JP4908642B1 - Waveform observation system - Google Patents

Abstract

An object of the present invention is to provide a device capable of intuitively confirming a measurement position on a circuit board, simultaneously observing waveforms and the like, and displaying a number of waveforms when the number of probes is increased. To do. It should also be provided as an educational material for engineering education in places where there are no facilities and application to e-Learning.
An apparatus for measuring the position and direction of a circuit board and a probe of an electronic circuit, processing signal waveform data captured from the probe, and projecting the processed waveform, etc., even in an environment without an oscilloscope or the like, If you have a personal computer and a USB camera, you can perform virtual education using an oscilloscope, supplementary teaching materials for circuit production on a computer, and measurement of invisible physical quantities. Characteristic waveform observation system.
[Selection] Figure 1

Description

  The present invention relates to a waveform observation system and the like, for example, by projecting a measured waveform by a projector near a measured probe, the measurement position on a circuit board can be intuitively confirmed, and the waveform can be observed simultaneously. About the system. It can also be applied to engineering education and e-Learning where there is no equipment such as an oscilloscope.

2. Description of the Related Art Conventionally, an apparatus that measures a three-dimensional shape of an image obtained by projecting pattern light with a projector has been known to shorten the measurement time.
In Patent Document 1, in an apparatus for measuring a three-dimensional shape of an image obtained by projecting pattern light with a projector, the number of input sheets is reduced to shorten the measurement time. A pattern reference image and a pattern measurement image projected from the projector are projected and captured by the camera. Based on the obtained reference image, phase connection of the measurement image is performed, thereby obtaining a three-dimensional shape.

JP 2006-003212 A

The inventors came up with the need for an observation system for waveforms, etc., because when used in engineering experiments, the conventional oscilloscope is far away from the cable and the display that displays the signal waveform. "I want to eliminate the task of looking at the display alternately."
The problem with conventional waveform observation methods is that if you use multiple probes of the same shape to measure the waveform of various objects, the waveform displayed on the oscilloscope will measure where in the circuit. It is difficult to judge whether there is.
Therefore, the present invention provides a system capable of intuitively confirming a measurement position on a circuit board, observing a plurality of waveforms at the same time, and increasing / decreasing the waveform display according to increase / decrease in the number of probes. Is an issue.
From another point of view, the present invention has an object to provide as an educational material for engineering education in a place where there is no equipment and application to e-Learning.

The inventor considered that the measurement position on the circuit board can be intuitively confirmed by displaying the measured waveform near the measured probe.
In addition, unlike the conventional observation of waveforms using an oscilloscope, since the waveform is displayed near the probe being measured, it is easy to compare the circuit with the waveform, and intuitive understanding becomes possible. Furthermore, it was considered that the waveform display can be increased or decreased according to the increase or decrease of the number of probes, and each waveform can be displayed larger.

The present invention comprises the following technical means.
[1] A plurality of board AR tags for mounting on an electronic circuit board, a camera for photographing a work area including the electronic circuit board, an oscilloscope for displaying waveforms measured by a plurality of probes, and for mounting on each probe A waveform observation system comprising a plurality of AR tags for probes, a projector for projecting waveform images onto a work area, a camera, an oscilloscope, and a computer connected to the projector, wherein the computer captures the image Means for acquiring the stored work area image and storing it in the storage device, means for recognizing the substrate AR tag from the work area image stored in the storage device, acquiring substrate coordinate information and storing it in the storage device, and storing in the storage device The AR tag for the probe is recognized from the obtained work area image, and the coordinate information of the probe is acquired and stored in the storage device The waveform image information acquired from the oscilloscope, means for setting the projection coordinates in the vicinity of the probe based on the probe coordinate information of the corresponding probe, and storing it in the storage device, and the waveform based on the set projection coordinates. A waveform observation system comprising: means for projecting an image.
[2] The waveform observation system according to [1], wherein the computer includes means for causing the projector to project an AR tag as an operation switch for enlarging or reducing the waveform image.
[3] With respect to the waveform image information stored in advance in the storage device by the computer, means for setting the projection coordinates in the vicinity of the probe based on the probe coordinate information of the corresponding probe, and the projector based on the set projection coordinates It comprises: means for projecting image information; and means for determining whether the waveform image information stored in advance in the storage device substantially matches the waveform image information acquired from the oscilloscope, and projecting the determination result onto the projector. The waveform observation system according to [1] or [2].

