JP4911964B2 - Contained structure, measuring device, method and program - Google Patents

Description

  The present invention relates to handling of an object to be measured that is measured by irradiation with electromagnetic waves.

  Conventionally, it is known to analyze an object to be measured based on transmittance when the object to be measured is irradiated with a terahertz wave (see, for example, Patent Document 1). Moreover, the transmittance | permeability at the time of irradiating electromagnetic waves to what opened the hole in the metal plate is also known (for example, refer nonpatent literature 1). Furthermore, it is also known to use a metal plate having a hole as a retardation plate (see, for example, Patent Document 2).

Further, referring to Fig. 1 of Non-Patent Document 3, Terahertz Time Domain Spectroscopy (Terahertz Time Domain Spectroscopy)
Spectroscopy: THz-TDS) is also known.

JP 2004-108905 A JP 2004-117703 A K.F.Renk and L. Genzel “Interference Filters and Fabry-PerotInterferometers for the Far Infrared”, APPLIED OPTICS, Vol. 1, No. 5, September 1962 Masaki Tanaka et al., “Effect of a thin dielectric layer onterahertz transmission characteristics for metal hole arrays”, Optics Letters, Vol. 30, May 2005 Sakai Kiyomi, “Terahertz Time Domain Spectroscopy”, Spectroscopic Research, 2001, Vol. 50, No. 6, p. 261-273

  However, the prior art as described above does not disclose how it is advantageous to handle a measurement object irradiated with electromagnetic waves.

  Terahertz time domain spectroscopy is a complex measurement method.

  Then, this invention makes it a subject to handle the to-be-measured object measured by irradiating electromagnetic waves advantageously (for example, performing a simple measurement).

  A containment structure according to the present invention includes a void arrangement structure in which a void surrounded by a conductor is arranged on a predetermined plane, and a container that accommodates an object to be measured and the void arrangement structure, A container is comprised so that the electromagnetic waves for a measurement irradiated to the said space | gap part may be transmitted in order to measure the characteristic of the said to-be-measured object.

  According to the accommodation type structure configured as described above, the gap arrangement structure is provided with the gap surrounded by the conductor in a predetermined plane. The container accommodates the object to be measured and the gap arrangement structure. Furthermore, the container transmits the electromagnetic wave for measurement irradiated to the gap portion in order to measure the characteristic of the object to be measured.

  In the accommodation type structure according to the present invention, the container may contain a liquid containing the measurement object or a gas containing the measurement object.

  In the containment structure according to the present invention, the measurement electromagnetic wave may be irradiated while the liquid or the gas is injected into and discharged from the container.

  In the containment structure according to the present invention, the container may transmit the transmitted electromagnetic wave that has passed through the gap.

  Moreover, the accommodation type structure concerning this invention WHEREIN: As for the said space | gap arrangement structure body, you may make it the said cavity part of the same shape arrange | positioned by the fixed space | interval in the predetermined direction.

  In the housing structure according to the present invention, the gap arrangement structure may be a two-dimensional lattice in which openings penetrating the conductors are arranged in the vertical direction and the horizontal direction.

  The measuring apparatus according to the present invention is a measurement electromagnetic wave irradiation means for irradiating the measurement type electromagnetic wave to the accommodation type structure according to the invention, and a measurement response that is a response by the accommodation type structure to the irradiated measurement electromagnetic wave. Measuring electromagnetic wave detecting means for detecting response electromagnetic waves, reference electromagnetic wave irradiating means for irradiating the gap arrangement structure with a reference electromagnetic wave, and detecting a reference response electromagnetic wave as a response by the gap arrangement structure to the irradiated reference electromagnetic wave A reference electromagnetic wave detection means, and a characteristic measurement means for measuring the characteristic of the object to be measured based on the detection result of the measurement electromagnetic wave detection means and the detection result of the reference electromagnetic wave detection means.

  Further, in the measuring apparatus according to the present invention, the characteristic measuring unit is a transmittance measuring unit that measures the transmittance of the electromagnetic wave based on the detection result of the electromagnetic wave detecting unit for measurement and the detection result of the reference electromagnetic wave detecting unit, You may make it have a refractive index derivation | leading-out means which derives | leads-out the refractive index of the said to-be-measured object based on the measured said transmittance | permeability.

