JP5125854B2 - Probing socket - Google Patents

Description

  The present invention relates to a socket of a connector to be connected for testing a circuit board and a contact technique for reducing wear of the socket.

  Conventionally, an electronic circuit made of a semiconductor component such as an IC (Integrated Circuit) or an LSI (Large Scale Integration) is formed on a circuit board built in the electronic device. This electronic circuit is not integrated into the electronic device. An operation test is performed to determine whether the device operates normally. This operation test is generally performed through a connector attached to an end of a circuit board to be tested.

  In the conventional circuit board, as shown in FIGS. 10 and 11, a female connector of a circuit board testing apparatus (not shown) for testing the operation of the electronic component 111 of the circuit board 110 provided with the male connector 100 and the electronic component 111. 200. When performing an operation test of the circuit board 110 to be tested, the female connector 201 connected to the circuit board testing apparatus with a cable is electrically coupled to the male connector 100 mounted on the circuit board 110. The connector terminal 101 is composed of a plurality of connection terminals, and the other end side of the connector terminal 101 pin is fixed to the circuit board 110 with solder or the like.

  The structure of the contact portion between the male connector 100 and the female connector 200 is as shown in FIG. The connector terminal 101 of the male connector 100 has a hook shape with a sharp tip, and the female connector 200 is provided with a receptacle (electrode) 201 for receiving the male connector 100 connector terminal 101 from both sides in the housing. ing. When the connector terminal 101 is inserted between the opposing electrodes of the receptacle 201, as shown in FIGS. 11A and 11B, the connector terminal 101 and the receptacle 201 are electrically connected while being rubbed against each other. .

  The male connector 100 and the female connector 200 configured as described above have no problem in normal use. However, when a large number of circuit boards 110 to be tested are tested, the female connector 200 is durable. There was a problem. That is, the test is completed when the circuit boards 110 to be tested are contacted only once, but since the receptacle 201 on the test apparatus side is used for each of the large number of male connectors 100, the opposing electrodes The gap between the (receptacle 201) becomes wide due to wear, and finally there arises a problem that contact is unstable and contact is poor.

  In order to solve such a problem, a ZIF (Zero Insertion Force) contact has been proposed as a method of connecting the connector terminal of the connector attached to the circuit board and the receptacle without rubbing.

  ZIF contacts are often used when testing semiconductor test equipment, etc. The semiconductor device is mounted with the contact electrodes in the holes opened in the two resin plates etc. open. The lead is inserted between the contact electrodes. Thereafter, the two resin plates are moved in opposite directions to close the contact electrodes to be electrically connected.

However, as shown in FIG. 11, the connector terminal 101 of the male connector 100 mounted on the circuit board 110 is in a deep position, and the terminal interval is narrow, which is not suitable for mounting.
Japanese Patent Laid-Open No. 06-96818 JP 09-92414 A Japanese Patent Application Laid-Open No. 07-22103

  Therefore, in the present invention, in a test apparatus for testing a circuit board, as a receptacle structure that can withstand many insertions and removals of a connector, the receptacle is not moved laterally but is inserted in the vertical direction of the terminal when the contact terminal is inserted. Provided is a probing socket for converting a movement from a movement into a lateral movement to make contact.

  The present invention relates to a probing socket for a connector to be connected to test a circuit board, a compression spring having a space into which a contact object is inserted on a spring shaft inside the socket, and a circuit on the opposite side to the insertion direction of the contact object. The compression spring is provided with a plunger electrically connected to the wiring from the board testing machine, and when the contact object is inserted, by the pressure from the plunger or the contact object integrated with the connector terminal, In the buckled state, the terminal to be contacted and the compression spring are brought into contact with each other by deformation thereof, so that there is no friction between the compression spring as the receptacle and the connector terminal on the socket side that receives the connector terminal. Wear caused by multiple insertion and removal of circuit board connector terminals Greatly reduced.

  According to the connection method of the present invention, since the phenomenon of rubbing between the receptacle made of the compression spring and the terminal of the inserted connector does not occur, there is almost no wear of the female connector on the testing machine side, and the contact is stable for a long time. The inspection quality can be improved. In addition, the operation can be performed simply by fixing the connector on the testing machine side and pressing the circuit board side connector on the connector, thereby simplifying the structure.

