JP5496472B2 - X-ray foreign matter detection system - Google Patents

Description

  The present invention relates to an X-ray foreign matter detection system for detecting the presence or absence of foreign matter mixed in an inspection object from the amount of X-ray transmission when the inspection object is irradiated with X-rays, and in particular, transported by loose flow. The present invention relates to an X-ray foreign object detection system capable of pinpointing an inspection object in which foreign substances are really mixed from a large number of inspection objects.

  Conventionally, X-rays are irradiated to an object to be inspected (food, etc.) transported by a conveyor, etc., and foreign matter such as metal, glass, stone, bone, etc. is in the object to be inspected based on the amount of transmitted X-rays. There is an X-ray foreign object detection device for detecting whether or not the toner is mixed.

  In this X-ray foreign object detection device, when a loose food such as a winner sausage is an object to be inspected W, the object to be inspected W is conveyed by the conveyor 101 as shown in FIG. When X-rays are irradiated toward the inspection object W in a predetermined inspection region P, and foreign matter is detected by this X-ray irradiation, the chute (sorting means) 102 is opened after a predetermined time and foreign matter is detected. The inspection object W (defective product) is dropped and selected.

  However, as shown in FIG. 5, when a large number of inspected objects W are transported in a scattered manner, defective products are sorted together with defective products as well as non-defective products, resulting in poor yield. It was.

  In addition, as shown in FIG. 5, two or more objects W to be inspected that are transported in bulk may overlap each other. Although such an inspected object W is a non-defective product, the amount of X-ray transmission at the overlapping portion is extremely reduced, so that it may be detected as a foreign object and treated as a defective product. This was also one of the causes of poor yield.

  Patent Documents 1 and 2 below disclose an X-ray foreign matter detection device and an X-ray inspection device provided with means for re-inspecting (secondary inspection) an object that has been treated as a defective product in normal inspection (primary inspection). Has been.

  The X-ray foreign matter detection device disclosed in the following Patent Document 1 divides a flow cell serving as a flow path of an object to be inspected into two parts, one being an initial sorting flow cell and the other being a re-sorting flow cell. An object to be inspected determined to have foreign matter in the flow cell is re-inspected with a re-sorting flow cell. According to such a configuration, it is possible to reduce the amount of non-defective products mixed in defective products.

  However, this X-ray foreign object detection apparatus has a problem that a real defective product cannot be specified because a plurality of inspected objects are inspected collectively at the time of reinspection as in the normal inspection.

Therefore, an X-ray inspection apparatus that solves such a problem is disclosed in Patent Document 2 below. This X-ray inspection apparatus divides a transport means for transporting an object to be inspected into a normal inspection section and a re-inspection section in a direction orthogonal to the transport direction. A defective product can be specified by changing the threshold value for each part of the line sensor corresponding to the partitioned area. Here, the threshold value of the re-inspection unit is set to be smaller (stricter) than the threshold value of the normal inspection unit, and the defective product is specified by the re-inspection unit.
JP-A-1-254848 JP 2004-132919 A

  However, in the X-ray inspection apparatus disclosed in Patent Document 2, the object of normal inspection (primary inspection) is a package in which a plurality of contents are packaged with packaging materials, and the bag is subjected to re-inspection (secondary inspection). To inspect the contents individually. In other words, this X-ray inspection device specializes in re-inspection of packaged goods, and re-inspection of packaged articles that were excluded as defective products in normal inspection is performed by changing the packaging state (breaking the bag) to ensure that there is no foreign matter. Therefore, no effect can be expected even if this apparatus is applied to the re-inspection of an object to be inspected that is conveyed in a loose state (in a state where it is not wrapped in a bag).

  It should be noted that in a line that handles food, workers and the like are paying sufficient attention to safety, so there is rarely any contamination with foreign matter. For this reason, in the X-ray inspection apparatus disclosed in Patent Document 2, the width of the re-inspection unit is extremely small with respect to the width of the normal inspection unit. However, as described above, two or more objects to be inspected may be handled as defective products, and this is particularly noticeable for objects to be inspected that are conveyed in a loose manner. In such a case, as in the X-ray inspection apparatus of Patent Document 2, the ratio of the re-inspection unit to the normal inspection unit is extremely small, and it is disadvantageous that the ratio is constant, and the object to be inspected is conveyed in a scattered manner. Inspection efficiency suitable for inspection of objects cannot be obtained.

