JP5554750B2 - Test management device - Google Patents

Description

  The present invention relates to a test management apparatus that manages tests to be performed on an object to be tested.

  Test automation is progressing in products in various fields (for example, optical modules, microcontrollers, system memories, etc.). Generally, in the automatic test, test items set in advance and test items are sequentially executed in the order (for example, refer to Patent Documents 1 to 3). Hereinafter, in this specification, it is assumed that the product test consists of a plurality of test items.

Japanese Patent Laid-Open No. 2001-124811 JP 2008-234232 A Japanese Patent Laid-Open No. 5-157592

  Of the plurality of test items, when the measurement value of the first test item falls within a predetermined range, there may be a relationship that the measurement value of the second test item always falls within the standard. In this case, even if the measurement of the second test item is omitted, the quality of the test evaluation is not affected at all. Even when the measurement value of the first test item falls within a predetermined range, if the measurement value is a value near the boundary of the range, it may be necessary to collect the measurement value of the third test item.

  In this way, the required test items are inherently different even for the same type of product due to variations in the characteristics of individual products. What is necessary and what is not necessary can be determined only by actually measuring and evaluating the characteristics. Therefore, in the conventional automatic test apparatus, it is a principle that all test items are performed so that no omission occurs in all products.

  However, performing all the test items for all products means that unnecessary tests are performed as described above. This means that time and cost are wasted.

  The present invention has been made in view of such circumstances, and an object thereof is to provide a technique capable of shortening the test time without reducing the reliability of the test.

  In order to solve the above-described problems, a test management apparatus according to an aspect of the present invention includes a test list holding unit that holds a test list that defines a plurality of test items to be performed on an object to be tested and their order, and each test. The result values of the items are ranked, and a correspondence table holding unit that holds a table in which each rank is associated with a test item to be omitted or added, and a test result value of a test item that is performed according to the test list is acquired. With reference to the test result value acquisition unit and the correspondence table holding unit, a rank determination unit that ranks the test result values acquired by the test result value acquisition unit, and a test list according to the rank determined by the rank determination unit A test list management unit that adaptively changes the contents of the test list.

  According to this aspect, the test time can be shortened without reducing the reliability of the test by adaptively changing the contents of the test list according to the test result value.

  The rank may be classified into a non-defective product rank and a defective product rank. The good product rank may be classified into a first good product rank and a second good product rank. The first non-defective product rank may be a rank that can designate the omission of the test item, and the second non-defective product rank may be a rank that can designate the addition of the test item.

  The good product rank may be classified into a first good product rank, a second good product rank, and a third good product rank. The first non-defective product rank is a rank in which omission of the test item can be specified, the second non-defective product rank is a rank in which the test item cannot be changed, and the third non-defective product rank can be specified to add a test item. It may be a rank.

  The plurality of test items included in the test list include a temperature characteristic test, and the test result value of the test item preceding the temperature characteristic test is classified into the first non-defective product rank in which the omission of the temperature characteristic test is specified. In this case, the test list management unit may omit the temperature characteristic test included in the test list. If the temperature characteristic test can be omitted, the test time can be greatly shortened.

  According to the present invention, the test time can be shortened without reducing the reliability of the test.

It is a figure which shows the structure of the test management apparatus which concerns on embodiment of this invention. It is a flowchart which shows operation | movement of the test management apparatus which concerns on embodiment of this invention. It is a figure which shows an example of ranking of a measured value. It is a figure which shows an example of rank definition data. It is a figure which shows the example of a change of the test item in a test list | wrist. It is a figure which shows the relationship between OSNR and BER.

  FIG. 1 is a diagram showing a configuration of a test management apparatus 100 according to an embodiment of the present invention. The test management apparatus 100 can be constructed by, for example, a PC or a dedicated machine. The test management apparatus 100 may be configured integrally with a test facility that actually performs a test, or may be installed at a remote position. In addition, the test management apparatus 100 and the test facility are connected by a wired or wireless network, and may be configured to exchange information electronically or through a tester (hereinafter referred to as a user). It may be a configuration. In the latter case, the user may input the test result value from the operation unit, or may be input by mounting the recording medium on which the test result value is written in the test management apparatus 100.