  Further, in the measuring apparatus according to the present invention, the refractive index deriving unit includes the transmittance measured based on the detection result of the measuring electromagnetic wave detecting unit at the frequency A and the detection result of the reference electromagnetic wave detecting unit at the frequency B. If the measured transmittance is equal, the refractive index of the object to be measured may be derived based on A and B.

  Moreover, the measuring apparatus according to the present invention may include a frequency characteristic adjusting member, and in the vicinity of the frequency B, the slope of the transmittance with respect to the frequency may be larger than that without the frequency characteristic adjusting member. .

  The present invention detects a measurement electromagnetic wave irradiation step for irradiating the measurement type electromagnetic wave to the accommodation type structure according to the present invention, and a measurement response electromagnetic wave that is a response by the accommodation type structure to the irradiated measurement electromagnetic wave. A measuring electromagnetic wave detecting step, a reference electromagnetic wave irradiating step for irradiating the gap arrangement structure with a reference electromagnetic wave, and a reference electromagnetic wave detection for detecting a reference response electromagnetic wave which is a response by the gap arrangement structure to the irradiated reference electromagnetic wave And a characteristic measurement step of measuring the characteristic of the object to be measured based on the detection result of the measurement electromagnetic wave detection step and the detection result of the reference electromagnetic wave detection step.

  The present invention detects a measurement electromagnetic wave irradiating means for irradiating the measurement electromagnetic wave to the accommodation structure according to the invention, and a measurement response electromagnetic wave that is a response by the accommodation structure to the irradiated measurement electromagnetic wave. Measuring electromagnetic wave detecting means, reference electromagnetic wave irradiating means for irradiating the gap arrangement structure with a reference electromagnetic wave, and reference electromagnetic wave detection for detecting a reference response electromagnetic wave which is a response by the gap arrangement structure to the irradiated reference electromagnetic wave A program for causing a computer to execute a measurement process in a measurement apparatus comprising: a measurement result of the measurement electromagnetic wave detection means and a detection result of the reference electromagnetic wave detection means; This is a program for causing a computer to execute a characteristic measurement process for measuring.

  Embodiments of the present invention will be described below with reference to the drawings.

  FIG. 1 is a perspective view of a lattice (gap arrangement structure) 1 according to an embodiment of the present invention. The lattice (gap arrangement structure) 1 includes a conductor plate 10. The conductor plate 10 is, for example, a metal plate. The direction of the thickness of the conductor plate 10 is the Z direction. A gap (opening) 12 is opened in the conductor plate 10. The gap 12 penetrates the conductor plate 10 in the Z direction. The gap 12 opens in the XY plane. The gaps 12 are arranged in the vertical direction (Y direction) and the horizontal direction (X direction). That is, the lattice 1 is a two-dimensional lattice.

  FIG. 2 is an XY plan view of the lattice (gap arrangement structure) 1 according to the embodiment of the present invention. Referring to FIG. 2, in a lattice (gap arrangement structure) 1, gaps (openings) 12 are arranged in two directions (X direction and Y direction) on the XY plane. The gap 12 is a square opening, and the lengths of one side (aperture) in the X direction and the Y direction are equal (assuming that they are a). Further, the pitch in the X direction and the pitch in the Y direction of the gap 12 are equal (assuming that they are p). Since a and p are about several tens of microns, it can be said that the lattice 1 is a so-called mesh.

  FIG. 3 is a plan view showing one vicinity of the gap 12 of the lattice 1. It can be said that the gap 12 is surrounded by the conductor 14 which is a part of the conductor plate 10 in the XY plane. Such voids 12 are arranged in the X direction and the Y direction.

  FIG. 4 is an XY plan view for explaining a modified example of the grating 1. In FIG. 4A, the gaps 12 are arranged only in one direction (X direction). That is, they are arranged one-dimensionally. In FIG. 4B, the gaps 12 are arranged in the X direction, the Y1 direction, and the Y2 direction (not the Y direction). Either can be used as the grating 1. However, as shown in FIG. 4, it is necessary that the gaps 12 having the same shape (the same shape and the same size) are arranged at a predetermined pitch (or interval). Further, the gap portion 12 of the lattice 1 may not be a square, may be a circle, and may be a triangle or a rectangle. That is, it may be a two-dimensional figure. Further, as shown in FIG. 5, even when there is only one gap portion 12, it can be used as the lattice 1.

