JP5042006B2 - Diamond field effect transistor - Google Patents

Diamond field effect transistor Download PDF

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JP5042006B2
JP5042006B2 JP2007333174A JP2007333174A JP5042006B2 JP 5042006 B2 JP5042006 B2 JP 5042006B2 JP 2007333174 A JP2007333174 A JP 2007333174A JP 2007333174 A JP2007333174 A JP 2007333174A JP 5042006 B2 JP5042006 B2 JP 5042006B2
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JP2009158612A (en
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誠 嘉数
研二 植田
博之 影島
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Nippon Telegraph and Telephone Corp
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本発明は、ダイヤモンド電界効果トランジスタに関し、より詳細には、絶縁層にＡｌ1-x-yＯxＨy化合物を用いたダイヤモンド電界効果トランジスタに関する。 The present invention relates to a diamond field effect transistor, and more particularly to a diamond field effect transistor using an Al 1-xy O x H y compound for an insulating layer.

ダイヤモンドは、ケイ素（Ｓｉ）に比べ、半導体としての物理特性において優れていることが知られている。ダイヤモンド素子は、Ｓｉ素子の高温動作で５倍、高電圧性能で３０倍、高速化では３倍の特性を有することが理論上確認されている。そのため、ダイヤモンドは、高い熱伝導率、絶縁破壊電界強度を有する高出力デバイスや、高いキャリアの移動度、飽和ドリフト速度を有する高周波デバイス等を実現するものとして期待されている。つまり、ダイヤモンド半導体を用いた電界効果トランジスタ（ＦＥＴ），バイポーラートランジスターにより、従来の半導体を遥かに越えた、高周波で駆動し、大電力動作可能な電子素子になる。   Diamond is known to be superior in physical properties as a semiconductor compared to silicon (Si). It has been theoretically confirmed that the diamond element has a characteristic that is five times as high as the Si element at high temperature, 30 times as high voltage performance, and three times as high speed. Therefore, diamond is expected to realize a high-power device having high thermal conductivity and dielectric breakdown electric field strength, a high-frequency device having high carrier mobility and saturation drift velocity, and the like. In other words, field effect transistors (FETs) and bipolar transistors using diamond semiconductors are electronic devices that can be driven at a high frequency and operate at high power, far exceeding conventional semiconductors.

従来のダイヤモンド電界効果トランジスタの作製方法について説明する。ＣＶＤ法などで成長したｐ型伝導性を示すダイヤモンド結晶層１を用意する（図３（ａ））。次に、ダイヤモンド結晶層１上に、ソース電極２、ドレイン電極３として金を蒸着させる（図３（ｂ））。次に、ダイヤモンド結晶層１上の、ソース電極２とドレイン電極３との間のゲート部に、１ｎｍの厚さのＡｌ金属膜５を蒸着させる（図３（ｃ））。最後に、試料を大気中に放置し、Ａｌ金属膜５を大気中の酸素と反応させ、Ａｌ2Ｏ3絶縁膜５にする。最後に、Ａｌ2Ｏ3絶縁膜５上にＡｌ金属膜６を蒸着させてゲート部を形成することにより、ダイヤモンド電界効果トランジスタが完成する（図３（ｄ））。 A method for manufacturing a conventional diamond field effect transistor will be described. A diamond crystal layer 1 having p-type conductivity grown by a CVD method or the like is prepared (FIG. 3A). Next, gold is deposited as a source electrode 2 and a drain electrode 3 on the diamond crystal layer 1 (FIG. 3B). Next, an Al metal film 5 having a thickness of 1 nm is deposited on the gate portion between the source electrode 2 and the drain electrode 3 on the diamond crystal layer 1 (FIG. 3C). Finally, the sample is left in the atmosphere, and the Al metal film 5 is reacted with oxygen in the atmosphere to form the Al 2 O 3 insulating film 5. Finally, an Al metal film 6 is deposited on the Al 2 O 3 insulating film 5 to form a gate portion, thereby completing a diamond field effect transistor (FIG. 3D).

