JP5252934B2 - Connector connection method and connector connection structure using the connection method - Google Patents
Connector connection method and connector connection structure using the connection method Download PDFInfo
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- JP5252934B2 JP5252934B2 JP2008014466A JP2008014466A JP5252934B2 JP 5252934 B2 JP5252934 B2 JP 5252934B2 JP 2008014466 A JP2008014466 A JP 2008014466A JP 2008014466 A JP2008014466 A JP 2008014466A JP 5252934 B2 JP5252934 B2 JP 5252934B2
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L24/39—Structure, shape, material or disposition of the strap connectors after the connecting process
- H01L24/40—Structure, shape, material or disposition of the strap connectors after the connecting process of an individual strap connector
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- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/84—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a strap connector
- H01L2224/848—Bonding techniques
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- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/84—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a strap connector
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
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Description
本発明は、半導体チップ上に配置する接続子の接続方法および該方法を用いた接続構造に関するものである。 The present invention relates to a connection method for a connector disposed on a semiconductor chip and a connection structure using the method.
特許文献1および特許文献2などには、半導体チップ上に配置される接続子が半田を用いて取付けられている様子が開示されている。接続子には、一般的に銅が用いられており、銅の良好な導電性を利用して半導体チップが外部と電気的に接続される。 Patent Document 1 and Patent Document 2 disclose a state in which a connector disposed on a semiconductor chip is attached using solder. Copper is generally used for the connector, and the semiconductor chip is electrically connected to the outside using the good conductivity of copper.
半導体チップにおいて、接続子を取り付けるための取り付け面には予め半田が塗布されており、該取付け面の面積は、接続子の接続面の面積よりも広く形成されている。この取付け部位と接続子の接続面との間に供給される半田によって、半導体チップと接続子とが接続される。 In a semiconductor chip, solder is previously applied to an attachment surface for attaching a connector, and the area of the attachment surface is formed wider than the area of the connection surface of the connector. The semiconductor chip and the connector are connected by solder supplied between the attachment site and the connection surface of the connector.
一方、特許文献3には、金属メッキ10を施したアイランド1が示されており、該アイランド10上に配置される半導体チップ5をろう材(半田)6によって取り付けることを開示している。尚、金属メッキが施されたアイランド1には、配置される半導体チップ5の周囲を取り囲むように、当該アイランド1の縁端の周辺の金属メッキ10が線状に取り除かれている。このように、金属メッキ1の一部が取り除かれることによって、半導体チップ5をアイランド1上に配置して取り付ける際、金属メッキ10が取り除かれたことによる濡れ性の悪さを利用して、ろう材6の過剰な流出の防止を図っている。 On the other hand, Patent Document 3 shows an island 1 to which a metal plating 10 is applied, and discloses that a semiconductor chip 5 disposed on the island 10 is attached by a brazing material (solder) 6. Note that the metal plating 10 around the edge of the island 1 is linearly removed from the island 1 subjected to metal plating so as to surround the periphery of the semiconductor chip 5 to be arranged. Thus, when a part of the metal plating 1 is removed, when the semiconductor chip 5 is placed on the island 1 and attached, the brazing material is used by utilizing the poor wettability due to the removal of the metal plating 10. 6 to prevent excessive outflow.
ところで、前記した特許文献3に開示されている濡れ性の悪さを利用する先行技術を、特許文献1および特許文献2などに適用することも考えられる。すなわち、接続子が配置される半導体チップの取付け面に予めメッキを施し、このメッキの一部を配置される接続子の外周形状に応じて取り除く。このようにメッキの一部が取り除かれたことで、接続子を取り付ける際、濡れ性の悪さを利用して、半田の過剰な流出の防止を図ることができる。
しかし、前記した接続子の取り付けでは、濡れ性の悪さを利用して半田の流出を防止することができるものの、流出が抑制される半田は、湾曲形状の接続子に這い上がり易くなる恐れがある。この場合、半田の這い上がりの有無によって、接続子を取り付けるための半田量の過不足を招いてしまい、良好な接続強度を安定して得ることができない恐れがある。 However, the attachment of the connector described above can prevent the solder from flowing out by using poor wettability, but the solder that is suppressed from flowing out may be likely to creep up to the curved connector. . In this case, depending on the presence or absence of solder creeping, the amount of solder for attaching the connector may be excessive or insufficient, and it may not be possible to stably obtain good connection strength.