Hereinafter, a contact socket which is an object of the present invention will be described specifically based on examples with reference to the drawings.
Example 1
In the first embodiment, a case where a compression spring is applied as a receptacle into which a connector terminal of a circuit board is inserted will be described. Hereinafter, the probing (test) socket according to the present invention, each component, and the connection configuration with the connector terminal will be described in this order with reference to FIGS.

  FIG. 1 shows an example of the structure of a probing socket according to an embodiment of the present invention (Part 1: application of a compression spring to a receptacle). FIG. 1A shows a basic structure of a probing socket, and FIG. 1B shows a structure to be mounted on a testing machine.

  As shown in FIG. 1A, the barrel 8 has a hole on the lower side for inserting a connector terminal to be contacted from the circuit board side, and a compression spring 9 as a receptacle and a compression spring on the hole. A plunger 7 for pressing the spring 9 is provided, and a part of the plunger 7 protrudes from the hole above the barrel 8.

  When the plunger 7 is pressed, the compression spring 9 comes into close contact. However, when the plunger 7 is further pressed, buckling occurs, and the central portion of the compression spring 9 is shifted laterally. In the present invention, the movement due to the lateral displacement is used for contact.

  That is, a connector terminal to be contacted is inserted from below the compression spring 9, and the compression spring 9 is buckled by the plunger 7 to make contact. When the plunger 7 is returned to the original position, the state of the normal compression spring 9 is restored. According to this connection method, the terminal of the connector and the receptacle do not rub against each other, and wear of the female connector on the testing machine side can be prevented.

  FIG. 1 (b) shows a mounting form of the probing socket. At the tip end portion of the plunger 7, a spring 11 that creates a pressure from the plunger 7 to the compression spring 9, a wiring 12 that is electrically connected to the testing machine, and The stopper ring 10 that suppresses the upper side of the spring 11 is provided.

  FIG. 2 shows an example of a receptacle (part 1: in the case of a compression spring) applied to the socket according to the embodiment of the present invention. In this example, the shape of a compression spring applied as a receptacle is shown. FIG. 2A shows an ordinary compression spring, and FIG. 2B shows an example of a bending compression spring that bends the spring in the axial direction and deforms when pressed to facilitate contact with the connector terminal.

  In the case of FIG. 2A, it is desirable that the ratio of the winding diameter of the compression spring 9 to the size of the connector terminal to be contacted is approximately 2 to 5 times larger than the connector terminal. This is because if the ratio is 1, it does not buckle, and if the ratio is too large, the barrel diameter becomes large and the pitch between the plurality of connector terminals cannot be accommodated.

  FIG. 3 shows an example of a tapered pressurizing mechanism for pressing the compression spring according to the embodiment of the present invention.

  As shown in FIG. 3A, the inclined portion (tapered portion) of the distal end portion of the plunger 7 is made almost the same as the diameter of the compression spring 9 (strictly, the diameter of the compression spring is slightly smaller) and processed into a press fit. By doing so, the unstable factor of the contact resistance of the inclined part of the compression spring 9 and the plunger 7 is removed and reduced.

  Further, in order to improve the electrical conductivity at the time of contact with the inserted connector terminal, it is preferable to apply a highly conductive metal plating (for example, gold plating) on the surface of the compression spring 9 or the plunger 7 as a receptacle. Needless to say.

  Further, as shown in FIG. 3B, the taper-shaped pressurizing mechanism may insert a ring having a taper on the socket side.

  FIG. 4 shows a connection structure of a probing socket according to an embodiment of the present invention (part 1: application example of a compression spring). This example shows a cross-sectional view of a connection configuration between a female connector 3 connected to a test apparatus (not shown) and a connector 1 mounted on a circuit board.

  In the connector 1, a plurality of connector terminals 2 (two examples in the figure) are arranged in rows and columns in the recessed position. Positioning pins 5 for connecting the female connector 3 and the cover 4 are provided, and an elastic body (spring or the like) 6 is provided outside the positioning pins 5, and the elastic body 6 according to the pressure from the connector 1 side attached to the circuit board. It has a structure that expands and contracts. The elastic body 6 has a role of making it easy to pull out the connector 1 from the probing socket after the connector 1 is connected.

  In addition, a spring 11 is provided around the plunger 7 and contracts when pressed from the female connector 3 side, and the plunger 7 is relatively pressed down and the compression spring 9 is pressed.