このように、従来の技術によって作製した電界効果トランジスタのドレイン電流電圧特性を図４（ａ）に示す。従来のダイヤモンド電界効果トランジスタの特性は、ゲート電圧−３Ｖにおける最大ドレイン電流密度は０．４５Ａ／ｍｍであった。   FIG. 4A shows the drain current-voltage characteristics of the field effect transistor manufactured by the conventional technique as described above. As a characteristic of the conventional diamond field effect transistor, the maximum drain current density at a gate voltage of −3 V was 0.45 A / mm.

以下の記述において最大ドレイン電流密度と記す場合は、ゲート電圧−３Ｖにおける電流密度とする。また、ゲート長は１μｍ、ゲート幅は１００μｍの素子構造の場合に統一する。   In the following description, the maximum drain current density is the current density at the gate voltage of −3V. Further, it is unified in the case of an element structure having a gate length of 1 μm and a gate width of 100 μm.

しかしながら、図３のダイヤモンド結晶層１と絶縁膜５との界面、あるいは絶縁膜５中には多数の表面準位が存在し、バンドのピン止めを起こすため、ゲート電極から印加するゲート電圧を変化させても、ダイヤモンド結晶層１内の伝導度を効率よく変化させることができず、最大ドレイン電流密度は低く、実用にならないという課題があった。また、表面準位によるヒステリシスが見られることから、信頼性もないため実用にならないという課題もあった。ここでヒステリシスとは、図４（ａ）のように、実際のドレイン電流電圧特性測定で、ドレイン電圧を増加させるか、減少させるか、スキャンの方向（図中の矢印方向）によって測定されるドレイン電流値が異なる現象を言う。   However, since there are a number of surface states in the interface between the diamond crystal layer 1 and the insulating film 5 in FIG. 3 or in the insulating film 5, band pinning occurs, so that the gate voltage applied from the gate electrode changes. However, there is a problem that the conductivity in the diamond crystal layer 1 cannot be changed efficiently, the maximum drain current density is low, and it is not practical. In addition, since hysteresis due to surface states is observed, there is also a problem that it is not practical because it is not reliable. Here, as shown in FIG. 4A, the hysteresis is a drain measured by an actual drain current-voltage characteristic measurement by increasing or decreasing the drain voltage or by a scanning direction (arrow direction in the figure). A phenomenon in which the current value is different.

本発明は、このような課題に鑑みてなされたもので、その目的とするところは、最大ドレイン電流密度が高く、長時間の電力動作にも耐える信頼性の高い、実用的なダイヤモンド電界効果トランジスタを提供することにある。   The present invention has been made in view of such problems, and its object is to provide a practical diamond field effect transistor with a high maximum drain current density and high reliability that can withstand long-time power operation. Is to provide.

このような目的を達成するために、請求項１に記載の発明は、ダイヤモンド電界効果トランジスタであって、ｐ型又はｎ型を示すダイヤモンド結晶のダイヤモンド結晶層と、前記ダイヤモンド結晶層上に形成された、アルミニウム（Ａｌ）、酸素（Ｏ）、水素（Ｈ）からなるＡｌ１−ｘ−ｙＯｘＨｙ化合物の第１の絶縁層と、前記第１の絶縁層上に形成された金属層と、から構成されるゲート部を備え、前記第１の絶縁層の酸素モル比ｘと水素モル比ｙの関係が、（３．２５／７）＜ｘ＋ｙ＜（６．８／７）、（０．５／７）＜ｘ＜（４．５／７）、（０．７５／７）＜ｙ＜（４．７／７）の全てを同時に満たすことを特徴とする。
In order to achieve such an object, the invention described in claim 1 is a diamond field effect transistor, which is formed on a diamond crystal layer of a diamond crystal of p-type or n-type and on the diamond crystal layer. A first insulating layer of an Al 1-xy O x H y compound made of aluminum (Al), oxygen (O), and hydrogen (H), and a metal layer formed on the first insulating layer The relationship between the oxygen molar ratio x and the hydrogen molar ratio y of the first insulating layer is (3.25 / 7) <x + y <(6.8 / 7), ( 0.5 / 7) <x <(4.5 / 7) and (0.75 / 7) <y <(4.7 / 7) are all satisfied simultaneously .