また、半田が這い上がる量を見越して予め半田の供給量を多くした場合には、溶融させた半田における接続子の浮力と自重とのバランス調整が難しく、半田の這い上がりの有無又は這い上がり量によって、溶融させた半田において、接続子の浮力を得ることができず、溶融半田の表面張力を利用して所望の位置に接続子を配置させる、いわゆるセルフアライメントを図ることができず、良好な接続強度を安定して得ることができない恐れがある。 Also, if the amount of solder supplied is increased in advance in anticipation of the amount of solder rising, it is difficult to adjust the balance between the buoyancy of the connector and the weight of the molten solder. Therefore, in the melted solder, the buoyancy of the connector cannot be obtained, so that the so-called self-alignment in which the connector is arranged at a desired position using the surface tension of the molten solder cannot be achieved. There is a possibility that the connection strength cannot be obtained stably.
そこで、本発明は上記した事情に鑑みてなされたものであり、本発明の目的は良好な接続強度を安定して得ることができる接続子の接続方法および該接続方法を用いた接続構造を提供することにある。 Accordingly, the present invention has been made in view of the above circumstances, and an object of the present invention is to provide a connection method of a connector that can stably obtain good connection strength, and a connection structure using the connection method. There is to do.
本発明は、前記目的を達成するために創案されたものであり、湾曲形状の一方の先端に接続面を有する接続子を、前記接続面と平行を成すと共に該接続面よりも広い取付け面を有する半導体チップ上に所定量の溶融させた半田を用いて面接続する前記接続子の接続方法において、前記半田において、浮力を得るために少なくとも前記接続面の面積および自重が考慮された接続子を用意する工程と、用意した前記接続子よりも前記半田との親和性を有するメッキを前記接続面に施す工程と、前記半導体チップの前記取付け面上に、前記メッキを施した前記接続子を前記半田を用いて取付ける工程と、を備えており、前記接続面において該接続面に連成される前記湾曲形状の近傍を除く領域に前記メッキを施すことを特徴とする。
The present invention was devised to achieve the above object, and a connector having a connection surface at one end of a curved shape has a mounting surface that is parallel to the connection surface and wider than the connection surface. In the connection method of the connector for performing surface connection using a predetermined amount of melted solder on a semiconductor chip having, in the solder , a connector considering at least the area of the connection surface and its own weight in order to obtain buoyancy wherein the step of providing, a step of plating the said connecting surface than prepared the connector having an affinity for the solder Prefecture, on the mounting surface of the semiconductor chip, said connector having been subjected to the plating A step of attaching using solder , wherein the plating is performed on a region of the connection surface excluding the vicinity of the curved shape coupled to the connection surface .
湾曲形状の一方の先端に接続面を有する接続子を、前記接続面と平行を成すと共に該接続面よりも広い取付け面を有する半導体チップ上に所定量の溶融させた半田を用いて面接続する接続子の接続構造において、前記接続子は、前記半田において浮力を得るために少なくとも前記接続面の面積および自重が考慮されており、当該接続子よりも前記半田との親和性を有するメッキが前記接続面に施されており、前記半導体チップの前記取付け面上に、前記メッキが施された前記接続子が前記半田を用いて取付けられており、前記接続面において該接続面に連成される前記湾曲形状の近傍を除く領域に前記メッキが施されていることを特徴とする。
A connector having a connection surface at one end of the curved shape is surface-connected using a predetermined amount of molten solder on a semiconductor chip that is parallel to the connection surface and has a mounting surface wider than the connection surface. in the connection structure of the connector, the connector, the area and the self-weight of at least the connecting surface has been considered in order to obtain a buoyancy in the solder, plating than the connector having an affinity for the solder Metropolitan said Connected to the connecting surface, and the plated connector is attached to the mounting surface of the semiconductor chip using the solder , and is connected to the connecting surface at the connecting surface. The plating is performed on a region excluding the vicinity of the curved shape .
本発明によれば、少なくとも接続面の面積および自重を考慮して、所定量の溶融させた半田において浮力を得る接続子の裏面に、接続子よりも半田との親和性有するメッキを選択的に施すことにより、半田との親和性効果を利用して半田の這い上がりを防止する。これにより半田の這い上がりを防止することができ、半田の這い上がりの有無によって生じる接続子を取り付けるための半田量の過不足が無く、もって良好な接続強度を安定して得ることができる。 According to the present invention, in consideration of at least the area of the connection surface and its own weight, a plating having affinity for solder rather than the connector is selectively applied to the back surface of the connector that obtains buoyancy in a predetermined amount of molten solder. By applying the solder, it is possible to prevent the solder from creeping up by utilizing the affinity effect with the solder. As a result, it is possible to prevent the solder from creeping up, and there is no excess or deficiency in the amount of solder for attaching the connector caused by the presence or absence of solder creeping, so that good connection strength can be stably obtained.
