JP5294645B2 - Board inspection equipment - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a substrate inspecting apparatus which solves such problems of damaging a substrate component, causing an examining staff etc. to get an electricshock and the like, by preventing a target substrate from being taken out until a residual voltage and a residual charge of the target substrate become equal to or less than a certain level. <P>SOLUTION: The target substrate is moved up along with a pin board by rotating a lever 4, and then a probe pin is brought to contact with a test point to turn on electricity, thereby conducting an operation test of the target substrate. After completing the test, a downward rotation of a rotation block 14, i.e., the rotation of the lever 4 is prevented mechanically by using a pin 19 of a solenoid lock 18, until an accumulated charge of an electrolytic capacitor contained in the target substrate is decreased. Since the accumulated charge of the electrolytic capacitor becomes low after an elapse of a certain time, the solenoid lock 18 is turned off, and the pin 19 is brought to return to its immersed state. Then, the pin board is moved down to return to its waiting position by rotating the lever 4 in its upward direction, and a top plate is opened in order to take out the target substrate. <P>COPYRIGHT: (C)2009,JPO&amp;INPIT

Description

  The present invention relates to a substrate inspection apparatus used for performing functional inspection and operation confirmation of a substrate used in industrial equipment, home appliances, and the like.

  When performing functional inspection and operation confirmation before incorporating boards used in industrial equipment and household appliances into products, in general, probe pins for current inspection are pressed against various test points on the board to be inspected. A method of inspecting by energizing from the probe pin is used.

  Such a substrate inspection apparatus has an apparatus main body with a lifting lever on the side surface, a top plate on the upper surface of the apparatus main body, and a plurality of probe pins provided in accordance with a predetermined arrangement pattern below the top plate A pin board is arranged, and the pin board is moved up and down between the standby position and the inspection position by operating the lifting lever. When the pin board at the lower standby position is raised to the inspection position, the tip of the probe pin comes into contact with the test point of the substrate to be inspected held by the top plate. Therefore, when power is supplied from a power source provided in the apparatus main body or an external power source, power is supplied to each probe pin, and a power supply inspection of the substrate is performed.

Japanese Patent Laid-Open No. 11-72527

  By the way, in the substrate inspection apparatus having such a structure, when the tester tries to take out the target substrate immediately after the inspection of the target substrate to be inspected or after the inspection is completed, the charge accumulated in the electrolytic capacitor of the target substrate is released. As a result, a component included in the target substrate may be damaged, or the tester or the operator may be electrocuted.

Therefore, conventionally, a light emitting means such as an LED or an audio output means such as a buzzer is used to notify the tester of the timing when the target substrate can be taken out by light or sound. However, even if such a notification is given, the target substrate can be taken out itself, so that the above-mentioned problem may be caused by carelessness of the tester and the operator. Conventionally, for example, the following series of operations are performed to take out the target substrate, that is,
(1) The lever is rotated upward (2) The rotating block rotates downward,
(3) The pin board descends to the standby position,
(4) The lock pin also descends,
(5) Turn the top plate upward,
(6) There is no problem as long as the target substrate is taken out, but if this procedure is removed, the above-described problems occur.

  In view of the above, an object of the present invention is to provide a substrate inspection apparatus that can solve such a conventional problem by preventing the target substrate from being mechanically taken out.

The board inspection apparatus of the present invention is located at the lower part of the apparatus main body, has a probe pin, and has a pin board provided with an elevating mechanism that can be moved up and down with the target board to be inspected set, and can be operated from outside the apparatus main body The lever and handle for moving the pin board up and down, and the upper body of the device are located on the upper part of the apparatus, can be opened and closed in the vertical direction, and hold down the target board on the pin board when rotating downward. In the board inspection apparatus comprising the top plate for contacting the probe pin with the substrate, and conducting an operation test of the substrate by energizing through the probe pin,
Detection means for detecting residual voltage and / or residual charge of the target substrate;
The residual voltage and / or residual charge of the target substrate possess a blocking means that mechanically prevents the operation of the operating body to a predetermined value or less,
The blocking means is a solenoid in which a pin protrudes in response to a signal from the detection means, and the operation body or the lifting mechanism is blocked by the protruding pin.
A support shaft for attaching the operating body to the device main body is inserted into the device main body, both ends of the support shaft are supported on the device main body side, and the pin board is moved up and down in the vicinity of the shaft support portion. A rotation block constituting a mechanism for the rotation block, the rotation block includes a lever-like body, and a pin of the solenoid abuts a side edge of the lever-like body to prevent the operation body or the lifting mechanism from operating.
It is characterized by that.

  The present invention includes a mechanism that detects the residual voltage and / or residual charge of the target substrate and cannot take out the target substrate until the residual voltage and / or residual charge reaches a certain level or less. Thus, there is an effect that it is possible to eliminate problems such as breakage of parts of the target board due to such operations and electric shock of the tester and the operator.

  Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings.