  That is, when the connector 1 is pressed against the probing socket, the connector terminal 2 to be contacted is first inserted into the space of the compression spring 9, and then the plunger 7 is relatively pushed down, so that the compression spring 9 is relatively moved. It will be pressed. A stop ring 10 is provided above the plunger 7 so as not to apply too much pressure. Moreover, the wiring 12 is for connecting with a test apparatus and giving an electrical signal to the connector 1.

  FIG. 5 is a diagram (part 1: application example of a compression spring) showing a connector / socket connection state according to the embodiment of the present invention. Here, description will be made assuming that the cover 9 side is fixed.

  FIG. 5A shows a state where the connector 1 attached to the circuit board is moved as indicated by an arrow and the connector terminal 2 is inserted into the compression spring 9. The compression spring 9 is inserted with ZIF that does not contact the connector terminal 2. When the connector 1 is further pressed, the female connector 3 moves to the cover 4 side, and the spring 11 is contracted, and the plunger 7 is relatively lowered to press the compression spring 9. The compression spring 9 is in a wound state while being in close contact with the pressure, and when further pressed, it is in a buckled state as shown in FIG. 5B, and the connector terminal 2, the compression spring 9, and the barrel 8 are in contact with each other. And connected to the wiring 12.

  At this time, in order to make the compression spring 9 easily buckle, a bending spring as shown in FIG. 2B is used as described above, or the pressing portion of the plunger 7 is tapered as shown in FIG. It is effective to put on or insert a ring with a taper on the socket side as shown in FIG. Further, when the pressing force of the connector 1 is eliminated, the electrical connection OFF state as shown in FIGS. 4 and 5A is restored.

  Note that the pressing functions in the same manner from both the connector 1 side of the circuit board and the female connector 3 side of the testing machine.

Next, another method for realizing ZIF will be described. The operation is almost the same as that of the first embodiment except that the structure of the receptacle is different.
(Example 2)
In the second embodiment, a case where a cylindrical metal spring that is narrowed down at the center and made easy to deform as another form for making a ZIF contact in the receptacle will be described. Hereinafter, the probing socket according to the present invention, each component member, and the connection configuration with the connector terminal will be described in this order with reference to FIGS.

  FIG. 6 shows an example of the structure of the probing socket according to the embodiment of the present invention (part 2: application of a cylindrical metal spring to the receptacle). FIG. 6A shows a principle structure when a cylindrical metal spring is applied as a receptacle, and FIG. 6B shows a mounting structure on a testing machine.

  For example, the cylindrical metal spring 15 having a structure in which the vicinity of the center of the pipe of the metal spring material is squeezed and thinned, and the squeezed center portion is slit and deformed independently, is shown in FIG. Thus, it is arranged in the barrel 8 and has a structure in which it is pressed by the plunger 7 provided at the top. When the connector terminal 2 to be contacted is inserted from the lower hole and pressed from above with the plunger 7, the band-shaped metal portion of the narrowed portion of the pipe protrudes toward the upper side of the shaft and contacts the contact object from four directions. When the plunger 7 is returned, the spring pressure is released and the band-shaped metal that has been squeezed back is restored.

  The stopper 13 shown in FIG. 6 (b) is a pipe-like component that physically stops the movement of the plunger 7, and prevents the squeezed portion of the metal from being plastically deformed by pressing. .

  FIG. 7 shows an example of a receptacle (part 2: case of a cylindrical metal spring) applied to the socket according to the embodiment of the invention. As shown in FIG. 7A, the cylindrical metal spring 15 as a receptacle has a cylindrical central portion that is squeezed to have a small radius, and the squeezed portion is provided with a slit. Has a structure that can be independently deformed.

  When this cylindrical metal spring 15 is pressed from the end in the axial direction, the slit of the throttle portion protrudes in the direction perpendicular to the axis, and can contact the one on the axis. The material of the cylindrical metal spring 15 is made of a spring material such as stainless steel, beryllium copper, phosphor bronze, etc., and metal plating may be performed to improve the contact property.

  Also, as shown in FIG. 7 (b), as shown in FIG. 7 (b), an electrode in which four directions are left every 90 degrees in a strip shape and other portions are removed as shown in FIG. 7 (b). It may be arranged in the barrel 8. The stopper 16 is for preventing the band-shaped metal in the narrowed portion from being plastically deformed by pressing.

