JP5115144B2 - Electronic equipment - Google Patents

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JP5115144B2
JP5115144B2 JP2007273787A JP2007273787A JP5115144B2 JP 5115144 B2 JP5115144 B2 JP 5115144B2 JP 2007273787 A JP2007273787 A JP 2007273787A JP 2007273787 A JP2007273787 A JP 2007273787A JP 5115144 B2 JP5115144 B2 JP 5115144B2
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reinforcing resin
substrate
electronic component
electronic
electronic components
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JP2009105126A (en
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裕之 山川
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Denso Corp
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Denso Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/013Alloys
    • H01L2924/0132Binary Alloys
    • H01L2924/01322Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases

Abstract

<P>PROBLEM TO BE SOLVED: To provide a structure suitable for achieving effective use of a mounting space on one-side surface of a board and simplification of an arrangement process of a reinforcing resin when a dam part for preventing projection of the reinforcing resin, in an electronic device composed by mounting a plurality of electronic components on one-side surface of a board and by applying reinforcement by a reinforcing resin to a part of the plurality of electronic components. <P>SOLUTION: On the one-side surface 11 of the board 10, a first electronic component arrangement region D1 being a continuing single region is formed where a plurality of first electronic components 20 and 22 with connection parts to the board 10 reinforced by the reinforcing resin 50 are arranged, and second electronic components 21 of which the connection parts to the board 10 are not reinforced by the reinforcing resin 50 are not arranged; and the dam part 60 for preventing the reinforcing resin 50 from projecting to the outside of the first electronic component arrangement region D1 on the one-side surface 11 of the board 10 is formed in the outer periphery of the first electronic component arrangement region D1. <P>COPYRIGHT: (C)2009,JPO&amp;INPIT

Description

本発明は、基板の一面に複数個の電子部品を搭載し、一部の電子部品にアンダーフィルによる補強を施してなる電子装置に関する。   The present invention relates to an electronic device in which a plurality of electronic components are mounted on one surface of a substrate, and some electronic components are reinforced by underfill.

従来より、基板の一面に複数個の電子部品を搭載し、基板と複数個の電子部品とを接続してなる電子装置は、広く知られている。このような場合、複数個の電子部品は、基板との接続部が、アンダーフィルと呼ばれる補強用樹脂により補強されているもの(以下、第1の電子部品という)と、基板との接続部が補強用樹脂により補強されていないもの(以下、第2の電子部品という)とより構成されているのが通常である。   2. Description of the Related Art Conventionally, an electronic device in which a plurality of electronic components are mounted on one surface of a substrate and the substrate and the plurality of electronic components are connected is widely known. In such a case, the plurality of electronic components have a connection portion between the substrate and a portion where the connection portion with the substrate is reinforced by a reinforcing resin called an underfill (hereinafter referred to as a first electronic component). In general, it is composed of one that is not reinforced by a reinforcing resin (hereinafter referred to as a second electronic component).

一方で、従来では、半導体素子を基板上にはんだ付けし、その接続部の信頼性向上のため、素子−基板間に補強用樹脂を充填する構成において、半導体素子の周囲にダムを設けて、補強用樹脂のはみ出しを止めるようにしたものが提案されている(たとえば、特許文献1参照)。   On the other hand, conventionally, in a configuration in which a semiconductor element is soldered on a substrate and a reinforcing resin is filled between the element and the substrate in order to improve the reliability of the connection portion, a dam is provided around the semiconductor element, There has been proposed one in which the protrusion of the reinforcing resin is stopped (see, for example, Patent Document 1).

ここで、電子部品のうち、はんだバンプを基板上に実装するFC(フリップチップ)やバンプが面全体に存在するCSP(チップサイズパッケージ)などについては、補強用樹脂を充填し、信頼性を向上させるが、ダイオード、トランジスタなどのミニモールド品、表面実装タイプのインダクタやアルミ電解コンデンサなどの電子部品についても、基板と部品との熱膨張差が大きい場合や部品の電極種類によっては、同様な補強用樹脂による補強が必要な場合がある。
特開2006−351559号公報
Here, among electronic components, FC (flip chip) that mounts solder bumps on the substrate and CSP (chip size package) that has bumps on the entire surface are filled with reinforcing resin to improve reliability. However, for electronic components such as diodes and transistors, mini-molded products, surface mount type inductors, and aluminum electrolytic capacitors, similar reinforcement is possible depending on the large thermal expansion difference between the substrate and the component, and depending on the component electrode type. Reinforcement with resin for use may be necessary.
JP 2006-351559 A

ここで、本発明者は、従来技術に基づいて、基板の一面に複数個の電子部品を搭載し、基板と複数個の電子部品とを接続してなる電子装置を、試作検討した。図8は、その試作品としての電子装置の概略平面構成を示す図である。なお、図8では、補強用樹脂50の表面には、識別のため便宜上、点ハッチングを施してある。   Here, based on the prior art, the present inventor has experimentally studied an electronic device in which a plurality of electronic components are mounted on one surface of a substrate and the substrate and the plurality of electronic components are connected. FIG. 8 is a diagram showing a schematic plan configuration of an electronic device as a prototype. In FIG. 8, the surface of the reinforcing resin 50 is point-hatched for convenience of identification.

図8に示される電子装置においては、基板10の一面11に搭載された複数個の電子部品20、21、22は、基板10との接続部が補強用樹脂50により補強されている第1の電子部品20、22と、基板10との接続部が補強用樹脂50により補強されていない第2の電子部品21とより構成されている。   In the electronic device shown in FIG. 8, the plurality of electronic components 20, 21, and 22 mounted on the one surface 11 of the substrate 10 have a first portion in which a connection portion with the substrate 10 is reinforced by a reinforcing resin 50. The connection parts between the electronic components 20 and 22 and the substrate 10 are constituted by the second electronic component 21 that is not reinforced by the reinforcing resin 50.

第1の電子部品は、FC、CSPなどの半導体素子20やモールドされたダイオードなどのモールド素子22であり、これらについては、図示しないはんだにより基板10と接続され、このはんだ接続部に対して補強用樹脂50による補強がなされている。   The first electronic component is a semiconductor element 20 such as FC or CSP, or a molded element 22 such as a molded diode, which is connected to the substrate 10 by solder (not shown) and reinforces the solder connection portion. The resin 50 is reinforced.