  FIG. 1 is a perspective view showing an appearance of a substrate inspection apparatus according to an embodiment of the present invention, and is a view (A) in a state where the top plate is closed and a view (B) in a state where the top plate is opened. In the figure, 1 is a device main body, 2 is a top plate, and 3 is a pin board. The pin board 3 is usually located at the lower part of the apparatus main body 1 and includes a probe pin. The pin board 3 moves the operating body (the lever 4 in the illustrated example) up and down in a state where the board (target board) 10 to be inspected is set. It can be moved up and down accordingly. The top plate 2 is pivotally supported on the upper part of the apparatus main body 1 so as to be pivotable in the vertical direction, and the target substrate 10 on the pin board 3 is pressed by a pin 2b made of resin or the like so that the probe pin is placed on the target substrate. 10 can be brought into contact. The structure of the substrate inspection using pins and probe pins is well known, so illustration and detailed description thereof are omitted.

  2 is an enlarged side sectional view of the opening / closing mechanism portion of the top plate 2 of the apparatus of FIG. 1, and FIG. 2 (A) shows that the top plate 2 is open and a probe pin (not shown) is lowered together with the pin board 3. Further, the locking portion 5a of the stopper 5 of the top plate 2 is detached from the locking mechanism 6 (round bar material in the illustrated example) provided on the upper surface of the apparatus body 1, and the top plate 2 is freely raised. The pin board 3 can be opened. The pin board 3 includes a lock pin 7 that moves up and down. In the state shown in FIG. 2A, the pin board 3 protrudes slightly from the upper surface of the apparatus main body 1 and is not related to the locking of the top plate 2. Yes.

  In FIG. 2B, the top plate 2 is lowered, the pin board 3 is raised, and the probe pin (not shown) is raised accordingly (this raising mechanism is well known and is not shown or described) A state is shown in which the target board 10 is sandwiched between the pin board 3 and the probe pin, and the target board 10 is energized through the probe pin so that an operation test of the target board 10 can be performed.

  FIG. 3A is a perspective view showing a state in which the top board 2 is open and the pin board 3 is lowered. FIG. 3B is a perspective view showing a state in which the pin board 3 is raised by the operation of the lever 4 while the top plate 2 remains open. 4 is a front view (A) and a side view (B) showing a blocking means for mechanically blocking the operation of the lever 4 as an operating body, and FIG. 5 shows a residual voltage detection / comparison means of the target substrate 10. It is a figure which shows an electrical circuit structure.

  First, the blocking means will be described. Although not shown in the drawings, the support shaft 11 of the lever 4 as an operating body is passed through the casing 12 of the inspection apparatus constituting the apparatus main body, and both ends thereof are supported by the bearing 13 so as to be rotatable by the casing 12. It is. In the vicinity of the portion where the bearing 13 is disposed, there is provided a rotating block 14 having a lever-like side surface that forms a mechanism for moving the pin board 3 up and down. The rotary block 14 is fixed to the support shaft 11 through the lower end, and a roller 16 for moving the pin board 3 up and down is inserted into a recess 15 provided at the upper end, and the rollers 16 are inserted into holes 17 provided on both side surfaces of the recess 15. A solenoid lock 18 is arranged inside the housing 12 of the rotary block 14 that is positioned on the opposite side of the lever 4 through the shaft 16a. Of course, a solenoid lock 18 may be arranged inside the housing 12 of the rotary block 14 located on the lever 4 side.

  The solenoid lock 18 includes a pin 19 that enters and exits, and its operation is controlled by a circuit shown in FIG. That is, one side of the residual voltage detection / comparison circuit 20 is electrically connected to or connected to a conductive portion of the target substrate 10, and the other side is grounded via a power source. The output is connected to the base of a transistor Tr disposed in the middle of the ground line of the solenoid lock 18. The solenoid lock 18 is connected so that power is supplied from a DC power source. Instead of detecting the residual voltage of the target substrate 10, the residual charge may be detected, or both may be detected, and the configuration is not limited to the illustrated example.

  Here, as shown in FIG. 3A, the top plate 2 is opened, and the pin board 3 is lowered by the operation of the lever 4 to be positioned at the standby position. At this time, since the target board 10 is not mounted on the pin board 3, there is no output from the residual voltage detection / comparison circuit 20, the transistor Tr is off, and the solenoid lock 18 is inactive and the pin is not operated. 19 only protrudes slightly (state shown in FIG. 6A).

  In this state, the target board 10 is mounted on the pin board 3, the top board 2 is lowered using the handle 2a, and the lever 4 is rotated downward to raise the pin board 3 together with the target board 10 to the inspection position. The probe pin (not shown) is raised, the target board 10 is sandwiched between the pin board 3 and the probe pin, the tip of the probe pin is brought into contact with the test point of the target board 10 to be inspected, and the probe pin is Then, the target substrate 10 is energized to perform an operation test on the target substrate 10. At the beginning of this operation test, the electrolytic capacitor of the target substrate 10 is in a state where either no charge is accumulated or the accumulation amount is small, and the top board 2 is lowered and the target substrate 10 is touched. In this state, the transistor Tr is still off, the solenoid lock 18 is not activated, and the pin 19 does not protrude significantly.

