JP5431313B2 - アモルファス炭素光吸収層に適合したレーザアニールシステムのための高温計 - Google Patents

アモルファス炭素光吸収層に適合したレーザアニールシステムのための高温計 Download PDF

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JP5431313B2
JP5431313B2 JP2010513186A JP2010513186A JP5431313B2 JP 5431313 B2 JP5431313 B2 JP 5431313B2 JP 2010513186 A JP2010513186 A JP 2010513186A JP 2010513186 A JP2010513186 A JP 2010513186A JP 5431313 B2 JP5431313 B2 JP 5431313B2
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wavelength
pyrometer
laser
nanometers
filter
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JP2010513186A
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Japanese (ja)
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JP2010530639A5 (enExample
JP2010530639A (ja
Inventor
ジーピン リー，
ブルース， イー． アダムス，
ティモシー， エヌ． トーマス，
アーロン， ミューア ハンター，
アブヒラッシュ， ジェイ． マユール，
ラジェシュ， エス． ラマニュジャム，
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Applied Materials Inc
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Applied Materials Inc
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Publication of JP2010530639A5 publication Critical patent/JP2010530639A5/ja
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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/03—Observing, e.g. monitoring, the workpiece
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/03—Observing, e.g. monitoring, the workpiece
    • B23K26/032—Observing, e.g. monitoring, the workpiece using optical means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/03—Observing, e.g. monitoring, the workpiece
    • B23K26/034—Observing the temperature of the workpiece
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/0665—Shaping the laser beam, e.g. by masks or multi-focusing by beam condensation on the workpiece, e.g. for focusing
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/18—Working by laser beam, e.g. welding, cutting or boring using absorbing layers on the workpiece, e.g. for marking or protecting purposes
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2101/00—Articles made by soldering, welding or cutting
    • B23K2101/36—Electric or electronic devices
    • B23K2101/40—Semiconductor devices

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Mechanical Engineering (AREA)
  • Recrystallisation Techniques (AREA)
  • Laser Beam Processing (AREA)
JP2010513186A 2007-06-18 2008-05-22 アモルファス炭素光吸収層に適合したレーザアニールシステムのための高温計 Active JP5431313B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/764,738 2007-06-18
US11/764,738 US7804042B2 (en) 2007-06-18 2007-06-18 Pryometer for laser annealing system compatible with amorphous carbon optical absorber layer
PCT/US2008/006616 WO2008156543A1 (en) 2007-06-18 2008-05-22 Pyrometer for laser annealing system compatible with amorphous carbon optical absorber layer

Publications (3)

Publication Number Publication Date
JP2010530639A JP2010530639A (ja) 2010-09-09
JP2010530639A5 JP2010530639A5 (enExample) 2011-07-07
JP5431313B2 true JP5431313B2 (ja) 2014-03-05

Family

ID=40131342

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010513186A Active JP5431313B2 (ja) 2007-06-18 2008-05-22 アモルファス炭素光吸収層に適合したレーザアニールシステムのための高温計

Country Status (6)

Country Link
US (2) US7804042B2 (enExample)
EP (2) EP2167272B1 (enExample)
JP (1) JP5431313B2 (enExample)
KR (1) KR101457345B1 (enExample)
CN (1) CN101678507B (enExample)
WO (1) WO2008156543A1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7947584B2 (en) * 2008-05-02 2011-05-24 Applied Materials, Inc. Suitably short wavelength light for laser annealing of silicon in DSA type systems
US9429742B1 (en) * 2011-01-04 2016-08-30 Nlight, Inc. High power laser imaging systems
US9409255B1 (en) 2011-01-04 2016-08-09 Nlight, Inc. High power laser imaging systems
US10095016B2 (en) 2011-01-04 2018-10-09 Nlight, Inc. High power laser system
US9720244B1 (en) 2011-09-30 2017-08-01 Nlight, Inc. Intensity distribution management system and method in pixel imaging
WO2013085687A1 (en) * 2011-12-07 2013-06-13 Applied Materials, Inc. Laser reflectometry for substrate processing
CN103862169B (zh) * 2012-12-12 2016-08-10 中芯国际集成电路制造(上海)有限公司 激光退火设备和方法
US9310248B2 (en) 2013-03-14 2016-04-12 Nlight, Inc. Active monitoring of multi-laser systems
CN105144355B (zh) 2013-05-01 2018-02-06 应用材料公司 用于在晶片处理系统内进行低温测量的设备与方法
KR102099722B1 (ko) 2014-02-05 2020-05-18 엔라이트 인크. 단일-이미터 라인 빔 시스템
US10247865B2 (en) * 2017-07-24 2019-04-02 Viavi Solutions Inc. Optical filter

