JP5166200B2 - microscope - Google Patents

Description

  The present invention relates to a transmission illumination optical system that transmits and illuminates a specimen and a microscope including a transmission light source.

  In general, in cytodiagnosis or the like, microscopic observation is performed after organelles in cells are colored by performing Papanicolaou staining or Giemsa staining on the specimen to be used. These stains are dyed in a very light color so that they can be observed with transmitted illumination. In addition, when a site of interest that requires re-examination is found on the specimen, a mark is placed near the site of interest and the marked site is re-microscoped.

  FIG. 1 is a perspective view of an upright optical microscope used in the above-described cytodiagnosis. In the microscope shown in FIG. 1, the objective lens 113 attached to the revolver 112 that is rotated is installed above the stage 105, and the condenser 108 is installed so as to face the illumination opening (not shown) of the stage 105. ing. A specimen 116 fixed on a slide glass or the like is placed on the illumination opening.

  FIG. 10 is a general optical path diagram of the illumination optical system of the microscope having the above configuration. The illumination light emitted from the light source 10 passes through the collector lens 20, passes through the filter 30, is adjusted in brightness and color tone, and then is reflected upward by the mirror 50 through the field stop 40. The light whose direction is changed upward passes through the window lens 60 and the aperture stop 70, passes through the condenser lens 80 accommodated in the condenser 108, and illuminates the specimen 116. At this time, the aperture diameter of the field stop is projected so as to illuminate a region corresponding to the actual field of the objective lens 113.

  When the specimen 116 is observed using the above-described microscope, the specimen 116 is not visually positioned in the vicinity of the optical axis of the objective lens 113 in advance unless the specimen 116 is observed through the microscope with the magnification increased. It takes time and effort to find the position. However, when a sample dyed in light color or a marked sample is placed on the stage 105 surface-treated in black (dark color), the sample 116 is hardly visible, and the sample 116 is fixed anywhere on the slide glass. I don't know.

  Furthermore, even when the specimen 116 is disposed in the illumination opening of the stage 105 (that is, the upper part of the condenser lens 80), it is difficult to visually confirm the specimen 116 regardless of the intensity of the illumination light. This is because the luminous flux of the illumination light is narrowed down to a region corresponding to the actual field of the objective lens 113 by the aperture diameter of the field diaphragm, and when the objective lens 113 is present, the illumination light does not leak outside the objective lens. It is. Therefore, various ideas have been made to make the specimen 116 easy to see visually.

  For example, in FIG. 12 of Patent Document 1, the front lens holding portion that holds the front lens of the condenser lens is coated with a bright white or metallic color, or a white cap is applied to the front lens holding portion. It is disclosed to cover.

  Further, FIG. 2 of Patent Document 1 discloses an illumination unit that transmits and illuminates a specimen from below a microscope stage. A glass plate is installed at the opening of the front end of the illumination unit, and a flat fluorescent lamp is disposed below the glass plate. The flat fluorescent lamp is turned on when power is supplied from a power source arranged outside the illumination unit, and illuminates the area including the visual field of the objective lens and the periphery of the visual field through the glass plate.

JP-A-8-114748

  However, as shown in FIG. 12 of Patent Document 1, when the front lens holding part of the condenser lens is coated with a white or metallic bright color, the specimen is easy to see at that portion, but above the front lens. The visibility of the specimen when the specimen is located is poor. That is, in this configuration, the periphery of the visual field that should be brightest is still dark and difficult to see. In particular, in the case of a condenser lens corresponding to the field of view of the low-magnification objective lens, the lens diameter of the front lens 202a of the condenser lens 80 is large so as to correspond to the wide field diameter of the low-magnification objective lens. There is a problem that the specimen is lost near the optical axis of the lens.

  In addition, when the specimen is illuminated with a flat fluorescent lamp as shown in FIG. 2 of Patent Document 1, the visual field of the objective lens and the visibility around the visual field are enhanced, but the configuration of the illumination unit is complicated, and a dedicated illumination member Therefore, there is a problem in cost.

  The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a microscope capable of improving the visibility of a specimen when the position of the specimen is visually confirmed with a simple configuration.