また、本発明によれば、接続子の接続面にメッキを施すことにより、半田との親和性を利用して半田の這い上がりを防止することができることから、半田の供給量を予め定めることができ、また定めた条件下の溶融半田において浮力を得る接続子を予め用意することができる。これにより、溶融半田における表面張力を利用して所望の位置に接続子を配置させることができ、良好なセルフアライメントを得ることができ、もって良好な接続強度を安定して得ることができる。 In addition, according to the present invention, by plating the connection surface of the connector, it is possible to prevent the solder from creeping up by utilizing the affinity with the solder. In addition, a connector for obtaining buoyancy in molten solder under a predetermined condition can be prepared in advance. As a result, the connector can be arranged at a desired position using the surface tension of the molten solder, and good self-alignment can be obtained, so that good connection strength can be stably obtained.
本発明の接続子の取付構造10は、図1に示すように半導体チップ1と、該半導体チップ1上に接続子2を半田3を用いて取付けられた構造であり、これらが図示省略のフレーム上に実装される。 The connector mounting structure 10 of the present invention is a structure in which a semiconductor chip 1 and a connector 2 are mounted on the semiconductor chip 1 using solder 3 as shown in FIG. Implemented above.
半導体チップ1の表面には電極が形成されており、該電極は接続子2を取付けるための取付け面11として機能する。 An electrode is formed on the surface of the semiconductor chip 1, and the electrode functions as an attachment surface 11 for attaching the connector 2.
接続子2は、アルミを主材とする矩形状の板材に折り曲げ加工を施して形成される。矩形状の板材の一端側が半導体チップの取付け面と対向する接続面21を成し、他端側が半導体チップの底面と同じ面高さを有する第2の接続面23を成し、該接続面21の端から上部へ向って弧を描き第2の接続面23へと続く湾曲部22を成し、これらが一体的に形成されている。 The connector 2 is formed by bending a rectangular plate material mainly made of aluminum. One end side of the rectangular plate material forms a connection surface 21 facing the mounting surface of the semiconductor chip, and the other end side forms a second connection surface 23 having the same surface height as the bottom surface of the semiconductor chip. An arc is drawn from the end to the top to form a curved portion 22 continuing to the second connecting surface 23, and these are integrally formed.
接続子2は、半導体チップ1と半田3を介して接続するための接続面21を有しており、該接続面21は、取り付け面11よりも狭く形成されている。尚、接続面21は、半導体チップ1の取付け面11に半田3で面接続される。 The connector 2 has a connection surface 21 for connecting to the semiconductor chip 1 via the solder 3, and the connection surface 21 is formed narrower than the attachment surface 11. The connection surface 21 is connected to the mounting surface 11 of the semiconductor chip 1 by solder 3.
また接続子2は溶融した半田3において浮力を得るべく、自重および接続面21の面積が適宜設定されている。 Further, the weight of the connector 2 and the area of the connection surface 21 are appropriately set so as to obtain buoyancy in the molten solder 3.
接続子2は、図1および図2に示すように接続面21が半導体チップ1の取付け面よりも狭くなるように形成されており、接続面21には周縁および連成される湾曲部22の近くを除く領域にメッキ24が施されている。尚、メッキ24には、半田付けが可能なニッケルや金などが用いられている。
As shown in FIGS. 1 and 2, the connector 2 is formed such that the connection surface 21 is narrower than the mounting surface of the semiconductor chip 1, and the connection surface 21 has a peripheral edge and a curved portion 22 coupled thereto. Plating 24 is applied to areas other than the vicinity. The plating 24 is made of nickel or gold that can be soldered.
接続面21に形成されるメッキ24は、接続子2(素地)よりも半田3との親和性がある。これにより、半田3とメッキ24との親和性により、溶融した半田3がメッキ24に接する部位に留まり易く、半田が接続子2の湾曲部22に這い上がることを防止することができる。 The plating 24 formed on the connection surface 21 is more compatible with the solder 3 than the connector 2 (base). Thereby, due to the affinity between the solder 3 and the plating 24, the melted solder 3 can easily stay at the portion in contact with the plating 24, and the solder can be prevented from creeping up to the curved portion 22 of the connector 2.
