JP4710239B2 - Natural air-cooled electronic device unit and temperature judgment method - Google Patents

Natural air-cooled electronic device unit and temperature judgment method Download PDF

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JP4710239B2
JP4710239B2 JP2004088181A JP2004088181A JP4710239B2 JP 4710239 B2 JP4710239 B2 JP 4710239B2 JP 2004088181 A JP2004088181 A JP 2004088181A JP 2004088181 A JP2004088181 A JP 2004088181A JP 4710239 B2 JP4710239 B2 JP 4710239B2
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temperature
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孝幸 長嶋
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Meidensha Corp
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Description

本発明は、自然空冷式の電子機器ユニットの温度測定装置とその電子機器ユニットの温度測定方法に関するものである。 The present invention relates to a temperature measuring device for a natural air-cooled electronic device unit and a temperature measuring method for the electronic device unit.

自然空冷式電子機器においてはその小型化がますます進み、これに伴って大発熱量化現象が発生している。従来、その対策として、図3で示すように電子機器ユニット1の内部を対流熱伝達により冷却する共に、局部発熱する部品(発熱デバイス)3からの熱を外ケース(筺体外箱)2へ熱伝導させ、その外ケースで冷却する構造が採られている。すなわち、外ケース2は金属板などよりなり、CPUや半導体素子などの比較的高熱を発生する発熱デバイス3の発生熱を外ケース2の発熱面を介して外部に放熱させる。また、比較的発生熱の少ない、若しくは発生しない電子機器部品(以下これらを内部部品という)は矢印で示すエアフローが形成されるよう電子機器ユニット内に配設される。5が熱を発生しない内部部品、斜線の施された6が熱を発生する内部部品である。また、4はプリント板である。   Natural air-cooled electronic devices are becoming more and more miniaturized, and as a result, a large amount of heat is generated. Conventionally, as a countermeasure, as shown in FIG. 3, the inside of the electronic device unit 1 is cooled by convection heat transfer, and heat from a component (heating device) 3 that locally generates heat is heated to the outer case (enclosure outer box) 2. A structure is adopted in which it is conducted and cooled in its outer case. That is, the outer case 2 is made of a metal plate or the like, and the heat generated by the heat generating device 3 that generates relatively high heat, such as a CPU or a semiconductor element, is radiated to the outside through the heat generating surface of the outer case 2. In addition, electronic device parts that generate relatively little heat or are not generated (hereinafter referred to as internal components) are arranged in the electronic device unit so that an air flow indicated by arrows is formed. Reference numeral 5 denotes an internal part that does not generate heat, and hatched 6 denotes an internal part that generates heat. Reference numeral 4 denotes a printed board.

この電子機器ユニット1は矢印方向に対流熱が伝達される。   In the electronic device unit 1, convection heat is transmitted in the direction of the arrow.

他の例として、最近の高発熱CPUデバイスには温度センサをデバイス内部に実装し、ダイ温度を測定して動作モード(動作周波数が変化)の制御や異常温度監視などに利用しているものもある。   As another example, some recent high heat generation CPU devices have a temperature sensor mounted inside the device, and the die temperature is measured and used for controlling the operation mode (operation frequency changes) and monitoring abnormal temperatures. is there.

さらに、図5で示すように、ユニットの吸気側に温度センサ7を配設して代表的なユニット温度としての吸気温度(周囲温度)を測定し、この測定温度に基づいてユニット全体を保護するシステム構成としているものもある。
特開平11−272341号公報
Further, as shown in FIG. 5, a temperature sensor 7 is provided on the intake side of the unit to measure the intake air temperature (ambient temperature) as a typical unit temperature, and the entire unit is protected based on this measured temperature. Some have a system configuration.
JP-A-11-272341

