part J having the lowest importance of inspection from the inspection target.

次に、検査エリアの位置とエリア数と撮像順序を決める検査エリアシーケンスの作成方法を図4を用いて説明する。
検査エリアシーケンスを作成する際に、まず、実装基板のいずれか1つの角部に最初の検査エリアを検査対象部品がより多く含まれるように配置し、最初の検査エリアから時計回り方向に検査エリアを順番に配置する時計回り方向の検査エリアシーケンス作成処理と反時計回り方向に検査エリアを順番に配置する反時計回り方向の検査エリアシーケンス作成処理を行う。各検査エリアシーケンス作成処理では、先に配置した検査エリアから移動した位置に次の検査エリアを検査対象部品がより多く含まれるように配置するという処理を繰り返すことで、実装基板上の全ての検査対象部品がいずれかの検査エリア内に収まるように検査エリアシーケンスを作成する。
Next, a method of creating an inspection area sequence that determines the position of the inspection area, the number of areas, and the imaging order will be described with reference to FIG.
When creating an inspection area sequence, first, place the first inspection area at one of the corners of the mounting board so that more parts to be inspected are included, and then inspect clockwise from the first inspection area. The inspection area sequence creation process in the clockwise direction for arranging the inspection areas and the inspection area sequence creation process in the counterclockwise direction for arranging the inspection areas in the counterclockwise direction are performed. In each inspection area sequence creation process, all inspections on the mounting board are repeated by repeating the process of arranging the next inspection area so that more parts to be inspected are included at the position moved from the inspection area previously arranged. An inspection area sequence is created so that the target part fits in one of the inspection areas.

実装基板の4つの角部について、それぞれ時計回り方向の検査エリアシーケンス作成処理と反時計回り方向の検査エリアシーケンス作成処理を行って、合計8通りの検査エリアシーケンスを作成し、これらの検査エリアシーケンスの中からエリア数とカメラ移動距離がより少ない検査エリアシーケンスを1つだけ採用する。   For the four corners of the mounting board, the inspection area sequence creation process in the clockwise direction and the inspection area sequence creation process in the counterclockwise direction are respectively performed to create a total of eight inspection area sequences. Only one inspection area sequence with a smaller number of areas and a smaller camera moving distance is adopted.

ここで、図5を用いて、実装基板の左上の角部に最初の検査エリアを配置して、反時計回り方向の検査エリアシーケンスを作成する具体例を説明する。
図5の例では、実装基板の左上の角部に配置した最初の検査エリアから下方に移動した位置に2番目の検査エリアを配置する。この際、2番目の検査エリア内に収める候補となる部品のうち、Y座標が一番大きく、X座標が一番小さい部品Cを2番目の検査エリアの左側上端に収める。一般に、先の検査エリアから下方に移動した位置に次の検査エリアを配置する場合は、次の検査エリア内に収める候補となる部品のうち、Y座標が一番大きく、X座標が一番小さい部品を次の検査エリアの左側上端に収めるように配置する。
Here, a specific example in which the first inspection area is arranged at the upper left corner of the mounting substrate and the inspection area sequence in the counterclockwise direction is created will be described with reference to FIG.
In the example of FIG. 5, the second inspection area is arranged at a position moved downward from the first inspection area arranged at the upper left corner of the mounting board. At this time, the component C having the largest Y coordinate and the smallest X coordinate among the candidate components to be accommodated in the second inspection area is stored in the upper left end of the second inspection area. In general, when the next inspection area is arranged at a position moved downward from the previous inspection area, the Y coordinate is the largest and the X coordinate is the smallest among the candidate parts to be placed in the next inspection area. Arrange the parts in the upper left corner of the next inspection area.

