JP4864734B2 - Optical displacement sensor and displacement measuring apparatus using the same - Google Patents

Description

  The present invention relates to an optical displacement sensor used to triangulate the displacement of the surface of the object to be measured by applying the light (beam) of the object to be measured and receiving the reflected light, and the displacement using the optical displacement sensor. It relates to a measuring device. In particular, the present invention relates to a technique that can measure the displacement of the surface of an object to be measured that is inclined in the scanning direction using regular reflection light and irregular reflection light.

  By irradiating the object to be measured from an oblique direction with a light source, the specularly reflected light from the object to be measured (a beam reflected to the opposite side at the same angle as the irradiation angle with respect to the vertical line at the irradiated point) by triangulation The displacement measurement device has a weak point in the measurement accuracy on the inclined surface of the object to be measured, and in order to overcome this, there has been a technique for capturing and measuring irregularly reflected light reflected in the vertical direction from the irradiation point at the same time ( Patent Document 1).

  The technique of Patent Document 1 detects displacement information and light quantity at the same time by using different PSDs (Positive Sensitive Detectors) for specularly reflected light and irregularly reflected light, and compares the magnitude of the light quantity and uses good displacement information. , The technology to measure.

Japanese Patent No. 3817232

  According to the technique of Patent Document 1 above, the displacement of the inclined surface of the object to be measured can be measured, but the inclination of the object to be measured on the side opposite to the light source with respect to the vertical line, In other words, there was something that was insufficient for the measurement of the shadowed part. For example, when the amount (for example, volume) of solder (cream solder) printed on a substrate is measured from different directions, there is a tendency to show different volume values because there is a shaded part depending on the measurement direction.

  An object of the present invention is to provide a technology that can receive regular reflection light and irregular reflection light from a plurality of light sources having different irradiation angles and improve the displacement measurement accuracy of a shadow portion that is difficult to obtain with only regular reflection light.

In order to achieve the above object, the invention according to claim 1 is a first light source (OS1) that irradiates a target position on the surface of the object to be measured, and a first light source of the first light source at the target position. A first light receiving means (D1) disposed on a first scattered light path formed at a first angle θ1 with respect to the first optical axis, and the first scattered light path with respect to the first optical axis The second light receiving means (D2) disposed on the second scattered light path formed at the second angle θ2 on the opposite side of the target position, and the target position at an angle θ3 oblique to the first optical axis A second light source (OS2) that irradiates the second light source, and a third reflection light path that is formed at a third angle 2θ3 with respect to the second optical axis of the second light source at the target position. and light receiving means (D3), defines the position of the cross provided on one casing, said first light receiving means, said second light receiving means and the third light receiving means Each has a light-receiving surface of a predetermined length, and is a position detector that detects light displacement information according to a light-receiving position in the predetermined length direction, and includes a first optical axis and a second light source. The predetermined length direction is arranged along the plane within a plane including the optical axis, the first scattered light path, the second scattered light path, and the regular reflection light path, and the first angle θ1, the second angle θ2, and the third angle 2θ3 are configured to be the same, the angle (α1) that the first light receiving means forms with the first scattered light path, and the second light receiving means The angle (α2) formed with the second scattered light path and the angle (α3) formed with the third light receiving means with the specular reflection light path were the same .