  The test management apparatus 100 includes a holding unit 10, a processing unit 20, and a user interface 30. The holding unit 10 includes a test item holding unit 11, a test list holding unit 12, a correspondence table holding unit 13, and a test result holding unit 14.

  The processing unit 20 includes a test item designation unit 21, a test result value acquisition unit 22, a rank determination unit 23, a test list management unit 24, and a non-defective product determination unit 25. The configuration of the processing unit 20 is realized in terms of software by a program loaded in a memory or the like, but here, functional blocks realized by their cooperation are depicted. Accordingly, those skilled in the art will understand that these functional blocks can be realized in various forms by hardware only, software only, or a combination thereof.

  The test item holding unit 11 holds various test items for various objects to be tested that are managed by the test management apparatus 100. The test list holding unit 12 holds a test list that defines a plurality of test items to be performed on an object to be tested and their order. This test list is generated in advance by a designer or a user from various test items held in the test item holding unit 11 according to the type of the test object and the type of test. For example, the user can generate a test list of a shipping test for a certain test object by operating the operation unit of the user interface 30. More specifically, the test items to be carried out in this test and their order can be determined and listed.

  The correspondence table holding unit 13 ranks the result values of each test item, and associates each rank with a test item to be omitted or added (hereinafter, data constructed in this table is referred to as rank definition data). Hold. The relationship between the result value of each test item and the rank is determined in advance based on the standard and the required specification. A detailed description of the rank will be given later. The test result holding unit 14 stores a result value of a test performed on the test object.

  The test item designating unit 21 designates the test item to be performed next to the test facility or the user based on the test list of the test object. The test result value acquisition unit 22 acquires the test result value of the test item performed according to the test list from the test facility or the user. The rank determination unit 23 refers to the correspondence table holding unit 13 and ranks the test result values acquired by the test result value acquisition unit 22.

  Hereinafter, a configuration example of the rank will be described. First, a first configuration example classified into three ranks will be described. The rank is classified into two categories, a good product rank and a defective product rank. In the first configuration example, the non-defective product rank is classified into two categories, a first good product rank and a second good product rank. Here, the first non-defective product rank is a rank in which omission of the test item can be designated, and the second non-defective product rank is a rank in which addition of the test item can be designated.

  Next, a second configuration example classified into four ranks will be described. In the second configuration example, the non-defective product rank is classified into three categories: a first good product rank, a second good product rank, and a third good product rank. Here, the first non-defective product rank is a rank in which omission of the test item can be specified, the second non-defective product rank is a rank in which the test item cannot be changed, and the third non-defective product rank can specify addition of the test item. Rank.

  The test list management unit 24 adaptively changes the contents of the test list or adaptively rearranges the test items in the test list according to the rank determined by the rank determination unit 23. More specifically, the specified test item in the test list is deleted, the test item specified in the test list is added, or the content is maintained without changing the test list. When adding a test item, the rank determination unit 23 also specifies the addition position (that is, the execution order). The non-defective product determination unit 25 determines that the test target object that passes all the test items included in the test list is a non-defective product, and determines that the test target object that fails to pass any of the test items is a defective product.

  FIG. 2 is a flowchart showing the operation of the test management apparatus 100 according to the embodiment of the present invention. The user interface 30 receives a product type to be tested from the user (S10). When there are a plurality of test types for the same product, the types are also accepted.

  The test item designating unit 21 specifies a test list corresponding to the received product type in the test list holding unit 12, reads the test items included in the test list from the test item holding unit 11, and generates an initial test list (S11). The test item designation unit 21 designates a test item to be performed next (S12), and instructs the test facility or the user to perform the test item (S13). At the start of the test, the first test item to be performed in the test list becomes the next test item to be performed.