図3のような冷却構造において、高発熱デバイス3の検出温度Tpによる監視の場合、この温度Tpは外ケース2の冷却特性に大きく依存している。これに対し、ユニット内部部品5,6は外ケース温度の他に、内部部品の発熱量(内部部品温度Ts)、吸気温度Taなどに大きく依存しているがデバイス温度Tpには依存してない。したがって、デバイス温度Tpでは高発熱デバイス3自体の温度監視はできるが、内部部品5,6の監視はできないものとなっている。   In the cooling structure as shown in FIG. 3, in the case of monitoring by the detected temperature Tp of the high heat generating device 3, this temperature Tp greatly depends on the cooling characteristics of the outer case 2. On the other hand, the unit internal components 5 and 6 largely depend on the heat generation amount (internal component temperature Ts) of the internal components, the intake air temperature Ta, etc. in addition to the outer case temperature, but not on the device temperature Tp. . Therefore, although the temperature of the high heat generating device 3 itself can be monitored at the device temperature Tp, the internal components 5 and 6 cannot be monitored.

図4はこの状態を示したもので、縦軸に内部部品温度Tsをとり、横軸に高発熱デバイス温度をとったときのTp監視でのTsの値を示したものである。   FIG. 4 shows this state. The vertical axis indicates the internal component temperature Ts, and the horizontal axis indicates the value of Ts in Tp monitoring when the high heat generating device temperature is taken.

すなわち、Tpのみの監視の場合、TpではTsを監視できないため、Tp≦TpmaxでもTs≧Tsmaxのエリアが存在する。   That is, in the case of monitoring only Tp, since Ts cannot be monitored by Tp, an area of Ts ≧ Tsmax exists even if Tp ≦ Tpmax.

次に、図5で示すようにユニット吸気部に温度センサ7を実装し、そのセンサにて検出された測定温度TaとTpを利用して温度監視制御を行う場合、内部部品温度Tsは、吸気温度Taに部品温度上昇△Tsを加えたものである。図6はこの状態を示したもので、Ts=Ta+△Tsである。   Next, as shown in FIG. 5, when the temperature sensor 7 is mounted in the unit intake section and the temperature monitoring control is performed using the measured temperatures Ta and Tp detected by the sensor, the internal component temperature Ts This is the temperature Ta plus the component temperature rise ΔTs. FIG. 6 shows this state, where Ts = Ta + ΔTs.

△Taは、部品発熱量、冷却効果などに依存するため、Taを測定してもTsの温度は算出できない。そのため、最大許容吸気温度Tamaxは、△Tが最大となる設定(最悪条件)の時の値△Tsmaxから算出した値で設定する必要がある。すなわち、Tamax=Tsmax(部品最大許容温度)−△Tsmaxである。   Since ΔTa depends on component heat generation, cooling effect, etc., the temperature of Ts cannot be calculated even if Ta is measured. Therefore, it is necessary to set the maximum allowable intake air temperature Tamax as a value calculated from the value ΔTsmax at the time when the maximum ΔT is set (worst condition). That is, Tamax = Tsmax (part maximum allowable temperature) −ΔTsmax.

部品の最大温度上昇値△Tsmaxを引いて得られたTamaxは、小さい値であるため、この方式で温度制御監視するユニットは、許容温度が低くなってしまう問題を有している。   Since Tamax obtained by subtracting the maximum temperature rise value ΔTsmax of the component is a small value, the unit for temperature control monitoring by this method has a problem that the allowable temperature is lowered.

そこで、本発明が目的とするところは、実装状況に応じた温度監視制御が実現でき、かつ製品の信頼性を下げることなく高い温度仕様のユニットの実現を可能とした電子機器ユニットとその監視センサ温度の許容温度判定方法を提供することにある。   Accordingly, an object of the present invention is to provide an electronic device unit and its monitoring sensor that can realize temperature monitoring control according to mounting conditions and can realize a unit having a high temperature specification without lowering product reliability. An object of the present invention is to provide a method for determining an allowable temperature.

