JP5206238B2 - Inspection system for power supply circuit board with wireless IC - Google Patents

Description

The present invention relates to an inspection system for a power supply circuit board with a wireless IC , and more particularly to an inspection system for a power supply circuit board with a wireless IC constituting a wireless IC device used in an RFID (Radio Frequency Identification) system.

  Conventionally, as an article management system, a reader / writer that generates an induction electromagnetic field and a wireless tag (also referred to as a wireless IC device) that stores predetermined information attached to the article are communicated in a non-contact manner to transmit the information. RFID systems have been developed. As an apparatus for inspecting a wireless tag used in this type of RFID system, Patent Document 1 discloses an apparatus that measures a scattering parameter in a non-contact manner for an inlet in which an IC chip and an antenna are integrated, and determines pass / fail. Is described. In this inspection apparatus, measurement / inspection is performed on a card substrate sheet in which a plurality of inlets are aligned while switching a detection head prepared for each inlet with the switching apparatus.

However, in the inspection apparatus described in Patent Document 1, one detection head is required for one inlet, and a switching device for switching the detection head is also required, which complicates the inspection apparatus, Expensive. Further, since the inspection is performed while switching for each inlet, there is a problem that the inspection time becomes long due to the switching time.
JP 2002-7969 A

SUMMARY OF THE INVENTION An object of the present invention is to provide an inspection system capable of performing inspection (reading and / or writing of data) on a power supply circuit board with a wireless IC in a short time with a simplified apparatus.

In order to achieve the above object, an inspection system for a power supply circuit board with a wireless IC according to the first aspect of the present invention comprises:
An inspection system for a power supply circuit board with a wireless IC comprising a wireless IC and a power supply circuit board having a power supply circuit including an inductance element coupled to the wireless IC ,
In a state where a plurality of the wireless IC with power feeding circuit board is collectively in a plane, Bei give a reading and / or writing which may probe data simultaneously bind to the feeding circuit of the plurality of radio IC with the power supply circuit board,
The power supply circuit board with the wireless IC includes a terminal electrode coupled to the power supply circuit,
The probe is in direct contact with the terminal electrode to read and / or write data;
It is characterized by.
The inspection system for the power supply circuit board with wireless IC according to the second embodiment of the present invention is as follows.
An inspection system for a power supply circuit board with a wireless IC comprising a wireless IC and a power supply circuit board having a power supply circuit including an inductance element coupled to the wireless IC,
In a state where a plurality of power supply circuit boards with wireless ICs are assembled in a plane, a probe capable of reading and / or writing data by being simultaneously coupled to power supply circuits of a plurality of power supply circuit boards with wireless ICs,
The probe has a loop shape with two ends connected to a reader / writer;
It is characterized by.

Wherein the wireless IC with the power supply circuit board inspection system, and the feeder circuit board with radio IC, the wireless IC device capable of communicating with the electromagnetic wave of the reader / writer and predetermined frequency RFID systems by combining the radiation plate It is a component.

According to the present invention includes the reading and / or writing a probe capable of data simultaneously bind to the feed circuit provided in each of a plurality of radio IC with the power supply circuit board, a plurality of wireless IC with power supply circuit The board can be simultaneously inspected (reading and / or writing data), and it is not necessary to replace the probe with respect to a plurality of power supply circuit boards with wireless ICs, so that the inspection can be performed in a short time. In addition, the inspection apparatus can be simplified by providing probes for the necessary number of power supply circuit boards with wireless ICs .

Embodiments of an inspection system for a power supply circuit board with a wireless IC according to the present invention will be described below with reference to the accompanying drawings. In addition, in each Example demonstrated below, the same code | symbol is attached | subjected to the same components and parts, and the overlapping description is abbreviate | omitted. The power supply circuit board with the wireless IC will be described as an electromagnetic coupling module.