  The test result value acquisition unit 22 acquires the test result value (hereinafter referred to as a measurement value) from the test facility or the user who performed the specified test item, and stores it in the test result holding unit 14 (S14). When a test end notification is acquired from the test facility or the user (S15), the rank determination unit 23 and the test list management unit 24 start a test item change confirmation process in the test list (S16).

  The rank determination unit 23 and the test list management unit 24 obtain rank definition data from the correspondence table holding unit 13 (S17). The rank determination unit 23 ranks the measurement values acquired by the test result value acquisition unit 22 (S18). The test list management unit 24 refers to the ranks of the measurement values classified by the rank determination unit 23 and the rank definition data, and determines whether or not test items are added or deleted (S19).

  When there is an addition or deletion of a test item (Y in S20), the test list management unit 24 reflects the addition or deletion in the test list (S21). That is, the contents of the test list are changed. If there is no addition or deletion of test items in step S20 (N in S20), the process in step S21 is skipped.

  The test item designating unit 21 determines whether all the test items in the test list have been completed (S22). When all the test items have not been completed (N in S22), the process proceeds to step S12, and the processes from step S13 to step S21 are executed. When all the test items are finished (Y in S22), the designated test is finished.

  Hereinafter, a processing example of the test management apparatus 100 according to the embodiment of the present invention will be described with reference to FIGS. FIG. 3 is a diagram illustrating an example of ranking of measured values. As shown in FIG. 3, in the processing example, the measurement values are classified into four ranks. More specifically, it is classified into S rank, A rank, B rank and C rank. Of these, S rank, A rank and B rank are non-defective products. C rank is a defective product. As shown in FIG. 3, the S rank range is set in the vicinity of the ideal value in the non-defective range. The S rank is a rank in which cancellation of subsequent test items can be designated in the test list.

  The A rank is set outside the S rank within the non-defective product range, but is set to a range having a certain margin with the defective product range. A rank is a rank which cannot change the test item in a test list. The B rank is set outside the A rank within the non-defective product range and is set to a range in contact with the defective product range. The rank B is a rank that can specify the addition of a test item in the test list. The C rank is set to a defective product range outside the good product range. The C rank is a rank in which the test items in the test list cannot be changed.

  FIG. 4 is a diagram illustrating an example of rank definition data. The rank definition data is constructed in the test list holding unit 12. The rank S, rank A and rank B in the rank definition data correspond to the rank S, rank A and rank B shown in FIG. In the rank definition data, test items 1 to 8 are defined, and a numerical range of each rank is defined for each test item. As shown in FIG. 3, since the numerical ranges of the ranks do not overlap, the measured values of the test items are assigned to any rank.

  The S rank further includes deleted items, and the B rank further includes additional items. In the rank definition data, it is defined that the test item 5 is deleted when the measured value of the test item 2 falls within the numerical range of the S rank. Similarly, it is defined that the test items 7 and 8 are deleted when the measured values of the test items 4 and 6 are in the numerical range of the S rank, respectively. On the contrary, when the measured value of the test item 1 falls within the numerical range of the B rank, the test item 3 is defined to be added.

  FIG. 5 is a diagram showing a transition example of test items in the test list based on FIGS. 3 and 4. In the test list in the pre-start state, seven items of test items 1, 2, and 4-8 are designated. That is, the test item 3 is not included in the scheduled item (see the first line). First, test item 1 is executed, and the measured value is included in the numerical range of B rank. Referring to FIG. 4, when the measurement value of test item 1 is B rank, test item 3 is added (see the second line). Next, test item 2 is executed, and the measured value is included in the numerical range of the S rank. Referring to FIG. 4, when the measured value of test item 2 is S rank, test item 5 is deleted (see the third line).