  FIG. 6 is a diagram showing a configuration of a measuring apparatus for measuring the refractive index of the measurement object accommodated in the container 50 according to the embodiment of the present invention. The measurement apparatus includes a radiation control unit 32, an electromagnetic wave irradiation unit (measurement electromagnetic wave irradiation unit and reference electromagnetic wave irradiation unit) 34, an electromagnetic wave detection unit (measurement electromagnetic wave detection unit and reference electromagnetic wave detection unit) 36, a characteristic measurement unit 40, and a container 50. , An injection pipe 62, a discharge pipe 64, an injection device 72, and a discharge device 74.

  FIG. 10 is a diagram showing the configuration of the measuring apparatus when the container 50 (and the grid 1 accommodated in the container 50) in FIG.

  7 is a side view of the container 50 (FIG. 7A), a bb cross-sectional view (FIG. 7B), and a cc cross-sectional view (FIG. 7C). The container 50 is a hollow rectangular parallelepiped. The container 50 has a front surface 52, a back surface 54, and a side surface 56. The front surface 52 and the back surface 54 are parallel. The side surfaces 56 are four side surfaces orthogonal to the front surface 52 and the back surface 54.

  The container 50 is hollow as shown in FIG. 7, and the lattice 1 is accommodated in this hollow portion. What accommodated the grid | lattice 1 in the container 50 is an accommodation type structure.

  FIG. 8 is a side sectional view (FIG. 8A) and a bb sectional view (FIG. 8B) in a state where the grid 1 is attached to the container 50. The grid 1 is arranged in parallel to the front surface 52 and the back surface 54.

  9 is a front view (FIG. 9 (a)) and a side sectional view (FIG. 9 (b)) in a state where the injection pipe 62 and the discharge pipe 64 are attached to the container 50 in the state shown in FIG. One end of the injection pipe 62 is attached to the injection device 72, and the other end is connected to the upper side inside the container 50. One end of the discharge pipe 64 is attached to the discharge device 74, and the other end is connected to the lower side inside the container 50.

  The injection device 72 injects the liquid 20 into the container 50 through the injection pipe 62. The container 50 contains the liquid 20 injected therein. The discharge device 74 discharges the liquid 20 from the inside of the container 50 through the discharge pipe 64. The liquid 20 has a solute 22 and a solvent 24. The solute 22 corresponds to the object to be measured. However, the case where the object to be measured itself is in a liquid state is also conceivable. In this case, the liquid 20 is the object to be measured. The case where the solute 22 is the object to be measured and the case where the liquid 20 is the object to be measured are referred to as “the liquid 20 includes the object to be measured”.

  A gas can be used instead of the liquid 20. An object to be measured exists in this gas. The object to be measured may be gaseous. The case where the object to be measured exists in the gas and the case where the object to be measured is gaseous are referred to as “the gas includes the object to be measured”.

  7 to 9, the container 50 is illustrated as a hollow rectangular parallelepiped. However, the container 50 may be a hollow cylinder. The container 50 is not limited to a rectangular parallelepiped and a cylinder as long as it can accommodate the liquid 20 and the grid 1.

  The radiation control unit 32 designates the electromagnetic wave power P1 and the electromagnetic wave frequency f, and causes the electromagnetic wave irradiation unit 34 to emit the electromagnetic wave. The designated power P1 and frequency f are also given to the transmittance measuring unit 42 of the characteristic measuring unit 40.

  The electromagnetic wave irradiation unit (measuring electromagnetic wave irradiation means and reference electromagnetic wave irradiation means) 34 emits an electromagnetic wave having power P1 and frequency f. The emitted electromagnetic wave is applied to the grating 1 (see FIG. 10) or the housing structure (the grating 1 and the container 50: see FIG. 6).

  Here, the electromagnetic wave irradiated to the housing structure is called a measurement electromagnetic wave, and the electromagnetic wave irradiated to the grating 1 is called a reference electromagnetic wave.