According to a second aspect of the present invention, there is provided a first light source (OS1) for irradiating a target position on the surface of the object to be measured, and a first optical axis of the first light source at the target position. A first light receiving means (D1) disposed on a first scattered light path formed at an angle θ1, and a second angle θ2 opposite to the first scattered light path with respect to the first optical axis; And a second light source (OS2) that irradiates the target position at an oblique angle θ3 with respect to the first optical axis. And a third light receiving means (D3) disposed on a regular reflection optical path formed at a third angle 2θ3 with respect to the second optical axis of the second light source at the target position. provided in one casing defining a position of mutual, the first light receiving means, wherein each of the second light receiving means and the third light receiving means, receiving the predetermined length A position detector that detects light displacement information in accordance with a light receiving position in the predetermined length direction, wherein the first optical axis, the optical axis of the second light source, and the first scattered light path The predetermined length direction is arranged along the plane in a plane including the second scattered light path and the regular reflection optical path, and further, the predetermined distance L1n is set on the first scattered light path. A first light-condensing function element (K1) that collects scattered light from the target position with the first angle θ1 as an axis and forms an image on the first light-receiving means separated by a predetermined distance L1m; and the second A second collection of scattered light having the second angle θ2 from the target position as an axis at a predetermined distance L2n and forming an image on the second light receiving means separated by a predetermined distance L2m. An optical functional element (K2) and a predetermined distance L3n on the regular reflection optical path. A third condensing function element (K3) that collects specularly reflected light from the target position with the third angle θ3 as an axis and forms an image on a third light receiving means separated by a predetermined distance L3m. The angle α1 formed by the first light receiving unit with the first scattered light path is tan ⁻¹ (L1n / L1m × tan θ1), and the angle α2 formed by the second light receiving unit with the second scattered light path is tan ^−1. (L2n / L2m × tan θ2) and an angle α3 formed by the third light receiving unit with the specular reflection optical path are arranged to be tan ⁻¹ (L3n / L3m × tan2θ3), and the predetermined distance ratios L1n / L1m, L2n / L2m and L3n / L3m have the same value, and the first angle θ1, the second angle θ2, and the third angle 2θ3 have the same value.

According to a third aspect of the present invention, there is provided the optical displacement sensor (2) according to the first or second aspect, and scanning for causing the optical displacement sensor to scan in a direction parallel to the plane with respect to the position of the object to be measured. Based on the mechanism (7), the sum of the output of the first light receiving means and the output of the second light receiving means, and the output of the third light receiving means, the displacement of the surface of the object to be measured is obtained. And a measurement unit (100) .

According to a fourth aspect of the present invention, in the invention of the third aspect, in the optical displacement sensor, the wavelength of the light emitted by the first light source and the wavelength of the light emitted by the second light source are the same. Furthermore, when the scanning mechanism causes the optical displacement sensor to irradiate the target position of the object to be measured, the irradiation by the first light source and the irradiation by the second light source are performed at the same target position. It was set as the structure switched.

Since the invention according to claim 1, 2 or 3 is configured to perform displacement measurement by specular reflection light in triangulation and displacement measurement by irregular reflection light in opposite directions, it is orthogonal to the first optical axis. The displacement can be measured on the plane to be inclined or the plane inclined with respect to the plane. Further, according to the invention described in claim 1, each light receiving means can be measured with the same sensitivity. According to this invention, in each light receiving means, it is possible to measure with substantially the same sensitivity in each measurement range (displacement range) .

  Embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a schematic configuration diagram for explaining an embodiment of an optical displacement sensor according to the present invention. FIG. 2 is a diagram for explaining the positional relationship between the elements in FIG. FIG. 3 is a diagram for explaining the amount of light detected by each light receiving means in FIG. FIG. 4 is a diagram showing an embodiment of a measurement unit using the embodiment of the optical displacement sensor of FIG. FIG. 5 is a diagram showing an embodiment of an inspection apparatus using the measurement unit of FIG.

[Optical displacement sensor]
In FIG. 1, the optical displacement sensor 2 irradiates a target position on the surface of a measurement object onto a single plate-like substrate or a base on a flat plate (hereinafter referred to as “base”). Light source OS1, a first light receiving means D1 disposed on a first scattered light path formed at a target position at a first angle θ1 with respect to the first optical axis, and a first optical axis The second light receiving means D2 disposed on the second scattered light path formed at the second angle θ2 on the opposite side of the first optical path, and the oblique angle θ3 with respect to the first optical axis A second light source OS2 that irradiates the target position at the third position, and a third light source OS2 disposed on the regular reflection optical path formed at a third angle 2θ3 with respect to the second optical axis of the second light source at the target position And a light receiving means D3, so that the positional relationship between them is fixed, and one housing is integrally formed. As shown in FIG. 1, the optical displacement sensor 2 moves on the surface of the DUT 1 while maintaining the positional relationship between the elements in a direction parallel to the surface of the base (left-right direction toward the drawing). This is to enable scanning.