一方、第2の電子部品としては、ベアチップの半導体素子21が搭載されており、これについては金属ワイヤ40を介して、基板10の一面11上の電極12に接続されている。その他、ここでは、基板10の一面11には、検査用の電極14や、外部とワイヤボンディングや溶接などで接続される外部接続用電極13などが存在する。   On the other hand, as the second electronic component, a bare chip semiconductor element 21 is mounted, which is connected to the electrode 12 on the one surface 11 of the substrate 10 through a metal wire 40. In addition, here, on one surface 11 of the substrate 10, there are an inspection electrode 14 and an external connection electrode 13 connected to the outside by wire bonding or welding.

この試作品に示されるように、従来では、設計上の観点から、回路形成を行うため、種々の電子部品や電極は、基板の一面上にてランダムに配置されているのが通常である。この場合、補強用樹脂50は、基板10の一面11に塗布・硬化することで配置されるが、当該塗布工程においては、樹脂の量や配設位置のずれなどにより、補強用樹脂50が、当該補強用樹脂50を設けない電子部品21や電極12〜14等に付着して不具合を引き起こす可能性がある。   As shown in this prototype, conventionally, from the viewpoint of design, in order to form a circuit, various electronic components and electrodes are usually randomly arranged on one surface of a substrate. In this case, the reinforcing resin 50 is disposed by being applied and cured on the one surface 11 of the substrate 10, but in the application step, the reinforcing resin 50 is changed due to the amount of the resin or the displacement of the arrangement position. There is a possibility that the electronic component 21 and the electrodes 12 to 14 and the like that are not provided with the reinforcing resin 50 may adhere to cause problems.

ここで、上記特許文献1に鑑みれば、補強用樹脂の必要な第1の電子部品の各々について、個々の部品を取り囲むようにダムを設ける案もあるが、その分、実装面積が大きくなり、また塗布工程にかかる工数も大きくなることなどことから、望ましくない。   Here, in view of the above-mentioned Patent Document 1, there is also a plan to provide a dam so as to surround each component for each of the first electronic components that require the reinforcing resin, but the mounting area increases accordingly, In addition, the number of man-hours for the coating process increases, which is not desirable.

本発明は、上記問題に鑑みてなされたものであり、基板の一面に搭載された複数個の電子部品のうち一部の電子部品について、補強用樹脂による補強を施してなる電子装置において、補強用樹脂のはみだし防止のためのダム部を設けるにあたって、基板の一面における実装スペースの有効活用と、補強用樹脂の配置工程の簡素化とを実現するのに適した構成を提供することを目的とする。   The present invention has been made in view of the above problems, and in an electronic device in which some electronic components among a plurality of electronic components mounted on one surface of a substrate are reinforced with a reinforcing resin. The purpose is to provide a configuration suitable for realizing effective use of the mounting space on one side of the board and simplification of the placement process of the reinforcing resin when providing a dam for preventing the resin from sticking out. To do.

上記目的を達成するため、本発明は、基板(10)の一面(11)には、基板(10)との接続部が補強用樹脂(50)により補強されている複数個の第1の電子部品(20、22)が配置されるとともに、基板(10)との接続部が補強用樹脂(50)により補強されていない第2の電子部品(21)は配置されない連続した1個の領域である第1の電子部品配置領域(D1)が複数個設けられており、それぞれの第1の電子部品配置領域(D1)の外周には、基板(10)の一面(11)における第1の電子部品配置領域(D1)の外側に補強用樹脂(50)がはみ出すのを防止するダム部(60)が設けられおり、複数個の第1の電子部品配置領域(D1)においては、個々の第1の電子部品配置領域(D1)内では補強用樹脂(50)の厚さが均一であり、異なる第1の電子部品配置領域(D1)の間では補強用樹脂(50)の厚さが互いに異なることを特徴とする(後述の図4参照)In order to achieve the above object, according to the present invention, a plurality of first electrons in which a connection portion with a substrate (10) is reinforced by a reinforcing resin (50) on one surface (11) of the substrate (10). The component (20, 22) is arranged, and the second electronic component (21) in which the connection portion with the substrate (10) is not reinforced by the reinforcing resin (50) is a single continuous region where the component (20, 22) is not arranged. A plurality of first electronic component placement areas (D1) are provided, and the first electrons on one surface (11) of the substrate (10) are arranged on the outer periphery of each first electronic component placement area (D1). A dam portion (60) that prevents the reinforcing resin (50) from protruding outside the component placement region (D1) is provided . In each of the plurality of first electronic component placement regions (D1), individual first 1 in the electronic component placement region (D1) The thickness of the uniform, than between different first electronic component placement area (D1), characterized in that the thickness of the reinforcement resin (50) are different from each other (see FIG. 4 described later).

それによれば、補強用樹脂(50)による補強が必要な第1の電子部品(20、22)を複数個まとめて配置し、その外側をダム部(60)で取り囲むことで補強用樹脂(50)のはみ出しを防止しているため、第1の電子部品(20、22)の1個1個に対してダム部(60)を設ける場合に比べて、基板(10)の一面(11)における部品実装面積を小さくでき、また、ダム部(60)内の複数個の第1の電子部品(20、21)に対して一括して補強用樹脂(50)を配置することが可能となる。   According to this, a plurality of first electronic components (20, 22) that need to be reinforced by the reinforcing resin (50) are arranged together, and the outside is surrounded by the dam portion (60), thereby reinforcing resin (50 ) Is prevented from protruding on the one surface (11) of the substrate (10) as compared with the case where the dam portion (60) is provided for each of the first electronic components (20, 22). The component mounting area can be reduced, and the reinforcing resin (50) can be collectively disposed with respect to the plurality of first electronic components (20, 21) in the dam portion (60).

それゆえ、ダム部(60)を設けるにあたって、基板(10)の一面(11)における実装スペースの有効活用と、補強用樹脂(50)の配置工程の簡素化とを実現するのに適した構成を提供することができる。   Therefore, in providing the dam portion (60), a configuration suitable for realizing effective use of the mounting space on the one surface (11) of the substrate (10) and simplification of the arrangement process of the reinforcing resin (50). Can be provided.