In order to achieve the above object, a microscope according to the present invention includes a stage on which a specimen is placed, an objective lens that is disposed above the specimen and for observing the specimen, and is disposed below the stage. A microscope that illuminates the specimen by guiding illumination light from a light source to the specimen from below the stage through the condenser lens, and a condenser lens frame that holds the condenser lens. is disposed between the sample and the condenser lens, comprising a diaphragm member which throttle hole is formed, the diaphragm member has an inner diameter of said throttle hole is smaller than the diameter of the opening at the tip of the condenser lens frame, reflectivity of the surface disposed on the inside of at least the condenser lens frame of the opening of the surface on the side facing the objective lens, said stage It is higher than the reflectance of the surface.

Further, the microscope according to the present invention, in the above invention, the diaphragm member, characterized in that attached to the distal end of the capacitor lens holding frame.

  The microscope according to the present invention is characterized in that, in the above-mentioned invention, the diaphragm member is detachably attached to the tip of the condenser lens holding frame.

  The microscope according to the present invention is characterized in that, in the above invention, the diaphragm member is attached to a lower part of an illumination opening formed in the stage.

Further, the microscope according to the present invention, in the above invention, the inner diameter of the throttle hole, characterized that you have configured changeable in.

The microscope according to the present invention is characterized in that, in the above invention, the inner diameter of the aperture is fixed to a size circumscribing the field diameter of the objective lens.

  In the microscope of the present invention, the diaphragm member is arranged at a position close to the specimen, and acts on illumination light for microscopic observation as a field diaphragm. The surface of the diaphragm member facing the objective lens has a higher reflectance than the stage surface. For this reason, by adjusting the aperture diameter of the aperture member so as to match the observation field diameter of the objective lens, at the same time, the surface of the aperture member on the back of the sample having a high light reflectance is circumscribed by the observation field diameter. . As a result, the outside light entering from the illumination opening of the stage is reflected by the highly reflective surface of the diaphragm member, so that the region outside the observation field diameter on the back of the specimen appears brighter than before. As a result, it is possible to improve the visibility of the specimen when visually checking the position of the thinly stained specimen or the marked specimen.

  Exemplary embodiments of a microscope according to the present invention will be described below in detail with reference to the accompanying drawings.

(Embodiment 1)
FIG. 1 is a side view of an upright optical microscope (hereinafter simply referred to as “microscope”) to which the first embodiment described below is applied. The microscope of the present invention has the same external configuration as the conventional microscope already described. Therefore, the following description will be made with reference to FIG. In this microscope, a base 102 is provided on the lower side surface of the microscope body 101, and an aiming handle 103 is attached to the base 102 so as to be rotatable. A stage unit 104 that moves up and down by an aiming handle 103 is attached to the side surface of the microscope main body 101 above the base 102. The stage unit 104 includes a stage 105 that can move in XY directions orthogonal to each other in a plane.

  Furthermore, a holder 107 that can be moved up and down with respect to the stage unit 104 by a handle 106 is attached to the stage unit 104. The holder 107 has a transmission bright field in which a condenser lens 202 (see FIG. 2) is accommodated. A capacitor 108 (hereinafter abbreviated as “capacitor 108”) is held. The capacitor 108 is fixed to the holder 107 by a clamp screw 109 and can be centered by a centering screw 110.

  On the other hand, the microscope body 101 is provided with a lens barrel holding portion 111 protruding above the stage 105, and a revolver 112 is rotatably attached to the lens barrel holding portion 111. An arbitrary objective lens 113 can be inserted on the optical axis by the rotation of the revolver 112. A specimen 116 held on the stage 105 is installed on the focal plane of the objective lens 113. A lens barrel 114 is attached above the lens barrel holding unit 111, and an enlarged image of the specimen 116 can be observed with a microscope using an eyepiece lens 115 attached to the lens barrel 114.

  FIG. 2 is an optical path diagram of the illumination optical system of the microscope described above. As shown in FIG. 2, the illumination light emitted from the light source 10 passes through the collector lens 20, passes through the filter 30, is adjusted in brightness and color tone, and then reflected upward by the mirror 50. The light whose direction is changed upward passes through the window lens 60, the aperture stop 207, the condenser lens 202, and the field stop 210 to illuminate a region corresponding to the field of the objective lens 113 of the sample 116. The filter 30 can be omitted depending on the illumination conditions.

  In the present embodiment, a Kohler illumination method is employed in which the aperture stop 207 and the field stop 210 are operated independently. The aperture stop 207 is disposed at a position conjugate with the pupil of the objective lens 113. By restricting the aperture stop 207, light reaching all positions in the illumination range on the specimen surface is equally blocked, and the brightness of the illumination range (the brightness of the field of view of the objective lens 113) can be changed.