請求項２に記載の発明は、ダイヤモンド電界効果トランジスタであって、ｐ型又はｎ型を示すダイヤモンド結晶のダイヤモンド結晶層と、前記ダイヤモンド結晶層上に形成された、アルミニウム（Ａｌ）、酸素（Ｏ）、水素（Ｈ）からなるＡｌ１−ｘ−ｙＯｘＨｙ化合物の第１の絶縁層と、 前記第１の絶縁層上に形成された第２の絶縁層と、前記第２の絶縁層上に形成された金属層と、から構成されるゲート部を備え、前記第１の絶縁層の酸素モル比ｘと水素モル比ｙの関係が、（３．２５／７）＜ｘ＋ｙ＜（６．８／７）、（０．５／７）＜ｘ＜（４．５／７）、（０．７５／７）＜ｙ＜（４．７／７）の全てを同時に満たすことを特徴とする。
The invention according to claim 2 is a diamond field effect transistor, which is a diamond crystal layer of p-type or n-type diamond crystal, and aluminum (Al), oxygen (O) formed on the diamond crystal layer. ), a first insulation layer of Al 1-x-y O x H y compounds consisting of hydrogen (H), a second insulating layer formed on the first insulating layer, the second A metal layer formed on the insulating layer, and the relationship between the oxygen molar ratio x and the hydrogen molar ratio y of the first insulating layer is (3.25 / 7) <x + y < (6.8 / 7), (0.5 / 7) <x <(4.5 / 7), (0.75 / 7) <y <(4.7 / 7) must be satisfied simultaneously. Features.

請求項３に記載の発明は、請求項２に記載のダイヤモンド電界効果トランジスタにおいて、前記第２の絶縁層が、酸化アルミニウム（Ａｌ2Ｏ3）又はニ酸化ケイ素（ＳｉＯ2）からなることを特徴とする。 According to a third aspect of the present invention, in the diamond field effect transistor according to the second aspect, the second insulating layer is made of aluminum oxide (Al 2 O 3 ) or silicon dioxide (SiO 2 ). And

請求項４に記載の発明は、請求項１乃至３のいずれかに記載のダイヤモンド電界効果トランジスタにおいて、前記第１の絶縁層の厚さが１ｎｍから６０ｎｍの範囲にあることを特徴とする。 According to a fourth aspect of the present invention, in the diamond field effect transistor according to any one of the first to third aspects, the thickness of the first insulating layer is in the range of 1 nm to 60 nm.

このように本発明は、ダイヤモンド電界効果トランジスタの絶縁層に、Ａｌ（ＯＨ）3、あるいは、アルミニウム、酸素、水素で構成されたＡｌ1-x-yＯxＨy化合物を用いることに特徴を持つ。 As described above, the present invention is characterized in that Al (OH) 3 or an Al 1-xy O x Hy compound composed of aluminum, oxygen, and hydrogen is used for the insulating layer of the diamond field effect transistor.

本発明によれば、最大ドレイン電流密度が高く、長時間の電力動作にも耐える信頼性の高いダイヤモンド電界効果トランジスタが可能になる。   According to the present invention, a highly reliable diamond field effect transistor having a high maximum drain current density and capable of withstanding long-time power operation becomes possible.

以下、図面を参照しながら本発明の実施形態について詳細に説明する。
（実施形態１）
図１に、本発明の一実施形態に係るダイヤモンド電界効果トランジスタの作製工程を示す。ｐ型またはｎ型の伝導性を有するダイヤモンド結晶層１をＣＶＤ装置などで成長させる。このダイヤモンド結晶層１は単結晶の方が望ましいが多結晶でもよい（図１（ａ））。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.
(Embodiment 1)
FIG. 1 shows a manufacturing process of a diamond field effect transistor according to an embodiment of the present invention. A diamond crystal layer 1 having p-type or n-type conductivity is grown by a CVD apparatus or the like. The diamond crystal layer 1 is preferably a single crystal but may be polycrystalline (FIG. 1 (a)).