  In FIG. 1, the first light source OS1 is, for example, a laser, and the surface of the device under test 1 (this surface is not a surface of the detailed portion of the device under test 1 but a surface indicating the overall direction). The light (beam) is irradiated in a direction perpendicular to the direction. That is, the first optical axis is perpendicular to the surface of the DUT 1. The second light source OS2 is, for example, a laser, and irradiates light (beam) so as to cross the first optical axis from the right direction in FIG. 1 (or from the left) at an angle θ3. This crossing position is the target position of the DUT 1 to be measured. Although not shown in the drawing, light from each light source is condensed on each of the first irradiation light path from the first light source OS1 to the target position and the second irradiation light path from the second light source OS2 to the target position. A collimator lens that converts the light into parallel light, and a condensing lens that condenses the parallel light to the target position (that is, in this case, the target position is the first light source OS1 and the second light source described later). It is also the position where the light from each of OS2 is collected.) Further, when the first light source OS1 and the second light source OS2 have the same wavelength, they may be light extracted from the same light source.

  In the irradiation position (target position) on the DUT 1, the first light receiving means D1 is disposed at a position (position on the first scattered light path) that forms an angle θ1 to the left with respect to the first optical axis. The second light receiving means D2 is arranged at a position (position on the second scattered light path) that forms an angle θ2 to the right with respect to the first optical axis. The first light receiving means D1 and the second light receiving means D2 receive light (beams) diffusely reflected at angles θ1 and θ2, respectively, among the reflected light reflected by the light emitted by the first light source OS1. The third light receiving means D3 receives light (beam) regularly reflected on the optical path (on the regular reflection optical path) that forms an angle 2θ3 with respect to the second optical axis of the second light source OS2.

  The displacement measurement system by irregular reflection using the first light source OS1, the first light receiving means D1, and the second light receiving means D2 is effective when the surface of the DUT 1 has an inclination, and the second light source OS2 The displacement measuring system by regular reflection using the third light receiving means D3 is effective when the surface of the DUT 1 is flat. Therefore, the angle θ3 is preferably smaller than the angle θ1 or the angle θ2. Also, the printed circuit board on which the solder is printed is divided into a weakly glossy, mainly soldered surface with a lot of unevenness, and a strongly glossy, mainly flat resist surface. The former is a diffuse reflection displacement measurement system, and the latter is a reflection displacement. It is desirable to measure with a measurement system.

  In order to avoid mutual interference between the regular reflection light and the irregular reflection light, the displacement measurement operation of the irregular reflection displacement measurement system using the first light source OS1, the first light receiving means D1 and the second light receiving means D2, and the second light source OS2 , And the displacement measurement operation by the specular reflection displacement measurement system using the third light receiving means D3 are performed simultaneously at different wavelengths or alternately by time sharing at the same wavelength. In the case of using different wavelengths, an optical filter that inserts wavelengths received by each of the first light receiving means D1, the second light receiving means D2, and the third light receiving means D3 and blocks other wavelengths is inserted. There is a need.

  FIG. 3 shows the displacement of a printed circuit board having a resist area 1a having a high reflection intensity on a plane and a solder area 1b having a slope and a flat part and having a low reflection intensity as the DUT 1 shown in FIG. FIGS. 3B to 3D schematically show the light amount of each light receiving means when measured by scanning. As shown in FIGS. 3B to 3D, even if the solder region 1b is inclined, it can be received by any one of the light receiving means, that is, the displacement can be measured.

  In FIG. 2, the first irregular reflection optical path between the first light receiving means D1 and the target position, the second irregular reflection optical path between the second light receiving means D2 and the target position, and the third light receiving means. In each of the regular reflection optical paths between D3 and the target position, a collimator lens that collects each reflected light from the target position and converts it into parallel light, and further collects the parallel light at the target position to form an image. Condensing functional elements K1, K2, and K3 including a condensing lens to be provided. Here, the expression “condensing functional element” is used, but it is basically a function that condenses each reflected light (beam) and forms an image on each light receiving means. This is an expression for representing all of them because it can be achieved with a lens or a plurality of lenses. As shown in FIG. 1, the distances to the positions where the reflected light is converted into parallel light around the optical axis where each of the light condensing functional elements K1, K2, and K3 is arranged are L1n, L2n, and L3n. L1m, L2m, and L3m are distances until the light receiving means collects light. The distance (the length of the light condensing function element) that the light condensing function elements K1, K2, and K3 maintain as parallel light is used to determine the position of each light receiving element with respect to the target position.