  Accordingly, the present invention has been made in view of the above circumstances, and it is possible to obtain a suitable inspection efficiency for an object to be inspected that is conveyed in a loose manner, and to make pinpoint selection of the object to be inspected that is actually mixed with foreign matter. An object of the present invention is to provide an X-ray foreign matter detection system capable of preventing the yield from deteriorating.

Next, means for solving the above problems will be described with reference to the drawings corresponding to the embodiments.
In the X-ray foreign matter detection system according to the first aspect of the present invention, the inspection lane 11 is formed by being divided in a direction orthogonal to the transport direction X, and a large number of inspection objects W are transported in each inspection lane 11 in a scattered manner. Conveying means 6 for
X-ray generation means 31 for irradiating the inspection object W conveyed by the conveyance means 6 with X-rays;
X-ray detection for detecting X-rays emitted from the X-ray generation means 31 and detecting the presence or absence of foreign matter mixed in the inspection object W based on the X-ray transmission amount transmitted through the inspection object W Means 32;
X-ray foreign matter detection using an inspection unit 2 provided for each inspection lane 11 and comprising a sorting means 14 for sorting the inspection subject W as a defective product when the foreign matter is detected on the inspection subject W System 1,
A plurality of primary inspection lanes 11 a to 11 c are set from the plurality of inspection lanes 11 by arranging a plurality of inspection units 2 in a direction orthogonal to the transport direction X in the transport means 6 and the remaining inspection lanes 11. the set as a secondary test lane 11d, with the one common conveying means 21 for conveying the sorted the object W from the primary inspection lanes 11a~11c as a defective product to the primary set point, said common transfer means 21 Thus, the inspection objects W collected at the primary collection point are re-transported in the secondary inspection lane 11d.

According to the X-ray foreign matter detection system of the present invention, a plurality of inspection units are arranged in parallel to have a plurality of inspection lanes, and a plurality of primary inspection lanes are set from the plurality of inspection lanes, and the remaining inspection lanes are set as secondary. Can be set to inspection lane. That is, the ratio between the primary inspection and the secondary inspection can be selectively set. As a result, both the primary inspection and the secondary inspection can be performed without delay, and it is possible to obtain inspection efficiency suitable for inspecting an object to be inspected that is conveyed in a loose manner. Further, pinpoint selection of an inspection object (defective product) in which foreign matter is mixed by the secondary inspection is possible. Thereby, the deterioration of the yield can be prevented.

  Furthermore, since each inspection lane is formed by being divided in the direction orthogonal to the transport direction of the transport means, that is, the width direction of the transport means, the number of inspected objects to be sorted together with defective products is reduced in the primary inspection lane. . As a result, the number of secondary inspections is reduced and pinpoint selection of defective products becomes possible.

Further, by Tei Rukoto a common transport means, the object to be inspected which has been sorted by the primary inspection by a plurality of primary inspection lanes (primary defective) can automatically batch. As a result, the inspection efficiency is improved.

  Furthermore, by providing a separating means in the input part of the secondary inspection lane, the inspection object (primary defective product) can be individually subjected to secondary inspection. As a result, pinpoint selection of a defective product can be performed reliably.

Embodiments of the present invention will be specifically described below with reference to the drawings.
1 is a plan view showing an embodiment of the X-ray foreign matter detection system of the present invention, FIG. 2 is a front view thereof, FIG. 3 is a schematic perspective view showing the embodiment, and FIG. It is a top view which shows the dispersion | distribution means with which is equipped.

  The X-ray foreign object detection system according to this embodiment is provided in a production line, for example, irradiates a loose inspection object such as a winner sausage with X-rays, and the inspection object based on the amount of X-ray transmission. It is detected whether or not foreign matter such as metal, glass, stone, bone, etc. is mixed in, and pinpoints the inspection object (defective product) mixed with foreign matter.

First, the configuration of the X-ray foreign matter detection system of this embodiment will be described.
As shown in FIG. 1, the X-ray foreign matter detection system 1 includes a plurality (two) of inspection units 2, 2 arranged in parallel in the width direction of a transport unit to be described later. Each of the inspection units 2 and 2 includes a box-shaped housing 3. As shown in FIG. 2, the housing 3 is supported on the installation surface by a plurality of legs 4. The housing 3 is formed using a radiation protection material so that a harmful amount of X-rays does not leak from the inside to the outside. Further, a part of the front surface and a part of both side surfaces of the housing 3 are opened, and an inspection region P for inspecting by irradiating X-rays while carrying the inspection object W (see FIG. 4) is provided. A shielding door 5 is provided in front of the body 3 so that X-rays do not leak from the inspection region P.