本発明の第1は、金属よりなる外ケース内部に電子機器部品を配設し、この電子機器部品を自然空冷すると共に、この電子機器部品で比較的高い熱を発生する発熱デバイスの発生熱を外ケースを介して外部に放熱する電子機器ユニットにおいて、
前記電子機器ユニット内部の熱排気側と前記発熱デバイスにそれぞれ温度センサを設け、熱排気側に設けた温度センサ測定された排気温度Thと発熱デバイスに設けた温度センサでデバイス温度Tpを測定し、前記発熱デバイスの温度上昇に対応して許容温度エリアを増加させ、前記測定した排気温度Thとデバイス温度Tpが許容温度エリア内に入ったときに、前記電子機器部品温度とデバイス温度が温度許容範囲内と判定することを特徴としたものである。
In the first aspect of the present invention, an electronic device component is disposed inside an outer case made of metal, and the electronic device component is naturally air-cooled, and the generated heat of the heat generating device that generates relatively high heat in the electronic device component is generated. In an electronic device unit that dissipates heat through the outer case,
The electronics unit respectively provided temperature sensor inside the heat exhaust side to the heating device, a temperature sensor provided in the measured exhaust gas temperature Th and the heating device at a temperature sensor provided in the heat exhaust side measures the device temperature Tp The allowable temperature area is increased in response to the temperature rise of the heat generating device, and when the measured exhaust temperature Th and device temperature Tp are within the allowable temperature area, the electronic device component temperature and the device temperature are temperature allowable. It is characterized by determining that it is within the range .

本発明の第2は、金属よりなる外ケース内部に電子機器部品を配設し、この電子機器部品を自然空冷すると共に、この電子機器部品で比較的高い熱を発生する発熱デバイスの発生熱を外ケースを介して外部に放熱する電子機器ユニットにおいて、
前記電子機器ユニット内部の熱排気側と前記発熱デバイスに、それぞれ温度センサを設け、熱排気側の温度センサにより測定された排気温度Thと発熱デバイスに設けられた温度センサにより測定されたデバイス温度Tpを入力して発熱デバイスの温度上昇に対応した温度許容エリアを求める演算部を設け、求められた温度許容エリア内に前記測定した排気温度Thとデバイス温度Tpが入るときに、前記電子機器部品温度とデバイス温度が温度許容範囲内であるとすることを特徴としたものである。
In the second aspect of the present invention, an electronic device component is disposed inside an outer case made of metal, and the electronic device component is naturally air-cooled, and the generated heat of the heat generating device that generates relatively high heat in the electronic device component is generated. In an electronic device unit that dissipates heat through the outer case,
A temperature sensor is provided on each of the heat exhaust side and the heat generating device inside the electronic device unit, and the exhaust temperature Th measured by the temperature sensor on the heat exhaust side and the device temperature Tp measured by the temperature sensor provided on the heat generating device. Is input to the electronic device component temperature when the measured exhaust temperature Th and device temperature Tp are within the obtained temperature allowable area. The device temperature is within the allowable temperature range .

本発明の第3は、 前記演算部は、前記測定された排気温度Th、デバイス温度Tp、電子機器部品Tsとし、排気温度Thとデバイス温度Tpの温度差によるデバイス温度から前記熱排気側へ回る温度上昇係数をAとしたとき、
Th={1/(1+A)}Ts+{A/(1+A)}Tp
の演算から発熱デバイスの温度上昇に対応した排気温度Thを算出することを
特徴としたものである。
According to a third aspect of the present invention, the calculation unit uses the measured exhaust temperature Th, device temperature Tp , and electronic equipment component Ts, and moves from the device temperature due to the temperature difference between the exhaust temperature Th and the device temperature Tp to the heat exhaust side. When the temperature rise coefficient is A,
Th = {1 / (1 + A)} Ts + {A / (1 + A)} Tp
The exhaust gas temperature Th corresponding to the temperature rise of the heat generating device is calculated from the above calculation .

本発明の第4は、前記外ケースの発熱面にヒートシンクを取り付けたことを特徴としたものである。
A fourth aspect of the present invention is characterized in that a heat sink is attached to the heat generating surface of the outer case.

以上のとおり、本発明によれば、電子機器ユニット全体の部品温度が許容温度範囲内であるか否かの判別が可能となり、これにより、ユニット仕様温度を安全方向に高めることができ、最適な熱設計を可能とするものである。   As described above, according to the present invention, it is possible to determine whether or not the component temperature of the entire electronic device unit is within the allowable temperature range. Thermal design is possible.