  Each of the first light receiving means D1, the second light receiving means D2, and the third light receiving means D3 has a light receiving surface with a predetermined length, and the optical displacement information according to the light receiving position in the predetermined length direction. A position detector (PSD) is used to detect. In the PSD, the light detection elements are arranged in the length direction, and when the output A and the output B are output from each end as information indicating the positions from both ends in the length direction, the displacement information is (A− B) / (A + B). In addition, each light receiving means outputs light quantity information. The PSD is an element that optically measures displacement and converts it into an electrical signal, and may be composed of a photodiode or a CCD.

  An angle α1 formed by the first light receiving unit D1 with the first scattered light path, an angle α2 formed by the second light receiving unit with the second scattered light path, and an angle α3 formed by the third light receiving unit with the specularly reflected light path, Set to These angles are set for sensitivity adjustment.

In the present embodiment, the angle α1 formed by the first light receiving unit D1 with the first scattered light path is tan ⁻¹ (L1n / L1m × tan θ1), and the angle α2 formed by the second light receiving unit D2 with the second scattered light path. Tan ⁻¹ (L2n / L2m × tan θ2) and the angle α3 formed by the third light receiving means D3 with the regular reflection optical path is tan ⁻¹ (L3n / L3m × tan2θ3). Can be measured while reducing the difference in sensitivity in the length direction of the light receiving means (direction in which the sensing elements are arranged).

  These underlying principles are called Scheimpflug Principles, and when an image is projected onto a subject surface with a lens, each of the three surfaces of the image surface, the lens surface and the subject surface is extended. If the lines meet at the same point, the entire surface of the image is said to be in focus. In the present embodiment, as shown in FIG. 2, the sensitivity of the three light receiving means is appropriately adjusted using this condition. In FIG. 2, a range R indicates a measurable displacement range of the DUT 1 and indicates a surface in the length direction of the light receiving means D (representing each of the light receiving means D1, D2, and D3). An extension line of the range R (in this case, the same as the optical axis from the light source), an extension line of the surface of the condensing function element K (representing each condensing function element K1, K2, K3), and light receiving means Displacement can be measured with appropriate sensitivity in the length direction of the light receiving means (in other words, in the entire range R) by arranging and arranging so that the extended line of the surface of D intersects at one point. .

  In the above formula, the distance ratios L1n / L1m, L2n / L2m, and L3n / L3m have the same value, and the first angle θ1, the second angle θ2, and the third angle 2θ3 have the same value (θ). Therefore, the angle α1, the angle α2, and the angle α3 with respect to the range R also have the same value (α), and the difference in sensitivity between the light receiving means can be reduced for measurement.

  In the above formula, the first angle θ1, the second angle θ2, and the third angle 2θ3 are the same regardless of whether the distance ratios L1n / L1m, L2n / L2m, and L3n / L3m have the same value. If the angle α1, the angle α2, and the angle α3 are also set to the same value (α) by setting the value (θ), the in-focus portion and the out-of-focus portion are generated inside the light-receiving device, but the sensitivity variation between the light-receiving devices is suppressed. be able to. In addition, the distance and angle in the present invention are described by the value of the approximate center in the measurement range.

  As described above, the optical displacement sensor 2 uses a diffuse reflection displacement measurement system that uses two symmetrical symmetric diffuse reflections, and is divided into a diffuse reflection displacement measurement system and a regular reflection displacement measurement system. Since the first angle θ1, the second angle θ2, and the third angle 2θ3 have the same value (θ), it is possible to make each displacement measurement have the same sensitivity. Regardless of the reflectance of the DUT 1, it is possible to measure the shaded part of specular reflection without sensitivity correction, reducing the difference in displacement measurement between the diffuse reflection displacement measurement system and the regular reflection displacement measurement system, and high accuracy. Can measure.