2番目の検査エリアから右方向に移動した位置に3番目の検査エリアを配置する場合は、3番目の検査エリア内に収める候補となる部品のうち、Y座標が一番小さく、X座標が一番小さい部品Gを3番目の検査エリアの左側下端に収める。一般に、先の検査エリアから右方向に移動した位置に次の検査エリアを配置する場合は、次の検査エリアに収める候補となる部品のうち、Y座標が一番小さく、X座標が一番小さい部品を次の検査エリアの左側下端に収めるように配置する。   When the third inspection area is arranged at a position moved to the right from the second inspection area, the Y coordinate is the smallest and the X coordinate is one among the candidate parts to be stored in the third inspection area. The smallest part G is stored in the lower left end of the third inspection area. In general, when the next inspection area is arranged at a position moved rightward from the previous inspection area, the Y coordinate is the smallest and the X coordinate is the smallest among the candidate parts to be placed in the next inspection area. Arrange the parts in the lower left corner of the next inspection area.

3番目の検査エリアから上方に移動した位置に4番目の検査エリアを配置する場合は、3番目の検査エリア内に収める候補となる部品のうち、Y座標が一番小さく、X座標が一番大きい部品Iを4番目の検査エリアの右側下端に収める。一般に、先の検査エリアから上方に移動した位置に次の検査エリアを配置する場合は、次の検査エリア内に収める候補となる部品のうち、Y座標が一番小さく、X座標が一番大きい部品を次の検査エリアの右側下端に収めるように配置する。   When the fourth inspection area is arranged at a position moved upward from the third inspection area, the Y coordinate is the smallest and the X coordinate is the smallest among the parts that are candidates to be accommodated in the third inspection area. The large part I is stored at the lower right end of the fourth inspection area. In general, when the next inspection area is arranged at a position moved upward from the previous inspection area, the Y coordinate is the smallest and the X coordinate is the largest among the candidate parts to be placed in the next inspection area. Arrange the parts in the lower right corner of the next inspection area.

図5に図示されていないが、4番目の検査エリアから左方向に移動した位置に5番目の検査エリアを配置する場合は、Y座標が一番大きく、X座標が一番大きい部品を5番目の検査エリアの右側上端に収める。一般に、先の検査エリアから左方向に移動した位置に次の検査エリアを配置する場合は、次の検査エリア内に収める候補となる部品のうち、Y座標が一番大きく、X座標が一番大きい部品を次の検査エリアの右側上端に収めるように配置する。   Although not shown in FIG. 5, when the fifth inspection area is arranged at a position moved leftward from the fourth inspection area, the component having the largest Y coordinate and the largest X coordinate is the fifth. Fit in the upper right corner of the inspection area. In general, when the next inspection area is arranged at a position moved leftward from the previous inspection area, the Y coordinate is the largest and the X coordinate is the largest among the candidate parts to be placed in the next inspection area. Arrange large parts to fit in the upper right corner of the next inspection area.

いずれの検査エリアも、実装基板のエリアからはみ出さないように配置する。
尚、実装基板の右上の角部に最初の検査エリアを配置して、時計回り方向の検査エリアシーケンスを作成する場合は、上述した反時計回り方向の検査エリアシーケンスを作成する方法の説明において、「X座標が一番大きい」を「X座標が一番小さい」、「X座標が一番小さい」を「X座標が一番大きい」とそれぞれ読み替え、「右」を「左」、「左」を「右」とそれぞれ読み替えれば良い。
All inspection areas are arranged so as not to protrude from the area of the mounting substrate.
In addition, in the case of creating the inspection area sequence in the clockwise direction by arranging the first inspection area at the upper right corner of the mounting substrate, in the description of the method for creating the inspection area sequence in the counterclockwise direction described above, “X coordinate is the largest” is read as “X coordinate is the smallest”, “X coordinate is the smallest” and “X coordinate is the largest” respectively. “Right” is “Left” Should be read as “right” respectively.

以上説明した本実施例の検査エリアシーケンス作成処理は、制御装置14によって図6の検査エリアシーケンス作成プログラムに従って実行される。本プログラムは、特許請求の範囲でいう検査エリアシーケンス作成手段としての役割を果たす。   The inspection area sequence creation processing of the present embodiment described above is executed by the control device 14 according to the inspection area sequence creation program of FIG. This program serves as inspection area sequence creation means in the claims.

