JP5359377B2 - 欠陥検出装置、欠陥検出方法および欠陥検出プログラム - Google Patents
欠陥検出装置、欠陥検出方法および欠陥検出プログラム Download PDFInfo
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JP2009048114A JP5359377B2 (ja) | 2009-03-02 | 2009-03-02 | 欠陥検出装置、欠陥検出方法および欠陥検出プログラム |
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JP2009048114A JP5359377B2 (ja) | 2009-03-02 | 2009-03-02 | 欠陥検出装置、欠陥検出方法および欠陥検出プログラム |
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JP2010203845A JP2010203845A (ja) | 2010-09-16 |
JP2010203845A5 JP2010203845A5 (enrdf_load_stackoverflow) | 2012-03-08 |
JP5359377B2 true JP5359377B2 (ja) | 2013-12-04 |
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Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012098181A (ja) * | 2010-11-02 | 2012-05-24 | Sumitomo Electric Ind Ltd | 検出装置及び検出方法 |
CN108463717B (zh) | 2016-01-26 | 2021-05-25 | 富士胶片株式会社 | 龟裂信息检测装置、龟裂信息检测方法及存储介质 |
US11948292B2 (en) | 2019-07-02 | 2024-04-02 | MakinaRocks Co., Ltd. | Systems and methods for detecting flaws on panels using images of the panels |
KR102450130B1 (ko) * | 2019-07-02 | 2022-10-04 | 주식회사 마키나락스 | 패널의 이미지를 이용하여 패널의 결함을 검출하는 방법 및 시스템 |
JP7435303B2 (ja) | 2020-06-23 | 2024-02-21 | オムロン株式会社 | 検査装置、ユニット選択装置、検査方法、及び検査プログラム |
KR102439163B1 (ko) * | 2022-06-24 | 2022-09-01 | 주식회사 아이브 | 인공지능 기반의 비지도 학습 모델을 이용한 불량 제품 검출 장치 및 그 제어방법 |
JP2024135911A (ja) * | 2023-03-23 | 2024-10-04 | 株式会社東京精密 | ワーク外観検査装置及び方法 |
CN116805204B (zh) * | 2023-08-24 | 2023-12-01 | 超网实业(成都)股份有限公司 | 一种智慧厂务监控方法及系统 |
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JPH05322533A (ja) * | 1992-05-25 | 1993-12-07 | Yamatake Honeywell Co Ltd | 回路部品の接続状態検出方法 |
JP3310898B2 (ja) * | 1997-03-28 | 2002-08-05 | 三菱電機株式会社 | 画像処理装置 |
JP3447572B2 (ja) * | 1998-07-31 | 2003-09-16 | 株式会社山武 | 部品の接続良否検査方法 |
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