  The field stop 210 is disposed at a position conjugate with the sample surface. By narrowing the field stop 210, the illumination range on the specimen surface can be changed. In the conventional example shown in FIG. 10, a field stop 40 is disposed between the filter 30 and the mirror 50.

  In the present embodiment, as shown in FIG. 2, the field stop 210 is arranged between the condenser lens 202 and the specimen 116, and the surface S1 on the side facing the objective lens 113 of the field stop 210 is formed. The reflectance is higher than that of the surface of the stage 105. With the above-described configuration, the visibility of the specimen 116 when visually confirming the position of the specimen 116 disposed on the illumination opening of the stage 105 is improved as compared with the prior art. Yes.

  FIG. 3 is a cross-sectional view showing a configuration of capacitor 108 used in the first embodiment. Above the condenser 108, there is a stage 105, and a slide glass 206 on which a specimen 116 is fixed is placed above the illumination opening 105 h of the stage 105, and the objective lens 113 is focused on the specimen 116. A capacitor ant 201 is fixed to the holder 107 shown in FIG.

  The condenser 108 accommodates the condenser lens 202 described above. As shown in FIG. 2, the condenser lens 202 includes the second group lenses 202 a, 202 b, and 202 c that are disposed to face the sample 116, and the first group lens that is disposed below the aperture stop 207. 202d and 202e, the first group lenses 202d and 202e are not shown in FIG. 3, and hereinafter, the condenser lenses 202a, 202b, and 202c will be collectively referred to as the condenser 202.

  The condenser lens 202 is held by the condenser lens holding frame 203 via the interval ring 204 and the holding ring 205 inside the condenser lens holding frame 203. The condenser lens holding frame 203 is an annular member having an open end. On the pupil plane of the condenser lens 202, an aperture stop 207 (hereinafter referred to as “AS stop 207”) is provided with a condenser lens holding frame 203 and an aperture stop rotation ring 208 (hereinafter referred to as “AS rotation ring 208”). ). Although not shown, the AS diaphragm 207 is composed of a plurality of diaphragm blades, and is configured as a variable diaphragm whose aperture diameter can be changed. The AS diaphragm 207 and the AS rotating ring 208 are engaged with a pin (not shown) so that the inner diameter of the AS diaphragm 207 changes when the AS rotating ring 208 is rotated. In addition, an index indicating the amount of rotation is engraved on the AS rotating ring 208.

  Above the condenser lens 202a, a field stop 210 (hereinafter referred to as “FS stop 210”) is provided by a condenser lens frame 203 and a field stop rotation ring 211 (hereinafter referred to as “FS rotation ring 211”). Is retained. The FS rotary ring 211 is rotatably held with respect to the condenser lens frame 203 by a stepped screw (not shown).

  4A is a plan view of the FS diaphragm 210 shown in FIG. 3. The left figure in FIG. 4-2 is a plan view of the diaphragm blade 210a constituting the FS diaphragm 210, and the right figure is an arrow in the left figure. FIG. As shown in FIG. 4A, the FS stop 210 is composed of a plurality of stop blades 210a, and is configured as a variable stop capable of changing the size of the inner diameter (aperture diameter) φ of the stop hole H1.

  As shown in FIG. 4A, the field stop 210 is configured by sequentially combining a plurality of stop blades 210a. In FIG. 4A, ten diaphragm blades 210a are used as an example, but the number of diaphragm blades 210a is not limited to the above.

  As shown in FIG. 4B, a fixed pin 210b and a moving pin 210c are provided on both ends of each diaphragm blade 210a so as to protrude on the opposite sides of the diaphragm blade 210a. The fixing pin 210b is rotatably engaged with a pin hole formed in the front end surface of the condenser lens holding frame 203. On the other hand, the moving pin 210c is engaged so as to be movable along the long groove 211a formed in the front end surface of the FS rotating ring 211. The FS stop 210 having the above-described configuration can change the illumination range irradiated on the sample surface 116 by rotating the FS rotary ring 211 and changing the stop diameter φ.