  As shown in FIGS. 1 to 3, the belt conveyor 6 serving as the above-described transporting means for transporting the inspection object W from the upstream side to the downstream side is provided inside the housing 3 so as to penetrate the housing 3. It has been. The belt conveyor 6 is formed by a substantially annular belt 8 being wound around rollers 7 and 7 provided on the upstream side and the downstream side in the transport direction X, respectively. One of the rollers 7 and 7 is connected to a drive motor (not shown). The roller 7 is rotated by the drive of the drive motor, and the belt 8 circulates by the rotation of the roller 7 to inspect the object. W is conveyed.

  A partition plate 9 whose longitudinal direction is along the transport direction X is provided at a substantially center on the transport surface of the belt conveyor 6, and the transport surface is perpendicular to the transport direction X, that is, the transport surface (belt conveyor 6). Divided into two in the width direction. And the conveyance surface divided | segmented by the partition plate 9 forms the inspection lane 11 (11a-11d), respectively. The partition plate 9 is divided into an upstream side and a downstream side, and there is a gap between the upstream partition plate 9 and the downstream partition plate 9.

  Further, side plates 10 are provided at both ends in the width direction on the conveying surface of the belt conveyor 6. The side plate 10 is also divided into an upstream side and a downstream side like the partition plate 9, and there is a gap between the upstream side plate 10 and the downstream side plate 10.

  As shown in FIG. 1, the upstream side surface of both side surfaces of the housing 3 is a loading portion of the inspection object W, and a loading hopper 12 is provided. The inside of the charging hopper 12 is also divided into two in the width direction by partitions in the same manner as the belt conveyor 6 described above.

  Further, as shown in FIG. 1, conveyors 13 and 13 for carrying the inspection object W into the housing 3 are disposed upstream of the inspection units 2 and 2. In addition, an operator may be provided in the vicinity of each of the conveyors 13 and 13 in order to perform an operation of making the inspection object W that has been conveyed in large quantities on the conveyor 13 substantially uniform.

  As shown in FIGS. 1 to 3, on the downstream side of the belt conveyor 6, a sorting chute 14 as a sorting unit is provided for each inspection lane 11 (11 a to 11 d). The sorting chute 14 is bent at a substantially right angle toward both ends in the width direction of the substantially rectangular plate. Further, the sorting chute 14 is rotated by the shaft portion 15 provided below the rectangular plate so that the upstream edge sinks downward, and foreign matter is detected in the inspection object W in each inspection lane 11. Sometimes, the inspection object W is dropped and sorted as a defective product.

  Further, as shown in FIGS. 1 to 3, a collecting chute 16 is provided on the downstream side of the sorting chute 14. The collecting chute 16 is bent at substantially right angles at both ends in the width direction of a substantially rectangular plate inclined downward toward the downstream side. One collecting chute 16 is provided for each inspection unit 2.

  As shown in FIGS. 1 and 2, a collecting feeder 17 is disposed on the downstream side of the collecting chute 16. The collective feeder 17 feeds the inspection object W collected by the collective chute 16 by vibrating itself in a direction perpendicular to the transport direction X (Y direction in FIG. 1).

  As shown in FIGS. 1 to 3, immediately below the sorting chutes 14, the object W dropped and sorted by the sorting chutes 14 is commonly transported in a direction perpendicular to the transport direction X (Z direction in FIG. 1). A common belt conveyor 21 as a conveying means is provided. The downstream side of the common belt conveyor 21 is a primary collection point for collecting inspection objects W that have been dropped and sorted by the sorting chute 14 from the inspection lanes 11a to 11c, and a primary defective product box 22 is provided there. Yes.

  Further, a secondary defective product box 23 is provided between the sorting chute 14 and the common belt conveyor 21 immediately below the sorting chute 14 in the inspection lane 11d.

  As shown in FIG. 1, a dispersion supply feeder 24 as a dispersion unit is provided in the input portion of the inspection object W of the inspection unit 2 having the inspection lane 11d. As shown in FIG. 4, the distributed supply feeder 24 is used to input the inspection object W into the input hopper 12 of the inspection lane 11 d so as to separate the inspection object W in the transport direction X. The inspection object W supplied by the distributed supply feeder 24 is separated and transported in the transport direction X along the inspection lane 11d.