  The electromagnetic wave detection unit (measurement electromagnetic wave detection unit and reference electromagnetic wave detection unit) 36 detects an electromagnetic wave that has passed through the lattice 1 or the housing structure, measures the power P2, and transmits the power P2 to the transmittance measurement unit 42 of the characteristic measurement unit 40. give. It is also conceivable to detect reflected electromagnetic waves instead of transmitted electromagnetic waves.

  That is, the electromagnetic wave detection unit 36 is a response (for example, transmission, reflection) of the measurement response electromagnetic wave that is a response (for example, transmission and reflection) to the irradiated measurement electromagnetic wave and a reference electromagnetic wave for irradiation. It is only necessary to detect a reference response electromagnetic wave that is a reflection.

  The characteristic measurement unit 40 measures the characteristic of the DUT 22 based on the detection result of the electromagnetic wave detection unit 36. The characteristic measuring unit 40 includes a transmittance measuring unit 42, a transmittance recording unit 44, and a refractive index deriving unit 46.

  The transmittance measuring unit 42 measures the transmittance of the electromagnetic wave based on the detection result of the electromagnetic wave detecting unit 36. That is, the electromagnetic wave transmittance of the structure with the object to be measured and the grating 1 is measured. The transmittance is obtained by P2 / P1. However, if the reflection cannot be ignored, the influence of the reflection can be canceled by measuring P2 for the same object having a different thickness. This is well known and will not be described in detail.

  The transmittance recording unit 44 records the transmittance measured by the transmittance measuring unit 42 in association with the frequency of the electromagnetic wave.

  The refractive index deriving unit 46 derives the refractive index of the DUT 22 based on the measured transmittance. That is, when the transmittance measured based on the detection result of the measurement response electromagnetic wave at the frequency A is equal to the transmittance measured based on the detection result of the reference response electromagnetic wave at the frequency B, the refractive index of the DUT 22 Is derived based on A and B.

  Next, the operation of the embodiment of the present invention will be described.

  FIG. 11 is a flowchart showing the operation of the measurement apparatus according to the embodiment of the present invention. FIG. 12 is a graph for explaining a method for determining the refractive index of the DUT 22.

  Note that the scattering and absorption of the grating 1 are negligible. For example, the material of the lattice 1 satisfies such a condition. Alternatively, the thickness of the grating 1 satisfies such a condition.

The front surface 52 transmits the measurement electromagnetic wave. It can be said that the electromagnetic wave for measurement is an electromagnetic wave irradiated toward the gap portion 12 in order to measure the characteristic (for example, refractive index) of the object 22 to be measured. Due to the frequency of the electromagnetic wave for measurement and terahertz (THz: 10 ¹² Hz), the front surface 52 is, for example, a thin plastic film, thin quartz, or thin polyethylene.

The back surface 54 transmits the measurement response electromagnetic wave. Specifically, the back surface 54 transmits the measurement response electromagnetic wave that is the electromagnetic wave through which the measurement electromagnetic wave has passed through the gap 12. Since the frequency of the measurement response electromagnetic wave is terahertz (THz: 10 ¹² Hz), the frequency of the measurement electromagnetic wave is, for example, a thin plastic film, thin quartz, or thin polyethylene.

In general, if the intensity at the point where an incident wave with an intensity of I ₀ travels through the substance by x is I (x), the attenuation (absorption) of the incident wave is I (x)
= I ₀ exp ^-αx

  Absorption is negligible when α (determined by the material) or x (thickness) in the above equation is very small.

First, the grid 1 is disposed between the electromagnetic wave irradiation unit 34 and the electromagnetic wave detection unit 36 (see FIG. 10), and the electromagnetic wave irradiation unit 34 radiates a reference electromagnetic wave in a predetermined band. The electromagnetic wave detection unit 36 detects the transmitted electromagnetic wave (reference response electromagnetic wave). Then, the transmittance measuring unit 42 measures the transmittance of the grating 1 (S10). The transmittance is obtained by P2 / P1. The measured transmittance is recorded in the transmittance recording unit 44 in association with the frequency of the reference electromagnetic wave. However, the measuring device is used in air having a refractive index n ₀ (for example, 1).

In the example shown in FIG. 12, a graph G1 is shown in which the transmittance of the grating 1 is measured by taking a band from 0 THz to 6 THz (terahertz) as a predetermined band. This graph G1 can be expressed as T _n0 (f). That is, the transmittance T is a function of the refractive index n ₀ and the frequency f.