[Configuration of measurement unit]
An embodiment of the measurement unit 100 that performs displacement measurement using the optical displacement sensor 2 will be described with reference to FIG.
In FIG. 4, the scanning mechanism 7 has a driving source such as a motor and a driving mechanism such as a belt, and scans by moving the device under test 1, the optical displacement sensor 2, or both of them. As shown in FIG. 1, the displacement is measured while performing main scanning in the planar direction of the optical displacement sensor 2, that is, the arrangement direction in which the respective elements such as the first light receiving means D1 are arranged, and then the direction orthogonal to the arrangement direction. (Sub-scanning) and then main scanning from there to measure displacement. By repeating this operation, the displacement of the device under test 1 in the desired range is measured.

  In response to an instruction from a panel or the like (not shown), for example, the control unit 8 receives an instruction of a desired measurement range of a printed circuit board on which solder is printed, and sends a scanning instruction for the desired range to the scanning mechanism 7 as described above. To scan. In scanning, when the first light source OS1 and the second light source OS2 use light sources having the same wavelength, the first light source OS1 and the second light source OS1 are scanned at the same scanning position (target position) on the DUT 1. The light source OS2 is switched alternately. When light sources having different wavelengths are used, it is not always necessary to switch them, and a configuration in which they are simultaneously output may be used.

  The adder 3 receives the output A1 of the first light receiving means D1 and the output A2 of the second light receiving means D2, adds them, and outputs Ax = A1 + A2. The adder 4 receives the output B1 of the first light receiving means D1 and the output B2 of the second light receiving means D2, adds them, and outputs Bx = B1 + B2. The computing unit 5 obtains displacement information L1 = (Ax−Bx) / (Ax + Bx) due to irregular reflection based on them. The calculator 5 receives the output from the third light receiving means D3 and obtains displacement information L2 = (A3−B3) / (A3 + B3) by regular reflection. At this time, the arithmetic unit 5 receives light quantity information from each light receiving means, compares the light quantity by the irregular reflection displacement measurement system and the magnitude of the light quantity by the regular reflection displacement measurement system, and calculates the displacement measurement system having the larger light quantity. The displacement information is output to the image processing unit 6 as displacement information. By doing so, even if the amount of light received by each light receiving unit is different as shown in FIG. 3, the displacement information with the higher light amount can be used.

  When comparing the amount of light by the irregular reflection displacement measurement system and the amount of light by the regular reflection displacement measurement system and selecting the displacement information of the displacement measurement system having the larger light amount, Japanese Patent No. 3817232 filed by the present applicant. You may employ | adopt the procedure shown by. In other words, out of the amount of light by the diffuse reflection displacement measurement system and the amount of light by the regular reflection displacement measurement system, when a light amount not less than a predetermined lower limit threshold and not more than a predetermined upper limit threshold is employed, and only one light amount is employed, The displacement information of the displacement measurement system corresponding to the adopted light quantity is taken as the measurement value. When both light quantities are adopted, the light quantity of both is compared, and the displacement information of the displacement measurement system with the higher light quantity is taken as the measurement value. Output or send to the image processing unit 6. If only displacement information is to be obtained, it can be obtained by plotting the output of the computing unit 5 against the position information from the control unit 8.

  The image processing unit 6 receives layout information (arrangement drawing) of the DUT 1 from the control unit 8 and position information when scanning and measuring, and receives displacement information in the position information from the calculator 5. Then, a stereoscopic image representing a quantitative shape is formed on the layout in accordance with the displacement information, and is reproduced and output as an image.

In addition, the DUT 1 is a printed circuit board printed with cream solder as shown in FIG. 3A, which has a weakly glossy, mainly uneven solder surface, and a highly glossy and mainly flat surface. In the case of being divided into the resist surfaces, the image processing unit 6 is measured by the displacement information L1 measured by the irregular reflection displacement measurement system and the specular reflection displacement measurement system, which are alternately measured and obtained by the calculator 5. A method may be used in which each image is generated based on the displacement information L2, and the computing unit 5 compares both light amounts, deletes the image at that position that is determined to be dark, and overlays the images. .
In a typical example, the image on the resist surface (displacement information L1 corresponding to this image) is deleted from the image created with the displacement information L1 due to irregular reflection, and the image created with the displacement information L2 due to regular reflection is used. The target image can be obtained by deleting the image of the solder surface (displacement information L2 corresponding to this image) and superimposing both deleted images.
Any of the methods described above can be applied to the shape inspection apparatus described below.