(Refer to the first embodiment, FIGS. 1 to 11)
As shown in FIG. 1, the inspection system 10 </ b> A according to the first embodiment has a plurality of elongated first probes 21 and second probes 22 arranged alternately adjacent to each other on a substrate 11. . The first and second probes 21 and 22 are electrodes formed on the substrate 11, each having one end electrically connected and connected to the reader / writer 15.

  FIG. 2 shows a state in which a plurality of electromagnetic coupling modules 100 are installed on the substrate 11 shown in FIG. 1 for inspection. The electromagnetic coupling module 100 is formed in a matrix in a plurality of units on one parent substrate, and is divided into units by being cut by a one-dot chain line A later.

  As shown in FIG. 3, each electromagnetic coupling module 100 includes a wireless IC chip 105 that processes a signal of a predetermined frequency, and a power feeding circuit 115 (matching circuit and / or resonance) including inductance elements L1 and L2 and capacitance elements C1 and C2. Circuit) 110 with a built-in circuit). The terminal electrodes 111a and 111b provided on the back surface side of the feeder circuit board 110 communicate with the reader / writer 15 via the radiation plates 120a and 120b by electromagnetic coupling or direct electrical connection with the radiation plates 120a and 120b. The wireless IC chip 105 includes a clock circuit, a logic circuit, a memory circuit, and the like, and a pair of input / output terminal electrodes are electrically connected to terminals of the power feeding circuit 115. Note that the power feeding circuit 115 can employ various configurations. Further, the wireless IC may not be a chip type but may be formed integrally with the power supply circuit board 110.

  Terminal electrodes 111 a and 111 b provided on the back side of the power supply circuit board 110 of each electromagnetic coupling module 100 are opposed to the first and second probes 21 and 22, and the first and second probes 21 and 22 are connected to the power supply circuit 115. Join. Then, by transmitting a predetermined signal from the reader / writer 15 through the first and second probes 21 and 22, the wireless IC chip 105 is driven via the power feeding circuit 115, and the signal from the wireless IC chip 105 is the first signal. And transmitted to the reader / writer 15 via the second probes 21 and 22.

  FIG. 4 shows a first example in which the electromagnetic coupling module 100 is disposed on the substrate 11, and terminal electrodes 111 a and 111 b are built in the back surface side of the feeder circuit substrate 110. In the first example, the first and second probes 21 and 22 and the terminal electrodes 111a and 111b are magnetically coupled or electric field coupled. Reference numeral 106 denotes a protective film (resin film) of the wireless IC chip 105.

  FIG. 5 shows a second example, in which the terminal electrodes 111 a and 111 b are provided exposed on the back surface of the feeder circuit board 110. In the second example, the first and second probes 21 and 22 and the terminal electrodes 111a and 111b are electromagnetically coupled and electrically connected. FIG. 6 shows a third example. The terminal electrodes 111 a and 111 b are built in the back side of the feeder circuit board 110, and the first and second probes 21 and 22 are also built in the board 11.

  FIG. 7 shows a fourth example, in which the electromagnetic coupling module 100 is divided into units, and the protective film 106 side is adhered to the adhesive sheet 19 in a matrix. FIG. 8 shows a fifth example. After the electromagnetic coupling module 100 is divided into units, the back surface side of the power supply circuit board 110 is stuck to the adhesive sheet 19 in a matrix.

  FIG. 9 shows a sixth example, in which the electromagnetic coupling modules 100 that have already been cut into units are provided in adjacent spaces and arranged in a matrix on a tray (not shown). The electromagnetic coupling module 100 in a state where the parent substrate is cut with a dicer having a predetermined width is also inspected with the cut state.

  In each arrangement of FIGS. 4 to 9, the inspection system executes writing and reading of ID to each module in the following procedure. The reader / writer 15 is provided with a filter function. First, one module is selected at random, and IDs are sequentially written from “000000001”. In FIG. 10, IDs are sequentially written to 18 modules 1 to 18.

  Here, the filter is set to “000 ******” and the reader / writer 15 is set so that only modules having IDs other than “000 ******” write IDs. . Note that * means any number or alphabet. In addition, “000 ******” is set to an ID different from the ID to be written. In this way, a unique serial number can be written to all modules.