また、請求項1の発明では、第1の電子部品配置領域(D1)を複数個設けた場合に、個々の第1の電子部品配置領域(D1)内では補強用樹脂(50)の厚さが均一であり、異なる第1の電子部品配置領域(D1)の間では補強用樹脂(50)の厚さが互いに異なるものであるものとしている。このようにすれば、補強用樹脂(50)の厚さの同じ第1の電子部品(22)毎にまとめることができるので、補強用樹脂(50)の配置を効率的に行える。 According to the first aspect of the present invention, when a plurality of first electronic component placement areas (D1) are provided, the thickness of the reinforcing resin (50) is within each first electronic component placement area (D1). Are uniform, and the thickness of the reinforcing resin (50) is different between the different first electronic component placement regions (D1). If it does in this way, since it can put together for every 1st electronic component (22) with the same thickness of the reinforcing resin (50), arrangement | positioning of the reinforcing resin (50) can be performed efficiently.

また、ダム部(60)の内側にて補強用樹脂(50)の内部に、補強用樹脂(50)よりも弾性率の大きい応力緩和部材(70)を配置すれば、連続した1個の補強用樹脂(50)の配置面積が大きくなっても、応力緩和部材(70)によって、樹脂内部の応力を低減して、補強用樹脂(50)のクラックの発生防止が可能となる(後述の図6および図7参照)。   Further, if the stress relaxation member (70) having a larger elastic modulus than the reinforcing resin (50) is arranged inside the reinforcing resin (50) inside the dam part (60), one continuous reinforcement is provided. Even if the arrangement area of the resin for resin (50) is increased, the stress relaxation member (70) can reduce the stress inside the resin and prevent the reinforcing resin (50) from cracking (described later). 6 and FIG. 7).

なお、特許請求の範囲およびこの欄で記載した各手段の括弧内の符号は、後述する実施形態に記載の具体的手段との対応関係を示す一例である。   In addition, the code | symbol in the bracket | parenthesis of each means described in the claim and this column is an example which shows a corresponding relationship with the specific means as described in embodiment mentioned later.

以下、本発明の実施形態について図に基づいて説明する。なお、以下の各実施形態相互において、互いに同一もしくは均等である部分には、説明の簡略化を図るべく、図中、同一符号を付してある。   Hereinafter, embodiments of the present invention will be described with reference to the drawings. In the following embodiments, parts that are the same or equivalent to each other are given the same reference numerals in the drawings in order to simplify the description.

(第1実施形態)
図1は、本発明の第1実施形態に係る電子装置S1を示す概略平面図であり、基板10の一面11側の平面構成を示す。なお、図1では、補強用樹脂50の表面には、識別のため便宜上、点ハッチングを施してある。また、図2は、図1中のA−A一点鎖線に沿った同電子装置S1の概略断面図である。
(First embodiment)
FIG. 1 is a schematic plan view showing the electronic device S1 according to the first embodiment of the present invention, and shows a planar configuration on the one surface 11 side of the substrate 10. As shown in FIG. In FIG. 1, the surface of the reinforcing resin 50 is point-hatched for convenience for identification. FIG. 2 is a schematic cross-sectional view of the electronic device S1 taken along the dashed line AA in FIG.

基板10の一面11上に、複数個の電子部品20、21、22が搭載され、基板10と電子部品20〜22とが、はんだ30やボンディングワイヤ40を介して電気的に接続されている。   A plurality of electronic components 20, 21, and 22 are mounted on one surface 11 of the substrate 10, and the substrate 10 and the electronic components 20 to 22 are electrically connected via the solder 30 and bonding wires 40.

基板10は、セラミック基板やプリント基板、あるいはリードフレーム等を採用することができ、特に限定されるものではない。基板10の一面11には、ボンディングワイヤ40と接続されるワイヤ用電極12、外部と接続するための外部接続用電極13、検査に用いる検査用電極14が設けられている。これら電極12〜14は、Cu、Au、Agなどの材料を用いた厚膜やめっきから構成されたものである。   The substrate 10 can employ a ceramic substrate, a printed substrate, a lead frame, or the like, and is not particularly limited. On one surface 11 of the substrate 10, a wire electrode 12 connected to the bonding wire 40, an external connection electrode 13 for connecting to the outside, and an inspection electrode 14 used for inspection are provided. These electrodes 12-14 are comprised from the thick film and plating which used materials, such as Cu, Au, and Ag.

電子部品20〜22は、基板10との接続部が補強用樹脂50により補強されている第1の電子部品20、22と、基板10との接続部が補強用樹脂50により補強されていない第2の電子部品21とより構成されている。   In the electronic components 20 to 22, the first electronic components 20 and 22 in which the connection portion with the substrate 10 is reinforced by the reinforcing resin 50 and the connection portion between the substrate 10 and the first electronic components 20 and 22 are not reinforced by the reinforcing resin 50. 2 electronic components 21.

具体的には、第1の電子部品20、22としては、FCやCSPなどの第1の半導体素子20と、モールドされたダイオードやモールドされたトランジスタなどのモールド素子22である。   Specifically, the first electronic components 20 and 22 include a first semiconductor element 20 such as FC or CSP, and a molded element 22 such as a molded diode or a molded transistor.

第1の半導体素子20は、図2に示されるように、はんだ30を介して基板10に接続されている。また、モールド素子22も図示しないが、はんだを介して基板10に接続されている。これらはんだ30としては、この種の電子装置に一般に用いられるはんだ材料が用いられる。具体的には、共晶はんだや鉛フリーはんだなどが採用される。   As shown in FIG. 2, the first semiconductor element 20 is connected to the substrate 10 via a solder 30. Further, although not shown, the mold element 22 is connected to the substrate 10 via solder. As these solders 30, a solder material generally used for this type of electronic device is used. Specifically, eutectic solder or lead-free solder is used.

そして、これら第1の電子部品20、22では、第1の電子部品20、22と基板10の一面11との間に、補強用樹脂50が充填されている。これにより、補強用樹脂50は、部品−基板間にてはんだ30を封止するように配置され、はんだ30による接続部が補強されている。   In the first electronic components 20 and 22, the reinforcing resin 50 is filled between the first electronic components 20 and 22 and the one surface 11 of the substrate 10. Accordingly, the reinforcing resin 50 is disposed so as to seal the solder 30 between the component and the substrate, and the connection portion by the solder 30 is reinforced.