According to the present invention, it is possible to provide a system capable of intuitively confirming a measurement position on a circuit board, simultaneously observing a waveform, and increasing / decreasing a waveform display according to an increase / decrease in the number of probes. It becomes. In addition, it is possible to display a large waveform by operating a computer or the like. Since the waveform is displayed near each probe, the measurement becomes very easy.
It can also be provided as educational materials for engineering education in places where there is no equipment, and application to e-Learning.
Furthermore, using the fact that the projector can also project onto curved surfaces and spherical surfaces, project planets such as the Earth, the Moon, and Mars on a sphere, and show the location with a tagged pen etc., the details of the location of that planet It can also be applied to teaching materials that are displayed.
In addition, the present invention can be applied to measurement of physical quantities that are invisible to the eyes, such as electricity, electromagnetics, heat, and radiation.

1 is an overall configuration diagram of a waveform observation system according to Embodiment 1. FIG. It is a block diagram of the tag attached to a probe. It is a figure when an observation waveform is projected. It is a figure when a plurality of observed waveforms are projected. It is explanatory drawing of the coordinate conversion of AR tag. It is a figure which shows an example of AR tag. FIG. 6 is an overall configuration diagram of a waveform observation system according to a third embodiment. FIG. 10 is an overall configuration diagram of a physical quantity measurement system according to a fourth embodiment. 12 is an initial screen of the physical quantity measurement system according to the fourth embodiment. 12 is a screen at the time of measurement of the physical quantity measurement system according to the fourth embodiment.

An embodiment for carrying out the invention will be described with an example of a waveform observation system.
The present invention includes an electronic circuit board to which an AR tag is attached, a camera fixed to a workbench for reading tag information, an oscilloscope for processing a waveform measured by a probe, an output unit, and a control unit. The waveform observation system is characterized in that the control unit outputs the information from the projector based on the AR tag position information read by the camera and the waveform measured by the oscilloscope.
First, the augmented reality “AR” technology is adopted as means for measuring the position and tilt of the substrate. Specifically, as shown in FIG. 1, substrate AR tags 8 are installed at three places among the four corners of the substrate. The board AR tag is composed of three to four tags that can acquire the position and inclination of the board on which a graphic as shown in FIG. 6 is printed. The AR tag for a substrate is affixed to the substrate with a magic tape (registered trademark, hereinafter omitted).

Next, as a means for measuring the position and inclination of the probe, the tag attached to the probe is shaped like a cap so that it can be easily removed. The cap is a polygonal prism such as a quadrangular prism (Fig. 2) or a pentagonal prism, with tags around it. Install the cap at the back of the probe so as not to obstruct the work as much as possible, so that it can be attached to any probe with a sponge inside the cap so that it can accommodate any probe . Since the substrate requires information such as size, position, and orientation, it requires at least three tags. These tags are fixed to the four corners of the board with removable magic tape or the like. You can attach a lot of tags, but it is better to attach as few as 3 or 4 tags as it will interfere with circuit production.
As the camera, a commercially available USB camera (CCD camera, CMOS camera, etc.) is used.
In the above, in order to measure the position and inclination of the circuit board and the probe, the two-color pattern on the tag is recognized from the image taken by the camera, and the tag is checked against the pre-registered tag pattern shape. Identify. The coordinates of the tag are measured by the computer from the video shot by specifying. By comparing the identified tag with the photographed tag, the tilt and position of the probe or the substrate can be measured. For example, as shown in FIG. 5A, when the tag of the rectangular pattern (33) has a parallelogram shape (34) in the image taken by the camera, As shown in the figure, it can be seen that the coordinates are slanted as shown in the figure, from which the position and inclination can be measured. In addition, a camera fixing base is required to use the camera without moving it as much as possible.

  An oscilloscope is used to process the signal waveform by the circuit measured by the probe. There are two methods for extracting the acquired waveform. One is to capture the waveform from the oscilloscope to a computer using a serial cable, and the other is a device in which the oscilloscope and computer are integrated. Using this device, the measured waveform data is directly stored in memory. It is a way to save and recall and use that data.