本プログラムでは、予め、専門のエンジニアが各部品の検査の重要度を設定して、各部品の検査の重要度のデータを格納した部品ライブラリを記憶装置17に保存しておく(ステップ101)。この際、少なくとも実装基板上の部品間の間隔、部品サイズ及び部品のリードピッチを考慮して各部品の検査の重要度を設定すれば良い。   In this program, a specialized engineer sets the importance of inspection of each part in advance, and stores a parts library storing data on the importance of inspection of each part in the storage device 17 (step 101). At this time, the importance of inspection of each component may be set in consideration of at least the interval between components on the mounting substrate, the component size, and the lead pitch of the component.

ここで、部品間の間隔、部品サイズ、部品のリードピッチは、部品実装機で用いる部品実装用データを用いれば良く、例えば、部品間の間隔が狭くなるほど、重要度を高くし、部品サイズが小さくなるほど、重要度を高くすれば良い。また、部品のリードピッチが狭いものほど、重要度を高くすれば良い。これにより、部品間の間隔、部品サイズ及び部品のリードピッチ等に基づいて各部品の検査の重要度を自動設定することも可能となる。尚、ステップ101の処理が特許請求の範囲でいう検査重要度設定手段としての役割を果たす。   Here, the interval between components, the component size, and the component lead pitch may be obtained by using component mounting data used in a component mounter. For example, the smaller the interval between components, the higher the importance and the component size. The smaller the value, the higher the importance. The narrower the component lead pitch, the higher the importance. Accordingly, it is possible to automatically set the importance of inspection of each part based on the interval between parts, the part size, the lead pitch of the part, and the like. Note that the processing in step 101 serves as inspection importance setting means in the claims.

この後、ステップ102で、前述した方法で、実装基板の4つの角部について、それぞれ時計回り方向の検査エリアシーケンス作成処理と反時計回り方向の検査エリアシーケンス作成処理を行って、合計8通りの検査エリアシーケンスを作成し、これらの検査エリアシーケンスの中からエリア数とカメラ移動距離がより少ない検査エリアシーケンスを1つだけ採用する。   Thereafter, in step 102, the inspection area sequence creation processing in the clockwise direction and the inspection area sequence creation processing in the counterclockwise direction are respectively performed on the four corners of the mounting board by the above-described method. An inspection area sequence is created, and only one inspection area sequence with a smaller number of areas and a smaller camera moving distance is adopted from these inspection area sequences.

この後、ステップ103に進み、目標タクトが設定されているか否かを判定し、目標タクトが設定されていなければ、検査エリアシーケンスを変更する必要はないと判断して、本プログラムを終了する。ここで、目標タクトは、部品実装ラインの各工程で用いられる各種データや生産ジョブに基づいて自動的に設定しても良いし、作業者がライン全体のタクトを考慮して設定しても良い。この機能が特許請求の範囲でいう目標タクト設定手段に相当する。   Thereafter, the process proceeds to step 103, where it is determined whether the target tact is set. If the target tact is not set, it is determined that there is no need to change the inspection area sequence, and this program is terminated. Here, the target tact may be set automatically based on various data and production jobs used in each process of the component mounting line, or may be set by the operator in consideration of the tact of the entire line. . This function corresponds to the target tact setting means in the claims.

一方、上記ステップ103で、目標タクトが設定されていると判定されれば、ステップ104に進み、上記ステップ102で最終的に採用された検査エリアシーケンスを用いて検査を行った場合のタクトが目標タクト内であるか否かを判定し、目標タクト内であれば、検査エリアシーケンスを変更する必要はないため、本プログラムを終了する。   On the other hand, if it is determined in step 103 that the target tact is set, the process proceeds to step 104, and the tact when the inspection is performed using the inspection area sequence finally adopted in step 102 is the target. It is determined whether or not it is within the tact, and if it is within the target tact, there is no need to change the inspection area sequence, so this program is terminated.