  As shown in FIGS. 1 and 4, the distributed supply feeder 24 is installed above the conveyor 13, and a storage unit 25 that configures the upper part of the distributed supply feeder 24 and a support unit (not shown) that configures the lower part via a spring. The inspection object W in the reservoir 25 is intermittently supplied to the inspection lane 11d by being vibrated by a vibration source such as an eccentric drive motor incorporated in the distributed supply feeder 24.

  Here, the optical system of this embodiment will be described with reference to FIG. An X-ray generator 31 as X-ray generation means is provided inside the housing 3, and X-ray detection as X-ray detection means is provided on the back side of the belt 8 of the belt conveyor 6 inside the housing 3. A vessel 32 is provided. The X-ray generator 32 is provided in the upper part of the housing 3, and an X-ray tube for generating X-rays is immersed in insulating oil in a metal box. The belt conveyor 6 is used in each inspection lane 11a to 11d. X-rays are irradiated toward the object W to be inspected (see FIG. 4). In addition, as shown in FIG. 3, the aspect of the X-rays irradiated from the X-ray generator 32 becomes a plane shape orthogonal to the conveyance direction X, and the surface has a substantially triangular shape spreading downward. At this time, the X-rays pass through the above-described gap between the partition plate 9 and the side plate 10.

  The X-ray detector 32 is provided in the lower part of the housing 3 and is disposed opposite to the X-ray generator 31 with the conveyance surface (belt 8) of the belt conveyor 6 interposed therebetween. Although not shown, the X-ray detector 32 includes a line sensor in which a photodiode and a large number of light receiving elements including scintillators arranged on the photodiode are arranged in a line perpendicular to the transport direction. .

  In such a configuration, the X-ray generator 31 irradiates the inspection object W transported by the belt conveyor 6 from the X-ray generator 31, and the X-ray transmitted through the inspection object W is emitted from the X-ray detector 32. It is converted into light by a scintillator. The light converted by the scintillator is received by a photodiode, further converted into an electric signal, and output to an external computer or the like. Then, the output from the X-ray detector 32 is compared with a preset threshold for discrimination of foreign matter, and foreign matter mixed in the inspection object W is detected based on the result.

Next, the inspection process by the X-ray foreign matter detection system of this embodiment will be described.
First, a primary inspection lane is set from a plurality (four) of inspection lanes 11a to 11d of each inspection unit 2 and 2, and the remaining inspection lanes are set as secondary inspection lanes. In FIG. 1 and the like, the inspection lanes 11a to 11c are primary inspection lanes, and the inspection lane 11d is a secondary inspection lane.
The inspection object W is conveyed in large quantities by the conveyor 13 and then supplied to the primary inspection lanes 11a to 11c of the inspection units 2 and 2 from the input hopper. In these primary inspection lanes 11a to 11c, a large number of objects W are conveyed by the belt conveyor 6 in a scattered manner.

  If no foreign matter is detected in the inspected object W subjected to the primary inspection in the primary inspection lanes 11a to 11c, these inspected objects W are non-defective products, so that the collective chutes 16 and 16 of the inspection units 2 and 2 are used as they are. And is collected to the collective feeder 17. The inspection object W collected in the collective feeder 17 is sent to the subsequent apparatus by the vibration of the collective feeder 17 itself.

  Further, when a foreign object is detected in the inspection object W in any of the primary inspection lanes 11a to 11c, the sorting chute 14 on the downstream side of the primary inspection lanes 11a to 11c is opened after a predetermined time from the primary inspection, and the foreign object is detected. The detected object W is subjected to drop sorting. At this time, the inspected object W near the defective product as well as the real defective product including the foreign matter is dropped and selected as a defective product. Further, the inspected object W (primary defective product) that has been subjected to drop-down falls onto the common belt conveyor 21, is transported as it is in the direction Z perpendicular to the transport direction X, and is discharged to the primary defective product box 22. Is done.

  When the primary defective product W accumulates to some extent in the primary defective product box 22, for example, a nearby worker holds the primary defective product box 22 and puts it into the storage unit 25 of the distributed supply feeder 24. The primary defective product of the distributed supply feeder 24 is intermittently supplied to the secondary inspection lane 11d via the input hopper. As a result, the primary defective product W transported in the secondary inspection lane 11d is transported separately in the transport direction X. The primary defective product W in which no foreign matter was detected in the secondary inspection was originally a non-defective product and was treated as a defective product in the primary inspection, and therefore, the collective chute 16 slipped down and collected in the collective feeder 17. It is done.