次に、ダイヤモンド結晶層１上のゲート電極を設ける領域にレジストを塗布し、その上から試料の表面全面に金を蒸着させる。レジストをリフトオフし、レジストとその上に蒸着されている金の一部を除去して開口部を形成し、ソース電極２、ドレイン電極３を形成する（図１（ｂ））。   Next, a resist is applied to the region on the diamond crystal layer 1 where the gate electrode is to be provided, and gold is deposited on the entire surface of the sample. The resist is lifted off, and the resist and a part of gold deposited thereon are removed to form an opening, and the source electrode 2 and the drain electrode 3 are formed (FIG. 1B).

次に、レジストを試料全面に塗布し、ゲート電極を形成する領域に露光および現像を行ってレジストの一部を除去し、開口部を形成する。７６Ｔｏｒｒに減圧したＣＶＤチャンバ内で、上記ダイヤモンド結晶層１に、酸素ガス、水素ガス、トリメチルアルミニウムを供給し、ソース電極２とドレイン電極３との間のゲート部に厚さ８ｎｍのＡｌ（ＯＨ）3またはＡｌ1-x-yＯxＨy化合物からなる絶縁層４を形成する（図１（ｃ））。 Next, a resist is applied to the entire surface of the sample, and exposure and development are performed on a region where a gate electrode is to be formed to remove a part of the resist, thereby forming an opening. In a CVD chamber decompressed to 76 Torr, oxygen gas, hydrogen gas, and trimethylaluminum are supplied to the diamond crystal layer 1, and Al (OH) having a thickness of 8 nm is supplied to the gate portion between the source electrode 2 and the drain electrode 3. An insulating layer 4 made of 3 or an Al 1-xy O x H y compound is formed (FIG. 1C).

最後に、絶縁層４上にＡｌ金属膜６を蒸着させてゲート部を形成し、レジストを除去する。（図１（ｄ））。   Finally, an Al metal film 6 is deposited on the insulating layer 4 to form a gate portion, and the resist is removed. (FIG. 1 (d)).

このようにして作製された本発明の電界効果トランジスタのドレイン電流電圧特性を図１（ｅ）のように測定した。その結果を図４（ｂ）に示す。本発明の一実施形態に係るダイヤモンド電界効果トランジスタでは、ゲート電圧−３Ｖにおける最大ドレイン電流密度は１Ａ／ｍｍであった。これは従来技術による場合の２倍に相当する。また、従来の技術のような表面準位がダイヤモンド結晶膜と絶縁層との界面、および絶縁膜中に存在しないため、ドレイン電流電圧特性において、ヒステリシス現象は消失し、信頼性は著しく向上した。   The drain current-voltage characteristics of the field effect transistor of the present invention produced as described above were measured as shown in FIG. The result is shown in FIG. In the diamond field effect transistor according to one embodiment of the present invention, the maximum drain current density at a gate voltage of −3 V was 1 A / mm. This corresponds to twice as much as in the prior art. Further, since the surface level as in the prior art does not exist in the interface between the diamond crystal film and the insulating layer and in the insulating film, the hysteresis phenomenon disappears in the drain current-voltage characteristics, and the reliability is remarkably improved.

図５に、絶縁層４にＡｌ1-x-yＯxＨy化合物を用いた場合の、酸素モル比ｘと水素モル比ｙに対する最大ドレイン電流値の変化を示す。黒丸は、実際に測定した酸素モル比ｘと水素モル比ｙの値を示すものであり、括弧内の数字は実際に得られた最大ドレイン電流値（Ａ／ｍｍ）である。また、それら実測値に基づき、最大ドレイン電流値の分布を等高線で示した。ｘ＝３／５、ｙ＝０の場合、すなわち、従来技術のＡｌ2Ｏ3の場合、最大ドレイン電流値は０．５Ａ／ｍｍであったが、ｘ＝ｙ＝３／７の場合、すなわち、Ａｌ1-x-yＯxＨy化合物がＡｌ（ＯＨ）3の場合、最大ドレイン電流値は極大値１Ａ／ｍｍを示した。 FIG. 5 shows changes in the maximum drain current value with respect to the oxygen molar ratio x and the hydrogen molar ratio y when an Al 1-xy O x H y compound is used for the insulating layer 4. The black circles indicate the values of the actually measured oxygen molar ratio x and hydrogen molar ratio y, and the numbers in parentheses are the maximum drain current values (A / mm) actually obtained. In addition, based on these actually measured values, the distribution of the maximum drain current value is shown by contour lines. In the case of x = 3/5, y = 0, that is, in the case of prior art Al 2 O 3 , the maximum drain current value was 0.5 A / mm, but in the case of x = y = 3/7, that is, When the Al 1-xy O x H y compound was Al (OH) 3 , the maximum drain current value showed a maximum value of 1 A / mm.