  Next, the accommodation type structure (lattice 1 and container 50) is disposed between the electromagnetic wave irradiation unit 34 and the electromagnetic wave detection unit 36, and the electromagnetic wave for measurement of frequency A is irradiated from the electromagnetic wave irradiation unit 34. The measurement electromagnetic wave passes through the front surface 52 of the container 50, passes through the housing structure, and further passes through the back surface 54 of the container 50 (measurement response electromagnetic wave). The electromagnetic wave detection unit 36 detects the transmitted electromagnetic wave (measurement response electromagnetic wave). And the transmittance | permeability measurement part 42 measures the transmittance | permeability of an accommodation type structure (S12). The transmittance is obtained by P2 / P1.

  In addition, the liquid 20 is accommodated in the container 50 while the measurement electromagnetic wave is irradiated. The liquid 20 may be injected into the container 50 in advance by the injection pipe 62 and the injection device 72 before the measurement electromagnetic wave is irradiated. Further, while the measurement electromagnetic wave is irradiated, the liquid 20 may be discharged by the discharge pipe 64 and the discharge device 74 while the liquid 20 is injected by the injection pipe 62 and the injection device 72.

In the example shown in FIG. 12, the transmittance A = 40% of the integrated structure 2 is obtained with the frequency A = 1 THz (graph G2). This graph G2 can be expressed as T _nx (A). That is, the transmittance T _nx integral structure 2 in the frequency A is a function of the refractive index of the object to be measured 22 n _x and frequency A (= 1 THz).

  Next, the refractive index deriving unit 46 determines the corresponding frequency B based on the recorded content of the transmittance recording unit 44 and the transmittance of the integrated structure 2 measured by the transmittance measuring unit 42 (S14). That is, with reference to FIG. 8, the refractive index deriving unit 46 transmits the transmittance (= 40%) measured based on the detection result (graph G2) of the electromagnetic wave detecting unit 36 at the frequency A (= 1 THz) and the corresponding frequency. The corresponding frequency B is determined such that the transmittance measured based on the detection result of the electromagnetic wave detection unit 36 in B becomes equal. The corresponding frequency B is 3.4 THz.

This means that T _n0 (B) = T _nx (A).

Finally, the refractive index deriving unit 46 derives the refractive index of the DUT 22 (S16). That is, the refractive index = B / A of the object 22, to derive the refractive indices n _x of the object 22. In the example shown in FIG. 8, the refractive index n _x = 3.4 THz / 1 THz = 3.4. This uses the fact that B = n _x · A, is obtained by deriving the refractive indices n _x of the object 22.

  According to the housed structure according to the embodiment of the present invention, the DUT 22 can be handled advantageously. For example, when the DUT 22 is contained in the liquid 20, the liquid 20 can be stored in the container 50. Further, the measurement object 22 of the liquid 20 passes through the gap 12 of the lattice 1. For this reason, if the measurement electromagnetic wave is irradiated to the container 50, the electromagnetic wave can be irradiated to the object 22 passing through the gap 12 of the lattice 1, and the characteristics of the object 22 can be measured.

  According to the measuring apparatus according to the embodiment of the present invention, the characteristics (for example, the refractive index) of the object to be measured 22 are measured by measuring the transmittance of the electromagnetic wave in the housing structure and the lattice (gap arrangement structure) 1. Easy to measure.

  FIG. 13 is a diagram for explaining changes of the graph G1 in which the transmittance of the grating 1 is measured with respect to the aperture a and the pitch p. When a and p are small (graph G1-1), the inclination is small, and when a and p are large (graph G1-2), the inclination is large.

  The maximum value of the corresponding frequency B is the frequency F1 (graph G1-1) and the frequency F2 (graph G1-2) at which the transmittance is a maximum value. The larger the maximum value of the corresponding frequency B, the larger the refractive index can be measured. Therefore, when a and p are small (graph G1-1), a wide range of refractive indexes can be measured. Conversely, when a and p are large (graph G1-2), the refractive index can be measured with high accuracy. This is because the transmittance varies greatly even if the refractive index is slightly different.