  The primary defective product W in which foreign matter is detected in the secondary inspection is subjected to drop selection by opening the sorting chute 14 after a predetermined time from the secondary inspection. A secondary defective product box 23 is located immediately below the sorting chute 14 in the secondary inspection lane 11d, and is discharged to this. In addition, since the inspection object W collected in the secondary defective product box 24 is a real defective product, processing such as disposal is performed.

  According to the above-described embodiment, the two inspection units 2 and 2 are arranged in parallel to have four inspection lanes 11 (11a to 11d), and the primary inspection lanes 11a to 11c are set from the four inspection lanes 11a to 11d. The rest can be set in the secondary inspection lane 11d. That is, the lane number ratio between the primary inspection lane and the secondary inspection lane can be selectively set. As a result, both the primary inspection and the secondary inspection can be performed without delay, and it is possible to obtain inspection efficiency suitable for the inspection of the inspection object W transported in a loose manner. Further, pinpoint selection of the inspection object W (defective product) in which foreign matter is mixed by the secondary inspection is possible. Thereby, the deterioration of the yield can be prevented.

  Furthermore, since each inspection lane 11 (11a-11d) is divided and formed in the direction orthogonal to the conveyance direction X of the belt conveyor 6, that is, the width direction of the belt conveyor 6, in the primary inspection lanes 11a-11c, The inspection object W sorted together with the defective products is reduced. As a result, the number of secondary inspections is reduced and pinpoint selection of defective products becomes possible.

  Moreover, by providing the common belt conveyor 21, it is possible to automatically collect the inspection objects W (primary defective products) selected by the primary inspection. As a result, the inspection efficiency is improved.

  Furthermore, by providing the separation supply feeder 24 at the input portion of the secondary inspection lane 11d, the inspection object W (primary defective product) can be individually subjected to secondary inspection. As a result, pinpoint selection of a defective product can be performed reliably.

  In the above-described embodiment, the material and shape of the primary defective product box 22 are not described in detail, but it is desirable that the primary defective product box 22 be formed of a transparent resin such as acrylic. Thereby, since an operator etc. can confirm the accumulation condition of the primary defective product W inside the primary defective product box 22 immediately, inspection efficiency improves. Moreover, it is of course desirable for the secondary defective product box 23 to be formed of a transparent resin.

  Furthermore, the primary defective product box 22 is carried by the operator to the distributed supply feeder 24, but the common belt conveyor 21 is extended to the distributed supply feeder 24 so that the primary defective product W is directly charged. Also good. Thereby, the process of a primary inspection and a secondary inspection can be fully automated.

It is a top view which shows one Embodiment of the X-ray foreign material detection system by this invention. It is a front view which shows one Embodiment of the X-ray foreign material detection system by this invention. It is a schematic perspective view which shows one Embodiment of the X-ray foreign material detection system by this invention. It is a top view which shows the dispersion | distribution means with which one Embodiment of the X-ray foreign material detection system by this invention is provided. It is explanatory drawing which shows the fault of the conventional X-ray foreign material detection.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 ... X-ray foreign material detection system 2 ... Inspection unit 6 ... Belt conveyor as conveyance means 11 ... Inspection lanes 11a-11c ... Primary inspection lane 11d ... Secondary inspection lane 14 ... Sorting chute as sorting means 21 ... As common conveyance means 24 ... Separation supply feeder 31 as separation means 31 ... X-ray generator as X-ray generation means 32 ... X-ray detector as X-ray detection means W ... Inspected object X ... Conveying direction

Claims (1)

A transport means (6) that is divided in a direction perpendicular to the transport direction (X) to form an inspection lane (11), and transports a large number of objects to be inspected (W) in each inspection lane;
X-ray generation means (31) for irradiating the inspection object conveyed by the conveyance means with X-rays;
X-ray detection means (32) for detecting X-rays irradiated from the X-ray generation means and detecting the presence or absence of foreign matter mixed in the inspection object based on the amount of X-ray transmission transmitted through the inspection object. )When,
X-ray foreign matter using an inspection unit (2) provided for each of the inspection lanes, and comprising sorting means (14) for sorting the inspection object as a defective product when the foreign object is detected in the inspection object A detection system (1) comprising:
A plurality of primary inspection lanes (11a to 11c) are set from the plurality of inspection lanes by arranging a plurality of inspection units in a direction orthogonal to the transport direction in the transport means, and the remaining inspection lanes are secondary Set as inspection lane (11d)
One common transport means (21) for transporting the inspection object sorted as defective from each primary inspection lane to a primary assembly location,
An X-ray foreign matter detection system , wherein the inspection objects collected at the primary collection location by the common transport means are transported again in the secondary inspection lane.

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