  Next, test item 3 is executed, and the measured value is included in the numerical range of the A rank. In the case of A rank, the test item does not change (see the fourth line). Next, test item 4 is executed, and the measured value is included in the numerical range of the S rank. Referring to FIG. 4, when the measurement value of test item 4 is S rank, test item 7 is deleted (see the fifth line). Next, test item 6 is executed. Test item 5 has already been deleted because the measurement value of test item 2 is included in the numerical range of the S rank. The measured value of test item 6 is included in the numerical range of S rank. Referring to FIG. 4, when the measurement value of the test item 6 is S rank, the test item 8 is deleted (see the sixth line). Since test items 7 and 8 have already been deleted, the entire test ends at test item 6. As an initial state, a test of 7 items was scheduled, but in reality, the test was completed with 5 items.

  Hereinafter, application examples of the test management apparatus 100 according to the embodiment of the present invention will be described. When the object to be tested has a temperature characteristic such as an optical module or a semiconductor module, the test item in the test list includes a temperature characteristic test. The temperature characteristic test is generally performed in three states of normal temperature, high temperature, and low temperature, and there is a problem that it takes time to obtain a measurement value. In addition, in order to test a large number of objects to be tested at the same time, there is a problem that the number of thermostats must be increased. As described above, the temperature characteristic test is a bottleneck of the entire test. Therefore, reducing the number of temperature characteristic tests as much as possible is effective in shortening the test time.

  Hereinafter, a test of a light receiving side optical module (hereinafter referred to as an optical receiver) will be described as an example. Hereinafter, in order to simplify the description, consider an example in which a signal passing test → a BER (Bit Error Rate) test (normal) → a BER test (OSNR: Optical Signal-to-Noise Ratio) → an alarm test is sequentially executed. In practice, more types of tests are generally performed.

  The signal passing test is a test in which an optical fiber and a light source are connected to an optical receiver and an optical receiver receives an optical signal. The BER test (normal) is a test for detecting a bit error rate when optical power is input to an optical receiver. The BER test (OSNR) is a test for detecting a bit error rate when an optical signal on which noise is superimposed is input. The alarm test is a test for inspecting whether or not an alarm is generated when an optical signal is cut off.

  Here, consider a case where the BER test (OSNR) is tested at three temperatures of normal temperature, high temperature, and low temperature. If the test time is ignored, it is desirable to test in all three states. However, a method for shortening the test time by eliminating unnecessary tests will be considered below.

  FIG. 6 is a diagram showing the relationship between OSNR and BER. An S rank region Rs (region between the solid line and the dotted line) is set around the ideal characteristic Li (solid line) of OSNR. B rank area Rb (area between the alternate long and short dash line) is set outside the S rank area Rs. The outer extension of the B rank region Rb indicates a boundary allowed by the standard or the required specification at normal temperature.

  Basically, the BER of the optical receiver increases as the temperature rises. This is because many electronic components used in the optical receiver have a positive temperature characteristic. If a circuit element having a negative temperature characteristic is not used, the BER test (OSNR) is performed in a high temperature state, and if it is a non-defective product, the tests in a normal temperature state and a low temperature state can be omitted.

  Moreover, you may perform a BER test (OSNR) initially at normal temperature. In this case, it is possible to test without using a thermostat. Here, when the measured value of the BER test (OSNR) in the normal temperature state is within the S rank region Rs, a case is considered in which it is guaranteed in advance that the product is good in both the high temperature state and the low temperature state. In this case, when the measured value of the BER test (OSNR) in the normal temperature state is within the S rank region Rs, the test in the high temperature state and the low temperature state can be omitted.

  If the measured value of the BER test (OSNR) in the normal temperature state does not fit in the S rank region Rs, but it falls in the B rank region Rb, it is necessary to execute the test in the high temperature state and the low temperature state. If the BER test (OSNR) is performed in a high temperature state and the product is a non-defective product, the test in the low temperature state may be omitted.