  As described above, the surface of the stage 105 is normally surface-treated in black, but in this embodiment, the surface S1 of each diaphragm blade 210a that constitutes the FS diaphragm 210 is opposed to the objective lens 113. Surface treatment is performed so that the reflectance is higher than that of the surface 105. As the surface treatment of the surface S1 of the FS diaphragm 210, for example, metal plating treatment or white coating treatment is preferable.

  As the metal used in the metal plating process, it is preferable to use a metal having a high reflectance in the entire visible light region, such as nickel or chromium. In the present embodiment, the surface S1 of the FS diaphragm 210 is plated with nickel, and the surface S1 of the FS diaphragm 210 is configured in a bright color as it is in the metal color. Note that the surface of the surface S1 of the FS stop 210 may be roughened or mirrored.

  Further, instead of performing the surface treatment such as the above-described metal plating treatment or white coating treatment, the aperture blade 210a itself may be composed of a white plastic molded product, a metal plate such as nickel or chrome, a mirror or the like. .

  When the aperture diameter φ of the FS aperture 210 configured as described above is adjusted so as to circumscribe the observation field diameter of the objective lens 113, the surface S1 of the FS aperture 210 at the back of the specimen 116 is also circumscribed to the observation field diameter. Will do. As a result, the outside light taken in from the illumination opening 105h of the stage 105 is reflected by the highly reflective surface S1 of the FS stop 210, so that the outer region of the observation field diameter in the back of the specimen 116 is larger than the conventional area. It looks bright.

  The FS rotary ring 211 is engraved with an index that indicates the amount of rotation. The index may be a scale line representing the size of the aperture diameter or an index line representing the type of the objective lens 113. Further, even if an oil objective or a water depth objective is used, or the aqueous solution of the specimen 116 is spilled on the FS diaphragm 210, the FS rotary ring 211 is rotatably fixed so that it can be easily disassembled and cleaned. Stepped screws can be removed with standard tools.

  The operation of the microscope of the present embodiment configured as described above will be described. The user places the slide glass 206 on which the specimen 116 is fixed on the stage 105 and fixes the slide glass 206 to the stage 105 using a clenmel (not shown). Next, the slide glass 206 is moved in the XY plane parallel to the surface of the stage 105 by operating a handle (not shown). At this time, the user directly looks at the specimen 116 on the slide glass 206 and moves the approximate position of the specimen 116 desired to be magnified with a microscope to the vicinity of the optical axis of the objective lens 113. In a plain stage without clemmel, the slide glass 206 may be moved directly by hand to move the specimen 116 to the optical axis of the objective lens 113. At this time, as described above, the back of the specimen 116 is composed of a bright color such as white or metal, so that the user can easily visually confirm the position of the specimen 116.

  When the position of the specimen 116 in the XY direction is determined by the visual level, the low-magnification objective lens 113 among the objective lenses 113 is inserted into the observation optical axis by rotating the revolver 112. Then, the light source 10 is turned on and the specimen 116 is illuminated with transmitted light.

  Looking through the eyepiece lens 115, the aiming handle 103 is rotated to move the stage unit 104 up and down. As a result, the specimen 116 moves up and down. As a result, when the image of the specimen 116 is focused, the focal plane of the objective lens 113 and the Z direction of the specimen 116 coincide.

  The AS rotation ring 208 is rotated to open the aperture hole of the AS aperture 207. Next, the FS rotary ring 211 is rotated to close the aperture hole H1 of the FS aperture 210 to the smallest hole. The handle 106 is rotated to move the capacitor 108 up and down in the Z direction with respect to the sample 116. While looking through the eyepiece lens 115, the handle 106 is rotated so that the wing end surface of the FS stop 210 is in focus. Since the FS stop 210 is not completely coincident with the direction of the optical axis of the specimen 116, it is adjusted in a slightly out-of-focus state, but an effect of eliminating unnecessary stray light is sufficiently obtained.

  After the focusing on the FS stop 210 is completed, the condenser 108 is then shaken in the XY direction by the centering screw 110 so that the stop hole H1 of the FS stop 210 is adjusted to the center of the field of view of the eyepiece 15. Next, the FS rotary ring 211 is rotated to open the aperture hole H1 of the FS aperture 210 so as to circumscribe the visual field of the eyepiece lens 115. At this time, the centering screw 110 may be readjusted so that the diaphragm hole H1 of the FS diaphragm 210 and the center of the visual field of the eyepiece lens 115 are aligned again.