  Therefore, if it is desired to measure the refractive index in a wide range, it is preferable to use the grating 1 having a small aperture a and pitch p. If it is desired to measure the refractive index with high accuracy, it is preferable to use the grating 1 having a larger aperture a and pitch p.

  In addition, when the pitch p is small, the frequency at which the transmittance takes a maximum value is on the high frequency side. When the pitch p is large, the frequency at which the transmittance takes a maximum value is on the low frequency side. Therefore, the pitch p may be selected according to the frequency of the first electromagnetic wave.

  Further, in order to measure the refractive index with high accuracy, the wire strip width 2α (= pa) or the thickness t of the integrated structure 2 may be changed.

  FIG. 17 is a diagram showing the shift of the frequency at which the transmittance reaches the maximum value due to the change in the wire strip width 2α (= pa). As shown in FIG. 17, even when the wire strip width 2α is changed, the frequency at which the transmittance reaches a maximum value does not change. However, when the wire strip width 2α is increased, the slope in the vicinity of the frequency at which the transmittance reaches a maximum value increases. Therefore, when the wire strip width 2α is increased, the refractive index can be measured with high accuracy.

  FIG. 18 is a diagram illustrating a frequency shift in which the transmittance has a maximum value due to a change in the thickness t of the integrated structure 2. As shown in FIG. 18, even if the thickness t of the integrated structure 2 changes, the frequency at which the transmittance reaches the maximum value does not change. However, when the thickness t of the integrated structure 2 is increased, the slope in the vicinity of the frequency at which the transmittance reaches a maximum value increases. Therefore, when the thickness t of the integral structure 2 is increased, the refractive index can be measured with high accuracy.

  It should be noted that the embodiment of the present invention may be modified as shown in FIG.

  FIG. 14 is a side cross-sectional view of a container 50 in a modification of the embodiment of the present invention. The container 50 accommodates the grating 1 and the grating 1 ′ (frequency characteristic adjusting member). The lattice 1 and the lattice 1 ′ are parallel to each other, and the distance d = (λ / 2) · n (where n is a natural number). Note that λ is the wavelength of the electromagnetic wave corresponding to the corresponding frequency B.

  FIG. 15 is a diagram showing a transmittance graph G1 when the grating 1 'is arranged parallel to the grating 1 and a transmittance graph G1' when the grating 1 'is not arranged. When the grating 1 'is arranged in parallel with the grating 1, resonance is established at the corresponding frequency B, so that the slope of the transmittance with respect to the frequency in the vicinity of the corresponding frequency B becomes larger than when the grating 1' is not arranged.

  That is, the transmittance graph G1 when the grating 1 'is arranged in parallel to the grating 1 is a wavy line. In other words, since the configuration in which the grating 1 ′ is arranged in parallel with the grating 1 has a structure equivalent to that of a Fabry-Perot etalon resonator, the transmittance graph G <b> 1 has a peak of the amount of transmission periodically. Here, a sample having a slightly different refractive index, for example, several types of proteins having different structures is considered as the DUT 22. The transmittance of the DUT 22 is measured. Since the refractive indexes are only slightly different, the transmittance is only slightly different if the grating 1 'is not arranged. However, if the grating 1 'is arranged, the transmittance varies greatly even with a slight difference in refractive index. Therefore, since different transmittances are obtained for each of the objects to be measured 22, the difference in protein structure can be determined.

  In the above embodiment, when the transmittance of the grating 1 and the housing structure is measured, it can be seen that the frequency at which the transmittance reaches a maximum value moves. FIG. 16 is a diagram showing the shift of the frequency at which the transmittance reaches the maximum value by the grating 1 and the housed structure. As shown in FIG. 16, the frequency Fa (lattice 1: graph Ga) at which the transmittance reaches a maximum value moves to Fb (accommodating structure: graph Gb). Thereby, what is the device under test 22 (this is also a kind of characteristic of the device under test 22) can be specified.

It is also possible to measure the complex refractive index (n + jk) and the complex dielectric constant ε (ω) of the DUT 22 by irradiating the grating 1 and the housing structure with electromagnetic waves. Here, n is the real part of the complex refractive index, k is the imaginary part of the complex refractive index, and ω is the angular frequency of the electromagnetic wave irradiating the grating 1 and the housing structure. In general, (n + jk) ² = ε (ω).