  For reference, FIG. 11 shows an example of a method for selecting one module for writing an ID from a plurality of modules. First, a random number generation command is issued from the reader / writer to all modules. This random number is different from the ID. Each module that receives the command generates a different random number. Next, the reader / writer selects a predetermined random number and issues a command to respond only to the module that generated the random number. Then, only the module that has generated the predetermined random number receives the response command, and the module that writes the ID can be selected by responding from the module to the reader / writer. The selected module can be written or inspected by the above-described method.

  In the inspection system 10A, in addition to writing data to each electromagnetic coupling module 100, the characteristics of the wireless IC chip 105 and the power supply circuit board 110 can be measured to inspect non-defective products and defective products.

  Since the inspection system 10A described above includes the first and second probes 21 and 22 that can be simultaneously coupled to the power supply circuits 115 of the plurality of electromagnetic coupling modules 100 to read and / or write data, The electromagnetic coupling modules 100 can be simultaneously inspected (data reading and / or writing), and it is not necessary to replace the probes 21 and 22 for a plurality of electromagnetic coupling modules 100, so that inspection can be performed in a short time. It is. Moreover, it is sufficient if the necessary number of probes 21 and 22 for the electromagnetic coupling modules 100 are provided, and the apparatus can be simplified.

(Refer to the second embodiment, FIG. 12)
As shown in FIG. 12, the inspection system 10B according to the second embodiment is a system in which probes 23 and 24 excluding both ends are made wide and integrated. One end of each of the first probe 23 and the second probe 24 is electrically connected and is connected to the reader / writer 15. In other words, the second embodiment shares a probe for the adjacent electromagnetic coupling module 100.

  The operation of the second embodiment is the same as that of the first embodiment, and the effect is the same as that of the first embodiment. In particular, since the widths of the probes 23 and 24 are widened, the process of forming the probes 23 and 24 on the substrate is facilitated, and the wiring is simplified.

(Refer to the third embodiment, FIG. 13)
The inspection system 10C according to the third embodiment is provided with a changeover switch 31 at one end of the first probe 21, as shown in FIG. By switching the switch 31, only one specific first probe 21 can be operated, and the electromagnetic coupling module 100 to be inspected can be selected for each column. The switch 31 may be configured so that a plurality of first probes 21 can be selected simultaneously.

  The operation of the third embodiment is the same as that of the first embodiment, and the effect is the same as that of the first embodiment. In particular, since the operation of the first probe 21 can be switched, the module 100 can write a desired ID for each column and measure characteristics.

(Refer to the fourth embodiment, FIG. 14)
As shown in FIG. 14, the inspection system 10 </ b> D according to the fourth embodiment divides the first probe 21 into individual probes that are coupled to the power feeding circuit 115 of the single electromagnetic coupling module 100. A changeover switch 32 is provided on the probe 21. Only one switch 32 may be turned on, or a plurality of switches 32 may be turned on at the same time, and a desired ID can be written in any electromagnetic coupling module 100 and characteristics can be measured.

  The operation of the fourth embodiment is the same as that of the first embodiment, and the effect is the same as that of the first embodiment. In particular, since the first probe 21 can be individually turned on / off, inspection (reading and writing) for a specific electromagnetic coupling module 100 is possible, and history information for the specific electromagnetic coupling module 100 is stored in, for example, the reader / writer 15. Can be kept in memory. Therefore, when a malfunction is discovered after the electromagnetic coupling module 100 is shipped, the history of the module 100 can be traced.

(Refer to the fifth embodiment, FIG. 15)
In the inspection system 10E according to the fifth embodiment, as shown in FIG. 15, the first and second probes 21 and 22 are, for example, ¼ size with respect to the parent substrate of the electromagnetic coupling module 100. . In the fifth embodiment, the electromagnetic coupling module 100 formed on one parent substrate is divided into four blocks, and ID writing or characteristic measurement is performed. The operation and effects are as described in the first embodiment, and it is possible to cope with an increase in the size of the parent substrate of the electromagnetic coupling module 100.