  Here, while the FS stop 210 is attached to the capacitor 108, there are cases where the FS stop is also provided at a position in the base 102 conjugate with the sample surface. In this case, there are two FS stops having the same function. However, both functions as the FS stop are the same. Therefore, the aperture hole of the FS diaphragm in the base 102 is left open, and only the FS diaphragm 210 in the present embodiment needs to be adjusted.

  Finally, by rotating the AS rotating ring 208 to change the aperture of the AS stop 207 and adjusting the contrast and depth of focus, the illumination conditions suitable for transmission bright field observation with the low-magnification objective lens 113 are established. Thereafter, the specimen 116 is microscopically observed with the low-magnification objective lens 113, and when there is a part to be observed in more detail, the high-magnification objective lens 113 is inserted into the observation optical axis by rotating the revolver 112. Thereafter, the FS diaphragm 210 and the AS diaphragm blade 207 are adjusted in accordance with the high-magnification objective lens 113 in the same manner as described above. However, in general, it is rare that the FS stop 210 is readjusted every time the objective lens 113 is switched. Most users perform microscopic observation only by aligning the FS stop 210 with a low-magnification objective lens having the widest field of view among the objective lenses 113 used by the user.

  As described above, according to the microscope of the present embodiment, the FS stop 210 is disposed between the sample 116 and the condenser lens 202, and the surface S1 on the sample 116 side of the FS stop 210 is made of metal, white, or the like. Since the surface treatment is performed with a material having a high reflectance, the visibility of the specimen 116 can be improved when the positions of the thinly stained specimen 116 and the marked specimen 116 are visually confirmed. In particular, when the position of the specimen 116 is visually confirmed, the FS stop 210 is narrowed down to a size that does not disturb the illumination range, so that the bright area of the back of the specimen 116 is close to the optical axis of the objective lens 113. And the range with higher visibility than before can be expanded.

  Furthermore, the position of the optical axis of the objective lens 113 can be easily predicted from the position of the aperture hole H1 of the FS stop 210, and the position of the specimen 116 to be observed can be positioned closer to the optical axis more accurately by visual observation. . As a result, it is possible to greatly reduce the trouble of searching for the position where the specimen 116 is to be observed when entering the microscope observation at a higher magnification.

  In addition, the effect of the FS stop 210, which is also an effect of blocking unnecessary transmitted illumination light outside the observation range, can be obtained. Furthermore, in order to further improve the visibility, the above-described effect can be further enhanced by reducing the inner diameter of the FS diaphragm 210 to the minimum only when the position of the specimen 116 to be observed is visually found.

(Embodiment 2)
Next, a microscope according to Embodiment 2 of the present invention will be described. In addition, the same code | symbol is attached | subjected and demonstrated about the component same as the component demonstrated in Embodiment 1 mentioned above.

  FIG. 5 is a cross-sectional view showing a configuration of capacitor 108 used in the second embodiment. In the second embodiment, a fixed stage 305 is used instead of the stage 105 shown in FIG. A slide glass 206 on which the specimen 116 is fixed is installed on the fixed stage 305, and is held by a clenmel (not shown) so as to be movable in the XY directions parallel to the fixed stage 305.

  In the first embodiment described above, the FS stop 210 is disposed on the front end surface of the condenser lens holding frame 203. On the other hand, the second embodiment is different from the first embodiment in that a field stop 310 (hereinafter referred to as “FS stop 310”) is disposed on the lower surface of the illumination opening 305h of the fixed stage 305. ing. Other configurations are the same as those in the first embodiment. Although this FS stop 310 is not explicitly shown in FIG. 5, it is composed of a plurality of stop blades 310a as in the FS stop 210 of Embodiment 1, and the size of the inner diameter (throttle diameter) φ of the stop hole H2 is large. It is configured as a variable aperture that can be changed. As shown in FIG. 5, the FS stop 310 is held by the peripheral portion of the illumination opening 315h of the fixed stage 305 and the front end face of the field stop rotary ring 311 (hereinafter referred to as “FS rotary ring 311”). ing. The FS rotary ring 311 is held rotatably with respect to the fixed stage 305 using a stepped screw (not shown).

  Similar to the first embodiment described above, the surface S2 of each diaphragm blade 310a constituting the FS diaphragm 310 that faces the objective lens 113 has a higher reflectance than the surface of the fixed stage 305 that has been surface-treated in black. Thus, the surface treatment is performed. A specific surface treatment method for the surface S2 of the FS stop 310 is the same as that in the first embodiment.