[Shape inspection device]
Based on FIG. 5, an embodiment used for a shape inspection apparatus that inspects the displacement of the surface of the object to be measured using the measurement unit 100 (displacement measurement apparatus) of FIG. 4 using the optical displacement sensor 2 described above. explain. The present embodiment can be used for, for example, determining the quality of a solder having a shape including a slope when cream solder is printed on a printed circuit board. In FIG. 5, the control unit 12, the comparison unit 9, the determination unit 10, and the display unit 11 constitute an inspection unit 200. The control unit 12 includes the control unit 8 of FIG.

  The image processing unit 6 (same as that shown in FIG. 4) is an area (measuring region of measurement points: for example, an area measured from the output of the computing unit 5 and the position (coordinates) of the measurement points of the measurement object from the control unit 12. Image data representing the area (for example, solder printed area) and volume (for example, solder amount) in the cream solder surface printed on the printed circuit board is generated. The comparison unit 9 receives a design value or the like in the area from the control unit 12 as a reference (area or volume), and calculates and outputs a difference between the image data and the reference. Note that the difference between the displacement measured at the measurement point (height: for example, the height of the solder) and the reference (in this case, for example, the design height at the measurement point) without being converted into image data. It may be output.

  The determination unit 10 receives the allowable value corresponding to the reference from the control unit 12 and compares it with the output from the comparison unit 9. If the output of the comparison unit 9 is within the allowable value, the determination unit 10 passes, and if the output is outside the allowable value. If it is defective, it is determined as bad.

  The display unit 11 displays the determination result of the determination unit 10. In addition, layout information (for example, a layout diagram of solder locations on the printed circuit board) is received from the control unit 12 and displayed so that it is possible to identify at which position of the layout the solder is defective (or not) and passed. May be. Further, separately or in combination, an image based on the image data generated by the image processing unit 6 can be displayed so that it can be identifiable which part of the solder state is defective and passed.

  When the surface shape of the object to be measured is inspected using the optical displacement sensor 2 described above, it is possible to inspect whether or not it is acceptable, including not only the apex and the flat portion but also the shape of the inclined portion.

  In the above description, the measurement object in the object to be measured has been explained that the inclination and the apex of the convex part on the surface of the object to be measured 1 can be measured in this embodiment as shown in FIG. Even in the case of a recess, the displacement of the inclined portion and the bottom portion can be measured depending on the size of the opening of the recess.

It is a typical block diagram for demonstrating embodiment of the optical displacement sensor which concerns on this invention. It is a figure for demonstrating the positional relationship of each element of FIG. It is a figure for demonstrating the light quantity which each light-receiving means of FIG. 1 detects. It is a figure which shows embodiment of the measurement part using the optical displacement sensor of FIG. It is a figure which shows embodiment of the test | inspection apparatus using the measurement part of FIG.

Explanation of symbols

1 object to be measured, 2 optical displacement sensor, 3 adder, 4 adder, 5 arithmetic unit,
6 image processing unit, 7 scanning mechanism, 8 control unit, 9 comparison unit, 10 determination unit,
11 display means, 12 control section, 100 measuring section, 200 inspection section D1 first light receiving means, D2 second light receiving means, D3 third light receiving means,
K1, K2, K3 Condensing functional element,
L1 Displacement information by diffuse reflection L2 Displacement information by regular reflection OS1 first light source, OS2 second light source,
R range

Claims (4)