(Refer to the sixth embodiment, FIGS. 16 and 17)
As shown in FIG. 16, the inspection system 10 </ b> F according to the sixth embodiment is a loop-shaped probe 25, and both ends of the probe 25 are connected to the reader / writer 15. The power feeding circuit 115 of the electromagnetic coupling module 100 is formed so as to include coils 117 as shown in FIG. 17, and each coil 117 is mainly magnetically coupled to the probe 25 in which currents flow in opposite directions on both sides. Operations and effects are the same as those in the first embodiment.

(Refer to the seventh embodiment, FIG. 18)
As shown in FIG. 18, the inspection system 10G according to the seventh embodiment is the same as the sixth embodiment in that a loop-shaped probe 25 is used. The difference is that the probes of adjacent electromagnetic coupling modules 100 are shared. The operations and effects of the seventh embodiment are the same as those of the first and sixth embodiments. Particularly, since the probe 25 is halved, the process of forming the probe 25 on the substrate becomes easy. Wiring is also simplified.

(See the eighth embodiment, FIG. 19)
In the inspection system 10H according to the eighth embodiment, as shown in FIG. 19, a changeover switch 33 is provided at one end of the first probe 21, and the second probe 22 is connected to the power supply circuit 115 of the single electromagnetic coupling module 100. The switches are divided into individual probes to be coupled, and a changeover switch 34 is provided for each second probe 22. It is possible to write IDs to a plurality of modules by arbitrarily selecting the ON positions of the switches 33 and 34, or to write IDs to all modules simultaneously by turning on all the contacts. FIG. 19 shows a case where the switches 33 and 34 select the contacts 33a and 34a to be ON, and writing is performed on the shaded modules.

(Summary of Examples)
In the electromagnetic coupling module inspection system, in a state where a plurality of electromagnetic coupling modules are assembled in a plane, a probe capable of reading and / or writing data by simultaneously coupling to a power supply circuit of the plurality of electromagnetic coupling modules is provided. The probe is connected to a reader / writer.

  The probe reads and / or writes data by electromagnetically coupling with the power feeding circuit of the power feeding circuit board by magnetic field coupling and / or electric field coupling. The electromagnetic coupling module may include a terminal electrode coupled to the power supply circuit, and the probe may read and / or write data in direct contact with the terminal electrode. The probe is disposed on the other main surface side facing the one main surface of the power supply circuit board on which the wireless IC is mounted.

  The probe may be in the form of a loop with two ends connected to the reader / writer. Alternatively, each probe includes a plurality of first probes and second probes, and at least one of the first and second probes has an elongated shape, and the first and second probes are coupled to the plurality of electromagnetic coupling modules. You may comprise.

  Both the first and second probes have an elongated shape, and may be alternately arranged adjacent to each other on a plane. At least one of the first and second probes may be electrically connected at one end thereof.

  At least one of the first and second probes may include switching means for selecting one specific probe at one end thereof. Alternatively, either one of the first and second probes may be an individual probe coupled to a power supply circuit of a single electromagnetic coupling module, and may include switching means for selecting the individual probe.

(Other examples)
The inspection system for the power supply circuit board with wireless IC according to the present invention is not limited to the above-described embodiment, and can be variously modified within the scope of the gist thereof.