  A projector is used to display the waveform. The projector projects a computer-processed waveform, and creates a diagram for projection as shown in FIG. 3 based on the acquired waveform data. In addition, the position of the projection view is set based on the position information by the probe and the substrate tag. The projected overall view is as shown in FIG. Reference numerals 21, 25, 29 are the first probe, reference numerals 22, 26, 30 are the second probe, reference numerals 23, 27, 31 are the third probe, and reference numerals 24, 28, 32 are the fourth probe. It corresponds to. As shown in the figure, the waveform is projected to the position of each probe. In order to display a plurality of waveforms, a projector is projected on the entire workbench, and a portion of the projected image is projected. By doing so, a plurality of waveforms can be displayed by one projector. That is, even if the number of probes increases, each waveform can be displayed near the probes.

  Also, if a tag is provided in the projected diagram, the tag can be recognized by the camera (FIG. 3). Tags are not recognized if they are hidden or distorted. By utilizing this fact, a program that hides a tag projected with a finger and operates when it is not recognized and recognized when distorted can be used as a switch. However, since there is a malfunction with only one tag, malfunction can be prevented if it is designed not to operate unless two or more tags are hidden. In FIG. 3, the tag 15 is a tag for preventing malfunction, and can be operated as a switch when designed so as to operate when this tag and other tags are hidden. In the example of FIG. 3, the tag 16 is a switch that doubles the entire figure, the tag 17 is a switch that increases the amplitude, the tag 18 is a switch that reduces the amplitude, the tag 19 is a switch that reduces the time axis, and the tag 20 is time. This is an axis expansion switch.

Hereinafter, details of the present invention will be described with reference to examples, but the present invention is not limited to the examples.

  The first embodiment relates to a waveform observation system that can intuitively confirm a measurement position on a circuit board by projecting a measured waveform near a measured probe by a projector and simultaneously observe the waveform. Augmented reality “AR” technology was used to measure the position and tilt of the substrate. AR is a technology for adding information to a real environment using a computer. For example, a tag photographed by a camera is recognized, coordinate information such as position, tilt, and angle is calculated, and based on that, an actual video photographed by the camera and a graphic such as CG are combined and displayed.

[System configuration]
The waveform observation system of the present embodiment shown in FIG. 1 includes a computer 1 including a display device such as a liquid crystal display and an input device such as a mouse / keyboard, a projector 2, a camera 3, a probe 4, an oscilloscope 5, A work table (screen) 6, a USB cable 7, a tag 8, and a circuit board 9 are main components.

The computer 1 is connected to the projector 2, the camera 3, and the oscilloscope 5, receives information from the camera 3 and the oscilloscope 5, performs information processing using a dedicated program, and transmits the information to the projector 2.
The projector 2 receives information processed by the computer 1 and projects it on a work table (screen) 6.
The camera 3 uses a USB camera having a pixel number of about 300,000 pixels or more, photographs the tag 8 attached to the circuit board 9 or the probe 4, and transmits it to the computer 1.
The probe 4 is connected to an oscilloscope 5 and transmits information measured by being attached to a measurement target to the oscilloscope 5. In addition, a quadrangular prism cap 11 is attached to the probe 4 in order to obtain position information.
The oscilloscope 5 receives a signal waveform from the circuit measured by the probe 4, processes the information, and transmits it to the computer 1.

The work table (screen) 6 is a table for fixing the circuit board 9 so as not to be displaced, and is a screen projected from the projector 2. The work table 6 is provided with a support column 35 to which the projector 2 and the camera 3 are fixed.
The USB cable 6 is a cable for connecting the computer 1 and the oscilloscope 5 and transmitting / receiving information.
The tag 8 is attached to the probe 4 or the circuit board 9 using a magic tape, and makes the camera discriminate.
The circuit board 9 is a circuit for measurement, and a tag 8 is attached to a corner.

FIG. 2 is an enlarged view of the probe 4 shown in FIG. 1, and includes a quadrangular prism cap 11, a probe AR tag 12, and a sponge 13 as main components.
The quadrangular prism cap 11 has tags 12 attached to four surfaces, and can be attached to and detached from the probe 4.
The sponge 13 is attached to the inner peripheral surface of a through hole provided in the quadrangular prism cap 11 so that the tag 12 can be attached to the probe 4 having an arbitrary thickness and shape.