これに対し、上記ステップ104で、目標タクト内ではないと判定されれば、ステップ105に進み、検査の重要度の低い方の所定数の部品を検査対象から除外して、ステップ102に戻り、再度、実装基板の4つの角部について、それぞれ時計回り方向の検査エリアシーケンス作成処理と反時計回り方向の検査エリアシーケンス作成処理を行って、合計8通りの検査エリアシーケンスを作成し、これらの検査エリアシーケンスの中からエリア数とカメラ移動距離がより少ない検査エリアシーケンスを1つだけ採用する。   On the other hand, if it is determined in step 104 that it is not within the target tact, the process proceeds to step 105, a predetermined number of parts having lower importance of inspection are excluded from inspection targets, and the process returns to step 102. Again, for each of the four corners of the mounting board, the inspection area sequence creation process in the clockwise direction and the inspection area sequence creation process in the counterclockwise direction are respectively performed to create a total of eight inspection area sequences. Only one inspection area sequence in which the number of areas and the camera movement distance are smaller is adopted from the area sequences.

その後、ステップ104で、目標タクト内であるか否かを判定し、目標タクト内でなければ、ステップ105で、再度、検査の重要度の低い方の所定数の部品を検査対象から除外して、ステップ102で、再度、実装基板の4つの角部について、それぞれ時計回り方向の検査エリアシーケンス作成処理と反時計回り方向の検査エリアシーケンス作成処理を行って、合計8通りの検査エリアシーケンスを作成し、これらの検査エリアシーケンスの中からエリア数とカメラ移動距離がより少ない検査エリアシーケンスを1つだけ採用する。   Thereafter, in step 104, it is determined whether or not it is within the target tact. If it is not within the target tact, a predetermined number of parts having a lower importance of inspection are again excluded from inspection targets in step 105. In step 102, the inspection area sequence creation process in the clockwise direction and the inspection area sequence creation process in the counterclockwise direction are respectively performed on the four corners of the mounting board again to create a total of eight inspection area sequences. Of these inspection area sequences, only one inspection area sequence having a smaller number of areas and a smaller camera moving distance is employed.

以上のようにして、目標タクト内となるまで、検査の重要度の低い方の所定数の部品を検査対象から除外して検査エリアシーケンスを作成する処理を繰り返すことで、目標タクトに応じて検査の重要度の低い方の部品を検査対象から除外した検査エリアシーケンスを作成する。   As described above, the process according to the target tact is repeated by repeating the process of creating the inspection area sequence by excluding the predetermined number of parts having the lower importance of inspection from the inspection target until the target tact is reached. The inspection area sequence is created by excluding the component with the lower importance from the inspection target.

以上説明した本実施例によれば、各部品の検査の重要度を設定し、目標タクトに応じて検査の重要度の低い方の部品を検査対象から除外して、検査エリアの位置とエリア数と撮像順序を決める検査エリアシーケンスを、より少ないエリア数で実装基板上の全ての検査対象部品がいずれかの検査エリア内に収まるように作成するため、目標タクトに応じて検査するエリア数を減らして検査時間を短縮することが可能となり、目標タクトを実現できる。しかも、検査の重要度の低い方の部品のみを検査対象から除外して、検査の重要度の高い方の部品を全て検査できるため、検査品質も確保することができる。   According to the present embodiment described above, the inspection importance of each part is set, the part with the lower importance of inspection is excluded from the inspection object according to the target tact, and the position and the number of areas of the inspection area are excluded. Since the inspection area sequence that determines the imaging order is created so that all parts to be inspected on the mounting board fit within one of the inspection areas with a smaller number of areas, the number of areas to be inspected is reduced according to the target tact. The inspection time can be shortened and the target tact can be realized. In addition, since only the parts with the lower importance of the inspection are excluded from the inspection target and all the parts with the higher importance of the inspection can be inspected, the inspection quality can be ensured.