これにより、半田の這い上がりの有無によって生じる接続子を取り付けるための半田量の過不足が生じることがなく、接続に用いる半田量を一定に保つことができるため、半田量に起因する接続強度のブレが低減し、接続子2と半導体チップ1との接続強度を安定させることができる。 As a result, the amount of solder used for connection can be kept constant without causing an excess or deficiency in the amount of solder for attaching a connector due to the presence or absence of solder creeping, so that the connection strength caused by the amount of solder can be maintained. Blur is reduced, and the connection strength between the connector 2 and the semiconductor chip 1 can be stabilized.
また、溶融した半田で浮力を得るように接続子2の自重および接続面21の面積を適宜設定すると共に、接続面21にメッキ24を施すことにより、溶融半田の表面張力を利用して所望の位置に接続子を配置させる、いわゆるセルフアライメントを得ることができる。 Further, the weight of the connector 2 and the area of the connection surface 21 are appropriately set so as to obtain buoyancy with the molten solder, and by applying the plating 24 to the connection surface 21, a desired tension can be obtained using the surface tension of the molten solder. A so-called self-alignment in which a connector is arranged at a position can be obtained.
ところでセルフアライメントをより得るために、接続面21に施すメッキ24を接続面21全面に施すことなく、例えば図2に示すように周縁および連成される湾曲部22の近くの領域(非メッキ領域25)を除くようにメッキを施してもよい。また、図3(a)に示すように周縁や連成される湾曲部22の接続辺および該接続面に対向する辺を除いてメッキ24を施すようにしてもよい。このような形状にメッキを施した場合でも、溶融した半田によるセルフアライメントを得ることができる。
However the self-alignment to more obtain, without plating 24 applied to the connection surface 21 to the connecting surface 21 entirely, near the region (non-plated region of the bending portion 22 to be made periphery and communicating, for example, as shown in FIG. 2 Plating may be performed so as to exclude 25). Further, as shown in FIG. 3A, the plating 24 may be applied except for the peripheral edge , the connecting side of the curved portion 22 to be coupled, and the side facing the connecting surface. Even when such a shape is plated, self-alignment with molten solder can be obtained.
また、図3(b)に示すように接続面21に十字を基調とする(十字、田の字など)非メッキ領域25が形成されるようにメッキ24を施してもよい。この非メッキ領域25は、メッキ24領域と比較して溶融した半田がのり難く、これを利用して非メッキ領域25を半田に含まれるガスを抜くための経路として活用することができる。尚、非メッキ領域25はこの形状に限定する必要はなく同様の効果を得ることができる範囲内で、適宜その形状を変更してもよい。
Further, as shown in FIG. 3B, plating 24 may be performed so that a non-plating region 25 having a cross as a keynote (cross, letter shape, etc.) is formed on the connection surface 21. The non-plated region 25 is less likely to deposit molten solder than the plated 24 region, and the non-plated region 25 can be used as a path for removing the gas contained in the solder by utilizing this. Note that the non-plated region 25 does not have to be limited to this shape, and the shape may be changed as appropriate within a range in which a similar effect can be obtained.
更に図3(d)に示すように、接続面21に溝26を設け、溝26が形成されていない領域にメッキ24を施すようにしてもよい。この場合も、溝26が半田に含まれるガスを抜くための経路となる。 Further, as shown in FIG. 3D, a groove 26 may be provided on the connection surface 21 and plating 24 may be applied to a region where the groove 26 is not formed. Also in this case, the groove 26 becomes a path for removing the gas contained in the solder.
加えて、図3(c)に示すように接続面21に市松模様のようにメッキ24を施してもよく、この場合、メッキ24を施す領域を分割することで、四隅に施したメッキ24でセルフアライメント効果を得ることができる。更に、四隅の中心に施されたメッキ24付近は熱応力が低いため熱応力の影響を受けにくく、結果的に熱疲労の防止も図ることができる。 In addition, as shown in FIG. 3 (c), the connection surface 21 may be plated 24 like a checkered pattern. In this case, by dividing the area where the plating 24 is applied, the plating 24 is applied to the four corners. A self-alignment effect can be obtained. Furthermore, since the thermal stress is low in the vicinity of the plating 24 applied to the center of the four corners, it is not easily affected by thermal stress, and as a result, thermal fatigue can be prevented.