  Although not shown, a knob for rotating the FS rotary ring 311 is provided at a predetermined position of the fixed stage 305, and the user can buffer the fixed stage 305 by operating this knob. The FS rotary ring 311 can be easily rotated without any problem. The fixed stage 305 can move in the Z direction, but cannot move in the XY direction. The center of the aperture hole H2 of the FS aperture 310 is adjusted to the center of the visual field of the low-magnification objective lens 113 at the factory shipment stage.

  The operation of the second embodiment configured as described above will be described. The user places the slide glass 206 on which the specimen 116 is fixed on the fixed stage 305, and fixes the slide glass 206 using a clenmel (not shown). Next, by operating a stage handle (not shown), Clenmel and the slide glass 206 are moved on the XY plane parallel to the stage surface. The user directly looks at the specimen 116 on the slide glass 206 and moves the approximate position of the specimen 116 to be magnified and observed with a microscope to the vicinity of the optical axis of the objective lens. At this time, as described above, the back of the specimen 116 is composed of a bright color such as white or metal, so that the user can easily visually confirm the position of the specimen 116.

  When the position of the sample 116 in the XY direction is determined by the visual level, the low-magnification objective lens 113 is inserted into the observation optical axis, the light source 10 is turned on, the sample 116 is transmitted and illuminated, and the image of the sample 116 is focused. Normally, the FS diaphragm 310 is centered and focused, but in this embodiment, the center and focus are also aligned at the time of shipment from the factory.

  Finally, if the AS rotary ring 208 is rotated to change the aperture of the AS stop 207 to adjust the contrast and depth of focus, the illumination conditions suitable for transmission bright field observation with the low-magnification objective lens 113 are established. Thereafter, the specimen 116 is observed in detail with the low-magnification objective lens 113, and when there is a part to be observed in more detail, the observation is performed by switching to the high-magnification objective lens 113.

  As described above, according to the microscope of the second embodiment, in addition to the effects shown in the first embodiment, there is an effect that centering and focusing of the FS stop 310 can be made unnecessary.

(Embodiment 3)
Next, a microscope according to Embodiment 3 of the present invention will be described. In addition, the same code | symbol is attached | subjected and demonstrated about the component same as the component demonstrated in Embodiment 1, 2 mentioned above.

  6 is a cross-sectional view showing a part of the capacitor 108 used in the third embodiment, and FIG. 7 is a perspective view of the capacitor 108 shown in FIG. In the first and second embodiments, the FS diaphragms 210 and 310 are fixed to the condenser lens holding frame 203 or the fixed stage 305. On the other hand, in the third embodiment, as shown in FIGS. 6 and 7, a field stop 410 (hereinafter referred to as “FS stop 410”) can be attached to and detached from the tip of the condenser lens holding frame 203. This is different from the first and second embodiments in the point configured as described above.

  As shown in FIG. 7, the FS stop 410 is configured as a cap-like member that covers the tip portion of the condenser lens holding frame 203 having a truncated cone shape, and an upper surface 411 has a stop hole of a predetermined size. H3 is formed. That is, the FS stop 410 is configured as a fixed stop in which the stop diameter φ of the stop hole H3 is fixed to a size that circumscribes the field diameter of the predetermined objective lens 113.

  The FS stop 410 includes an upper surface portion 411, a side surface portion 412, and a flange portion 413. The inner diameter dimensions of the upper surface portion 411 and the side surface portion 412 are the diameters of the upper surface portion 203a and the side surface portion 203b at the tip portion of the condenser lens holding frame 203. It is formed slightly larger than the dimensions. The FS diaphragm 410 having the above configuration can be positioned in the Z direction with respect to the condenser lens holding frame 203 by fitting with the upper surface portion 203a and the side surface portion 203b at the tip portion of the condenser lens holding frame 203. Yes.

  The surface S3 of the FS stop 410 facing the objective lens 113 has a higher reflectance than the stage 105, like the FS stops 210 and 310 of the first and second embodiments. In the present embodiment, a molded body made of a bright color such as white is used as the FS stop 410. However, the present invention is not limited to this, and the FS stop 410 may be configured by a metal plate having high reflectivity such as nickel or chromium. Further, the above-described white coating or metal plating may be applied to the surface S3 of the FS diaphragm 410.