  This method may be applied to the BER test (normal) and alarm test of the optical receiver, or to the extinction ratio test, cross-point test, pulse mask test, alarm test, etc. of the optical module on the transmission side. Good. Since these tests are known tests, a detailed description thereof is omitted.

  As described above, according to the present embodiment, the characteristics of individual products are measured and evaluated during the test, and the test items are dynamically changed to match the characteristics of the individual products. Optimal testing can be performed. More specifically, by evaluating and classifying the measured values of individual products, the differences in the characteristics of individual products are judged, and the optimum test items that are essential or necessary for test evaluation are found. Run the test while automatically changing the items. Thereby, the test time can be shortened without reducing the reliability of the test.

  Conventionally, in order to change test items, test conditions, and standards during a test, a method in which a user operates a terminal device in an interactive manner has been common. On the other hand, in the present embodiment, it is sufficient for the user to set them before the test, and they are adaptively changed fully automatically during the test. Therefore, the occurrence of human error is suppressed and the test time is shortened.

  In addition, the test time can be greatly shortened by adopting an algorithm that changes the test items so as to skip the temperature characteristic test as much as possible.

  The present invention has been described based on the embodiments. This embodiment is an exemplification, and it will be understood by those skilled in the art that various modifications can be made to combinations of the respective constituent elements and processing processes, and such modifications are also within the scope of the present invention. is there.

  DESCRIPTION OF SYMBOLS 10 Holding part, 11 Test item holding part, 12 Test list holding part, 13 Corresponding table holding part, 14 Test result holding part, 20 Processing part, 21 Test item designation part, 22 Test result value acquisition part, 23 Rank determination part, 24 test list management unit, 25 non-defective product determination unit, 30 user interface, 100 test management device.

Claims (2)

A test list holding unit that holds a test list that defines a plurality of test items to be performed on the object to be tested and their order;
A result table for each test item, and a correspondence table holding unit for holding a table in which each rank is associated with a test item to be omitted or added;
A test result value acquisition unit for acquiring a test result value of a test item performed in accordance with the test list;
With reference to the correspondence table holding unit, a rank determination unit that ranks the test result values acquired by the test result value acquisition unit;
A test list management unit that adaptively changes the content of the test list according to the rank determined by the rank determination unit;
With
The rank is classified into a non-defective product rank and a defective product rank,
The good product rank is classified into a first good product rank and a second good product rank,
The first non-defective product rank is a rank that can specify omission of a test item,
The second non-defective product rank is a rank capable of designating addition of test items,
The plurality of test items included in the test list includes a temperature characteristic test,
When the test result value of the test item preceding the temperature characteristic test is classified into the first non-defective product rank in which omission of the temperature characteristic test is specified, the test list management unit includes the test list included in the test list A test management device characterized by omitting the temperature characteristic test . A test list holding unit that holds a test list that defines a plurality of test items to be performed on the object to be tested and their order;
A result table for each test item, and a correspondence table holding unit for holding a table in which each rank is associated with a test item to be omitted or added;
A test result value acquisition unit for acquiring a test result value of a test item performed in accordance with the test list;
With reference to the correspondence table holding unit, a rank determination unit that ranks the test result values acquired by the test result value acquisition unit;
A test list management unit that adaptively changes the content of the test list according to the rank determined by the rank determination unit;
With
The rank is classified into a non-defective product rank and a defective product rank,
The good product rank is classified into a first good product rank, a second good product rank, and a third good product rank,
The first non-defective product rank is a rank that can specify omission of a test item,
The second non-defective product rank is a rank in which the test item cannot be changed,
The third non-defective product rank is a rank capable of designating addition of test items,
The plurality of test items included in the test list includes a temperature characteristic test,
When the test result value of the test item preceding the temperature characteristic test is classified into the first non-defective product rank in which omission of the temperature characteristic test is specified, the test list management unit includes the test list included in the test list A test management device characterized by omitting the temperature characteristic test .

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