次に、接続子の接続方法を説明する。
先ず、アルミを主材とする接続子2を用意する(ステップS1)。
接続子2は、図1に示すように、湾曲部22の一方の先端に接続面21を有し、他方の先端に第2の接続面23を有しており、これらが一体的に形成されている。
Next, a method for connecting connectors will be described.
First, a connector 2 whose main material is aluminum is prepared (step S1).
As shown in FIG. 1, the connector 2 has a connection surface 21 at one end of the bending portion 22 and a second connection surface 23 at the other end, which are integrally formed. ing.
尚、用意する接続子2は、溶融した半田において浮力を得るべく、少なくとも自重および接続面21の面積が適宜設定されている。 The prepared connector 2 has at least its own weight and the area of the connection surface 21 appropriately set so as to obtain buoyancy in molten solder.
次に、用意した接続子2の接続面21であって、半導体チップ1上の取付け面11に対向する裏面側にニッケルを用いてメッキ24を施す(ステップS2)。尚、メッキは、接続面21全面に施されておらず、具体的には周縁および連成される湾曲部22の近くの領域にはメッキが施されていない。尚、ニッケルを用いたメッキ24は、アルミと比較して半田との親和性があり、いわゆる半田の濡れが良い。
Next, plating 24 is performed using nickel on the back surface side of the prepared connector 2 which faces the mounting surface 11 on the semiconductor chip 1 (step S2). The plating is not applied to the entire connection surface 21, and specifically, the peripheral edge and the region near the coupled curved portion 22 are not plated. Note that the plating 24 using nickel has an affinity for solder as compared with aluminum, and so-called wetness of solder is good.
従って、素地がアルミの接続子2の接続面21にメッキを施し、これに溶融した半田が供給されると、半田との親和性の乖離差によって、メッキに半田が留まり易い。 Accordingly, when the base material is plated on the connection surface 21 of the aluminum connector 2 and molten solder is supplied thereto, the solder tends to remain in the plating due to the difference in affinity with the solder.
次に、取付け面11と接続面21とを対向させるべく、半導体チップ1上に接続子2を配置し、取付け面11と接続面21との間を半田を用いて接続する(ステップS3)。 Next, in order to make the attachment surface 11 and the connection surface 21 face each other, the connector 2 is disposed on the semiconductor chip 1, and the attachment surface 11 and the connection surface 21 are connected using solder (step S3).
尚、半田を用いた接続は、半導体チップ1上に接続子2を配置した後に溶融した半田を適量供給してもよく、また予め半導体チップ上の取付け面11上にクリーム半田などを塗布しておき、その上に接続子2を配置した後、リフローによって半田を溶融させてもよい。 For the connection using solder, an appropriate amount of melted solder may be supplied after the connector 2 is arranged on the semiconductor chip 1, or cream solder or the like is previously applied on the mounting surface 11 on the semiconductor chip. In addition, after the connector 2 is disposed thereon, the solder may be melted by reflow.
いずれの場合であっても、取付け面11と接続面21との間において、接続面21に施されたメッキの親和性により、溶融した半田はメッキ上に留まり易い。これにより、半田が接続子2の湾曲部22に這い上がることを防止することができ、半田の這い上がりの有無によって生じる接続子を取り付けるための半田量の過不足が生じることがなく、接続に用いる半田量を一定に保つことができるため、半田量に起因する接続強度のブレを低減できる、結果的に接続子2と半導体チップ1との接続強度を安定させることができる。 In any case, the molten solder tends to stay on the plating between the attachment surface 11 and the connection surface 21 due to the affinity of the plating applied to the connection surface 21. As a result, it is possible to prevent the solder from climbing up to the curved portion 22 of the connector 2, and there is no excess or deficiency in the amount of solder for attaching the connector due to the presence or absence of solder creeping up. Since the amount of solder used can be kept constant, it is possible to reduce the fluctuation in connection strength due to the amount of solder, and as a result, the connection strength between the connector 2 and the semiconductor chip 1 can be stabilized.
また、本発明の接続方法によれば、接続子2は溶融半田の表面張力を利用して浮力を得ており、セルフアライメント効果を得て、半導体チップ1上の所望位置に接続子2を配置させることができ、適切な配置によって接続子2と半導体チップ1との接続強度をより安定させることができる。 Further, according to the connection method of the present invention, the connector 2 obtains buoyancy using the surface tension of the molten solder, obtains a self-alignment effect, and places the connector 2 at a desired position on the semiconductor chip 1. The connection strength between the connector 2 and the semiconductor chip 1 can be further stabilized by an appropriate arrangement.