  FIG. 8 shows a connection structure for a probing socket according to an embodiment of the present invention (part 2: application example of a cylindrical metal spring).

  The connector 1 of the circuit board and the connection cable from the testing machine are made to face each other. The connector terminal 2 of the connector 1 of the fixed circuit board is not in the cylindrical metal spring 15 and the elastic body 6 between the cover 4 and the wiring 12 is not contracted. The wiring 12 is connected to a connection cable in the cover 4.

  FIG. 9 is a diagram (part 2: application example of a cylindrical metal spring) illustrating a connection state of the connector / socket according to the embodiment of the present invention. This example shows a connection state when the connector terminal 2 is inserted into the cylindrical metal spring 15 by pressing the connector 1 from the state of FIG.

  FIG. 9A shows a state where the connector terminal 2 is not sufficiently pushed in and is not in contact with the cylindrical metal spring 15, and as shown in FIG. When the connector 1 is pushed, the elastic body 6 between the cover 4 and the female connector 3 is contracted. The elastic body 6 is contracted, the spring 11 is contracted, the plunger 7 is relatively lowered, and thereby the cylindrical metal spring 15 is contracted, and the slit at the center portion of the narrowed portion protrudes in the direction perpendicular to the axis. 2 and the cylindrical metal spring 15 come into contact with each other.

  The circuit board is tested in the contact state as shown in FIG. When the test is finished and the pressure from the connector 1 of the circuit board is returned, the state shown in FIG. 8 and FIG. With such a structure, the connector terminal 2 and the cylindrical metal spring 15 can come into contact with each other without rubbing. Either the connector 1 side of the circuit board or the cover 4 side of the connection cable of the testing machine may be fixed.

It is a figure which shows the structural example (the 1: application of a compression spring to a receptacle) of the socket for probing which becomes embodiment of this invention. It is a figure which shows the receptacle example (the case of the 1: compression spring) applied to the socket which becomes embodiment of this invention. It is a figure which shows the example of the taper-shaped pressurization mechanism for pressing the compression spring which becomes embodiment of this invention. It is a figure which shows the connection structure (the 1: application example of a compression spring) of the socket for probing which becomes embodiment of this invention. It is a figure (the 1: compression spring application example) which shows the connection state of the connector / socket which becomes embodiment of this invention. It is a figure which shows the structural example (the 2nd: cylindrical metal spring application to a receptacle) of the socket for probing which becomes embodiment of this invention. It is a figure which shows the example of the receptacle applied to the socket which becomes embodiment of invention (the case 2: the case of a cylindrical metal spring). It is a figure which shows the connection structure (the 2: example of a cylindrical metal spring application) of the socket for probing which becomes embodiment of this invention. It is a figure which shows the connection state of the connector / socket which becomes embodiment of this invention (the 2: example of a cylindrical metal spring application). It is a figure which shows the example of the conventional circuit board. It is a figure which shows the example of the conventional contact structure.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Connector 2 Connector terminal 3 Female connector 4 Cover 5 Positioning pin 6 Elastic body 7 Plunger 8 Barrel 9 Compression spring 10 Stop ring 11 Spring 12 Wiring 13 Stopper 15 Cylindrical metal spring 20, 21 Tapered surface

Claims (4)

A probing socket that is electrically connected to a contact object,
A compression spring having a space allowing insertion of the contact object on a spring shaft inside the socket;
A plunger that is electrically connected to the wiring from the testing machine on the side opposite to the insertion direction of the contact object;
A probing socket, wherein the compression spring is buckled by the pressing of the plunger or the pressing of the contact object integrated with the connector terminal, and the connector terminal of the contact object and the compression spring are brought into contact with each other.   2. The probing socket according to claim 1, wherein the plunger has a tapered end on the insertion side of the contact object and buckles the compression spring by the tapered end when pressed.   2. The probing socket includes a tapered ring set on a side facing the pressing surface of the plunger, and the compression spring is buckled by the tapered ring when the plunger is pressed. Socket for probing as described in 1.   An elastic body provided outside the positioning pin of the connector terminal; and a spring provided around the plunger; when pressed from the connector terminal side, the contact object is first a space of the compression spring. 4. The probing socket according to claim 1, wherein the probing socket is inserted into the socket, and then the plunger is relatively pushed down, and the compression spring is relatively pushed. 5.

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