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6183130B1 (en) 1998-02-20 2001-02-06 Applied Materials, Inc. Apparatus for substrate temperature measurement using a reflecting cavity and detector
US6535535B1 (en) * 1999-02-12 2003-03-18 Semiconductor Energy Laboratory Co., Ltd. Laser irradiation method, laser irradiation apparatus, and semiconductor device
US6822787B1 (en) 1999-04-26 2004-11-23 Finisar Corporation Lasing semiconductor optical amplifier with optical signal power monitor
US6531681B1 (en) 2000-03-27 2003-03-11 Ultratech Stepper, Inc. Apparatus having line source of radiant energy for exposing a substrate
JP3903761B2 (ja) * 2001-10-10 2007-04-11 株式会社日立製作所 レ−ザアニ−ル方法およびレ−ザアニ−ル装置
WO2003049175A1 (fr) * 2001-12-07 2003-06-12 Sony Corporation Irradiateur a faisceaux et dispositif de recuit pour laser
KR100436218B1 (ko) * 2001-12-24 2004-06-16 한국원자력연구소 ＬｉＦ에 Ｍｇ,Ｃｕ,Ｎａ, 및 Ｓｉ를 첨가한 방사선계측용 열발광소자 및 그의 제조방법
US6987240B2 (en) 2002-04-18 2006-01-17 Applied Materials, Inc. Thermal flux processing by scanning
US8288239B2 (en) * 2002-09-30 2012-10-16 Applied Materials, Inc. Thermal flux annealing influence of buried species
JP4043859B2 (ja) * 2002-06-18 2008-02-06 浜松ホトニクス株式会社 樹脂溶接装置及び樹脂溶接方法
US6747245B2 (en) 2002-11-06 2004-06-08 Ultratech Stepper, Inc. Laser scanning apparatus and methods for thermal processing
US7109087B2 (en) * 2003-10-03 2006-09-19 Applied Materials, Inc. Absorber layer for DSA processing
US7304310B1 (en) * 2003-11-21 2007-12-04 Kla-Tencor Technologies Corp. Methods and systems for inspecting a specimen using light scattered in different wavelength ranges
US7078302B2 (en) * 2004-02-23 2006-07-18 Applied Materials, Inc. Gate electrode dopant activation method for semiconductor manufacturing including a laser anneal
US7438468B2 (en) * 2004-11-12 2008-10-21 Applied Materials, Inc. Multiple band pass filtering for pyrometry in laser based annealing systems
US7642205B2 (en) * 2005-04-08 2010-01-05 Mattson Technology, Inc. Rapid thermal processing using energy transfer layers
US7279721B2 (en) * 2005-04-13 2007-10-09 Applied Materials, Inc. Dual wavelength thermal flux laser anneal
US20060260545A1 (en) * 2005-05-17 2006-11-23 Kartik Ramaswamy Low temperature absorption layer deposition and high speed optical annealing system
US7312162B2 (en) * 2005-05-17 2007-12-25 Applied Materials, Inc. Low temperature plasma deposition process for carbon layer deposition

Also Published As

Publication number Publication date
US20110006044A1 (en) 2011-01-13
WO2008156543A1 (en) 2008-12-24
CN101678507B (zh) 2012-11-28
EP3330036B1 (en) 2019-11-06
US8232503B2 (en) 2012-07-31
KR20100044786A (ko) 2010-04-30
CN101678507A (zh) 2010-03-24
KR101457345B1 (ko) 2014-11-04
US7804042B2 (en) 2010-09-28
EP3330036A1 (en) 2018-06-06
EP2167272A4 (en) 2016-11-23
EP2167272A1 (en) 2010-03-31
US20080308534A1 (en) 2008-12-18
JP2010530639A (ja) 2010-09-09
EP2167272B1 (en) 2018-01-24

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