FIG. 3 is a diagram when the observed waveform is projected. The waveform display 14, the malfunction prevention tag 15, the projection map expansion tag 16, the waveform amplitude expansion tag 17, the waveform amplitude reduction tag 18, and the waveform display cycle. The reduction tag 19 and the waveform display period expansion tag 20 are main components. The tags 15 to 20 are projected onto the waveforms 21 to 24 by the projector 2.
The waveform display 14 is a waveform projected from the projector 2 by transmitting information from the probe 4 from the oscilloscope 5 to the computer 1.
The display method is switched by utilizing the fact that the image captured by the camera 3 is not recognized as a tag by distorting a part of the tag by placing a finger on the tags 15 to 20. The malfunction prevention tag 15 serves as an operation switch that operates when the tag 15 and one of the other tags 16 to 20 are simultaneously hidden with a finger. The projection map enlargement tag 16 is a switch that doubles the entire projection map 10.
The waveform display amplitude expansion tag 17 is a switch that expands the amplitude of the waveform display 14.
The waveform display amplitude reduction tag 18 is a switch for reducing the amplitude of the waveform display 14.
The waveform display reduction tag 19 is a switch for reducing the time axis of the waveform display 14.
The waveform display period expansion tag 20 is a switch for expanding the time axis of the waveform display 14.

FIG. 4 is a diagram when a plurality of observed waveforms are projected. The probe waveforms 21 to 24, the probe tags 25 to 28, and the probes 29 to 32 are main components.
The probe waveform 21, the probe tag 25, and the probe 29 form a set, and the probe waveform 21 is displayed based on the waveform read by the probe 29 and the position information obtained by the probe tag 25.
Similarly, the waveform 22 of the probe, the tag 26, and the probe 30 form a pair, the waveform 23, the tag 27, and the probe 31 form a pair, and the waveform 24, the tag 28, and the probe 32 form a pair.
FIG. 5 is a diagram for explaining the coordinate conversion of the AR tags 33 and 34.
The AR tag 33 is an example of a rectangular pattern tag.
The AR tag 34 assumes a case where the AR tag 33 is actually photographed by the camera 3 and the photographed image has a parallelogram shape.

The board AR tag 8 is printed with two-color graphics as shown in FIG. Since the substrate requires information such as size, position, and orientation, at least three AR tags 8 are required. Therefore, in FIG. 1, it installs in three places among four corners of a board | substrate. The AR tag 8 may be affixed with an adhesive, but may be affixed to the substrate using a magic tape or the like so that it can be easily detached from the substrate. Although a large number of tags 8 may be attached, it is a hindrance to circuit manufacture, so it is preferable that the number is as small as possible (for example, 3 or 4) within a range where position information can be obtained.
It is necessary to attach a cap 11 with a tag to the probe 4 in order to measure the position and inclination. The attachment position of the cap 11 is set to the base part of the probe so as not to obstruct the work as much as possible, and the tag can be recognized from almost any position by attaching the tag around a polygonal column cap such as a quadrangular column (see FIG. 1) or a pentagonal column. Like that.

The camera 3 photographs the tag 8 attached to the circuit board 9 and the probe 4 and measures coordinates such as the position and inclination of the circuit board and probe on the computer 1 based on the information. Further, since the camera 3 is used without moving as much as possible, a stand for fixing the camera is also necessary. In FIG. 1, the camera 3 is fixed by a support column 35.
In order to measure the position and tilt of the circuit board 9 and the probe, the two-color pattern on the tag is recognized from the image taken by the camera 3, and the tag is identified by comparing with the pattern shape of the tag registered in advance. . The coordinates of the tag 8 are measured by the computer 1 from the video imaged by specifying. The position and inclination can be measured by comparing the identified tag and the photographed tag 8. For example, it is assumed that the tag of the rectangular pattern 33 as shown in FIG. 5A has a parallelogram shape 34 as shown in FIG. 5B in the image taken by the camera 3. In that case, it can be seen that the coordinates of FIG. 5A are oblique as shown in FIG. 5B, and the position and inclination of the tag can be measured therefrom.