このような補強用樹脂50は、従来より半導体装置の分野にて用いられる一般的なものであり、たとえばエポキシ樹脂などよりなる。ここで、この補強用樹脂50には、通常のものと同じくシリカなどの無機材料よりなるフィラーが含まれていてもよいし、全く含まれなくてもよい。   Such a reinforcing resin 50 is generally used in the field of semiconductor devices and is made of, for example, an epoxy resin. Here, the reinforcing resin 50 may include a filler made of an inorganic material such as silica as in the normal case, or may not be included at all.

また、第2の電子部品21は、ここでは、ベアチップなどよりなる第2の半導体素子21であり、この第2の半導体素子21は、基板10の一面11に対して図示しないダイマウント材を介して接合固定されている。   Here, the second electronic component 21 is a second semiconductor element 21 made of a bare chip or the like, and the second semiconductor element 21 is placed on a surface 11 of the substrate 10 via a die mount material (not shown). Are fixed.

そして、第2の半導体素子21とワイヤ用電極12とは、ボンディングワイヤ40により結線され電気的に接続されている。ボンディングワイヤ40は、一般的なAuやAlなどよりなるものである。   The second semiconductor element 21 and the wire electrode 12 are connected by a bonding wire 40 and are electrically connected. The bonding wire 40 is made of general Au or Al.

ここで、本実施形態の電子装置S1においては、基板10の一面11には、連続した1個の領域である第1の電子部品配置領域D1が設けられており、この第1の電子部品配置領域D1内に、複数個の第1の電子部品20、22が、互いに近接してまとめられて配置されている。   Here, in the electronic device S1 of the present embodiment, the first surface 11 of the substrate 10 is provided with a first electronic component placement region D1, which is a continuous region, and this first electronic component placement. In the region D1, a plurality of first electronic components 20 and 22 are arranged in close proximity to each other.

本実施形態では、第1の電子部品配置領域D1は、1個設けられており、この中に、電子装置S1におけるすべての第1の電子部品20、22のみが配置されている。また、第1の電子部品配置領域D1には、第2の電子部品21や上記各電極12〜14は配置されていない。   In the present embodiment, one first electronic component placement region D1 is provided, in which only all the first electronic components 20 and 22 in the electronic device S1 are placed. Further, the second electronic component 21 and the electrodes 12 to 14 are not arranged in the first electronic component arrangement region D1.

これら第2の電子部品21や上記各電極12〜14は、補強用樹脂50が付着すると不具合が生ずるものであり、補強用樹脂50を付着させたくない部材である。そして、これら第2の電子部品21を含む補強用樹脂50を付着させたくない部材12〜14および21は、基板10の一面11のうち第1の電子部品配置領域D1以外の部位に配置されている。   The second electronic component 21 and each of the electrodes 12 to 14 are members that cause problems when the reinforcing resin 50 adheres, and are members that do not want the reinforcing resin 50 to adhere. The members 12 to 14 and 21 to which the reinforcing resin 50 including the second electronic component 21 is not desired are disposed in a portion other than the first electronic component disposition region D1 on the one surface 11 of the substrate 10. Yes.

そして、第1の電子部品配置領域D1の外周には、ダム部60が設けられている。ここでは、ダム部60は環状をなし、当該領域D1を取り囲むように設けられている。そして、補強用樹脂50の上面のほぼ全体は、ダム部60の頂部よりも低くなっており、補強用樹脂50はダム部60の内周に収容されている。   And the dam part 60 is provided in the outer periphery of the 1st electronic component arrangement | positioning area | region D1. Here, the dam portion 60 has an annular shape and is provided so as to surround the region D1. The substantially entire upper surface of the reinforcing resin 50 is lower than the top of the dam portion 60, and the reinforcing resin 50 is accommodated in the inner periphery of the dam portion 60.

このようにして、ダム部60によって、第1の電子部品配置領域D1とその外側に位置する上記補強用樹脂50を付着させたくない部材12〜14および21とが、区画されている。そして、ダム部60により、基板10の一面11における第1の電子部品配置領域D1の外側に補強用樹脂50がはみ出すのを防止している。   In this manner, the dam portion 60 divides the first electronic component placement region D1 and the members 12 to 14 and 21 to which the reinforcing resin 50 located outside thereof is not to be attached. The dam portion 60 prevents the reinforcing resin 50 from protruding outside the first electronic component placement region D1 on the one surface 11 of the substrate 10.

このダム部60は、基板10の作成時に厚膜導体やガラスを焼成することにより作製したり、部品実装時にシリコーン樹脂、エポキシ樹脂、ポリイミドなどの樹脂やはんだで作製したり、あるいはその両者を併用することで形成される。   The dam portion 60 is produced by firing a thick film conductor or glass when the substrate 10 is produced, or is produced with a resin such as silicone resin, epoxy resin, polyimide, or solder when mounting a component, or a combination of both. It is formed by doing.

また、本電子装置S1においては、上記した各電子部品20〜22や各電極12〜14は、基板10の表面または内部に形成されている図示しない配線により、電気的に接続されており、電気回路を構成している。   In the electronic device S1, the electronic components 20 to 22 and the electrodes 12 to 14 are electrically connected by a wiring (not shown) formed on the surface or inside of the substrate 10, and The circuit is configured.

このような電子装置S1の製造方法の一例を述べる。一面11に上記各電極12〜14が形成された基板10において、当該一面11にダム部60を形成し、そのダム部60の内周にはんだ30を介して第1の電子部品20、22を接続する。   An example of a method for manufacturing such an electronic device S1 will be described. In the substrate 10 on which the electrodes 12 to 14 are formed on the one surface 11, a dam portion 60 is formed on the one surface 11, and the first electronic components 20 and 22 are connected to the inner periphery of the dam portion 60 via the solder 30. Connecting.

