JP4921588B2 - 質量分析計 - Google Patents

質量分析計 Download PDF

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Publication number
JP4921588B2
JP4921588B2 JP2010507972A JP2010507972A JP4921588B2 JP 4921588 B2 JP4921588 B2 JP 4921588B2 JP 2010507972 A JP2010507972 A JP 2010507972A JP 2010507972 A JP2010507972 A JP 2010507972A JP 4921588 B2 JP4921588 B2 JP 4921588B2
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JP
Japan
Prior art keywords
ion
signal
value
ions
time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2010507972A
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English (en)
Japanese (ja)
Other versions
JP2010527019A (ja
JP2010527019A5 (enExample
Inventor
ギルバート・アンソニー・ジェイムズ
グリーン・マーティン
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Micromass UK Ltd
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Micromass UK Ltd
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Filing date
Publication date
Application filed by Micromass UK Ltd filed Critical Micromass UK Ltd
Publication of JP2010527019A publication Critical patent/JP2010527019A/ja
Publication of JP2010527019A5 publication Critical patent/JP2010527019A5/ja
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Publication of JP4921588B2 publication Critical patent/JP4921588B2/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0036—Step by step routines describing the handling of the data generated during a measurement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2218/00—Aspects of pattern recognition specially adapted for signal processing
    • G06F2218/02—Preprocessing
    • G06F2218/04—Denoising

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2010507972A 2007-05-15 2008-05-14 質量分析計 Expired - Fee Related JP4921588B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GBGB0709312.3A GB0709312D0 (en) 2007-05-15 2007-05-15 Mass spectrometer
GB0709312.3 2007-05-15
US94049407P 2007-05-29 2007-05-29
US60/940.494 2007-05-29
PCT/GB2008/001663 WO2008139193A2 (en) 2007-05-15 2008-05-14 Mass spectrometer

Publications (3)

Publication Number Publication Date
JP2010527019A JP2010527019A (ja) 2010-08-05
JP2010527019A5 JP2010527019A5 (enExample) 2011-07-07
JP4921588B2 true JP4921588B2 (ja) 2012-04-25

Family

ID=38219430

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010507972A Expired - Fee Related JP4921588B2 (ja) 2007-05-15 2008-05-14 質量分析計

Country Status (6)

Country Link
US (1) US8598513B2 (enExample)
EP (1) EP2147453B1 (enExample)
JP (1) JP4921588B2 (enExample)
CA (1) CA2687181C (enExample)
GB (2) GB0709312D0 (enExample)
WO (1) WO2008139193A2 (enExample)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008023694B4 (de) * 2008-05-15 2010-12-30 Bruker Daltonik Gmbh Fragmentierung von Analytionen durch Ionenstoß in HF-Ionenfallen
GB0909289D0 (en) * 2009-05-29 2009-07-15 Micromass Ltd Method of processing mass spectral data
GB201002447D0 (en) 2010-02-12 2010-03-31 Micromass Ltd Mass spectrometer
CN103328966B (zh) * 2011-01-21 2016-03-16 麦丝地科技有限公司 背景扣除介导的数据相关型采集
US20130015344A1 (en) * 2011-07-15 2013-01-17 Bruker Daltonics, Inc. Background noise correction in quadrupole mass spectrometers
US8942943B2 (en) 2011-07-15 2015-01-27 Bruker Daltonics, Inc. Dynamic range improvement for mass spectrometry
GB201208841D0 (en) * 2012-05-18 2012-07-04 Micromass Ltd Calibrating dual adc acquisition system
WO2013180818A2 (en) 2012-05-29 2013-12-05 Biodesix, Inc. Deep-maldi tof mass spectrometry of complex biological samples, e.g., serum, and uses thereof
US9196467B2 (en) 2013-03-11 2015-11-24 1St Detect Corporation Mass spectrum noise cancellation by alternating inverted synchronous RF
US10354849B2 (en) 2013-07-09 2019-07-16 Micromass Uk Limited Method of recording ADC saturation
WO2015118321A1 (en) 2014-02-04 2015-08-13 Micromass Uk Limited Optimized multiple reaction monitoring or single ion recording method
WO2015189546A1 (en) 2014-06-11 2015-12-17 Micromass Uk Limited Flagging adc coalescence
EP3158574B1 (en) * 2014-06-23 2025-11-19 DH Technologies Development Pte. Ltd. Crosstalk compensation for ion mobility spectrometry power supply
GB2541385B (en) * 2015-08-14 2020-01-01 Thermo Fisher Scient Bremen Gmbh Dynamic range improvement for isotope ratio mass spectrometry
US10026598B2 (en) * 2016-01-04 2018-07-17 Rohde & Schwarz Gmbh & Co. Kg Signal amplitude measurement and calibration with an ion trap
JP6683015B2 (ja) * 2016-05-26 2020-04-15 株式会社島津製作所 分析データ処理装置
WO2018138901A1 (ja) * 2017-01-30 2018-08-02 株式会社島津製作所 スペクトルデータ処理装置
CN113311496B (zh) * 2021-06-11 2022-07-19 中国科学院精密测量科学与技术创新研究院 一种基于双组分原子交织干涉效应的重力仪
WO2023211782A1 (en) 2022-04-27 2023-11-02 Elemental Scientific, Inc. Nanoparticle baseline and particle detection threshold determination through iterative outlier removal
US12085497B1 (en) 2023-04-12 2024-09-10 Elemental Scientific, Inc. Nanoparticle analysis for ultra-low level concentrations of nanoparticles in fluid samples

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10152821B4 (de) * 2001-10-25 2006-11-16 Bruker Daltonik Gmbh Massenspektren ohne elektronisches Rauschen
KR100492898B1 (ko) * 2001-12-14 2005-06-03 주식회사 하이닉스반도체 반도체 소자 제조 방법
US6680476B1 (en) 2002-11-22 2004-01-20 Agilent Technologies, Inc. Summed time-of-flight mass spectrometry utilizing thresholding to reduce noise
GB0329554D0 (en) 2003-12-22 2004-01-28 Micromass Ltd Mass spectrometer
JP4575193B2 (ja) 2005-02-25 2010-11-04 株式会社日立ハイテクノロジーズ 質量分析装置および質量分析方法
US8626449B2 (en) * 2006-10-17 2014-01-07 The Regents Of The University Of California Biological cell sorting and characterization using aerosol mass spectrometry

Also Published As

Publication number Publication date
GB0808828D0 (en) 2008-06-18
US20110049353A1 (en) 2011-03-03
JP2010527019A (ja) 2010-08-05
CA2687181C (en) 2016-04-26
WO2008139193A2 (en) 2008-11-20
GB0709312D0 (en) 2007-06-20
EP2147453A2 (en) 2010-01-27
GB2450959B (en) 2009-09-23
EP2147453B1 (en) 2012-07-11
GB2450959A (en) 2009-01-14
US8598513B2 (en) 2013-12-03
CA2687181A1 (en) 2008-11-20
WO2008139193A3 (en) 2009-08-13

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