Information such as the measured waveform and the position and inclination of the circuit board is taken into the computer 1 and information processing for displaying the waveform of the oscilloscope 5 is performed by a dedicated program. The waveform information acquired by the oscilloscope 5 is taken into the computer 1 using the serial cable 7. Here, when the apparatus in which the oscilloscope 5 and the computer 1 are integrated is used, the measured waveform data is directly stored in the memory. Therefore, the data may be called and used.
The projector 2 projects a computer-processed waveform, and a D-Sub 15-pin cable is used for connection with the computer 1. A diagram for projection as shown in FIG. 3 is created based on the projector 2 and the acquired waveform data. Further, the position of each projection 10 is set based on the position information from the probe AR tag 12 and the substrate AR tag 8. The actual projection diagram 10 is as shown in FIG. Reference numerals 21, 25, 29 are the first probe, reference numerals 22, 26, 30 are the second probe, reference numerals 23, 27, 31 are the third probe, and reference numerals 24, 28, 32 are the fourth probe. It has become. As shown in the figure, the waveform follows each probe and is projected to a position close to the measurement target. The projector 2 is fixed to the support column 35, and the worktable 6 is used as a screen for projection. In order to display a plurality of waveforms, the projector 2 is projected on the entire work table, and a waveform is projected using a part of the projected image. The waveform information acquired from the probes 29 to 32 is processed by the dedicated program of the computer 1, and the four projection views 10 are simultaneously projected on the work table by the projector 2. In this way, the same number of waveforms as the probe can be displayed with one projector. That is, each waveform can be displayed near the probe 4 in accordance with the increase or decrease of the number of probes 4. If the tags 15 to 20 are also included in the projection diagram 10, the camera 3 can recognize the tags (FIG. 3). Each tag will not be recognized if it is hidden or distorted. By utilizing this fact, a tag projected with a finger is hidden, and when it is distorted, it is not recognized and operates when it is no longer recognized. In this embodiment, since there is a malfunction with only one tag, malfunction is prevented if it is designed not to operate unless two or more tags are hidden. As shown in FIG. 3, when a malfunction prevention tag 15 is provided and the tag 15 and any one of the other tags 16 to 20 are concealed with a finger at the same time, it is possible to operate as a switch. is there.

[how to use]
The waveform observation system of the first embodiment is used in the following procedure.
When the user starts the computer 1, the oscilloscope 2, and the projector 5 and connects the probe 4 to the circuit board 9, the dedicated program executed on the computer 1 is used for the board from the image captured by the camera 3. The two-color pattern on the AR tag 8 is recognized, and the substrate AR tag 8 is specified by collating with the pattern shape of the tag registered in advance. As a result, the dedicated program measures the coordinates of the tag 8 from the captured video and acquires position information. The position and inclination of the circuit board 9 can be recognized by comparing the identified tag with the photographed tag 8. For example, when the tag of the rectangular pattern 33 as shown in FIG. 5A has a parallelogram shape 34 as shown in FIG. 5B in the image photographed by the camera 3, the circuit board 9 is inclined. It can be recognized that the picture was taken. The dedicated program automatically adjusts the projection position of the projector 2 based on the recognized position and inclination of the circuit board 9.
Subsequently, the dedicated program recognizes the two-color patterns on the probe AR tags 25 to 28 from the image photographed by the camera 3 and compares them with the pattern shape of the tag registered in advance. Specify 25-28. The dedicated program determines the arrangement of the waveforms 21 to 24 displayed in the projection diagram 10 based on the position information of the probe AR tags 25 to 28.
The projector 2 receives the projection information whose projection position has been adjusted transmitted from the computer 1, and projects it onto a work table (screen) 6. Even during the projection, the AR tags for probes 25 to 28 are photographed by the camera 3, and the projected waveform of the waveform measured by the probe 4 follows the probe 4 and is projected to a close position in almost real time. . Thereby, the user can see the object at the same time as viewing the waveform being measured.

  The waveform display 14, the malfunction prevention tag 15, the projection map expansion tag 16, the waveform amplitude expansion tag 17, the waveform amplitude reduction tag 18, the waveform display period reduction tag 19, and the waveform display period reduction tag 20 are also projected. To do. The user can enlarge / reduce the projected waveform or change the cycle by placing his / her finger on the tags 15 to 20. According to the system of the first embodiment described above, even if a plurality of probes are used, a system in which a user can intuitively confirm a measurement position on a circuit board and simultaneously observe a plurality of waveforms on the board. It becomes possible to provide.

  The second embodiment relates to a waveform observation system for engineering education in a place where there is no equipment. In elementary and junior high schools and ordinary high schools, equipment such as an oscilloscope is often not provided. However, if the system of this embodiment is used, virtual education using an oscilloscope can be practiced even if there is a personal computer and a USB camera, even in an environment where there is no equipment such as an oscilloscope. Virtual education can also be practiced in developing countries where there are no facilities other than personal computers.