It is a top view which shows the inspection system which is 1st Example. It is a top view which shows the state which has arrange | positioned the electromagnetic coupling module gathered to the test | inspection system which is 1st Example. It is a typical sectional view showing an electromagnetic coupling module. It is sectional drawing which shows the 1st example of arrangement | positioning relationship in 1st Example. It is sectional drawing which shows the 2nd example of arrangement | positioning relationship in 1st Example. It is sectional drawing which shows the 3rd example of arrangement | positioning relationship in 1st Example. It is sectional drawing which shows the 4th example of arrangement | positioning relationship in 1st Example. It is sectional drawing which shows the 5th example of arrangement | positioning relationship in 1st Example. It is a top view which shows the 6th example of arrangement | positioning relationship in 1st Example. It is explanatory drawing which shows the write-in procedure to a module. It is explanatory drawing which shows the selection procedure of a module. It is a top view which shows the inspection system which is 2nd Example. It is a top view which shows the inspection system which is 3rd Example. It is a top view which shows the inspection system which is 4th Example. It is a top view which shows the inspection system which is 5th Example. It is a top view which shows the inspection system which is 6th Example. It is a top view which shows the state which has arrange | positioned the electromagnetic coupling module gathered to the test | inspection system which is 6th Example. It is a top view which shows the inspection system which is 7th Example. It is a top view which shows the inspection system which is 8th Example.

Explanation of symbols

10A to 10H ... Inspection system 15 ... Reader / writer 21-25 ... Probe 31, 32, 33, 34 ... Switch 100 ... Electromagnetic coupling module (power supply circuit board with wireless IC)
DESCRIPTION OF SYMBOLS 105 ... Wireless IC chip 110 ... Feed circuit board 111a, 111b ... Terminal electrode 115 ... Feed circuit 117 ... Coil L1, L2 ... Inductance element

Claims (10)

An inspection system for a power supply circuit board with a wireless IC comprising a wireless IC and a power supply circuit board having a power supply circuit including an inductance element coupled to the wireless IC ,
In a state where a plurality of the wireless IC with power feeding circuit board is collectively in a plane, Bei give a reading and / or writing which may probe data simultaneously bind to the feeding circuit of the plurality of radio IC with the power supply circuit board,
The power supply circuit board with the wireless IC includes a terminal electrode coupled to the power supply circuit,
The probe is in direct contact with the terminal electrode to read and / or write data;
An inspection system for a power supply circuit board with a wireless IC . An inspection system for a power supply circuit board with a wireless IC comprising a wireless IC and a power supply circuit board having a power supply circuit including an inductance element coupled to the wireless IC ,
In a state where a plurality of the wireless IC with power feeding circuit board is collectively in a plane, Bei give a reading and / or writing which may probe data simultaneously bind to the feeding circuit of the plurality of radio IC with the power supply circuit board,
The probe has a loop shape with two ends connected to a reader / writer;
An inspection system for a power supply circuit board with a wireless IC . The said probe is connected to the reader / writer, The inspection system of the electric power feeding circuit board with a radio | wireless IC of Claim 1 or Claim 2 characterized by the above-mentioned. 3. The inspection of a power supply circuit board with a wireless IC according to claim 1 or 2 , wherein the probe is arranged on the other main surface side opposite to one main surface of the power supply circuit board on which the wireless IC is mounted. system. 2. The inspection of a power supply circuit board with a wireless IC according to claim 1, wherein the probe is coupled to the power supply circuit electromagnetically by magnetic field coupling and / or electric field coupling to read and / or write data. system. Each of the probes includes a plurality of first probes and second probes, and at least one of the first and second probes has an elongated shape, and the first and second probes are connected to the plurality of power supply circuit boards with wireless ICs. The inspection system for a power supply circuit board with a wireless IC according to claim 1, wherein the second probe is coupled. 7. The inspection system for a power supply circuit board with a wireless IC according to claim 6 , wherein both the first and second probes have a long shape and are alternately arranged adjacent to each other on a plane. The inspection of the power supply circuit board with wireless IC according to claim 6 or 7 , wherein at least one of the first and second probes is electrically connected at one end thereof. system. Wherein the first and at least one of the second probe, the one end portion thereof, any of claims 6 to 8, characterized in, further comprising a switching means for selecting a particular one probe An inspection system for a power supply circuit board with a wireless IC according to claim 1 . Either of the first and second probes comprises an individual probe coupled to a power supply circuit of a single power supply circuit board with a wireless IC , and has switching means for selecting the individual probe. The inspection system for a power supply circuit board with a wireless IC according to any one of claims 6 to 9 .

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