JP5119301B2 - プローブカード - Google Patents
プローブカード Download PDFInfo
- Publication number
- JP5119301B2 JP5119301B2 JP2010171977A JP2010171977A JP5119301B2 JP 5119301 B2 JP5119301 B2 JP 5119301B2 JP 2010171977 A JP2010171977 A JP 2010171977A JP 2010171977 A JP2010171977 A JP 2010171977A JP 5119301 B2 JP5119301 B2 JP 5119301B2
- Authority
- JP
- Japan
- Prior art keywords
- probe
- probe card
- printed circuit
- circuit board
- horizontal adjustment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Description
120 水平調節部
121 水平調節ボルト
122 連結部
123 ナット部
130 プローブ基板
131 溝部
140 連結部材
150 側面治具
Claims (6)
- 印刷回路基板と、
前記印刷回路基板を貫通し、水平調節ボルトと前記水平調節ボルトの端部に形成された連結部を含む水平調節部と、
前記印刷回路基板と電気的に連結されるプローブ基板と、
前記プローブ基板上に形成された溝部に収容され、前記連結部と締結される連結部材と、
を含み、
前記溝部の厚さ方向の断面は、下に向かうほど、狭い面積を有するように形成された段差を含むことを特徴とするプローブカード。 - 前記連結部は、前記連結部材と締結される鋸歯状の締結部をさらに含むことを特徴とする請求項1に記載のプローブカード。
- 前記連結部材は、接着性のある樹脂であることを特徴とする請求項1に記載のプローブカード。
- 前記連結部材は、エポキシ系樹脂であることを特徴とする請求項1に記載のプローブカード。
- 前記印刷回路基板を貫通し、前記プローブ基板の側面を保持する側面治具をさらに含むことを特徴とする請求項1に記載のプローブカード。
- 前記水平調節部は、前記水平調節ボルトに対応するナット部をさらに含むことを特徴とする請求項1に記載のプローブカード。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020100001778A KR101122479B1 (ko) | 2010-01-08 | 2010-01-08 | 프로브 카드 |
KR10-2010-0001778 | 2010-01-08 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2011141263A JP2011141263A (ja) | 2011-07-21 |
JP5119301B2 true JP5119301B2 (ja) | 2013-01-16 |
Family
ID=44457201
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010171977A Active JP5119301B2 (ja) | 2010-01-08 | 2010-07-30 | プローブカード |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP5119301B2 (ja) |
KR (1) | KR101122479B1 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102122459B1 (ko) * | 2014-02-06 | 2020-06-12 | 삼성전자주식회사 | 웨이퍼 테스트 장치 |
WO2023112315A1 (ja) * | 2021-12-17 | 2023-06-22 | 日本電子材料株式会社 | プローブカード基板用接続台座 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100278104B1 (ko) * | 1999-11-19 | 2001-01-15 | 김수학 | 프로브 카드 |
US7285968B2 (en) * | 2005-04-19 | 2007-10-23 | Formfactor, Inc. | Apparatus and method for managing thermally induced motion of a probe card assembly |
KR100675487B1 (ko) * | 2005-06-02 | 2007-01-30 | 주식회사 파이컴 | 프로브 카드 |
US7471094B2 (en) * | 2005-06-24 | 2008-12-30 | Formfactor, Inc. | Method and apparatus for adjusting a multi-substrate probe structure |
KR100718203B1 (ko) * | 2005-10-26 | 2007-05-16 | 지아이테크놀로지(주) | 반도체 웨이퍼 검사용 프로브헤드 조립체 |
KR200443286Y1 (ko) * | 2007-05-18 | 2009-02-10 | 주식회사 아이엠 | 프로브 카드와 프로브 카드의 니들 |
-
2010
- 2010-01-08 KR KR1020100001778A patent/KR101122479B1/ko active IP Right Grant
- 2010-07-30 JP JP2010171977A patent/JP5119301B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
KR20110081560A (ko) | 2011-07-14 |
KR101122479B1 (ko) | 2012-02-29 |
JP2011141263A (ja) | 2011-07-21 |
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