  A plurality of FS diaphragms 410 having a diaphragm hole H3 optimized for a diaphragm diameter φ circumscribing each field diameter of the plurality of objective lenses 113 are prepared, and FS corresponding to the objective lens 113 to be used is prepared. A diaphragm 410 is attached to the tip of the condenser lens frame 203.

  The operation of the third embodiment configured as described above will be described. First, the FS stop 410 for the low-magnification objective lens having the widest field of view among the objective lenses 113 to be used is placed on the condenser lens holding frame 203. A slide glass 206 on which the specimen 116 is fixed is placed on the stage 105, and the position of the specimen 116 to be observed with a microscope is brought close to the optical axis of the objective lens 113. At this time, as described above, the back of the specimen 116 is composed of a bright color such as white or metal, so that the user can easily visually confirm the position of the specimen 116.

  The low-magnification objective lens 113 is placed on the optical axis, the light source 10 is turned on, and the specimen 116 is focused. The hole of the AS diaphragm 207 is opened, and the capacitor 108 is moved up and down in the vertical direction with respect to the specimen 116, thereby focusing on the end face of the diaphragm hole H3 of the FS diaphragm 410. Since the FS stop 410 is not completely coincident with the direction of the optical axis of the specimen 116, the FS stop 410 is adjusted in a slightly out-of-focus state, but the effect of eliminating unnecessary stray light is sufficiently obtained.

  Next, the condenser 108 is shaken in the XY directions so that the inner diameter of the FS diaphragm 410 and the center of the field of view of the eyepiece lens 115 are matched. Finally, by changing the aperture of the AS stop 207 and adjusting the contrast and depth of focus, illumination conditions suitable for transmission bright field observation with a low-magnification objective lens can be achieved. Thereafter, the specimen 116 is microscopically observed with a low-magnification objective lens, and when there is a portion to be observed in more detail, the objective lens 113 is switched to the high-magnification objective lens 113 and corresponds to the field diameter of the high-magnification objective lens 113. The observation is performed by replacing with another FS stop 410.

  As described above, according to the microscope of the third embodiment, in addition to the effects shown in the first embodiment, the manufacturing cost can be suppressed by using an inexpensive molded product as the FS diaphragm 410. There is an effect. Further, the FS stop 410 preferably changes the stop diameter φ according to a plurality of objective lenses 113 having different magnifications. However, in practice, the user does not change the stop diameter φ according to the magnification of the objective lens 113. In many cases, the FS stop 410 having a stop diameter φ circumscribing the field diameter of the objective lens 113 having the largest field diameter is often used. Therefore, when the product is shipped, if the FS stop 410 having the stop hole H3 circumscribing the field diameter of the objective lens 113 having the largest field diameter is packed together with the microscope, at least the stop diameter φ is not manipulated. The effect of maintaining the optimum FS diameter for the user can be obtained.

(Embodiment 4)
Next, a microscope according to Embodiment 4 of the present invention will be described. In addition, the same code | symbol is attached | subjected and demonstrated about the component same as the component demonstrated in Embodiment 1-3 mentioned above.

  FIG. 8 is a cross-sectional view showing a part of the capacitor 108 used in the fourth embodiment, and FIG. 9 is a perspective view of the capacitor 108 shown in FIG. In Embodiment 3 described above, the FS stop 410 is configured to be detachable from the tip portion of the condenser lens holding frame 203. On the other hand, in the present embodiment, instead of providing the FS diaphragm 410 as a separate member, as shown in FIG. 8, the opening inner diameter of the upper surface portion 203a at the tip of the condenser lens frame 203 is reduced. The upper surface portion 203a of the condenser lens frame 203 has a function as an FS stop. That is, the opening portion of the upper surface portion 203a functions as the aperture hole H4 of the FS diaphragm by forming the inner diameter φ of the same diameter as the field diameter of the objective lens 113 having the largest field diameter.

  The entire surface of the condenser lens holding frame 203 is surface-treated so that the reflectance is higher than the surface of the stage 105. A specific surface treatment method for the condenser lens holding frame 203 is the same as in the first to third embodiments. In the present embodiment, the entire surface of the condenser lens holding frame 203 is subjected to a metal plating process such as nickel or chromium, so that the entire surface is composed of a light color as it is. Note that the above surface treatment does not necessarily have to be performed over the entire surface of the condenser lens holding frame 203, and it is sufficient that the surface of the upper surface 203a functioning as an FS stop is processed to the minimum.