このとき、第1の電子部品20、22間の距離や配置をできる限り均等になるように配慮することが望ましい。また、第1の電子部品配置領域D1の周辺部は、ダム部60を形成するためのスペースを空けておく。また、一方で、第2の電子部品21を基板10の一面11に搭載し、ワイヤボンディングを行う。   At this time, it is desirable to consider the distance and arrangement between the first electronic components 20 and 22 to be as uniform as possible. Further, a space for forming the dam part 60 is left in the peripheral part of the first electronic component placement region D1. On the other hand, the second electronic component 21 is mounted on one surface 11 of the substrate 10 and wire bonding is performed.

その後、ダム部60内の第1の電子部品配置領域D1に、補強用樹脂50を必要量塗布することで、第1の電子部品20、22と基板10との隙間に補強用樹脂50を充填し、これを硬化させる。この補強用樹脂50の塗布時には、ダム部60があるため、第1の電子部品配置領域D1の外側へ補強用樹脂50がはみ出すのを防止する。こうして、本実施形態の電子装置S1ができあがる。   Thereafter, the reinforcing resin 50 is applied to the first electronic component placement region D1 in the dam portion 60 to fill the gap between the first electronic components 20 and 22 and the substrate 10 with the reinforcing resin 50. And cure it. When the reinforcing resin 50 is applied, since the dam portion 60 is present, the reinforcing resin 50 is prevented from protruding outside the first electronic component placement region D1. Thus, the electronic device S1 of the present embodiment is completed.

ところで、本実施形態によれば、基板10の一面11に、複数個の第1の電子部品20、22が配置されるとともに、補強用樹脂50を付着させたくない部材としての第2の電子部品21および各電極12〜14は配置されていない連続した1個の領域である第1の電子部品配置領域D1を設け、この領域D1の外周に、基板10の一面11における当該領域D1の外側に補強用樹脂50がはみ出すのを防止するダム部60を設けている。   By the way, according to the present embodiment, the plurality of first electronic components 20 and 22 are arranged on the one surface 11 of the substrate 10 and the second electronic component as a member for which the reinforcing resin 50 is not desired to be attached. 21 and the respective electrodes 12 to 14 are provided with a first electronic component placement region D1 which is one continuous region where no placement is provided, and on the outer periphery of the region D1 on the outer surface of the region D1 on the one surface 11 of the substrate 10. A dam portion 60 is provided to prevent the reinforcing resin 50 from protruding.

それによれば、補強用樹脂50による補強が必要な第1の電子部品20、22を複数個まとめて配置し、その外側をダム部60で取り囲むことで補強用樹脂50のはみ出しを防止できるため、第1の電子部品20、22の1個1個に対してダム部60を設ける場合に比べて、基板10の一面11における部品実装面積を小さくできる。   According to this, since the plurality of first electronic components 20 and 22 that need to be reinforced with the reinforcing resin 50 are arranged together and the outside is surrounded by the dam portion 60, the protruding of the reinforcing resin 50 can be prevented. Compared with the case where the dam portion 60 is provided for each of the first electronic components 20 and 22, the component mounting area on the one surface 11 of the substrate 10 can be reduced.

また、ダム部60内の複数個の第1の電子部品20、21に対して一括して補強用樹脂50を配置することが可能となるため、第1の電子部品20、22の1個1個に対して補強用樹脂50を設ける場合に比べて、効率的に樹脂配置が行える。   In addition, since the reinforcing resin 50 can be collectively disposed with respect to the plurality of first electronic components 20 and 21 in the dam portion 60, each of the first electronic components 20 and 22 is one by one. Compared with the case where the reinforcing resin 50 is provided for the individual, the resin can be arranged efficiently.

このように、本実施形態によれば、補強用樹脂50のはみ出し防止の目的でダム部60を設けるにあたって、基板10の一面11における実装スペースの有効活用と、補強用樹脂50の配置工程の簡素化とを実現するのに適した構成を提供することができる。   As described above, according to the present embodiment, when the dam portion 60 is provided for the purpose of preventing the protrusion of the reinforcing resin 50, the mounting space on the first surface 11 of the substrate 10 is effectively used and the arrangement process of the reinforcing resin 50 is simplified. It is possible to provide a configuration suitable for realizing the above.

(第2実施形態)
図3は、本発明の第2実施形態に係る電子装置の製造方法の要部を示す概略平面図であり、多連基板の状態を示す。
(Second Embodiment)
FIG. 3 is a schematic plan view showing the main part of the method for manufacturing an electronic device according to the second embodiment of the present invention, and shows the state of the multiple substrate.

基板10が多連基板を分割して個片化された基板として構成され、且つ、第1の電子部品配置領域D1が基板10の一面11の隅に形成される場合がある。この場合には、多連状態の基板10にて、電子部品20〜22の実装、ダム部60の形成、補強用樹脂50の配置を行い、その後、多連の基板10を分割ラインLに沿って分割するようにしてもよい。それにより、工数を低減することが可能となる。   In some cases, the substrate 10 is configured as a substrate obtained by dividing a multiple substrate and the first electronic component placement region D1 is formed at the corner of the one surface 11 of the substrate 10. In this case, the mounting of the electronic components 20 to 22, the formation of the dam portion 60, and the placement of the reinforcing resin 50 are performed on the substrate 10 in the multiple state, and then the multiple substrate 10 is moved along the dividing line L. May be divided. Thereby, man-hours can be reduced.

なお、この場合、第1の電子部品配置領域D1は、基板10の一面11の隅部に位置するため、上記第1実施形態のように、ダム部60で全周を取り囲まれたものではなく、基板10の端部にはダム部60が存在しない。しかし、このことが、補強用樹脂50のはみ出しによる影響を与えることはない。   In this case, since the first electronic component placement region D1 is located at the corner of the one surface 11 of the substrate 10, it is not surrounded by the dam portion 60 as in the first embodiment. The dam portion 60 does not exist at the end of the substrate 10. However, this does not affect the protrusion of the reinforcing resin 50.

(第3実施形態)
図4は、本発明の第3実施形態に係る電子装置S2の要部を示す図であり、(a)は、基板10の一面11側の概略平面図、(b)は、(a)中のB−B一点鎖線に沿った概略断面図である。なお、図4では、上記の第2の電子部品や電極等は省略してある。
(Third embodiment)
4A and 4B are diagrams showing the main part of the electronic device S2 according to the third embodiment of the present invention, in which FIG. 4A is a schematic plan view of one surface 11 side of the substrate 10, and FIG. It is a schematic sectional drawing in alignment with BB dashed-dotted line. In FIG. 4, the second electronic component, the electrode, and the like are omitted.