また、（３．２５／７）＜ｘ＋ｙ＜（６．８／７）、（０．５／７）＜ｘ＜（４．５／７）、（０．７５／７）＜ｙ＜（４．７／７）の全てを同時に満たす範囲では、０．７Ａ／ｍｍ以上の高い値を取る。   Also, (3.25 / 7) <x + y <(6.8 / 7), (0.5 / 7) <x <(4.5 / 7), (0.75 / 7) <y <(4 In the range where all of .7 / 7) are simultaneously satisfied, a high value of 0.7 A / mm or more is taken.

尚、個体差等を考慮すると、（４／７）＜ｘ＋ｙ＜（６．７／７）、（０．９／７）＜ｘ＜（４．３／７）、（１．５／７）＜ｙ＜（４．５／７）の全てを同時に満たす範囲では、より高い精度で０．８Ａ／ｍｍ以上の高い値を取る。   In consideration of individual differences, (4/7) <x + y <(6.7 / 7), (0.9 / 7) <x <(4.3 / 7), (1.5 / 7) In a range where all of <y <(4.5 / 7) are simultaneously satisfied, a high value of 0.8 A / mm or more is taken with higher accuracy.

同様に、（５／７）＜ｘ＋ｙ＜（６．５／７）、（１．９／７）＜ｘ＜（３．８／７）、（２．２５／７）＜ｙ＜（４／７）の全てを同時に満たす範囲では、より高い確度で０．９Ａ／ｍｍ以上の高い値を取る。   Similarly, (5/7) <x + y <(6.5 / 7), (1.9 / 7) <x <(3.8 / 7), (2.25 / 7) <y <(4 / In a range where all of 7) are satisfied at the same time, a high value of 0.9 A / mm or more is taken with higher accuracy.

次に、図６に、Ａｌ（ＯＨ）3絶縁層４の厚さと、作製した本発明のダイヤモンド電界効果トランジスタのゲート電圧−３Ｖにおける最大ドレイン電流密度との関係を示す。白丸の傍の数字は絶縁膜の厚さ（ｎｍ）を示している。厚さ８ｎｍで極大値１Ａ／ｍｍを取るが、厚さが１ｎｍから６０ｎｍの範囲で最大ドレイン電流密度は０．８Ａ／ｍｍ以上の高い値を取る。 Next, FIG. 6 shows the relationship between the thickness of the Al (OH) 3 insulating layer 4 and the maximum drain current density at a gate voltage of −3 V of the fabricated diamond field effect transistor of the present invention. The number next to the white circle indicates the thickness (nm) of the insulating film. Although the maximum value is 1 A / mm at a thickness of 8 nm, the maximum drain current density is a high value of 0.8 A / mm or more when the thickness ranges from 1 nm to 60 nm.

尚、個体差等を考慮すると、厚さが２ｎｍから４０ｎｍの範囲では、より高い精度で最大ドレイン電流密度は０．９Ａ／ｍｍ以上の高い値を取る。   In consideration of individual differences and the like, the maximum drain current density takes a high value of 0.9 A / mm or more with higher accuracy in the thickness range of 2 nm to 40 nm.

同様に、厚さが５ｎｍから２０ｎｍの範囲では、より高い精度で最大ドレイン電流密度は１Ａ／ｍｍ程度の高い値を取る。   Similarly, in the thickness range of 5 nm to 20 nm, the maximum drain current density takes a high value of about 1 A / mm with higher accuracy.