  Note that, as described with reference to FIGS. 13, 15, and 16, the transmittance of the grating 1 and the housing structure greatly changes when an electromagnetic wave having a frequency of terahertz is irradiated. The transmittance of the grating 1 and the housing structure is substantially constant when it is large to some extent (for example, several times as large) as the wavelength of the electromagnetic wave irradiated by the aperture a. When the aperture a is very small with respect to the wavelength of the electromagnetic wave, the irradiated electromagnetic wave hardly transmits the grating 1 and the housing structure. Therefore, for example, when the size of the grating 1 and the aperture a of the housing structure is adjusted to irradiate electromagnetic waves having a frequency of terahertz, the transmittance is changed greatly.

  In addition, said embodiment is realizable as follows. A medium in which a program for realizing each of the above-described parts (for example, the characteristic measuring unit 40) is recorded in a medium reading device of a computer having a CPU, a hard disk, and a medium (floppy (registered trademark) disk, CD-ROM, etc.) reading device. And install it on the hard disk. The above embodiment can also be realized by such a method.

1 is a perspective view of a lattice (gap arrangement structure) 1 according to an embodiment of the present invention. It is XY top view of the grating | lattice (gap arrangement structure body) 1 concerning embodiment of this invention. FIG. 3 is a plan view showing one vicinity of a gap 12 of the lattice 1. FIG. 6 is an XY plan view for explaining a modification of the lattice 1. It is an XY plan view of the lattice 1 when there is only one gap portion 12. It is a figure which shows the structure of the measuring apparatus for measuring the refractive index of the to-be-measured object accommodated in the container 50 concerning embodiment of this invention. They are a side view (Drawing 7 (a)) of a container 50, a bb sectional view (Drawing 7 (b)), and a cc sectional view (Drawing 7 (c)). FIG. 8 is a side sectional view (FIG. 8A) and a bb sectional view (FIG. 8B) in a state where the grid 1 is attached to the container 50. FIG. 9 is a front view (FIG. 9A) and a side cross-sectional view (FIG. 9B) in a state where an injection pipe 62 and a discharge pipe 64 are attached to the container 50 in the state shown in FIG. 8. It is a figure which shows the structure of the measuring apparatus when the container 50 (and the grating | lattice 1 accommodated in the container 50) in FIG. It is a flowchart which shows operation | movement of the measuring apparatus concerning embodiment of this invention. 4 is a graph for explaining a method for determining a refractive index of an object to be measured 22; It is a figure for demonstrating the change with respect to the aperture a and the pitch p of the graph G1 which measured the transmittance | permeability of the grating | lattice 1. FIG. It is side surface sectional drawing of the container 50 in the modification of embodiment of this invention. It is a figure which shows the transmittance | permeability graph G1 when the grating | lattice 1 'is arrange | positioned in parallel with the grating | lattice 1, and the transmittance | permeability graph G1' when not arrange | positioning the grating | lattice 1 '. It is a figure which shows the movement of the frequency from which the transmittance | permeability takes the maximum value with the grating | lattice 1 and the accommodation type structure. It is a figure which shows the movement of the frequency from which the transmittance | permeability takes the maximum value by the change of wire strip width 2 (alpha) (= pa). It is a figure which shows the movement of the frequency from which the transmittance | permeability takes the maximum value with the change of the thickness t of the integrated structure 2. FIG.

Explanation of symbols

1 Lattice (void arrangement structure)
1 'grating (frequency characteristic adjustment member)
10 Conductor plate 12 Air gap (opening)
20 liquid 22 solute (object to be measured)
24 Solvent 30 Electromagnetic wave irradiation unit 32 Radiation control unit 34 Electromagnetic wave irradiation unit (Measurement electromagnetic wave irradiation means and reference electromagnetic wave irradiation means)
36 Electromagnetic wave detection section (measurement electromagnetic wave detection means and reference electromagnetic wave detection means)
40 Characteristic Measuring Unit 42 Transmittance Measuring Unit 44 Transmittance Recording Unit 46 Refractive Index Deriving Unit 50 Container 52 Front 54 Back 56

Claims (12)