また、最少時2個の温度センサでユニット全体の温度監視制御が可能であるので、低コストの温度監視制御を提供することができる。   In addition, since the temperature monitoring control of the entire unit can be performed with a minimum of two temperature sensors, low-cost temperature monitoring control can be provided.

2箇所で測定した温度が許容エリア内にあるか否かのソフトウェアにて設計可能なため、電子機器ユニットの温度マージンが簡単に調整でき、また、部品の実装を水平方向などその方向を変えて部品配置する場合、計算式のバラメータを変更するだけで正確な判定が可能となるものである。   The software can be designed to determine whether the temperature measured at two locations is within the permissible area, so the temperature margin of the electronic device unit can be easily adjusted, and the mounting direction of components can be changed in the horizontal direction. In the case of component placement, accurate determination can be made only by changing the parameters of the calculation formula.

さらに、外ケースにヒートシンクを取り付けたり、外ケース発熱面を放熱性能の高い壁などに取り付けてユニットの冷却性能を高め、ユニット排気温度を下げることにより、より厳しい環境に対応可能となるなどの効果を有するものである。   In addition, by attaching a heat sink to the outer case, attaching the outer case heat generating surface to a wall with high heat dissipation performance, etc., improving the cooling performance of the unit and lowering the unit exhaust temperature, it becomes possible to cope with more severe environments It is what has.

図1は本発明の実施例を示す電子機器ユニットの概念図で、図3及び図5と同一部分若しくは相当部分に同符号を付してその説明を省略する。すなわち、本発明は電子機器ユニット1の排気側内部に温度センサ8を設けると共に、発熱デバイス3に温度センサ9を設けたものである。各温度センサにて検出された温度信号は、図示省略された演算部に導入され係数値を用いて排気温度の演算が行われる。   FIG. 1 is a conceptual diagram of an electronic device unit showing an embodiment of the present invention. The same or corresponding parts as those in FIGS. That is, according to the present invention, the temperature sensor 8 is provided inside the exhaust side of the electronic device unit 1 and the temperature sensor 9 is provided in the heat generating device 3. The temperature signal detected by each temperature sensor is introduced into a calculation unit (not shown), and the exhaust gas temperature is calculated using a coefficient value.

今、温度センサ8によって検出された排気温度をTh、温度センサ9によって検出されたデバイス温度をTp、内部部品温度Ts、TpとThの温度差による発熱デバイスから排気側へ回る温度上昇値係数をAとしたとき、電子機器ユニット1の熱回路における各温度の関係は(1),(2)より(3)を得る。   Now, the exhaust temperature detected by the temperature sensor 8 is Th, the device temperature detected by the temperature sensor 9 is Tp, the internal component temperature Ts, and the temperature rise value coefficient that turns from the heat generating device to the exhaust side due to the temperature difference between Tp and Th. Assuming A, the relationship between the temperatures in the thermal circuit of the electronic device unit 1 is (3) from (1) and (2).

Th=Ts+A(Tp−Th)…(1)
β=1/(1+A)、α=A/(1+A)…(2)
Th=βTs+αTp……(3)
また、排気温度Thの変化は次の通りとなる。
Th = Ts + A (Tp−Th) (1)
β = 1 / (1 + A), α = A / (1 + A) (2)
Th = βTs + αTp (3)
The change in the exhaust temperature Th is as follows.

排気温度Thは、吸気温度と内部の温度上昇に依存(内部発熱量と冷却効率に依存)している。したがって、内部部品の発熱量を小さくしたり、冷却効率を高めることで内部部品温度Tsが下がり、それに伴って排気温度Thも下がる。   The exhaust temperature Th depends on the intake air temperature and the internal temperature rise (depends on the internal heat generation amount and the cooling efficiency). Therefore, the internal component temperature Ts is lowered by reducing the heat generation amount of the internal components or the cooling efficiency is increased, and the exhaust temperature Th is also lowered accordingly.