（実施形態２）
図２に、本発明の別の実施形態として、Ａｌ（ＯＨ）3またはＡｌ1-x-yＯxＨy絶縁層４とゲート金属６の間にＡｌ2Ｏ3またはＳｉＯ2絶縁膜５を挿入したダイヤモンド電界効果トランジスタの構造を示す。Ａｌ（ＯＨ）3またはＡｌ1-x-yＯxＨy絶縁層４はゲート金属６に対する付着力が強くないため、Ａｌ2Ｏ3またはＳｉＯ2絶縁膜５を介すことによってゲート金属６の付着力を高めることができる。本実施形態に係る電界効果トランジスタは、絶縁層４を形成するところまでは実施形態１と同じ方法で作製し、絶縁層４上にＡｌ2Ｏ3またはＳｉＯ2絶縁膜５、Ａｌ金属膜６を順に蒸着させてゲート部を形成し、レジストを除去することによって作製される。 (Embodiment 2)
In FIG. 2, as another embodiment of the present invention, an Al 2 O 3 or SiO 2 insulating film 5 is inserted between an Al (OH) 3 or Al 1-xy O x H y insulating layer 4 and a gate metal 6. The structure of a diamond field effect transistor is shown. Since the Al (OH) 3 or Al 1-xy O x H y insulating layer 4 does not have a strong adhesion to the gate metal 6, the adhesion of the gate metal 6 through the Al 2 O 3 or SiO 2 insulating film 5. Can be increased. The field effect transistor according to the present embodiment is manufactured by the same method as in the first embodiment until the insulating layer 4 is formed, and the Al 2 O 3 or SiO 2 insulating film 5 and the Al metal film 6 are formed on the insulating layer 4. It is produced by sequentially depositing the gate portion to remove the resist.

本実施形態に係るダイヤモンド電界効果トランジスタは、実施形態１の特性、すなわち、図４（ｂ）、図５、図６と同様の特性を有しており、最大ドレイン電流密度が高く、信頼性の高い電界効果トランジスタである。   The diamond field effect transistor according to the present embodiment has the characteristics of the first embodiment, that is, the same characteristics as those of FIGS. 4B, 5 and 6, and has a high maximum drain current density and high reliability. It is a high field effect transistor.

（ａ）〜（ｄ）は、本発明の実施形態１に係るダイヤモンド電界効果トランジスタの作製工程を示す図であり、（ｅ）は、ダイヤモンド電界効果トランジスタのドレイン電流電圧特性の測定方法を示す図である。(A)-(d) is a figure which shows the preparation process of the diamond field effect transistor which concerns on Embodiment 1 of this invention, (e) is a figure which shows the measuring method of the drain current voltage characteristic of a diamond field effect transistor. It is. 本発明の実施形態２に係るダイヤモンド電界効果トランジスタの構想を示す図である。It is a figure which shows the concept of the diamond field effect transistor which concerns on Embodiment 2 of this invention. 従来のダイヤモンド電界効果トランジスタの作製工程を示す図である。It is a figure which shows the preparation process of the conventional diamond field effect transistor. （ａ）は、従来のダイヤモンド電界効果トランジスタのドレイン電流電圧特性を示す図であり、（ｂ）は、本発明の電界効果トランジスタのドレイン電流電圧特性を示す図である。(A) is a figure which shows the drain current voltage characteristic of the conventional diamond field effect transistor, (b) is a figure which shows the drain current voltage characteristic of the field effect transistor of this invention. Ａｌ1-x-yＯxＨy化合物を用いた絶縁層の酸素モル比ｘと水素モル比ｙに対する最大ドレイン電流値の変化を示す図である。Is a graph showing changes in the maximum drain current with respect to Al 1-xy O x H y compound oxygen molar ratio x of hydrogen molar ratio y of the insulating layer using. Ａｌ（ＯＨ）3絶縁層の厚さと、本発明のダイヤモンド電界効果トランジスタのゲート電圧−３Ｖにおける最大ドレイン電流密度との関係を示す図である。It is a figure which shows the relationship between the thickness of an Al (OH) 3 insulating layer, and the maximum drain current density in the gate voltage -3V of the diamond field effect transistor of this invention.