[System configuration]
The waveform observation system of the present embodiment includes a computer 1 having a display device such as a liquid crystal display and an input device such as a mouse / keyboard, a camera 3, a work table (screen) 6, a tag 8, and a circuit board 9. Is the main component. In the present embodiment, unlike the first embodiment, an oscilloscope and a projector are unnecessary.

The computer 1 is connected to the camera 3, receives information from the camera 3, performs information processing using a dedicated program, and outputs waveforms similar to the waveforms 21 to 24 of the first embodiment to the screen of the computer 1.
The camera 3 uses a USB camera having a number of pixels of about 300,000 pixels or more, photographs the tag 12 attached to the circuit board 9 or the probe 4, and transmits it to the computer 1.
The probe 4 uses a model with a tag 12 for obtaining the position information.

The work table (screen) 6 is a table for fixing the circuit board 9 so as not to be displaced. The work table 6 is provided with a support column 35 to which the camera 3 is fixed.
The tag 8 is attached to the probe 4 or the circuit board 9 using a magic tape, and makes the camera 3 discriminate.
The circuit board 9 is a circuit for measurement, and a tag 8 is attached to a corner.
The computer 1 stores waveforms at various positions on the circuit board 9 in advance in a hard disk (storage device) as a plurality of patterns and image files. As in the first embodiment, the computer 1 measures coordinates such as the position and tilt of the circuit board 9 and the probe 4 from the image taken by the camera 3. Based on the measured relative position information, the relative position information of the probe 4 and the circuit board 9 is calculated. Then, based on the correspondence table between the relative position information and the waveform image file created in advance, a combined image of the substrate and the waveform (see FIG. 4) is displayed on the screen of the computer 1. At this time, a graphical user interface including operation buttons (for example, a button for enlarging / reducing the waveform amplitude and a button for enlarging / reducing the waveform display period) may be displayed.

[how to use]
The experiment instructor (teacher) first stores a plurality of waveform patterns as image files in the hard disk of the computer 1 in advance as waveform images to be displayed on the screen. Then, the board with the tag 8 and the probe with the tag 12 (which may be a model) are distributed to the students. An oscilloscope is not connected to the probe 4 used by the student. However, in this embodiment, it is substituted by displaying the same waveform as that displayed on the oscilloscope on the screen of the computer 1. Specifically, the position and orientation of the tag 8 of the probe 4 is photographed by the USB camera 3 to obtain the relative position information of the probe 4 and the circuit board 9, and the relative position information of the probe 4 and the circuit board 9 created in advance is obtained. Based on the correspondence table of the waveform image file, a composite image of the substrate and the waveform (see FIG. 4) is displayed on the screen of the computer 1. As described above, according to this embodiment, since a composite image of a waveform corresponding to the installation position of the probe can be output to a personal computer, virtual education using an oscilloscope is practiced even in an environment without an oscilloscope or a projector 2. It becomes possible to do. A plurality of waveform outputs including correct answers and errors may be displayed on the screen, and a problem exercise may be performed in which the student selects the correct answer.

Example 3 relates to a waveform observation system for e-Learning that can also be used as an auxiliary teaching material for circuit production on a computer. In the system of this embodiment shown in FIG. 7, a circuit is laid out on a computer, a waveform diagram of a layout produced by a projector is projected, and the projected waveform diagram matches the waveform diagram of an actually produced electronic circuit. Determine whether. In addition, the USB camera is not only for recognizing a tag, but it is also possible to photograph an experimental situation. In actual engineering experiments, only observed data is often left, but in the system of this embodiment, a circuit created using a USB camera can be left as image data. Not only the circuit but also the position measured by the probe can be left in the data, and the report can be used to evaluate the circuit manufacturing process. In addition to displaying the waveform, various data can be left by projecting the voltage and frequency values of the measured location and the calculated results and photographing them with a USB camera. By recording the video that projects the waveform etc. and saving it, and playing it back in the next class or next year, other students (juniors) who saw it also intuitively understand the electrical circuit I can study.
Note that the waveform observation system of this embodiment projects the planet such as the earth, the moon, and Mars on a sphere by using the fact that the projector can project a curved surface and a spherical surface, and places the place with a tagged pen or the like. It can also be applied to teaching materials that show details of the location of the planet.

[System configuration]
The waveform observation system of the present embodiment includes a computer 1, a projector 2, a camera 3, a probe 4, an oscilloscope 5, a workbench (screen) 6, a tag 12, and a circuit board 9. Element.