図4に示されるように、本実施形態の電子装置S2では、基板10の一面11に、第1の電子部品配置領域D1が2個設けられており、それぞれの第1の電子部品配置領域D1について、ダム部60が設けられている。   As shown in FIG. 4, in the electronic device S2 of the present embodiment, two first electronic component placement areas D1 are provided on one surface 11 of the substrate 10, and each first electronic component placement area D1 is provided. A dam part 60 is provided.

ここでは、図4中の左側の第1の電子部品配置領域D1には、比較的大型のモールド素子22が複数個まとめられて配置されており、右側の第1の電子部品配置領域D1には、比較的小型のモールド素子22が複数個まとめられて配置されている。そして、当該領域D1の両方ともダム部60の内周に補強用樹脂50が収納され、領域D1外へのはみ出しが防止されている。   Here, in the first electronic component placement region D1 on the left side in FIG. 4, a plurality of relatively large mold elements 22 are arranged in a group, and in the first electronic component placement region D1 on the right side, A plurality of relatively small mold elements 22 are arranged and arranged. In both of the areas D1, the reinforcing resin 50 is accommodated on the inner periphery of the dam portion 60, so that the area D1 is prevented from protruding to the outside.

ここで、図4中の左側の大型のモールド素子22と右側の小型のモールド素子22とでは、部品−基板間のギャップが異なり、当該大型のものの方が大きい。そのため、当該2個の第1の電子部品配置領域D1では、補強用樹脂50の厚さも互いに異なり、左側の大型のものの方が、補強用樹脂50が厚い。   Here, the large mold element 22 on the left side and the small mold element 22 on the right side in FIG. 4 have different gaps between the component and the substrate, and the large one is larger. Therefore, in the two first electronic component arrangement regions D1, the thickness of the reinforcing resin 50 is also different from each other, and the reinforcing resin 50 is thicker in the large left side.

つまり、ここでは、2個の第1の電子部品配置領域D1においては、1つの第1の電子部品配置領域D1内では補強用樹脂50の厚さが均一であり、互いの第1の電子部品配置領域D1の間では補強用樹脂50の厚さが互いに異なるものとなっている。   That is, here, in the two first electronic component placement regions D1, the thickness of the reinforcing resin 50 is uniform in one first electronic component placement region D1, and the first electronic components are mutually connected. The thickness of the reinforcing resin 50 is different between the arrangement regions D1.

そのため、本実施形態においては、必要な補強用樹脂50の厚さが異なる第1の電子部品が存在する場合には、補強用樹脂50の厚さが同じ第1の電子部品22毎にまとめることができるので、補強用樹脂50の配置を効率的に行える。   Therefore, in the present embodiment, when there are first electronic components having different thicknesses of the necessary reinforcing resin 50, the first electronic components 22 having the same thickness of the reinforcing resin 50 are grouped together. Therefore, the reinforcing resin 50 can be arranged efficiently.

なお、上記例では、2種類の異なる補強用樹脂50の厚さが存在する場合について示したが、3種類以上の異なる補強用樹脂50の厚さが存在する場合には、第1の電子部品配置領域D1を2個ではなく、当該種類に応じて3個以上設けてもよい。この場合も、3個以上の複数個の第1の電子部品配置領域D1において、個々の領域D1内では補強用樹脂50の厚さが均一であり、異なる領域D1の間では補強用樹脂50の厚さが互いに異なるものにすればよい。   In the above example, the case where the thickness of two different types of reinforcing resin 50 exists is shown. However, when the thickness of three or more types of different reinforcing resin 50 exists, the first electronic component You may provide three or more arrangement | positioning area | region D1 according to the said kind instead of two. Also in this case, in the plurality of first electronic component arrangement regions D1 of three or more, the thickness of the reinforcing resin 50 is uniform in each region D1, and the reinforcing resin 50 is different between the different regions D1. The thickness may be different from each other.

さらには、第1の電子部品の補強用樹脂50の厚さがすべて同じ場合であっても、複数個の第1の電子部品配置領域D1を設けてもよい。この場合には、第1の電子部品の種類や形状などに応じて、各領域D1毎に区別して配置することも可能である。   Furthermore, even if the thicknesses of the reinforcing resins 50 of the first electronic components are all the same, a plurality of first electronic component arrangement regions D1 may be provided. In this case, it is also possible to distinguish and arrange each region D1 according to the type and shape of the first electronic component.

(第4実施形態)
図5は、本発明の第4実施形態に係る電子装置の要部を示す概略断面図である。ここでは、基板10の一面11に設けられた本実施形態のダム部60のみを示し、それ以外の部材は省略している。
(Fourth embodiment)
FIG. 5 is a schematic cross-sectional view showing a main part of an electronic device according to the fourth embodiment of the present invention. Here, only the dam portion 60 of the present embodiment provided on the one surface 11 of the substrate 10 is shown, and other members are omitted.

本実施形態は、上記第3実施形態と同様に、複数個の第1の電子部品配置領域D1を設けるものであるが、異なる第1の電子部品配置領域D1間で、ダム部60の高さを異ならせるものである。   In the present embodiment, a plurality of first electronic component placement areas D1 are provided as in the third embodiment, but the height of the dam portion 60 is different between different first electronic component placement areas D1. Are different.

この場合、高さの異なるダム部60の形成方法は、次の通りである。まず、基板10の焼成時に厚膜導体として一定の厚みのダム部60を形成する。図5の左側の低いダム部60については、これで完成である。次に、図5の右側の高いダム部60については、上記一定の厚みのダム部60の上にさらに、はんだによって付加部60aを形成し、この付加部60aを含めて、高いダム部60とする。   In this case, the formation method of the dam part 60 from which height differs is as follows. First, when the substrate 10 is fired, a dam portion 60 having a constant thickness is formed as a thick film conductor. This completes the lower dam 60 on the left side of FIG. Next, with respect to the high dam portion 60 on the right side of FIG. 5, an additional portion 60a is further formed on the dam portion 60 with the constant thickness by solder, and the high dam portion 60 including the additional portion 60a To do.

