JP5019335B2 - 時間差アナログ比較器およびアナログ信号の時間差比較を行なう方法 - Google Patents

時間差アナログ比較器およびアナログ信号の時間差比較を行なう方法 Download PDF

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JP5019335B2
JP5019335B2 JP2008322169A JP2008322169A JP5019335B2 JP 5019335 B2 JP5019335 B2 JP 5019335B2 JP 2008322169 A JP2008322169 A JP 2008322169A JP 2008322169 A JP2008322169 A JP 2008322169A JP 5019335 B2 JP5019335 B2 JP 5019335B2
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time interval
signal
time
time difference
circuit
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JP2009153130A5 (enExample
JP2009153130A (ja
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ウィリアム・エム・ポリフカ
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パワー・インテグレーションズ・インコーポレーテッド
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
    • H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/60—Analogue/digital converters with intermediate conversion to frequency of pulses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/12—Measuring rate of change

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Manipulation Of Pulses (AREA)
  • Measuring Frequencies, Analyzing Spectra (AREA)
JP2008322169A 2007-12-21 2008-12-18 時間差アナログ比較器およびアナログ信号の時間差比較を行なう方法 Expired - Fee Related JP5019335B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/963,645 2007-12-21
US11/963,645 US8154321B2 (en) 2007-12-21 2007-12-21 Method and apparatus for time-differential comparison of an analog signal

Related Child Applications (1)

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JP2012125750A Division JP5270019B2 (ja) 2007-12-21 2012-06-01 時間差アナログ比較器およびアナログ信号の時間差比較を行なう方法

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JP2009153130A JP2009153130A (ja) 2009-07-09
JP2009153130A5 JP2009153130A5 (enExample) 2012-02-02
JP5019335B2 true JP5019335B2 (ja) 2012-09-05

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JP2008322169A Expired - Fee Related JP5019335B2 (ja) 2007-12-21 2008-12-18 時間差アナログ比較器およびアナログ信号の時間差比較を行なう方法
JP2012125750A Expired - Fee Related JP5270019B2 (ja) 2007-12-21 2012-06-01 時間差アナログ比較器およびアナログ信号の時間差比較を行なう方法

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US (3) US8154321B2 (enExample)
EP (1) EP2073384A3 (enExample)
JP (2) JP5019335B2 (enExample)
CN (1) CN101464658B (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8154321B2 (en) * 2007-12-21 2012-04-10 Power Integrations, Inc. Method and apparatus for time-differential comparison of an analog signal
JP2010271091A (ja) 2009-05-20 2010-12-02 Seiko Epson Corp 周波数測定装置
JP5517033B2 (ja) 2009-05-22 2014-06-11 セイコーエプソン株式会社 周波数測定装置
JP5440999B2 (ja) * 2009-05-22 2014-03-12 セイコーエプソン株式会社 周波数測定装置
JP5582447B2 (ja) 2009-08-27 2014-09-03 セイコーエプソン株式会社 電気回路、同電気回路を備えたセンサーシステム、及び同電気回路を備えたセンサーデバイス
JP5815918B2 (ja) 2009-10-06 2015-11-17 セイコーエプソン株式会社 周波数測定方法、周波数測定装置及び周波数測定装置を備えた装置
JP5876975B2 (ja) 2009-10-08 2016-03-02 セイコーエプソン株式会社 周波数測定装置及び周波数測定装置における変速分周信号の生成方法
JP5883558B2 (ja) 2010-08-31 2016-03-15 セイコーエプソン株式会社 周波数測定装置及び電子機器
US11942900B2 (en) 2021-10-14 2024-03-26 Power Integrations, Inc. Signal compensation with summed error signals
JP2023183169A (ja) * 2022-06-15 2023-12-27 ソニーセミコンダクタソリューションズ株式会社 光検出素子

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NL290465A (enExample) * 1963-03-21
US3651414A (en) * 1970-04-30 1972-03-21 Lorain Prod Corp Variable frequency system
US3735347A (en) * 1971-11-02 1973-05-22 Franklin Electric Co Inc Change detector system
US3737789A (en) * 1971-12-21 1973-06-05 Atomic Energy Commission Count rate discriminator
FR2238934B1 (enExample) * 1973-07-27 1978-06-30 Lignes Telegraph Telephon
US3963909A (en) * 1974-08-22 1976-06-15 The Perkin-Elmer Corporation Method and apparatus for computation in a kinetic analyzer
US4114083A (en) * 1977-06-15 1978-09-12 The United States Of America As Represented By The Secretary Of The Navy Battery thermal runaway monitor
JPS55162140A (en) * 1979-06-04 1980-12-17 Hitachi Ltd Arithmetic unit
JPS56144635A (en) * 1980-04-11 1981-11-11 Toshiba Corp Analog to digital converter
US4602246A (en) * 1982-02-11 1986-07-22 Jensen Garold K Intruder detector apparatus
US5764089A (en) * 1995-09-11 1998-06-09 Altera Corporation Dynamic latching device
CN2508553Y (zh) * 2001-08-03 2002-09-04 王先运 间歇式自动喷灌系统控制器
US7411425B2 (en) * 2005-06-28 2008-08-12 International Business Machines Corporation Method for power consumption reduction in a limited-switch dynamic logic (LSDL) circuit
US8154321B2 (en) * 2007-12-21 2012-04-10 Power Integrations, Inc. Method and apparatus for time-differential comparison of an analog signal

Also Published As

Publication number Publication date
JP2012161107A (ja) 2012-08-23
US8497729B2 (en) 2013-07-30
EP2073384A2 (en) 2009-06-24
CN101464658A (zh) 2009-06-24
CN101464658B (zh) 2013-01-23
US20120161815A1 (en) 2012-06-28
JP5270019B2 (ja) 2013-08-21
US20130057316A1 (en) 2013-03-07
US8324941B2 (en) 2012-12-04
EP2073384A3 (en) 2013-12-18
US20090160489A1 (en) 2009-06-25
US8154321B2 (en) 2012-04-10
JP2009153130A (ja) 2009-07-09

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