前記した実施例の説明に用いた図では、接続子2の接続面21に施すメッキの形状は方形状を基本とする例で説明を行ったが、本発明はこれに限る必要はなく、本発明と同様の効果を得ることができる範囲内において例えば円状、矩形状、縞状などの様々な形状にメッキを施すようにしても良い。 In the figure used for description of the above-described embodiment, the shape of the plating applied to the connection surface 21 of the connector 2 has been described as an example based on a square shape. However, the present invention is not limited to this, and the present invention is not limited to this. For example, various shapes such as a circular shape, a rectangular shape, and a stripe shape may be plated within a range in which the same effect as the invention can be obtained.
また、前記した実施例の説明に用いた図では、接続子2の接続面21や半導体チップ1の取付け面11の面形状は方形を例に説明を行ったが、本発明はこれに限る必要は無く、面形状を適宜変更しても良い。また、面形状以外のその他の構成の形状も、実施例の説明に用いた図の形状に限定する必要は無く、本発明と同様の効果を得ることができる範囲内で適宜、その形状を変更してもよい。 Moreover, in the figure used for description of an above-described Example, although the surface shape of the connection surface 21 of the connector 2 or the attachment surface 11 of the semiconductor chip 1 was demonstrated to the example of a square, this invention needs to be restricted to this. However, the surface shape may be changed as appropriate. Further, it is not necessary to limit the shape of the configuration other than the surface shape to the shape of the figure used in the description of the embodiments, and the shape is appropriately changed within a range where the same effect as the present invention can be obtained. May be.
1 半導体チップ
2 接続子
3 半田
10 接続子の接続構造
11 取付け面
21 接続面
22 湾曲部
23 第2の接続面
24 メッキ
25 非メッキ領域
26 溝
DESCRIPTION OF SYMBOLS 1 Semiconductor chip 2 Connector 3 Solder 10 Connector connection structure 11 Mounting surface 21 Connection surface 22 Curved portion 23 Second connection surface 24 Plating 25 Non-plating region 26 Groove
Claims (12)
前記半田において、浮力を得るために少なくとも前記接続面の面積および自重が考慮された接続子を用意する工程と、
用意した前記接続子よりも前記半田との親和性を有するメッキを前記接続面に施す工程と、
前記半導体チップの前記取付け面上に、前記メッキを施した前記接続子を前記半田を用いて取付ける工程と、を備えており、
前記接続面において該接続面に連成される前記湾曲形状の近傍を除く領域に前記メッキを施すことを特徴とする接続子の接続方法。 A connector having a connection surface at one end of the curved shape is surface-connected using a predetermined amount of molten solder on a semiconductor chip that is parallel to the connection surface and has a mounting surface wider than the connection surface. In the connection method of the connector,
In the solder , preparing a connector that takes into account at least the area of the connection surface and its own weight in order to obtain buoyancy;
A step of applying plating having affinity for the solder to the connecting surface rather than the prepared connector ;
Mounting the plated connector on the mounting surface of the semiconductor chip using the solder , and
A method of connecting a connector, wherein the plating is performed on a region of the connection surface excluding the vicinity of the curved shape coupled to the connection surface .
前記接続子は、前記半田において浮力を得るために少なくとも前記接続面の面積および自重が考慮されており、当該接続子よりも前記半田との親和性を有するメッキが前記接続面に施されており、
前記半導体チップの前記取付け面上に、前記メッキが施された前記接続子が前記半田を用いて取付けられており、
前記接続面において該接続面に連成される前記湾曲形状の近傍を除く領域に前記メッキが施されていることを特徴とする接続子の接続構造。 A connector having a connection surface at one end of the curved shape is surface-connected using a predetermined amount of molten solder on a semiconductor chip that is parallel to the connection surface and has a mounting surface wider than the connection surface. In the connection structure of the connector,
In order to obtain buoyancy in the solder , the connector takes into account at least the area of the connection surface and its own weight, and the connection surface is plated with affinity for the solder rather than the connector. ,
On the attachment surface of the semiconductor chip, the plated connector is attached using the solder ,
A connection structure for a connector, wherein the plating is applied to a region of the connection surface excluding the vicinity of the curved shape coupled to the connection surface .
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