  Then, as time elapses from the start of the operation test, electric charge is accumulated in the electrolytic capacitor of the target substrate 10 by energization. At a certain point in time, the electric charge accumulation amount of the electrolytic capacitor exceeds a predetermined value, and a residual voltage detection / comparison circuit The voltage detected by 20 becomes a predetermined value or more. Then, an output from the residual voltage detection / comparison circuit 20 is generated, and when this is input to the base of the transistor Tr, the transistor Tr is turned on, the solenoid lock 18 is activated, and the pin 19 protrudes greatly. The pin 19 of the solenoid lock 18 that protrudes greatly cushions the side surface of the rotating block 14 (the state shown in FIG. 6B), and the rotating block 14 is prevented from rotating downward.

  That is, after the energization operation test is completed, the target substrate 10 may be removed from the pin board 3, but immediately after the inspection is completed, as described above, the target substrate 10 is touched to the electrolytic capacitor by touching the target substrate 10. There is a possibility that the accumulated charge will be released and the parts of the target board will be damaged, or the tester or operator may be electrocuted. If so, it is necessary to wait until the voltage value (or the amount of charge: the same applies hereinafter) becomes equal to or lower than a predetermined value. Therefore, the solenoid lock 18 is actuated in order to keep the same state as in the test even after the end of the energization operation test, and the pin 19 prevents the rotating block 14 from rotating downward, that is, the lever 4 from rotating. The blocking by the pin 19 mechanically prevents the tester or the operator from applying a force to the lever 4 to rotate the lever 4, and the tester or the operator enters a mechanical motion blocking state. You can experience something.

  Then, after a certain amount of time has elapsed after the end of the energization operation test, the charge accumulated in the electrolytic capacitor is released through the probe pin, the amount of accumulated charge decreases, and the voltage value detected by the residual voltage detection / comparison circuit 20 is predetermined. When the value is less than the value, there is no output from the residual voltage detection / comparison circuit 20 to the base of the transistor Tr, thereby turning off the transistor Tr, and the pin 19 of the solenoid lock 18 is not much as shown in FIG. It returns to the state where it does not protrude greatly. Then, since there is nothing that prevents the rotating block 14 from rotating downward, if the tester or operator rotates the lever 4 upward, the pin board 3 descends and returns to the standby position, and the top plate 2 is raised. The target substrate 10 can be removed. In this state, since the electric charge is not reliably accumulated in the electrolytic capacitor of the target substrate 10, problems such as component damage and electric shock do not occur.

  The configurations of the blocking means and the residual voltage (or residual charge) detection / comparison means are not limited to the illustrated example, and other various known means can be adopted. Further, not only the residual voltage and the residual charge but also an electrical feature value indicated by another target substrate may be detected.

The perspective view which shows the external appearance of the board | substrate inspection apparatus which concerns on the Example of this invention. 1 is an enlarged side sectional view of the opening / closing mechanism portion of the top plate of the apparatus of FIG. A perspective view showing a state where the top board is open and the pin board is lowered (A), and a perspective view showing a state where the top board is opened and the pin board is raised by operating the lever (B). Front view (A) and side view (B) showing blocking means for mechanically blocking the operation of the lever as the operating body The figure which shows the electrical circuit structure of the residual voltage detection and comparison means of a target board | substrate A diagram showing the non-operating state of the solenoid lock (A) and a diagram showing the operating state (B)

Explanation of symbols

1: Device body 2: Top plate 2a: Handle 2b: Pin 3: Pin board 4: Lever 5: Stopper 5a: Stopper locking portion 6: Locking mechanism 7: Lock pin 10: Target substrate 11: Lever support shaft 12: Inspection device housing 13: Bearing 14: Rotating block 15: Recessed portion of rotating block 16: Roller 16a: Roller shaft 17: Long hole 18: Solenoid lock 19: Pin of solenoid lock 20: Residual voltage detection / comparison circuit

Claims (1)

Located at the bottom of the device body, provided with a probe board, provided with a lift mechanism that can be moved up and down with the target substrate to be inspected set, and can be operated from outside the device body and moved up and down the pin board An operation body such as a lever and a handle for positioning and an upper part of the apparatus main body, which can be pivoted up and down in the vertical direction, presses the target substrate on the pin board when rotating downward, and contacts the probe pin with the substrate In the substrate inspection apparatus for performing an operation test of the substrate by energizing through the probe pin,
Detection means for detecting residual voltage and / or residual charge of the target substrate;
The residual voltage and / or residual charge of the target substrate possess a blocking means that mechanically prevents the operation of the operating body to a predetermined value or less,
The blocking means is a solenoid in which a pin protrudes in response to a signal from the detection means, and the operation body or the lifting mechanism is blocked by the protruding pin.
A support shaft for attaching the operating body to the device main body is inserted into the device main body, both ends of the support shaft are supported on the device main body side, and the pin board is moved up and down in the vicinity of the shaft support portion. A rotation block constituting a mechanism for the rotation block, the rotation block includes a lever-like body, and a pin of the solenoid abuts a side edge of the lever-like body to prevent the operation body or the lifting mechanism from operating.
A substrate inspection apparatus.