  Further, as shown in FIGS. 8 and 9, the inner peripheral surface 203d of the diaphragm hole H4 of the condenser lens frame 203 is not a surface parallel to the optical axis but an inclined surface so that stray light of illumination light is not generated. Is formed. More specifically, the inner peripheral surface 203d of the throttle hole H4 forms an inclined surface in such a manner that its inner diameter gradually decreases from the upper end portion toward the lower end portion.

  As described above, according to the microscope according to the fourth embodiment, in addition to the effects shown in the first and third embodiments, it is not necessary to separately provide the FS diaphragm as a dedicated member thereof. It is possible to reduce the number of components.

  In the first and second embodiments described above, a variable diaphragm capable of changing the diaphragm diameter φ is used as the FS diaphragms 210 and 310. However, as the FS diaphragms 210 and 310, a fixed diaphragm having a fixed diaphragm diameter φ is used. It may be used.

1 is a side view of a microscope to which Embodiments 1 to 4 of the present invention are applied. It is an optical path figure of the illumination optical system of the microscope to which Embodiment 1-4 of this invention was applied. 3 is a cross-sectional view illustrating a configuration of a capacitor used in Embodiment 1. FIG. FIG. 4 is a plan view of the FS stop shown in FIG. 3. It is the top view and arrow AA figure of the aperture blade which comprises FS aperture_diaphragm | restriction. 6 is a cross-sectional view showing a configuration of a capacitor used in Embodiment 2. FIG. 10 is a cross-sectional view showing a part of the configuration of a capacitor used in Embodiment 3. FIG. 6 is a perspective view showing a part of the configuration of a capacitor used in Embodiment 3. FIG. 6 is a cross-sectional view showing a part of the configuration of a capacitor used in Embodiment 4. FIG. 6 is a perspective view showing a part of the configuration of a capacitor used in Embodiment 4. FIG. It is an optical path figure of the illumination optical system of the conventional microscope.

Explanation of symbols

DESCRIPTION OF SYMBOLS 10 Light source 20 Collector lens 30 Filter 50 Mirror 60 Window lens 101 Main body 102 Base 103 Aiming handle 104 Stage unit 105,305 Stage 105h Illumination opening 106 Handle 107 Holder 108 Capacitor 109 Clamp screw 110 Centering screw 111 Lens barrel holding part 112 Revolver DESCRIPTION OF SYMBOLS 113 Objective lens 114 Lens tube 115 Eyepiece lens 116 Specimen 201 Condenser ant 202 Condenser lens 203 Condenser lens holding frame 204 Space ring 205 Press ring 206 Slide glass 207 AS stop (aperture stop)
208 AS rotary ring (aperture stop rotary ring)
210, 310, 410 FS stop (field stop)
211,311 FS rotary ring (field stop rotary ring)
H1, H2, H3, H4 Aperture S1, S2, S3, S4 Surface of the FS diaphragm facing the objective lens

Claims (6)

A stage on which the specimen is placed;
An objective lens disposed above the specimen for observing the specimen;
A condenser lens disposed below the stage ;
A condenser lens frame for holding the condenser lens;
A microscope for guiding illumination light from a light source to the specimen from below the stage through the condenser lens and illuminating the specimen,
Disposed between said specimen and said condenser lens comprises a diaphragm member the aperture hole is formed,
The diaphragm member has an inner diameter of the diaphragm hole that is smaller than the diameter of the opening at the tip of the condenser lens frame and is disposed at least inside the opening of the condenser lens frame on the surface facing the objective lens. The microscope characterized in that the reflectance of the surface to be applied is higher than the reflectance of the stage surface. Microscope according to claim 1, characterized in that the stop member, attached to the distal end of the capacitor lens holding frame.   The microscope according to claim 2, wherein the diaphragm member is detachably attached to a front end portion of the condenser lens holding frame.   The microscope according to claim 1, wherein the diaphragm member is attached to a lower portion of an illumination opening formed in the stage. The diaphragm inner diameter of the hole is, the microscope according to claim 1, any one of 4, wherein that you have been changed can be configured. 5. The microscope according to claim 1, wherein an inner diameter of the aperture is fixed to a size circumscribing a field diameter of the objective lens.

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