JP5290960B2 - 質量分析計 - Google Patents

質量分析計 Download PDF

Info

Publication number
JP5290960B2
JP5290960B2 JP2009507174A JP2009507174A JP5290960B2 JP 5290960 B2 JP5290960 B2 JP 5290960B2 JP 2009507174 A JP2009507174 A JP 2009507174A JP 2009507174 A JP2009507174 A JP 2009507174A JP 5290960 B2 JP5290960 B2 JP 5290960B2
Authority
JP
Japan
Prior art keywords
ion guide
ions
mass
electrodes
peak
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2009507174A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009535761A (ja
Inventor
グリーン、マーティン
ワイルドグース、ジェイソン、リー
プリングル、スティーブン、デレク
ケニー、ダニエル、ジェイムス
Original Assignee
マイクロマス ユーケー リミテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GBGB0608470.1A external-priority patent/GB0608470D0/en
Application filed by マイクロマス ユーケー リミテッド filed Critical マイクロマス ユーケー リミテッド
Publication of JP2009535761A publication Critical patent/JP2009535761A/ja
Application granted granted Critical
Publication of JP5290960B2 publication Critical patent/JP5290960B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205Device types
    • H01J49/422Two-dimensional RF ion traps
    • H01J49/4235Stacked rings or stacked plates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/06Electron- or ion-optical arrangements
    • H01J49/062Ion guides
    • H01J49/065Ion guides having stacked electrodes, e.g. ring stack, plate stack

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2009507174A 2006-04-28 2007-04-30 質量分析計 Active JP5290960B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GBGB0608470.1A GB0608470D0 (en) 2006-04-28 2006-04-28 Mass spectrometer
GB0608470.1 2006-04-28
US80177206P 2006-05-19 2006-05-19
US60/801,772 2006-05-19
PCT/GB2007/001589 WO2007125354A2 (en) 2006-04-28 2007-04-30 Mass spectrometer

Publications (2)

Publication Number Publication Date
JP2009535761A JP2009535761A (ja) 2009-10-01
JP5290960B2 true JP5290960B2 (ja) 2013-09-18

Family

ID=38573479

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009507174A Active JP5290960B2 (ja) 2006-04-28 2007-04-30 質量分析計

Country Status (5)

Country Link
EP (1) EP2013895B8 (xx)
JP (1) JP5290960B2 (xx)
CA (1) CA2650390C (xx)
HK (1) HK1132839A1 (xx)
WO (1) WO2007125354A2 (xx)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0514964D0 (en) 2005-07-21 2005-08-24 Ms Horizons Ltd Mass spectrometer devices & methods of performing mass spectrometry
JP5341753B2 (ja) * 2006-07-10 2013-11-13 マイクロマス ユーケー リミテッド 質量分析計
GB0622780D0 (en) 2006-11-15 2006-12-27 Micromass Ltd Mass spectrometer
GB0718468D0 (en) 2007-09-21 2007-10-31 Micromass Ltd Mass spectrometer
GB0820308D0 (en) * 2008-11-06 2008-12-17 Micromass Ltd Mass spectrometer
GB201000852D0 (en) * 2010-01-19 2010-03-03 Micromass Ltd Mass spectrometer
KR20140020152A (ko) * 2012-08-08 2014-02-18 (주)영린기기 질량 분석기용 rf/dc 이온 가이드
DE112014005915T5 (de) 2013-12-19 2016-09-08 Micromass Uk Limited Massenauflösende Hochdruck-Ionenführung mit axialem Feld
DE112014005868T5 (de) 2013-12-24 2016-09-15 Micromass Uk Limited Wanderwellen-IMS mit Gegenstrom von Gas
GB201323004D0 (en) * 2013-12-24 2014-02-12 Micromass Ltd Travelling wave IMS with counterflow of gas
GB2541346B (en) * 2014-06-25 2022-05-11 Hitachi High Tech Corp Mass spectrometer
CN107665806B (zh) 2016-07-28 2019-11-26 株式会社岛津制作所 质谱仪、离子光学装置及对质谱仪中离子操作的方法
CN113066713A (zh) 2020-01-02 2021-07-02 株式会社岛津制作所 离子光学装置、质谱仪以及离子操作方法
US11600480B2 (en) * 2020-09-22 2023-03-07 Thermo Finnigan Llc Methods and apparatus for ion transfer by ion bunching

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5206506A (en) * 1991-02-12 1993-04-27 Kirchner Nicholas J Ion processing: control and analysis
EP0843887A1 (en) * 1995-08-11 1998-05-27 Mds Health Group Limited Spectrometer with axial field
EP1212778A2 (en) * 1999-08-26 2002-06-12 University Of New Hampshire Multiple stage mass spectrometer
JP2002184347A (ja) * 2000-12-12 2002-06-28 Shimadzu Corp 質量分析装置
JP3791479B2 (ja) * 2002-09-17 2006-06-28 株式会社島津製作所 イオンガイド
US6838662B2 (en) * 2002-11-08 2005-01-04 Micromass Uk Limited Mass spectrometer
DE602005027656D1 (de) * 2004-01-09 2011-06-09 Micromass Ltd Ionenextraktionseinrichtungen und verfahren zur selektiven extraktion von ionen
JP4193734B2 (ja) * 2004-03-11 2008-12-10 株式会社島津製作所 質量分析装置
GB0522327D0 (en) * 2005-11-01 2005-12-07 Micromass Ltd Mass spectrometer
EP1956635B1 (en) * 2005-11-28 2013-05-15 Hitachi, Ltd. Ion guide device, ion reactor, and mass analyzer

Also Published As

Publication number Publication date
EP2013895B8 (en) 2019-07-17
WO2007125354A3 (en) 2008-10-02
WO2007125354A2 (en) 2007-11-08
EP2013895B1 (en) 2018-09-12
JP2009535761A (ja) 2009-10-01
CA2650390A1 (en) 2007-11-08
CA2650390C (en) 2017-05-16
HK1132839A1 (en) 2010-03-05
EP2013895A2 (en) 2009-01-14

Similar Documents

Publication Publication Date Title
JP5290960B2 (ja) 質量分析計
US9786479B2 (en) Mass spectrometer device and method using scanned phase applied potentials in ion guidance
JP5341753B2 (ja) 質量分析計
EP3640970B1 (en) Ion guiding device
EP2033208B1 (en) Mass spectrometer
JP4778560B2 (ja) 質量分析計
JP5346294B2 (ja) 質量分析計
EP2235739B1 (en) Linear ion trap
EP2526562B1 (en) Mass to charge ratio selective ejection from ion guide having supplemental rf voltage applied thereto
CA2692079A1 (en) Mass spectrometer

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20100415

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20120222

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120228

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120411

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20121108

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20130123

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20130507

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20130606

R150 Certificate of patent or registration of utility model

Ref document number: 5290960

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250