JP5045871B2 - 分光分析装置における機体差の補正方法 - Google Patents
分光分析装置における機体差の補正方法 Download PDFInfo
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Description
前記基準差分吸光度を目的変数、前記差分吸光度を説明変数として単回帰分析により差分吸光度ごとに回帰式を求める工程と、
から構成され、
前記回帰式を前記分光分析装置における各差分吸光度の固有の補正式とし、該分光分析装置にて測定対象物を測定して求めた差分吸光度を前記回帰式により補正する、という技術的手段を講じた。
Claims (1)
- 複数の波長の光で測定を行う分光分析装置において、
基準機となる分光分析装置にて複数のサンプルを測定し、波長ごとに複数の基準吸光度を求め、
各波長の前記基準吸光度毎に、その基準吸光度の波長の一方向側に隣接する波長の基準吸光度との差を求め、該差をそれぞれ基準差分吸光度とする工程と、
補正対象の分光分析装置にて前記サンプルを測定し、波長ごとに複数の吸光度を求め、各波長の前記吸光度毎に、その吸光度の波長の一方向側に隣接する波長の吸光度との差を求め、該差をそれぞれ差分吸光度とする工程と、
前記基準差分吸光度を目的変数、前記差分吸光度を説明変数として単回帰分析により差分吸光度ごとに回帰式を求める工程と、
から構成され、
前記回帰式を前記分光分析装置における各差分吸光度の固有の補正式とし、該分光分析装置にて測定対象物を測定して求めた差分吸光度を前記回帰式により補正することを特徴とする各分光分析装置間の機体差の補正方法。
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JP2007163353A JP2007163353A (ja) | 2007-06-28 |
JP5045871B2 true JP5045871B2 (ja) | 2012-10-10 |
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Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
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JP5572955B2 (ja) * | 2009-01-29 | 2014-08-20 | 株式会社サタケ | 近似式による吸光度の算出方法 |
JP2019190927A (ja) * | 2018-04-23 | 2019-10-31 | キヤノン株式会社 | 解析システム、撮像装置、および、プログラム |
Family Cites Families (6)
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JP3119528B2 (ja) * | 1992-05-15 | 2000-12-25 | 株式会社豊田中央研究所 | スキャナ分光測色装置 |
JP3252843B2 (ja) * | 1993-01-25 | 2002-02-04 | 井関農機株式会社 | 近赤外線分光分析装置 |
JP2950329B1 (ja) * | 1998-07-10 | 1999-09-20 | 株式会社島津製作所 | 食物成分分析装置 |
US20050037505A1 (en) * | 2000-05-11 | 2005-02-17 | James Samsoondar | Spectroscopic method and apparatus for analyte measurement |
JP4416896B2 (ja) * | 2000-02-02 | 2010-02-17 | 東北電力株式会社 | 石炭成分分析装置センサーの標準板及び該標準板を用いた器差補正方法 |
EP1418417A3 (en) * | 2002-09-30 | 2004-09-08 | Spectromedical Inc. | Method for calibrating spectrophotometric apparatus |
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