A gap arrangement structure in which a gap surrounded by a conductor is arranged in a predetermined plane;
A container for housing the object to be measured and the void arrangement structure;
With
The container transmits an electromagnetic wave for measurement irradiated to the gap in order to measure the characteristics of the measurement object passing through the gap ;
The shape of the gap is determined so that the measurement electromagnetic wave can pass through the gap.
Containment structure.
The containment type structure according to claim 1,
The container contains a liquid containing the object to be measured or a gas containing the object to be measured.
Containment structure. The containment structure according to claim 2,
While the liquid or gas is being injected and discharged from the container, the measurement electromagnetic wave is irradiated.
Containment structure. The containment structure according to any one of claims 1 to 3,
The container transmits the transmitted electromagnetic wave that has passed through the gap.
Containment structure. The containment type structure according to any one of claims 1 to 4,
In the gap arrangement structure, the gap portions having the same shape are arranged at predetermined intervals in a predetermined direction.
Containment structure. The containment structure according to claim 5,
The gap arrangement structure is a two-dimensional lattice in which openings penetrating a conductor are arranged in a vertical direction and a horizontal direction.
Containment structure. An electromagnetic wave irradiation means for measurement that irradiates the electromagnetic wave for measurement to the containing structure according to any one of claims 1 to 6,
A measurement electromagnetic wave detection means for detecting a measurement response electromagnetic wave, which is a response by the containing structure to the irradiated measurement electromagnetic wave;
A reference electromagnetic wave irradiation means for irradiating the gap arrangement structure with a reference electromagnetic wave;
A reference electromagnetic wave detecting means for detecting a reference response electromagnetic wave which is a response by the gap arrangement structure to the irradiated reference electromagnetic wave;
Based on the detection result of the measurement electromagnetic wave detection means and the detection result of the reference electromagnetic wave detection means, characteristic measurement means for measuring the characteristics of the object to be measured;
Measuring device. The measuring device according to claim 7,
The characteristic measuring means comprises:
Based on the detection result of the measurement electromagnetic wave detection means and the detection result of the reference electromagnetic wave detection means, transmittance measurement means for measuring the transmittance of electromagnetic waves,
A refractive index deriving means for deriving a refractive index of the object to be measured based on the measured transmittance;
Measuring device. The measuring device according to claim 8,
When the refractive index deriving unit has a transmittance measured based on the detection result of the measurement electromagnetic wave detecting unit at the frequency A equal to a transmittance measured based on the detection result of the reference electromagnetic wave detecting unit at the frequency B The refractive index of the object to be measured is derived based on A and B.
measuring device. The measuring device according to claim 9,
With a frequency characteristic adjustment member,
In the vicinity of the frequency B, the measurement apparatus in which the slope of the transmittance with respect to the frequency is larger than when the frequency characteristic adjusting member is not provided. An electromagnetic wave irradiation step for measurement, which irradiates the electromagnetic wave for measurement to the containment structure according to any one of claims 1 to 6,
A measurement electromagnetic wave detection step for detecting a measurement response electromagnetic wave, which is a response by the containing structure to the irradiated measurement electromagnetic wave;
A reference electromagnetic wave irradiation step of irradiating the void arrangement structure with a reference electromagnetic wave;
A reference electromagnetic wave detection step of detecting a reference response electromagnetic wave that is a response by the gap arrangement structure to the irradiated reference electromagnetic wave;
Based on the detection result of the measurement electromagnetic wave detection step and the detection result of the reference electromagnetic wave detection step, a characteristic measurement step of measuring the characteristics of the object to be measured,
Measuring method. An electromagnetic wave irradiation means for measurement that irradiates the electromagnetic wave for measurement to the containing structure according to any one of claims 1 to 6,
A measurement electromagnetic wave detection means for detecting a measurement response electromagnetic wave, which is a response by the containing structure to the irradiated measurement electromagnetic wave;
A reference electromagnetic wave irradiation means for irradiating the gap arrangement structure with a reference electromagnetic wave;
A reference electromagnetic wave detecting means for detecting a reference response electromagnetic wave which is a response by the gap arrangement structure to the irradiated reference electromagnetic wave;
A program for causing a computer to execute a measurement process in a measurement apparatus comprising:
A program for causing a computer to execute a characteristic measurement process for measuring characteristics of the object to be measured based on a detection result of the measurement electromagnetic wave detection means and a detection result of the reference electromagnetic wave detection means.

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