ここで、厚膜導体としては、Cu、Agなどの導体ペーストを用い、これを塗布・硬化させることで、ダム部60を形成する。また、高いダム部60を形成するにあたって、上記例では、下側が厚膜導体、上側の付加部60aがはんだ、というように上下で異種材料を用いたが、下側の部分とその上の付加部60aとが、シリコーン樹脂などの同一材料であってもよい。   Here, as the thick film conductor, a conductor paste such as Cu or Ag is used, and the dam portion 60 is formed by applying and curing the paste. In forming the high dam portion 60, in the above example, different materials are used in the upper and lower sides, such as the thick film conductor on the lower side and the solder on the upper addition portion 60a. The part 60a may be made of the same material such as a silicone resin.

この場合、たとえば、シリコーン樹脂をディスペンスで配置するにあたって、ニードル径を変えたり、二度・三度塗りを行ったりすることで、ダム部60の高さを変えることが可能である。   In this case, for example, when the silicone resin is disposed by dispensing, it is possible to change the height of the dam portion 60 by changing the needle diameter or by applying twice or three times.

本実施形態のように、異なる第1の電子部品配置領域D1間でダム部60の高さを異ならせることは、上記第3実施形態のような異なる第1の電子部品配置領域D1の間で補強用樹脂50の厚さが互いに異なる場合に、効果的である。つまり、補強用樹脂50が厚い領域D1では、ダム部60を高く、補強用樹脂50薄い領域D1では、ダム部60を低くすればよい。   Different heights of the dam portions 60 between different first electronic component placement areas D1 as in the present embodiment are different between different first electronic component placement areas D1 as in the third embodiment. This is effective when the reinforcing resins 50 have different thicknesses. That is, the dam portion 60 may be raised in the region D1 where the reinforcing resin 50 is thick, and the dam portion 60 may be lowered in the region D1 where the reinforcing resin 50 is thin.

(第5実施形態)
図6は、本発明の第5実施形態に係る電子装置S3の要部を示す図であり、(a)は、基板10の一面11側の概略平面図、(b)は、後述する応力緩和部材70およびその近傍部の部分概略断面図である。
(Fifth embodiment)
6A and 6B are diagrams showing the main part of an electronic device S3 according to a fifth embodiment of the present invention, where FIG. 6A is a schematic plan view of one side 11 of the substrate 10, and FIG. 6B is stress relaxation described later. It is a partial schematic sectional drawing of the member 70 and its vicinity part.

ダム部60内の補強用樹脂50のエリアすなわち第1の電子部品配置領域D1が大きくなると、応力が大きくなり、補強用樹脂50にクラックが発生する懸念がある。そこで、本実施形態では、ダム部60の内側にて補強用樹脂50の内部に、補強用樹脂50よりも弾性率の大きい応力緩和部材70を配置する。   When the area of the reinforcing resin 50 in the dam portion 60, that is, the first electronic component placement region D1 is increased, there is a concern that stress increases and cracks are generated in the reinforcing resin 50. Therefore, in the present embodiment, the stress relaxation member 70 having a larger elastic modulus than the reinforcing resin 50 is disposed inside the reinforcing resin 50 inside the dam portion 60.

ここでは、応力緩和部材70は棒状をなすものであり、ダム部60と同様に、基板10の一面11に突出して設けられている。また、応力緩和部材70は、第1の電子部品配置領域D1内において、第1の電子部品20、22と重ならない位置、すなわち、第1の電子部品20、22とは異なる位置に設けられることが必要である。   Here, the stress relaxation member 70 has a rod shape, and is provided on the one surface 11 of the substrate 10 so as to protrude in the same manner as the dam portion 60. Further, the stress relaxation member 70 is provided in a position that does not overlap the first electronic components 20 and 22 in the first electronic component placement region D1, that is, a position different from the first electronic components 20 and 22. is required.

補強用樹脂50がエポキシ樹脂の場合には、応力緩和部材70の材料としては、シリコーン樹脂等が挙げられるが、同じエポキシ樹脂であっても、フィラーの量などを変えることで補強用樹脂50よりも弾性率が大きくなっているものであればよい。   In the case where the reinforcing resin 50 is an epoxy resin, examples of the material of the stress relaxation member 70 include a silicone resin. However, even if the same epoxy resin is used, the amount of the filler can be changed from the reinforcing resin 50. As long as the elastic modulus is large.

この応力緩和部材70は、基板10の一面11に、上記シリコーン樹脂等を塗布・硬化することにより形成される。その形成のタイミングとしては、たとえば、ダム部60の形成時に行ってもよいし、ダム部60を形成しさらに電子部品20〜22を実装した後に行ってもよい。要するに、補強用樹脂50の塗布前であればよい。   The stress relaxation member 70 is formed by applying and curing the silicone resin or the like on the one surface 11 of the substrate 10. The formation timing may be performed, for example, when the dam portion 60 is formed, or after the dam portion 60 is formed and the electronic components 20 to 22 are mounted. In short, it may be before application of the reinforcing resin 50.

本実施形態によれば、第1の電子部品配置領域D1を広くしていくことで連続した1個の補強用樹脂50の配置面積が大きくなっても、応力緩和部材70によって、樹脂内部の応力を低減できるため、補強用樹脂50のクラックの発生防止が可能となる。   According to this embodiment, even if the arrangement area of one continuous reinforcing resin 50 is increased by widening the first electronic component arrangement region D1, the stress relaxation member 70 causes the stress inside the resin to increase. Therefore, generation of cracks in the reinforcing resin 50 can be prevented.

図7は、本第5実施形態のもう一つの例としての電子装置の要部の概略平面構成を示す図であり、基板10の一面11側の概略平面図である。上記図6に示される例では、応力緩和部材70は棒状であったが、応力緩和部材70の形状は、図7に示されるように、球状であってもよい。この場合、棒状のものに比べて、必要な箇所に適宜配置しやすいという利点がある。また、これらの形状以外にも、応力緩和部材70の形状は、適宜変更が可能である。   FIG. 7 is a diagram showing a schematic plan configuration of a main part of an electronic device as another example of the fifth embodiment, and is a schematic plan view on the one surface 11 side of the substrate 10. In the example shown in FIG. 6, the stress relaxation member 70 has a rod shape, but the shape of the stress relaxation member 70 may be spherical as shown in FIG. 7. In this case, there is an advantage that it can be easily arranged where necessary in comparison with the rod-shaped one. In addition to these shapes, the shape of the stress relaxation member 70 can be changed as appropriate.