The computer 1 is connected to the camera 3, receives information from the camera 3, performs information processing using a dedicated program, and transmits the information to the projector 2.
The projector 2 receives information processed by the computer 1 and projects it on a work table (screen) 6.
The camera 3 uses a USB camera having a number of pixels of about 300,000 pixels or more, photographs the tag 12 attached to the circuit board 9 or the probe 4, and transmits it to the computer 1.
The probe 4 is connected to an oscilloscope 5 and transmits information measured by being attached to a measurement target to the oscilloscope 5. In addition, a quadrangular prism cap 11 is attached to the probe 4 in order to obtain position information.
The oscilloscope 5 receives a signal waveform from the circuit measured by the probe 4, processes the information, and transmits it to the computer 1.

The work table (screen) 6 is a table for fixing the circuit board 9 so as not to be displaced, and is a screen projected from the projector 2. The work table 6 is provided with a support column 35 to which the projector 2 and the camera 3 are fixed.
The tag 12 is attached to the probe 4 or the circuit board 9 using a magic tape, and makes the camera 3 discriminate.
The circuit board 9 is a circuit for measurement, and a tag 8 is attached to a corner.

  The computer 1 analyzes the circuit design information input by the user, analyzes the waveform at each position on the circuit board by the circuit simulator, and the position and inclination of the circuit board 9 and the probe 4 from the video by the camera 3 as in the first embodiment. Match coordinate information such as The projector 2 projects a circuit design information diagram on the circuit board 9.

[how to use]
The experiment instructor (teacher) analyzes a plurality of circuit design information patterns and waveforms at respective positions on the circuit board 9 by a circuit simulator and stores them in the hard disk of the computer 1. Then, the student creates a circuit based on the circuit design information diagram projected on the circuit board 9 by the projector 2. Next, each waveform is measured with the oscilloscope 5 by connecting the probe 4 to the portion of the wired circuit board 9 to be measured. At that time, the computer 1 acquires the coordinate information of the circuit board 9 and the probe 4 from the video by the camera 3, collates the data (ideal waveform by the simulator) that should be in that position with the measured waveform by image processing, and determines the degree of coincidence. judge. At this time, if the degree of coincidence between the ideal waveform and the measured waveform is within a preset allowable value, it is determined to be acceptable and an image indicating acceptance is selected, and if it exceeds the allowable value, it is determined to be unacceptable. Select the image to show. By projecting both waveforms and the determination result 44 using the projector 2, it is possible to support a student to design a correct electronic circuit.

  Example 4 relates to a waveform observation system for physical quantity measurement. In this embodiment, the physical quantity refers to a physical quantity that is invisible such as electricity, electromagnetics, heat, electromagnetic waves (including radio waves, light, radiation, etc.). In the following, an example will be described in which a radiation contamination level or the like of a place indicated by a stick or the like attached with a tag in the experimental apparatus is displayed so as to be visually understood during an experiment dealing with radiation.

[System configuration]
FIG. 8 shows the configuration of the physical measurement system according to the fourth embodiment. The system of the present embodiment includes a computer 1 for numerically calculating measurement data, a radiation dose measuring device 36, a camera 3 for acquiring images, a work table 6, a counter tube 37, and a counter tube 37. A detection tag 38 for recognizing a position, a radioactive substance 39, a reference coordinate tag 40 for setting a reference coordinate, and a shield 41 are main components.

The computer 1 receives information from the radiation dose measuring device 36 and the camera 3 connected to the main body, performs information processing using a dedicated program, and displays the information on the screen.
As the radiation dose measuring device 36, SURVEY METER, CYPHER MODEL 5000 manufactured by Health Physics Instruments was used. The radiation dose measuring device 36 can numerically display the intensity of radioactivity as a radiation dose, and transmits the measured radiation dose to the computer 1.
The camera 3 uses a USB camera having a number of pixels of about 300,000 pixels or more, shoots a detection tag 38 and a reference coordinate tag 40 for recognizing the position of the counter tube, and transmits them to the computer 1.
The work table 6 is a table on which the radioactive substance 39 and the shield 41 are installed. The reference coordinate tag 40 is fixed to the work table 6 so as not to shift.
The counter tube 37 is a radiation detection unit of the radiation dose measuring device 36.
A detection tag 38 for recognizing the position of the counter tube is attached to the counter tube 37 so that the camera 1 can identify the position of the counter tube 37 by the camera 3.
The radioactive substance 39 is a substance having radioactivity, and a Co60 gamma ray source was used.
The shield 41 was made of lead.
The reference coordinate tag 40 is used to set reference coordinates for displaying mesh lines on the screen by photographing with the camera 3 and causing the computer 1 to determine.