符号の説明Explanation of symbols

１ ダイヤモンド結晶層
２ ソース電極
３ ドレイン電極
４、５ 絶縁層
６ 金属膜 DESCRIPTION OF SYMBOLS 1 Diamond crystal layer 2 Source electrode 3 Drain electrode 4, 5 Insulating layer 6 Metal film

Claims (4)

ｐ型又はｎ型を示すダイヤモンド結晶のダイヤモンド結晶層と、
前記ダイヤモンド結晶層上に形成された、アルミニウム（Ａｌ）、酸素（Ｏ）、水素（Ｈ）からなるＡｌ１−ｘ−ｙＯｘＨｙ化合物の第１の絶縁層と、
前記第１の絶縁層上に形成された金属層と、
から構成されるゲート部を備え、
前記第１の絶縁層の酸素モル比ｘと水素モル比ｙの関係が、（３．２５／７）＜ｘ＋ｙ＜（６．８／７）、（０．５／７）＜ｘ＜（４．５／７）、（０．７５／７）＜ｙ＜（４．７／７）の全てを同時に満たすことを特徴とするダイヤモンド電界効果トランジスタ。 a diamond crystal layer of diamond crystal exhibiting p-type or n-type;
A first insulating layer of an Al 1-xy O x H y compound made of aluminum (Al), oxygen (O), and hydrogen (H) formed on the diamond crystal layer;
A metal layer formed on the first insulating layer;
Comprising a composed gate portion from
The relationship between the oxygen molar ratio x and the hydrogen molar ratio y of the first insulating layer is (3.25 / 7) <x + y <(6.8 / 7), (0.5 / 7) <x <(4 .5 / 7) and (0.75 / 7) <y <(4.7 / 7), all of which are satisfied at the same time . ｐ型又はｎ型を示すダイヤモンド結晶のダイヤモンド結晶層と、
前記ダイヤモンド結晶層上に形成された、アルミニウム（Ａｌ）、酸素（Ｏ）、水素（Ｈ）からなるＡｌ１−ｘ−ｙＯｘＨｙ化合物の第１の絶縁層と、
前記第１の絶縁層上に形成された第２の絶縁層と、
前記第２の絶縁層上に形成された金属層と、
から構成されるゲート部を備え、
前記第１の絶縁層の酸素モル比ｘと水素モル比ｙの関係が、（３．２５／７）＜ｘ＋ｙ＜（６．８／７）、（０．５／７）＜ｘ＜（４．５／７）、（０．７５／７）＜ｙ＜（４．７／７）の全てを同時に満たすことを特徴とするダイヤモンド電界効果トランジスタ。 a diamond crystal layer of diamond crystal exhibiting p-type or n-type;
Wherein formed on the diamond crystal layer, and an aluminum (Al), oxygen (O), in the first insulation layer of Al 1-x-y O x H y compounds consisting of hydrogen (H),
A second insulating layer formed on the first insulating layer;
A metal layer formed on the second insulating layer;
Comprising a composed gate portion from
The relationship between the oxygen molar ratio x and the hydrogen molar ratio y of the first insulating layer is (3.25 / 7) <x + y <(6.8 / 7), (0.5 / 7) <x <(4 .5 / 7) and (0.75 / 7) <y <(4.7 / 7), all of which are satisfied at the same time . 前記第２の絶縁層が、酸化アルミニウム（Ａｌ２Ｏ３）又は二酸化ケイ素（ＳｉＯ２）からなることを特徴とする請求項２に記載のダイヤモンド電界効果トランジスタ。 The diamond field effect transistor according to claim 2, wherein the second insulating layer is made of aluminum oxide (Al 2 O 3 ) or silicon dioxide (SiO 2 ). 前記第１の絶縁層の厚さが１ｎｍから６０ｎｍの範囲にあることを特徴とする請求項１乃至３のいずれかに記載のダイヤモンド電界効果トランジスタ。
Diamond field effect transistor according to any one of claims 1 to 3 the thickness of the first insulating layer is characterized in that in the range of 1nm to 60 nm.
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