本発明はこの関係を利用し、Th及びTpを測定して内部部品温度Tsと発熱デバイス温度Tpを監視するものである。   The present invention utilizes this relationship to monitor the internal component temperature Ts and the heat generating device temperature Tp by measuring Th and Tp.

図2は縦軸に排気温度Thを、横軸に発熱デバイス温度Tpをとった温度許容エリアとTpによる温度上昇分を示したものである。同図で明かなように、Tpの変化に対するThの増加分(αTp)を考慮している。したがって、発熱デバイス3及び内部部品5,6が許容温度となるのは、ハッチングで示されたエリアでαTp分を補正した広いエリアとなり、このエリアに測定したTh及びTpが存在していれば、内部部品温度も発熱デバイス温度も許容範囲であって、その他ユニット吸気温度や、設置条件などに影響されることがなく信頼性確保が可能となるものである。   FIG. 2 shows a temperature allowable area in which the vertical axis represents the exhaust gas temperature Th and the horizontal axis represents the heat generating device temperature Tp, and the temperature rise due to Tp. As is clear from the figure, the increase in Th (αTp) with respect to the change in Tp is considered. Therefore, the heat generating device 3 and the internal components 5 and 6 have an allowable temperature in a wide area where αTp is corrected in the hatched area. If the measured Th and Tp exist in this area, Both the internal component temperature and the heat generating device temperature are within an allowable range, and reliability can be ensured without being affected by other unit intake air temperature, installation conditions, and the like.

なお、電子機器ユニット1をより厳しい環境にて使用する場合には、外ケース2の発熱面2’にヒートシンクを取り付けるか、もしくは放熱性能の高い壁などに発熱面2’を介してユニットを取り付けることにより冷却性能を高め、これによって排気温度を下げることにより対応可能となる。すなわち、電子機器ユニット1の吸気温度の規定が不用なため、温度異常が検出されなければ部品実装状況により非常に高い吸気温度にまで使用可能となる。   When the electronic device unit 1 is used in a harsher environment, a heat sink is attached to the heat generating surface 2 ′ of the outer case 2 or the unit is attached to a wall having high heat dissipation performance through the heat generating surface 2 ′. Therefore, it is possible to cope with the problem by improving the cooling performance and thereby lowering the exhaust temperature. That is, since the regulation of the intake air temperature of the electronic device unit 1 is unnecessary, it can be used up to a very high intake air temperature depending on the component mounting state if no temperature abnormality is detected.

本発明の実施形態を示す電子機器ユニットの概念図。The conceptual diagram of the electronic device unit which shows embodiment of this invention. 発熱デバイス温度と排気温度による部品許容エリア図。Parts tolerance area diagram by exothermic device temperature and exhaust temperature. 従来の電子機器ユニットの概念図。The conceptual diagram of the conventional electronic device unit. 発熱デバイス温度監視による内部部品温度の許容関係図。The permissible relationship diagram of internal component temperature by heat generation device temperature monitoring. 従来の他の電子機器ユニットの概念図。The conceptual diagram of the other conventional electronic device unit. 発熱デバイス温度による温度制御状態図。The temperature control state diagram by heat-generating device temperature.

符号の説明Explanation of symbols

1…電子機器ユニット
2…外ケース
3…高発熱デバイス
4…プリント板
5…非発熱部品
6…発熱部品
7…吸気側温度センサ
8…排気側温度センサ
9…温度センサ
DESCRIPTION OF SYMBOLS 1 ... Electronic device unit 2 ... Outer case 3 ... High heat generation device 4 ... Print board 5 ... Non-heat generation component 6 ... Heat generation component 7 ... Intake side temperature sensor 8 ... Exhaust side temperature sensor 9 ... Temperature sensor

Claims (4)