  The computer 1 receives the position information of the detection tag 38 and the tag 40 by the camera 3 and the measurement data acquired by the radiation dose measuring device 36. The computer 1 calculates the distance between the detection tag 38 and the tag 40 from the position information of the detection tags 38 and 40 by the camera 3 and acquires the position information of the counter 37. Further, a three-dimensional graph is created in which information obtained by quantifying the intensity of radioactivity by the radiation dose measuring device 36 as the amount of radiation is connected by mesh lines. The two pieces of information described above and the video from the camera 3 are collated and displayed on the screen in real time (see FIG. 10). When performing experiments such as radiation detection using existing radiation detectors, it is necessary to recognize the amount of radiation detected only by numerical information such as the sound generated when the radiation is detected and the number of radiation per hour As described above, it is difficult to recognize position information and measurement data in association with each other. With this system, 3D display can be performed so that the user can intuitively understand how much measurement data is acquired at which position.

[how to use]
The experimenter first activates the computer 1, the radiation dose measuring device 36, and the camera 3. Then, it is confirmed that the mesh line and the radioactive substance 39 are displayed on the screen of the computer 1 (see FIG. 9). Next, the experimenter brings the counter tube 37 close to the object. When the counter tube 37 is brought closer, the radiation dose detected by the counter tube 37 is transmitted to the computer 1 through the radiation dose meter 36. The computer 1 creates mesh lines corresponding to the radiation dose density in real time and displays them on the screen (see FIG. 10). The experimenter can intuitively understand the intensity of radioactivity depending on the height of the mountain.

1 Computer 2 Projector 3 Camera 4 Probe 5 Oscilloscope 6 Worktable (Screen)
7 USB cable 8 AR tag for board 9 Circuit board 10 Projection view 11 Cap 12 AR tag for probe 13 Sponge 14 Waveform display 15 Malfunction prevention tag 16 Projection view enlargement tag 17 Waveform amplitude enlargement tag 18 Waveform amplitude reduction tag 19 Waveform display period Reduction tag 20 Waveform display period expansion tag 21 First probe waveform 22 Second probe waveform 23 Third probe waveform 24 Fourth probe waveform 25 First probe AR tag 26 Second probe AR tag 27 Third tag AR tag 28 Fourth probe AR tag 29 First probe 30 Second probe 31 Third probe 32 Fourth probe 33 AR tag 34 AR tag 35 photographed by camera Column 36 Radiation dose measuring device 37 Counter tube 38 Detection tag 39 Radioactive substance 40 Reference coordinate tag 41 Shielding It objects 42 Measurement waveform 43 ideal waveform 44 determination result

Claims (3)

A plurality of board AR tags for mounting on an electronic circuit board;
A camera for photographing a work area including an electronic circuit board;
An oscilloscope displaying waveforms measured by multiple probes;
A plurality of probe AR tags for attachment to each probe;
A projector for projecting a waveform image onto the work area;
A waveform observation system comprising a computer connected to a camera, an oscilloscope and a projector,
Means for the computer to acquire a work area image taken by the camera and store it in a storage device;
Means for recognizing the substrate AR tag from the work area image stored in the storage device, acquiring the substrate coordinate information and storing it in the storage device;
Means for recognizing the probe AR tag from the work area image stored in the storage device, acquiring the coordinate information of the probe and storing it in the storage device;
For waveform image information acquired from an oscilloscope, means for setting a projection coordinate in the vicinity of the probe based on the probe coordinate information of the corresponding probe and storing it in a storage device;
Means for projecting a waveform image on the projector based on the set projection coordinates;
A waveform observation system comprising:   The waveform observation system according to claim 1, wherein the computer comprises means for causing the projector to project an AR tag as an operation switch for enlarging or reducing the waveform image. Computer
Means for setting projection coordinates in the vicinity of the probe based on the probe coordinate information of the probe corresponding to the waveform image information stored in advance in the storage device;
Means for projecting waveform image information on the projector based on the set projection coordinates;
3. The apparatus according to claim 1, further comprising means for determining whether the waveform image information stored in advance in the storage device substantially matches the waveform image information acquired from the oscilloscope, and causing the projector to project the determination result. Waveform observation system.