A first light source (OS1) that irradiates the target position on the surface of the object to be measured, and a first angle formed at a first angle θ1 with respect to the first optical axis of the first light source at the target position. First light receiving means (D1) disposed on the scattered light path, and a second scattering formed at a second angle θ2 on the opposite side of the first scattered light path with respect to the first optical axis. A second light receiving means (D2) disposed on the optical path, a second light source (OS2) that irradiates the target position at an oblique angle θ3 with respect to the first optical axis, and the target position The third light receiving means (D3) disposed on the specular reflection optical path formed at the third angle 2θ3 with respect to the second optical axis of the second light source is positioned with respect to each other, and Prepare in the housing ,
Each of the first light receiving means, the second light receiving means, and the third light receiving means has a light receiving surface having a predetermined length, and detects optical displacement information according to the light receiving position in the predetermined length direction. A position detector, wherein the predetermined length is within a plane including the first optical axis, the optical axis of the second light source, the first scattered light path, the second scattered light path, and the specularly reflected light path. It is arranged so that the direction is along the plane,
further,
The first angle θ1, the second angle θ2, and the third angle 2θ3 are configured to be the same,
The angle (α1) formed by the first light receiving unit with the first scattered light path, the angle (α2) formed by the second light receiving unit with the second scattered light path, and the third light receiving unit with the specularly reflected light path. An optical displacement sensor characterized in that the formed angles (α3) are the same . A first light source (OS1) that irradiates the target position on the surface of the object to be measured, and a first angle formed at a first angle θ1 with respect to the first optical axis of the first light source at the target position. First light receiving means (D1) disposed on the scattered light path, and a second scattering formed at a second angle θ2 on the opposite side of the first scattered light path with respect to the first optical axis. A second light receiving means (D2) disposed on the optical path, a second light source (OS2) that irradiates the target position at an oblique angle θ3 with respect to the first optical axis, and the target position The third light receiving means (D3) disposed on the specular reflection optical path formed at the third angle 2θ3 with respect to the second optical axis of the second light source is positioned with respect to each other, and Prepare in the housing,
Each of the first light receiving means, the second light receiving means, and the third light receiving means has a light receiving surface having a predetermined length, and detects optical displacement information according to the light receiving position in the predetermined length direction. A position detector, wherein the predetermined length is within a plane including the first optical axis, the optical axis of the second light source, the first scattered light path, the second scattered light path, and the specularly reflected light path. It is arranged so that the direction is along the plane,
further,
On the first scattered light path, the scattered light having the first angle θ1 as the axis from the target position at a predetermined distance L1n is collected and imaged on the first light receiving means separated by the predetermined distance L1m. The scattered light having the second angle θ2 as the axis from the target position is collected at a predetermined distance L2n on the second light collecting functional element (K1) and the second scattered light path, and separated by a predetermined distance L2m A second light-condensing functional element (K2) that forms an image on the second light receiving means, and regular reflection about the third angle θ3 from the target position at a predetermined distance L3n on the regular reflection optical path. A third condensing function element (K3) that collects light and forms an image on a third light receiving means separated by a predetermined distance L3m, and an angle α1 formed by the first light receiving means and the first scattered light path receiving There ^{tan -1 (L1n / L1m × tanθ1} ), the second Angle α2 which means makes with the second scattered light paths are ^{tan -1 (L2n / L2m × tanθ2} ) and the third angle α3 which light receiving means makes with the positive reflection light path of ^{tan -1 (L3n / L3m × tan2θ3} ) Is arranged to be
The ratios L1n / L1m, L2n / L2m, and L3n / L3m of the predetermined distance are the same value, and the first angle θ1, the second angle θ2, and the third angle 2θ3 are the same value. An optical displacement sensor. The optical displacement sensor (2) according to claim 1 or 2 ,
A scanning mechanism (7) for scanning the optical displacement sensor relative to the position of the object to be measured in a direction parallel to the plane;
A measuring section (100) for determining a displacement of the surface of the object to be measured based on the sum of the output of the first light receiving means and the output of the second light receiving means and the output of the third light receiving means; And a displacement measuring device. In the optical displacement sensor, the wavelength of the light emitted by the first light source and the wavelength of the light emitted by the second light source are the same, and
When the scanning mechanism causes the optical displacement sensor to irradiate the target position of the object to be measured, the irradiation by the first light source and the irradiation by the second light source are switched at the same target position. The displacement measuring device according to claim 3 .

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