金属よりなる外ケース内部に電子機器部品を配設し、この電子機器部品を自然空冷すると共に、この電子機器部品で比較的高い熱を発生する発熱デバイスの発生熱を外ケースを介して外部に放熱する電子機器ユニットにおいて、
前記電子機器ユニット内部の熱排気側と前記発熱デバイスにそれぞれ温度センサを設け、熱排気側に設けた温度センサ測定された排気温度Thと発熱デバイスに設けた温度センサでデバイス温度Tpを測定し、前記発熱デバイスの温度上昇に対応して許容温度エリアを増加させ、前記測定した排気温度Thとデバイス温度Tpが許容温度エリア内に入ったときに、前記電子機器部品温度とデバイス温度が温度許容範囲内と判定することを特徴とした自然空冷式電子機器ユニットの温度判定方法。
Electronic equipment parts are arranged inside an outer case made of metal, and the electronic equipment parts are naturally air-cooled, and heat generated by a heat generating device that generates relatively high heat in the electronic equipment parts is externally passed through the outer case. In an electronic device unit that dissipates heat,
The electronics unit respectively provided temperature sensor inside the heat exhaust side to the heating device, a temperature sensor provided in the measured exhaust gas temperature Th and the heating device at a temperature sensor provided in the heat exhaust side measures the device temperature Tp The allowable temperature area is increased in response to the temperature rise of the heat generating device, and when the measured exhaust temperature Th and device temperature Tp are within the allowable temperature area, the electronic device component temperature and the device temperature are temperature allowable. A method for determining the temperature of a natural air-cooled electronic device unit, wherein the temperature is determined to be within a range .
金属よりなる外ケース内部に電子機器部品を配設し、この電子機器部品を自然空冷すると共に、この電子機器部品で比較的高い熱を発生する発熱デバイスの発生熱を外ケースを介して外部に放熱する電子機器ユニットにおいて、
前記電子機器ユニット内部の熱排気側と前記発熱デバイスに、それぞれ温度センサを設け、熱排気側の温度センサにより測定された排気温度Thと発熱デバイスに設けられた温度センサにより測定されたデバイス温度Tpを入力して発熱デバイスの温度上昇に対応した温度許容エリアを求める演算部を設け、求められた温度許容エリア内に前記測定した排気温度Thとデバイス温度Tpが入るときに、前記電子機器部品温度とデバイス温度が温度許容範囲内であるとすることを特徴とした自然空冷式電子機器ユニットの温度測定装置
Electronic equipment parts are arranged inside an outer case made of metal, and the electronic equipment parts are naturally air-cooled, and heat generated by a heat generating device that generates relatively high heat in the electronic equipment parts is externally passed through the outer case. In an electronic device unit that dissipates heat,
A temperature sensor is provided on each of the heat exhaust side and the heat generating device inside the electronic device unit, and the exhaust temperature Th measured by the temperature sensor on the heat exhaust side and the device temperature Tp measured by the temperature sensor provided on the heat generating device. Is input to the electronic device component temperature when the measured exhaust temperature Th and device temperature Tp are within the obtained temperature allowable area. And a device for measuring the temperature of a natural air-cooled electronic device unit, characterized in that the device temperature is within the allowable temperature range .
前記演算部は、前記測定された排気温度Th、デバイス温度Tp、電子機器部品Tsとし、排気温度Thとデバイス温度Tpの温度差によるデバイス温度から前記熱排気側へ回る温度上昇係数をAとしたとき、
Th={1/(1+A)}Ts+{A/(1+A)}Tp
の演算から発熱デバイスの温度上昇に対応した排気温度Thを算出することを特徴とした請求項2記載の自然空冷式電子機器ユニットの温度測定装置。
The calculation unit uses the measured exhaust temperature Th, device temperature Tp, and electronic equipment component Ts, and A represents a temperature increase coefficient that turns from the device temperature to the thermal exhaust side due to the temperature difference between the exhaust temperature Th and the device temperature Tp. When
Th = {1 / (1 + A)} Ts + {A / (1 + A)} Tp
3. The natural air-cooled electronic device unit temperature measuring device according to claim 2, wherein the exhaust temperature Th corresponding to the temperature rise of the heat generating device is calculated from the above calculation .
前記外ケースの発熱面にヒートシンクを取り付けたことを特徴とした請求項2又は3記載の自然空冷式電子機器ユニットの温度測定装置。 4. The temperature measuring apparatus for a natural air-cooled electronic device unit according to claim 2, wherein a heat sink is attached to the heat generating surface of the outer case .
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