要するに、本実施例では、部品単位で検査対象から除外するため、検査エリア単位で検査対象から除外する従来技術と比較して、同じ検査時間(同じエリア数)でも検査対象部品の数を多くすることができ、検査時間の短縮と検査品質の確保とを両立させることができる。   In short, in this embodiment, since the parts are excluded from the inspection target in units of parts, the number of parts to be inspected is increased even in the same inspection time (the same number of areas) as compared with the prior art in which the inspection areas are excluded from the inspection targets. Therefore, both shortening of inspection time and ensuring of inspection quality can be achieved.

しかも、予め専門のエンジニアが各部品の検査の重要度を設定したデータを検査対象部品ライブラリに格納しておけば、検査エリアシーケンスの作成時に作業者が各部品の検査の重要度を設定する必要がなく、作業者の設定ミスによる検査品質の低下を確実に防止できる。   In addition, if the data that sets the importance of inspection of each part by a specialist engineer is stored in the inspection target part library in advance, the operator needs to set the importance of inspection of each part when creating the inspection area sequence. Therefore, it is possible to reliably prevent the deterioration of inspection quality due to an operator's setting mistake.

但し、本発明は、検査エリアシーケンスの作成時に作業者が各部品の検査の重要度を設定するようにしても良く、この場合でも、検査エリア単位で検査対象から除外する従来の作業と比較すれば、部品単位で検査の重要度を設定する作業は簡単であるため、熟練度や経験が少ない作業者でも十分に作業可能であり、作業者の設定ミスを大幅に低減することができる。   However, according to the present invention, when creating an inspection area sequence, an operator may set the importance of inspection of each part, and even in this case, it is compared with the conventional work that is excluded from inspection targets in units of inspection areas. For example, since it is easy to set the inspection importance level for each part, even a worker with little skill or experience can work sufficiently, and the setting mistake of the worker can be greatly reduced.

11…カメラ、12…XY移動装置、13…基板搬送装置、14…制御装置(検査エリアシーケンス作成手段,検査重要度設定手段,目標タクト設定手段)、15…入力装置、16…表示装置、17…記憶装置   DESCRIPTION OF SYMBOLS 11 ... Camera, 12 ... XY movement apparatus, 13 ... Board | substrate conveyance apparatus, 14 ... Control apparatus (inspection area sequence creation means, inspection importance setting means, target tact setting means), 15 ... Input device, 16 ... Display apparatus, 17 …Storage device

Claims (4)

