JP5511800B2 - 閉じ込め場の磁石システム及びその方法 - Google Patents
閉じ込め場の磁石システム及びその方法 Download PDFInfo
- Publication number
- JP5511800B2 JP5511800B2 JP2011511826A JP2011511826A JP5511800B2 JP 5511800 B2 JP5511800 B2 JP 5511800B2 JP 2011511826 A JP2011511826 A JP 2011511826A JP 2011511826 A JP2011511826 A JP 2011511826A JP 5511800 B2 JP5511800 B2 JP 5511800B2
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- JP
- Japan
- Prior art keywords
- field
- magnetic
- boundary
- pole faces
- pole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title claims description 47
- 230000003068 static effect Effects 0.000 claims description 57
- 238000004804 winding Methods 0.000 claims description 12
- 238000012360 testing method Methods 0.000 claims description 10
- 239000000696 magnetic material Substances 0.000 claims description 7
- 239000004020 conductor Substances 0.000 claims description 5
- 230000035699 permeability Effects 0.000 claims description 5
- 230000008569 process Effects 0.000 claims description 2
- 239000007787 solid Substances 0.000 claims description 2
- 230000005686 electrostatic field Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 21
- 238000013461 design Methods 0.000 description 18
- 230000006870 function Effects 0.000 description 8
- 230000008859 change Effects 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 230000004913 activation Effects 0.000 description 3
- 230000002411 adverse Effects 0.000 description 3
- 238000013459 approach Methods 0.000 description 3
- 238000005452 bending Methods 0.000 description 3
- 230000004907 flux Effects 0.000 description 2
- 230000005415 magnetization Effects 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000008901 benefit Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000001627 detrimental effect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
- G01R33/38—Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field
- G01R33/383—Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field using permanent magnets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F7/00—Magnets
- H01F7/06—Electromagnets; Actuators including electromagnets
- H01F7/20—Electromagnets; Actuators including electromagnets without armatures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F7/00—Magnets
- H01F7/02—Permanent magnets [PM]
- H01F7/0273—Magnetic circuits with PM for magnetic field generation
- H01F7/0278—Magnetic circuits with PM for magnetic field generation for generating uniform fields, focusing, deflecting electrically charged particles
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Magnetic Resonance Imaging Apparatus (AREA)
- Measuring Magnetic Variables (AREA)
- Linear Motors (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/128,474 | 2008-05-28 | ||
| US12/128,474 US8179220B2 (en) | 2008-05-28 | 2008-05-28 | Confined field magnet system and method |
| PCT/US2009/045507 WO2009146378A1 (en) | 2008-05-28 | 2009-05-28 | Confined field magnet system and method |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011522424A JP2011522424A (ja) | 2011-07-28 |
| JP2011522424A5 JP2011522424A5 (https=) | 2012-04-26 |
| JP5511800B2 true JP5511800B2 (ja) | 2014-06-04 |
Family
ID=40886109
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011511826A Expired - Fee Related JP5511800B2 (ja) | 2008-05-28 | 2009-05-28 | 閉じ込め場の磁石システム及びその方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US8179220B2 (https=) |
| EP (2) | EP2620957A1 (https=) |
| JP (1) | JP5511800B2 (https=) |
| WO (1) | WO2009146378A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE112020000394T5 (de) * | 2019-01-11 | 2021-09-23 | Kanazawa Institute Of Technology | Magnetfeld-kalibrierungsvorrichtung und verfahren zur kalibrierung einer magnetismus-messvorrichtung mit dieser vorrichtung |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL133615C (https=) * | 1962-10-04 | |||
| FR2562785B1 (fr) | 1984-04-13 | 1988-04-15 | Commissariat Energie Atomique | Systeme a aimants permanents destine a l'imagerie par resonance magnetique nucleaire, notamment pour l'examen du corps humain |
| US4647887A (en) * | 1984-12-24 | 1987-03-03 | The United States Of America As Represented By The Secretary Of The Army | Lightweight cladding for magnetic circuits |
| JPS61175600A (ja) * | 1985-01-31 | 1986-08-07 | 日本電信電話株式会社 | パルス電磁石 |
| US4667174A (en) * | 1985-08-23 | 1987-05-19 | Resonex, Inc. | Magnet assembly for magnetic resonance imaging and method of manufacture |
| FR2605450B1 (fr) * | 1986-10-17 | 1988-12-02 | Thomson Cgr | Aimant permanent cylindrique pour produire un champ d'induction uniforme et transverse |
| FR2611975B1 (fr) * | 1987-03-03 | 1995-02-17 | Commissariat Energie Atomique | Systeme d'aimants permanents pour un champ magnetique intense |
| JPH01109799A (ja) * | 1987-10-23 | 1989-04-26 | Mitsubishi Electric Corp | 磁気シールド装置 |
| EP0525246A1 (de) * | 1991-08-01 | 1993-02-03 | Siemens Aktiengesellschaft | Magneteinrichtung mit einem ein magnetisches Streufeld erzeugenden Jochkörper |
| US5319339A (en) * | 1993-03-08 | 1994-06-07 | The United States Of America As Represented By The Secretary Of The Army | Tubular structure having transverse magnetic field with gradient |
| US5576679A (en) * | 1994-10-25 | 1996-11-19 | Shin-Etsu Chemical Co., Ltd. | Cylindrical permanent magnet unit suitable for gyrotron |
| DE19742548C2 (de) * | 1997-09-26 | 1999-10-07 | Otten Ernst Wilhelm | Magneteinrichtung für Tansport und Aufbewahrung kernspinpolarisierter Gase und Verfahren zur Entnahme dieser Gase |
| WO1999040593A1 (en) * | 1998-02-09 | 1999-08-12 | Odin Medical Technologies Ltd | A method for designing open magnets and open magnetic apparatus for use in mri/mrt probes |
| JP3698099B2 (ja) * | 2001-12-14 | 2005-09-21 | 株式会社日立製作所 | 磁気共鳴撮像装置用マグネット |
| JP2005084022A (ja) * | 2003-09-11 | 2005-03-31 | Neomax Co Ltd | センサ検査用磁場発生装置およびセンサ検査装置 |
| US7199689B1 (en) * | 2006-01-09 | 2007-04-03 | Brk Wireless Company, Inc | High field NMR permanent magnetic structure |
| JP2008249619A (ja) * | 2007-03-30 | 2008-10-16 | Tdk Corp | 透磁率測定用プローブ及びそれを用いた透磁率測定装置 |
-
2008
- 2008-05-28 US US12/128,474 patent/US8179220B2/en not_active Expired - Fee Related
-
2009
- 2009-05-28 EP EP13162604.6A patent/EP2620957A1/en not_active Withdrawn
- 2009-05-28 WO PCT/US2009/045507 patent/WO2009146378A1/en not_active Ceased
- 2009-05-28 EP EP09755739.1A patent/EP2286421B1/en not_active Not-in-force
- 2009-05-28 JP JP2011511826A patent/JP5511800B2/ja not_active Expired - Fee Related
-
2012
- 2012-04-27 US US13/458,535 patent/US8294543B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| EP2286421A1 (en) | 2011-02-23 |
| EP2286421B1 (en) | 2013-05-22 |
| US8294543B2 (en) | 2012-10-23 |
| JP2011522424A (ja) | 2011-07-28 |
| US20090295378A1 (en) | 2009-12-03 |
| WO2009146378A1 (en) | 2009-12-03 |
| US20120212310A1 (en) | 2012-08-23 |
| EP2620957A1 (en) | 2013-07-31 |
| US8179220B2 (en) | 2012-05-15 |
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