(他の実施形態)
なお、上記した各実施形態は、可能な範囲で適宜組み合わせてもよい。たとえば、基板10の一面11に、第1の電子部品配置領域D1を複数個設け、各領域D1について、補強用樹脂50の内部に応力緩和部材70を配置してもよい。
(Other embodiments)
In addition, you may combine each above-mentioned embodiment suitably in the possible range. For example, a plurality of first electronic component placement regions D1 may be provided on the one surface 11 of the substrate 10, and the stress relaxation member 70 may be disposed inside the reinforcing resin 50 for each region D1.

本発明の第1実施形態に係る電子装置を示す概略平面図である。1 is a schematic plan view showing an electronic device according to a first embodiment of the present invention. 図1中のA−A一点鎖線に沿った概略断面図である。It is a schematic sectional drawing in alignment with the AA dashed-dotted line in FIG. 本発明の第2実施形態に係る電子装置の製造方法の要部を示す概略平面図である。It is a schematic plan view which shows the principal part of the manufacturing method of the electronic device which concerns on 2nd Embodiment of this invention. 本発明の第3実施形態に係る電子装置を示す図であり、(a)は概略平面図、(b)は(a)中のB−B一点鎖線に沿った概略断面図である。It is a figure which shows the electronic device which concerns on 3rd Embodiment of this invention, (a) is a schematic plan view, (b) is a schematic sectional drawing along the BB dashed-dotted line in (a). 本発明の第4実施形態に係る電子装置の要部を示す概略断面図である。It is a schematic sectional drawing which shows the principal part of the electronic device which concerns on 4th Embodiment of this invention. 本発明の第5実施形態に係る電子装置の要部を示す図であり、(a)は概略平面図、(b)は応力緩和部材の近傍部の部分概略断面図である。It is a figure which shows the principal part of the electronic device which concerns on 5th Embodiment of this invention, (a) is a schematic plan view, (b) is a partial schematic sectional drawing of the vicinity part of a stress relaxation member. 上記第5実施形態のもう一つの例としての電子装置の要部の概略平面図である。It is a schematic plan view of the principal part of the electronic apparatus as another example of the said 5th Embodiment. 本発明者の試作品としての電子装置の概略平面図である。It is a schematic plan view of the electronic device as a prototype of the present inventor.

符号の説明Explanation of symbols

10…基板、11…基板の一面、20…第1の電子部品としての第1の半導体素子、
21…第2の電子部品としての第2の半導体素子、
22…第1の電子部品としてのモールド素子、50…補強用樹脂、60…ダム部、
70…応力緩和部材、D1…第1の電子部品配置領域。
DESCRIPTION OF SYMBOLS 10 ... Board | substrate, 11 ... One surface of a board | substrate, 20 ... 1st semiconductor element as 1st electronic component,
21 ... Second semiconductor element as second electronic component,
22 ... Mold element as first electronic component, 50 ... Reinforcing resin, 60 ... Dam part,
70: Stress relaxation member, D1: First electronic component placement region.

Claims (2)

基板(10)の一面(11)に複数個の電子部品(20、21、22)を搭載し、前記基板(10)と前記複数個の電子部品(20〜22)とを接続してなり、
前記複数個の電子部品は、前記基板(10)との接続部が補強用樹脂(50)により補強されている第1の電子部品(20、22)と、前記基板(10)との接続部が前記補強用樹脂(50)により補強されていない第2の電子部品(21)とより構成されている電子装置において、
前記基板(10)の一面(11)には、複数個の前記第1の電子部品(20、22)が配置されるとともに前記第2の電子部品(21)は配置されない連続した1個の領域である第1の電子部品配置領域(D1)が複数個設けられており、
それぞれの前記第1の電子部品配置領域(D1)の外周には、前記基板(10)の一面(11)における前記第1の電子部品配置領域(D1)の外側に前記補強用樹脂(50)がはみ出すのを防止するダム部(60)が設けられており、
複数個の前記第1の電子部品配置領域(D1)においては、個々の第1の電子部品配置領域(D1)内では前記補強用樹脂(50)の厚さが均一であり、異なる前記第1の電子部品配置領域(D1)の間では前記補強用樹脂(50)の厚さが互いに異なることを特徴とする電子装置。
A plurality of electronic components (20, 21, 22) are mounted on one surface (11) of the substrate (10), and the substrate (10) and the plurality of electronic components (20-22) are connected,
The plurality of electronic components are connected to the substrate (10) and the first electronic component (20, 22) in which the connection to the substrate (10) is reinforced by a reinforcing resin (50). In the electronic device constituted by the second electronic component (21) which is not reinforced by the reinforcing resin (50),
On one surface (11) of the substrate (10), a plurality of the first electronic components (20, 22) are arranged and one continuous region where the second electronic components (21) are not arranged. A plurality of first electronic component placement regions (D1) are provided,
On the outer periphery of each of the first electronic component placement regions (D1), the reinforcing resin (50) is disposed outside the first electronic component placement region (D1) on one surface (11) of the substrate (10). A dam (60) is provided to prevent overhanging ,
In the plurality of first electronic component arrangement regions (D1), the thickness of the reinforcing resin (50) is uniform in each of the first electronic component arrangement regions (D1), and the first electronic component arrangement regions (D1) are different. The electronic device is characterized in that the reinforcing resin (50) has a different thickness between the electronic component placement regions (D1) .
前記ダム部(60)の内側にて前記補強用樹脂(50)の内部には、前記補強用樹脂(50)よりも弾性率の大きい応力緩和部材(70)が配置されていることを特徴とする請求項1に記載の電子装置。 A stress relaxation member (70) having a higher elastic modulus than the reinforcing resin (50) is disposed inside the reinforcing resin (50) inside the dam portion (60). The electronic device according to claim 1 .
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