部品が実装された実装基板の検査対象領域に複数の検査エリアを設定し、前記複数の検査エリアを1つずつ順番にカメラで撮像して当該検査エリア内の部品実装状態を検査する実装基板検査装置において、
前記実装基板に実装する各部品の検査の重要度を設定する検査重要度設定手段と、
目標タクトを設定する目標タクト設定手段と、
前記検査エリアの位置とエリア数と撮像順序を決める検査エリアシーケンスを作成する際に前記目標タクトに応じて検査の重要度の低い方の部品を検査対象から除外して前記検査エリアシーケンスをより少ないエリア数で前記実装基板上の全ての検査対象部品がいずれかの検査エリア内に収まるように作成する検査エリアシーケンス作成手段とを備え、
前記検査エリアシーケンス作成手段は、前記実装基板のいずれか1つの角部周辺に最初の検査エリアを検査対象部品がより多く含まれるように配置し、以後、先に配置した検査エリアから移動した位置に次の検査エリアを検査対象部品がより多く含まれるように配置するという処理を繰り返すことで、前記実装基板上の全ての検査対象部品がいずれかの検査エリア内に収まるように検査エリアシーケンスを作成することを特徴とする実装基板検査装置。
Mounting board inspection in which a plurality of inspection areas are set in the inspection target area of the mounting board on which the component is mounted, and the plurality of inspection areas are sequentially imaged by a camera to inspect the component mounting state in the inspection area. In the device
Inspection importance setting means for setting the importance of inspection of each component mounted on the mounting board;
Target tact setting means for setting the target tact;
When creating an inspection area sequence that determines the position, the number of areas, and the imaging order of the inspection area, the inspection area sequence is reduced by excluding the parts with the lower importance of the inspection from the inspection target according to the target tact. An inspection area sequence creating means for creating all the inspection target parts on the mounting board so as to fit in any inspection area in the number of areas ,
The inspection area sequence creation means arranges the first inspection area around any one corner of the mounting substrate so as to include more parts to be inspected, and then moves from the inspection area previously arranged. By repeating the process of arranging the next inspection area so that more parts to be inspected are included, the inspection area sequence is set so that all the parts to be inspected on the mounting board are within one of the inspection areas. A mounting board inspection apparatus characterized by being produced .
前記各部品の検査の重要度は、少なくとも前記実装基板上の部品間の間隔、部品サイズ及び部品のリードピッチを考慮して設定されることを特徴とする請求項1に記載の実装基板検査装置。   The mounting board inspection apparatus according to claim 1, wherein the importance of the inspection of each component is set in consideration of at least an interval between components on the mounting substrate, a component size, and a lead pitch of the component. . 前記検査エリアシーケンス作成手段は、前記実装基板の4つの角部について、それぞれの角部周辺に配置した最初の検査エリアから時計回り方向に検査エリアを順番に配置する時計回り方向の検査エリアシーケンス作成処理と反時計回り方向に検査エリアを順番に配置する反時計回り方向の検査エリアシーケンス作成処理を行って、合計8通りの検査エリアシーケンスを作成し、これらの検査エリアシーケンスの中からエリア数とカメラ移動距離がより少ない検査エリアシーケンスを1つだけ採用することを特徴とする請求項1又は2に記載の実装基板検査装置。 The inspection area sequence creation means creates a clockwise inspection area sequence in which the inspection areas are sequentially arranged in the clockwise direction from the first inspection area arranged around each corner of the four corners of the mounting substrate. The inspection area sequence creation processing in the counterclockwise direction in which the inspection areas are sequentially arranged in the counterclockwise direction is performed to create a total of eight inspection area sequences. From these inspection area sequences, the number of areas mounting board inspection apparatus according to claim 1 or 2 camera movement distance is equal to or to employ only one fewer test area sequence. 部品が実装された実装基板の検査対象領域に複数の検査エリアを設定し、前記複数の検査エリアを1つずつ順番にカメラで撮像して当該検査エリア内の部品実装状態を検査する実装基板検査方法において、
前記実装基板に実装する各部品の検査の重要度と目標タクトを設定し、
前記目標タクトに応じて検査の重要度の低い方の部品を検査対象から除外して、前記検査エリアの位置とエリア数と撮像順序を決める検査エリアシーケンスを、より少ないエリア数で前記実装基板上の全ての検査対象部品がいずれかの検査エリア内に収まるように作成する実装基板検査方法であって、
前記実装基板のいずれか1つの角部周辺に最初の検査エリアを検査対象部品がより多く含まれるように配置し、以後、先に配置した検査エリアから移動した位置に次の検査エリアを検査対象部品がより多く含まれるように配置するという処理を繰り返すことで、前記実装基板上の全ての検査対象部品がいずれかの検査エリア内に収まるように検査エリアシーケンスを作成することを特徴とする実装基板検査方法。
Mounting board inspection in which a plurality of inspection areas are set in the inspection target area of the mounting board on which the component is mounted, and the plurality of inspection areas are sequentially imaged by a camera to inspect the component mounting state in the inspection area. In the method
Set the importance and target tact of inspection of each component mounted on the mounting board,
According to the target tact, an inspection area sequence that determines the position, the number of areas, and the imaging order of the inspection area by excluding the part having the lower importance of the inspection from the inspection target on the mounting board. A mounting board inspection method for creating all inspection target parts so as to fit within any inspection area ,
The first inspection area is arranged around any one corner of the mounting substrate so as to include more parts to be inspected, and then the next inspection area is inspected at a position moved from the inspection area previously arranged. Mounting is characterized in that an inspection area sequence is created so that all inspection target parts on the mounting board fit within one of the inspection areas by repeating the process of arranging so as to include more parts. Board inspection method.
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